UTRON UT62L12816(I)
Rev. 1.1 128K X 16 BIT LOW POWER CMOS SRAM
UTRON TECHNOLOGY INC. P80049
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.
TEL: 886-3-5777882 FAX: 886-3-5777919 5
CAPACITANCE (TA=25℃, f=1.0MHz)
PARAMETER SYMBOL MIN. MAX UNIT
Input Capacitance CIN - 6 pF
Input/Output Capacitance CI/O - 8 pF
Note : These parameters are guaranteed by device characterization, but not production tested.
AC TEST CONDITIONS
Input Pulse Levels 0V to 3.0V
Input Rise and Fall Times 5ns
Input and Output Timing Reference Levels 1.5V
Output Load CL = 30pF, IOH/ IOL = -1mA/2.1mA
AC ELECTRICAL CHARACTERISTICS (TA = -40℃ to 85℃)
(1) READ CYCLE UT62L12816(I)-55
VCC =2.7V~3.6V UT62L12816(I)-70
VCC =2.5V~3.6V UT62L12816(I)-100
VCC =2.5V~3.6V
PARAMETER SYMBOL MIN. MAX. MIN. MAX. MIN. MAX.
UNIT
Read Cycle Time tRC 55 - 70 - 100 - ns
Address Access Time tAA - 55 - 70 - 100 ns
Chip Enable Access Time tACE - 55 - 70 - 100 ns
Output Enable Access Time tOE - 30 - 35 - 50 ns
Chip Enable to Output in Low Z tCLZ* 10 - 10 - 10 - ns
Output Enable to Output in Low Z tOLZ* 5 - 5 - 5 - ns
Chip Disable to Output in High Z tCHZ* - 20 - 25 - 30 ns
Output Disable to Output in High Z tOHZ* - 20 - 25 - 30 ns
Output Hold from Address Change tOH 10 - 10 - 10 - ns
LB ,UB Access Time tBA - 55 - 70 - 100 ns
LB ,UB to High-Z Output tBHZ - 25 - 30 - 40 ns
LB ,UB to Low-Z Output tBLZ 10 - 10 - 10 - ns
(2) WRITE CYCLE UT62L12816(I)-55
VCC =2.7V~3.6V UT62L12816(I)-70
VCC =2.5V~3.6V UT62L12816(I)-100
VCC =2.5V~3.6V
PARAMETER SYMBOL MIN. MAX. MIN. MAX. MIN. MAX.
UNIT
Write Cycle Time tWC 55 - 70 - 100 - ns
Address Valid to End of Write tAW 50 - 60 - 80 - ns
Chip Enable to End of Write tCW 50 - 60 - 80 - ns
Address Set-up Time tAS 0 - 0 - 0 - ns
Write Pulse Width tWP 45 - 55 - 70 - ns
Write Recovery Time tWR 0 - 0 - 0 - ns
Data to Write Time Overlap tDW 25 - 30 - 40 - ns
Data Hold from End of Write Time tDH 0 - 0 - 0 - ns
Output Active from End of Write tOW* 5 - 5 - 5 - ns
Write to Output in High Z tWHZ* - 30 - 30 - 40 ns
LB ,UB Valid to End of Write tBW 45 - 60 - 80 - ns
* These parameters are guaranteed by device characterization, but not production tested.