ecember 5, 2014 4 Revision 1.0
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Absolute Maximum Ratings(3)
Supply Voltage (VDD, VDDIN) ........................................... 5.5V
Input Voltage (VIN) .............................. –0.5V to VDDIN + 0. 5 V
Lead Temperature (soldering, 20s) ............................ 260°C
Maximum Junction Temperature................................ 125°C
Storage Temperature (Ts) ......................... –65°C to +150°C
ESD Protection (input) ....................................... 2000V min.
Operating Ratings(4)
Supply Voltage (VDD, VDDIN) ...................... 3.135V to 3.465V
Ambient Op Temperature (TA) .................... −40°C to +85°C
Package Thermal Resistance(5)
QFN-16
Still-air (θJA) ................................................. 59°C/W
Junction-to-board (ψJB) ............................... 38°C/W
DC Electrical Characteristics(6)
VDD = VDDIN = 3.135V to 3.465V, TA = −40°C to +85°C, unless otherwise stated. RREF = 475Ω
Symbol Parameter Condition Min. Typ. Max. Units
VDD, VDDIN Power Supply Voltage Range 3.135 3.3 3.465 V
CIN Input Capacitance 6 pF
COUT Output Capacitance 5 pF
LPIN Pin Inductance 4 nH
ROUT Output Resistance 3 kΩ
RPULL-UP Pull up Resistance SEL, PDB, OE 110 kΩ
VIH Input High Voltage SEL, PDB, OE 2 VDDIN + 0.3 V
VIL Input Low Voltage SEL, PDB, OE −0.3 0.8 V
VIH Input High Voltage HCSL, IN, /IN 660 750 850 V
VIL Input Low Voltage HCSL, IN, /IN −150 0 V
VIN Differential Input Voltage Range LVDS, IN, /IN 250 350 550 mV
VINPUT OFFSET Input Common Mode Voltage LVDS, IN, /IN, 1.125 1.25 1.375 V
VOH Output High Voltage HSCL 660 750 850 mV
VOL Output Low Voltage HSCL −150 0 27 mV
VCROSS(7, 8) Crossing Point Voltage Absolute 250 350 550 mV
VCROSS_VARIATION(7, 8, 9) Variation of Crossing Point Voltage Variation over all edges 140 mV
IDD Power Supply Current For
VDD + VDDIN
50Ω, 2pF 42 60 mA
No load, PDB = Low 0.4 mA
OE = Logic Low 20 mA
IIL(10) Input Lea kag e Current 0 < VIN < VDDIN −5 5 µA
Notes:
3. Permanent device dam age may occur if absolute maximum ratings are exceeded. This is a stress rating only and functional operation is not impli ed
at conditions other than thos e detailed in the operati onal sections of this datas heet. Exposure to absolute maximum ratings conditions for extended
periods may affect device reliabil i ty.
4. The datas heet limits are not guaranteed i f the device is operated beyond the operating ratings.
5. Package t hermal resist ance assumes that the exposed pad is soldered (or equivalent) t o the devic e's most negati ve potential on the PCB. ψJB and
θJA values are determined for a 4-layer board in still-air unless ot herwise st ated. The circuit is desi gned to meet the DC specifications s hown in the
above table after thermal equil i bri um has been established.
6. The ci rcuit is designed to meet the DC specifications shown in the above table after thermal equil i bri um has been established.
7. Test s etup is RL = 50Ω with 2pF, RREF = 475Ω ±1%.
8. Measurement taken from Q and /Q.
9. Measured at t he crossing point where instantaneous voltages of Q and /Q are equal.
10. Inputs with pull -up/pull-down resistances are not included.