1
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 – Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
PIN SYMBOL PIN SYMBOL PIN SYMBOL PIN SYMBOL
1VSS 43 VSS 85 VSS 127 VSS
2 DQ0 44 DNU 86 DQ32 128 CKE0
3 DQ1 45 S2# 87 DQ33 129 S3#*
4 DQ2 46 DQMB2 88 DQ34 130 DQMB6
5 DQ3 47 DQMB3 89 DQ35 131 DQMB7
6VDD 48 DNU 90 VDD 132 RFU
7 DQ4 49 VDD 91 DQ36 133 VDD
8 DQ5 50 NC 92 DQ37 134 NC
9 DQ6 51 NC 93 DQ38 135 NC
10 DQ7 52 NC 94 DQ39 136 NC
11 DQ8 53 NC 95 DQ40 137 NC
12 VSS 54 VSS 96 VSS 138 VSS
13 DQ9 55 DQ16 97 DQ41 139 DQ48
14 DQ10 56 DQ17 98 DQ42 140 DQ49
15 DQ11 57 DQ18 99 DQ43 141 DQ50
16 DQ12 58 DQ19 100 DQ44 142 DQ51
17 DQ13 59 VDD 101 DQ45 143 VDD
18 VDD 60 DQ20 102 VDD 144 DQ52
19 DQ14 61 NC 103 DQ46 145 NC
20 DQ15 62 NC 104 DQ47 146 NC
21 NC 63 CKE1* 105 NC 147 NC
22 NC 64 VSS 106 NC 148 VSS
23 VSS 65 DQ21 107 VSS 149 DQ53
24 NC 66 DQ22 108 NC 150 DQ54
25 NC 67 DQ23 109 NC 151 DQ55
26 VDD 68 VSS 110 VDD 152 VSS
27 WE# 69 DQ24 111 CAS# 153 DQ56
28 DQMB0 70 DQ25 112 DQMB4 154 DQ57
29 DQMB1 71 DQ26 113 DQMB5 155 DQ58
30 S0# 72 DQ27 114 S1#* 156 DQ59
31 DNU 73 VDD 115 RAS# 157 VDD
32 VSS 74 DQ28 116 VSS 158 DQ60
33 A0 75 DQ29 117 A1 159 DQ61
34 A2 76 DQ30 118 A3 160 DQ62
35 A4 77 DQ31 119 A5 161 DQ63
36 A6 78 VSS 120 A7 162 VSS
37 A8 79 CK2 121 A9 163 CK3
38 A10 80 NC 122 BA0 164 NC
39 BA1 81 NC/WP** 123 A11 165 SA0
40 VDD 82 SDA 124 VDD 166 SA1
41 VDD 83 SCL 125 CK1 167 SA2
42 CK0 84 VDD 126 RFU 168 VDD
*128MB version only **-133/-10E versions only
PIN ASSIGNMENT (Front View)
SYNCHRONOUS
DRAM MODULE MT8LSDT864A, MT16LSDT1664A
For the latest data sheet, please refer to the Micron Web
site: www.micron.com/mti/msp/html/datasheet.html
FEATURES
PC66-, PC100- and PC133-compliant
JEDEC-standard 168-pin, dual in-line memory
module (DIMM)
Utilizes 100 MHz, 125 MHz and 133 MHz SDRAM
components
Unbuffered
64MB (8 Meg x 64) and 128MB (16 Meg x 64)
Single +3.3V ±0.3V power supply
Fully synchronous; all signals registered on
positive edge of system clock
Internal pipelined operation; column address can
be changed every clock cycle
Internal SDRAM banks for hiding row access/
precharge
Programmable burst lengths: 1, 2, 4, 8 or full page
Auto Precharge, includes CONCURRENT AUTO
PRECHARGE, and Auto Refresh Modes
Self Refresh Mode
64ms, 4,096-cycle refresh
LVTTL-compatible inputs and outputs
Serial Presence-Detect (SPD)
OPTIONS MARKING
Operating Temperature Range
Commercial (-0oC to +70oC) G
Extended (-40oC to +85oC) I
Frequency/CAS Latency
133 MHz/CL = 2 (7.5, 133MHz SDRAMs) -13E
133 MHz/CL = 3 (7.5ns, 133 MHz SDRAMs) -133
100 MHz/CL = 2 (8ns, 125 MHz SDRAMs) -10E
66 MHz/CL = 2 (10ns, 100 MHz SDRAMs) -662
168-Pin DIMM
64MB, 66 MHz; 64MB, 100 MHz; 128MB
KEY SDRAM COMPONENT
TIMING PARAMETERS
MODULE SPEED CAS ACCESS SETUP HOLD
MARKING GRADE LATENCY TIME TIME TIME
-13E -7E 2 5.4ns 1.5ns 0.8ns
-133 -75 3 5.4ns 1.5ns 0.8ns
-10E -8E 2 6ns 2ns 1ns
-662 -10 2 9ns 3ns 1ns
Micron is a registered trademark of Micron Technology, Inc.
2
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 – Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
GENERAL DESCRIPTION
The MT8LSDT864A and MT16LSDT1664A are high-
speed CMOS, dynamic random-access, 64MB and 128MB
memories organized in a x64 configuration. These
modules use internally configured quad-bank SDRAMs
with a synchronous interface (all signals are registered
on the positive edge of the clock signals CK0-CK3).
Read and write accesses to the SDRAM modules are
burst oriented; accesses start at a selected location and
continue for a programmed number of locations in a
programmed sequence. Accesses begin with the regis-
tration of an ACTIVE command, which is then fol-
lowed by a READ or WRITE command. The address bits
registered coincident with the ACTIVE command are
used to select the bank and row to be accessed (BA0, BA1
select the bank, A0-A11 select the row). The address bits
registered coincident with the READ or WRITE com-
mand are used to select the starting column location for
the burst access.
These modules provide for programmable READ or
WRITE burst lengths of 1, 2, 4 or 8 locations, or the full
page, with a burst terminate option. An auto precharge
function may be enabled to provide a self-timed row
precharge that is initiated at the end of the burst
sequence.
These modules use an internal pipelined architec-
ture to achieve high-speed operation. This architecture
is compatible with the 2n rule of prefetch architectures,
but it also allows the column address to be changed on
every clock cycle to achieve a high-speed, fully random
access. Precharging one bank while accessing one of the
other three banks will hide the precharge cycles and
provide seamless, high-speed, random-access opera-
tion.
These modules are designed to operate in 3.3V, low-
power memory systems. An auto refresh mode is pro-
vided, along with a power-saving, power-down mode.
All inputs and outputs are LVTTL-compatible.
SDRAM modules offer substantial advances in DRAM
operating performance, including the ability to syn-
chronously burst data at a high data rate with auto-
matic column-address generation, the ability to inter-
leave between internal banks in order to hide precharge
time and the capability to randomly change column
addresses on each clock cycle during a burst access. For
more information regarding SDRAM operation, refer to
the 64Mb x4, x8, x16 SDRAM data sheet.
SERIAL PRESENCE-DETECT OPERATION
These modules incorporate serial presence-detect
(SPD). The SPD function is implemented using a 2,048-
bit EEPROM. This nonvolatile storage device contains
256 bytes. The first 128 bytes can be programmed by
Micron to identify the module type and various SDRAM
organizations and timing parameters. The remaining
128 bytes of storage are available for use by the cus-
tomer. System READ/WRITE operations between the
master (system logic) and the slave EEPROM device
(DIMM) occur via a standard IIC bus using the DIMM’s
SCL (clock) and SDA (data) signals, together with SA(2:0),
which provide eight unique DIMM/EEPROM addresses.
PART NUMBERS
PART NUMBER CONFIG BUS SPEED TEMP
MT8LSDT864AG-13E_ 8 Meg x 64 133 MHz 0
o
to +70
o
MT8LSDT864AG-133_ 8 Meg x 64 133 MHz 0
o
to +70
o
MT8LSDT864AG-10E_ 8 Meg x 64 100 MHz 0
o
to +70
o
MT8LSDT864AG-662_ 8 Meg x 64 66 MHz 0
o
to +70
o
MT16LSDT1664AG-13E_ 16 Meg x 64 133MHz 0
o
to +70
o
MT16LSDT1664AG-133_ 16 Meg x 64 133 MHz 0
o
to +70
o
MT16LSDT1664AG-10E_ 16 Meg x 64 100 MHz 0
o
to +70
o
MT16LSDT1664AG-662_ 16 Meg x 64 66 MHz 0
o
to +70
o
MT8LSDT864AI-133_ 8 Meg x 64 133 MHz -40
o
to +85
o
MT8LSDT864AI-10E_ 8 Meg x 64 100 MHz -40
o
to +85
o
MT8LSDT864AI-662_ 8 Meg x 64 66 MHz -40
o
to +85
o
MT16LSDT1664AI-133_ 16 Meg x 64 133 MHz -40
o
to +85
o
MT16LSDT1664AI-10E_ 16 Meg x 64 100 MHz -40
o
to +85
o
MT16LSDT1664AI-662_ 16 Meg x 64 66 MHz -40
o
to +85
o
NOTE: All part numbers end with a two-place code (not
shown), designating component and PCB revisions.
Consult factory for current revision codes. Example:
MT8LSDT864AG-10EB4.
3
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 – Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
MT8LSDT864A (64MB)
DQM CS#
U8
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DQMB7
DQM CS#
U6
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQMB6
DQM CS#
U4
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQMB5
DQM CS#
U2
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQMB4
DQM CS#
U9
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQMB3
DQM CS#
U7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQMB2
DQM CS#
U3
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQMB1
DQM CS#
U1
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQMB0
S2#
S0#
U0-U7 = MT48LC8M8A2GT SDRAMs
A0
SA0
SPD
SDA
A1
SA1
A2
SA2
RAS#
CAS#
CKE0
WE#
RAS#: SDRAMs U0-U7
CAS#: SDRAMs U0-U7
CKE0: SDRAMs U0-U7
WE#: SDRAMs U0-U7
A0-A11: SDRAMs U0-U7
BA0: SDRAMs U0-U7
BA1: SDRAMs U0-U7
A0-A11
BA0
BA1
V
DD
V
SS
SDRAMs U0-U7
SDRAMs U0-U7
10pF
CK2, CK3
U0
U4
U1
U5
CK0
U2
U6
U3
U7
CK1
10pF
CK1, CK3
SDRAM
SDRAM
SDRAM
SDRAM
CK0
SDRAM
SDRAM
SDRAM
SDRAM
CK2
3.3pF
3.3pF
66 MHz VERSION
100 MHz/133 MHz VERSIONS
SCL
WP
47K
U10
NOTE: All resistor values are 10 ohms.
4
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
MT16LSDT1664A (128MB)
DQM CS#
U8
U0-U15 = MT48LC8M8A2TG SDRAMs
A0
SA0
SPD
SDA
A1
SA1
A2
SA2
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
DQMB7
DQM CS#
U6
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
DQMB6
DQM CS#
U4
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQMB5
DQM CS#
U2
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
DQMB4
DQM CS#
U9
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
DQMB3
DQM CS#
U7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
DQMB2
DQM CS#
U3
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DQMB1
DQM CS#
U1
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQMB0
S2#
S0#
CKE1
CKE0
CAS#
RAS#
WE#
CKE: SDRAMs U8-U15
CKE: SDRAMs U0-U7
CAS#: SDRAMs U0-U15
RAS#: SDRAMs U0-U15
WE#: SDRAMs U0-U15
A0-A11: SDRAMs U0-U15
BA0: SDRAMs U0-U15
BA1: SDRAMs U0-U15
A0-A11
BA0
BA1
VDD
VSS
SDRAMs U0-U15
SDRAMs U0-U15
DQM CS#
U12
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U14
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U16
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U18
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
S1#
DQM CS#
U11
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U13
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U17
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQM CS#
U19
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
S3#
VDD
10K
SDRAM
SDRAM
SDRAM
SDRAM
CK0
3.3pF
SDRAM
SDRAM
SDRAM
SDRAM
CK1
3.3pF
SDRAM
SDRAM
SDRAM
SDRAM
CK2
3.3pF
SDRAM
SDRAM
SDRAM
SDRAM
CK3
3.3pF
SCL
WP
47K
NOTE: All resistor values are 10 ohms unless otherwise specified.
5
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
PIN DESCRIPTIONS
PIN NUMBERS SYMBOL TYPE DESCRIPTION
115, 111, 27 RAS#, CAS#, Input Command Inputs: RAS#, CAS# and WE# (along with
WE# S0#-S3#) define the command being entered.
42, 79, 125, 163 CK0-CK3 Input Clock: CK0-CK3 are driven by the system clock. All SDRAM
input signals are sampled on the positive edge of CK. CK
also increments the internal burst counter and controls
the output registers.
63, 128 CKE1, CKE0 Input Clock Enable: CKE0-CKE1 activate (HIGH) and deactivate
(LOW) the CK0-CK3 signals. Deactivating the clock provides
PRECHARGE POWER-DOWN and SELF REFRESH operation
(all banks idle), ACTIVE POWER-DOWN (row ACTIVE in any
bank) or CLOCK SUSPEND operation (burst access in
progress). CKE0-CKE1 are synchronous except after the
device enters power-down and self refresh modes, where
CKE0-CKE1 become asynchronous until after exiting the
same mode. The input buffers, including CK0-CK3, are
disabled during power-down and self refresh modes,
providing low standby power.
30, 45, 114, 129 S0#-S3# Input Chip Select: S0#-S3# enable (registered LOW) and disable
(registered HIGH) the command decoder. All commands are
masked when S0#-S3# are registered HIGH. S0#-S3# are
considered part of the command code.
28-29, 46-47, DQMB0-DQMB7 Input Input/Output Mask: DQMB is an input mask signal for write
112-113, 130-131 accesses and an output enable signal for read accesses.
Input data is masked when DQMB is sampled HIGH during
a WRITE cycle. The output buffers are placed in a High-Z
state (two-clock latency) when DQMB is sampled HIGH
during a READ cycle.
39, 122 BA0, BA1 Input Bank Address: BA0 and BA1 define to which bank the
ACTIVE, READ, WRITE or PRECHARGE command is being
applied.
33-38, 117-121, 123 A0-A11 Input Address Inputs: A0-A11 are sampled during the ACTIVE
command (row-address A0-A11) and READ/WRITE com-
mand (column-address A0-A8, with A10 defining AUTO
PRECHARGE) to select one location out of the memory
array in the respective bank. A10 is sampled during a
PRECHARGE command to determine if all banks are to be
precharged (A10 HIGH) or bank selected by BA0, BA1
(LOW). The address inputs also provide the op-code during
a LOAD MODE REGISTER command.
81 WP Input Write Protect: Serial presence-detect hardware write
protect. Applies to -10E/-10C versions only.
83 SCL Input Serial Clock for Presence-Detect: SCL is used to synchro-
nize the presence-detect data transfer to and from the
module.
165-167 SA0-SA2 Input Presence-Detect Address Inputs: These pins are used to
configure the presence-detect device.
6
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
PIN DESCRIPTIONS (continued)
PIN NUMBERS SYMBOL TYPE DESCRIPTION
2-5, 7-11, 13-17, 19-20, DQ0-DQ63 Input/ Data I/Os: Data bus.
55-58, 60, 65-67, 69-72, Output
74-77, 86-89, 91-95,
97-101, 103-104, 139-142,
144, 149-151, 153-156,
158-161
82 SDA Input/ Serial Presence-Detect Data: SDA is a bidirectional pin
Output used to transfer addresses and data into and data out of
the presence-detect portion of the module.
6, 18, 26, 40, 41, 49, 59, VDD Supply Power Supply: +3.3V ±0.3V.
73, 84, 90, 102, 110,
124, 133, 143, 157, 168
1, 12, 23, 32, 43, 54, 64, VSS Supply Ground.
68, 78, 85, 96, 107, 116,
127, 138, 148, 152, 162
126, 132 RFU Reserved for Future Use: These pins should be left
unconnected.
31, 44, 48 DNU Do Not Use: These pins are not connected on these
modules but are assigned pins on the compatible DRAM
version.
7
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
SPD CLOCK AND DATA CONVENTIONS
Data states on the SDA line can change only during
SCL LOW. SDA state changes during SCL HIGH are
reserved for indicating start and stop conditions
(Figures 1 and 2).
SPD START CONDITION
All commands are preceded by the start condition,
which is a HIGH-to-LOW transition of SDA when SCL
is HIGH. The SPD device continuously monitors the
SDA and SCL lines for the start condition and will not
respond to any command until this condition has been
met.
SPD STOP CONDITION
All communications are terminated by a stop condi-
tion, which is a LOW-to-HIGH transition of SDA when
SCL is HIGH. The stop condition is also used to place
the SPD device into standby power mode.
SPD ACKNOWLEDGE
Acknowledge is a software convention used to indi-
cate successful data transfers. The transmitting device,
either master or slave, will release the bus after trans-
mitting eight bits. During the ninth clock cycle, the
receiver will pull the SDA line LOW to acknowledge
that it received the eight bits of data (Figure 3).
The SPD device will always respond with an ac-
knowledge after recognition of a start condition and its
slave address. If both the device and a WRITE operation
have been selected, the SPD device will respond with an
acknowledge after the receipt of each subsequent eight
bit word. In the read mode the SPD device will transmit
eight bits of data, release the SDA line and monitor the
line for an acknowledge. If an acknowledge is detected
and no stop condition is generated by the master, the
slave will continue to transmit data. If an acknowledge
is not detected, the slave will terminate further data
transmissions and await the stop condition to return to
standby power mode.
Figure 1
Data Validity
SCL
SDA
DATA STABLE DATA STABLEDATA
CHANGE
SCL
SDA
START
BIT
STOP
BIT
Figure 2
Definition of Start and Stop
SCL from Master
Data Output
from Transmitter
Data Output
from Receiver
98
Acknowledge
Figure 3
Acknowledge Response From Receiver
8
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
SERIAL PRESENCE-DETECT MATRIX
BYTE DESCRIPTION ENTRY (VERSION) SYMBOL MT8LSDT864A MT16LSDT1664A
0 NUMBER OF BYTES USED BY MICRON 128 80 80
1 TOTAL NUMBER OF SPD MEMORY BYTES 256 08 08
2 MEMORY TYPE SDRAM 04 04
3 NUMBER OF ROW ADDRESSES 12 0C 0C
4 NUMBER OF COLUMN ADDRESSES 9 09 09
5 NUMBER OF BANKS 1 or 2 01 02
6 MODULE DATA WIDTH 64 40 40
7 MODULE DATA WIDTH (continued) 0 00 00
8 MODULE VOLTAGE INTERFACE LEVELS LVTTL 01 01
9 SDRAM CYCLE TIME 7 (-13E) tCK 70 70
(CAS LATENCY = 3) 7.5 (-133) 75 75
8 (-10E) 80 80
10 (-662) A0 A0
10 SDRAM ACCESS FROM CLOCK 5.4 (-13E/-133) tAC 54 54
(CAS LATENCY = 3) 6 (-10E) 60 60
7.5 (-662) 75 75
11 MODULE CONFIGURATION TYPE NONPARITY 00 00
12 REFRESH RATE/TYPE 15.6µs/SELF 80 80
13 SDRAM WIDTH (PRIMARY SDRAM) 8 08 08
14 ERROR-CHECKING SDRAM DATA WIDTH NONE 00 00
15 MINIMUM CLOCK DELAY FROM BACK-TO- 1 tCCD 01 01
BACK RANDOM COLUMN ADDRESSES
16 BURST LENGTHS SUPPORTED 1, 2, 4, 8, PAGE 8F 8F
17 NUMBER OF BANKS ON SDRAM DEVICE 4 04 04
18 CAS LATENCIES SUPPORTED 2, 3 06 06
19 CS LATENCY 0 01 01
20 WE LATENCY 0 01 01
21 SDRAM MODULE ATTRIBUTES UNBUFFERED 00 00
22 SDRAM DEVICE ATTRIBUTES: GENERAL 0E 0E 0E
23 SDRAM CYCLE TIME 7.5 (-13E) tCK 75 75
(CAS LATENCY = 2) 10 (-133/-10E) A0 A0
15 (-662) F0 F0
24 SDRAM ACCESS FROM CK 5.4 (-13E) tAC 54 54
(CAS LATENCY = 2) 6 (-133/-10E) 60 60
9 (-662) 90 90
25 SDRAM CYCLE TIME tCK 00 00
(CAS LATENCY = 1)
26 SDRAM ACCESS FROM CK tAC 00 00
(CAS LATENCY = 1)
27 MINIMUM ROW PRECHARGE TIME 15 (-13E) tRP 0F 0F
20 (-133/-10E) 14 14
30 (-662) 1E 1E
28 MINIMUM ROW ACTIVE TO ROW ACTIVE 14 (-13E) tRRD 0E 0E
15 (-133) 0F 0F
20 (-10E/-662) 14 14
NOTE: 1/0: Serial Data, driven to HIGH/driven to LOW.
9
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
SERIAL PRESENCE-DETECT MATRIX (continued)
BYTE DESCRIPTION ENTRY (VERSION) SYMBOL MT8LSDT864A MT16LSDT1664A
29 MINIMUM RAS# TO CAS# DELAY 15 (-13E) tRCD 0F 0F
20 (-133/-10E) 14 14
30 (-662) 1E 1E
30 MINIMUM RAS# PULSE WIDTH 37 (-13E) tRAS 25 25
44 (-133) 2C 2C
50 (-10E) 32 32
60 (-662) 3C 3C
31 MODULE BANK DENSITY 64MB 10 10
32 COMMAND AND ADDRESS SETUP TIME 1.5 (-13E/-133)
t
AS,
t
CMS
15 15
2 (-10E/-662) 20 20
33 COMMAND AND ADDRESS HOLD TIME 0.8 (-13E/-133)
t
AH,
t
CMH
08 08
1 (-10E/-662) 10 10
34 DATA SIGNAL INPUT SETUP TIME 1.5 (-13E/-133) tDS 15 15
2 (-10E/-662) 20 20
35 DATA SIGNAL INPUT HOLD TIME` 0.8(-13E/-133) tDH 08 08
1 (-10E/-662) 10 10
36-61 RESERVED 00 00
62 SPD REVISION REV. 1.2 12 12
63 CHECKSUM FOR BYTES 0-62 (-13E) 4F 50
(-133) 9D 9E
(-10E) E5 E6
(-662) B8 B9
64 MANUFACTURERS JEDEC ID CODE MICRON 2C 2C
65-71 MANUFACTURERS JEDEC ID CODE FF FF
(continued)
72 MANUFACTURING LOCATION 01 01
02 02
03 03
04 04
05 05
06 06
07 07
08 08
09 09
73-90 MODULE PART NUMBER (ASCII) xx xx
91 PCB IDENTIFICATION CODE 1 01 01
20202
30303
40404
50505
NOTE: 1. 1/0: Serial Data, driven to HIGH/driven to LOW.
2. x = Variable Data.
10
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8, 16 MEG x 64
SDRAM DIMMs
SERIAL PRESENCE-DETECT MATRIX (continued)
BYTE DESCRIPTION ENTRY (VERSION) SYMBOL MT8LSDT864A MT16LSDT1664A
91 PCB IDENTIFICATION CODE (continued) 6 06 06
70707
80808
90909
92 IDENTIFICATION CODE (continued) 0 00 00
93 YEAR OF MANUFACTURE IN BCD xx xx
94 WEEK OF MANUFACTURE IN BCD xx xx
95-98 MODULE SERIAL NUMBER xx xx
99-125 MANUFACTURER-SPECIFIC DATA (RSVD) ––
126 SYSTEM FREQUENCY 100 MHz
(-13E/-133/-10E) 64 64
66 MHz (-662) 66 66
127 SDRAM COMPONENT AND CLOCK DETAIL (-13E/-133/-10E) AF FF
(-662) CF FF
NOTE: 1. 1/0: Serial Data, driven to HIGH/driven to LOW.
2. x = Variable Data.
11
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8, 16 MEG x 64
SDRAM DIMMs
COMMANDS
Truth Table 1 provides a general reference of avail-
able commands. For a more detailed description of
TRUTH TABLE 1 – COMMANDS AND DQMB OPERATION
(Note: 1)
NAME (FUNCTION) CS# RAS# CAS# WE# DQMB ADDR DQs NOTES
COMMAND INHIBIT (NOP) H XXXX X X
NO OPERATION (NOP) L H H H X X X
ACTIVE (Select bank and activate row) L L H H X Bank/Row X 3
READ (Select bank and column, and start READ burst) L H L H L/H8Bank/Col X 4
WRITE (Select bank and column, and start WRITE burst) L H L L L/H8Bank/Col Valid 4
BURST TERMINATE L H H L X X Active
PRECHARGE (Deactivate row in bank or banks) L L H L X Code X 5
AUTO REFRESH or L L L H X X X 6, 7
SELF REFRESH (Enter self refresh mode)
LOAD MODE REGISTER L L L L X Op-Code X 2
Write Enable/Output Enable ––––LActive 8
Write Inhibit/Output High-Z ––––HHigh-Z 8
NOTE: 1. CKE is HIGH for all commands shown except SELF REFRESH.
2. A0-A11 define the op-code written to the Mode Register.
3. A0-A11 provide row address, and BA0, BA1 determine which bank is made active.
4. A0-A8 provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables
the auto precharge feature; BA0, BA1 determine which bank is being read from or written to.
5. A10 LOW: BA0, BA1 determine which bank is being precharged. A10 HIGH: all banks are precharged and BA0, BA1 are
Dont Care.
6. This command is AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
7. Internal refresh counter controls row addressing; all inputs and I/Os are Dont Care except for CKE.
8. Activates or deactivates the DQs during WRITEs (zero-clock delay) and READs (two-clock delay).
commands and operations, refer to the 64Mb x4, x8,
x16 SDRAM data sheet.
12
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
Table 1
Burst Definition
Burst Starting Column Order of Accesses Within a Burst
Length Address Type = Sequential Type = Interleaved
A0
200-1 0-1
11-0 1-0
A1 A0
0 0 0-1-2-3 0-1-2-3
40 1 1-2-3-0 1-0-3-2
1 0 2-3-0-1 2-3-0-1
1 1 3-0-1-2 3-2-1-0
A2 A1 A0
0 0 0 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7
0 0 1 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6
0 1 0 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5
80 1 1 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4
1 0 0 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3
1 0 1 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2
1 1 0 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1
1 1 1 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0
Full n = A0-A8 Cn, Cn + 1, Cn + 2
Page Cn + 3, Cn + 4... Not supported
(y) (location 0-y) Cn - 1,
Cn
M3 = 0
1
2
4
8
Reserved
Reserved
Reserved
Full Page
M3 = 1
1
2
4
8
Reserved
Reserved
Reserved
Reserved
Operating Mode
Standard Operation
All other states reserved
0
-
0
-
Defined
-
0
1
Burst Type
Sequential
Interleaved
CAS Latency
Reserved
Reserved
2
3
Reserved
Reserved
Reserved
Reserved
Burst Length
M0
0
1
0
1
0
1
0
1
Burst LengthCAS Latency BT
A9 A7 A6 A5 A4 A3
A8 A2 A1 A0
Mode Register (Mx)
Address Bus
976543
8210
M1
0
0
1
1
0
0
1
1
M2
0
0
0
0
1
1
1
1
M3
M4
0
1
0
1
0
1
0
1
M5
0
0
1
1
0
0
1
1
M6
0
0
0
0
1
1
1
1
M6-M0
M8 M7
Op Mode
A10
A11
10
11
Reserved* WB
0
1
Write Burst Mode
Programmed Burst Length
Single Location Access
M9
*Should program
M11, M10 = 0, 0
to ensure compatibility
with future devices.
Figure 4
Mode Register Definition
NOTE: 1. For full-page accesses: y = 512.
2. For a burst length of two, A1-A8 select the block-
of-two burst; A0 selects the starting column
within the block.
3. For a burst length of four, A2-A8 select the block-
of-four burst; A0-A1 select the starting column
within the block.
4. For a burst length of eight, A3-A8 select the
block-of-eight burst; A0-A2 select the starting
column within the block.
5. For a full-page burst, the full row is selected, and
A0-A8 select the starting column.
6. Whenever a boundary of the block is reached
within a given sequence above, the following
access wraps within the block.
7. For a burst length of one, A0-A8 select the unique
column to be accessed, and Mode Register bit M3
is ignored.
13
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
ABSOLUTE MAXIMUM RATINGS*
Voltage on VDD Supply Relative to VSS .... -1V to +4.6V
Voltage on Inputs, NC or I/O Pins
Relative to VSS ..................................... -1V to +4.6V
Operating Temperature, TA (ambient) ... 0°C to +70°C
Storage Temperature (plastic) ............ -55°C to +125°C
Power Dissipation ................................................... 8W
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1,2) (VDD = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
SUPPLY VOLTAGE VDD 3 3.6 V
INPUT HIGH VOLTAGE: Logic 1; All inputs VIH 2VDD + 0.3 V 3
INPUT LOW VOLTAGE: Logic 0; All inputs VIL -0.5 0.8 V 3
INPUT LEAKAGE CURRENT: DQMB0-DQMB7 II1-10 10 µA 4
Any input 0V VIN VDD CK0-CK3, S0#-S3# II2-20 20 µA
(All other pins not under test = 0V) CKE0-CKE1 II3-40 40 µA
RAS#, CAS#, A0-A11, II4-80 80 µA 4
BA0-BA1, WE#
OUTPUT LEAKAGE CURRENT: DQ0-DQ63 IOZ -10 10 µA 4
DQs are disabled; 0V VOUT VDD
OUTPUT LEVELS: VOH 2.4 V
Output High Voltage (IOUT = -4mA)
Output Low Voltage (IOUT = 4mA) VOL 0.4 V
NOTE: 1. All voltages referenced to VSS.
2. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper
device operation is ensured. The two AUTO REFRESH command wake-ups should be repeated any time the tREF
refresh requirement is exceeded.
3. VIH overshoot: VIH (MAX) = VDD + 2V for a pulse width 10ns, and the pulse width cannot be greater than one third of
the cycle rate. VIL undershoot: VIL (MIN) = -2V for a pulse width 10ns, and the pulse width cannot be greater than
one third of the cycle rate.
4. 64MB module values will be half of those shown.
14
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8, 16 MEG x 64
SDRAM DIMMs
IDD SPECIFICATIONS AND CONDITIONS
(Notes: 1-4) (VDD = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL SIZE -13E -133 -10E -662 UNITS NOTES
OPERATING CURRENT: Active Mode; 64MB 1,000 920 760 720 5, 6,
Burst = 2; READ or WRITE; tRC = tRC (MIN); IDD1mA 7, 8
CAS latency = 3 128MB 1,360 1,280 1,040 960
STANDBY CURRENT: Power-Down Mode; IDD264MB 16 16 16 24 mA 8
CKE = LOW; All banks idle 128MB 32 32 32 48
STANDBY CURRENT: Active Mode; S0#-S3# = HIGH; 64MB 360 360 280 240 5, 9,
CKE = HIGH; All banks active after tRCD met; IDD3mA 7, 8
No accesses in progress 128MB 720 720 560 480
OPERATING CURRENT: Burst Mode; Continuous burst; 64MB 1,200 1,120 960 840 5, 6,
READ or WRITE; All banks active; IDD4mA 7, 8
CAS latency = 3 128MB 1,560 1,480 1,240 1,080
AUTO REFRESH CURRENT: IDD564MB 1,840 1,680 1,520 1,360 mA 5, 6,
CKE = HIGH; S0#-S3# = HIGH tRC = tRC (MIN); CL = 3 128MB 2,200 2,040 1,800 1,600 7, 8,
IDD664MB 24 24 24 24 mA 9, 10
tRC = 15.625µs; CL = 3 128MB 48 48 48 48
SELF REFRESH CURRENT: CKE 0.2V IDD764MB 8 8 8 16 mA 11
128MB 16 16 16 32
MAX
NOTE: 1. All voltages referenced to VSS.
2. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper
device operation is ensured. The two AUTO REFRESH command wake-ups should be repeated any time the tREF
refresh requirement is exceeded.
3. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. If the input
transition time is longer than 1ns, then the timing is referenced at VIL (MAX) and VIL (MIN) and no longer at the 1.5V
crosspover point.
4. IDD specifications are tested after the device is properly initialized.
5. IDD is dependent on output loading and cycle rates. Specified values are obtained with minimum cycle time and the
outputs open.
6. The IDD current will decrease as the CAS latency is reduced. This is due to the fact that the maximum cycle rate is
slower as the CAS latency is reduced.
7. Address transitions average one transition every two clocks.
8. tCK = 7.5ns for -133, 10ns for -10E and 15ns for -662.
9. Other input signals are allowed to transition no more than once every two clocks and are otherwise at valid VIH or VIL
levels.
10. CKE is high during refresh command period (tRFC [MIN]) else CKE is low. The IDD6 limit is actually a nominal value and
does not result in a fail value.
11. Enables on-chip refresh and address counters.
15
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
CAPACITANCE
(Note: 1)
PARAMETER SYMBOL MIN MAX MIN MAX UNITS
Input Capacitance: A0-A11, BA0, BA1, RAS#, CAS#, WE# CI122 30 44 60 pF
Input Capacitance: CK0-CK3 CI212 18 12 18 pF
Input Capacitance: S0#-S3# CI312 16 12 16 pF
Input Capacitance: CKE0, CKE1 CI422 30 22 30 pF
Input Capacitance: DQMB0#-DQMB7# CI54679pF
Input Capacitance: SCL, SA0-SA2 CI666pF
Input/Output Capacitance: DQ0-DQ63, SDA CIO 6 8 10 14 pF
64MB 128MB
NOTE: This parameter is sampled. VDD = +3.3V; f = 1 MHz.
16
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
SDRAM COMPONENT* AC ELECTRICAL CHARACTERISTICS
(Notes: 1-6; notes appear below and on next page)
AC CHARACTERISTICS -13E (PC133) -133 (PC133) -10E (PC100) -662 (PC66)
PARAMETER SYMBOL MIN MAX MIN MAX MIN MAX MIN MAX UNITS NOTES
Access time from CK (pos. edge) CL = 3 tAC 5.4 5.4 6 7.5 ns 7
CL = 2 tAC 5.4 6 6 9 ns
Address hold time tAH 0.8 0.8 1 1 ns
Address setup time tAS 1.5 1.5 2 2 ns
CK high-level width tCH 2.5 2.5 3 3 ns
CK low-level width tCL 2.5 2.5 3 3 ns
Clock cycle time CL = 3 tCK 7 7.5 8 10 ns 8
CL = 2 tCK 7.5 10 10 15 ns 8
CKE hold time tCKH 0.8 0.8 1 1 ns
CKE setup time tCKS 1.5 1.5 2 2 ns
CS#, RAS#, CAS#, WE#, DQM hold time tCMH 0.8 0.8 1 1 ns
CS#, RAS#, CAS#, WE#, DQM setup time tCMS 1.5 1.5 2 2 ns
Data-in hold time tDH 0.8 0.8 1 1 ns
Data-in setup time tDS 1.5 1.5 2 2 ns
Data-out high-impedance time CL = 3 tHZ 5.4 5.4 6 8 ns 9
CL = 2 tHZ 5.4 7 7 10 ns 9
Data-out low-impedance time tLZ 1 1 1 2 ns
Data-out hold time (load) tOH 2.7 2.7 3 3 ns
Data-out hold time (no load) tOHN1.8 1.8 1.8 n/a ns 10
ACTIVE to PRECHARGE command tRAS 37 120,000 44 120,000 50 120,000 60 120,000 ns
ACTIVE to ACTIVE command period tRC 60 66 70 90 ns
AUTO REFRESH period tRCAR 15 66 70 90 ns
ACTIVE to READ or WRITE delay tRCD 64 20 20 30 ns
Refresh period (4,096 cycles) tREF 66 64 64 64 ms
PRECHARGE command period tRP 15 20 20 30 ns
ACTIVE bank A to ACTIVE bank B command tRRD 14 15 20 20 ns
Transition time tT 0.3 1.2 0.3 1.2 0.3 1.2 1 1.2 ns 11
WRITE recovery time tWR 1 CK + 1 CK + 1 CK + 1 CK + 12
7ns 7.5ns 8ns 8ns
14 15 15 15 ns 13
Exit SELF REFRESH to ACTIVE command tXSR 67 75 80 90 ns 14
*Specifications for the SDRAM components used on the module.
NOTE: 1. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature
range (0°C TA +70°C) is ensured.
2. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper
device operation is ensured. The two AUTO REFRESH command wake-ups should be repeated any time the tREF
refresh requirement is exceeded.
3. AC characteristics assume tT = 1ns.
4. In addition to meeting the transition rate specification, the clock and CKE must transit between VIH and VIL (or
between VIL and VIH) in a monotonic manner.
5. Outputs measured at 1.5V with equivalent load:
Q
50pF
17
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
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SDRAM DIMMs
NOTES: (continued)
6. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. If the input
transition time is longer than 1ns, then the timing is referenced at VIL (MAX) and VIL (MIN) and no longer at the 1.5V
crosspover point.
7. tAC for -133 at CL = 3 with no load is 4.6ns and is guaranteed by design.
8. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints
specified for the clock pin) during access or precharge states (READ, WRITE, including tWR, and PRECHARGE com-
mands). CKE may be used to reduce the data rate.
9. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to VOH or VOL. The
last valid data element will meet tOH before going High-Z.
10. Parameter guaranteed by design.
11. AC characteristics assume tT = 1ns.
12. Auto precharge mode only. The precharge timing budget (tRP) begins 7.5ns/8ns after the first clock delay, after the
last WRITE is executed.
13. Precharge mode only.
14. CK must be toggled a minimum of two times during this period.
18
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SDRAM DIMMs
AC FUNCTIONAL CHARACTERISTICS
(Notes: 1-6)
PARAMETER SYMBOL -133 -13E/ -10E -662 UNITS NOTES
READ/WRITE command to READ/WRITE command tCCD 1 1 1 tCK 7
CKE to clock disable or power-down entry mode tCKED 1 1 1 tCK 8
CKE to clock enable or power-down exit setup mode tPED 1 1 1 tCK 8
DQM to input data delay tDQD000
tCK 7
DQM to data mask during WRITEs tDQM 0 0 0 tCK 7
DQM to data high-impedance during READs tDQZ 2 2 2 tCK 7
WRITE command to input data delay tDWD 0 0 0 tCK 7
Data-in to ACTIVE command tDAL 5 4 4 tCK 9, 10
Data-in to PRECHARGE command tDPL 2 2 2 tCK 10, 11
Last data-in to burst STOP command tBDL 1 1 1 tCK 7
Last data-in to new READ/WRITE command tCDL 1 1 1 tCK 7
Last data-in to PRECHARGE command tRDL 2 2 2 tCK 10, 11
LOAD MODE REGISTER command to ACTIVE or REFRESH command tMRD 2 2 2 tCK 12
Data-out to high-impedance from PRECHARGE command CL = 3 tROH 3 3 3 tCK 7
CL = 2 tROH 2 2 2 tCK 7
NOTE: 1. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature
range (0°C TA +70°C) is ensured.
2. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper
device operation is ensured. The two AUTO REFRESH command wake-ups should be repeated any time the tREF
refresh requirement is exceeded.
3. AC characteristics assume tT = 1ns.
4. In addition to meeting the transition rate specification, the clock and CKE must transit between VIH and VIL (or
between VIL and VIH) in a monotonic manner.
5. Outputs measured at 1.5V with equivalent load:
6. AC timing and IDD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. If the input
transition time is longer than 1ns, then the timing is referenced at VIL (MAX) and VIL (MIN) and no longer at the 1.5V
crosspover point.
7. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter.
8. Timing actually specified by tCKS; clock(s) specified as a reference only at minimum cycle rate.
9. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate.
10. Based on tCK = 143 MHz for 13E, tCK = 133 MHz for -75, 100 MHz for -10E and 66 MHz for -662.
11. Timing actually specified by tWR.
12. JEDEC and PC100 specify three clocks.
Q
50pF
19
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8, 16 MEG x 64
SDRAM DIMMs
SERIAL PRESENCE-DETECT EEPROM AC OPERATING CONDITIONS
(Note: 1) (VDD = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
SCL LOW to SDA data-out valid tAA 0.3 3.5 µs
Time the bus must be free before a new transition can start tBUF 4.7 µs
Data-out hold time tDH 300 ns
SDA and SCL fall time tF 300 ns
Data-in hold time tHD:DAT 0 µs
Start condition hold time tHD:STA 4 µs
Clock HIGH period tHIGH 4 µs
Noise suppression time constant at SCL, SDA inputs tI 100 ns
Clock LOW period tLOW 4.7 µs
SDA and SCL rise time tR1µs
SCL clock frequency tSCL 100 KHz
Data-in setup time tSU:DAT 250 ns
Start condition setup time tSU:STA 4.7 µs
Stop condition setup time tSU:STO 4.7 µs
WRITE cycle time tWRC 10 ms 2
SERIAL PRESENCE-DETECT EEPROM DC OPERATING CONDITIONS
(Note: 1) (VDD = +3.3V ±0.3V)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
SUPPLY VOLTAGE VDD 3 3.6 V
INPUT HIGH VOLTAGE: Logic 1; All inputs VIH VDD x 0.7 VDD + 0.5 V
INPUT LOW VOLTAGE: Logic 0; All inputs VIL -1 VDD x 0.3 V
OUTPUT LOW VOLTAGE: IOUT = 3mA VOL 0.4 V
INPUT LEAKAGE CURRENT: VIN = GND to VDD ILI 10 µA
OUTPUT LEAKAGE CURRENT: VOUT = GND to VDD ILO 10 µA
STANDBY CURRENT: ISB 30 µA
SCL = SDA = VDD - 0.3V; All other inputs = GND or 3.3V +10%
POWER SUPPLY CURRENT: IDD 2mA
SCL clock frequency = 100 KHz
NOTE: 1. All voltages referenced to VSS.
NOTE: 1. All voltages referenced to VSS.
2. The SPD EEPROM WRITE cycle time (tWRC) is the time from a valid stop condition of a write sequence to the end of
the EEPROM internal erase/program cycle. During the WRITE cycle, the EEPROM bus interface circuit is disabled, SDA
remains HIGH due to pull-up resistor, and the EEPROM does not respond to its slave address.
20
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8, 16 MEG x 64
SDRAM DIMMs
SCL
SDA IN
SDA OUT
tLOW
tSU:STA tHD:STA
tFtHIGH tR
tBUF
tDH
tAA
tSU:STO
tSU:DAT
tHD:DAT
UNDEFINED
SERIAL PRESENCE-DETECT EEPROM
TIMING PARAMETERS
SYMBOL MIN MAX UNITS
tAA 0.3 3.5 µs
tBUF 4.7 µs
tDH 300 ns
tF 300 ns
tHD:DAT 0 µs
tHD:STA 4 µs
SPD EEPROM
SYMBOL MIN MAX UNITS
tHIGH 4 µs
tLOW 4.7 µs
tR1µs
tSU:DAT 250 ns
tSU:STA 4.7 µs
tSU:STO 4.7 µs
21
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ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
168-PIN DIMM
(64MB, 66 MHz)
.125 (3.18)
MAX
.054 (1.37)
.046 (1.17)
PIN 1 (PIN 85 ON BACKSIDE)
.700 (17.78)
TYP
.118 (3.00)
(2X)
.118 (3.00) TYP
4.550 (115.57)
.050 (1.27)
TYP
.118 (3.00)
TYP .039 (1.00)
TYP
.079 (2.00) R
(2X)
.039 (1.00)R (2X)
FRONT VIEW
.128 (3.25)
.118 (3.00)
PIN 84 (PIN 168 ON BACKSIDE)
(2X)
1.255 (31.88)
1.245 (31.62)
.250 (6.35) TYP
1.661 (42.18)
2.625 (66.68)
5.256 (133.50)
5.244 (133.20)
168-PIN DIMM
(64MB, 100 MHz)
.125 (3.18)
MAX
.054 (1.37)
.046 (1.17)
PIN 1 (PIN 85 ON BACKSIDE)
.700 (17.78)
TYP
.118 (3.00)
(2X)
.118 (3.00) TYP
4.550 (115.57)
.050 (1.27)
TYP
.118 (3.00)
TYP .039 (1.00)
TYP
.079 (2.00) R
(2X)
.039 (1.00)R (2X)
FRONT VIEW
.128 (3.25)
.118 (3.00)
PIN 84 (PIN 168 ON BACKSIDE)
(2X)
1.380 (35.05)
1.370 (34.80)
.250 (6.35) TYP
1.661 (42.18)
2.625 (66.68)
5.256 (133.50)
5.244 (133.20)
NOTE: All dimensions in inches (millimeters) MAX or typical where noted.
MIN
22
8, 16 Meg x 64 SDRAM DIMMs Micron Technology, Inc., reserves the right to change products or specifications without notice.
ZM06_5.p65 Rev. 3/00 ©2000, Micron Technology, Inc.
8, 16 MEG x 64
SDRAM DIMMs
NOTE: All dimensions in inches (millimeters) MAX or typical where noted.
MIN
168-PIN DIMM
(128MB)
.157 (4.00)
MAX
.054 (1.37)
.046 (1.17)
PIN 1 (PIN 85 ON BACKSIDE)
.700 (17.78)
TYP
.118 (3.00)
(2X)
.118 (3.00) TYP
4.550 (115.57)
.050 (1.27)
TYP
.118 (3.00)
TYP .039 (1.00)
TYP
.079 (2.00) R
(2X)
.039 (1.00)R (2X)
FRONT VIEW
.128 (3.25)
.118 (3.00)
PIN 84 (PIN 168 ON BACKSIDE)
(2X)
.250 (6.35) TYP
1.661 (42.18)
2.625 (66.68)
1.380 (35.05)
1.370 (34.80)
5.256 (133.50)
5.244 (133.20)
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron is a registered trademark of Micron Technology, Inc.
PRODUCT GUIDE
M3Q00
PART NUMBERING GUIDESPART SELECTOR ORDER INFORMATION
MICRON. A WORLD MEMORY LEADER
DRAM Modules
SDRAM Modules
DDR SDRAM Modules
RIMM™ Modules
MODULE
ORDER INFORMATION
208.368.3900
www.micronsemi.com
For more information
about our high-quality
Micron® Modules, visit
our Web site or phone
us today.
Micron Semiconductor Products, Inc.
8000 S. Federal Way, P.O. Box 6 • Boise, Idaho 83707-0006 • Tel: 208-368-3900 • Fax: 208-368-4617
Internet: www.micronsemi.com/mti • E-mail: prodmktg@micron.com
Customer Comment Line: 800-932-4992 • Customer Comment Fax Line: 01-208-368-5018
Micron Europe Limited
Micron House, Wellington Business Park Dukes Ride, Crowthorne Berkshire RG45 6LS United Kingdom
Tel: 44-1344-750750 Fax: 44-1344-750710
Micron Semiconductor (Deutschland) GmbH
Sternstrasse 20 D-85609 Aschheim Germany Tel: 49-89-904-8720 Fax: 49-89-904-87250
Micron Semiconductor Asia, Pte. Ltd.
5 Upper Aljunied Link #06-06 Quartz Industrial Bldg. Singapore 367903 Tel: 65-287-6006 Fax: 65-287-6556
Micron Technology Asia Pacific, Inc., Taiwan Branch
Suite 1010, 10th Floor 333 Keelung Road, Sec 1 Taipei, 110 Taiwan, ROC Tel: 886-2-2757-6622 Fax: 886-2-2757-6656
Micron Technology Italia, Srl
Via Antonio Pacinotti 5/7 Nucleo Industriale (AQ), Building 2 Avezzano (AQ) Italia 67051 Tel: 39-0863-423206 Fax: 39-0863-423283
Micron Technology Japan, K.K.
4-30 Shiba-Koen 3-chome 32 Mori Building 8F Minato-ku Tokyo 105, Japan Tel: 81-3-3436-5666 Fax: 81-3-3436-1444
©2000, Micron Technology, Inc.
Micron is a registered trademark of Micron Technology, Inc.
Rambus and RDRAM are registered trademarks and RIMM is a
trademark of Rambus Inc. Products and specifications are
subject to change without notice.
Rev. 8/00
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PART NUMBERING GUIDES
MICRON. A WORLD MEMORY LEADER
DRAM MODULE NUMBERING
SDRAM/DDR SDRAM/RDRAM® MODULE NUMBERING
MT18LD1672 A G-5 X
Micron Technology
Product Family
D = DRAM
DT = DRAM TSOP
Process Technology
L = Low Voltage (3.3V)
Module Special Designator
Blank = Fast Page Mode
X = Extended Data-Out
L = Extended Refresh
S = Self Refresh
Package Code
G = Gold-Plated SIMM/DIMM
M = Tin/Lead-Plated SIMM
HG = Small-Outline Gold DIMM
DG = Low-Profile, Double-Sided SIMM
(gold-plated)
DM = Low-Profile, Double-Sided SIMM
(tin/lead-plated)
Access Time
50ns = -5
60ns = -6
70ns = -7
Number of
Memory Components
Depth
Width
Module Version
A = 168-pin DIMM; unbuffered,
serial presence-detect
MT18L SDT1672 AG-10EC 7
Micron Technology
Product Family
SD = SDRAM
SDT = SDRAM TSOP
DDT = DDR SDRAM TSOP
VR = Rambus®
Process Technology
L = 3.3V
V = 2.5V
Printed Circuit Board
Revision Designator
Package Code
G = Gold-Plated SIMM/DIMM
HG = Small-Outline Gold DIMM
DG = Low-Profile, Double-Sided DIMM
Memory Bus Speed
66 MHz CAS Latency 2 (-10 SDRAMs) = -662
100 MHz CAS Latency 3 (-8C SDRAMs) = -10C
100 MHz CAS Latency 2 (-8E SDRAMs) = -10E
133 MHz CAS Latency 3 (-75 SDRAMs) = -133
133 MHz CAS Latency 2 (-7E SDRAMs) = -13E
200 MHz data rate, CAS Latency 2 (-8 DDR SDRAMs) = -202
266 MHz data rate, CAS Latency 2.5 (-75 DDR SDRAMs) = -265
266 MHz data rate, CAS Latency 2 (-7 DDR SDRAMs) = -262
700 MHz data rate, 53ns access time = -750
700 MHz data rate, 45ns access time = -745
800 MHz data rate, 53ns access time = -850
800 MHz data rate, 45ns access time = -845
800 MHz data rate, 40ns access time = -840
Number of
Memory Components
Depth
Width
Module Version
SDRAM
A = 168-pin/184-pin DIMM and 184-pin RIMM;
unbuffered, serial presence-detect
U = 100-pin DIMM; unbuffered,
serial presence-detect
G = 144-pin graphics SODIMM
Die Revision Designator
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MICRON. A WORLD MEMORY LEADER
DRAM MODULE PART SELECTOR
Data sheets are available at
www.micronsemi.com/datasheets/datasheet.html.
DRAM MODULES
DS = Double Sided, SS = Single Sided; M = Tin Plated, G = Gold Plated; U = 100-pin DIMM,
H = Small-Outline DIMM (SODIMM), (A) = see footnote references below,
(X) = EDO, no X = FPM version
MODULE KEY
72-pin SODIMM 4MB SS 1 Meg x 32 3.3V Gold (2) 1 Meg x 16 TSOP MT2LDT132HG 60 1.000" Now Now
8MB SS 2 Meg x 32 3.3V Gold (4) 1 Meg x 16 TSOP MT4LDT232HG 60 1.000" Now Now
16MB SS 4 Meg x 32 3.3V Gold (2) 4 Meg x 16 TSOP MT2LDT432HG 60 1.000" Now Now
16MB DS 4 Meg x 32 3.3V Gold (8) 4 Meg x 4 TSOP MT8LDT432HG 60 1.000" Now Now
32MB DS 8 Meg x 32 3.3V Gold (4) 4 Meg x 16 TSOP MT4LDT832HG 60 1.000" Now Now
72-pin SIMM 4MB SS 1 Meg x 32 Gold/Tin (2) 1 Meg x 16 MT2D132G/M 50, 60 .800" Now Now
8MB DS 2 Meg x 32 Gold/Tin (4) 1 Meg x 16 MT4D232DG/M 50, 60 .800" Now Now
16MB SS 4 Meg x 32 Gold/Tin (8) 4 Meg x 4 MT8D432G/M 50, 60 1.000" Now Now
16MB SS 4 Meg x 36 ECC Gold/Tin (9) 4 Meg x 4 MT9D436G/M 50, 60 1.000" Now Now
32MB DS 8 Meg x 36 ECC Gold/Tin (18) 4 Meg x 4 MT18D836G/M 50, 60 1.000" Now Now
32MB DS 8 Meg x 32 Gold/Tin (16) 4 Meg x 4 MT16D832G/M 50, 60 1.000" Now Now
100-pin DIMM 4MB SS 1 Meg x 32 3.3V Gold (2) 1 Meg x 16 MT2LD132UG 60 1.000" Now Now
8MB SS 2 Meg x 32 3.3V Gold (4) 1 Meg x 16 MT4LD232UG 60 1.000" Now Now
16MB SS 4 Meg x 32 3.3V Gold (2) 4 Meg x 16 TSOP MT2LDT432UG 60 1.000" Now Now
32MB DS 8 Meg x 32 3.3V Gold (4) 4 Meg x 16 TSOP MT4LDT832UG 60 1.000" Now Now
144-pin SODIMM 32MB DS 4 Meg x 64 3.3V Gold (4) 4 Meg x 16 TSOP MT4LDT464HG (S) 50, 60 1.000" Now Now
64MB DS 8 Meg x 64 3.3V Gold (8) 8 Meg x 8 TSOP MT8LDT864HG (S) 60 1.050" Now Now
168-pin DIMM 8MB DS 1 Meg x 64 3.3V Gold (4) 1 Meg x 16 TSOP MT4LDT164AG 60 1.000" Now Now
32MB SS 4 Meg x 64 3.3V Gold (4) 4 Meg x 16 TSOP MT4LDT464AG 50, 60 1.000" Now Now
32MB DS 4 Meg x 64 3.3V Gold (16) 4 Meg x 4 MT16LD464AG 60 1.000" Now Now
32MB DS 4 Meg x 72 3.3V ECC Gold (18) 4 Meg x 4 MT18LD472(A)G 60 UB = 1.000" Now Now
B = 1.000"
32MB SS 4 Meg x 72 3.3V ECC Gold (5) 4 Meg x 16 TSOP MT5LDT472(A)G 60 UB = 1.000" Now Now
B = 1.050"
64MB SS 8 Meg x 64 3.3V Gold (8) 8 Meg x 8 MT8LD864AG 50, 60 1.100" Now Now
64MB DS 8 Meg x 72 3.3V ECC Gold (36) 4 Meg x 4 MT36LD872(A)G 60 UB = 1.500" Now Now
B = 1.500"
64MB SS 8 Meg x 72 3.3V ECC Gold (9) 8 Meg x 8 MT9LD872(A)G 50, 60 UB = 1.100" Now Now
B = 1.250"
64MB SS 8 Meg x 72 3.3V ECC Gold (9) 8 Meg x 8 TSOP MT9LDT872G 50, 60 1.350" Now Now
128MB DS 16 Meg x 64 3.3V Gold (16) 16 Meg x 4 MT16LD1664AG 50, 60 1.250" Now Now
128MB DS 16 Meg x 72 3.3V ECC Gold (18) 16 Meg x 4 MT18LD1672(A)G 50, 60 UB = 1.250" Now Now
B = 1.100"
128MB DS 16 Meg x 72 3.3V ECC Gold (18) 16 Meg x 4 TSOP MT18LDT1672G 50, 60 2.000" Now Now
256MB DS 32 Meg x 72 3.3V ECC Gold (36) 16 Meg x 4 MT36LD3272G 50, 60 2.000" Now Now
256MB DS 32 Meg x 72 3.3V ECC Gold (36) 16 Meg x 4 TSOP MT36LDT3272G 50, 60 2.000" Now Now
*All DRAM modules are available in EDO or Fast Page Mode.
DS = Double Sided; SS = Single Sided; (A) = 8 CAS, SPD version, unbuffered; no A = Buffered version for x72 DIMMs; UB = Unbuffered; B = Buffered.
Highlighted parts are not recommended for new designs.
Module Module Speed
Family Density Description Components Part Number (ns) Height Sample Prod.
MICRON. A WORLD MEMORY LEADER
DS = Double Sided, SS = Single Sided; M = Tin Plated, G = Gold Plated; U = 100-pin DIMM,
UDG = Double-sided, dual-bank 100-pin DIMM, H = Small-Outline DIMM (SODIMM),
(A) = see footnote references below
MODULE KEY
SDRAM MODULES
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Module Module
Family Density Description Components Part Number Speed Die Rev. PCB (Height) MHz Samp. Prod. Note
100-pin DIMM 4MB SS 1 Meg x 32 3.3V Gold (2)1 Meg x 16 TSOP MT2LSDT132UG -10E1 E = Y72G 1 = 6649 (1")100 Now Now
-8E1 125 Now Now
8MB DS 2 Meg x 32 3.3V Gold (4)1 Meg x 16 TSOP MT4LSDT232UDG -10E1 E = Y72G 1 = 6649 (1")100 Now Now
-8E1 125 Now Now
16MB SS 4 Meg x 32 3.3V Gold (2)4 Meg x 16 TSOP MT2LSDT432UG -10C1 C = Y84 1 = 6660 (1")100 Now Now
-8C1 125 Now Now
32MB DS 8 Meg x 32 3.3V Gold (4)4 Meg x 16 TSOP MT4LSDT832UDG -10C1 C = Y84 1 = 6660 (1")100 Now Now
-8C1 125 Now Now
64MB DS 16 Meg x 32 3.3V Gold (4)16 Meg x 8 TSOP MT4LSDT1632UG -10B1 B = Y85B 1 = 6692 (1.15) 100 Now Now
-8B1 125 Now Now
128MB DS 32 Meg x 32 3.3V Gold (8) 16 Meg x 8 TSOP MT8LSDT3232UG -10B1 B = Y85B 1 = 6692 (1.15) 100 Now Now
-8B1 125 Now Now
144-pin SODIMM 32MB DS 4 Meg x 64 3.3V Gold (4)4 Meg x 16 TSOP MT4LSDT464(L)HG -662C1 C = Y84 1 = 6645 (1.15 " )66 Now Now
-662C2 2 = 6669 (1")66 Now Now
-10EC3 3 = 0118B (1")100 Now Now PC100
64MB DS 8 Meg x 64 3.3V Gold (8)8 Meg x 8 TSOP MT8LSDT864(L)HG -662C3 C = Y84 3 = 6678 (1.05")66 Now Now
4 Meg x 16 TSOP MT8LSDT864(L)HG -10EC5 5 = 0115C (1.25")100 Now Now PC100
64MB DS 8 Meg x 64 3.3V Gold (4)8 Meg x 16 TSOP MT4LSDT864(L)HG -10EB1 B = Y85B 1 = 0118B (1")100 Now Now
-133B1 133 Now Now
128MB DS 16 Meg x 64 3.3V Gold (8)16 Meg x 8 TSOP MT8LSDT1664(L)HG -662B2 B = Y85B 1 = 0115C (1.25")66 Now Now
(8) 8 Meg x 16 TSOP -10EB1 2 = 6678 (1.05")100 Now Now PC100
168-pin DIMM 32MB SS 4 Meg x 64 3.3V Gold (4)4 Meg x 16 TSOP MT4LSDT464AG -662C1 C = Y84 1 = 6652 (1")66 Now Now
Unbuffered -662C6 6 = 0134 (1) 66 Now Now
-10EC6 100 Now Now
-133C6 133 Now Now CL3
-13EC6 133 Now Now CL2
64MB SS 8 Meg x 64 3.3V Gold (8)8 Meg x 8 TSOP MT8LSDT864AG -662C7 C = Y84 7 = 0104B (1.375")66 Now Now
-10EC7 100 Now Now
-133C7 133 Now Now CL3
-13EC7 133 Now Now CL2
64MB SS 8 Meg x 64 3.3V Gold (4)8 Meg x 16 TSOP MT4LSDT864AG -662B1 B = Y85B 1 = 0134 (1")66 Now Now
-10EB1 100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
64MB SS 8 Meg x 72 3.3V ECC Gold (9)8 Meg x 8 TSOP MT9LSDT872AG -662C7 C = Y84 7 = 0104B (1.375) 66 Now Now
-10EC7 100 Now Now
-133C7 133 Now Now CL3
-13EC7 133 Now Now CL2
128MB DS 16 Meg x 64 3.3V Gold (16)8 Meg x 8 TSOP MT16LSDT1664AG -662C7 C = Y84 7 = 0104B (1.375")66 Now Now
-10EC7 100 Now Now
-133C7 133 Now Now CL3
-13EC7 133 Now Now CL2
128MB SS 16 Meg x 64 3.3V Gold (8)16 Meg x 8 TSOP MT8LSDT1664AG -662B1 B = Y85B 1 = 0104 (1.375")66 Now Now
-10EB1 100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
128MB DS 16 Meg x 72 3.3V ECC Gold (18)8 Meg x 8 TSOP MT18LSDT1672AG -662C7 C = Y84 7 = 0104B (1.375")66 Now Now
-10EC7 100 Now Now
-133C7 133 Now Now CL3
-13EC7 133 Now Now CL2
128MB SS 16 Meg x 72 3.3V Gold (9)16 Meg x 8 TSOP MT9LSDT1672AG -662B1 B = Y85B 1 = 0104 (1.375")66 Now Now
-10EB1 100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
256MB DS 32 Meg x 64 3.3V Gold (16)16 Meg x 8 TSOP MT16LSDT3264AG -10EB1 B = Y85B 1 = 0104B (1.375")100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
256MB DS 32 Meg x 72 3.3V ECC Gold (18)16 Meg x 8 TSOP MT18LSDT3272AG -10EB1 B = Y85B 1 = 0104B (1.375")100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
(A) = SPD version, unbuffered; no A = registered version for x72 DIMMs. 144- and 168-pin DIMMs (66 MHz/100 MHz) adhere to Intels 4-clock SDRAM module specs (66 MHz uses -10
components,100 MHz uses -8, 133 MHz uses -75). For 100-pin DIMMs, 100 MHz uses -10 components; adheres to JEDEC standard. Highlighted parts are available in PC133.
MICRON. A WORLD MEMORY LEADER
We’re ready with DDR. See below . . .
SDRAM MODULES (continued)
Module Module
Family Density Description Components Part Number Speed Die Rev. PCB (Height) MHz Samp. Prod. Note
168-pin DIMM 64MB SS 8 Meg x 72 3.3V ECC Gold (9)8 Meg x 8 TSOP MT9LSDT872G -10EC3 C = Y84 3 = 0144 (1.5) 100 Now Now
Registered
-133C3 133 Now Now CL3
-13EC3 133 Now Now
CL2
128MB DS 16 Meg x 72 3.3V ECC Gold (18)16 Meg x 4 TSOP MT18LSDT1672G -10EC2 C = Y84 2 = 0129 (1.7")100 Now Now
-133C2 133 Now Now CL3
-13EC2 133 Now Now CL2
128MB SS 16 Meg x 72 3.3V Gold (9)16 Meg x 8 TSOP MT9LSDT1672G -10EB1 B = Y85B 1 = 0144 (1.7")100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
256MB DS 32 Meg x 72 3.3V ECC Gold (18)32 Meg x 4 TSOP MT18LSDT3272G -10EB1 B = Y85B 1 = 0129 (1.7) 100 Now Now
-133B1 133 Now Now CL3
-13EB1 133 Now Now CL2
512MB DS 64 Meg x 72 3.3V ECC Gold (36)32 Meg x 4 FBGA MT36LSDF6472G -10EB1 B = Y85B 1 = 0123 (1.6")100 Now Now 11x13 pkg.
-133B2
2 = TBD (1.6)
133 Now Now CL3
-13EB2 133 Now Now CL2
1GB DS 128 Meg x 72 3.3V Gold (36)32 Meg x 4 TSOP MT36LSDT12872G -10EA1 A = Y86 1 = TBD (1.7")100 9/00 4Q00
-133A1 133 9/00 4Q00 CL3
N
o A = registered version for x72 DIMMs. 144- and 168-pin DIMMs (66 MHz/100 MHz) adhere to Intels 4-clock SDRAM module specs (66 MHz uses -10 components,100 MHz uses -8,
133 MHz uses -75). Highlighted parts are available in PC133.
DDR SDRAM MODULES (PC1600 and PC2100)
Module Module
Family Density Description Components Part Number Speed Die Rev. PCB (Height) MHz Sample Production
184-pin DIMM 64MB SS 8 Meg x 64 2.5V Gold (8)8 Meg x 8 TSOP MT8VDDT864AG -202A2 A = T84 2 = 0161 (1.25")200 Now 4Q00
Unbuffered -265A2 266 Now 4Q00
-262A2 266 TBD TBD
64MB SS 8 Meg x 72 2.5V Gold (9)8 Meg x 8 TSOP MT9VDDT872AG -202A2 A = T84 2 = 0161 (1.25")200 Now 4Q00
-265A2 266 Now 4Q00
-262A2 266 TBD TBD
128MB SS 16 Meg x 64 2.5V Gold (8)16 Meg x 8 TSOP MT8VDDT1664AG -202A1 A = T85 1 = 0161 (1.25")200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
128MB SS 16 Meg x 72 2.5V Gold (9)16 Meg x 8 TSOP MT9VDDT1672AG -202A1 A = T85 1 = 0161 (1.25")200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
256MB DS 32 Meg x 64 2.5V Gold (16)16 Meg x 8 TSOP MT16VDDT3264AG -202A1 A = T85 1 = 0116B (1.25") 200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
256MB DS 32 Meg x 72 2.5V Gold (18)16 Meg x 8 TSOP MT18VDDT3272AG -202A1 A = T85 1 = 0116B (1.25") 200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
184-pin DIMM 64MB SS 8 Meg x 72 2.5V Gold (9)8 Meg x 8 TSOP MT9VDDT872G -202A1 A = T84 1 = 0162 (1.80")200 Now 4Q00
Registered -265A1 266 Now 4Q00
-262A1 266 TBD TBD
128MB DS 16 Meg x 72 2.5V Gold (18)8 Meg x 8 TSOP MT18VDDT1672DG -202A1 A = T84 1 = 0162 (1.80")200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
128MB DS 16 Meg x 72 2.5V Gold (18)16 Meg x 4 TSOP MT18VDDT1672G -202A1 A = T84 1 = 0163 (1.80")200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
128MB SS 16 Meg x 72 2.5V Gold (9)16 Meg x 8 TSOP MT9VDDT1672G -202A1 A = T85 1 = 0162 (1.80) 200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
256MB DS 32 Meg x 72 2.5V Gold (18)16 Meg x 8 TSOP MT18VDDT3272DG -202A1 A = T85 1 = 0162 (1.80) 200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
256MB DS 32 Meg x 72 2.5V Gold (18)32 Meg x 4 TSOP MT18VDDT3272G -202A1 A = T85 1 = 0163 (1.80) 200 Now 4Q00
-265A1 266 Now 4Q00
-262A1 266 TBD TBD
512MB DS 64 Meg x 72 2.5V Gold (36)32 Meg x 4 TSOP MT36VDDT6472G -202A1 A = T85 1 = 0163 (1.80) 200 TBD TBD
-265A1 266 TBD TBD
-262A1 266 TBD TBD
DS = Double Sided, SS = Single Sided; M = Tin Plated, G = Gold Plated; U = 100-pin DIMM,
UDG = Double-sided, dual-bank 100-pin DIMM, H = Small-Outline DIMM (SODIMM),
(A) = see footnote references below
MODULE KEY
MICRON. A WORLD MEMORY LEADER
RDRAM® MODULES (RIMM MODULES)
Module Module PCB
Pins Density Description Components Part Number Speed Die Rev. (Height) MHz Sample Prod.
184-pin 128MB SS 64 Meg x 16 non-ECC (4) 16 Meg x 16 MT4VR6416AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD
128MB SS 64 Meg x 18 ECC (4) 16 Meg x 18 MT4VR6418AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD
256MB SS 128 Meg x 16 non-ECC (8) 16 Meg x 16 MT8VR12816AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD
256MB SS 128 Meg x 18 ECC (8) 16 Meg x 18 MT8VR12818AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD
512MB DS 256 Meg x 16 non-ECC (16) 16 Meg x 16 MT16VR25616AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD
512MB DS 256 Meg x 18 ECC (16) 16 Meg x 18 MT16VR25618AG -653A1 A = R96 1 = TBD (1.25) 600 TBD TBD
-750A1 700 TBD TBD
-745A1 700 TBD TBD
-845A1 800 TBD TBD
-840A1 800 TBD TBD