ADPD103 Data Sheet
Rev. B | Page 30 of 52
Measuring TIA Input Shunt Resistance
Another problem that can occur is for a resistance to develop
between the TIA input and another supply or ground on the
PCB. These resistances can force the TIA into saturation
prematurely. This, in turn, takes away dynamic range from the
device in operation and adds a Johnson noise component to the
input. To measure these resistances, place the device in TIA_ADC
mode in the dark and start by measuring the TIA_ADC offset level
with the photodiode inputs disconnected (Register 0x14,
Bits[11:8] = 0 or Register 0x14, Bits[7:4] = 0). From this,
subtract the value of TIA_ADC mode with the darkened
photodiode connected and convert the difference into a current.
If the value is positive, and the ADC signal decreased, the
resistance is to a voltage higher than 1.3 V, such as VDD. Current
entering the TIA causes the output to drop. If the output
difference is negative due to an increase of codes at the ADC,
current is being pulled out of the TIA and there is a shunt
resistance to a lower potential than 1.3 V, such as ground.
DIGITAL INTEGRATE MODE
Digital integrate mode is built into the ADPD103 and allows the
device to accommodate longer LED/AFE pulse widths and
different types of sensors at the input. The analog integration
mode described in the AFE Operation section is ideally suited
for applications requiring a large LED duty cycle, or applications
that require customization of the sampling scheme. Digital
integrate mode allows the integration function to be performed
after the ADC in the digital domain. This mode enables the
device to handle a much wider range of sensors at the input.
In digital integrate mode, the ADC performs a conversion every
1 µs during the integration window. During the integration
window, the digital engine either adds to or subtracts from the
previous sample. The band-pass filter is bypassed and the
integrator is converted to a voltage buffer, allowing the digital
engine to perform the integration function. In this mode, after
the timing is optimized, the output of the ADC increases as the
light level on the photodiode increases.
The integration window is a combination of negative and positive
windows where the duration of these windows is set by SLOTx_
AFE_WIDTH. At the end of the digital integration window, the
resulting sum is sent to the decimate unit as the sample for that
LED pulse. There is one sample per time slot for every sample
cycle. Table 18 lists the registers required for placing the device
in digital integrate mode.
There may also be changes needed in the SLOTx_AFE_OFFSET
registers and FIFO configuration register (0x11). To read the
final value through the FIFO, set the appropriate values in Regis-
ter 0x11, Bits[4:2] for Time Slot A, and Register 0x11, Bits[8:6]
for Time Slot B. Alternatively, the final output is also available
through the data registers; Register 0x64, Register 0x70, and
Register 0x74 for Time Slot A, and Register 0x68, Register 0x78,
and Register 0x7C for Time Slot B.
To put the ADPD103 into digital integration mode during Time
Slot A, write 0x1 to Register 0x58, Bit 12. To put the ADPD103
into digital integration mode in Time Slot B, write 0x1 to
Register 0x58, Bit 13. The other writes required to switch to
digital integration mode are listed in Table 18.
When using digital integrate mode, up to two photodiodes can
be connected to the ADPD103 inputs; one photodiode per PDx
input group (PD1/PD2/PD3/PD4 or PD5/PD6/PD7/PD8).
Never connect the same photodiode across the two PDx groups.
In digital integrate mode, there are options to connect the
photodiode to all four AFE channels (PD1/PD2/PD3/PD4 or
PD5/PD6/PD7/PD8), or just a single AFE channel (PD1 or
PD5). When connecting to a single AFE channel, write 0x1 to
Register 0x54, Bit 14 for Time Slot A, or, for Time Slot B, write
0x1 to Register 0x54, Bit 15.
When connecting to a single AFE channel, there is also an
option to turn off Channel 2, Channel 3, and Channel 4 (and to
save power) by writing 0x7 to Register 0x55, Bits[15:13]. When
connecting to all four channels (PD1/PD2/PD3/PD4 or
PD5/PD6/PD7/PD8), write 0x0 (default)to Register 0x54, Bit 14
for Time Slot A, or write 0x0 (default) to Register 0x54, Bit 15
for Time Slot B. Ensure that all AFE channels are powered up by
writing 0x0 to Register 0x55, Bits[15:13].
Connecting the single photodiode to a single AFE channel offers
the best SNR performance in cases where signal is limited, whereas
connecting the single photodiode to all four AFE channels offers
the best dynamic range in cases where signal is large.
Digital Integration Sampling Modes
There are two sampling modes that can be used while the
device is in digital integration mode. These modes are single-
sample pair mode and double-sample pair mode.
In single-sample pair mode, there is a single negative sample
region and a single positive sample region, shown in Figure 29
and Figure 30. To use single-sample pair mode, write 0x1 to
Register 5A, Bit 5 for Time Slot A, or Register 5A, Bit 6 for
Time Slot B. The negative sample region starts at SLOTx_AFE_
OFFSET + 9 and its duration (the number of samples taken) is set
by SLOTx_AFE_WIDTH. The positive sample region starts at
SLOTx_AFE_OFFSET + 9 + SLOTx_AFE_WIDTH, and its
duration is also set by SLOTx_AFE_WIDTH. Set the timing
such that the negative sample region falls entirely in the flat
(dark) portion of the LED response, whereas the positive
sample region falls in the pulsed region of the LED response.
Placing the LED pulse offset, SLOTx_LED_OFFSET, at the
beginning of SLOTx_AFE_OFFSET + 9 + SLOTx_AFE_WIDTH
achieves this timing. The output is the difference of the signals
in the two regions.