The documentation and process conversion measures necessary to comply with this revision shall be completed by 12 December 2013. INCH-POUND MIL-PRF-19500/500E w/AMENDMENT 1 12 September 2013 SUPERSEDING MIL-PRF-19500/500E 24 March 2009 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, DIODE, SILICON, UNIPOLAR TRANSIENT VOLTAGE SUPPRESSOR, TYPES 1N5555 THROUGH 1N5558, 1N5907, 1N5629A THROUGH 1N5665A, JAN, JANTX, AND JANTXV This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product described herein shall consist of this specification sheet and MIL-PRF-19500. 1. SCOPE 1.1 Scope. This specification covers the performance requirements for 1,500 watt, silicon, transient voltage suppressor diodes. Three levels of product assurance are provided for each device type as specified in MIL-PRF-19500. 1.2 Physical dimensions. See figure 1 (DO-13). 1.3 Maximum ratings. Maximum ratings are as shown in maximum test ratings (see 3.6 herein) and as follows: PPP = 1500 W (see figures 2 and 3) at tp = 1.0 ms. PM(AV) = 1.0 W (derate at 6.67 mW/C above TA = +25C) (see 6.5 herein). IFSM = 200 A (pk) at tp = 8.3 ms (TA = +25C). -55C TJ +175C (ambient), -55C TSTG +175C (ambient). 1.4 Primary electrical characteristics at TA = +25C. Primary ratings are as shown in maximum test ratings (see 3.6). * Comments, suggestions, or questions on this document should be addressed to DLA Land and Maritime, ATTN: VAC, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to Semiconductor@dla.mil . Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https://assist.dla.mil . AMSC N/A FSC 5961 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-19500 - Semiconductor Devices, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-750 * - Test Methods for Semiconductor Devices. (Copies of these documents are available online at http://quicksearch.dla.mil/ or https://assist.dla.mil/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. Unless otherwise noted herein or in the contract, in the event of a conflict between the text of this document and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 2 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 3. REQUIREMENTS 3.1 General. The individual item requirements shall be as specified in MIL-PRF-19500 and as modified herein. 3.2 Qualification. Devices furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturer's list (QML) before contract award (see 4.2 and 6.3). 3.3 Abbreviations, symbols, and definitions. Abbreviations, symbols, and definitions used herein shall be as specified in MIL-PRF-19500 and as follows: I(BR) - reverse breakdown current at a specified condition. 3.4 Interface and physical dimensions. The interface and physical dimensions shall be as specified in MIL-PRF-19500, and on figure 1 (DO-13) herein. 3.4.1 Metallurgically bonded construction. Metallurgically bonded construction is required. The bonding flow shall have flow points above 260C. 3.4.2 Lead finish. Lead finish shall be solderable in accordance with MIL-PRF-19500, MIL-STD-750, and herein. Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.2). 3.5 Marking. Devices shall be marked in accordance with MIL-PRF-19500. 3.6 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in 1.3, 1.4, and table I. Maximum ratings shall be in accordance with columns 6 through 8 of table II. Primary electrical characteristics are shown in columns 4 and 5 of table II herein. 3.7 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table I, subgroup 2. 3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and shall be free from other defects that will affect life, serviceability, or appearance. 3 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 DO-13 Symbol BD BL BLT CD LD LL LU NOTES: 1. 2. 3. 4. 5. 6. 7. Dimensions Inches Millimeters Min Max Min Max .215 .235 5.46 5.97 .293 .357 7.44 9.07 .570 14.48 .045 .100 1.14 2.54 .025 .035 0.64 0.89 1.000 1.625 25.40 41.28 .188 4.78 Notes 3 5 4 4 Dimensions are in inches. Millimeters are given for general information only. The major diameter is essentially constant along its length. Within this zone, diameter may vary to allow for lead finishes and irregularities. Dimension to allow for pinch or seal deformation anywhere along tubulation. Lead 1 (cathode) shall be electrically connected to the case. In accordance with ASME Y14.5M, diameters are equivalent to x symbology. FIGURE 1. Physical dimensions (DO-13). 4 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 4. VERIFICATION 4.1 Classification of inspections. The inspection requirements specified herein are classified as follows: a. Qualification inspection (see 4.2). b. Screening (see 4.3). c. Conformance inspection (see 4.4, and tables I, II, III, and IV). 4.1.1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-PRF-19500, and as specified herein except, lot accumulation shall be 6-months in lieu of 6-weeks. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified herein. 4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In case qualification was awarded to a prior revision of the specification sheet that did not request the performance of table IV tests, the tests specified in table IV herein that were not performed in the prior revision shall be performed on the first inspection lot of this revision to maintain qualification. 4.3 Screening (JANTX and JANTXV levels only). Screening shall be in accordance with table E-IV of MIL-PRF-19500, and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I herein shall not be acceptable. Screen (see table E-IV of MIL-PRF-19500) 3a Measurement JANTX and JANTXV levels T(high) = +175C 9, 10, 11 Not applicable 12 See 4.3.1 13 Interim electrical, delta, and table I, subgroups 2 and 3, electrical parameters not applicable for this screen (performed in screen 12). 14 Required 15 For JANTXV devices only - 100 percent inspection will be in accordance with manufacturer's internal failure criteria. 5 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 4.3.1 Power burn-in (HTRB) and steady-state operation life test conditions. The test conditions and order of events shall be as follows: a. Pulse in accordance with 4.5.2.a herein, 20 times (screening and group B) and 100 times (group C) at TA = +25C. b. Read ID and V(BR) at TA = +25C, remove defective devices and record the number of failures. c. Apply the working peak reverse voltage (VWM) (column 4 of table II herein) at TA = +125C as follows: (1) For 96 hours (JANTX and JANTXV). (2) For 340 hours (JANTX and JANTXV) for group B steady-state operation life test. (3) For 1,000 hours for group C steady-state operation life test. d. Read ID and V(BR) at TA = +25C. Devices with ID > 50 percent (100 percent for steady-state operation life) of the initial reading or 1 A dc, whichever is greater, or V(BR) > 2 percent (5 percent for steady-state operation life) of initial value shall be considered defective. Remove defective devices and record the number of failures. 4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500. 4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I herein. End-point electrical measurements shall be in accordance with table I, subgroup 2 herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500. Electrical measurements (endpoints) and delta requirements shall be in accordance with the applicable steps of table III herein. 4.4.2.1 Group B inspection, table E-VIb of MIL-PRF-19500. Subgroup Method B2 1051 -55C to +175C. B2 4066 10 pulses, see 4.5.2 herein. B3 1027 See 4.5.1 and 4.5.3. B5 Conditions Not applicable. 6 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table E-VII of MIL-PRF-19500. Electrical measurements (end-points) and delta requirements shall be in accordance with the applicable steps of table III herein. * 4.4.3.1 Group C inspection, table E-VII of MIL-PRF-19500. * Subgroup Method C2 2036 C5 Conditions Lead tension: Test condition A; weight = 10 pounds (4.54 kg); t = 15 3 s. Lead fatigue: Test condition E; weight = 8 ounces (226.7 g). Not applicable C6 1026 See 4.5.1 and 4.5.2 herein. C7 1018 n = 3, c = 0 or n = 5, c = 1. C8 Condition for temperature coefficient of breakdown voltage is as follows: IBR = column 3 of table II herein, T1 = +25C 3C, T2 = T1 +100C; n = 22, c = 0. C9 Condition for maximum peak pulse current is as follows: See 4.5.2.b herein, (20 s pulse only) 10 pulses; n = 22, c = 0. 4.4.4 Group E inspection. Group E inspection shall be conducted in accordance with the conditions specified for subgroup testing in appendix E, table E-IX of MIL-PRF-19500 and as specified herein. Electrical measurements (end-points) shall be in accordance with table I, subgroup 2 herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables as follows. 4.5.1 Group C steady-state operation life test (alternate procedure). When the group B, 340-hour life test is continued on test to 1,000 hours to satisfy the group C life test requirements, the test shall be performed as given in 4.3.1 herein with the following exception: Step 4.3.1.d shall be repeated at the end of the 1,000 hours. * 4.5.2 Maximum peak pulse current (IPP). The peak pulse currents specified in column 7 of table II herein shall be applied while simultaneously maintaining a bias voltage of not less than the applicable voltage specified in column 4 of table II, in the same polarity as the peak pulse current. The clamping voltage (Vc) shall be as specified in 4.5.3. The peak pulse current shall be applied with a current vs time waveform as follows (1 pulse per minute maximum): a. Pulse current shall reach 100 percent of IPP at t 10 s and decay to 50 percent of IPP at t 1 ms for tp = 1 ms (see figure 4). b. Pulse current shall reach 100 percent of IPP at t 8 s and decay to 50 percent of IPP at t 20 s for tp = 20 s (see figure 5). 4.5.3 Clamping voltage. The peak pulse clamping voltage shall be measured across the diode in a 1 ms time interval. The response detector shall demonstrate equipment accuracy of 3 percent. The peak clamping voltage as specified in column 6 of table II shall be applicable to the 1 ms pulse of 4.5.2.a only. 7 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 TABLE I. Group A inspection. MIL-STD-750 Inspection 1/ Method Limits 2/ Symbol Conditions Min Unit Max Subgroup 1 Visual and mechanical examination 2071 Radiography 2076 For JANTX devices only. Inspection will be in accordance with manufacturer's internal failure criteria, c = 45, n = 0 Standby current 4016 DC method, VR = VWM (column 4 of table II) Breakdown voltage 4022 tp 300 ms, duty cycle 2 percent, IBR = column 3 of table II Subgroup 2 Column 5 A dc ID VBR Column 2 Column 2 V dc Column 10 V dc Subgroup 3 Low temperature operation: Minimum breakdown voltage TA = -55C 4022 tp 300 ms, duty cycle 2 percent, IBR = column 3 of table II TA = 125C VBR 4016 DC method, VR = VWM (column 4 of table II) ID2 Column 9 A dc tp = 1.0 ms (see 4.5.2.a), IPP = column 7 of table II, (pulsed) (see 4.5.3) VC Column 6 V (pk) IFM = 100 A (pk); tp = 8.3 ms (max), duty cycle = 4 pulses per minute (max) VFM High temperature operation: Reverse current leakage Subgroup 4 Clamping voltage maximum Forward voltage 4011 Subgroup 5 Not applicable See footnotes at end of table. 8 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. 3.5 V (pk) MIL-PRF-19500/500E w/AMENDMENT 1 TABLE I. Group A inspection - Continued. MIL-STD-750 Inspection 1/ Method Conditions Limits 2/ Symbol Min Subgroup 6 Forward surge current End-point electrical measurements 4066 IFSM = 200 A (pk), one pulse, half sine wave (8.3 ms), IF = 0; VWM = 0; TA = 25C See table III, steps 1 and 2 Subgroup 7 Not applicable 1/ 2/ For sampling plan, see MIL-PRF-19500. Column references are to table II. 9 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. Max Unit TABLE II. Characteristics and ratings. Col 1 Col 2 Type Breakdown voltage VBR at IBR Col 4 Col 5 Col 6 Test Working peak Maximum Maximum current reverse standby clamping voltage current voltage IBR V dc mA dc Max 6.75 1 7.14 10 7.88 10 8.61 10 9.55 1 10.50 1 11.60 1 12.60 1 13.70 1 15.80 1 16.80 1 18.90 1 21.00 1 23.10 1 25.20 1 28.40 1 31.50 1 34.70 1 1 37.80 1 Col 7 Col 8 Col 9 Col 10 Maximum peak pulse current IPP Maximum Maximum Minimum temperature standby Breakdown Coefficient current voltage at of VBR ID IBR VC at IPP t = 20 s t = 1 ms T = VBR TA = -55C A p p +125C tr = 8 s tr = 10 s Col 11 Breakdown current IBR maximum dc current TA = +25C VWM ID V (pk) A dc V (pk) A (pk) A (pk) %/C A dc V dc mA dc 5.00 5.80 6.40 7.02 7.78 8.55 9.40 10.20 11.10 12.80 13.60 15.30 17.10 18.80 20.50 23.10 25.60 28.20 30.50 30.80 300 1,000 500 200 50 10 5 5 5 5 5 5 5 5 5 5 5 5 5 5 10.0 10.5 11.3 12.1 13.4 14.5 15.6 16.7 18.2 21.2 22.5 25.2 27.7 30.6 33.2 37.5 41.4 45.7 47.5 49.9 1,000 810 750 700 630 585 545 510 465 400 375 335 305 275 255 225 205 185 193 170 150.0 143.0 132.0 124.0 112.0 103.5 96.0 90.0 82.0 71.0 67.0 59.5 54.0 49.0 45.0 40.0 36.0 33.0 32.0 30.0 .057 .057 .061 .065 .068 .073 .075 .078 .081 .084 .086 .088 .090 .092 .094 .096 .097 .098 .093 .099 1,500 4,000 2,000 1,000 400 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 5.63 6.05 6.66 7.24 8.01 8.75 9.65 10.40 11.30 13.00 13.70 15.40 17.10 18.80 20.50 23.00 23.50 28.00 30.20 30.50 140.0 140.0 125.0 115.0 104.0 95.0 86.0 73.0 70.0 63.0 59.0 53.0 47.0 43.0 39.0 35.0 31.0 28.0 27.0 26.0 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 10 1N5907 1N5629A 1N5630A 1N5631A 1N5632A 1N5633A 1N5634A 1N5635A 1N5636A 1N5637A 1N5638A 1N5639A 1N5640A 1N5641A 1N5642A 1N5643A 1N5644A 1N5645A 1N5555 1N5646A V dc Min 6.00 6.45 7.13 7.79 8.65 9.50 10.50 11.40 12.40 14.30 15.20 17.10 19.00 20.90 22.80 25.70 28.50 31.40 33.00 34.20 Col 3 TABLE II. Characteristics and ratings - Continued. MIL-PRF-19500/500D Col 1 Col 2 Type Breakdown Voltage VBR at IBR Col 4 Col 5 Test Working peak Maximum current reverse standby voltage current IBR V dc mA dc Max 41.00 1 45.20 1 1 49.40 1 53.60 1 58.80 1 1 65.10 1 71.40 1 78.80 1 86.10 1 95.50 1 105.00 1 116.00 1 126.00 1 137.00 1 158.00 1 168.00 1 179.00 1 189.00 1 210.00 1 1 Col 6 Col 7 Col 8 Maximum clamping voltage Maximum peak pulse current IPP Col 9 Col 10 Maximum Maximum Minimum temperature standby breakdown coefficient current voltage at of VBR ID IBR VC at IPP t = 20 s t = 1 ms T = T = A p VBR A -55C p +125C t = 10 s tr = 8 s r Col 11 Breakdown current IBR maximum dc current TA = +25C VWM ID V (pk) A dc V (pk) A (pk) A (pk) %/C A dc V dc mA dc 33.30 36.80 40.30 40.20 43.60 47.80 49.00 53.00 58.10 64.10 70.10 77.80 85.50 94.00 102.00 111.00 128.00 136.00 145.00 154.00 171.00 175.00 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 53.9 59.3 63.5 64.8 70.1 77.0 78.5 85.0 92.0 103.0 113.0 125.0 137.0 152.0 165.0 179.0 207.0 219.0 234.0 246.0 274.0 265.0 155 145 136 130 120 110 116 100 90 82 75 68 62 55 50 47 40 38 36 34 30 33 28.0 25.3 24.0 23.2 21.4 19.5 19.0 17.7 16.3 14.6 13.3 12.0 11.0 9.9 9.1 8.4 7.2 6.8 6.4 6.1 5.5 5.7 .100 .101 .094 .101 .102 .103 .096 .104 .104 .105 .105 .106 .106 .107 .107 .107 .108 .108 .108 .108 .108 .100 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 200 33.10 36.40 40.00 39.80 43.10 47.30 48.50 52.30 57.30 63.20 69.00 76.50 84.10 92.80 100.00 109.00 126.00 134.00 143.00 151.00 167.00 172.00 24.0 22.0 21.0 20.0 18.0 17.0 16.0 15.0 14.0 12.0 11.0 10.0 9.5 8.5 7.5 7.0 6.0 5.8 5.5 5.0 4.5 4.5 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 11 1N5647A 1N5648A 1N5556 1N5649A 1N5650A 1N5651A 1N5557 1N5652A 1N5653A 1N5654A 1N5655A 1N5656A 1N5657A 1N5658A 1N5659A 1N5660A 1N5661A 1N5662A 1N5663A 1N5664A 1N5665A 1N5558 V dc Min 37.10 40.90 43.70 44.70 48.50 53.20 54.00 58.90 64.60 71.30 77.90 86.50 95.00 105.00 114.00 124.00 143.00 152.00 162.00 171.00 190.00 191.00 Col 3 MIL-PRF-19500/500E w/AMENDMENT 1 TABLE III. Groups B and C electrical and delta measurements. 1/ 2/ 3/ Step MIL-STD-750 Inspection Method 1/ 2/ 3/ 4/ Symbol Conditions Min 1. Standby current 4016 DC method, VR = VWM (column 4 of table II) 2. Breakdown voltage 4022 tp 300 ms, duty cycle 2 percent, IBR = column 3 of table II VBR 3. Standby current 4016 DC method; VR = VWM (column 4 of table II) ID 4. Breakdown voltage 4022 tp 300 ms, duty cycle 2 percent, IBR = column 3 of table II 5. Clamping voltage tp = 1.0 ms (see 4.5.2.a); IPP = column 7 of table II Limits 4/ ID Column 2 VBR VC Unit Max Column 5 A dc Column 2 V dc 100 percent of initial reading or 20 percent of column 5 of table II, whichever is greater. 5 percent of initial value Column 6 V (pk) The electrical measurements for table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500 are as follows: a. Subgroup 2, see table III herein, steps 1 and 2. b. Subgroup 6, see table III herein, steps 1, 2, 3, and 4. The electrical measurements for table E-VII (JAN, JANTX, and JANTXV) of MIL-PRF-19500 are as follows: a. Subgroup 2 and 3, see table III herein, and steps 1 and 2. b. Subgroup 9, see table III herein, steps 1 and 2 for all levels. Column references are to table II. Devices which exceed the table I limits for this test shall not be accepted. 12 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 TABLE IV. Group E inspection (all quality levels) for qualification only. MIL-STD-750 Inspection Method Sampling plan Conditions Subgroup 1 n = 45, c = 0 Temperature cycling 1051 Electrical measurements 500 cycles, condition C, -55C to +175C. See table III, steps 1, 2, 3, and 4. Subgroup 2 n = 22, c = 0 Life test 1,000 hours. See 4.3.1 Electrical measurements See table III, steps 1, 2, 3, and 4. Subgroups 4 and 5 Not applicable Subgroup 6 Peak pulse current See 4.5.2. IPP shall be characterized by the supplier and this data shall be available to the government. Test shall be performed on each low and high voltage device for each structurally identical grouping. Test to failure. Electrical measurements See table III, steps 1, 2, 3, and 4. Subgroup 7 Soldering heat n = 45, c = 0 2031 1 cycle. 13 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 FIGURE 2. Derating curve. 14 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 FIGURE 3. Peak pulse power versus pulse time. 15 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 TIME (t) IN MILLISECONDS NOTE: Pulse time duration is defined as that point where the pulse current decays to 50 percent of IPP. (Rise time to 100 percent of IPP = 10 s). FIGURE 4. Current impulse waveform (see 4.5.2.a herein). NOTE: Pulse time duration is defined as that point where the pulse current decays to 50 percent of IPP. (Rise time to 100 percent of IPP = 8 s). FIGURE 5. Current impulse waveform (see 4.5.2.b herein). 16 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 5. PACKAGING 5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activities within the Military Service or Defense Agency, or within the Military Service's system commands. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. The notes specified in MIL-PRF-19500 are applicable to this specification.) 6.1 Intended use. Semiconductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: * a. Title, number, and date of this specification. b. Packaging requirements (see 5.1). c. Lead finish (see 3.4.2). d. Product assurance level and type designator. e. Destructive physical analysis when requested. 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List (QML 19500) whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DLA Land and Maritime, ATTN: VQE, P.O. Box 3990, Columbus, OH 43218-3990 or e-mail vqe.chief@dla.mil . An online listing of products qualified to this specification may be found in the Qualified Products Database (QPD) at https://assist.dla.mil . 6.4 Substitution information. Type numbers 1N5555 through 1N5558 were previously covered by MIL-PRF-19500/434. 6.5 Steady state power rating. This rating is not relevant for most applications. * 6.6 Amendment notations. The margins of this specification are marked with asterisks to indicate modifications generated by this amendment. This was done as a convenience only and the Government assumes no liability whatsoever for any inaccuracies in these notations. Bidders and contractors are cautioned to evaluate the requirements of this document based on the entire content irrespective of the marginal notations and relationship to the last previous issue. 17 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use. MIL-PRF-19500/500E w/AMENDMENT 1 Custodians: Army - CR Navy - EC Air Force - 85 NASA - NA DLA - CC Preparing activity: DLA - CC (Project 5961-2013-071) Review activities: Army - AR, MI, SM Navy - AS, MC Air Force - 19, 99 * NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at https://assist.dla.mil . 18 Source: https://assist.dla.mil -- Downloaded: 2015-04-16T07:13Z Check the source to verify that this is the current version before use.