INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
1MARCH 2001INDUSTRIAL TEMPERATURE RANGE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2001 Integrated Device Technology, Inc. DSC-5873/1
FEATURES:
• CMOS power levels: <7.5mW static
• Undershoot clamp diodes on all inputs
• True TTL input and output compatibility
• Ground bounce controlled outputs
• Reduced output swing of 0 to 3.5V
•IOL = 48mA
• Available in SOIC, QSOP, and S1 packages
FUNCTIONAL BLOCK DIAGRAM
IDTQS74FCT253AT
HIGH-SPEED CMOS
DUAL 4-INPUT
MULTIPLEXER
DESCRIPTION:
The IDTQS74FCT253AT is a high-speed CMOS TTL-compatible dual
4-input multiplexer with 3-state outputs. All inputs have clamp diodes for
undershoot noise suppression. All outputs have ground bounce suppres-
sion. Outputs will not load an active bus when Vcc is removed from the
device.
YA
EB
YB
EA S1 S0 I0A I1A I2A I3A I0B I1B I2B I3B
INDUSTRIAL TEMPERATURE RANGE
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IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
PIN CONFIGURATION Symbol Description Max Unit
VTERM Terminal Voltage with Respect to GND –0.5 to +7 V
TSTG Storage Temperature –65 to +150 °C
IOUT DC Output Current Max Current Sink/Pin +120 mA
IIK Input Diode Current, VIN < 0 -20 mA
IOK DC Output Current, VOUT < 0 -50 mA
ABSOLUTE MAXIMUM RATINGS(1)
NOTE:
1 . Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
SOIC/ QSOP/ S1
TOP VIEW
NOTE:
1 . H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High-Impedance
FUNCTION TABLE(1)
Enable Select Outputs
EA EB S0S1YA YB Function
H X X X Z Z Disable A
X H X X X Z Disable B
LLLLI0AI0BS1- 0 = 0
LLLHI1AI1BS1- 0 = 1
LLHLI2AI2BS1- 0 = 2
LLHHI
3AI3BS1- 0 = 3
Pin Names I/O Description
Ix I Data In
Sx I Select
EA, EB I Enable
YA, YB 0 Data Out
PIN DESCRIPTION
Symbol Parameter(1) Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 4 — pF
COUT Output Capacitance VOUT = 0V 8 — pF
CAPACITANCE (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
2
3
4
5
6
7
89
10
11
12
13
14
15
16
1
EA
S1
GND
YA
I1A
I0A
I3A
EB
S0
I3B
I2B
I1B
I0B
YB
VCC
I2A
INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
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Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 — — V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
∆VTInput Hysteresis VTLH - VTHL for all inputs — 0. 2 — V
IIH Input HIGH Current VCC = Max. 0 ≤ VIN ≤ VCC ——±5µA
IIL Input LOW Current
IOZ Off-State Output Current (Hi-Z) VCC = Max. 0 ≤ VIN ≤ VCC ——±5µA
IOS Short Circuit Current VCC = Max., VOUT = GND(2) -60 — — mA
VIC Input Clamp Voltage VCC = Min., IIN = –18mA, TA = 25°C — –0.7 –1.2 V
VOH Output HIGH Voltage VCC = Min. IOH = –15mA 2.4 — — V
VOL Output LOW Voltage VCC = Min. IOL = 12mA — — 0.5 V
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
NOTES:
1. Typical values are at VCC = 5.0V, +25°C ambient.
2. This parameter is guaranteed but not tested
Symbol Parameter Test Conditions(1) Min. Max. Unit
ICC Quiescent Power Supply Current VCC = Max. — 1.5 mA
freq = 0
0V ≤ VIN ≤ 0.2V or
VCC - 0.2V ≤ VIN ≤ VCC
∆ICC Supply Current per Input TTL Inputs HIGH VCC = Max. — 2 mA
VIN = 3.4V(2)
freq = 0
ICCD Supply Current per Input per MHz VCC = Max. — 0.25 mA/
Outputs Open and Enabled MHz
One Bit Toggling
50% Duty Cycle
Other inputs at GND or VCC(3,4)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under DC Electrical Characteristics.
2. Per TTL driven input (VIN = 3.4V).
3. For flip-flops, ICCD is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption
only and does not include power to drive load capacitance or tester capacitance.
4. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Output Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Output Frequency
Ni = Number of Outputs at fi
All currents are in milliamps and all frequencies are in megahertz.
POWER SUPPLY CHARACTERISTICS
INDUSTRIAL TEMPERATURE RANGE
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IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
NOTES:
1. CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted.
2. Minimums guaranteed but not tested.
3. This parameter is guaranteed by design but not tested.
Symbol Parameter Min. Max. Unit
tIY Propagation Delay 1.5 5.2 ns
Ix to Y
tSY Propagation Delay 1.5 6.6 ns
Sx to Y
tPZH Output Enable Time 1.5 6 ns
tPZL E to Y
tPHZ Output Disable Time 1.5 6 ns
tPLZ E to Y
SWITCHING CHARACTERISTICS OVER OPERATING RANGE(1)
INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
5
Pulse
Generator
RT
D.U.T.
VCC
VIN
CL
VOUT
50pF 500Ω
500Ω
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CO NTROL
tSU tH
tREM
tSU tH
HIGH-LOW-HIGH
PULSE
LOW-HIGH-LOW
PULSE
tW
1.5V
1.5V
SAME PHASE
INPUT TRANSITION
3V
1.5V
0V
1.5V
VOH
tPLH
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
3V
1.5V
0V
tPLH tPHL
tPHL
VOL
CONTROL
INPUT
3V
1.5V
0V
3.5V
0V
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
SWITCH
CLOSED
SWITCH
OPEN
VOL
0.3V
0.3V
tPLZtPZL
tPZH tPHZ
3.5V
0V
1.5V
1.5V
ENABLE DISABLE
VOH
PRESET
CLEAR
CLOCK ENA BLE
ETC.
FCTL link
FCTL link
FCTL link
FCTL link
FCTL link
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuits for All Outputs
Enable and Disable Times
Set-Up, Hold, and Release Times
Pulse Width
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
Test Switch
Open Drain
Disable Low Closed
Enable Low
All Other Tests Open
SWITCH POSITION
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
INDUSTRIAL TEMPERATURE RANGE
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IDTQS74FCT253AT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
ORDERING INFORMATION
CORPORATE HEADQUARTERS for SALES: for Tech Support:
2975 Stender Way 800-345-7015 or 408-727-6116 logichelp@idt.com
Santa Clara, CA 95054 fax: 408-492-8674 (408) 654-6459
www.idt.com
IDTQS XX FCT XXXX XX
PackageDevice T y pe
SO
Q
S1
Small Outline IC (gull wing)
Quarter Size Small Outline Package
Small Outline IC (gull wing)
High-Speed CMOS Dual 4-Input Multiplexer
253AT
Temp. Range
74 –40°C to +85°C
