SCOPE: QUAD COMPARATOR WITH PROGRAMMABLE THRESHOLD
Device Type Generic Number
01 MAX516A(x)/883B
02 MAX516B(x)/883B
Case Outline(s). The case outlines shall be designated in Mil-Std-1835 and as follows:
Outline Letter Mil-Std-1835 Case Outline Package Code
RG GDIP1-T24 or CDIP2-T24 24 LEAD CERDIP R24
LI CQCC1-N28 28 LCC L28
A bsolute Maximum Ratings:
VDD to GND ...........................................................................................…... -0.3V to +17V
VDD to VCC ..............................................................................................….. -0.3V to +17V
VCC to GND .......................................................................................…... -0.3V, VDD+0.3V
Digital Input Voltage to DGND ........................................................…... -0.3V, VDD+0.3V
Comparator Input Voltage to GND .......................................................... -0.3V, VDD+0.3V
REF to GND ............................................................................................. -0.3V, VDD+0.3V
C0-C3 to GND ......................................................................................... GND, VDD +0.3V
Continuous Current, VCC or GND .............................................................................. 12mA
Lead Temperature (soldering, 10 seconds) ................................................................... +300°C
Storage Temperature ...................................................................................... -65°C to +150°C
Continuous Power Dissipation .........................................................................…... TA=+70°C
24 pin CERDIP(derate 12.5mW/°C above +70°C) ..............................................….. 1000mW
28 pin LCC(derate 10.2mW/°C above +70°C) .......................................................…. 816mW
Junct ion Temperature TJ ......................................................................................…. +150°C
Thermal Resista nce, J unction to Case, ΘJC
24 pin CERDIP................................................................................................….. 40°C/W
28 pin LCC .....................................................................................................….. 15°C/W
Thermal Resistance, Junction to Ambient, ΘJA:
24 pin CERDIP.................................................................................................…. 80°C/W
28 pin LCC .....................................................................................................….. 98°C/W
Recommended Operating Co ndit ions
Ambient Operating Range (TA) .........................................................…... -55°C to +125°C
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of the device at these or any other conditions be yond
those indicated in the operational section s of the sp ecifica tions is not implied. Exposure to absolute maxi mum
rating conditions for extended periods may affect device reliability.
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TABLE 1. ELECTR ICAL TESTS:
TEST Symbol
CONDITIONS
-55 °C TA +125°C 1/
Unless otherwise specified Group A
Subgroup Device
type Limits
Min Limits
Max Units
Resolution N 1,2,3 All 8.0 Bits
Total Unadjusted Error TUE VREF=1.25V
VREF=10V
1
2,3
2,3
1,2,3
01
02
±1.0
±1.5
±1.0
±2.0
LSB
Relative Accuracy INL 1,2,3 01
02 ±0.5
±1.0 LSB
Differential Nonlinearity DNL Guaranteed monotonic 1,2,3 All ±1.0 LSB
Full Scale Error AE 1,2,3 01
02 ±0.5
±1.0 LSB
Zero-Code Error VREF=1.25V
VREF=10V
VREF=1.25V
VREF=10V
1
2,3
01 ±1.5
±0.5
±2.5
±1.0
LSB
Zero-Code Error VREF=1.25V
VREF=10V
VREF=1.25V
VREF=10V
1
2,3
02 ±2.5
±1.0
±3.0
±1.5
LSB
REFERENC E INPUT 4.75V
VDD
16.5V
Reference Input Range REF 1,2,3 All 1.25 VDD-3.5 V
Reference Input
Resistance RREF Worst-case code 1,2,3 All 3.0 k
Reference Input
Capacitance CREF Worst-case code NOTE 2 4 All 250 pF
COMPARATOR
INPUT 4.75V
VDD
16.5V
Comparator Input Range VAIN 1,2,3 All 0V
DD V
Comparator Input Bias
Current IB1
2,3 All 300
400 nA
DIGITAL INPUTS 4.75V
VDD
16.5V ___ ___
D0-D7, WR, CS
Input High Voltage VIH 1,2,3 All 2.4 V
Digital Output Low
Voltage VIL 1,2,3 All 0.8 V
Input Leakage Current IIN VIN=0V and VDD 1,2,3 All -1.0 +1.0 µA
Input Capacitance CIN NOTE 2 4 All 15 pF
DIGITAL OUTPUT S C0-C3, VCC=5V
Output High Voltage VOH ISOURCE=200µA1,2,3 All VCC-1 V
Output Low Voltage VOL ISINK=1.6mA 1,2,3 All 0.4 V
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TEST Symbol
CONDITIONS
-55 °C TA +125°C 1/
Unless otherwise specified Group A
Subgroup Device
type Limits
Min Limits
Max Units
DYNAMIC PERFORMANCE
Digital Input to
Comparator Out Delay tDCO NOT E 3 4,5,6 All 2.0 µs
Analog Input to
Comparator Out Delay tACO NOTE 4 4,5,6 All 1.5 µs
__ ____
CS to WR Setup Time tCS 9,10,11 All 0 ns
__ ____
CS to WR Hold Time tCH 9,10,11 All 0 ns
___ Address to
WR to Setup Time tAS 9,10,11 All 50 ns
___ Address to
WR to Hold Time tAH 9,10,11 All 5 ns
___ Data Valid to
WR to Setup Time tDS 9,10,11 All 50 ns
___ Data Valid after
WR to Hold Time tDH 9,10,11 All 5 ns
______
WRITE Puls e Width tWR 9,10,11 All 120 ns
POWER SUPPLIES
VDD Range VDD 1,2,3 All 4.75 16.5 V
VCC Range VCC 1,2,3 All 4.75 VDD+0.3 V
Supply Current IDD 1,2,3 All 10 mA
Logic Supply ICC 1,2,3 All 10 µA
NOTE 1: VDD=VCC=+4.75V, REF=0V or VDD=VCC=+16.5V, REF=+10V, GND=0 V unless o therwise specified.
NOTE 2: Guaranteed by design but not production tested.
NOTE 3: VDD=5V, differential comparator input voltage changes by 1.25 with 5mV overdrive. VIN must be le ss
than VDD or longer propagation delays will result.
NOTE 4: Not tested but guaranteed by correlation to TDCO.
TERMINAL CONNECTIONS:
Pin R24 L28 Pin R24 L28
1C1 NC15D3 NC
2C0 C116D2 D5
3 Vcc C0 17 D1 D4
4AIN1 V
CC 18 D0 D3
5 AIN0 AIN1 19 REF D2
6 GND AIN0 20 AIN3 D1
7 ___
CS GND 21 AIN2 D0
8 ___
WR NC 22 VDD NC
9 A1 ___
CS 23 C3 REF
10 A0 ___
WR 24 C2 AIN3
11 D7 A1 25 AIN2
12 D6 A0 26 VDD
13 D5 D7 27 C3
14 D4 D6 28 C2
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ORDERING INFORMATION:
Package Pkg. Code MAXIM PART #
01 24 pin CERDIP R24 MAX516AMRG/883B
01 28 pin LCC L28 MAX516AMLI/883B
02 24 pin CERDIP R24 MAX516BMRG/883B
02 28 pin LCC L28 MAX516BMLI/883B
QUALITY ASSURAN CE
Sampling and inspection procedures shall be in accordance with MIL-Prf-38535, Appendix A as specified in Mil-
Std-883.
Screening shall be in accordance with Method 5004 of Mil-Std-883. Burn-in test Method 1015:
1. Test Condition, A, B, C, or D.
2. TA = +125°C minimum.
3. Interim and final electrical test requirements shall be specified in Table 2.
Quality conformance inspection shall be in accordance with Method 5005 of Mil-Std-883, including Groups A, B,
C, and D inspection.
Group A inspection:
1. Tests as specified in Table 2.
2. Selected subgroups in Table 1, Method 5005 of Mil-Std-883 shall be omitted.
Group C and D inspections:
a. End-point electrical parameters shall be specified in Table 1.
b. Steady-state life test, Method 1005 of Mil-Std-883:
1. Test condition A, B, C, D.
2. TA = +125°C, minimum.
3. Test duration, 1000 hours, except as permitted by Method 1005 of Mil-Std-883.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
Mil-Std-883 Test Requirements Subgroups
per Method 5005, Table 1
Interim Electric Parameters
Method 5004 1
Final Electrical Parameters
Method 5005 1*, 2, 3, 4, 5, 6, 9, 10, 11
Group A Test Requirements
Method 5005 1, 2, 3, 4, 5, 6, 9, 10, 11
Group C and D End-Point Electrical Parameters
Method 5005 1
* PDA applies to Subgroup 1 only.
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