Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor FEATURES PHN210 SYMBOL * Dual device * Low threshold voltage * Fast switching * Logic level compatible * Surface mount package QUICK REFERENCE DATA d1 d1 VDS = 30 V d2 d2 ID = 3.4 A RDS(ON) 100 m (VGS = 10 V) RDS(ON) 200 m (VGS = 4.5 V) s1 GENERAL DESCRIPTION Dual N-channel enhancement mode field-effect transistor in a plastic envelope using 'trench' technology. Applications:* Motor and relay drivers * d.c. to d.c. converters * Logic level translator The PHN210 is supplied in the SOT96-1 (SO8) surface mounting package. s2 g2 g1 PINNING PIN SOT96-1 DESCRIPTION 1 source 1 2 gate 1 3 source 2 4 gate 2 5,6 drain 2 7,8 drain 1 pin 1 index 8 7 6 5 1 2 3 4 LIMITING VALUES Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL PARAMETER CONDITIONS VDS Repetitive peak drain-source voltage Continuous drain-source voltage Drain-gate voltage Gate-source voltage Drain current per MOSFET1 Tj = 25 C to 150C VDS VDGR VGS ID ID IDM Ptot Tstg, Tj Drain current per MOSFET (both MOSFETs conducting)1 Drain current per MOSFET (pulse peak value) Total power dissipation (either or both MOSFETs conducting)1 Storage & operating temperature RGS = 20 k Ta = 25 C Ta = 70 C Ta = 25 C Ta = 70 C Ta = 25 C Ta = 25 C Ta = 70 C MIN. MAX. UNIT - 30 V - 30 30 20 3.4 2.8 2.4 1.9 14 V V V A A A A A - 65 2 1.3 150 W W C 1 Surface mounted on FR4 board, t 10 sec January 2002 1 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 THERMAL RESISTANCES SYMBOL PARAMETER CONDITIONS Rth j-a Surface mounted, FR4 board, t 10 sec Rth j-a Thermal resistance junction to ambient Thermal resistance junction to ambient Surface mounted, FR4 board TYP. MAX. UNIT - 62.5 K/W 150 - K/W MIN. MAX. UNIT - 13 mJ - 3.4 A AVALANCHE ENERGY LIMITING VALUES Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL PARAMETER CONDITIONS EAS Non-repetitive avalanche energy (per MOSFET) Unclamped inductive load, IAS = 3.4 A; tp = 0.2 ms; Tj prior to avalanche = 25C; VDD 15 V; RGS = 50 ; VGS = 10 V IAS Non-repetitive avalanche current (per MOSFET) ELECTRICAL CHARACTERISTICS Tj= 25C, per MOSFET unless otherwise specified SYMBOL PARAMETER CONDITIONS V(BR)DSS VGS = 0 V; ID = 10 A; VGS(TO) Drain-source breakdown voltage Gate threshold voltage MIN. Tj = -55C VDS = VGS; ID = 1 mA Tj = 150C Tj = -55C 2 80 120 4.5 10 0.6 10 2.8 3.2 100 200 170 100 10 100 V V V V V m m m S A A nA A nA IGSS VGS = 10 V; ID = 2.2 A VGS = 4.5 V; ID = 1 A VGS = 10 V; ID = 2.2 A; Tj = 150C Forward transconductance VDS = 20 V; ID = 2.2 A On-state drain current VGS = 10 V; VDS = 1 V; VGS = 4.5 V; VDS = 5 V Zero gate voltage drain VDS = 24 V; VGS = 0 V; current VDS = 24 V; VGS = 0 V; Tj = 150C Gate source leakage current VGS = 20 V; VDS = 0 V Qg(tot) Qgs Qgd Total gate charge Gate-source charge Gate-drain (Miller) charge ID = 2.3 A; VDD = 15 V; VGS = 10 V - 6 0.7 0.7 - nC nC nC td on tr td off tf Turn-on delay time Turn-on rise time Turn-off delay time Turn-off fall time VDD = 20 V; RD = 18 ; VGS = 10 V; RG = 6 Resistive load - 6 8 21 15 - ns ns ns ns Ld Ls Internal drain inductance Internal source inductance Measured from drain lead to centre of die Measured from source lead to source bond pad - 2.5 5 - nH nH Ciss Coss Crss Input capacitance Output capacitance Feedback capacitance VGS = 0 V; VDS = 20 V; f = 1 MHz - 250 88 54 - pF pF pF RDS(ON) gfs ID(ON) IDSS Drain-source on-state resistance 30 27 1 0.4 2 3.5 2 - TYP. MAX. UNIT January 2002 2 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS Tj = 25C, per MOSFET unless otherwise specified SYMBOL PARAMETER CONDITIONS Ta = 25 C VSD Continuous source diode current (per MOSFET) Pulsed source diode current (per MOSFET) Diode forward voltage trr Qrr Reverse recovery time Reverse recovery charge IS ISM 120 MIN. TYP. MAX. UNIT - - 2.2 A - - 14 A IF = 1.25 A; VGS = 0 V - 0.82 1.2 V IF = 1.25 A; -dIF/dt = 100 A/s; VGS = 0 V; VR = 25 V - 69 55 - ns nC Normalised Power Derating PD% 110 100 100 PHN210 Peak Pulsed Drain Current, IDM (A) 90 80 tp = 10 us RDS(on) = VDS/ ID 10 100 us 70 1 ms 60 1 50 10 ms 40 100 ms 30 0.1 10 s 20 10 0.01 0 0 20 40 60 80 100 Tamb / C 120 140 0.1 Fig.1. Normalised power dissipation. PD% = 100PD/PD 25 C = f(Ta) 120 1 10 Drain-Source Voltage, VDS (V) 100 Fig.3. Safe operating area. Ta = 25 C ID & IDM = f(VDS); IDM single pulse; parameter tp Normalised Current Derating ID% 110 100 100 PHN210 Zth j-a (K/W) D = 0.5 90 10 80 0.2 0.1 0.05 70 60 0.02 1 P D 50 tp D = tp/T 40 0.1 30 single pulse 20 T 10 0.01 1E-06 0 0 20 40 60 80 100 Ambient temperature, Tamb (C) 120 140 1E-04 1E-03 1E-02 1E-01 1E+00 1E+01 Pulse width, tp (s) Fig.2. Normalised continuous drain current. ID% = 100ID/ID 25 C = f(Ta); conditions: VGS 10 V January 2002 1E-05 Fig.4. Transient thermal impedance. Zth j-a = f(t); parameter D = tp/T 3 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 Transconductance, gfs (S) 6 Drain Current, ID (A) 10 VGS = 20 V 9 8 10 V 5 5V Tj = 25 C 4 Tj = 25 C 7 150 C 6 4.2 V 5 3 4V 4 2 3.8 V 3.6 V 3.4 V 3.2 V 3 2 1 1 0 0 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 Drain-Source Voltage, VDS (V) 1.8 0 2 Fig.5. Typical output characteristics, Tj = 25 C. ID = f(VDS); parameter VGS 0.5 3.2 V 4V 2 4.2 V 2 3 4 5 6 7 Drain current, ID (A) 8 9 10 Fig.8. Typical transconductance, Tj = 25 C. gfs = f(ID) ; parameter Tj Drain-Source On Resistance, RDS(on) (Ohms) 3.6 V 3.8V 1 a SOT223 30V Trench Normalised RDS(ON) = f(Tj) Tj = 25 C 3.4 V 0.4 1.5 0.3 1 0.2 VGS =5 V 10V 0.1 0.5 20V 0 0 1 2 3 4 5 6 Drain Current, ID (A) 7 8 9 0 -50 10 Fig.6. Typical on-state resistance, Tj = 25 C. RDS(ON) = f(ID); parameter VGS 0 50 Tj / C 100 150 Fig.9. Normalised drain-source on-state resistance. a = RDS(ON)/RDS(ON)25 C = f(Tj) VGS(TO) / V Drain current, ID (A) 10 4 VDS > ID X RDS(ON) 9 8 7 3 Tj = 25 C 6 max. 150 C 5 typ. 2 4 3 2 min. 1 1 0 0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5 5.5 6 0 -60 -40 -20 Gate-source voltage, VGS (V) Fig.7. Typical transfer characteristics. ID = f(VGS); parameter Tj January 2002 0 20 40 60 Tj / C 80 100 120 140 Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS 4 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 Sub-Threshold Conduction 1E-01 Source-Drain Diode Current, IF (A) 10 9 1E-02 VGS = 0 V 8 7 min 1E-03 typ 6 max 150 C 5 Tj = 25 C 4 1E-04 3 2 1 1E-05 0 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 1.1 1.2 1.3 1.4 1.5 1E-06 0 1 2 3 4 Drain-Source Voltage, VSDS (V) 5 Fig.11. Sub-threshold drain current. ID = f(VGS); conditions: Tj = 25 C; VDS = VGS Fig.14. Typical reverse diode current. IF = f(VSDS); conditions: VGS = 0 V; parameter Tj Non-repetitive Avalanche current, IAS (A) PHN210 10 Capacitances, Ciss, Coss, Crss (pF) 1000 25 C Ciss Tj prior to avalanche =125 C 1 100 VDS Coss tp Crss ID 0.1 1E-06 10 0.1 1 10 Drain-Source Voltage, VDS (V) 100 1E-05 1E-04 1E-03 1E-02 Avalanche time, tp (s) Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz Fig.15. Maximum permissible non-repetitive avalanche current (IAS) versus avalanche time (tp); unclamped inductive load Gate-source voltage, VGS (V) 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 ID = 2.3A Tj = 25 C VDD = 15 V 0 1 2 3 4 5 6 7 Gate charge, QG (nC) 8 9 10 Fig.13. Typical turn-on gate-charge characteristics. VGS = f(QG); parameter VDS January 2002 5 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 MECHANICAL DATA SO8: plastic small outline package; 8 leads; body width 3.9 mm SOT96-1 D E A X c y HE v M A Z 5 8 Q A2 A (A 3) A1 pin 1 index Lp L 4 1 e detail X w M bp 0 2.5 5 mm scale DIMENSIONS (inch dimensions are derived from the original mm dimensions) UNIT mm inches A max. A1 A2 1.75 0.25 0.10 1.45 1.25 0.010 0.057 0.069 0.004 0.049 A3 bp c D (1) E (2) e HE 0.25 0.49 0.36 0.25 0.19 5.0 4.8 4.0 3.8 1.27 6.2 5.8 0.01 0.019 0.0100 0.014 0.0075 0.20 0.19 0.16 0.15 0.244 0.039 0.028 0.050 0.041 0.228 0.016 0.024 L Lp Q 1.05 1.0 0.4 0.7 0.6 v 0.25 0.01 w 0.25 0.01 y Z (1) 0.1 0.7 0.3 0.028 0.004 0.012 o 8 0o Notes 1. Plastic or metal protrusions of 0.15 mm maximum per side are not included. 2. Plastic or metal protrusions of 0.25 mm maximum per side are not included. REFERENCES OUTLINE VERSION IEC JEDEC SOT96-1 076E03S MS-012AA EIAJ EUROPEAN PROJECTION ISSUE DATE 95-02-04 97-05-22 Fig.16. SOT96 surface mounting package. Notes 1. This product is supplied in anti-static packaging. The gate-source input must be protected against static discharge during transport or handling. 2. Refer to Integrated Circuit Packages, Data Handbook IC26. 3. Epoxy meets UL94 V0 at 1/8". January 2002 6 Rev 1.100 Philips Semiconductors Product specification Dual N-channel enhancement mode TrenchMOSTM transistor PHN210 DEFINITIONS DATA SHEET STATUS DATA SHEET STATUS2 PRODUCT STATUS3 DEFINITIONS Objective data Development This data sheet contains data from the objective specification for product development. Philips Semiconductors reserves the right to change the specification in any manner without notice Preliminary data Qualification This data sheet contains data from the preliminary specification. Supplementary data will be published at a later date. Philips Semiconductors reserves the right to change the specification without notice, in order to improve the design and supply the best possible product Product data Production This data sheet contains data from the product specification. Philips Semiconductors reserves the right to make changes at any time in order to improve the design, manufacturing and supply. Changes will be communicated according to the Customer Product/Process Change Notification (CPCN) procedure SNW-SQ-650A Limiting values Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of this specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information Where application information is given, it is advisory and does not form part of the specification. Philips Electronics N.V. 2002 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, it is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent or other industrial or intellectual property rights. LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices or systems where malfunction of these products can be reasonably expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. 2 Please consult the most recently issued datasheet before initiating or completing a design. 3 The product status of the device(s) described in this datasheet may have changed since this datasheet was published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com. January 2002 7 Rev 1.100