LOW NOISE HIGH LINEARITY PACKAGED PHEMT
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
1
Datasheet v3.0
FPD1
050SO
T
89
FEATURES (1.8GHZ):
26 dBm Output Power (P1dB)
17.5 dB Small-Signal Gain (SSG)
1.1 dB Noise Figure
40 dBm Output IP3
50% Power-Added Efficiency
FPD1050SOT89E: RoHS compliant
(Directive 2002/95/EC)
GENERAL DESCRIPTION:
The FPD1050SOT89 is a packaged depletion
mode AlGaAs/InGaAs pseudomorphic High
Electron Mobility Transistor (pHEMT). It
utilizes a 0.25 µm x 1050 µm Schottky barrier
Gate, defined by high-resolution stepper-
based photolithography. The recessed and
offset Gate structure minimizes parasitics to
optimize performance, with an epitaxial
structure designed for improved linearity over
a range of bias conditions and i/p power levels.
PACKAGE:
YPICAL APPLICATIONS: in PCS/Cellular
nd other types
T
Drivers or output stages
base station transmitter amplifiers
High intercept-point LNAs
WLL and WLAN systems, a
of wireless infrastructure systems.
ELECTRICAL SPECIFICATIONS:
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
Power at 1dB Gain Compression P1dB VDS = 5 V; IDS = 50% IDSS 24.5 26 dBm
Small-Signal Gain SSG VDS = 5 V; IDS = 50% IDSS 16 17.5 dB
Power-Added Efficiency PAE VDS = 5 V; IDS = 50% IDSS;
POUT = P1dB
50 %
Noise Figure NF VDS = 5 V; IDS = 50% IDSS
VDS = 5 V; IDS = 25% IDSS
0.9 1.1 dB
Output Third-Order Intercept Point
(from 15 to 5 dB below P1dB)
IP3 VDS = 5V; IDS = 50% IDSS
Matched for optimal power
Matched for best IP3
37
39
40
dBm
Saturated Drain-Source Current IDSS VDS = 1.3 V; VGS = 0 V 260 320 385 mA
Maximum Drain-Source Current IMAX VDS = 1.3 V; VGS +1 V 520 mA
Transconductance GM VDS = 1.3 V; VGS = 0 V 270 mS
Gate-Source Leakage Current IGSO VGS = -5 V 1 15 µA
Pinch-Off Voltage |VP| VDS = 1.3 V; IDS = 1.05 mA 0.7 1.0 1.3 V
Gate-Source Breakdown Voltage |VBDGS| IGS = 1.05 mA 12 16 V
Gate-Drain Breakdown Voltag e |VBDGD| IGD = 1.05 mA 12 16 V
Thermal Resistance RθJC 76 °C/W
Note: TAMBIENT = 22°; RF specification measured at f = 1850 MHz using CW signal (except as noted)
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
2
Datasheet v3.0
FPD1
050SO
T
89
ABSOLUTE MAXIMUM RATING1:
Notes:
PARAMETER SYMBOL TEST CONDITIONS ABSOLUTE MAXIMUM
Drain-Source Voltage VDS -3V < VGS < +0V 8V
Gate-Source Voltage VGS 0V < VDS < +8V -3V
Drain-Source Current IDS For VDS > 2V IDss
Gate Current IG Forward or reverse current 10mA
RF Input Power2PIN Under any acceptable bias state 260mW
Channel Operating Temperature TCH Under any acceptable bias state 175°C
Storage Temperature TSTG Non-Operating Storage -40°C to 150°C
Total Power Dissipation PTOT See De-Rating Note below 2.0W
Gain Compression Comp. Under any bias conditions 5dB
Simultaneous Combination of Limits3 2 or more Max. Limits
1TAmbient = 22°C unless otherwise noted; exce eding any one of these absolu te maximum ratings may caus e
permanent damage to the dev ice
2Max. RF Input Limit must be further limited if input VSW R > 2.5:1
3Users should avoid exceedi ng 80% of 2 or more Limits simultaneously
4Total Power Dissipation defined as: PTOT (PDC + PIN) – POUT,
where PDC: DC Bias Power, PIN: RF Input Power, POUT: RF Output Power
Total Power Dissipation to be de-rated as follows above 22°C:
PTOT= 2.0 - (0.013W/°C) x TPACK
where TPACK= source tab lead temperature above 22°C
(coefficient of de-rating formula is the Thermal Conductivity)
Example: For a 65°C carrier temperature: PTOT = 2.0W – (0.013 x (65 – 22)) = 1.44W
BIASING GUIDELINES:
Active bias circuits provide good performance stabilization over variations of operating
temperature, but require a larger number of components compared to self-bias or dual-biased.
Such circuits should include provisions to ensure that Gate bias is applied before Drain bias,
otherwise the pHEMT may be induced to self-oscillate
Dual-bias circuits are relatively simple to implement, but will require a regulated negative voltage
supply for depletion-mode devices.
Self-biased circuits employ an RF-bypassed Source resistor to pro vide the negative Gate-Source
bias voltage, and such circuits provide some temperature stabilization for the device. A nominal
value for circuit development is 3.6 for a 50% of IDSS operating point.
For standard Class A ope ration, a 50% of IDSS bias point is recommended. A small amount of
RF gain expansion prior to the onset of compression is normal for this operating point. Note that
pHEMTs, since they are “quasi- E/D mo de” devices, exhibit Class AB traits when operated at 50%
of IDSS. To achieve a larger separation between P1dB and IP3, an operating point in the 25% to
33% of IDSS range is suggested. Such Class AB operation will not degrade the IP3 performance.
Specifications subject to change without notice
Filtronic Compound Semiconductors Ltd
Tel: +44 (0) 1325 301111 Fax: +44 (0) 1325 306177 Email: sales@filcs.com Website: www.filtronic.com
3
Datasheet v3.0
FPD1
050SO
T
89
PACKAGE OUTLINE:
(dimensions in millimeters – mm)
TE: Drawing available on request
NO
PREFERRED ASSEMBLY INSTRUCTIONS:
Available on request.
HANDLING PRECAUTIONS:
To avoid damage to
the devices care
should be exercised
during handling.
Proper Electrostatic Discharge (ESD)
precautions should be observed at all stages of
storage, handling, assembly, and testing.
These devices should be treated as Class (0-
250 V) as defined in JEDEC Standard No. 22-
A114. Further information on ESD control
measures can be found in MIL-STD-1686 and
MIL-HDBK-263.
APPLICATION NOTES & DESIGN DATA:
Application Notes and design data including S-
parameters are available on requ est.
DISCLAIMERS:
This product is not designed for use in any
space based or life sustaining/supporting
equipment.
ORDERING INFORMATION:
PART NUMBER DESCRIPTION
FPD1050SOT89 Packaged pHEMT
FPD1050SOT89E RoHS compliant Packaged pHEMT
PCB Foot Print
Units in inches