ZXMP10A13F
SEMICONDUCTORS
ISSUE 1 - MARCH 2005
4
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS
STATIC
Drain-Source Breakdown Voltage V(BR)DSS -100 V ID= -250A, VGS=0V
Zero Gate Voltage Drain Current IDSS -1.0 AV
DS= -100V, VGS=0V
Gate-Body Leakage IGSS 100 nA VGS=±20V, VDS=0V
Gate-Source Threshold Voltage VGS(th) -2.0 -4.0 V ID= -250A, VDS=VGS
Static Drain-Source On-State
Resistance (1) RDS(on) 1
1.45
⍀
⍀
VGS= -10V, ID= -0.6A
VGS= -6V, ID= -0.5A
Forward Transconductance (1)(3) gfs 1.2 S VDS= -15V, ID= -0.6A
DYNAMIC (3)
Input Capacitance Ciss 141 pF VDS= -50V, VGS=0V
f=1MHz
Output Capacitance Coss 13.1 pF
Reverse Transfer Capacitance Crss 10.8 pF
SWITCHING (2) (3)
Turn-On Delay Time td(on) 1.6 ns
VDD= -50V, ID= -1A
RG≅6.0⍀,V
GS= -10V
Rise Time tr2.1 ns
Turn-Off Delay Time td(off) 5.9 ns
Fall Time tf3.3 ns
Gate Charge Qg1.8 nC VDS= -50V, VGS= -5V
ID= -0.6A
Total Gate Charge Qg3.5 nC VDS= -50V, VGS= -10V
ID= -0.6A
Gate-Source Charge Qgs 0.6 nC
Gate-Drain Charge Qgd 1.6 nC
SOURCE-DRAIN DIODE
Diode Forward Voltage (1) VSD -0.85 -0.95 V Tj=25°C, IS= -0.75A,
VGS=0V
Reverse Recovery Time (3) trr 29 ns Tj=25°C, IS= -0.9A,
di/dt=100A/s
Reverse Recovery Charge (3) Qrr 31 nC
ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated)
NOTES
(1) Measured under pulsed conditions. Pulse width ⱕ300ms; duty cycle ⱕ2%.
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.