ST7LITE0xY0, ST7LITESxY0 8-bit microcontroller with single voltage Flash memory, data EEPROM, ADC, timers, SPI Memories - 1K or 1.5 Kbytes single voltage Flash Program memory with read-out protection, In-Circuit and In-Application Programming (ICP and IAP). 10 K write/erase cycles guaranteed, data retention: 20 years at 55 C. - 128 bytes RAM. - 128 bytes data EEPROM with read-out protection. 300K write/erase cycles guaranteed, data retention: 20 years at 55 C. Clock, Reset and Supply Management - 3-level low voltage supervisor (LVD) and auxiliary voltage detector (AVD) for safe poweron/off procedures - Clock sources: internal 1MHz RC 1% oscillator or external clock - PLL x4 or x8 for 4 or 8 MHz internal clock - Four Power Saving Modes: Halt, Active-Halt, Wait and Slow Interrupt Management - 10 interrupt vectors plus TRAP and RESET - 4 external interrupt lines (on 4 vectors) I/O Ports - 13 multifunctional bidirectional I/O lines - 9 alternate function lines - 6 high sink outputs 2 Timers - One 8-bit Lite Timer (LT) with prescaler including: watchdog, 1 realtime base and 1 input capture. SO16 150" DIP16 QFN20 - One 12-bit Auto-reload Timer (AT) with output compare function and PWM 1 Communication Interface - SPI synchronous serial interface A/D Converter - 8-bit resolution for 0 to VDD - Fixed gain Op-amp for 11-bit resolution in 0 to 250 mV range (@ 5V VDD) - 5 input channels Instruction Set - 8-bit data manipulation - 63 basic instructions with illegal opcode detection - 17 main addressing modes - 8 x 8 unsigned multiply instruction Development Tools - Full hardware/software development package Device Summary Features Program memory - bytes RAM (stack) - bytes Data EEPROM - bytes Peripherals Operating Supply CPU Frequency Operating Temperature Packages ST7LITESxY0 (ST7SUPERLITE) ST7LITES2Y0 ST7LITES5Y0 ST7LITE02Y0 ST7LITE0xY0 ST7LITE05Y0 1K 1K 1.5K 128 (64) 128 (64) 128 (64) LT Timer w/ Wdg, LT Timer w/ Wdg, LT Timer w/ Wdg, AT Timer w/ 1 PWM, AT Timer w/ 1 PWM, AT Timer w/ 1 PWM, SPI SPI, 8-bit ADC SPI 2.4V to 5.5V 1MHz RC 1% + PLLx4/8MHz -40C to +85C SO16 150", DIP16, QFN20 ST7LITE09Y0 1.5K 1.5K 128 (64) 128 (64) 128 LT Timer w/ Wdg, AT Timer w/ 1 PWM, SPI, 8-bit ADC w/ Op-Amp Rev 6 November 2007 1/124 1 Table of Contents ST7LITE0xY0, ST7LITESxY0 . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1 DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 2 PIN DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 3 REGISTER & MEMORY MAP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 4 FLASH PROGRAM MEMORY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.1 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.2 MAIN FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.3 PROGRAMMING MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 4.4 ICC INTERFACE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 4.5 MEMORY PROTECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 4.6 RELATED DOCUMENTATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 4.7 REGISTER DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 5 DATA EEPROM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 5.1 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 5.2 MAIN FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 5.3 MEMORY ACCESS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 5.4 POWER SAVING MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 5.5 ACCESS ERROR HANDLING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 5.6 DATA EEPROM READ-OUT PROTECTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 5.7 REGISTER DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6 CENTRAL PROCESSING UNIT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.1 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.2 MAIN FEATURES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 6.3 CPU REGISTERS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 7 SUPPLY, RESET AND CLOCK MANAGEMENT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 7.1 INTERNAL RC OSCILLATOR ADJUSTMENT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 7.2 PHASE LOCKED LOOP . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 7.3 REGISTER DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 7.4 RESET SEQUENCE MANAGER (RSM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 8 INTERRUPTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 8.1 NON MASKABLE SOFTWARE INTERRUPT . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 8.2 EXTERNAL INTERRUPTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 8.3 PERIPHERAL INTERRUPTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 8.4 SYSTEM INTEGRITY MANAGEMENT (SI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 9 POWER SAVING MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 9.1 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 9.2 9.3 SLOW MODE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 WAIT MODE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124 . . . . 38 9.4 ACTIVE-HALT AND HALT MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 2/124 2 Table of Contents 10 I/O PORTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 10.1 INTRODUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 10.2 FUNCTIONAL DESCRIPTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 10.3 UNUSED I/O PINS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 10.4 LOW POWER MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 10.5 INTERRUPTS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 10.6 I/O PORT IMPLEMENTATION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 11 ON-CHIP PERIPHERALS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 11.1 LITE TIMER (LT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 11.2 12-BIT AUTORELOAD TIMER (AT) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53 11.3 SERIAL PERIPHERAL INTERFACE (SPI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 11.4 8-BIT A/D CONVERTER (ADC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 12 INSTRUCTION SET . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 12.1 ST7 ADDRESSING MODES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75 12.2 INSTRUCTION GROUPS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78 13 ELECTRICAL CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 13.1 PARAMETER CONDITIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81 13.2 ABSOLUTE MAXIMUM RATINGS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 13.3 OPERATING CONDITIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 13.4 SUPPLY CURRENT CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89 13.5 CLOCK AND TIMING CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91 13.6 MEMORY CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92 13.7 EMC (ELECTROMAGNETIC COMPATIBILITY) CHARACTERISTICS . . . . . . . . . . . . . 93 13.8 I/O PORT PIN CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95 13.9 CONTROL PIN CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 13.10 COMMUNICATION INTERFACE CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . 102 13.11 8-BIT ADC CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104 14 PACKAGE CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109 14.1 PACKAGE MECHANICAL DATA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 109 14.2 THERMAL CHARACTERISTICS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111 15 DEVICE CONFIGURATION AND ORDERING INFORMATION . . . . . . . . . . . . . . . . . . . . . . . 112 15.1 OPTION BYTES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 112 15.2 DEVICE ORDERING INFORMATION AND TRANSFER OF CUSTOMER CODE . . . . 114 15.3 DEVELOPMENT TOOLS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 117 15.4 ST7 APPLICATION NOTES . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 118 16 KNOWN LIMITATIONS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 16.1 EXECUTION OF BTJX INSTRUCTION . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 16.2 IN-CIRCUIT PROGRAMMING OF DEVICES PREVIOUSLY PROGRAMMED WITH HARDWARE WATCHDOG OPTION 121 16.3 IN-CIRCUIT DEBUGGING WITH HARDWARE WATCHDOG . . . . . . . . . . . . . . . . . . . 121 16.4 RECOMMENDATIONS WHEN LVD IS ENABLED . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121 16.5 CLEARING ACTIVE INTERRUPTS OUTSIDE INTERRUPT ROUTINE . . . . . . . . . . . . 121 17 REVISION HISTORY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122 3/124 3 Table of Contents To obtain the most recent version of this datasheet, please check at www.st.com Please also pay special attention to the Section "KNOWN LIMITATIONS" on page 121. 4/124 1 ST7LITE0xY0, ST7LITESxY0 1 DESCRIPTION The ST7LITE0x and ST7SUPERLITE (ST7LITESx) are members of the ST7 microcontroller family. All ST7 devices are based on a common industry-standard 8-bit core, featuring an enhanced instruction set. The ST7LITE0x and ST7SUPERLITE feature FLASH memory with byte-by-byte In-Circuit Programming (ICP) and In-Application Programming (IAP) capability. Under software control, the ST7LITE0x and ST7SUPERLITE devices can be placed in WAIT, SLOW, or HALT mode, reducing power consumption when the application is in idle or standby state. The enhanced instruction set and addressing modes of the ST7 offer both power and flexibility to software developers, enabling the design of highly efficient and compact application code. In addition to standard 8-bit data management, all ST7 microcontrollers feature true bit manipulation, 8x8 unsigned multiplication and indirect addressing modes. For easy reference, all parametric data are located in section 13 on page 81. Figure 1. General Block Diagram 1 MHz. RC OSC + PLL x 4 or x 8 Internal CLOCK LITE TIMER VDD VSS POWER SUPPLY PORT A CONTROL 8-BIT CORE ALU FLASH MEMORY (1 or 1.5K Bytes) ADDRESS AND DATA BUS RESET LVD/AVD w/ WATCHDOG PA7:0 (8 bits) 12-BIT AUTORELOAD TIMER SPI PORT B PB4:0 (5 bits) 8-BIT ADC RAM (128 Bytes) DATA EEPROM (128 Bytes) 5/124 1 ST7LITE0xY0, ST7LITESxY0 2 PIN DESCRIPTION PA0 (HS)/LTIC VSS VDD PB0/SS/AIN0 Figure 2. 20-Pin QFN Package Pinout 20 19 18 17 e3 e0 16 PA1 (HS) 2 15 PA2 (HS)/ATPWM0 NC 3 14 PA3 (HS) NC 4 13 NC MISO/AIN2/PB2 5 12 PA4 (HS) 11 PA5 (HS)/ICCDATA RESET 1 NC ei1 ei2 7 8 9 10 CLKIN/AIN4/PB4 PA7 MCO/ICCCLK/PA6 6 MOSI/AIN3/PB3 SCK/AIN1/PB1 (HS) 20mA High sink capability eix associated external interrupt vector Figure 3. 16-Pin SO and DIP Package Pinout k VSS 1 ei0 16 VDD RESET 2 15 3 14 4 ei3 13 PA3 (HS) 5 12 PA4 (HS) MISO/AIN2/PB2 6 11 PA5 (HS)/ICCDATA MOSI/AIN3/PB3 7 ei2 10 PA6/MCO/ICCCLK SS/AIN0/PB0 SCK/AIN1/PB1 CLKIN/AIN4/PB4 8 ei1 9 PA0 (HS)/LTIC PA1 (HS) PA2 (HS)/ATPWM0 PA7 (HS) 20mA high sink capability eix associated external interrupt vector 6/124 1 ST7LITE0xY0, ST7LITESxY0 PIN DESCRIPTION (Cont'd) Legend / Abbreviations for Table 1: Type: I = input, O = output, S = supply In/Output level: C= CMOS 0.15VDD/0.85VDD with input trigger CT= CMOS 0.3VDD/0.7VDD with input trigger Output level: HS = 20mA high sink (on N-buffer only) Port and control configuration: - Input: float = floating, wpu = weak pull-up, int = interrupt 1), ana = analog - Output: OD = open drain, PP = push-pull Table 1. Device Pin Description Port / Control VSS S Ground 19 2 VDD S Main power supply 1 3 RESET I/O CT 20 4 PB0/AIN0/SS I/O CT X 6 5 PB1/AIN1/SCK I/O CT X 5 6 PB2/AIN2/MISO I/O CT X 7 7 PB3/AIN3/MOSI I/O CT X 8 8 PB4/AIN4/CLKIN I/O CT X 9 9 PA7 I/O CT X X PP OD Output ana int wpu Input float Output 1 Input 18 Pin Name Type SO16/DIP16 Level QFN20 Pin n X ei3 Main Function (after reset) Top priority non maskable interrupt (active low) X X X Port B0 X X X X Port B1 X X X X Port B2 X X X Port B3 X X X Port B4 X X Port A7 ei2 X ei1 Alternate Function ADC Analog Input 0 or SPI Slave Select (active low) ADC Analog Input 1 or SPI Clock Caution: No negative current injection allowed on this pin. For details, refer to section 13.2.2 on page 82 ADC Analog Input 2 or SPI Master In/ Slave Out Data ADC Analog Input 3 or SPI Master Out / Slave In Data ADC Analog Input 4 or External clock input X X X X Port A6 Main Clock Output/In Circuit Communication Clock. Caution: During normal operation this pin must be pulled- up, internally or externally (external pull-up of 10k mandatory in noisy environment). This is to avoid entering ICC mode unexpectedly during a reset. In the application, even if the pin is configured as output, any reset will put it back in input pull-up I/O CT HS X X X X Port A5 In Circuit Communication Data 12 12 PA4 I/O CT HS X X X X Port A4 14 13 PA3 I/O CT HS X X X X Port A3 10 10 PA6 /MCO/ ICCCLK I/O 11 11 PA5/ ICCDATA CT 7/124 1 ST7LITE0xY0, ST7LITESxY0 Level Port / Control PP X X X Port A2 16 15 PA1 I/O CT HS X X X X Port A1 17 16 PA0/LTIC I/O CT HS X X X Port A0 ei0 ana X int I/O CT HS Pin Name Input 15 14 PA2/ATPWM0 QFN20 OD Main Function (after reset) wpu Output float Input Output Type SO16/DIP16 Pin n Alternate Function Auto-Reload Timer PWM0 Lite Timer Input Capture Note: In the interrupt input column, "eix" defines the associated external interrupt vector. If the weak pull-up column (wpu) is merged with the interrupt column (int), then the I/O configuration is pull-up interrupt input, else the configuration is floating interrupt input. 8/124 1 ST7LITE0xY0, ST7LITESxY0 3 REGISTER & MEMORY MAP As shown in Figure 4 and Figure 5, the MCU is capable of addressing 64K bytes of memories and I/ O registers. The available memory locations consist of up to 128 bytes of register locations, 128 bytes of RAM, 128 bytes of data EEPROM and up to 1.5 Kbytes of user program memory. The RAM space includes up to 64 bytes for the stack from 0C0h to 0FFh. The highest address bytes contain the user reset and interrupt vectors. The size of Flash Sector 0 is configurable by Option byte. IMPORTANT: Memory locations marked as "Reserved" must never be accessed. Accessing a reserved area can have unpredictable effects on the device. Figure 4. Memory Map (ST7LITE0x) 0000h 007Fh 0080h HW Registers (see Table 2) RAM (128 Bytes) 00FFh 0100h 0080h Short Addressing RAM (zero page) 00BFh 00C0h 64 Bytes Stack 00FFh Reserved 0FFFh 1000h 107Fh 1080h Data EEPROM (128 Bytes) F9FFh FA00h 1001h RCCR1 1.5K FLASH PROGRAM MEMORY FA00h Flash Memory (1.5K) FBFFh FC00h FFFFh FFFFh RCCR0 see section 7.1 on page 24 Reserved FFDFh FFE0h 1000h Interrupt & Reset Vectors (see Table 6) 0.5 Kbytes SECTOR 1 1 Kbytes SECTOR 0 FFDEh RCCR0 FFDFh RCCR1 see section 7.1 on page 24 9/124 1 ST7LITE0xY0, ST7LITESxY0 REGISTER AND MEMORY MAP (Cont'd) Figure 5. Memory Map (ST7SUPERLITE) 0000h 007Fh 0080h HW Registers (see Table 2) RAM (128 Bytes) 00FFh 0100h 0080h Short Addressing RAM (zero page) 00BFh 00C0h 64 Bytes Stack 00FFh Reserved 1K FLASH PROGRAM MEMORY FBFFh FC00h FC00h Flash Memory (1K) FDFFh FE00h FFFFh FFDFh FFE0h FFFFh Interrupt & Reset Vectors (see Table 6) 0.5 Kbytes SECTOR 1 0.5 Kbytes SECTOR 0 FFDEh RCCR0 FFDFh RCCR1 see section 7.1 on page 24 10/124 1 ST7LITE0xY0, ST7LITESxY0 REGISTER AND MEMORY MAP (Cont'd) Legend: x=undefined, R/W=read/write Table 2. Hardware Register Map Address 0000h 0001h 0002h 0003h 0004h 0005h Block Register Label 000Dh 000Eh 000Fh 0010h 0011h 0012h 0013h Remarks Port A Port A Data Register Port A Data Direction Register Port A Option Register 00h1) 00h 40h R/W R/W R/W Port B PBDR PBDDR PBOR Port B Data Register Port B Data Direction Register Port B Option Register E0h 1) 00h 00h R/W R/W R/W2) Reserved area (5 bytes) LITE TIMER LTCSR LTICR ATCSR CNTRH CNTRL AUTO-RELOAD ATRH TIMER ATRL PWMCR PWM0CSR 0014h to 0016h 0017h 0018h Reset Status PADR PADDR PAOR 0006h to 000Ah 000Bh 000Ch Register Name Lite Timer Control/Status Register Lite Timer Input Capture Register xxh xxh R/W Read Only Timer Control/Status Register Counter Register High Counter Register Low Auto-Reload Register High Auto-Reload Register Low PWM Output Control Register PWM 0 Control/Status Register 00h 00h 00h 00h 00h 00h 00h R/W Read Only Read Only R/W R/W R/W R/W 00h 00h R/W R/W Reserved area (3 bytes) AUTO-RELOAD DCR0H TIMER DCR0L 0019h to 002Eh PWM 0 Duty Cycle Register High PWM 0 Duty Cycle Register Low Reserved area (22 bytes) 0002Fh FLASH FCSR Flash Control/Status Register 00h R/W 00030h EEPROM EECSR Data EEPROM Control/Status Register 00h R/W 0031h 0032h 0033h SPI SPIDR SPICR SPICSR SPI Data I/O Register SPI Control Register SPI Control/Status Register xxh 0xh 00h R/W R/W R/W 0034h 0035h 0036h ADC ADCCSR ADCDR ADCAMP A/D Control Status Register A/D Data Register A/D Amplifier Control Register 00h 00h 00h R/W Read Only R/W 0037h ITC EICR External Interrupt Control Register 00h R/W MCCSR RCCR Main Clock Control/Status Register RC oscillator Control Register 00h FFh R/W R/W 0038h 0039h CLOCKS 11/124 1 ST7LITE0xY0, ST7LITESxY0 Address Block 003Ah SI 003Bh to 007Fh Register Label SICSR Register Name System Integrity Control/Status Register Reset Status 0xh Remarks R/W Reserved area (69 bytes) Notes: 1. The contents of the I/O port DR registers are readable only in output configuration. In input configuration, the values of the I/O pins are returned instead of the DR register contents. 2. The bits associated with unavailable pins must always keep their reset value. 12/124 1 ST7LITE0xY0, ST7LITESxY0 4 FLASH PROGRAM MEMORY 4.1 Introduction The ST7 single voltage extended Flash (XFlash) is a non-volatile memory that can be electrically erased and programmed either on a byte-by-byte basis or up to 32 bytes in parallel. The XFlash devices can be programmed off-board (plugged in a programming tool) or on-board using In-Circuit Programming or In-Application Programming. The array matrix organisation allows each sector to be erased and reprogrammed without affecting other sectors. 4.2 Main Features ICP (In-Circuit Programming) IAP (In-Application Programming) ICT (In-Circuit Testing) for downloading and executing user application test patterns in RAM Sector 0 size configurable by option byte Read-out and write protection 4.3 PROGRAMMING MODES The ST7 can be programmed in three different ways: - Insertion in a programming tool. In this mode, FLASH sectors 0 and 1, option byte row and data EEPROM can be programmed or erased. - In-Circuit Programming. In this mode, FLASH sectors 0 and 1, option byte row and data EEPROM can be programmed or erased without removing the device from the application board. - In-Application Programming. In this mode, sector 1 and data EEPROM can be programmed or erased without removing the device from the application board and while the application is running. 4.3.1 In-Circuit Programming (ICP) ICP uses a protocol called ICC (In-Circuit Communication) which allows an ST7 plugged on a printed circuit board (PCB) to communicate with an external programming device connected via cable. ICP is performed in three steps: Switch the ST7 to ICC mode (In-Circuit Communications). This is done by driving a specific signal sequence on the ICCCLK/DATA pins while the RESET pin is pulled low. When the ST7 enters ICC mode, it fetches a specific RESET vector which points to the ST7 System Memory containing the ICC protocol routine. This routine enables the ST7 to receive bytes from the ICC interface. - Download ICP Driver code in RAM from the ICCDATA pin - Execute ICP Driver code in RAM to program the FLASH memory Depending on the ICP Driver code downloaded in RAM, FLASH memory programming can be fully customized (number of bytes to program, program locations, or selection of the serial communication interface for downloading). 4.3.2 In Application Programming (IAP) This mode uses an IAP Driver program previously programmed in Sector 0 by the user (in ICP mode). This mode is fully controlled by user software. This allows it to be adapted to the user application, (user-defined strategy for entering programming mode, choice of communications protocol used to fetch the data to be stored etc.) IAP mode can be used to program any memory areas except Sector 0, which is write/erase protected to allow recovery in case errors occur during the programming operation. 13/124 1 ST7LITE0xY0, ST7LITESxY0 FLASH PROGRAM MEMORY (Cont'd) 4.4 ICC interface high level (push pull output or pull-up resistor<1K). A schottky diode can be used to isolate the application RESET circuit in this case. When using a classical RC network with R>1K or a reset management IC with open drain output and pull-up resistor>1K, no additional components are needed. In all cases the user must ensure that no external reset is generated by the application during the ICC session. 3. The use of Pin 7 of the ICC connector depends on the Programming Tool architecture. This pin must be connected when using most ST Programming Tools (it is used to monitor the application power supply). Please refer to the Programming Tool manual. 4. Pin 9 has to be connected to the CLKIN pin of the ST7 when the clock is not available in the application or if the selected clock option is not programmed in the option byte. Caution: During normal operation, ICCCLK pin must be pulled- up, internally or externally (external pull-up of 10K mandatory in noisy environment). This is to avoid entering ICC mode unexpectedly during a reset. In the application, even if the pin is configured as output, any reset will put it back in input pull-up. ICP needs a minimum of 4 and up to 6 pins to be connected to the programming tool. These pins are: - RESET: device reset - VSS: device power supply ground - ICCCLK: ICC output serial clock pin - ICCDATA: ICC input serial data pin - CLKIN: main clock input for external source - VDD: application board power supply (optional, see Note 3) Notes: 1. If the ICCCLK or ICCDATA pins are only used as outputs in the application, no signal isolation is necessary. As soon as the Programming Tool is plugged to the board, even if an ICC session is not in progress, the ICCCLK and ICCDATA pins are not available for the application. If they are used as inputs by the application, isolation such as a serial resistor has to be implemented in case another device forces the signal. Refer to the Programming Tool documentation for recommended resistor values. 2. During the ICP session, the programming tool must control the RESET pin. This can lead to conflicts between the programming tool and the application reset circuit if it drives more than 5mA at Figure 6. Typical ICC Interface PROGRAMMING TOOL ICC CONNECTOR ICC Cable ICC CONNECTOR HE10 CONNECTOR TYPE (See Note 3) OPTIONAL (See Note 4) 9 7 5 3 1 10 8 6 4 2 APPLICATION BOARD APPLICATION RESET SOURCE See Note 2 APPLICATION POWER SUPPLY 14/124 1 ICCDATA ICCCLK ST7 RESET CLKIN VDD See Note 1 and Caution APPLICATION I/O See Note 1 ST7LITE0xY0, ST7LITESxY0 FLASH PROGRAM MEMORY (Cont'd) 4.5 Memory Protection There are two different types of memory protection: Read Out Protection and Write/Erase Protection which can be applied individually. 4.5.1 Read out Protection Readout protection, when selected provides a protection against program memory content extraction and against write access to Flash memory. Even if no protection can be considered as totally unbreakable, the feature provides a very high level of protection for a general purpose microcontroller. Both program and data E2 memory are protected. In flash devices, this protection is removed by reprogramming the option. In this case, both program and data E2 memory are automatically erased, and the device can be reprogrammed. Read-out protection selection depends on the device type: - In Flash devices it is enabled and removed through the FMP_R bit in the option byte. - In ROM devices it is enabled by mask option specified in the Option List. 4.5.2 Flash Write/Erase Protection Write/erase protection, when set, makes it impossible to both overwrite and erase program memory. It does not apply to E2 data. Its purpose is to provide advanced security to applications and prevent any change being made to the memory content. Warning: Once set, Write/erase protection can never be removed. A write-protected flash device is no longer reprogrammable. Write/erase protection is enabled through the FMP_W bit in the option byte. 4.6 Related Documentation For details on Flash programming and ICC protocol, refer to the ST7 Flash Programming Reference Manual and to the ST7 ICC Protocol Reference Manual. 4.7 Register Description FLASH CONTROL/STATUS REGISTER (FCSR) Read/Write Reset Value: 000 0000 (00h) 1st RASS Key: 0101 0110 (56h) 2nd RASS Key: 1010 1110 (AEh) 7 0 0 0 0 0 0 OPT LAT PGM Note: This register is reserved for programming using ICP, IAP or other programming methods. It controls the XFlash programming and erasing operations. When an EPB or another programming tool is used (in socket or ICP mode), the RASS keys are sent automatically. Table 3. FLASH Register Map and Reset Values Address (Hex.) 002Fh Register Label 7 6 5 4 3 2 1 0 0 0 0 0 0 OPT 0 LAT 0 PGM 0 FCSR Reset Value 15/124 1 ST7LITE0xY0, ST7LITESxY0 5 DATA EEPROM 5.1 INTRODUCTION 5.2 MAIN FEATURES The Electrically Erasable Programmable Read Only Memory can be used as a non-volatile backup for storing data. Using the EEPROM requires a basic access protocol described in this chapter. Up to 32 bytes programmed in the same cycle EEPROM mono-voltage (charge pump) Chained erase and programming cycles Internal control of the global programming cycle duration WAIT mode management Read-out protection Figure 7. EEPROM Block Diagram HIGH VOLTAGE PUMP EECSR 0 0 0 ADDRESS DECODER 0 0 4 0 E2LAT E2PGM EEPROM ROW MEMORY MATRIX DECODER (1 ROW = 32 x 8 BITS) 128 4 128 DATA 32 x 8 BITS MULTIPLEXER DATA LATCHES 4 ADDRESS BUS 16/124 1 DATA BUS ST7LITE0xY0, ST7LITESxY0 DATA EEPROM (Cont'd) 5.3 MEMORY ACCESS The Data EEPROM memory read/write access modes are controlled by the E2LAT bit of the EEPROM Control/Status register (EECSR). The flowchart in Figure 8 describes these different memory access modes. Read Operation (E2LAT = 0) The EEPROM can be read as a normal ROM location when the E2LAT bit of the EECSR register is cleared. On this device, Data EEPROM can also be used to execute machine code. Take care not to write to the Data EEPROM while executing from it. This would result in an unexpected code being executed. Write Operation (E2LAT = 1) To access the write mode, the E2LAT bit has to be set by software (the E2PGM bit remains cleared). When a write access to the EEPROM area occurs, the value is latched inside the 32 data latches according to its address. When PGM bit is set by the software, all the previous bytes written in the data latches (up to 32) are programmed in the EEPROM cells. The effective high address (row) is determined by the last EEPROM write sequence. To avoid wrong programming, the user must take care that all the bytes written between two programming sequences have the same high address: Only the five Least Significant Bits of the address can change. At the end of the programming cycle, the PGM and LAT bits are cleared simultaneously. Note: Care should be taken during the programming cycle. Writing to the same memory location will over-program the memory (logical AND between the two write access data result) because the data latches are only cleared at the end of the programming cycle and by the falling edge of the E2LAT bit. It is not possible to read the latched data. This note is illustrated by the Figure 10. Figure 8. Data EEPROM Programming Flowchart READ MODE E2LAT = 0 E2PGM = 0 READ BYTES IN EEPROM AREA WRITE MODE E2LAT = 1 E2PGM = 0 WRITE UP TO 32 BYTES IN EEPROM AREA (with the same 11 MSB of the address) START PROGRAMMING CYCLE E2LAT=1 E2PGM=1 (set by software) 0 E2LAT 1 CLEARED BY HARDWARE 17/124 1 ST7LITE0xY0, ST7LITESxY0 DATA EEPROM (Cont'd) Figure 9. Data E2PROM Write Operation Row / Byte ROW DEFINITION 0 1 2 3 ... 30 31 Physical Address 0 00h...1Fh 1 20h...3Fh ... Nx20h...Nx20h+1Fh N Read operation impossible Byte 1 Byte 2 Byte 32 Read operation possible Programming cycle PHASE 1 PHASE 2 Writing data latches Waiting E2PGM and E2LAT to fall E2LAT bit Set by USER application Cleared by hardware E2PGM bit Note: If a programming cycle is interrupted (by RESET action), the integrity of the data in memory will not be guaranteed. 18/124 1 ST7LITE0xY0, ST7LITESxY0 DATA EEPROM (Cont'd) 5.4 POWER SAVING MODES 5.5 ACCESS ERROR HANDLING Wait mode The DATA EEPROM can enter WAIT mode on execution of the WFI instruction of the microcontroller or when the microcontroller enters Active Halt mode.The DATA EEPROM will immediately enter this mode if there is no programming in progress, otherwise the DATA EEPROM will finish the cycle and then enter WAIT mode. If a read access occurs while E2LAT = 1, then the data bus will not be driven. If a write access occurs while E2LAT = 0, then the data on the bus will not be latched. If a programming cycle is interrupted (by RESET action), the integrity of the data in memory will not be guaranteed. 5.6 DATA EEPROM READ-OUT PROTECTION Active Halt mode Refer to Wait mode. Halt mode The DATA EEPROM immediately enters HALT mode if the microcontroller executes the HALT instruction. Therefore the EEPROM will stop the function in progress, and data may be corrupted. The read-out protection is enabled through an option bit (see option byte section). When this option is selected, the programs and data stored in the EEPROM memory are protected against read-out (including a re-write protection). In Flash devices, when this protection is removed by reprogramming the Option Byte, the entire Program memory and EEPROM is first automatically erased. Note: Both Program Memory and data EEPROM are protected using the same option bit. Figure 10. Data EEPROM Programming Cycle READ OPERATION NOT POSSIBLE READ OPERATION POSSIBLE INTERNAL PROGRAMMING VOLTAGE ERASE CYCLE WRITE OF DATA LATCHES WRITE CYCLE tPROG LAT PGM 19/124 1 ST7LITE0xY0, ST7LITESxY0 DATA EEPROM (Cont'd) 5.7 REGISTER DESCRIPTION EEPROM CONTROL/STATUS REGISTER (EECSR) Read/Write Reset Value: 0000 0000 (00h) 7 0 0 0 0 0 0 0 E2LAT E2PGM Bits 7:2 = Reserved, forced by hardware to 0. Bit 1 = E2LAT Latch Access Transfer This bit is set by software. It is cleared by hardware at the end of the programming cycle. It can only be cleared by software if the E2PGM bit is cleared. 0: Read mode 1: Write mode Bit 0 = E2PGM Programming control and status This bit is set by software to begin the programming cycle. At the end of the programming cycle, this bit is cleared by hardware. 0: Programming finished or not yet started 1: Programming cycle is in progress Note: If the E2PGM bit is cleared during the programming cycle, the memory data is not guaranteed. Table 4. DATA EEPROM Register Map and Reset Values Address (Hex.) 0030h 20/124 1 Register Label 7 6 5 4 3 2 1 0 0 0 0 0 0 0 E2LAT 0 E2PGM 0 EECSR Reset Value ST7LITE0xY0, ST7LITESxY0 6 CENTRAL PROCESSING UNIT 6.1 INTRODUCTION This CPU has a full 8-bit architecture and contains six internal registers allowing efficient 8-bit data manipulation. 6.2 MAIN FEATURES 63 basic instructions Fast 8-bit by 8-bit multiply 17 main addressing modes Two 8-bit index registers 16-bit stack pointer Low power modes Maskable hardware interrupts Non-maskable software interrupt 6.3 CPU REGISTERS The six CPU registers shown in Figure 11 are not present in the memory mapping and are accessed by specific instructions. Accumulator (A) The Accumulator is an 8-bit general purpose register used to hold operands and the results of the arithmetic and logic calculations and to manipulate data. Index Registers (X and Y) In indexed addressing modes, these 8-bit registers are used to create either effective addresses or temporary storage areas for data manipulation. (The Cross-Assembler generates a precede instruction (PRE) to indicate that the following instruction refers to the Y register.) The Y register is not affected by the interrupt automatic procedures (not pushed to and popped from the stack). Program Counter (PC) The program counter is a 16-bit register containing the address of the next instruction to be executed by the CPU. It is made of two 8-bit registers PCL (Program Counter Low which is the LSB) and PCH (Program Counter High which is the MSB). Figure 11. CPU Registers 7 0 ACCUMULATOR RESET VALUE = XXh 7 0 X INDEX REGISTER RESET VALUE = XXh 7 0 Y INDEX REGISTER RESET VALUE = XXh 15 PCH 8 7 PCL 0 PROGRAM COUNTER RESET VALUE = RESET VECTOR @ FFFEh-FFFFh 7 1 1 1 H I 0 N Z C CONDITION CODE REGISTER RESET VALUE = 1 1 1 X 1 X X X 15 8 7 0 STACK POINTER RESET VALUE = STACK HIGHER ADDRESS X = Undefined Value 21/124 1 ST7LITE0xY0, ST7LITESxY0 CPU REGISTERS (Cont'd) CONDITION CODE REGISTER (CC) Read/Write Reset Value: 111x1xxx 7 1 0 1 1 H I N Z because the I bit is set by hardware at the start of the routine and reset by the IRET instruction at the end of the routine. If the I bit is cleared by software in the interrupt routine, pending interrupts are serviced regardless of the priority level of the current interrupt routine. C The 8-bit Condition Code register contains the interrupt mask and four flags representative of the result of the instruction just executed. This register can also be handled by the PUSH and POP instructions. These bits can be individually tested and/or controlled by specific instructions. Bit 4 = H Half carry. This bit is set by hardware when a carry occurs between bits 3 and 4 of the ALU during an ADD or ADC instruction. It is reset by hardware during the same instructions. 0: No half carry has occurred. 1: A half carry has occurred. This bit is tested using the JRH or JRNH instruction. The H bit is useful in BCD arithmetic subroutines. Bit 2 = N Negative. This bit is set and cleared by hardware. It is representative of the result sign of the last arithmetic, logical or data manipulation. It is a copy of the 7th bit of the result. 0: The result of the last operation is positive or null. 1: The result of the last operation is negative (that is, the most significant bit is a logic 1). This bit is accessed by the JRMI and JRPL instructions. Bit 1 = Z Zero. This bit is set and cleared by hardware. This bit indicates that the result of the last arithmetic, logical or data manipulation is zero. 0: The result of the last operation is different from zero. 1: The result of the last operation is zero. This bit is accessed by the JREQ and JRNE test instructions. Bit 3 = I Interrupt mask. This bit is set by hardware when entering in interrupt or by software to disable all interrupts except the TRAP software interrupt. This bit is cleared by software. 0: Interrupts are enabled. 1: Interrupts are disabled. This bit is controlled by the RIM, SIM and IRET instructions and is tested by the JRM and JRNM instructions. Note: Interrupts requested while I is set are latched and can be processed when I is cleared. By default an interrupt routine is not interruptible 22/124 1 Bit 0 = C Carry/borrow. This bit is set and cleared by hardware and software. It indicates an overflow or an underflow has occurred during the last arithmetic operation. 0: No overflow or underflow has occurred. 1: An overflow or underflow has occurred. This bit is driven by the SCF and RCF instructions and tested by the JRC and JRNC instructions. It is also affected by the "bit test and branch", shift and rotate instructions. ST7LITE0xY0, ST7LITESxY0 CPU REGISTERS (Cont'd) Stack Pointer (SP) Read/Write Reset Value: 00 FFh 15 0 8 0 0 0 0 0 0 7 1 0 0 1 SP5 SP4 SP3 SP2 SP1 SP0 The Stack Pointer is a 16-bit register which is always pointing to the next free location in the stack. It is then decremented after data has been pushed onto the stack and incremented before data is popped from the stack (see Figure 12). Since the stack is 64 bytes deep, the 10 most significant bits are forced by hardware. Following an MCU Reset, or after a Reset Stack Pointer instruction (RSP), the Stack Pointer contains its reset value (the SP5 to SP0 bits are set) which is the stack higher address. The least significant byte of the Stack Pointer (called S) can be directly accessed by a LD instruction. Note: When the lower limit is exceeded, the Stack Pointer wraps around to the stack upper limit, without indicating the stack overflow. The previously stored information is then overwritten and therefore lost. The stack also wraps in case of an underflow. The stack is used to save the return address during a subroutine call and the CPU context during an interrupt. The user may also directly manipulate the stack by means of the PUSH and POP instructions. In the case of an interrupt, the PCL is stored at the first location pointed to by the SP. Then the other registers are stored in the next locations as shown in Figure 12. - When an interrupt is received, the SP is decremented and the context is pushed on the stack. - On return from interrupt, the SP is incremented and the context is popped from the stack. A subroutine call occupies two locations and an interrupt five locations in the stack area. Figure 12. Stack Manipulation Example CALL Subroutine PUSH Y Interrupt event POP Y RET or RSP IRET @ 00C0h SP SP CC A X X X PCH PCH PCH PCL PCL PCL PCH PCH PCH PCH PCH PCL PCL PCL PCL PCL SP @ 00FFh SP Y CC A CC A SP SP Stack Higher Address = 00FFh Stack Lower Address = 00C0h 23/124 1 ST7LITE0xY0, ST7LITESxY0 7 SUPPLY, RESET AND CLOCK MANAGEMENT The device includes a range of utility features for securing the application in critical situations (for example in case of a power brown-out), and reducing the number of external components. Main features Clock Management - 1 MHz internal RC oscillator (enabled by option byte) - External Clock Input (enabled by option byte) - PLL for multiplying the frequency by 4 or 8 (enabled by option byte) Reset Sequence Manager (RSM) System Integrity Management (SI) - Main supply Low voltage detection (LVD) with reset generation (enabled by option byte) - Auxiliary Voltage detector (AVD) with interrupt capability for monitoring the main supply (enabled by option byte) 7.1 INTERNAL RC OSCILLATOR ADJUSTMENT The ST7 contains an internal RC oscillator with an accuracy of 1% for a given device, temperature and voltage. It must be calibrated to obtain the frequency required in the application. This is done by software writing a calibration value in the RCCR (RC Control Register). Whenever the microcontroller is reset, the RCCR returns to its default value (FFh), i.e. each time the device is reset, the calibration value must be loaded in the RCCR. Predefined calibration values are stored in EEPROM for 3.0 and 5V VDD supply voltages at 25C, as shown in the following table. Notes: - See "ELECTRICAL CHARACTERISTICS" on page 81. for more information on the frequency and accuracy of the RC oscillator. - To improve clock stability and frequency accuracy, it is recommended to place a decoupling capacitor, typically 100nF, between the VDD and VSS pins as close as possible to the ST7 device. 24/124 1 RCCR RCCR0 RCCR1 Conditions VDD=5V TA=25C fRC=1MHz VDD=3.0V TA=25C fRC=700KHz ST7FLITE09 Address ST7FLITE05/ ST7FLITES5 Address 1000h and FFDEh FFDEh 1001h andFFDFh FFDFh - These two bytes are systematically programmed by ST, including on FASTROM devices. Consequently, customers intending to us e FASTROM service must not use these two bytes. - RCCR0 and RCCR1 calibration values will be erased if the read-out protection bit is reset after it has been set. See "Read out Protection" on page 15. Caution: If the voltage or temperature conditions change in the application, the frequency may need to be recalibrated. Refer to application note AN1324 for information on how to calibrate the RC frequency using an external reference signal. 7.2 PHASE LOCKED LOOP The PLL can be used to multiply a 1MHz frequency from the RC oscillator or the external clock by 4 or 8 to obtain fOSC of 4 or 8 MHz. The PLL is enabled and the multiplication factor of 4 or 8 is selected by 2 option bits. - The x4 PLL is intended for operation with VDD in the 2.4V to 3.3V range - The x8 PLL is intended for operation with VDD in the 3.3V to 5.5V range Refer to Section 15.1 for the option byte description. If the PLL is disabled and the RC oscillator is enabled, then fOSC = 1MHz. If both the RC oscillator and the PLL are disabled, fOSC is driven by the external clock. ST7LITE0xY0, ST7LITESxY0 Figure 13. PLL Output Frequency Timing Diagram LOCKED bit set 4/8 x input freq. Bit 1 = MCO Main Clock Out enable This bit is read/write by software and cleared by hardware after a reset. This bit allows to enable the MCO output clock. 0: MCO clock disabled, I/O port free for general purpose I/O. 1: MCO clock enabled. Output freq. tSTAB Bit 0 = SMS Slow Mode select This bit is read/write by software and cleared by hardware after a reset. This bit selects the input clock fOSC or fOSC/32. 0: Normal mode (fCPU = fOSC 1: Slow mode (fCPU = fOSC/32) tLOCK tSTARTUP t When the PLL is started, after reset or wakeup from Halt mode or AWUFH mode, it outputs the clock after a delay of tSTARTUP. When the PLL output signal reaches the operating frequency, the LOCKED bit in the SICSCR register is set. Full PLL accuracy (ACCPLL) is reached after a stabilization time of tSTAB (see Figure 13 and 13.3.4 Internal RC Oscillator and PLL) Refer to section 8.4.4 on page 36 for a description of the LOCKED bit in the SICSR register. 7.3 REGISTER DESCRIPTION MAIN CLOCK CONTROL/STATUS REGISTER (MCCSR) Read / Write Reset Value: 0000 0000 (00h) 7 0 0 0 0 0 0 0 MCO RC CONTROL REGISTER (RCCR) Read / Write Reset Value: 1111 1111 (FFh) 7 0 CR7 CR6 CR5 CR4 CR3 CR2 CR1 CR0 Bits 7:0 = CR[7:0] RC Oscillator Frequency Adjustment Bits These bits must be written immediately after reset to adjust the RC oscillator frequency and to obtain an accuracy of 1%. The application can store the correct value for each voltage range in EEPROM and write it to this register at start-up. 00h = maximum available frequency FFh = lowest available frequency Note: To tune the oscillator, write a series of different values in the register until the correct frequency is reached. The fastest method is to use a dichotomy starting with 80h. SMS Bits 7:2 = Reserved, must be kept cleared. Table 5. Clock Register Map and Reset Values Address (Hex.) 0038h 0039h Register Label 7 6 5 4 3 2 1 0 0 0 0 0 0 0 MCO 0 SMS 0 CR7 1 CR6 1 CR5 1 CR4 1 CR3 1 CR2 1 CR1 1 CR0 1 MCCSR Reset Value RCCR Reset Value 25/124 1 ST7LITE0xY0, ST7LITESxY0 SUPPLY, RESET AND CLOCK MANAGEMENT (Cont'd) Figure 14. Clock Management Block Diagram CR7 CR6 CR5 CR4 CR3 CR2 CR1 CR0 RCCR 1MHz 8MHz PLL 1MHz -> 8MHz PLL 1MHz -> 4MHz Tunable 1% RC Oscillator Option byte /2 DIVIDER CLKIN fOSC 4MHz 0 to 8 MHz Option byte 8-BIT LITE TIMER COUNTER fOSC fLTIMER (1ms timebase @ 8 MHz fOSC) fOSC/32 /32 DIVIDER 1 fCPU fOSC 0 TO CPU AND PERIPHERALS (except LITE TIMER) MCO SMS MCCSR 7 26/124 1 0 fCPU MCO ST7LITE0xY0, ST7LITESxY0 7.4 RESET SEQUENCE MANAGER (RSM) 7.4.1 Introduction The reset sequence manager includes three RESET sources as shown in Figure 16: External RESET source pulse Internal LVD RESET (Low Voltage Detection) Internal WATCHDOG RESET Note: A reset can also be triggered following the detection of an illegal opcode or prebyte code. Refer to section 11.2.1 on page 53 for further details. These sources act on the RESET pin and it is always kept low during the delay phase. The RESET service routine vector is fixed at addresses FFFEh-FFFFh in the ST7 memory map. The basic RESET sequence consists of 3 phases as shown in Figure 15: Active Phase depending on the RESET source 256 CPU clock cycle delay RESET vector fetch The 256 CPU clock cycle delay allows the oscillator to stabilise and ensures that recovery has taken place from the Reset state. The RESET vector fetch phase duration is 2 clock cycles. If the PLL is enabled by option byte, it outputs the clock after an additional delay of tSTARTUP (see Figure 13). Figure 15. RESET Sequence Phases RESET Active Phase INTERNAL RESET 256 CLOCK CYCLES FETCH VECTOR Figure 16.Reset Block Diagram VDD RON RESET INTERNAL RESET FILTER PULSE GENERATOR WATCHDOG RESET ILLEGAL OPCODE RESET 1) LVD RESET Note 1: See "Illegal Opcode Reset" on page 78. for more details on illegal opcode reset conditions. 27/124 1 ST7LITE0xY0, ST7LITESxY0 RESET SEQUENCE MANAGER (Cont'd) 7.4.2 Asynchronous External RESET pin The RESET pin is both an input and an open-drain output with integrated RON weak pull-up resistor. This pull-up has no fixed value but varies in accordance with the input voltage. It can be pulled low by external circuitry to reset the device. See Electrical Characteristic section for more details. A RESET signal originating from an external source must have a duration of at least th(RSTL)in in order to be recognized (see Figure 17). This detection is asynchronous and therefore the MCU can enter reset state even in HALT mode. The RESET pin is an asynchronous signal which plays a major role in EMS performance. In a noisy environment, it is recommended to follow the guidelines mentioned in the electrical characteristics section. 7.4.3 External Power-On RESET If the LVD is disabled by option byte, to start up the microcontroller correctly, the user must ensure by means of an external reset circuit that the reset signal is held low until VDD is over the minimum level specified for the selected fOSC frequency. A proper reset signal for a slow rising VDD supply can generally be provided by an external RC network connected to the RESET pin. 7.4.4 Internal Low Voltage Detector (LVD) RESET Two different RESET sequences caused by the internal LVD circuitry can be distinguished: Power-On RESET Voltage Drop RESET The device RESET pin acts as an output that is pulled low when VDD= JRUGT Jump if (C + Z = 0) Unsigned > 79/124 1 ST7LITE0xY0, ST7LITESxY0 INSTRUCTION GROUPS (cont'd) Mnemo Description Function/Example Dst Src JRULE Jump if (C + Z = 1) Unsigned <= LD Load dst <= src reg, M M, reg MUL Multiply X,A = X * A A, X, Y X, Y, A NEG Negate (2's compl) neg $10 reg, M NOP No Operation OR OR operation A=A+M A M POP Pop from the Stack pop reg reg M pop CC CC M M reg, CC H I N Z N Z 0 H C 0 I N Z N Z N Z C C PUSH Push onto the Stack push Y RCF Reset carry flag C=0 RET Subroutine Return RIM Enable Interrupts I=0 RLC Rotate left true C C <= Dst <= C reg, M N Z C RRC Rotate right true C C => Dst => C reg, M N Z C RSP Reset Stack Pointer S = Max allowed SBC Subtract with Carry A=A-M-C N Z C SCF Set carry flag C=1 SIM Disable Interrupts I=1 SLA Shift left Arithmetic C <= Dst <= 0 reg, M N Z C SLL Shift left Logic C <= Dst <= 0 reg, M N Z C SRL Shift right Logic 0 => Dst => C reg, M 0 Z C SRA Shift right Arithmetic Dst7 => Dst => C reg, M N Z C SUB Subtraction A=A-M A N Z C SWAP SWAP nibbles Dst[7..4] <=> Dst[3..0] reg, M N Z TNZ Test for Neg & Zero tnz lbl1 N Z TRAP S/W trap S/W interrupt WFI Wait for Interrupt XOR Exclusive OR N Z 80/124 1 0 0 A M 1 1 M 1 0 A = A XOR M A M ST7LITE0xY0, ST7LITESxY0 13 ELECTRICAL CHARACTERISTICS 13.1 PARAMETER CONDITIONS Unless otherwise specified, all voltages are referred to VSS. 13.1.1 Minimum and Maximum values Unless otherwise specified the minimum and maximum values are guaranteed in the worst conditions of ambient temperature, supply voltage and frequencies by tests in production on 100% of the devices with an ambient temperature at TA=25C and TA=TAmax (given by the selected temperature range). Data based on characterization results, design simulation and/or technology characteristics are indicated in the table footnotes and are not tested in production. Based on characterization, the minimum and maximum values refer to sample tests and represent the mean value plus or minus three times the standard deviation (mean3). 13.1.2 Typical values Unless otherwise specified, typical data are based on TA=25C, VDD=5V (for the 4.5VVDD5.5V voltage range), VDD=3.3V (for the 3VVDD3.6V voltage range) and VDD=2.7V (for the 2.4VVDD3V voltage range). They are given only as design guidelines and are not tested. 13.1.3 Typical curves Unless otherwise specified, all typical curves are given only as design guidelines and are not tested. 13.1.4 Loading capacitor The loading conditions used for pin parameter measurement are shown in Figure 46. 13.1.5 Pin input voltage The input voltage measurement on a pin of the device is described in Figure 47. Figure 47. Pin input voltage ST7 PIN VIN Figure 46. Pin loading conditions ST7 PIN CL 81/124 1 ST7LITE0xY0, ST7LITESxY0 13.2 ABSOLUTE MAXIMUM RATINGS Stresses above those listed as "absolute maximum ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device under these condi13.2.1 Voltage Characteristics Symbol VDD - VSS VIN VESD(HBM) tions is not implied. Exposure to maximum rating conditions for extended periods may affect device reliability. Ratings Maximum value Supply voltage 7.0 Unit V Input voltage on any pin 1) & 2) VSS-0.3 to VDD+0.3 Electrostatic discharge voltage (Human Body Model) see section 13.7.2 on page 93 13.2.2 Current Characteristics Symbol Ratings Maximum value 3) IVDD Total current into VDD power lines (source) IVSS Total current out of VSS ground lines (sink) 3) IIO IINJ(PIN) 2) & 4) 20 Output current sunk by any high sink I/O pin 40 Output current source by any I/Os and control pin - 25 Injected current on RESET pin 5 Injected current on any other pin IINJ(PIN) 2) 75 150 Output current sunk by any standard I/O and control pin Injected current on PB1 pin 5) Unit mA +5 6) Total injected current (sum of all I/O and control pins) 6) 5 20 13.2.3 Thermal Characteristics Symbol TSTG TJ Ratings Storage temperature range Value Unit -65 to +150 C Maximum junction temperature (see Section 14.2 THERMAL CHARACTERISTICS) Notes: 1. Directly connecting the I/O pins to VDD or VSS could damage the device if an unexpected change of the I/O configuration occurs (for example, due to a corrupted program counter). To guarantee safe operation, this connection has to be done through a pull-up or pull-down resistor (typical: 10k for I/Os). Unused I/O pins must be tied in the same way to VDD or VSS according to their reset configuration. For reset pin, please refer to Figure 80. 2. IINJ(PIN) must never be exceeded. This is implicitly insured if VIN maximum is respected. If VIN maximum cannot be respected, the injection current must be limited externally to the IINJ(PIN) value. A positive injection is induced by VIN>VDD while a negative injection is induced by VIN0 AVDF flag toggle threshold (VDD rise) High Threshold Med. Threshold Low Threshold 4.40 3.90 3.20 4.70 4.10 3.40 5.00 4.30 3.60 VIT-(AVD) 0=>1 AVDF flag toggle threshold (VDD fall) High Threshold Med. Threshold Low Threshold 4.30 3.70 2.90 4.60 3.90 3.20 4.90 4.10 3.40 Vhys AVD voltage threshold hysteresis VIT+(AVD)-VIT-(AVD) 150 mV VIT- Voltage drop between AVD flag set and LVD reset activation VDD fall 0.45 V VIT+(AVD) 84/124 1 V ST7LITE0xY0, ST7LITESxY0 13.3.4 Internal RC Oscillator and PLL The ST7 internal clock can be supplied by an internal RC oscillator and PLL (selectable by option byte). Symbol Parameter Conditions Min Typ Max VDD(RC) Internal RC Oscillator operating voltage 2.4 5.5 VDD(x4PLL) x4 PLL operating voltage 2.4 3.3 VDD(x8PLL) x8 PLL operating voltage 3.3 5.5 tSTARTUP PLL Startup time Unit V PLL input clock (fPLL) cycles 60 The RC oscillator and PLL characteristics are temperature-dependent and are grouped in two tables. 13.3.4.1 Devices with "6" order code suffix (tested for TA = -40 to +85C) @ VDD = 4.5 to 5.5V Symbol Parameter Conditions fRC 1) Internal RC oscillator fre- RCCR = FF (reset value), TA=25C, VDD=5V quency RCCR = RCCR02 ),TA=25C, VDD=5V ACCRC Accuracy of Internal RC oscillator with RCCR=RCCR02) tSTAB ACCPLL PLL Stabilization +1 % +2 % -23) +23) % TA=0 to +85C, VDD=4.5 to 5.5V A 9703) 102) TA=25C,VDD=5V 1 time5) x8 PLL Accuracy kHz 1000 -5 RC oscillator setup time PLL Lock time5) Unit -1 tsu(RC) tLOCK Max 760 TA=-40 to +85C, VDD=5V IDD(RC) x8 PLL input clock Typ TA=25C,VDD=4.5 to 5.5V RC oscillator current conTA=25C,VDD=5V sumption fPLL Min 3) s MHz 2 ms 4 ms fRC = 1MHz@TA=25C, VDD=4.5 to 5.5V 0.14) % fRC = 1MHz@TA=-40 to +85C, VDD=5V 0.14) % tw(JIT) PLL jitter period JITPLL PLL jitter (fCPU/fCPU) IDD(PLL) PLL current consumption TA=25C fRC = 1MHz 8 6) kHz 16) % 6003) A Notes: 1. If the RC oscillator clock is selected, to improve clock stability and frequency accuracy, it is recommended to place a decoupling capacitor, typically 100nF, between the VDD and VSS pins as close as possible to the ST7 device. 2. See "INTERNAL RC OSCILLATOR ADJUSTMENT" on page 24 3. Data based on characterization results, not tested in production 4. Averaged over a 4ms period. After the LOCKED bit is set, a period of tSTAB is required to reach ACCPLL accuracy 5. After the LOCKED bit is set ACCPLL is max. 10% until tSTAB has elapsed. See Figure 13 on page 25. 6. Guaranteed by design. 85/124 1 ST7LITE0xY0, ST7LITESxY0 OPERATING CONDITIONS (Cont'd) 13.3.4.2 Devices with `"6" order code suffix (tested for TA = -40 to +85C) @ VDD = 2.7 to 3.3V Symbol Parameter Conditions fRC 1) Internal RC oscillator fre- RCCR = FF (reset value), TA=25C, VDD= 3.0V quency RCCR=RCCR12) ,TA=25C, VDD= 3V ACCRC Accuracy of Internal RC TA=25C,VDD=3V oscillator when calibrated TA=25C,VDD=2.7 to 3.3V with RCCR=RCCR12)3) TA=-40 to +85C, VDD=3V IDD(RC) RC oscillator current conTA=25C,VDD=3V sumption tsu(RC) RC oscillator setup time fPLL x4 PLL input clock tLOCK PLL Lock time5) tSTAB PLL Stabilization Min Typ Unit kHz 700 -2 +2 % -25 +25 % 15 % -15 A 7003) 102) TA=25C,VDD=3V time5) Max 560 s 0.73) MHz 2 ms 4 ms fRC = 1MHz@TA=25C, VDD=2.7 to 3.3V 0.14) % fRC = 1MHz@TA=40 to +85C, VDD= 3V 0.14) % fRC = 1MHz 86) kHz ACCPLL x4 PLL Accuracy tw(JIT) PLL jitter period JITPLL PLL jitter (fCPU/fCPU) IDD(PLL) PLL current consumption TA=25C 16) % 1903) A Notes: 1. If the RC oscillator clock is selected, to improve clock stability and frequency accuracy, it is recommended to place a decoupling capacitor, typically 100nF, between the VDD and VSS pins as close as possible to the ST7 device. 2. See "INTERNAL RC OSCILLATOR ADJUSTMENT" on page 24. 3. Data based on characterization results, not tested in production 4. Averaged over a 4ms period. After the LOCKED bit is set, a period of tSTAB is required to reach ACCPLL accuracy 5. After the LOCKED bit is set ACCPLL is max. 10% until tSTAB has elapsed. See Figure 13 on page 25. 6. Guaranteed by design. 86/124 1 ST7LITE0xY0, ST7LITESxY0 OPERATING CONDITIONS (Cont'd) Figure 51. Typical RC oscillator Accuracy vs temperature @ VDD=5V (Calibrated with RCCR0: 5V @ 25C 1.00 0.95 0.90 0.85 0.80 0.75 0.70 0.65 0.60 0.55 0.50 2 (*) 1 RC Accuracy Output Freq (MHz) Figure 49. RC Osc Freq vs VDD @ TA=25C (Calibrated with RCCR1: 3V @ 25C) 0 (*) -1 -2 -3 -4 -5 ( ) * -45 2.4 2.6 2.8 3 3.2 3.4 3.6 3.8 0 4 25 85 125 Temperature (C) VDD (V) (*) tested in production Figure 50. RC Osc Freq vs VDD (Calibrated with RCCR0: 5V@ 25C) Figure 52. RC Osc Freq vs VDD and RCCR Value 1.60 Output Freq. (MHz) Output Freq. (MHz) 1.80 1.10 1.00 0.90 0.80 0.70 0.60 0.50 0.40 0.30 0.20 0.10 0.00 -45 0 25 90 105 130 1.40 1.20 1.00 rccr=00h 0.80 rccr=64h 0.60 rccr=80h 0.40 rccr=C0h 0.20 rccr=FFh 0.00 2.5 3 3.5 4 4.5 5 5.5 2.4 6 Vdd (V) 2.7 3 3.3 3.75 4 4.5 5 5.5 6 Vdd (V) Figure 53. PLL fCPU/fCPU versus time fCPU/fCPU Max t 0 Min tw(JIT) tw(JIT) 87/124 1 ST7LITE0xY0, ST7LITESxY0 OPERATING CONDITIONS (Cont'd) Figure 54. PLLx4 Output vs CLKIN frequency Figure 55. PLLx8 Output vs CLKIN frequency 7.00 5.00 3.3 4.00 3 2.7 3.00 2.00 1 1.5 2 2.5 External Input Clock Frequency (MHz) Note: fOSC = fCLKIN/2*PLL4 1 9.00 7.00 5.5 5 5.00 4.5 4 3.00 1.00 1.00 88/124 Output Frequency (MHz) Output Frequency (MHz) 11.00 6.00 3 0.85 0.9 1 1.5 2 External Input Clock Frequency (MHz) Note: fOSC = fCLKIN/2*PLL8 2.5 ST7LITE0xY0, ST7LITESxY0 13.4 SUPPLY CURRENT CHARACTERISTICS The following current consumption specified for the ST7 functional operating modes over temperature range does not take into account the clock source current consumption. To get the total de13.4.1 Supply Current TA = -40 to +85C unless otherwise specified Symbol Conditions Supply current in RUN mode fCPU=8MHz 1) Supply current in WAIT mode Supply current in SLOW mode Supply current in SLOW WAIT mode Supply current in HALT mode 5) VDD=5.5V IDD Parameter vice consumption, the two current values must be added (except for HALT mode for which the clock is stopped). Typ Max fCPU=8MHz 2) 4.50 1.75 7.00 2.70 fCPU=250kHz 3) 0.75 1.13 fCPU=250kHz 4) 0.65 1 -40CTA+85C 0.50 10 -40CTA+105C TBD TBD TA= +85C 5 Unit mA A 100 Notes: 1. CPU running with memory access, all I/O pins in input mode with a static value at VDD or VSS (no load), all peripherals in reset state; clock input (CLKIN) driven by external square wave, LVD disabled. 2. All I/O pins in input mode with a static value at VDD or VSS (no load), all peripherals in reset state; clock input (CLKIN) driven by external square wave, LVD disabled. 3. SLOW mode selected with fCPU based on fOSC divided by 32. All I/O pins in input mode with a static value at VDD or VSS (no load), all peripherals in reset state; clock input (CLKIN) driven by external square wave, LVD disabled. 4. SLOW-WAIT mode selected with fCPU based on fOSC divided by 32. All I/O pins in input mode with a static value at VDD or VSS (no load), all peripherals in reset state; clock input (CLKIN) driven by external square wave, LVD disabled. 5. All I/O pins in output mode with a static value at VSS (no load), LVD disabled. Data based on characterization results, tested in production at VDD max and fCPU max. Figure 56. Typical IDD in RUN vs. fCPU 8MHz 5.0 4MHz 4.0 1MHz 3.0 Idd (mA) Idd (mA) Figure 57. Typical IDD in SLOW vs. fCPU 2.0 1.0 0.0 2.4 2.7 3.7 4.5 Vdd (V) 5 5.5 250kHz 0.80 0.70 0.60 0.50 0.40 0.30 0.20 0.10 0.00 125kHz 62.5kHz 2.4 2.7 3.7 4.5 5 5.5 Vdd (V) 89/124 1 ST7LITE0xY0, ST7LITESxY0 SUPPLY CURRENT CHARACTERISTICS (Cont'd) Figure 58. Typical IDD in WAIT vs. fCPU Figure 60. Typical IDD vs. Temperature at VDD = 5V and fCPU = 8MHz 8MHz 2.0 5.00 1MHz 1.0 0.5 0.0 2.4 2.7 3.7 4.5 5 5.5 Vdd (V) Idd (mA) Idd (mA) 4MHz 1.5 4.50 4.00 3.50 3.00 RUN WAIT SLOW 2.50 2.00 1.50 SLOW WAIT 1.00 0.50 0.00 -45 25 Idd (mA) Figure 59. Typical IDD in SLOW-WAIT vs. fCPU 0.70 250kHz 0.60 125kHz 0.50 62.5kHz 90 130 Temperature (C) 0.40 0.30 0.20 0.10 0.00 2.4 2.7 3.7 4.5 5 5.5 Vdd (V) 13.4.2 On-chip peripherals Symbol IDD(AT) Parameter 12-bit Auto-Reload Timer supply current 1) IDD(SPI) SPI supply current 2) IDD(ADC) ADC supply current when converting 3) Conditions Typ fCPU=4MHz VDD=3.0V 150 fCPU=8MHz VDD=5.0V 250 fCPU=4MHz VDD=3.0V 50 fCPU=8MHz VDD=5.0V 300 fADC=4MHz VDD=3.0V 780 VDD=5.0V 1100 Unit A 1. Data based on a differential IDD measurement between reset configuration (timer stopped) and a timer running in PWM mode at fcpu=8MHz. 2. Data based on a differential IDD measurement between reset configuration and a permanent SPI master communication (data sent equal to 55h). 3. Data based on a differential IDD measurement between reset configuration and continuous A/D conversions with amplifier off. 90/124 1 ST7LITE0xY0, ST7LITESxY0 13.5 CLOCK AND TIMING CHARACTERISTICS Subject to general operating conditions for VDD, fOSC, and TA. 13.5.1 General Timings Parameter 1) Symbol tc(INST) tv(IT) Conditions Instruction cycle time Interrupt reaction time tv(IT) = tc(INST) + 10 fCPU=8MHz 3) fCPU=8MHz Min Typ 2) Max Unit 2 3 12 tCPU 250 375 1500 ns 10 22 tCPU 1.25 2.75 s Max Unit 13.5.2 External Clock Source Symbol Parameter Conditions Min Typ VCLKINH CLKIN input pin high level voltage 0.7xVDD VDD VCLKINL CLKIN input pin low level voltage VSS 0.3xVDD tw(CLKINH) tw(CLKINL) CLKIN high or low time 4) tr(CLKIN) tf(CLKIN) CLKIN rise or fall time 4) IL see Figure 61 V 15 ns 15 VSSVINVDD CLKIN Input leakage current 1 A Notes: 1. Guaranteed by Design. Not tested in production. 2. Data based on typical application software. 3. Time measured between interrupt event and interrupt vector fetch. tc(INST) is the number of tCPU cycles needed to finish the current instruction execution. 4. Data based on design simulation and/or technology characteristics, not tested in production. Figure 61. Typical Application with an External Clock Source 90% VCLKINH 10% VCLKINL tr(CLKIN) tfCLKIN) tw(CLKINH) tw(CLKINL) fOSC EXTERNAL CLOCK SOURCE CLKIN IL ST72XXX 91/124 1 ST7LITE0xY0, ST7LITESxY0 13.6 MEMORY CHARACTERISTICS TA = -40C to 105C, unless otherwise specified 13.6.1 RAM and Hardware Registers Symbol VRM Parameter Data retention mode 1) Conditions HALT mode (or RESET) Min Typ Max 1.6 Unit V 13.6.2 FLASH Program Memory Symbol VDD tprog Parameter Min Programming time for 1~32 bytes 2) TA=-40 to +105C Programming time for 1.5 kBytes TA=+25C 4) tRET Data retention Write erase cycles Supply current Typ 2.4 Operating voltage for Flash write/erase NRW IDD Conditions TA=+55C 3) Max Unit 5.5 V 5 10 ms 0.24 0.48 s 20 years TA=+25C 10K 7) Read / Write / Erase modes fCPU = 8MHz, VDD = 5.5V No Read/No Write Mode Power down mode / HALT cycles 0 2.6 6) mA 100 0.1 A A 13.6.3 EEPROM Data Memory Symbol Parameter Conditions VDD Operating voltage for EEPROM write/erase tprog Programming time for 1~32 bytes TA=-40 to +105C Data retention 4) TA=+55C 3) Write erase cycles TA=+25C tret NRW Min Typ 2.4 5 Max Unit 5.5 V 10 ms 20 years 300K 7) cycles Notes: 1. Minimum VDD supply voltage without losing data stored in RAM (in HALT mode or under RESET) or in hardware registers (only in HALT mode). Guaranteed by construction, not tested in production. 2. Up to 32 bytes can be programmed at a time. 3. The data retention time increases when the TA decreases. 4. Data based on reliability test results and monitored in production. 5. Data based on characterization results, not tested in production. 6. Guaranteed by Design. Not tested in production. 7. Design target value pending full product characterization. 92/124 1 ST7LITE0xY0, ST7LITESxY0 13.7 EMC (ELECTROMAGNETIC COMPATIBILITY) CHARACTERISTICS Susceptibility tests are performed on a sample basis during product characterization. 13.7.1 Functional EMS (Electro Magnetic Susceptibility) Based on a simple running application on the product (toggling two -+LEDs through I/O ports), the product is stressed by two electro magnetic events until a failure occurs (indicated by the LEDs). ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2 standard. FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and VSS through a 100pF capacitor, until a functional disturbance occurs. This test conforms with the IEC 1000-44 standard. A device reset allows normal operations to be resumed. The test results are given in the table below based on the EMS levels and classes defined in application note AN1709. 13.7.1.1 Designing hardened software to avoid noise problems EMC characterization and optimization are performed at component level with a typical applicaSymbol tion environment and simplified MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in particular. Therefore it is recommended that the user applies EMC software optimization and prequalification tests in relation with the EMC level requested for his application. Software recommendations: The software flowchart must include the management of runaway conditions such as: - Corrupted program counter - Unexpected reset - Critical Data corruption (control registers...) Prequalification trials: Most of the common failures (unexpected reset and program counter corruption) can be reproduced by manually forcing a low state on the RESET pin or the Oscillator pins for 1 second. To complete these trials, ESD stress can be applied directly on the device, over the range of specification values. When unexpected behaviour is detected, the software can be hardened to prevent unrecoverable errors occurring (see application note AN1015). Parameter Level/ Class Conditions VFESD Voltage limits to be applied on any I/O pin to induce a VDD=5V, TA=+25C, fOSC=8MHz functional disturbance conforms to IEC 1000-4-2 2B VFFTB Fast transient voltage burst limits to be applied V =5V, TA=+25C, fOSC=8MHz through 100pF on VDD and VDD pins to induce a func- DD conforms to IEC 1000-4-4 tional disturbance 3B 13.7.2 EMI (Electromagnetic interference) Based on a simple application running on the product (toggling two LEDs through the I/O ports), the product is monitored in terms of emission. This emission test is in line with the norm SAE J 1752/3 which specifies the board and the loading of each pin. Table 20: EMI emissions Symbol SEMI Parameter Peak level Conditions Monitored Frequency Band 0.1MHz to 30MHz VDD=5V, TA=+25C, 30MHz to 130MHz SO16 package, conforming to SAE J 1752/3 130MHz to 1GHz SAE EMI Level Max vs. [fOSC/fCPU] 1/4MHz 1/8MHz 8 14 27 32 26 28 3.5 4 Unit dBV - Note: 1. Data based on characterization results, not tested in production. 93/124 1 ST7LITE0xY0, ST7LITESxY0 EMC CHARACTERISTICS (Cont'd) 13.7.3 Absolute Maximum Ratings (Electrical Sensitivity) Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine its performance in terms of electrical sensitivity. 13.7.3.1 Electro-Static Discharge (ESD) Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test conforms to the JESD22A114A standard. ESD absolute maximum ratings Symbol VESD(HBM) Ratings Electro-static discharge voltage (Human Body Model) Conditions TA=+25C conforming to JESD22-A114 Maximum value 1) Unit 4000 V Notes: 1. Data based on characterization results, not tested in production. 13.7.3.2 Static Latch-Up LU: Two complementary static tests are required on 10 parts to assess the latch-up performance. A supply overvoltage (applied to each power supply pin) and a current injection (applied to each input, output and configurable I/ O pin) are performed on each sample. These test are compliant with the EIA/JESD 78 IC latch-up standard. Electrical Sensitivities Symbol LU Parameter Static latch-up class Conditions TA=+25C conforming to JESD78A Class 1) II level A Note: 1. Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B Class strictly covers all the JEDEC criteria (international standard). 94/124 1 ST7LITE0xY0, ST7LITESxY0 13.8 I/O PORT PIN CHARACTERISTICS 13.8.1 General Characteristics Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified. Symbol Max Unit VIL Input low level voltage Parameter Conditions VSS - 0.3 Min Typ 0.3xVDD V VIH Input high level voltage 0.7xVDD VDD + 0.3 Vhys Schmitt trigger voltage hysteresis 1) IL Input leakage current IS Static current consumption induced by Floating input mode each floating input pin2) 400 VSSVINVDD RPU Weak pull-up equivalent resistor3) CIO mV 1 VIN=V VDD=5V VDD=3V SS A 400 50 120 160 I/O pin capacitance 5 tf(IO)out Output high to low level fall time 1) 25 tr(IO)out Output low to high level rise time 1) tw(IT)in External interrupt pulse time 4) CL=50pF Between 10% and 90% 250 k pF ns 25 1 tCPU Notes: 1. Data based on characterization results, not tested in production. 2. Configuration not recommended, all unused pins must be kept at a fixed voltage: using the output mode of the I/O for example or an external pull-up or pull-down resistor (see Figure 66). Static peak current value taken at a fixed VIN value, based on design simulation and technology characteristics, not tested in production. This value depends on VDD and temperature values. 3. The RPU pull-up equivalent resistor is based on a resistive transistor (corresponding IPU current characteristics described in Figure 63). 4. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external interrupt source. Figure 62. Two typical applications with unused I/O pin configured as input VDD ST7XXX 10k UNUSED I/O PORT 10k UNUSED I/O PORT ST7XXX Caution: During normal operation the ICCCLK pin must be pulled- up, internally or externally (external pull-up of 10k mandatory in noisy environment). This is to avoid entering ICC mode unexpectedly during a reset. Note: I/O can be left unconnected if it is configured as output (0 or 1) by the software. This has the advantage of greater EMC robustness and lower cost. Figure 63. Typical IPU vs. VDD with VIN=VSS l 90 Ta=1 40C 80 Ta=9 5C 70 Ta=2 5C Ta=-45 C Ipu(uA) 60 50 TO BE CHARACTERIZED 40 30 20 10 0 2 2.5 3 3.5 4 4.5 Vdd(V) 5 5.5 6 95/124 1 ST7LITE0xY0, ST7LITESxY0 I/O PORT PIN CHARACTERISTICS (Cont'd) 13.8.2 Output Driving Current Subject to general operating conditions for VDD, fCPU, and TA unless otherwise specified. Symbol Parameter Conditions Output low level voltage for a standard I/O pin when 8 pins are sunk at same time (see Figure 65) Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time (see Figure 66) VOH 2)3) Output high level voltage for an I/O pin when 4 pins are sourced at same time Output low level voltage for a standard I/O pin when 8 pins are sunk at same time VOL 1)3) Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time Output high level voltage for an I/O pin VOH 2)3) when 4 pins are sourced at same time (see Figure 69) IIO=+5mA TA85C TA85C 1.0 1.2 IIO=+2mA TA85C TA85C 0.4 0.5 IIO=+20mA, TA85C TA85C 1.3 1.5 IIO=+8mA TA85C TA85C 0.75 0.85 IIO=-2mA VDD=3.3V Output low level voltage for a standard I/O pin when 8 pins are sunk at same time VOL 1)3) (see Figure 64) Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time Max Unit IIO=-5mA, TA85C VDD-1.5 TA85C VDD-1.6 Output high level voltage for an I/O pin when 4 pins are sourced at same time (see Figure 72) VDD=2.7V VOH 2) VDD=5V VOL 1) Min TA85C VDD-0.8 TA85C VDD-1.0 IIO=+2mA TA85C TA85C 0.5 0.6 IIO=+8mA TA85C TA85C 0.5 0.6 IIO=-2mA TA85C VDD-0.8 TA85C VDD-1.0 IIO=+2mA TA85C TA85C 0.6 0.7 IIO=+8mA TA85C TA85C 0.6 0.7 IIO=-2mA V TA85C VDD-0.9 TA85C VDD-1.0 Notes: 1. The IIO current sunk must always respect the absolute maximum rating specified in Section 13.2.2 and the sum of IIO (I/O ports and control pins) must not exceed IVSS. 2. The IIO current sourced must always respect the absolute maximum rating specified in Section 13.2.2 and the sum of IIO (I/O ports and control pins) must not exceed IVDD. 3. Not tested in production, based on characterization results. 96/124 1 ST7LITE0xY0, ST7LITESxY0 I/O PORT PIN CHARACTERISTICS (Cont'd) Figure 64. Typical VOL at VDD=3.3V (standard) Figure 66. Typical VOL at VDD=5V (high-sink) 2.50 0.70 2.00 0.50 -45C 0C 25C 90C 130C 0.40 0.30 0.20 Vol (V) at VDD=5V (HS) VOL at VDD=3.3V 0.60 -45 0C 25C 90C 130C 1.50 1.00 0.50 0.10 0.00 0.00 0.01 1 2 6 3 7 8 9 10 15 20 25 30 35 40 lio (mA) lio (mA) Figure 65. Typical VOL at VDD=5V (standard) Figure 67. Typical VOL at VDD=3V (high-sink) 1.20 0.80 -45C 0C 25C 90C 130C 0.50 0.40 0.30 0.20 0.10 0.80 -45 0C 0.60 25C 90C 0.40 130C 0.20 0.00 0.01 1 2 3 4 5 0.00 lio (mA) 6 7 8 9 10 15 lio (mA) Figure 68. Typical VDD-VOH at VDD=2.4V 1.60 1.40 VDD-VOH at VDD=2.4V VOL at VDD=5V 0.60 Vol (V) at VDD=3V (HS) 1.00 0.70 1.20 -45C 0C 25C 90C 130C 1.00 0.80 0.60 0.40 0.20 0.00 -0.01 -1 -2 lio (mA) 97/124 1 ST7LITE0xY0, ST7LITESxY0 Figure 71. Typical VDD-VOH at VDD=4V Figure 69. Typical VDD-VOH at VDD=2.7V 1.20 2.50 1.00 -45C 0C 25C 90C 130C 0.60 0.40 VDD-VOH at VDD=4V VDD-VOH at VDD=2.7V 2.00 0.80 -45C 0C 25C 90C 130C 1.50 1.00 0.50 0.20 0.00 0.00 -0.01 -1 -2 -0.01 -1 -2 lio(mA) -3 -4 -5 lio (mA) Figure 72. Typical VDD-VOH at VDD=5V Figure 70. Typical VDD-VOH at VDD=3V 2.00 1.60 1.80 1.20 -45C 0C 25C 90C 130C 1.00 0.80 0.60 VDD-VOH at VDD=5V VDD-VOH at VDD=3V 1.40 1.60 1.40 1.20 1.00 TO BE CHARACTERIZED 0.80 0.60 0.40 0.40 0.20 0.20 -45C 0C 25C 90C 130C 0.00 0.00 -0.01 -0.01 -1 -2 -1 -2 -3 -3 -4 -5 lio (mA) lio (mA) Figure 73. Typical VOL vs. VDD (standard I/Os) 0.70 0.06 0.50 -45 0.40 0C 25C 0.30 90C 130C 0.20 0.10 0.00 2.7 3.3 VDD (V) 1 0.05 -45 0.04 0C 0.03 25C 90C 0.02 130C 0.01 0.00 2.4 98/124 Vol (V) at lio=0.01mA Vol (V) at lio=2mA 0.60 5 2.4 2.7 3.3 VDD (V) 5 ST7LITE0xY0, ST7LITESxY0 Figure 74. Typical VOL vs. VDD (high-sink I/Os) 1.00 0.60 0.50 -45 0.40 0C 25C 0.30 90C 130C 0.20 0.10 VOL vs VDD (HS) at lio=20mA VOL vs VDD (HS) at lio=8mA 0.70 0.90 0.80 0.70 -45 0.60 0C 0.50 25C 0.40 90C 0.30 0.20 130C 0.10 0.00 0.00 2.4 3 2.4 5 3 5 VDD (V) VDD (V) Figure 75. Typical VDD-VOH vs. VDD 1.80 1.10 VDD-VOH at lio=-5mA 1.60 1.50 -45C 0C 25C 90C 130C 1.40 1.30 1.20 1.10 1.00 VDD-VOH (V) at lio=-2mA 1.70 1.00 0.90 -45C 0.80 0C 25C 0.70 90C 130C 0.60 0.50 0.90 0.40 0.80 4 5 VDD 2.4 2.7 3 4 5 VDD (V) 99/124 1 ST7LITE0xY0, ST7LITESxY0 13.9 CONTROL PIN CHARACTERISTICS 13.9.1 Asynchronous RESET Pin TA = -40C to 105C, unless otherwise specified Symbol Parameter Conditions Min Typ Max VIL Input low level voltage VSS - 0.3 0.3xVDD VIH Input high level voltage 0.7xVDD VDD + 0.3 Vhys Schmitt trigger voltage hysteresis 1) VOL RON Output low level voltage 2) VDD=5V Pull-up equivalent resistor 3) 1) th(RSTL)in External reset pulse hold time Filtered glitch duration 0.5 1.0 1.2 IIO=+2mA TA85C TA105C 0.2 0.4 0.5 40 80 4) 20 Internal reset sources 30 V V IIO=+5mA TA85C TA105C VDD=5V tw(RSTL)out Generated reset pulse duration tg(RSTL)in 2 Unit V k s s 20 200 ns Notes: 1. Data based on characterization results, not tested in production. 2. The IIO current sunk must always respect the absolute maximum rating specified in section 13.2.2 on page 82 and the sum of IIO (I/O ports and control pins) must not exceed IVSS. 3. The RON pull-up equivalent resistor is based on a resistive transistor. Specified for voltages on RESET pin between VILmax and VDD 4. To guarantee the reset of the device, a minimum pulse has to be applied to the RESET pin. All short pulses applied on RESET pin with a duration below th(RSTL)in can be ignored. 100/124 1 ST7LITE0xY0, ST7LITESxY0 CONTROL PIN CHARACTERISTICS (Cont'd) Figure 76. RESET pin protection when LVD is enabled.1)2)3)4) VDD Required Optional (note 3) ST72XXX RON EXTERNAL RESET INTERNAL RESET Filter 0.01F 1M PULSE GENERATOR WATCHDOG ILLEGAL OPCODE 5) LVD RESET Figure 77. RESET pin protection when LVD is disabled.1) VDD ST72XXX RON USER EXTERNAL RESET CIRCUIT INTERNAL RESET Filter 0.01F PULSE GENERATOR WATCHDOG ILLEGAL OPCODE 5) Required Note 1: - The reset network protects the device against parasitic resets. - The output of the external reset circuit must have an open-drain output to drive the ST7 reset pad. Otherwise the device can be damaged when the ST7 generates an internal reset (LVD or watchdog). - Whatever the reset source is (internal or external), the user must ensure that the level on the RESET pin can go below the VIL max. level specified in section 13.9.1 on page 100. Otherwise the reset will not be taken into account internally. - Because the reset circuit is designed to allow the internal RESET to be output in the RESET pin, the user must ensure that the current sunk on the RESET pin is less than the absolute maximum value specified for IINJ(RESET) in section 13.2.2 on page 82. Note 2: When the LVD is enabled, it is recommended not to connect a pull-up resistor or capacitor. A 10nF pull-down capacitor is required to filter noise on the reset line. Note 3: In case a capacitive power supply is used, it is recommended to connect a 1M pull-down resistor to the RESET pin to discharge any residual voltage induced by the capacitive effect of the power supply (this will add 5A to the power consumption of the MCU). Note 4: Tips when using the LVD: - 1. Check that all recommendations related to ICCCLK and reset circuit have been applied (see caution in Table 1 on page 7 and notes above) - 2. Check that the power supply is properly decoupled (100nF + 10F close to the MCU). Refer to AN1709 and AN2017. If this cannot be done, it is recommended to put a 100nF + 1M pull-down on the RESET pin. - 3. The capacitors connected on the RESET pin and also the power supply are key to avoid any start-up marginality. In most cases, steps 1 and 2 above are sufficient for a robust solution. Otherwise: replace 10nF pull-down on the RESET pin with a 5F to 20F capacitor." Note 5: See "Illegal Opcode Reset" on page 78. for more details on illegal opcode reset conditions 101/124 1 ST7LITE0xY0, ST7LITESxY0 13.10 COMMUNICATION INTERFACE CHARACTERISTICS 13.10.1 SPI - Serial Peripheral Interface Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified. Symbol Refer to I/O port characteristics for more details on the input/output alternate function characteristics (SS, SCK, MOSI, MISO). Parameter Conditions Master fSCK = 1/tc(SCK) fCPU=8MHz SPI clock frequency Min Max fCPU/128 = 0.0625 fCPU/4 = 2 0 fCPU/2 = 4 Slave fCPU=8MHz tr(SCK) tf(SCK) SPI clock rise and fall time tsu(SS) 1) SS setup time th(SS) 1) TCPU + 50 SS hold time Slave 120 SCK high and low time Master Slave 100 90 tsu(MI) 1) tsu(SI) 1) Data input setup time Master Slave 100 100 th(MI) 1) th(SI) 1) Data input hold time Master Slave 100 100 Data output access time Slave 0 Data output disable time Slave ta(SO) 1) tdis(SO) 1) tv(SO) 1) Data output valid time th(SO) 1) Data output hold time 1) Data output valid time th(MO) 1) Data output hold time tv(MO) MHz see I/O port pin description 4) Slave tw(SCKH) 1) tw(SCKL) 1) Unit ns 120 240 120 Slave (after enable edge) 0 120 Master (after enable edge) 0 Figure 78. SPI Slave Timing Diagram with CPHA=0 3) SS INPUT SCK INPUT tsu(SS) tc(SCK) th(SS) CPHA=0 CPOL=0 CPHA=0 CPOL=1 ta(SO) MISO OUTPUT tw(SCKH) tw(SCKL) MSB OUT see note 2 tsu(SI) MOSI INPUT tv(SO) th(SO) BIT6 OUT tdis(SO) tr(SCK) tf(SCK) LSB OUT see note 2 th(SI) MSB IN BIT1 IN LSB IN Notes: 1. Data based on design simulation and/or characterisation results, not tested in production. 2. When no communication is on-going the data output line of the SPI (MOSI in master mode, MISO in slave mode) has its alternate function capability released. In this case, the pin status depends on the I/O port configuration. 3. Measurement points are done at CMOS levels: 0.3xVDD and 0.7xVDD. 4. Depends on fCPU. For example, if fCPU=8MHz, then TCPU = 1/fCPU =125ns and tsu(SS)=175ns 102/124 1 ST7LITE0xY0, ST7LITESxY0 COMMUNICATION INTERFACE CHARACTERISTICS (Cont'd) Figure 79. SPI Slave Timing Diagram with CPHA=11) SS INPUT SCK INPUT tsu(SS) tc(SCK) th(SS) CPHA=1 CPOL=0 CPHA=1 CPOL=1 tw(SCKH) tw(SCKL) ta(SO) MISO OUTPUT see note 2 tv(SO) th(SO) MSB OUT HZ tsu(SI) BIT6 OUT LSB OUT tdis(SO) see note 2 th(SI) MSB IN MOSI INPUT tr(SCK) tf(SCK) BIT1 IN LSB IN Figure 80. SPI Master Timing Diagram 1) SS INPUT tc(SCK) SCK INPUT CPHA = 0 CPOL = 0 CPHA = 0 CPOL = 1 CPHA = 1 CPOL = 0 CPHA = 1 CPOL = 1 tw(SCKH) tw(SCKL) tsu(MI) MISO INPUT tr(SCK) tf(SCK) th(MI) MSB IN BIT6 IN tv(MO) MOSI OUTPUT See note 2 MSB OUT LSB IN th(MO) BIT6 OUT LSB OUT See note 2 Notes: 1. Measurement points are done at CMOS levels: 0.3xVDD and 0.7xVDD. 2. When no communication is on-going the data output line of the SPI (MOSI in master mode, MISO in slave mode) has its alternate function capability released. In this case, the pin status depends of the I/O port configuration. 103/124 ST7LITE0xY0, ST7LITESxY0 13.11 8-BIT ADC CHARACTERISTICS TA = -40C to 85C, unless otherwise specified Symbol Parameter fADC ADC clock frequency VAIN Conversion voltage range Conditions RAIN External input resistor Internal sample and hold capacitor tSTAB Stabilization time after ADC enable tCONV Conversion time (tSAMPLE+tHOLD) tHOLD Typ VSS CADC tSAMPLE Min Sample capacitor loading time VDD=5V Max Unit 4 MHz VDD V 10 1) k 3 0 fCPU=8MHz, fADC=4MHz Hold conversion time pF 2) s 3 4 1/fADC 8 Notes: 1. Unless otherwise specified, typical data are based on TA=25C and VDD-VSS=5V. They are given only as design guidelines and are not tested. 2. Data based on characterization results, not tested in production. 3. Any added external serial resistor will downgrade the ADC accuracy (especially for resistance greater than 10k). Data based on characterization results, not tested in production. 4. The stabilization time of the AD converter is masked by the first tLOAD. The first conversion after the enable is then always valid. Figure 81. Typical Application with ADC VDD VT 0.6V RAIN AINx 2k(max) VAIN CAIN VT 0.6V IL 1A 8-Bit A/D Conversion CADC 3pF ST7XX 104/124 ST7LITE0xY0, ST7LITESxY0 ADC CHARACTERISTICS (Cont'd) Figure 82. RAIN max. vs fADC with CAIN=0pF1) Figure 83. Recommended CAIN/RAIN values2) 45 1000 Cain 10 nF 4 MHz 35 2 MHz 30 1 MHz 25 20 15 10 Cain 22 nF 100 Max. R AIN (Kohm) Max. R AIN (Kohm) 40 Cain 47 nF 10 1 5 0 0.1 0 10 30 70 CPARASITIC (pF) 0.01 0.1 1 10 fAIN(KHz) Notes: 1. CPARASITIC represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the pad capacitance (3pF). A high CPARASITIC value will downgrade conversion accuracy. To remedy this, fADC should be reduced. 2. This graph shows that depending on the input signal variation (fAIN), CAIN can be increased for stabilization and to allow the use of a larger serial resistor (RAIN). It is valid for all fADC frequencies 4MHz. 13.11.1 General PCB Design Guidelines To obtain best results, some general design and layout rules should be followed when designing the application PCB to shield the noise-sensitive, analog physical interface from noise-generating CMOS logic signals. Properly place components and route the signal traces on the PCB to shield the analog inputs. An- alog signals paths should run over the analog ground plane and be as short as possible. Isolate analog signals from digital signals that may switch while the analog inputs are being sampled by the A/D converter. Do not toggle digital outputs on the same I/O port as the A/D input being converted. 105/124 ST7LITE0xY0, ST7LITESxY0 ADC CHARACTERISTICS (Cont'd) ADC Accuracy with VDD=5.0V TA = -40C to 85C, unless otherwise specified Symbol ET Parameter Total unadjusted error Conditions 2) Typ Offset error EG Gain Error 2) -0.5 / +1 fCPU=4MHz, fADC=2MHz ,VDD=5.0V ED Differential linearity error EL Integral linearity error 2) ET Total unadjusted error 2) Offset error EG Gain Error 2) 1 2) 1 LSB 1) 11) 2 2) EO Unit 1 2) EO Max -0.5 / 3.5 fCPU=8MHz, fADC=4MHz ,VDD=5.0V error 2) ED Differential linearity EL Integral linearity error 2) -2 / 0 LSB 11) 11) Notes: 1. Data based on characterization results over the whole temperature range, monitored in production. 2. Injecting negative current on any of the analog input pins significantly reduces the accuracy of any conversion being performed on any analog input. Analog pins can be protected against negative injection by adding a Schottky diode (pin to ground). Injecting negative current on digital input pins degrades ADC accuracy especially if performed on a pin close to the analog input pins. Any positive injection current within the limits specified for IINJ(PIN) and IINJ(PIN) in Section 13.8 does not affect the ADC accuracy. - 106/124 ST7LITE0xY0, ST7LITESxY0 ADC CHARACTERISTICS (Cont'd) Figure 84. ADC Accuracy Characteristics with Amplifier disabled Digital Result ADCDR EG 255 254 1LSB 253 IDEAL V -V DDA SSA = ----------------------------------------256 ET=Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves. EO=Offset Error: deviation between the first actual transition and the first ideal one. EG=Gain Error: deviation between the last ideal transition and the last actual one. ED=Differential Linearity Error: maximum deviation between actual steps and the ideal one. EL=Integral Linearity Error: maximum deviation between any actual transition and the end point correlation line. (2) ET (3) 7 (1) 6 5 EO EL 4 3 (1) Example of an actual transfer curve (2) The ideal transfer curve (3) End point correlation line ED 2 1 LSBIDEAL 1 0 1 VSSA Vin (LSBIDEAL) 2 3 4 5 6 7 253 254 255 256 VDDA Figure 85. ADC Accuracy Characteristics with Amplifier enabled Digital Result ADCDR EG (2) ET (3) n+7 (1) n+6 n+5 EO n+4 EL n+3 ED n+2 (1) Example of an actual transfer curve (2) The ideal transfer curve (3) End point correlation line ET=Total Unadjusted Error: maximum deviation between the actual and the ideal transfer curves. EO=Offset Error: deviation between the first actual transition and the first ideal one. EG=Gain Error: deviation between the last ideal transition and the last actual one. ED=Differential Linearity Error: maximum deviation between actual steps and the ideal one. EL=Integral Linearity Error: maximum deviation between any actual transition and the end point correlation line. n=Amplifier Offset 1 LSBIDEAL n+1 Vin (LSBIDEAL) 0 1 VSS 2 3 4 5 6 7 100 101 102 103 250 mV Note: When the AMPSEL bit in the ADCDRL register is set, it is mandatory that fADC be less than or equal to 2 MHz. (if fCPU=8MHz. then SPEED=0, SLOW=1). 107/124 ST7LITE0xY0, ST7LITESxY0 ADC CHARACTERISTICS (Cont'd) Vout (ADC input) Vmax Noise Vmin 0V Symbol 0V 250mV Parameter Conditions VDD(AMP) Amplifier operating voltage VIN Amplifier input voltage VOFFSET Amplifier offset voltage VSTEP Step size for monotonicity3) Output Voltage Response Linearity Vin (OPAMP input) VDD=5V Min Typ Max 5.5 V 0 250 mV 200 Amplified Analog input Vmax Output Linearity Max Voltage Vmin Output Linearity Min Voltage mV 5 mV Linear Gain2) Gain factor 71) VINmax = 250mV, VDD=5V 8 91) 2.2 2.4 200 Notes: 1. Data based on characterization results over the whole temperature range, not tested in production. 2. For precise conversion results it is recommended to calibrate the amplifier at the following two points: - offset at VINmin = 0V - gain at full scale (for example VIN=250mV) 3. Monotonicity guaranteed if VIN increases or decreases in steps of min. 5mV. 108/124 Unit 4.5 V mV ST7LITE0xY0, ST7LITESxY0 14 PACKAGE CHARACTERISTICS In order to meet environmental requirements, ST offers these devices in ECOPACK(R) packages. These packages have a Lead-free second level interconnect. The category of second Level Interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label. ECOPACK is an ST trademark. ECOPACK specifications are available at: www.st.com. 14.1 PACKAGE MECHANICAL DATA Figure 86. 20-Lead Very thin Fine pitch Quad Flat No-Lead Package Dim. inches1) mm Min Typ Max Min Typ Max A 0.80 0.85 0.90 0.0315 0.0335 0.0354 A1 0.00 0.02 0.05 A3 0.02 b D D2 E E2 e L ddd 0.0008 0.0020 0.0008 0.25 0.30 0.35 0.0098 0.0118 0.0138 5.00 0.1969 3.10 3.25 3.35 0.1220 0.1280 0.1319 6.00 0.2362 4.10 4.25 4.35 0.1614 0.1673 0.1713 0.80 0.0315 0.45 0.50 0.55 0.0177 0.0197 0.0217 0.08 0.0031 Number of Pins N 20 Note 1. Values in inches are converted from mm and rounded to 4 decimal digits. 109/124 ST7LITE0xY0, ST7LITESxY0 Figure 87. 16-Pin Plastic Dual In-Line Package, 300-mil Width Dim A2 A1 A L Min Typ A E c inches1) mm Max Min Typ Max 5.33 0.2098 A1 0.38 A2 2.92 3.30 4.95 0.1150 0.1299 0.1949 0.0150 b 0.36 0.46 0.56 0.0142 0.0181 0.0220 b2 1.14 1.52 1.78 0.0449 0.0598 0.0701 b3 0.76 0.99 1.14 0.0299 0.0390 0.0449 c 0.20 0.25 0.36 0.0079 0.0098 0.0142 D 18.67 19.18 19.69 0.7350 0.7551 0.7752 D1 0.13 E1 b2 D1 b eB e b3 D 0.0051 2.54 e 0.1000 E 7.62 7.87 8.26 0.3000 0.3098 0.3252 E1 6.10 6.35 7.11 0.2402 0.2500 0.2799 L 2.92 3.30 3.81 0.1150 0.1299 0.1500 10.92 0.4299 eB Number of Pins 16 N Note 1. Values in inches are converted from mm and rounded to 4 decimal digits. Figure 88. 16-Pin Plastic Small Outline Package, 150-mil Width L Dim. 45x A e B A1 H D C Min Typ Max 9 E 1 8 Typ Max 1.75 0.0531 0.0689 A1 0.10 0.25 0.0039 0.0098 B 0.33 0.51 0.0130 0.0201 C 0.19 0.25 0.0075 0.0098 D 9.80 10.0 0.3858 0 0.3937 E 3.80 4.00 0.1496 1.27 e 16 Min 1.35 A A1 inches1) mm H 5.80 0 L 0.40 0.1575 0.0500 6.20 0.2283 8 0 1.27 0.0157 0.2441 8 0.0500 Number of Pins N 16 Note 1. Values in inches are converted from mm and rounded to 4 decimal digits. 110/124 ST7LITE0xY0, ST7LITESxY0 14.2 THERMAL CHARACTERISTICS Symbol RthJA Ratings Package thermal resistance SO16 (junction to ambient) DIP16 Value Unit 95 TBD C/W TJmax Maximum junction temperature 1) 150 C PDmax Power dissipation 2) 500 mW Notes: 1. The maximum chip-junction temperature is based on technology characteristics. 2. The maximum power dissipation is obtained from the formula PD = (TJ -TA) / RthJA. The power dissipation of an application can be defined by the user with the formula: PD=PINT+PPORT where PINT is the chip internal power (IDDxVDD) and PPORT is the port power dissipation depending on the ports used in the application. 111/124 ST7LITE0xY0, ST7LITESxY0 15 DEVICE CONFIGURATION AND ORDERING INFORMATION Each device is available for production in user programmable versions (FLASH) as well as in factory coded versions (FASTROM). ST7PLITE0x and ST7PLITES2/S5 devices are Factory Advanced Service Technique ROM (FASTROM) versions: they are factory-programmed XFlash devices. ST7FLITE0x and ST7FLITES2/S5 XFlash devices are shipped to customers with a default program memory content (FFh). The OSC option bit is programmed to 0 by default. The FASTROM factory coded parts contain the code supplied by the customer. This implies that FLASH devices have to be configured by the customer using the Option Bytes while the FASTROM devices are factory-configured. 15.1 OPTION BYTES The two option bytes allow the hardware configuration of the microcontroller to be selected. The option bytes can be accessed only in programming mode (for example using a standard ST7 programming tool). OPTION BYTE 0 Bits 7:4 = Reserved, must always be 1. 0: Read-out protection off 1: Read-out protection on Bits 3:2 = SEC[1:0] Sector 0 size definition These option bits indicate the size of sector 0 according to the following table. Sector 0 Size SEC1 SEC0 0.5k 0 0 1k 0 1 1 x 1.5k 1) Note 1: Configuration available for ST7LITE0x devices only. 112/124 Bit 1 = FMP_R Read-out protection Readout protection, when selected provides a protection against program memory content extraction and against write access to Flash memory. Erasing the option bytes when the FMP_R option is selected will cause the whole memory to be erased first, and the device can be reprogrammed. Refer to Section 4.5 and the ST7 Flash Programming Reference Manual for more details. Bit 0 = FMP_W FLASH write protection This option indicates if the FLASH program memory is write protected. Warning: When this option is selected, the program memory (and the option bit itself) can never be erased or programmed again. 0: Write protection off 1: Write protection on ST7LITE0xY0, ST7LITESxY0 OPTION BYTES (Cont'd) OPTION BYTE 1 Bit 7 = PLLx4x8 PLL Factor selection. 0: PLLx4 1: PLLx8 Bit 4 = OSC RC Oscillator selection 0: RC oscillator on 1: RC oscillator off Note: If the RC oscillator is selected, then to improve clock stability and frequency accuracy, it is recommended to place a decoupling capacitor, typically 100nF, between the VDD and VSS pins as close as possible to the ST7 device. Bit 6 = PLLOFF PLL disabled 0: PLL enabled 1: PLL disabled (by-passed) Bit 5 = Reserved, must always be 1. Table 21. List of valid option combinations Operating conditions Clock Source VDD range PLL off x4 x8 off x4 x8 off x4 x8 off x4 x8 Internal RC 1% 2.4V - 3.3V External clock Internal RC 1% 3.3V - 5.5V External clock Typ fCPU 0.7MHz @3V 2.8MHz @3V 0-4MHz 4MHz 1MHz @5V 8MHz @5V 0-8MHz 8 MHz OSC 0 0 1 1 0 0 1 1 Option Bits PLLOFF PLLx4x8 1 1 0 0 1 1 0 0 1 1 0 1 1 1 0 1 Note: see Clock Management Block diagram in Figure 14 Bits 3:2 = LVD[1:0] Low voltage detection selection These option bits enable the LVD block with a selected threshold as shown in Table 22. Table 22. LVD Threshold Configuration Configuration Bit 1 = WDG SW Hardware or software watchdog This option bit selects the watchdog type. 0: Hardware (watchdog always enabled) 1: Software (watchdog to be enabled by software) Bit 0 = WDG HALT Watchdog Reset on Halt This option bit determines if a RESET is generated when entering HALT mode while the Watchdog is active. 0: No Reset generation when entering Halt mode 1: Reset generation when entering Halt mode LVD1 LVD0 LVD Off 1 1 Highest Voltage Threshold (4.1V) 1 0 Medium Voltage Threshold (3.5V) 0 1 Lowest Voltage Threshold (2.8V) 0 0 OPTION BYTE 0 OPTION BYTE 1 7 0 1 1 1 0 FMP FMP PLL PLL SEC1 SEC0 R W x4x8 OFF Reserved Default Value 7 1 1 1 0 0 1 1 WDG WDG OSC LVD1 LVD0 SW HALT 1 0 1 1 1 1 113/124 ST7LITE0xY0, ST7LITESxY0 15.2 DEVICE ORDERING INFORMATION AND TRANSFER OF CUSTOMER CODE Customer code is made up of the FASTROM contents and the list of the selected options (if any). The FASTROM contents are to be sent on diskette, or by electronic means, with the S19 hexadecimal file generated by the development tool. All unused bytes must be set to FFh. The selected options are communicated to STMicroelectronics using the correctly completed OPTION LIST appended. 114/124 Refer to application note AN1635 for information on the counter listing returned by ST after code has been transferred. The STMicroelectronics Sales Organization will be pleased to provide detailed information on contractual points. ST7LITE0xY0, ST7LITESxY0 Figure 89. Ordering information scheme Example: ST7 F LITES5 Y 0 M 6 TR Family ST7 Microcontroller Family Memory type F: Flash P: FASTROM Sub-family LITES2, LITES5, LITE02, LITE05 or LITE09 No. of pins Y = 16 Memory size 0 = 1K (LITESx versions) or 1.5K (LITE0x versions) Package B = DIP M = SO U = QFN Temperature range 6 = -40 C to 85 C Shipping Option TR = Tape & Reel packing Blank = Tube (DIP16 or SO16) or Tray (QFN20) For a list of available options (e.g. data EEPROM, package) and orderable part numbers or for further information on any aspect of this device, please contact the ST Sales Office nearest to you. 115/124 ST7LITE0xY0, ST7LITESxY0 ST7LITE0xY0 AND ST7LITESxY0 FASTROM MICROCONTROLLER OPTION LIST (Last update: November 2007) Customer Address .......................................................................... .......................................................................... .......................................................................... Contact .......................................................................... Phone No .......................................................................... Reference/FASTROM Code*: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . *FASTROM code name is assigned by STMicroelectronics. FASTROM code must be sent in .S19 format. .Hex extension cannot be processed. Memory size (check only one option): []1K [ ] 1.5 K Device type (check only one option): [ ] ST7PLITES2Y0 [ ] ST7PLITE02Y0 [ ] ST7PLITES5Y0 [ ] ST7PLITE05Y0 [ ] ST7PLITE09Y0 Warning: Addresses 1000h, 1001h, FFDEh and FFDFh are reserved areas for ST to program RCCR0 and RCCR1 (see section 7.1 on page 24). Conditioning (check only one option): PDIP16 [ ] Tube SO16 [ ] Tape & Reel QFN20 [ ] Tape & Reel [ ] Tube [ ] Tray Special Marking: [ ] No [ ] Yes Authorized characters are letters, digits, '.', '-', '/' and spaces only. Maximum character count: PDIP16 (15 char. max) : _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ SO16 (11 char. max) : _ _ _ _ _ _ _ _ _ _ _ Sector 0 size: [ ] 0.5K [ ] 1K [ ] 1.5K Readout Protection: FLASH write Protection: [ ] Disabled [ ] Disabled [ ] Enabled [ ] Enabled Clock Source Selection: [ ] Internal RC [ ] External Clock PLL [ ] Disabled [ ] PLLx4 LVD Reset [ ] Disabled [ ] Highest threshold [ ] Medium threshold [ ] Lowest threshold Watchdog Selection: Watchdog Reset on Halt: [ ] Software Activation [ ] Disabled [ ] PLLx8 [ ] Hardware Activation [ ] Enabled Comments : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Supply Operating Range in the application: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Notes .......................................................................... Date: .......................................................................... Signature: .......................................................................... Important note: Not all configurations are available. See Table 21 on page 113 for authorized option byte combinations and "Ordering information scheme" on page 115. Please download the latest version of this option list from: www.st.com 116/124 ST7LITE0xY0, ST7LITESxY0 15.3 DEVELOPMENT TOOLS Development tools for the ST7 microcontrollers include a complete range of hardware systems and software tools from STMicroelectronics and thirdparty tool suppliers. The range of tools includes solutions to help you evaluate microcontroller peripherals, develop and debug your application, and program your microcontrollers. 15.3.1 Starter kits ST offers complete, affordable starter kits. Starter kits are complete, affordable hardware/software tool packages that include features and samples to help you quickly start developing your application. 15.3.2 Development and debugging tools Application development for ST7 is supported by fully optimizing C Compilers and the ST7 Assembler-Linker toolchain, which are all seamlessly integrated in the ST7 integrated development environments in order to facilitate the debugging and fine-tuning of your application. The Cosmic C Compiler is available in a free version that outputs up to 16KBytes of code. The range of hardware tools includes full-featured ST7-EMU3 series emulators, cost effective ST7DVP3 series emulators and the low-cost RLink in-circuit debugger/programmer. These tools are supported by the ST7 Toolset from STMicroelectronics, which includes the STVD7 integrated development environment (IDE) with high-level lan- guage debugger, editor, project manager and integrated programming interface. 15.3.3 Programming tools During the development cycle, the ST7-DVP3 and ST7-EMU3 series emulators and the RLink provide in-circuit programming capability for programming the Flash microcontroller on your application board. ST also provides a low-cost dedicated in-circuit programmer, the ST7-STICK, as well as ST7 Socket Boards which provide all the sockets required for programming any of the devices in a specific ST7 sub-family on a platform that can be used with any tool with in-circuit programming capability for ST7. For production programming of ST7 devices, ST's third-party tool partners also provide a complete range of gang and automated programming solutions, which are ready to integrate into your production environment. 15.3.4 Order Codes for Development and Programming Tools Table 23 below lists the ordering codes for the ST7LITE0/ST7LITES development and programming tools. For additional ordering codes for spare parts and accessories, refer to the online product selector at www.st.com/mcu. 15.3.5 Order codes for ST7LITE0/ST7LITES development tools Table 23. Development tool order codes for the ST7LITE0/ST7LITES family Emulator Programming Tool In-circuit Debugger, RLink Series1) Starter Kit ST Socket ST7FLITE02, Starter Kit with In-circuit DVP Series EMU Series Boards and ST7FLITE05, without Demo Demo Board Programmer Board EPBs ST7FLITE09, ST7FLITES2, ST7MDT10ST7MDT10STX-RLINK 2) ST7FLITE-SK/RAIS2) ST7SB10-SU04) ST7FLITES5 STX-RLINK DVP33) EMU3 ST7-STICK4)5) Notes: 1. Available from ST or from Raisonance, www.raisonance.com 2. USB connection to PC 3. Includes connection kit for DIP16/SO16 only. See "How to order an EMU or DVP" in ST product and tool selection guide for connection kit ordering information 4. Add suffix /EU, /UK or /US for the power supply for your region 5. Parallel port connection to PC MCU 117/124 ST7LITE0xY0, ST7LITESxY0 15.4 ST7 APPLICATION NOTES Table 24. ST7 Application Notes IDENTIFICATION DESCRIPTION APPLICATION EXAMPLES AN1658 SERIAL NUMBERING IMPLEMENTATION AN1720 MANAGING THE READ-OUT PROTECTION IN FLASH MICROCONTROLLERS AN1755 A HIGH RESOLUTION/PRECISION THERMOMETER USING ST7 AND NE555 AN1756 CHOOSING A DALI IMPLEMENTATION STRATEGY WITH ST7DALI A HIGH PRECISION, LOW COST, SINGLE SUPPLY ADC FOR POSITIVE AND NEGATIVE INAN1812 PUT VOLTAGES EXAMPLE DRIVERS AN 969 SCI COMMUNICATION BETWEEN ST7 AND PC AN 970 SPI COMMUNICATION BETWEEN ST7 AND EEPROM AN 971 IC COMMUNICATION BETWEEN ST7 AND M24CXX EEPROM AN 972 ST7 SOFTWARE SPI MASTER COMMUNICATION AN 973 SCI SOFTWARE COMMUNICATION WITH A PC USING ST72251 16-BIT TIMER AN 974 REAL TIME CLOCK WITH ST7 TIMER OUTPUT COMPARE AN 976 DRIVING A BUZZER THROUGH ST7 TIMER PWM FUNCTION AN 979 DRIVING AN ANALOG KEYBOARD WITH THE ST7 ADC AN 980 ST7 KEYPAD DECODING TECHNIQUES, IMPLEMENTING WAKE-UP ON KEYSTROKE AN1017 USING THE ST7 UNIVERSAL SERIAL BUS MICROCONTROLLER AN1041 USING ST7 PWM SIGNAL TO GENERATE ANALOG OUTPUT (SINUSOID) AN1042 ST7 ROUTINE FOR IC SLAVE MODE MANAGEMENT AN1044 MULTIPLE INTERRUPT SOURCES MANAGEMENT FOR ST7 MCUS AN1045 ST7 S/W IMPLEMENTATION OF IC BUS MASTER AN1046 UART EMULATION SOFTWARE AN1047 MANAGING RECEPTION ERRORS WITH THE ST7 SCI PERIPHERALS AN1048 ST7 SOFTWARE LCD DRIVER AN1078 PWM DUTY CYCLE SWITCH IMPLEMENTING TRUE 0% & 100% DUTY CYCLE AN1082 DESCRIPTION OF THE ST72141 MOTOR CONTROL PERIPHERALS REGISTERS AN1083 ST72141 BLDC MOTOR CONTROL SOFTWARE AND FLOWCHART EXAMPLE AN1105 ST7 PCAN PERIPHERAL DRIVER AN1129 PWM MANAGEMENT FOR BLDC MOTOR DRIVES USING THE ST72141 AN INTRODUCTION TO SENSORLESS BRUSHLESS DC MOTOR DRIVE APPLICATIONS AN1130 WITH THE ST72141 AN1148 USING THE ST7263 FOR DESIGNING A USB MOUSE AN1149 HANDLING SUSPEND MODE ON A USB MOUSE AN1180 USING THE ST7263 KIT TO IMPLEMENT A USB GAME PAD AN1276 BLDC MOTOR START ROUTINE FOR THE ST72141 MICROCONTROLLER AN1321 USING THE ST72141 MOTOR CONTROL MCU IN SENSOR MODE AN1325 USING THE ST7 USB LOW-SPEED FIRMWARE V4.X AN1445 EMULATED 16-BIT SLAVE SPI AN1475 DEVELOPING AN ST7265X MASS STORAGE APPLICATION AN1504 STARTING A PWM SIGNAL DIRECTLY AT HIGH LEVEL USING THE ST7 16-BIT TIMER AN1602 16-BIT TIMING OPERATIONS USING ST7262 OR ST7263B ST7 USB MCUS AN1633 DEVICE FIRMWARE UPGRADE (DFU) IMPLEMENTATION IN ST7 NON-USB APPLICATIONS AN1712 GENERATING A HIGH RESOLUTION SINEWAVE USING ST7 PWMART AN1713 SMBUS SLAVE DRIVER FOR ST7 I2C PERIPHERALS AN1753 SOFTWARE UART USING 12-BIT ART 118/124 ST7LITE0xY0, ST7LITESxY0 Table 24. ST7 Application Notes IDENTIFICATION DESCRIPTION AN1947 ST7MC PMAC SINE WAVE MOTOR CONTROL SOFTWARE LIBRARY GENERAL PURPOSE AN1476 LOW COST POWER SUPPLY FOR HOME APPLIANCES AN1526 ST7FLITE0 QUICK REFERENCE NOTE AN1709 EMC DESIGN FOR ST MICROCONTROLLERS AN1752 ST72324 QUICK REFERENCE NOTE PRODUCT EVALUATION AN 910 PERFORMANCE BENCHMARKING AN 990 ST7 BENEFITS VS INDUSTRY STANDARD AN1077 OVERVIEW OF ENHANCED CAN CONTROLLERS FOR ST7 AND ST9 MCUS AN1086 U435 CAN-DO SOLUTIONS FOR CAR MULTIPLEXING AN1103 IMPROVED B-EMF DETECTION FOR LOW SPEED, LOW VOLTAGE WITH ST72141 AN1150 BENCHMARK ST72 VS PC16 AN1151 PERFORMANCE COMPARISON BETWEEN ST72254 & PC16F876 AN1278 LIN (LOCAL INTERCONNECT NETWORK) SOLUTIONS PRODUCT MIGRATION AN1131 MIGRATING APPLICATIONS FROM ST72511/311/214/124 TO ST72521/321/324 AN1322 MIGRATING AN APPLICATION FROM ST7263 REV.B TO ST7263B AN1365 GUIDELINES FOR MIGRATING ST72C254 APPLICATIONS TO ST72F264 AN1604 HOW TO USE ST7MDT1-TRAIN WITH ST72F264 AN2200 GUIDELINES FOR MIGRATING ST7LITE1X APPLICATIONS TO ST7FLITE1XB PRODUCT OPTIMIZATION AN 982 USING ST7 WITH CERAMIC RESONATOR AN1014 HOW TO MINIMIZE THE ST7 POWER CONSUMPTION AN1015 SOFTWARE TECHNIQUES FOR IMPROVING MICROCONTROLLER EMC PERFORMANCE AN1040 MONITORING THE VBUS SIGNAL FOR USB SELF-POWERED DEVICES AN1070 ST7 CHECKSUM SELF-CHECKING CAPABILITY AN1181 ELECTROSTATIC DISCHARGE SENSITIVE MEASUREMENT AN1324 CALIBRATING THE RC OSCILLATOR OF THE ST7FLITE0 MCU USING THE MAINS AN1502 EMULATED DATA EEPROM WITH ST7 HDFLASH MEMORY AN1529 EXTENDING THE CURRENT & VOLTAGE CAPABILITY ON THE ST7265 VDDF SUPPLY ACCURATE TIMEBASE FOR LOW-COST ST7 APPLICATIONS WITH INTERNAL RC OSCILLAAN1530 TOR AN1605 USING AN ACTIVE RC TO WAKEUP THE ST7LITE0 FROM POWER SAVING MODE AN1636 UNDERSTANDING AND MINIMIZING ADC CONVERSION ERRORS AN1828 PIR (PASSIVE INFRARED) DETECTOR USING THE ST7FLITE05/09/SUPERLITE AN1946 SENSORLESS BLDC MOTOR CONTROL AND BEMF SAMPLING METHODS WITH ST7MC AN1953 PFC FOR ST7MC STARTER KIT AN1971 ST7LITE0 MICROCONTROLLED BALLAST PROGRAMMING AND TOOLS AN 978 ST7 VISUAL DEVELOP SOFTWARE KEY DEBUGGING FEATURES AN 983 KEY FEATURES OF THE COSMIC ST7 C-COMPILER PACKAGE AN 985 EXECUTING CODE IN ST7 RAM AN 986 USING THE INDIRECT ADDRESSING MODE WITH ST7 AN 987 ST7 SERIAL TEST CONTROLLER PROGRAMMING AN 988 STARTING WITH ST7 ASSEMBLY TOOL CHAIN AN1039 ST7 MATH UTILITY ROUTINES 119/124 ST7LITE0xY0, ST7LITESxY0 Table 24. ST7 Application Notes IDENTIFICATION AN1071 AN1106 DESCRIPTION HALF DUPLEX USB-TO-SERIAL BRIDGE USING THE ST72611 USB MICROCONTROLLER TRANSLATING ASSEMBLY CODE FROM HC05 TO ST7 PROGRAMMING ST7 FLASH MICROCONTROLLERS IN REMOTE ISP MODE (IN-SITU PROAN1179 GRAMMING) AN1446 USING THE ST72521 EMULATOR TO DEBUG AN ST72324 TARGET APPLICATION AN1477 EMULATED DATA EEPROM WITH XFLASH MEMORY AN1527 DEVELOPING A USB SMARTCARD READER WITH ST7SCR AN1575 ON-BOARD PROGRAMMING METHODS FOR XFLASH AND HDFLASH ST7 MCUS AN1576 IN-APPLICATION PROGRAMMING (IAP) DRIVERS FOR ST7 HDFLASH OR XFLASH MCUS AN1577 DEVICE FIRMWARE UPGRADE (DFU) IMPLEMENTATION FOR ST7 USB APPLICATIONS AN1601 SOFTWARE IMPLEMENTATION FOR ST7DALI-EVAL AN1603 USING THE ST7 USB DEVICE FIRMWARE UPGRADE DEVELOPMENT KIT (DFU-DK) AN1635 ST7 CUSTOMER ROM CODE RELEASE INFORMATION AN1754 DATA LOGGING PROGRAM FOR TESTING ST7 APPLICATIONS VIA ICC AN1796 FIELD UPDATES FOR FLASH BASED ST7 APPLICATIONS USING A PC COMM PORT AN1900 HARDWARE IMPLEMENTATION FOR ST7DALI-EVAL AN1904 ST7MC THREE-PHASE AC INDUCTION MOTOR CONTROL SOFTWARE LIBRARY AN1905 ST7MC THREE-PHASE BLDC MOTOR CONTROL SOFTWARE LIBRARY SYSTEM OPTIMIZATION AN1711 SOFTWARE TECHNIQUES FOR COMPENSATING ST7 ADC ERRORS AN1827 IMPLEMENTATION OF SIGMA-DELTA ADC WITH ST7FLITE05/09 AN2009 PWM MANAGEMENT FOR 3-PHASE BLDC MOTOR DRIVES USING THE ST7FMC AN2030 BACK EMF DETECTION DURING PWM ON TIME BY ST7MC 120/124 ST7LITE0xY0, ST7LITESxY0 16 KNOWN LIMITATIONS 16.1 Execution of BTJX Instruction Description Executing a BTJx instruction jumps to a random address in the following conditions: the jump goes to a lower address (jump backward) and the test is performed on a data located at the address 00FFh. 16.2 In-Circuit Programming of devices previously programmed with Hardware Watchdog option Description In-Circuit Programming of devices configured with Hardware Watchdog (WDGSW bit in option byte 1 programmed to 0) requires certain precautions (see below). In-Circuit Programming uses ICC mode. In this mode, the Hardware Watchdog is not automatically deactivated as one might expect. As a consequence, internal resets are generated every 2 ms by the watchdog, thus preventing programming. The device factory configuration is Software Watchdog so this issue is not seen with devices that are programmed for the first time. For the same reason, devices programmed by the user with the Software Watchdog option are not impacted. The only devices impacted are those that have previously been programmed with the Hardware Watchdog option. Workaround Devices configured with Hardware Watchdog must be programmed using a specific programming mode that ignores the option byte settings. In this mode, an external clock, normally provided by the programming tool, has to be used. In ST tools, this mode is called "ICP OPTIONS DISABLED". Sockets on ST programming tools (such as ST7MDT10-EPB) are controlled using "ICP OPTIONS DISABLED" mode. Devices can therefore be reprogrammed by plugging them in the ST Programming Board socket, whatever the watchdog configuration. When using third-party tools, please refer the manufacturer's documentation to check how to access specific programming modes. If a tool does not have a mode that ignores the option byte set- tings, devices programmed with the Hardware watchdog option cannot be reprogrammed using this tool. 16.3 In-Circuit Debugging with Hardware Watchdog In Circuit Debugging is impacted in the same way as In Circuit Programming by the activation of the hardware watchdog in ICC mode. Please refer to Section 16.2. 16.4 Recommendations when LVD is enabled When the LVD is enabled, it is recommended not to connect a pull-up resistor or capacitor. A 10nF pull-down capacitor is required to filter noise on the reset line. 16.5 Clearing Active Interrupt Routine Interrupts Outside When an active interrupt request occurs at the same time as the related flag or interrupt mask is being cleared, the CC register may be corrupted. Concurrent interrupt context The symptom does not occur when the interrupts are handled normally, i.e. when: - The interrupt request is cleared (flag reset or interrupt mask) within its own interrupt routine - The interrupt request is cleared (flag reset or interrupt mask) within any interrupt routine - The interrupt request is cleared (flag reset or interrupt mask) in any part of the code while this interrupt is disabled If these conditions are not met, the symptom can be avoided by implementing the following sequence: Perform SIM and RIM operation before and after resetting an active interrupt request Ex: SIM reset flag or interrupt mask RIM 121/124 ST7LITE0xY0, ST7LITESxY0 17 REVISION HISTORY Table 25. Revision History Date 27-Oct-04 21-July-06 Revision Description of changes 3 Revision number incremented from 2.5 to 3.0 due to Internal Document Management System change Changed all references of ADCDAT to ADCDR Added EMU3 Emulator Programming Capability in Table 23 Clarification of read-out protection Altered note 1 for section 13.2.3 on page 82 removing references to RESET Alteration of fCPU for SLOW and SLOW-WAIT modes in Section 13.4.1 table and Figure 59 on page 90 Removed sentence relating to an effective change only after overflow for CK[1:0], page 56 Added illegal opcode detection to page 1, section 8.4 on page 32, section 12 on page 75 Clarification of Flash read-out protection, section 4.5.1 on page 15 fPLL value of 1MHz quoted as Typical instead of a Minimum in section 14.3.5.2 on page 92 Updated FSCK in section 13.10.1 on page 102 to FCPU/4 and FCPU/2 section 8.4.4 on page 36: Changed wording in AVDIE and AVDF bit descriptions to "...when the AVDF bit is set" Socket Board development kit details added in Table 24 on page 115 PWM Signal diagram corrected, Figure 36 on page 55 Corrected count of reserved bits between 003Bh to 007Fh, Table 2 on page 11 Inserted note that RCCR0 and RCCR1 are erased if read-only flag is reset, section 7.1 on page 24 4 Added QFN20 package Modified section 2 on page 6 Changed Read operation paragraph in section 5.3 on page 17 Modified note below Figure 9 on page 18 and modified section 5.5 on page 19 Modified note to section 7.1 on page 24 Added note on illegal opcode reset to section 7.4.1 on page 27 Added note 2 to EICR description on page 31 Modified External Interrupt Function in section 10.2.1 on page 42 Changed text on input capture before section 11.1.4 on page 51 Modified text in section 11.1.5 on page 51 Added important note in section 11.3.3.3 on page 62 Changed note 1 in section 13.2 on page 82 Modified values in section 13.2.2 on page 82 Modified note 2 in section 13.3.4.1 on page 85 and section 13.3.4.2 on page 86 Added note on clock stability and frequency accuracy to section 13.3.4.1 on page 85, section 13.3.4.2 on page 86, section 7.1 on page 24 and to OSC option bit in Section 15.1 on page 113 Changed IS value and note 2 in section 13.8.1 on page 95 Added note in Figure 62 on page 95 Changed Figure 76 on page 101 and removed EMC protection circuitry in Figure 77 on page 101 (device works correctly without these components) Changed section 13.10.1 on page 102 (tsu(SS), tv(MO) and th(MO)) Modified Figure 79 (CPHA=1) and Figure 80 on page 103 (tv(MO) , th(MO)) Added ECOPACK information to section 14 on page 109 Modified Figure 88 on page 110 (A1 and A swapped in the diagram) Modified Table 21 on page 112 Modified section 15.2 on page 114 Updated option list on page 116 Changed section 15.3 on page 117 Removed erratasheet section Added Section 16.4 and section 16.5 on page 121 Revision History continued overleaf ... 122/124 ST7LITE0xY0, ST7LITESxY0 09-Oct-06 19-Nov-07 5 Removed QFN20 pinout and mechanical data. Modified text in External Interrupt Function section in section 10.2.1 on page 42 Modified Table 24 on page 116 (and QFN20 rows in grey). Added "External Clock Source" on page 91 and Figure 61 on page 91 Modified description of CNTR[11:0] bits in section 11.2.6 on page 56 Updated option list on page 116 Changed section 15.3 on page 117 6 Title of the document modified Modified LOCKED bit description in section 8.4.4 on page 36 In Table 1 on page 7 and section 13.2.2 on page 82, note "negative injection not allowed on PB0 and PB1 pins" replaced by "negative injection not allowed on PB1 pin" Added QFN20 package pinout (with new QFN20 mechanical data): Figure 2 on page 6 and Figure 86 on page 109 Modified section 8.4.4 on page 36 Removed one note in section 11.1.3.1 on page 49 Modified section 13.7 on page 93 Modified "PACKAGE MECHANICAL DATA" on page 109 (values in inches rounded to 4 decimal digits) Modified section 15.2 on page 114 ("Ordering information scheme" on page 115 added and table removed) and option list on page 116 Removed "soldering information" section Modified section 15.3.5 on page 117 123/124 ST7LITE0xY0, ST7LITESxY0 Notes: Please Read Carefully: Information in this document is provided solely in connection with ST products. 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