CUSTOMER
NOMINAL FREQUENCY
PRODUCT TYPE
SPEC. NO. ( P/N )
CUSTOMER P/N
ISSUE DATE
VERSION
PSE Technolo
gy
Cor
p
oration
*RoHS Compliant
Please return one copy with approval to PSE-TW
APPROVED BY CUSTOMER：AVL Status
A
0
Jun.16,2016
APPROVED QAPREPARED
PSE Technology Corporation
SPECIFICATION FOR APPROVAL
32.768 KHz
TYPE G8 SMD CRYSTAL
G83270023
No.2, Tzu-Chiang 5th Rd, Chung Li Industrial Park,
Chung Li City, Taoyuan County, Taiwan (R.O.C.)
TEL: 886-3-451-8888
FAX: 886-3-461-3865
http://www.saronix-ecera.com.tw
E0-R-4-014 Rev. E Page i
A Jun.16,2016 Initial Release
VERSION HISTORY
Version
No.
Version
Date
Customer Receipt
Date
Supplier Receipt
Date NotesDescription
16-Jun-16
TYPE G8 SMD CRYSTAL
VER. A
G83270023
E0-R-4-014 Rev. E Page ii
ELECTRICAL SPECIFICATIONS
SRe Part Number : G83270023
Reliability ( Mechanical and environmental performances )
No.
1
․Fre
q
uenc
y
chan
g
e: Within ±5
pp
m
2
3
4
5
Typ.
Quality Factor
C0 1.5 pF
KQ13
°C
Shunt Capacitance
Temperature Coefficient K -0.03 ppm/°C
2
500
Operating Temperature Range TR -40 to 85
Storage Temperature Range
Drive Level DL 0.1 / 0.5 μW
Equivalent Series Resistance ESR 70 KΩ
fF
Typ.
Max.
± 0.01ppm/°C
2
Max. 1st year
Min.
Typ.
Min.
Specifications UnitsParameters Symbol
Load Capacitance CL 7 pF
Nominal Frequency Fn
Notes
at 25°C ± 5°C
Frequency Tolerance
32.768 KHz
FT ± 20 ppm
Typ. / Max.
16-Jun-16
TYPE G8 SMD CRYSTAL
Motional Capacitance 6.5
-40 to 85
C1
G83270023
VER. A
°C
MΩ
Aging ± 3
Insulation Resistance
ppm
Test Items Conditions Requirements
Bending test
Apply pressure in the direction of the arrow at a rate of
about 0.5mm/s until bent width reaches 5mm, and hold
for 30 seconds.
․Without mechanical damage such as
breaks and satisfy sealing specification.
Shear test
Apply 20N(2.04kgf) static load to the core of quartz
crystal units in the direction of the arrow using a R0.5
scratch tool, then hold for 5 seconds.
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
Core body
strength
Apply 10N(1.02kgf) static load to the quartz crystal units
center in the direction of the arrow using a R0.5 pushing
tool, then hold for 10 seconds.
Vibration
Frequency sweep method shall be applied as follows.
Quartz crystal units shall be vibrated with the sweeping
frequency from 10Hz to 55Hz and return to 10Hz in 1
minute, with 1.5mm amplitude. This vibration shall be
applied for 2 hours in each 3 perpendicular axes. Other
procedures conform to JIS C 60068-2-6.
Shock
Quartz crystal units shall be accelerated at 9810m/s2 by
1ms pulse duration. This shock shall be applied 3 times
in each 3 perpendicular axes. Other procedures
conform to JIS C 60068-2-27.
E0-R-4-014 Rev. E Page 1
6
․Frequency change: Within ±5ppm
7
8
9
1
-40±3°C30min.
2
Normal temperature Within 30 sec.
3100±2°C
30min.
4
Normal temperature Within 30 sec.
10 Sealing
Both the test methods specified below shall be applied.
11 Aging
․Frequency change: Within ±5ppm
12 Solder-ability
1
TYPE G8 SMD CRYSTAL
G83270023
VER. A 16-Jun-16
Cold
Quartz crystal units shall be stored in the -40±3℃
atmosphere for 1000 hours. Other procedures conform
to JIS C 60068-2-1.
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
Dry heat
Quartz crystal units shall be stored in the 100±2℃
atmosphere for 100 hours. Other procedures conform to
JIS C 60068-2-2.
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
Damp heat
Quartz crystal units shall be stored in the 40±2℃
atmosphere with 90 to 95% relative humidity for 1000
hours. Other procedures conform to JIS C 60068-2-3.
Change of
temperature
Quartz crystal units shall be subjected successively 100
cycles of temperature change shown below. Other
procedures conform to JIS C 0025.
Temperature Duration
Quartz crystal units shall be soaked in 90℃ or higher
temperature hot water for 5 minutes.
․Without repetitive leaking bubbles from
quartz crystal units.
Quartz crystal units shall be tested by Mass
spectrometric leakage detector to measure the leakage
rate of helium gas.
․1×10-9 Pa･m3/s or less
Quartz crystal units shall be stored in the 85±3℃
atmosphere for 720±12 hours. ․Equivalent series resistance(E.S.R)
change: Within 5kΩ
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
Terminals coated with flux shall be immersed in the
solder bath for 3.5±0.5 seconds.
․Minimum 95% of immersed terminal shall
be covered with new uniform solder.
Items Conditions
Solder Sn-3.0Ag-0.5Cu
2
Flux
Approximately 25wt%
methanol(JIS K 8891)
solution of resin(JIS K
5902).
3
Solder
temperature 245±5°C
E0-R-4-014 Rev. E Page 2
13
․Frequency change: Within ±5ppm
Hot Air method ․Frequency change: Within ±5ppm
14
․Frequency change: Within ±5ppm
TYPE G8 SMD CRYSTAL
G83270023
VER. A 16-Jun-16
Resistance to
soldering heat
Reflow soldering method
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
Peak temperature: 260±5°C for within 5seconds.
Soldering temperature: 220°C or higher for 60±10
seconds.
Pre-heating temperature: 160±10°C for 90±10 seconds.
Quartz crystal units which is put on PCB shall be
through reflow soldering furnace twice with the condition
shown above.
․Equivalent series resistance (E.S.R)
change: Within 10kΩ
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
․Without distinct deformation in
appearance.
Apply hot air for 7±0.5seconds, distance 10mm, 300±5°
C, flow 10L/minutes
․Equivalent series resistance(E.S.R)
change: Within 5kΩ
․Without distinct deformation in
appearance.
․Marking shall be legible.
․After conditioning, quartz crystal units
shall be subjected to standard atmospheric
conditions for 1 hour, and measured.
․Without distinct deformation in
appearance.
Solubility to
resistance
Soak cleaning ․Without mechanical damage such as
breaks and satisfy sealing specification.
Quartz crystal units shall be soaked in isopropyl alcohol
at normal temperature for 90 seconds.
E0-R-4-014 Rev. E Page 3
Marking
Dimensions
(Units: mm)
Recommended Soldering Pattern Internal connection
(TOP VIEW)
TYPE G8 SMD CRYSTAL
BLmv
G83270023
VER. A
Date Code Factory Code
mv
16-Jun-16
E0-R-4-014 Rev. E Page 4
TAPING
(Units: mm)
REEL
(Units: mm)
Quantity : 3000pcs / Reel
TYPE G8 SMD CRYSTAL
G83270023
VER. A 16-Jun-16
E0-R-4-014 Rev. E Page 5
