2CGHV27100 Rev 1.0
Cree, Inc.
4600 Silicon Drive
Durham, North Carolina, USA 27703
USA Tel: +1.919.313.5300
Fax: +1.919.869.2733
www.cree.com/rf
Copyright © 2014-2015 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree and the Cree logo are
registered trademarks of Cree, Inc.
Absolute Maximum Ratings (not simultaneous) at 25˚C Case Temperature
Parameter Symbol Rating Units Conditions
Drain-Source Voltage VDSS 125 Volts 25˚C
Gate-to-Source Voltage VGS -10, +2 Volts 25˚C
Storage Temperature TSTG -65, +150 ˚C
Operating Junction Temperature TJ225 ˚C
Maximum Forward Gate Current IGMAX 16 mA 25˚C
Maximum Drain Current1IDMAX 6 A 25˚C
Soldering Temperature2TS245 ˚C
Screw Torque τ80 in-oz
Thermal Resistance, Junction to Case3RθJC 2.34 ˚C/W 85˚C, PDISS = 48 W
Thermal Resistance, Junction to Case4RθJC 2.95 ˚C/W 85˚C, PDISS = 48 W
Case Operating Temperature5TC-40, +150 ˚C
Note:
1 Current limit for long term, reliable operation.
2 Refer to the Application Note on soldering at http://www.cree.com/rf/document-library
3 Measured for the CGHV27100P
4 Measured for the CGHV27100F
5 See also, the Power Dissipation De-rating Curve on Page 5.
Electrical Characteristics (TC = 25˚C)
Characteristics Symbol Min. Typ. Max. Units Conditions
DC Characteristics1
Gate Threshold Voltage VGS(th) -3.8 -3.0 -2.3 VDC VDS = 10 V, ID = 16 mA
Gate Quiescent Voltage VGS(Q) –-2.7 – VDC VDS = 50 V, ID = 500 mA
Saturated Drain Current2IDS 12 14.4 –AVDS = 6.0 V, VGS = 2.0 V
Drain-Source Breakdown Voltage VBR 150 – – VDC VGS = -8 V, ID = 16 mA
RF Characteristics5 (TC = 25˚C, F0 = 2.7 GHz unless otherwise noted)
Saturated Output Power3,4 PSAT –135 –WVDD = 50 V, IDQ = 500 mA
Pulsed Drain Efciency3,4 η–68 –%VDD = 50 V, IDQ = 500 mA, POUT = PSAT
Gain6G – 18 – dB VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
WCDMA Linearity6ACLR –-37 –dBc VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
Drain Efciency6η–33 –%VDD = 50 V, IDQ = 500 mA, POUT = 44 dBm
Output Mismatch Stress3VSWR – – 10 : 1 YNo damage at all phase angles, VDD = 50 V, IDQ =
500 mA, POUT = 100 W Pulsed
Dynamic Characteristics
Input Capacitance7CGS –66 –pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Output Capacitance7CDS –8.7 –pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Feedback Capacitance CGD –0.47 –pF VDS = 50 V, Vgs = -8 V, f = 1 MHz
Notes:
1 Measured on wafer prior to packaging.
2 Scaled from PCM data.
3 Pulse Width = 100 µs, Duty Cycle = 10%
4 PSAT is dened as IGS = 1.6 mA peak
5 Measured in CGHV27100-AMP
6 Single Carrier WCDMA, 3GPP Test Model 1, 64 DPCH, 45% Clipping, PAR = 7.5 dB @ 0.01% Probability on CCDF, VDD = 50 V.
7 Includes package and internal matching components.