INCH-POUND MIL-M-38510/339E 22 March 2011 SUPERSEDING MIL-M-38510/339D 18 February 2004 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DATA SELECTORS/MULTIPLEXERS WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON Reactivated after 18 February 2004 and may be used for either new or existing design acquisition. This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, advanced Schottky TTL, data selectors and multiplexers (three-state) microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.3). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type 01 02 03 04 05 06 07 08 09 10 Circuit 8 - input, data selector/multiplexer Dual, 4 - input, data selector/multiplexer Quad, 2 - input, data selector/multiplexer Quad, 2 - input, data selector/multiplexer with inverted output 8 - input, data selector/multiplexer with 3 - state outputs Quad, 2 - input, data selector/multiplexer with 3 - state outputs Quad, 2 - input, data selector/multiplexer with 3 - state inverted output Dual, 4 - input, data selector/multiplexer with 3 - state outputs Dual, 4 - input, data selector/multiplexer with inverted outputs Dual, 4 - input, data selector/multiplexer with 3 - state inverted outputs 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter E F 2 Descriptive designator GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 CQCC1-N20 Terminals 16 16 20 Package style Dual-in-line Flat pack Square leadless chip carrier Comments, suggestions, or questions on this document should be addressed to: DLA Land and Maritime, ATTN: DLA Land and Maritime- VAS, P.O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at https://assist.daps.dla.mil. AMSC N/A FSC 5962 MIL-M-38510/339E 1.3 Absolute maximum ratings. Supply voltage range .............................................................................. Input voltage range ................................................................................. Storage temperature range .................................................................... Maximum power dissipation, per device (PD) 1/ Device type 01 .................................................................................. Device type 02 .................................................................................. Device type 03 .................................................................................. Device type 04 .................................................................................. Device type 05 .................................................................................. Device type 06 .................................................................................. Device type 07 .................................................................................. Device type 08 .................................................................................. Device type 09 .................................................................................. Device type 10 .................................................................................. Lead temperature (soldering, 10 seconds) ............................................. Thermal resistance, junction to case (JC): Cases E, F, and 2 ................................................................................. Junction temperature (TJ) 2/ ................................................................... -0.5 V dc to +7.0 V dc -1.2 V dc at -18 mA to +7.0 V dc -65 to +150C 116 mW 110 mW 127 mW 83 mW 132 mW 127 mW 127 mW 121 mW 110 mW 127 mW +300C (See MIL-STD-1835) 175C 1.4 Recommended operating conditions. Supply voltage (VCC) ............................................................................... Minimum high level input voltage (VIH) ................................................... Maximum low level input voltage (VIL) .................................................... Case operating temperature range (TC) ................................................. 4.5 V minimum to 5.5 V maximum 2.0 V dc 0.8 V dc -55 to +125C 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at https://assist.daps.dla.mil/quicksearch/ or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _______ 1/ Must withstand the added PD due to short-circuit test (e.g., IOS). 2/ Maximum junction temperature shall not be exceeded except in accordance with allowable short duration burn-in screening condition in accordance with MIL-PRF-38535. 2 MIL-M-38510/339E 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.4). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Terminal connections and pin assignments. The terminal connections and pin assignments shall be as specified on figure 1. 3.3.2 Logic diagrams. The logic diagrams shall be as specified on figure 2. 3.3.3 Truth tables. The truth tables shall be as specified on figure 3. 3.3.4 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3.5 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 11 (see MIL-PRF-38535, appendix A). 3 MIL-M-38510/339E 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be specified as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional and positive when flowing into the referenced terminal. 4 MIL-M-38510/339E TABLE I. Electrical performance characteristics. Test High level output voltage Symbol VOH Low level output voltage VOL Input clamp voltage VI C Conditions Device -55C TC +125C type Limits Min Unit Max VCC = 4.5 V, VIL = 0.8 V, IOH = -1.0 mA 01, 02, 03, 04, 09 2.5 V VIH = 2.0 V IOH = -3.0 mA 05, 06, 07, 08, 10 2.4 V VCC = 4.5 V, IOL = 20 mA, All 0.5 V All -1.2 V VIH = 2.0 V, VIL = 0.8 V VCC = 4.5 V, IIN = -18 mA, TC = +25C IIH1 VCC = 5.5 V, VIH = 2.7 V All 20 A IIH2 VCC = 5.5 V, VIH = 7.0 V All 100 A Low level input current IIL VCC = 5.5 V, VIL = 0.5 V All Short circuit output current IOS VCC = 5.5 V, VOS = 0 V All -60 IOD VCC = 4.5 V, 01, 04, 09 60 mA 02, 03, 05, 06, 07, 08, 10 35 mA High level input current -.03 -.60 -150 mA mA 1/ Output drive Supply current High level supply current ICC ICCH VCC = 5.5 V, VOS = 0 V VCC = 5.5 V 01 21 mA 02 20 mA 03 23 mA 04 15 mA 05 22 mA 06 15 mA 07 Low level supply current ICCL VCC = 5.5 V 1/ Not more than one output should be shorted at a time. 5 9.5 mA 08 16 mA 09 14 mA 10 14 mA 06 22 mA 07 23 mA 08 23 mA 09 20 mA 10 20 mA MIL-M-38510/339E TABLE I. Electrical performance characteristics - Continued. Test Off state supply current Symbol ICCZ Conditions Device -55C TC +125C type VCC = 5.5 V IOZH VCC = 5.5 V, VZH = 2.7 V cuurent Propagation delay time, Unit Max 24 mA 06 23 mA 07 17 mA 08 23 mA 10 23 mA 05, 06, 07, 50 A -50 A 08, 10 IOZL VCC = 5.5 V, VZL = 0.5 V tPLH1 VCC = 5.5 V low to high level, data to Z 01 (see figure 4) output Propagation delay time, Min 05 Outputs disabled Off state output leakage Limits tPLH2 low to high level, data to Z output 2.5 8.5 ns 02 2.5 9.0 ns 03 2.5 7.5 ns 05 2.5 9.0 ns 06 2.0 7.0 ns 08 2.5 9.0 ns 01 2.5 7.5 ns 04 2.5 8.5 ns 05 2.5 8.5 ns 07 2.0 7.5 ns 09 2.0 9.0 ns 10 1.5 9.0 ns 01 4.5 13.5 ns low to high level, select to Z 02 4.5 14.0 ns output 03 4.0 12.0 ns 05 3.5 14.0 ns 06 3.5 11.5 ns 08 3.5 15.0 ns Propagation delay time, Propagation delay time, tPLH3 01 3.5 11.5 ns low to high level, select to 04 3.0 10.5 ns Z output 05 3.5 11.5 ns 07 3.0 9.5 ns 09 3.5 14.5 ns 10 4.0 16.0 ns 01 4.0 12.0 ns Propagation delay time, tPLH4 tPLH5 low to high level, enable 02 4.5 11.5 ns to Z output 03 5.0 13.0 ns 01 3.0 7.5 ns Propagation delay time, tPLH6 low to high level, enable to 04 2.5 8.0 ns Z output 09 3.5 17.0 ns 6 MIL-M-38510/339E TABLE I. Electrical performance characteristics - Continued. Test Propagation delay time, Symbol tPHL1 Conditions Device -55C TC +125C type Limits Min Unit Max VCC = 5.5 V 01 3.5 9.0 ns (see figure 4) 02 2.5 8.0 ns 03 1.5 7.5 ns 05 3.5 9.0 ns 06 1.5 7.0 ns 08 2.5 8.0 ns 01 1.5 6.0 ns high to low level, data to Z 04 1.5 5.0 ns output 05 1.0 6.0 ns 07 1.0 6.0 ns 09 1.5 7.5 ns 10 1.5 7.5 ns 01 4.0 9.5 ns 02 3.5 11.0 ns high to low level, data to Z output Propagation delay time, Propagation delay time, tPHL2 tPHL3 high to low level, select to Z output 03 3.0 9.0 ns 05 3.0 10.5 ns 06 2.5 9.0 ns 08 2.5 11.0 ns 01 3.0 8.0 ns high to low level, select to 04 2.5 8.0 ns Z output 05 3.2 8.0 ns 07 2.5 9.0 ns 09 3.5 15.0 ns 10 4.0 14.0 ns Propagation delay time, Propagation delay time, tPHL4 01 3.0 8.0 ns high to low level, enable 02 2.5 9.0 ns to Z output 03 2.5 7.5 ns Propagation delay time, tPHL5 01 2.5 6.5 ns high to low level, enable to 04 2.0 8.5 ns Z output 09 3.0 13.0 ns Propagation delay time, tPHL6 05 1.0 5.5 ns low level to off state, output 06 2.0 8.5 ns enable to Z output 08 2.0 8.0 ns 05 1.0 5.0 ns low level to off state, output 07 2.0 8.5 ns enable to Z output 10 2.0 8.5 ns Propagation delay time, tPLZ5 tPLZ6 7 MIL-M-38510/339E TABLE I. Electrical performance characteristics - Continued. Test Symbol Propagation delay time, tPHZ5 high level to off state, output Conditions Device -55C TC +125C type Limits Min Unit Max VCC = 5.5 V 05 2.0 5.5 ns (see figure 4) 06 2.0 7.0 ns enable to Z output 08 2.0 6.5 ns 05 2.0 6.0 ns high level to off state, output 07 1.5 7.0 ns enable to Z output 10 2.0 6.5 ns Propagation delay time, Propagation delay time, tPHZ6 05 2.5 9.0 ns off state to low level output 06 2.5 9.0 ns enable to Z output 08 2.5 10.0 ns Propagation delay time, tPZL5 05 2.5 7.5 ns off state to low level output 07 2.5 9.0 ns enable to Z output 10 3.0 15.5 ns Propagation delay time, tPZL6 05 3.0 8.5 ns off state to high level output 06 2.0 8.0 ns enable to Z output 08 2.5 10.0 ns 05 2.0 7.0 ns Propagation delay time, tPZH5 tPZH6 off state to high level output 07 2.0 8.0 ns enable to Z output 10 3.0 11.0 ns TABLE II. Electrical test requirements. Subgroups (see table III) Class S Class B devices devices 1 1 MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B electrical test parameters when using the method 5005 QCI option Group C end-point electrical parameters Group D end-point electrical parameters *PDA applies to subgroup 1. 8 1*, 2, 3, 7, 9, 10, 11 1, 2, 3, 7, 8, 9, 10, 11 1, 2, 3, 7, 8, 9, 10, 11 1, 2, 3, 7, 8, 9, 10, 11 1, 2, 3 1*, 2, 3, 7, 9 1, 2, 3, 7, 8, 9, 10, 11 N/A 1, 2, 3 1, 2, 3 MIL-M-38510/339E Terminal assignments Device type 01 Terminal Cases number E and F Device type 02 Device type 03 Device type 04 Device type 05 Case 2 Cases E and F Case 2 Cases E and F Case 2 Cases E and F Case 2 Cases E and F Case 2 Ea N/C S N/C S N/C I3 N/C 1 I3 N/C 2 I2 I3 S1 Ea I0a S I0a S I2 I3 3 I1 I2 I3a S1 I1a I0a I1a I0a I1 I2 4 I0 I1 I2a I3a Za I1a Za I1a I0 I1 5 Z I0 I1a I2a I0b Za I0b Za Z I0 6 Z N/C I0a N/C I1b N/C I1b N/C Z N/C 7 E Z Za I1a Zb I0b Zb I0b QE Z 8 GND Z GND I0a GND I1b GND I1b GND Z 9 S2 E Zb Za Zd Zb Zd Zb S2 QE 10 S1 GND I0b GND I1d GND I1d GND S1 GND 11 S0 N/C I1b N/C I0d N/C I0d N/C S0 N/C 12 I7 S2 I2b Zb Zc Zd Zc Zd I7 S2 13 I6 S1 I3b I0b I1c I1d I1c I1d I6 S1 14 I5 S0 S0 I1b I0c I0d I0c I0d I5 S0 15 I4 I7 Eb I2b E Zc E Zc I4 I7 16 VCC N/C VCC N/C VCC N/C VCC N/C VCC N/C 17 I6 I3b I1c I1c I6 18 I5 S0 I0c I0c I5 19 I4 Eb E E I4 20 VCC VCC VCC VCC VCC FIGURE 1. Terminal connections. 9 MIL-M-38510/339E Terminal assignments Device type 06 Terminal Cases number E and F Device type 07 Device type 08 Device type 09 Device type 10 Case 2 Cases E and F Case 2 Cases E and F Case 2 Cases E and F Case 2 Cases E and F Case 2 1 S N/C S N/C OE a N/C Ea N/C OE a N/C 2 I0a S I0a S S1 OE a S1 Ea S1 OE a 3 I1a I0a I1a I0a I3a S1 I3a S1 I3a S1 4 Za I1a Za I1a I2a I3a I2a I3a I2a I3a 5 I0b Za I0b Za I1a I2a I1a I2a I1a I2a 6 I1b N/C I1b N/C I0a N/C I0a N/C I0a N/C 7 Zb I0b Zb I0b Za I1a Za I1a Za I1a 8 GND I1b GND I1b GND I0a GND I0a GND I0a 9 Zd Zb Zd Zb Zb Za Zb Za Zb Za 10 I1d GND I1d GND I0b GND I0b GND I0b GND 11 I0d N/C I0d N/C I1b N/C I1b N/C I1b N/C 12 Zc Zd Zc Zd I2b Zb I2b Zb I2b Zb 13 I1c I1d I1c I1d I3b I0b I3b I0b I3b I0b 14 I0c I0d I0c I0d S0 I1b S0 I1b S0 I1b 15 OE Zc OE Zc OE b I2b Eb I2b OE b I2b 16 VCC N/C VCC N/C VCC N/C VCC N/C VCC N/C 17 I1c I1c I3b I3b I3b 18 I0c I0c S0 S0 S0 19 OE OE OE b Eb OE b 20 VCC VCC VCC VCC VCC FIGURE 1. Terminal connections - Continued. 10 MIL-M-38510/339E FIGURE 2. Logic diagrams. 11 MIL-M-38510/339E FIGURE 2. Logic diagrams - Continued. 12 MIL-M-38510/339E FIGURE 2. Logic diagrams - Continued. 13 MIL-M-38510/339E FIGURE 2. Logic diagrams - Continued. 14 MIL-M-38510/339E FIGURE 2. Logic diagrams - Continued. 15 MIL-M-38510/339E Device type 01 INPUTS OUTPUTS E S2 S1 S0 Z Z H X X X H L L L L L I 0 I0 L L L H I 1 I1 L L H L I 2 I2 L L H H I 3 I3 L H L L I 4 I4 L H L H I 5 I5 L H H L I 6 I6 L H H H I 7 I7 Device type 02 SELECT INPUTS INPUTS (a or b) OUTPUT S0 S1 E I0 I1 I2 I3 Z X X H X X X X L L L L L X X X L L L L H X X X H H L L X L X X L H L L X H X X H L H L X X L X L L H L X X H X H H H L X X X L L H H L X X X H H H = HIGH voltage level L = LOW voltage level X = Immaterial FIGURE 3. Truth tables. 16 MIL-M-38510/339E Device type 03 INPUTS Device type 04 OUTPUT INPUTS OUTPUT E S I0 I1 Z E S I0 I1 Z H X X X L H X X X H L H X L L L L L X H L H X H H L L H X L L L L X L L H X L H L L H X H L H X H L Device type 05 INPUTS Device type 06 OUTPUTS OUTPUT SELECT DATE OUTPUTS INPUTS OE S2 S1 S0 Z Z ENABLE INPUT H X X X Z Z OE S I0 I1 Z L L L L I 0 I0 H X X X (Z) L L L H I 1 I1 L H X L L L L H L I 2 I2 L H X H H L L H H I 3 I3 L L L X L L H L L I 4 I4 L L H X H L H L H I 5 I5 L H H L I 6 I6 L H H H I 7 I7 H = HIGH voltage level L = LOW voltage level X = Immaterial (Z) = High impedance FIGURE 3. Truth tables - Continued. 17 MIL-M-38510/339E Device type 07 OUTPUT SELECT DATE ENABLE INPUT INPUTS OUTPUTS OE S I0 I1 Z H X X X Z L H X L H L H X H L L L L X H L L H X L Device type 08 SELECT INPUTS DATA INPUTS I1 I2 OUTPUT ENABLE OUTPUT I3 OE Z S0 S1 I0 X X X X X X H (Z) L L L X X X L L L L H X X X L H H L X L X X L L H L X H X X L H L H X X L X L L L H X X H X L H H H X X X L L L H H X X X H L H H = HIGH voltage level L = LOW voltage level X = Immaterial (Z) = High impedance FIGURE 3. Truth tables - Continued. 18 MIL-M-38510/339E Device type 09 SELECT INPUTS INPUTS (a or b) OUTPUT S0 S1 E I0 I1 I2 I3 Z X X H X X X X H L L L L X X X H L L L H X X X L H L L X L X X H H L L X H X X L L H L X X L X H L H L X X H X L H H L X X X L H H H L X X X H L Device type 10 SELECT INPUTS DATA INPUTS OUTPUT ENABLE OUTPUT S0 S1 I0 I1 I2 I3 OE Z X X X X X X H (Z) L L L X X X L H L L H X X X L L H L X L X X L H H L X H X X L L L H X X L X L H L H X X H X L L H H X X X L L H H H X X X H L L Address inputs S0 and S1 are common to both sections H = HIGH voltage level L = LOW voltage level X = Immaterial (Z) = High impedance FIGURE 3. Truth tables - Continued. 19 MIL-M-38510/339E Test Circuit Test Type tPLH tPHL tPHZ tPZH tPLZ tPZL S1 Open Open Open Open Closed Closed NOTES: 1. VIN input pulse has the following characteristics: t1 = t0 2.5 ns, PRR 1 MHz, ZOUT 50. 2. Inputs not under test are at ground. 3. CL = 50 pF 10% including scope probe, wiring and stray capacitance without package in test fixture. 4. R1 = R2 = 499 5%. 5. Voltage measurements are to be made with respect to network ground terminal. FIGURE 4. Switching time test circuit and waveform for all device types. 20 MIL-M-38510/339E FIGURE 4. Switching time waveform - Continued. 21 MIL-M-38510/339E FIGURE 4. Switching time waveform - Continued. 22 TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 I0 Z Z 20 mA E 0.8 V I7 I6 I5 I4 " " " " " " " 3007 1 VOH " " " " " " " " 3006 2 3 4 5 6 7 8 9 10 " " " " " " " " " 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Tc = 25C 23 VI C IIH1 IIH2 3010 " " " " 25 26 27 28 29 30 31 32 33 34 35 36 " " " " " " " " " " " " 37 38 39 40 41 42 43 44 45 46 47 48 " " " " " " " 49 50 51 52 53 54 55 See footnotes at end of table. 2.0 V 2.0 V 2.0 V 2.0 V 0.8 V 20 mA -1.0 mA 0.8 V " " " " " " " " 0.8 V 0.8 V 0.8 V 2.0 V -1.0 mA GND S2 S1 S0 GND 0.8 V 0.8 V 0.8 V 4.5 V " " " " " " " " 2.0 V " " " " " " " " " " " " 2.0 V " " " 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V " " " " " " " " " 0.8 V " " " " " " " " 0.8 V " " " 2.0 V " " " 0.8 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V -18 mA " " " " " " " " " " " " " " -18 mA 4.5 V " " " 2.7 V " " " " " " " " " " " " 2.7 V 4.5 V " " " " " " " 7.0 V " " " " " " " " " " " " 7.0 V 4.5 V " " " " " " " " " " -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V 2.0 V 2.0 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA 4.5 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 2.7 V 0.0 V " " " 4.5 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 0.0 V 0.0 V 4.5 V 4.5 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 0.0 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 7.0 V 0.0 V 4.5 V 0.0 V 4.5 V 7.0 V 7.0 V 7.0 V 7.0 V VCC " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " Limits Min Z " " " " " " " Z Z " " " " " " " " Z I3 I2 I1 I0 E S2 S1 S0 I7 I6 I5 I4 I3 I2 I1 I0 E S2 S1 S0 I7 I6 I5 I4 I3 I2 I1 I0 E S2 S1 S0 I7 I6 I5 I4 Unit Max 0.5 V " " " " " " " " " " " " " " " " " 2.5 " " " " " " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " " " A " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E VOL Measured terminal TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL IOS IOD 24 8 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I2 I1 I0 Z Z E 0.0 V " " " 0.5 V I7 I6 I5 I4 Test no. I3 3009 " " " " 56 57 58 59 60 0.5 V " " " " " " " 3011 3011 61 62 63 64 65 66 67 68 69 GND S2 S1 S0 GND " " " " 0.0 V " " " 4.5 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.5 V 0.0 V 0.0 V " " " 0.0 V 4.5 V " " " " " " " " " 2.5 V 5.5 V 0.0 V " " 0.5 V 70 71 0.5 V 0.5 V 4.5 V 0.0 V 2.5 V 5.5 V ICC 3005 72 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V " Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. Func3014 73 A A A A L H A GND tional " 74 " " " " " " " " test " 75 " " " " " " " " 3/ " 76 " " " " " " " " " 77 " " " " " " " " " 78 " " " " " " " " " 79 " " " " " " " " " 80 " " " " " " " " " 81 B B B " H L B " " 82 " B A B " " " " " 83 " A B " " " " " " 84 A B " " " " " " " 85 B " " " " " " " " 86 " " " " " " " " " 87 " " " " " " " " " 88 " " " " " " " " " 89 A A A " L H " " " 90 " A B A " " " " " 91 " B A " " " " " " 92 B A " " " " " " " 93 A " " " " " " " " 94 " " " " " " " " " 95 " " " " " " " " " 96 " " " " " " " " Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. See footnotes at end of device types 01. 4.5 V " " " 0.0 V 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V 0.5 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V VCC 5.5 V " " " " 0.5 V 0.5 V 0.5 V 0.5 V 0.5 V Measured terminal " " " " " " " " " 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 5.5 V B " " " A " " " B " " " A " " " B " " " A " " " B B A A B B A A B B A A B B A A B B A A B B A A B A B A B A B A B A B A B A B A B A B A B A B A A " " " " " " " B " " " " " " A " " " " " " " B A " " " " " " " B " " " " " A B A " " " " " B A A " " " " " " " B " " " " A B B A " " " " B A A A " " " " " " " B " " " A B " " A " " " B A " " 4/ " " " " " " " " " " " " " " " " " " " " " " " I3 I2 I1 I0 E S2 S1 S0 I7 I6 I5 I4 Z Z Z Z VCC Limits Unit Min Max 2/ " " " " 2/ " " " " mA " " " " " " " " " " " -60 -60 " " " " " " " -150 -150 " " " " " " " " " 60 60 " " 21 " MIL-M-38510/339E 2 3 7 Tc = 25C Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 TC = 25C Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 Z I7 I6 I5 I4 OUT E 0.0 V " " " " " " " " " " " " " " " " " S2 S1 S0 GND " " " " " " " " " " " " " " " " 0.0 V " " " 2.7 V " " " 0.0 V " " " 2.7 V " " " 0.0 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V " " " 0.0 V 2.7 V " " " " " 2.7 V 0.0 V " " " " " 2.7 V 2.7 V " 117 " " " 2.7 V 0.0 V 0.0 V " 118 " " " " 0.0 V 2.7 V " 119 " " " " 2.7 V 0.0 V " 120 " " " " 2.7 V 2.7 V " 121 " " " 0.0 V 0.0 V 0.0 V " " 122 " " " " 0.0 V 2.7 V " " 123 " " " " 2.7 V 0.0 V " " 124 " " " " 2.7 V 2.7 V " " 125 " " " 2.7 V 0.0 V 0.0 V " 126 " " " " 0.0 V 2.7 V " 127 " " " " 2.7 V 0.0 V " 128 " " " " 2.7 V 2.7 V IN tPLH5 " 129 2.7 V 2.7 V 2.7 V 2.7 V OUT IN " 0.0 V 0.0 V 0.0 V 2.7 V 2.7 V 2.7 V 2.7 V " tPHL5 " 130 2.7 V 2.7 V 2.7 V 2.7 V OUT IN " 0.0 V 0.0 V 0.0 V " 2.7 V 2.7 V 2.7 V " tPLH6 " 131 0.0 V 0.0 V 0.0 V 0.0 V OUT " " 2.7 V 2.7 V 2.7 V " 0.0 V 0.0 V 0.0 V " tPHL6 " 132 0.0 V 0.0 V 0.0 V 0.0 V OUT " " 2.7 V 2.7 V 2.7 V " 0.0 V 0.0 V 0.0 V " tPLH3 " " " " " " 133 134 135 136 137 138 2.7 V 0.0 V " " 2.7 V " " 0.0 V " " " " " " " " " " " 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V IN 0.0 V 0.0 V IN 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V tPHL1 tPLH2 25 tPHL2 tPHL3 3003 Fig. 4 " " " " " " " " " " " " " " " 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 " 114 " 115 " 116 " I0 Z IN OUT " " " " " " " " " " " " " " " IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN 2.7 V 0.0 V 0.0 V See footnotes at end of device types 01. OUT " " " " " IN IN IN IN IN IN IN IN IN IN VCC 5.0 V " " " " " " " " " " " " " " " " " " IN " IN " IN IN " " IN " " 2.7 V 0.0 V " " " " " " I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z E to Z E to Z E to Z E to Z S0 to Z S1 to Z S2 to Z S0 to Z S1 to Z S2 to Z Limits Unit Min Max 3.0 " " " " " " " 3.7 " " " " " " " 3.0 6.5 " " " " " " " 7.0 " " " " " " " 6.5 ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 1.5 4.0 " " " " " " " " " " " " " " " " " " " " " " 5.0 9.5 " 3.5 7.0 " 3.0 6.1 " 3.0 6.0 " 4.5 " " 4.0 " " 10.5 " " 9.0 " " " " " " " " MIL-M-38510/339E GND tPLH1 Measured terminal TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 tPLH4 tPHL4 Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 I0 Z E 0.0 V I6 I5 I4 2.7 V Z OUT I7 0.0 V " " " 3003 139 Fig 4 140 " 141 " 142 " 143 " 144 0.0 V 2.7 V 2.7 V Measured terminal Limits Unit GND S2 S1 S0 VCC Min Max GND 0.0 V 0.0 V IN 5.0 V 4.0 9.0 ns " " 0.0 V IN 0.0 V " " " " " " " IN 0.0 V 0.0 V " " " 0.0 V " " " 0.0 V 0.0 V IN " 3.2 7.5 " " " " " 0.0 V IN 0.0 V " " " " " " " " IN 0.0 V 0.0 V " " " 0.0 V 2.7 V " " S0 to Z S1 to Z S2 to Z S0 to Z S1 to Z S2 to Z 10 11 Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH1 = 2.5 to 8.5 ns tPHL1 = 3.5 to 9.0 ns tPLH2 = 2.5 to 7.5 ns tPLH3 = 4.5 to 13.5 ns tPHL3 = 4.0 to 9.5 ns tPLH4 = 3.5 to 11.5 ns tPLH5 = 4.0 to 12.0 ns tPHL5 = 3.0 to 8.0 ns tPLH6 = 3.0 to 7.5 ns Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. tPHL2 = 1.5 to 6.0 ns tPHL4 = 3.0 to 8.0 ns tPHL6 = 2.5 to 6.5 ns 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Min/Max limits in mA for circuit A B C -.25/-.60 -.03/-.60 -.03/-.60 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. MIL-M-38510/339E Test IIL 26 TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a Za GND Zb I0b I1b I2b I3b S0 2.0 V -1 mA " " " GND " " " " " " " " " " " " " " " " " " 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V Test no. 1 Tc = 25C VOH VOL 3006 " " " " " " " 3007 " " " " " " " " " VI C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 E a 0.8 V " " " 2.0 V 0.8 V " " " 27 IIH2 3010 31 " " " " " " " " " " " 32 33 34 35 36 37 38 39 40 41 42 " 43 " " " " " " " " " " " 44 45 46 47 48 49 50 51 52 53 54 See footnotes at end of table. 0.8 V 0.8 V 2.0 V 2.0 V 2.0 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V 2.0 V -18 mA 20 21 22 23 24 25 26 27 28 29 30 IIH1 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V -18 mA -18 mA -18 mA -18 mA -18 mA 2.7 V 4.5 V " " " 2.7 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 4.5 V " " " 7.0 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 7.0 V 7.0 V 7.0 V 7.0 V 20 mA " " " " " " " " " " " " " " " -1 mA " " " 2.0 V 2.0 V 2.0 V E b 0.8 V " " " 0.8 V 2.0 V 0.8 V 2.0 V 20 mA " " " " 0.8 V 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V 0.8 V 2.0 V 2.0 V 0.8 V " " " -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " 2.7 V 2.7 V 2.7 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 2.7 V 4.5 V " " " 2.7 V " " " " " " " " " " " " " " " " " " " " " " " " 7.0 V 7.0 V 7.0 V 7.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 7.0 V 4.5 V " " " 7.0 V Measured terminal Limits Min Za " " " Zb " " " Za " " " " Zb " " " " E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 E b E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 E b E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 E b Unit Max 2.5 " " " " " " " 0.5 " " " " " " " " " -1.2 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 20 A " " " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 02 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a Za GND Zb I0b I1b I2b I3b S0 Test no. 1 IIL1 Tc = 25C IOS 3009 55 " " " " " " " " " " " 56 57 58 59 60 61 62 63 64 65 66 3011 3011 Ea 0.5 V 0.0 V " " " 0.5 V 4.5 V 4.5 V 0.0 V " " " 4.5 V 4.5 V 0.5 V 0.5 V 0.5 V 0.5 V Limits Unit 28 Min Max 5.5 V 2/ 2/ m " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " -60 -60 60 60 -150 -150 20 " " " " " 7.0 " " " " " " " 6.5 " " " " " " " ns " " " " " " " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.5 V E b 0.0 V " " " 0.5 V 0.0 V Eb Za Zb Za Zb VCC 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 5.5 V 0.0 V " " 4.5 V 4.5 V 5.5 V A B A " " " " " " " " " A " " B A " " " " " " " A " " " " B A " " " " " A " " " " " " B A " " " A B B A A B B A A B A B A B " " " " " " " A " " 4/ " " " " " " " " " " " All outputs 5.0 V " " " " " " " " " " " " " " " I0a to Za I1a to Za I2a to Za I3a to Za I0b to Zb I1b to Zb I2b to Zb I3b to Zb I0a to Za I1a to Za I2a to Za I3a to Za I0b to Zb I1b to Zb I2b to Zb I3b to Zb 2.5 V L L H L H L H L H L " " E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OUT " " " IN OUT " " " IN IN IN IN IN IN IN 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 0.0 V " " " 0.0 V " " " MIL-M-38510/339E VCC GND 67 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 4.5 V 0.0 V " 68 0.0 V " IOD 69 5.5 V 2.5 V " 70 0.0 V " ICC 3005 71 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 72 A A A A A A L GND " 73 B B " " " B L " Tc = 25C tional test " 74 " " " " " A H " 3/ " 75 " " " " B " L " " 76 " " " " A " H " " 77 " A " B " " L " " 78 " " " A " " H " " 79 " " B " " " L " " 80 " " A " " " H " " 81 A B " " " " L " " 82 " B " " " " " " " 83 " A " " " " " " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH1 3003 84 0.0 V 0.0 V IN OUT GND Fig. 4 85 " 0.0 V IN " " TC = 25C " 86 " 2.7 V IN " " " 87 " 2.7 V IN " " " 88 0.0 V " " 89 0.0 V " " 90 2.7 V " " 91 2.7 V " tPHL1 " 92 0.0 V 0.0 V IN OUT " " 93 " 0.0 V IN " " " 94 " 2.7 V IN " " " 95 " 2.7 V IN " " " 96 0.0 V " " 97 0.0 V " " 98 2.7 V " " 99 2.7 V " See footnotes at end of table. Measured terminal 3.0 " " " " " " " 2.5 " " " " " " " TABLE III. Group A inspection for device type 02 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 E a IN S1 I3a I2a I1a Zb I0b I1b I2b I3b 0.0 V Test no. 9 tPLH5 TC = 25C tPHL5 tPLH3 tPHL3 3003 100 Fig. 4 101 " 102 " 103 " " " " " " " " 104 105 106 107 108 109 110 111 I0a Za GND 2.7 V OUT GND " IN " " 2.7 V OUT " 0.0 V 0.0 V 0.0 V 0.0 V 2.7 V 2.7 V IN IN 0.0 V 0.0 V IN IN 0.0 V 2.7 V 2.7 V OUT 0.0 V 0.0 V 0.0 V OUT 2.7 V 2.7 V OUT OUT OUT 2.7 V " " " " " " " " " " " S0 E b 0.0 V IN " OUT 2.7 V " OUT 2.7 V OUT 0.0 V OUT 2.7 V OUT 2.7 V 0.0 V 2.7 V 0.0 V 0.0 V IN IN 2.7 V 2.7 V IN IN 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V Limits Unit VCC Min Max 5.0 V 4.5 9.0 ns 4.5 9.0 " 3.0 7.0 " 3.0 7.0 " 4.5 " " " 3.5 " " " 10.5 " " " 9.0 " " " " " " " " " " " " " IN Measured terminal " " " " " " " " " E a to Za E b to Zb E a to Za E b to Zb S0 to Za S0 to Zb S1 to Za S1 to Zb S0 to Za S0 to Zb S1 to Za S1 to Zb 10 29 11 Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH1 = 2.5 to 9.0 ns tPHL1 = 2.5 to 8.0 ns tPLH3 = 4.5 to 14.0 ns tPHL3 = 3.5 to 11.0 ns tPLH5 = 4.5 to 11.5 ns tPHL5 = 2.5 to 9.0 ns Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. Test IIL Min/Max limits in mA for circuit A B C D -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. MIL-M-38510/339E 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C VOL VOH Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0b I1b Zb GND Zd I1d I0d Zc I1c I0c S I0a I1a Za 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V -18 mA 0.8 V 2.0 V 2.0 V 0.8 V 20 mA 20 mA 3010 " " " " " " " " " 27 28 29 30 31 32 33 34 35 36 2.7 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V " " " " " " " " " " 37 38 39 40 41 42 43 44 45 46 7.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V VI C 30 IIH1 IIH2 See footnotes at end of table. 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 20 mA 20 mA -1 mA -1 mA 2.0 V 0.8 V 0.8 V 2.0 V -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V -1 mA -1 mA GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 20 mA 20 mA 2.0 V 0.8 V 0.8 V 2.0 V 20 mA 20 mA -1 mA -1 mA 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V -1 mA -1 mA 0.8 V 2.0 V 2.0 V 0.8 V E 0.8 V " " " " " " " " " " " " " " " -18 mA 4.5 V " " " " " " " " 2.7 V 5.5 V " " " " " " " " " 4.5 V " " " " " " " " 7.0 V " " " " " " " " " " -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " Limits Min Za Za Zb Zb Zd Zd Zc Zc Za Za Zb Zb Zd Zd Zc Zc S I0a I1a I0b I1b I1d I0d I1c I0c E S I0a I1a I0b I1b I1d I0d I1c I0c E S I0a I1a I0b I1b I1d I0d I1c I0c E Unit Max 0.5 " " " " " " " -1.2 " " " " " " " " " V " " " " " " " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " A " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " 2.5 " " " " " " " MIL-M-38510/339E Test no. 3007 " " " " " " " 3006 " " " " " " " Measured terminal TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL1 IOS Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. S I0a I1a Za I0b I1b Zb GND Zd I1d I0d Zc I1c I0c 47 48 49 50 51 52 53 54 55 56 0.5 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 3009 " " " " " " " " " GND " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V 0.0 V 0.0 V 3011 " " " 31 " 89 " " 90 " " " 91 " " See footnotes at end of table. 2.7 V OUT VCC 0.0 V 0.5 V 5.5 V " " " " " " " " " 4.5 V 4.5 V 0.0 V " " " 5.5 V " " " 4.5 V " " " " 4.5 V " " " 5.5 V A A B B A A A " " " B B A A B " " " 4/ " " " " " All outputs 0.0 V " " " " " " " " " " " " " " " IN 5.0 V " " " " " " " " " " " " " " " " I0a to Za I1a to Za I0b to Zb I1b to Zb I1d to Zd I0d to Zd I1c to Zc I0c to Zc I0a to Za I1a to Za I0b to Zb I1b to Zb I1d to Zd I0d to Zd I1c to Zc I0c to Zc " " " " " " 0.5 V 0.5 V 0.5 V 0.0 V 4.5 V 0.0 V 4.5 V 2.5 V 2.5 V L L H L L H OUT OUT OUT OUT 4.5 V 4.5 V A A B B A A A " " " B B L L H L L H IN IN OUT OUT IN OUT OUT IN IN IN IN IN " OUT 2.7 V OUT 2.7 V S I0a I1a I0b I1b I1d I0d I1c I0c E Za Zb Zd Zc Za Zb Zd Zc VCC E to Za E to Zb E to Zd E to Zc Limits Unit Min Max 2/ " " " " " " " " " 2/ " " " " " " " " " mA " " " " " " " " " -60 " " " 60 5/ " " " -150 " " " 23 " " " " " " " " " 2.5 " " " " " " " " " " " " " " " 5.0 6.0 " " " " " " " 5.5 " " " " " " " 9.5 ns " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E 57 0.0 V 4.5 V 0.0 V " 58 " 4.5 V 0.0 V " 59 " " 60 " " IOD 61 2.5 V " 62 2.5 V " 63 " 64 " ICC 3005 65 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 66 A A A L A A L GND " 67 B " A L " A L " Tc = 25C tional test " 68 B " B H " B H " 3/ " 69 A " B L " B L " " 70 B B A L B A L " " 71 A B A H B A H " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH1 3003 72 0.0 V IN OUT GND Fig. 4 73 2.7 V IN OUT " TC = 25C " 74 0.0 V IN OUT " " 75 2.7 V IN OUT " " 76 2.7 V " " 77 0.0 V " " 78 2.7 V " " 79 0.0 V " tPHL1 " 80 0.0 V IN OUT " " 81 2.7 V IN OUT " " 82 0.0 V IN OUT " " 83 2.7 V IN OUT " " 84 2.7 V " " 85 0.0 V " " 86 2.7 V " " 87 0.0 V " tPLH5 " 88 2.7 V 2.7 V OUT " E 0.5 V 0.0 V Measured terminal TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 tPHL5 TC = 25C tPLH3 tPHL3 Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I1a Za I0b I1b Zb GND Zd I1d I0d Zc I1c I0c E IN VCC Min Max GND 5.0 V 2.5 6.5 ns " " " " " " " " " " " " " " " " 0.0 V " " " " " " " " " " " " " " " 4.0 " " " 3.0 " " " 10.0 " " " 7.0 " " " " " " " " " " " Test no. S I0a 3003 92 0.0 V 2.7 V Fig. 4 93 " " 94 " " " 95 " " " " " " " " " " 96 97 98 99 100 101 102 103 IN " " " " " " " OUT 2.7 V 2.7 V 0.0 V OUT 2.7 V 0.0 V 2.7 V OUT 0.0 V OUT OUT 0.0 V 2.7 V OUT 10 Same tests and terminal conditions as subgroup 9, except TC = +125C and use limits from table I. 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. " " " " " " " " OUT 2.7 V OUT OUT OUT 0.0 V 2.7 V 2.7 V 2.7 V OUT 0.0 V 2.7 V OUT 2.7 V 0.0 V 0.0 V Measured terminal E to Za E to Zb E to Zd E to Zc S to Za S to Zb S to Zd S to Zc S to Za S to Zb S to Zd S to Zc Limits Unit 32 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Min/Max limits in mA for circuit A B C D -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. 5/ IOD minimum limit for circuit D shall be 35 mA. MIL-M-38510/339E Test IIL TABLE III. Group A inspection for device type 04. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 VOL Tc = 25C VOH Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0b I1b I1d I0d I1c I0c GND E 0.8 V 4.5 V " " " 33 S I0a I1a 1 0.8 V 2.0 V 0.8 V Za 20 mA " 2 2.0 V 0.8 V 2.0 V 20 mA " 3 0.8 V 2.0 V 0.8 V 20 mA " " " " 4 2.0 V 0.8 V 2.0 V 20 mA " " " " 5 0.8 V " 20 mA 2.0 V 0.8 V " " " 6 2.0 V " 20 mA 0.8 V 2.0 V " " " 7 0.8 V " 20 mA 2.0 V 0.8 V " " " 8 2.0 V " 20 mA 0.8 V 2.0 V " " 3006 9 0.8 V 0.8 V 2.0 V -1 mA " " " " 10 2.0 V 2.0 V 0.8 V -1 mA " " " " 11 0.8 V 0.8 V 2.0 V -1 mA " " " " 12 2.0 V 2.0 V 0.8 V -1 mA " " " " 13 0.8 V " -1 mA 0.8 V 2.0 V " " " 14 2.0 V " -1 mA 2.0 V 0.8 V " " " 15 0.8 V " -1 mA 0.8 V 2.0 V " " " 16 2.0 V " -1 mA 2.0 V 0.8 V " " 17 18 19 20 21 22 23 24 25 26 -18 mA " " " " " " " " " " -18 mA " " " " " " " " " " 3010 " " " " " " " " " 27 28 29 30 31 32 33 34 35 36 2.7 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V " " " " " " " " 2.7 V 5.5 V " " " " " " " " " " " " " " " " " " " 37 38 39 40 41 42 43 44 45 46 7.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V " " " " " " " " 7.0 V " " " " " " " " " " VI C IIH1 IIH2 See footnotes at end of table. -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V Zb GND " " " " " " " " " " " " " " " " " " " " Zd Zc -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V VCC Limits Min Za Za Zb Zb Zd Zd Zc Zc Za Za Zb Zb Zd Zd Zc Zc S I0a I1a I0b I1b I1d I0d I1c I0c E S I0a I1a I0b I1b I1d I0d I1c I0c E S I0a I1a I0b I1b I1d I0d I1c I0c E Unit Max 0.5 V " " " " " " " " " " " " " " 2.5 " " " " " " " " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " A " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E Test no. 3007 Measured terminal TABLE III. Group A inspection for device type 04. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL1 IOS Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0a I1a I0b I1b I1d I0d I1c I0c Test no. S 3009 " " " " " " " " " 47 48 49 50 51 52 53 54 55 56 0.5 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 3011 57 0.0 V " 58 " " 59 " " " 60 " " 61 " 62 " 63 " " 64 " " IOD Za Zb 0.5 V 0.5 V 0.5 V 4.5 V 0.0 V 0.0 V 5.5 V 4.5 V 0.0 V 2.5 V 5.5 V 2.5 V 34 0.0 V " " " " " " " " " 5.5 V " " " " " " 5.5 V " " 4.5 V 4.5 V 4.5 V " A A B B A A A " " " B B A A B " " " 4/ " " " " " 0.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 2.5 V 4.5 V 5.5 V 2.5 V H H L H H L 0.0 V 4.5 V 4.5 V A A B B A A A " " " B B H H L H H L 0.0 V 5.0 V " " " OUT " " " OUT " " " " " " " " " " " OUT " 74 0.0 V " 75 2.7 V " 76 2.7 V " OUT " 77 0.0 V " OUT " 78 2.7 V " OUT " 79 0.0 V " OUT IN IN IN IN S I0a I1a I0b I1b I1d I0d I1c I0c E Za Zb Zd Zc Za Zb Zd Zc VCC Limits Unit Min Max 2/ " " " " " " " " " 2/ " " " " " " " " " mA " " " " " " " " " -60 -150 " " " " " " " " " " 60 " " " " " " " 15 " 2.5 5.9 ns " " " " " " " " " " " " " " " " " " " " " All outputs I0a to Z a I1a to Z a I0b to Z b I1b to Z b I1d to Z d I0d to Z d I1c to Z c I0c to Z c MIL-M-38510/339E 0.5 V " 0.5 V 0.0 V 2.7 V IN VCC 0.5 V 73 IN E 0.5 V Fig. 4 See footnotes at end of table. IN Zc 5.5 V " " " " " " " " " ICC 3005 65 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 66 A A A H A A H GND " 67 B " A H " A H " Tc = 25C tional test " 68 B " B L " B L " 3/ " 69 A " B H " B H " " 70 B B A H B A H " " 71 A B A L B A L " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH2 3003 72 0.0 V IN OUT GND TC = 25C Zd GND " " " " " " " " " 0.5 V 0.0 V GND Measured terminal TABLE III. Group A inspection for device type 04. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 tPHL2 TC = 25C tPLH6 tPHL6 35 tPHL4 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I1a I0b I1b I1d I0d I1c I0c GND E 0.0 V 5.0 V " " " OUT " " " OUT " " " " " " " " " " " " IN " " " " " " " " " " " " " " " " " " " 0.0 V " " " " " " " " " " " " " " " " " " Test no. S I0a 3003 80 0.0 V IN Fig. 4 81 2.7 V " 82 0.0 V " 83 2.7 V " 84 2.7 V " OUT " 85 0.0 V " OUT " 86 2.7 V " OUT " 87 0.0 V " OUT " 88 2.7 V " 89 " " 90 " " " 91 " " " 92 0.0 V " 93 " " 94 " " " 95 " " " 96 IN " 97 " " 98 " " " 99 " " " 100 " " 101 " " 102 " " " 103 " " IN Za OUT OUT IN IN 2.7 V OUT 2.7 V 2.7 V 2.7 V 0.0 V OUT OUT 0.0 V 2.7 V OUT OUT 2.7 V 0.0 V Zb 2.7 V OUT OUT 2.7 V 0.0 V OUT 10 Same tests and terminal conditions as subgroup 9, except TC = +125C and use limits from table I. 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Test IIL Min/Max limits in mA for circuit A B C D -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V minimum, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. GND Zd OUT Zc IN IN IN IN 2.7 V OUT OUT 2.7 V 2.7 V OUT OUT 2.7 V 0.0 V OUT OUT 0.0 V 2.7 V 2.7 V 0.0 V 2.7 V OUT 0.0 V 2.7 V Measured terminal VCC I0a to Z a I1a to Z a I0b to Z b I1b to Z b I1d to Z d I0d to Z d I1c to Z c I0c to Z c E to Z a E to Z b E to Z d E to Z c E to Z a E to Z b E to Z d E to Z c S to Z a S to Z b S to Z d S to Z c S to Z a S to Z b S to Z d S to Z c Limits Unit Min Max 1.5 4.0 ns " " " " " " " " " " " " " " " " " " " " " 2.5 6.0 " " " " " " " " " " 2.0 7.5 " " " " " " " " " " 3.0 9.5 " " " " " " " " " " 2.5 6.5 " " " " " " " " " " MIL-M-38510/339E tPLH3 Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 VOL Tc = 25C VOH Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 I0 Z Z QE 0.8 V I7 I6 I5 I4 36 1 " " " " " " " " 3006 " 2 3 4 5 6 7 8 9 10 11 " " " " " " " 12 13 14 15 16 17 18 19 20 21 22 23 VI C IIH1 IIH2 3010 " " " " 24 25 26 27 28 29 30 31 32 33 34 35 " " " " " " " " " " " " 36 37 38 39 40 41 42 43 44 45 46 47 " " " " " " " 48 49 50 51 52 53 54 See footnotes at end of table. 2.0 V GND S2 S1 S0 GND 0.8 V 0.8 V 0.8 V 4.5 V -3.0 mA " " " " " " " " 0.8 V " " " " " " " " " " " " " " 2.0 V " " " 0.8 V 0.8 V " 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V " 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 0.8 V 0.8 V " " " " " " " " " " " " " " " " " " " " " " " " " " " 2.0 V " " " " 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V -18 mA " " " " " " " " " " " " -18 mA 4.5 V " " " 2.7 V " " " " " " " " " " " " " " " " " " " " " " " " 2.7 V " " " " " " " 7.0 V 20 mA 2.0 V " " " " " " " 2.0 V 2.0 V 0.8 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V 20 mA -3.0 mA -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 4.5 V 7.0 V 7.0 V 7.0 V 7.0 V 7.0 V 2.0 V 2.0 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA 4.5 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 2.7 V 0.0 V " " " 4.5 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 0.0 V 0.0 V 4.5 V 4.5 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 0.0 V " " " 0.0 V 0.0 V 4.5 V 4.5 V 7.0 V 0.0 V 4.5 V 0.0 V 4.5 V 7.0 V 7.0 V 7.0 V 7.0 V VCC " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " Limits Min Z " " " " " " " Z Z Z " " " " " " " I3 I2 I1 I0 QE S2 S1 S0 I7 I6 I5 I4 I3 I2 I1 I0 QE S2 S1 S0 I7 I6 I5 I4 I3 I2 I1 I0 QE S2 S1 S0 I7 I6 I5 I4 Unit Max 0.5 V " " " " " " " " " " " " " " " " " " 2.4 " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " " " A " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E 3007 Measured terminal TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I2 I1 I0 Z Z QE 0.0 V " " " 0.5 V I7 I6 I5 I4 Test no. I3 3009 " " " " 55 56 57 58 59 0.5 V " " " " " " " 60 61 62 63 64 65 66 67 68 0.0 V 4.5 V 2.7 V 69 70 4.5 V 0.0 V 0.5 V 71 72 4.5 V 0.0 V 0.0 V 73 74 0.0 V 5.5 V 2.5 V IOZH IOZL IOS 37 IOD 3011 3011 GND S2 S1 S0 GND " " " " 0.0 V " " " 4.5 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.5 V 2.7 V 0.0 V " " " 4.5 V " " " " " " " " " " 4.5 V " " " 0.0 V " 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V " 0.5 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V " 0.5 V " " " " " " " " " " " " 0.0 V 0.0 V " " " " " " " " " " " 2.5 V " " " " " " " " " " 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 5.5 V 5.5 V B " " " A " " " B " " " A " " " B B A A B B A A B B A A B A A B B A B A B A B A B A B A B B A A B " " " " " " A " " " " " " B B B " " " " " A B A " " " " B " " B " " " " A B B A " " " " " " B B " " " A B " " A " " " B " " " 4/ " " " " " " " " " " " " " " " All outputs 0.0 V " " " 2.7 V " " " 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 5.0 V " " " " " " " I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z 0.5 V 0.5 V 0.5 V 0.0 V VCC 5.5 V " " " " 0.5 V 0.5 V 0.5 V 0.5 V 0.5 V IN IN IN IN " " " " " " " " " I3 I2 I1 I0 QE S2 S1 S0 I7 I6 I5 I4 Z Limits Min Max 2/ " " " " 2/ " " " " mA " " " " " " " " " " " " " " " " " " 50 50 " " " " " A " -50 -50 " " -150 -150 mA " Z Z Z Z Z Z Z VCC VCC Unit -60 -60 35 35 " " 22 24 " " 7.0 " " " " " " " ns " " " " " " " MIL-M-38510/339E ICC 3005 75 4.5 V 4.5 V 4.5 V 4.5 V " " ICCZ 3005 76 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 77 B B B A H L B GND " 78 " B A B " " " " Tc = 25C tional test " 79 " A B " " " " " 3/ " 80 A B " " " " " " " 81 B " " " " " " " " 82 " " " " " " " " " 83 " " " " " " " " " 84 " " " " " " " " " 85 A A A " L H " " " 86 " A B " " " " " " 87 " B A " " " " " " 88 B A " " " " " " " 89 A " " " " " " " " 90 " " " " " " " " " 91 " " " " " " " " " 92 " " " " " " " " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH1 3003 93 IN OUT 0.0 V GND Fig. 4 94 IN " " " Tc = 25C " 95 IN " " " " 96 IN " " " " 97 " " " " 98 " " " " 99 " " " " 100 " " " See footnotes at end of table. Measured terminal 2.5 " " " " " " " TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 Tc = 25C tPHL1 tPLH2 38 tPHL2 tPHL3 tPLH4 tPHL4 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 Z I7 I6 I5 I4 VCC IN OUT QE 0.0 V " " " " " " " " 5.0 V " " " " " " " " " GND S2 S1 S0 GND " " " " " " " " 0.0 V " " " 2.7 V " " " 0.0 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V " " " 0.0 V 2.7 V " " " " " 2.7 V 0.0 V " " " " " 2.7 V 2.7 V " 113 " " " 2.7 V 0.0 V 0.0 V " 114 " " " " 0.0 V 2.7 V " 115 " " " " 2.7 V 0.0 V " 116 " " " " 2.7 V 2.7 V " 117 " " " 0.0 V 0.0 V 0.0 V " " 118 " " " " 0.0 V 2.7 V " " 119 " " " " 2.7 V 0.0 V " " 120 " " " " 2.7 V 2.7 V " " 121 " " " 2.7 V 0.0 V 0.0 V " 122 " " " " 0.0 V 2.7 V " 123 " " " " 2.7 V 0.0 V " 124 " " " " 2.7 V 2.7 V " " " " " " " 125 126 127 128 129 130 131 OUT " " " " " " " " " " " " " " 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V IN 0.0 V 0.0 V IN " 132 " " " " 0.0 V IN 0.0 V " 133 " " " " IN 0.0 V 0.0 V " 134 0.0 V " " " 0.0 V 0.0 V IN " " 135 " " " " 0.0 V IN 0.0 V " " 136 " " " " IN 0.0 V 0.0 V 3003 Fig. 4 " " " " " " " 101 102 103 104 105 106 107 108 109 " 110 " 111 " 112 " See footnotes at end of table. I0 Z IN OUT " " " " " " " IN IN IN IN IN IN IN IN IN IN IN 2.7 V 2.7 V 0.0 V 0.0 V 0.0 V 0.0 V 2.7 V 2.7 V 0.0 V " " 2.7 V " " " OUT " " " " " IN IN IN IN IN " " IN " IN " IN IN " " IN " IN " 2.7 V 0.0 V " " " " " " " " 0.0 V 2.7 V " " Measured terminal I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z I0 to Z I1 to Z I2 to Z I3 to Z I4 to Z I5 to Z I6 to Z I7 to Z S0 to Z S1 to Z S2 to Z S0 to Z S1 to Z S2 to Z S0 to Z S1 to Z S2 to Z S0 to Z S1 to Z S2 to Z Limits Unit Min Max 3.5 " " " " " " " 2.5 7.0 " " " " " " " 6.5 ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 1.0 4.0 " " " " " " " " " " " " " " " " " " " " " " 4.5 " " 4.0 " " 3.5 10.5 " " 8.5 " " 9.0 " " " " " " " " " " " " " 3.2 7.5 " " " " " " " MIL-M-38510/339E tPLH3 Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. I3 I2 I1 Z QE IN GND S2 S1 S0 I7 I6 I5 I4 VCC Min Max GND 0.0 V 0.0 V 0.0 V 5.0 V 3.5 7.0 ns " " " " " " 2.5 6.0 " " " " " " " 3.5 7.5 " " " " " " " 2.5 6.0 " " " " " " " 2.0 5.5 " " " " " " " 2.5 5.5 " " " " " " " 1.0 4.5 " " " " " " " 1.0 4.5 " I0 Z 9 tPZH5 3003 137 2.7 V OUT Tc = 25C tPZH6 Fig. 4 138 0.0 V tPZL5 " 139 0.0 V tPZL6 " 140 2.7 V tPHZ5 " 141 2.7 V tPHZ6 " 142 0.0 V tPLZ5 " 143 0.0 V tPLZ6 " 144 2.7 V OUT OUT OUT OUT OUT OUT OUT Measured terminal QE to Z QE to Z QE to Z QE to Z QE to Z QE to Z QE to Z QE to Z Limits Unit 10 11 Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH1 = 2.5 to 9.0 ns tPLH3 = 3.5 to 14.0 ns tPZH5 = 3.0 to 8.5 ns tPLH2 = 2.5 to 8.5 ns tPLH4 = 3.5 to 11.5 ns tPZH6 = 2.0 to 7.0 ns tPHL1 = 3.5 to 9.0 ns tPHL3 = 3.0 to 10.5 ns tPZL5 = 2.5 to 9.0 ns tPHL2 = 1.0 to 6.0 ns tPHL4 = 3.2 to 8.0 ns tPZL6 = 2.5 to 7.5 ns Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. tPHZ5 = 2.0 to 5.5 ns tPHZ6 = 2.0 to 6.0 ns tPLZ5 = 1.0 to 5.5 ns tPLZ6 = 1.0 to 5.0 ns 39 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Min/Max limits in mA for circuit A B C -.25/-.60 -.03/-.60 -.03/-.60 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. MIL-M-38510/339E Test IIL TABLE III. Group A inspection for device type 06. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C VOL VOH Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0b I1b Zb GND Zd I1d I0d Zc I1c I0c S I0a I1a Za 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V -18 mA 0.8 V 2.0 V 2.0 V 0.8 V 20 mA 20 mA 3010 " " " " " " " " " 27 28 29 30 31 32 33 34 35 36 2.7 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V " " " " " " " " " " 37 38 39 40 41 42 43 44 45 46 7.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V VI C 40 IIH1 IIH2 See footnotes at end of table. 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 20 mA 20 mA -3 mA -3 mA 2.0 V 0.8 V 0.8 V 2.0 V -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V -3 mA -3 mA GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 20 mA 20 mA 2.0 V 0.8 V 0.8 V 2.0 V 20 mA 20 mA -3 mA -3 mA 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V -3 mA -3 mA 0.8 V 2.0 V 2.0 V 0.8 V OE 0.8 V " " " " " " " " " " " " " " " -18 mA 4.5 V " " " " " " " " 2.7 V 5.5 V " " " " " " " " " 4.5 V " " " " " " " " 7.0 V " " " " " " " " " " -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " Limits Min Za Za Zb Zb Zd Zd Zc Zc Za Za Zb Zb Zd Zd Zc Zc S I0a I1a I0b I1b I1d I0d I1c I0c OE S I0a I1a I0b I1b I1d I0d I1c I0c OE S I0a I1a I0b I1b I1d I0d I1c I0c OE Unit Max 0.5 " " " " " " " -1.2 " " " " " " " " " V " " " " " " " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " A " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " 2.4 " " " " " " " MIL-M-38510/339E Test no. 3007 " " " " " " " 3006 " " " " " " " Measured terminal TABLE III. Group A inspection for device type 06. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL1 IOS Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 Test no. S I0a I1a Za I0b I1b Zb GND Zd I1d I0d Zc I1c I0c 47 48 49 50 51 52 53 54 55 56 0.5 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 3009 " " " " " " " " " 3011 " " " 0.5 V 0.5 V 0.5 V 0.5 V GND " " " " " " " " " 41 See footnotes at end of table. VCC 0.5 V 5.5 V " " " " " " " " " " " " " 4.5 V " " " 5.5 V " " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V 0.0 V 2.7 V 0.5 V L L H H L L H H OUT OUT 2.7 V 4.5 V 4.5 V 0.5 V 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V L L H H L L H H B B A A A B B A A B B A B B A A B " " " " " " " 4/ " " " " " " " All outputs IN 0.0 V " " " " " " " 5.0 V " " " " " " " I0a to Za I1a to Za I0b to Zb I1b to Zb I1d to Zd I0d to Zd I1c to Zc I0c to Zc 0.0 V 4.5 V 2.5 V 0.0 V 0.0 V 4.5 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V B B A A A B B A A B B A B B A A OE Za Zb Zd Zc Za Zb Zd Zc Za Zb Zd Zc Za Zb Zd Zc VCC VCC VCC 0.0 V " " " " " " " 2.0 V " " " " " " " 0.0 V 0.0 V 4.5 V 4.5 V 2.5 V S I0a I1a I0b I1b I1d I0d I1c I0c IN IN OUT OUT IN Limits Unit Min Max 2/ " " " " " " " " " 2/ " " " " " " " " " mA " " " " " " " " " -60 " " " 35 " " " -150 " " " 50 " " " -50 " " " 15 22 23 " " " " " " " " A " " " " " " " mA " " 5.5 " " " " " " " ns " " " " " " " 2.5 " " " " " " " MIL-M-38510/339E 57 0.0 V 4.5 V 0.0 V " 58 " 4.5 V 0.0 V " 59 " " 60 " " IOD 61 0.0 V 0.0 V 2.5 V " 62 0.0 V 2.5 V " 63 " 64 " IOZH 65 4.5 V 4.5 V 4.5 V 2.7 V " 66 " 4.5 V 4.5 V 2.7 V " 67 " " 68 " " IOZL 69 0.0 V 0.0 V 4.5 V 0.5 V " 70 " 0.0 V 4.5 V 0.5 V " 71 " " 72 " " ICCH 3005 73 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V " ICCL 3005 74 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " ICCZ 3005 75 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 76 A A B L A B L GND " 77 " B B L B B L " Tc = 25C tional test " 78 " B A H B A H " 3/ " 79 " A A H A A H " " 80 B B A L B A L " " 81 " B B L B B L " " 82 " A B H A B H " " 83 " A A H A A H " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH1 3003 84 0.0 V IN OUT GND Fig. 4 85 2.7 V IN OUT " TC = 25C " 86 0.0 V IN OUT " " 87 2.7 V IN OUT " " 88 2.7 V " " 89 0.0 V " " 90 2.7 V " " 91 0.0 V " OE Measured terminal TABLE III. Group A inspection for device type 06. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 TC = 25C tPHL1 tPLH3 tPHL3 tPZH5 42 tPZL5 tPLZ5 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I1a Za I0b I1b Zb GND Zd I1d I0d Zc I1c I0c IN OUT OUT OE 0.0 V " " " " " " " " " " " " " " " IN 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Test no. S I0a 3003 Fig. 4 " " " " " " " " " " " " " " " 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 0.0 V 2.7 V 0.0 V 2.7 V 2.7 V 0.0 V 2.7 V 0.0 V IN " " " " " " " 0.0 V IN " 109 " " 110 " " " 111 " " " 112 2.7 V " 113 " " 114 " " " 115 " " " 116 " " 117 " " 118 " " " 119 " " " 120 0.0 V " 121 " " 122 " " " 123 " " IN IN 0.0 V 2.7 V OUT 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V OUT OUT 2.7 V 0.0 V OUT OUT 0.0 V 2.7 V OUT OUT OUT OUT OUT OUT IN IN 2.7 V 0.0 V OUT OUT IN OUT 2.7 V 0.0 V OUT 0.0 V 2.7 V IN 0.0 V 2.7 V " OUT 2.7 V OUT OUT 2.7 V 0.0 V OUT 0.0 V " 2.7 V 0.0 V OUT OUT 2.7 V 2.7 V OUT OUT GND " " " " " " " " " " " " " " " " OUT OUT 0.0 V OUT 10 Same tests and terminal conditions as subgroup 9, except TC = +125C and use limits from table I. 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Min/Max limits in mA for circuit Test A B C D IIL -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. " OUT 2.7 V OUT OUT 2.7 V 0.0 V OUT 0.0 V Measured terminal VCC I0a to Za I1a to Za I0b to Zb I1b to Zb I1d to Zd I0d to Zd I1c to Zc I0c to Zc S to Za S to Zb S to Zd S to Zc S to Za S to Zb S to Zd S to Zc OE to Za OE to Zb OE to Zd OE to Zc OE to Za OE to Zb OE to Zd OE to Zc OE to Za OE to Zb OE to Zd OE to Zc OE to Za OE to Zb OE to Zd OE to Zc Limits Unit Min Max 2.0 " " " " " " " 4.0 " " " 2.5 " " " 2.0 5.5 " " " " " " " 9.5 " " " 7.0 " " " 6.0 ns " " " " " " " " " " " " " " " " " " " " " " " " " 2.5 7.0 " " " " " " " " " " 2.0 6.0 " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E tPHZ5 Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 07. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 VOL Tc = 25C VOH Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0b I1b I1d I0d I1c I0c 43 S I0a I1a 1 0.8 V 2.0 V 0.8 V 20 mA GND OE 0.8 V 4.5 V " 2 2.0 V 0.8 V 2.0 V 20 mA " " " " 3 0.8 V 2.0 V 0.8 V 20 mA " " " " 4 2.0 V 0.8 V 2.0 V 20 mA " " " " 5 0.8 V " 20 mA 0.8 V 2.0 V V " " " 6 2.0 V " 20 mA 2.0 V V 0.8 V " " " 7 0.8 V " 20 mA 0.8 V 2.0 V " " " 8 2.0 V " 20 mA 2.0 V 0.8 V " " 3006 9 0.8 V 0.8 V 2.0 V -3 mA " " " " 10 2.0 V 2.0 V 0.8 V -3 mA " " " " 11 0.8 V 0.8 V 2.0 V -3 mA " " " " 12 2.0 V 2.0 V 0.8 V -3 mA " " " " 13 0.8 V " -3 mA 2.0 V 0.8 V " " " 14 2.0 V " -3 mA 0.8 V 2.0 V " " " 15 0.8 V " -3 mA 2.0 V 0.8 V " " " 16 2.0 V " -3 mA 0.8 V 2.0 V " " 17 18 19 20 21 22 23 24 25 26 -18 mA " " " " " " " " " " -18 mA " " " " " " " " " " 3010 " " " " " " " " " 27 28 29 30 31 32 33 34 35 36 2.7 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V " " " " " " " " 2.7 V 5.5 V " " " " " " " " " " " " " " " " " " " 37 38 39 40 41 42 43 44 45 46 7.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V " " " " " " " " 7.0 V " " " " " " " " " " VI C IIH1 IIH2 See footnotes at end of table. Za -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V Zb GND " " " " " " " " " " " " " " " " " " " " Zd Zc -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 7.0 V 7.0 V VCC Limits Min Za Za Zb Zb Zd Zd Zc Zc Za Za Zb Zb Zd Zd Zc Zc S I0a I1a I0b I1b I1d I0d I1c I0c OE S I0a I1a I0b I1b I1d I0d I1c I0c OE S I0a I1a I0b I1b I1d I0d I1c I0c OE Unit Max 0.5 V " " " " " " " " " " " " " " 2.4 " " " " " " " " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " 20 " " " " " " " " " A " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E Test no. 3007 Measured terminal TABLE III. Group A inspection for device type 07. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 1 Tc = 25C IIL1 IOS IOD 44 IOZL 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I0a I1a I0b I1b I1d I0d I1c I0c Test no. S 3009 " " " " " " " " " 47 48 49 50 51 52 53 54 55 56 0.5 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 3011 57 0.0 V " 58 " " 59 " " 60 " 61 " 62 " 63 " " 64 " " 65 " 66 " 67 " Za Zb 0.5 V 0.5 V 0.5 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 5.5 V 4.5 V 4.5 V 2.5 V 2.7 V 4.5 V 4.5 V 2.7 V 0.0 V " " " " " " 0.5 V 0.5 V 0.5 V 0.0 V 4.5 V 0.0 V " " " " 4.5 V " " " " " " " " 2.0 V 5.5 V " " " " " " " 69 4.5 V 70 " 71 " " 72 " " 0.0 V 2.5 V 0.0 V 0.5 V 4.5 V 0.0 V 0.5 V 4.5 V 2.5 V 2.7 V 0.0 V 5.5 V 4.5 V 5.5 V 4.5 V " 4.5 V VCC 0.5 V 0.5 V " 2.5 V OE " " 5.5 V Zc 5.5 V " " " " " " " " " 68 " " " " " " " " " " ICCH 3005 73 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " ICCL 3005 74 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V " ICC 3005 75 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 76 B A B L A B L GND " 77 " A A L A A L " Tc = 25C tional test " 78 " B A H B A H " 3/ " 79 " B B " B B " " " 80 A A B " A B " " " 81 " B B " B B " " " 82 " B A L B A L " " 83 " A A L A A L " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. See footnotes at end of table. Zd GND " " " " " " " " " 0.5 V 0.0 V GND 2.7 V 0.5 V 0.0 V 4.5 V 4.5 V 0.5 V L L H " " " L L 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V B A A B B B A A A A B B A B B A L L H " " " L L Measured terminal 0.0 V 4.5 V " " 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 4.5 V " " " B A A B B B A A A A B B A B B A B " " " " " " " 4/ " " " " " " " S I0a I1a I0b I1b I1d I0d I1c I0c OE Za Zb Zd Zc Za Zb Zd Zc Za Zb Zd Zc Za Zb Zd Zc VCC VCC VCC All outputs Limits Unit Min Max 2/ " " " " " " " " " 2/ " " " " " " " " " mA " " " " " " " " " -60 -150 " " " " " " " " " " 35 " " " " " " " 50 A " " " " " " -50 " " " " " " " 9.5 23 17 mA " " MIL-M-38510/339E IOZH Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 07. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 tPLH2 TC = 25C tPHL2 45 tPLH4 tPZH6 tPZL6 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I1a I0b I1b I1d I0d I1c I0c Test no. S I0a 3003 84 0.0 V IN Fig. 4 85 2.7 V " 86 0.0 V " 87 2.7 V " 88 2.7 V " OUT " 89 0.0 V " OUT " 90 2.7 V " OUT " 91 0.0 V " OUT " 92 0.0 V " 93 2.7 V " 94 0.0 V " 95 2.7 V " 96 2.7 V " OUT " 97 0.0 V " OUT " 98 2.7 V " OUT " 99 0.0 V " OUT " 100 IN " 101 " " 102 " " " 103 " " " 104 " " 105 " " 106 " " " 107 " " " 108 0.0 V " 109 " " 110 " " " 111 " " " 112 2.7 V " 113 " " 114 " " " 115 " " See footnotes at end of table. IN OE 0.0 V VCC Min Max 5.0 V 2.5 5.3 ns OUT " " " " " " OUT " " " " " " OUT " " " " " " " " " " " " " " " " " " " " " " " " IN IN 2.7 V IN IN IN OUT " " " OUT " " " OUT " " " OUT 0.0 V OUT OUT 2.7 V OUT OUT 0.0 V 2.7 V IN " 0.0 V 0.0 V Zc " 2.7 V 0.0 V Zd " IN 0.0 V Zb OUT IN 2.7 V Unit GND IN IN Limits OUT Za GND Measured terminal OUT OUT 2.7 V OUT " " " " " " " " " IN " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT IN IN 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 0.0 V OUT OUT 2.7 V 0.0 V OUT OUT IN 2.7 V OUT OUT IN 0.0 V 2.7 V OUT 2.7 V " " " " I0a to Z a I1a to Z a I0b to Z b I1b to Z b I1d to Z d I0d to Z d I1c to Z c I0c to Z c I0a to Z a I1a to Z a I0b to Z b I1b to Z b I1d to Z d I0d to Z d I1c to Z c I0c to Z c S to Z a S to Z b S to Z d S to Z c S to Z a S to Z b S to Z d S to Z c OE to Z a OE to Z b OE to Z d OE to Z c OE to Z a OE to Z b OE to Z d OE to Z c " " 1.0 4.0 " " " " " " " " " " " " " " " " " " " " " " 3.0 7.5 " " " " " " " " " " 2.5 7.0 " " " " " " " " " " 2.0 6.0 " " " " " " " " " " 2.5 7.0 " " " " " " " " " " MIL-M-38510/339E tPHL4 Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 07. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 9 tPHZ6 TC = 25C tPLZ6 Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I1a I0b I1b I1d I0d I1c I0c OE IN VCC Min Max GND 5.0 V 2.0 6.0 ns " " " " " " " " " " " " " " " " " " " " " " " " " " Test no. S I0a 3003 116 0.0 V 0.0 V Fig. 4 117 " " 118 " " " 119 " " Za OUT 0.0 V 2.7 V Zb OUT OUT GND " 120 2.7 V " 121 " " 122 " " " 123 " " 2.7 V OUT 10 Same tests and terminal conditions as subgroup 9, except TC = +125C and use limits from table I. 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. Zd OUT Zc 0.0 V OUT OUT 0.0 V 2.7 V OUT 2.7 V Measured terminal OE to Z a OE to Z b OE to Z d OE to Z c OE to Z a OE to Z b OE to Z d OE to Z c Limits Unit " " " " " " " " " " " " 46 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Min/Max limits in mA for circuit A B C D -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. MIL-M-38510/339E Test IIL TABLE III. Group A inspection for device type 08. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a Za GND Zb I0b I1b I2b I3b 2.0 V -3 mA " " " GND " " " " " " " " " " " " " " " " Test no. 1 Tc = 25C VOH VOL 3006 " " " " " " " 3007 " " " " " " " VI C 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 OE a 0.8 V " " " 0.8 V " " " 47 IIH2 3010 29 " " " " " " " " " " " 30 31 32 33 34 35 36 37 38 39 40 " 41 " " " " " " " " " " " 42 43 44 45 46 47 48 49 50 51 52 See footnotes at end of table. 2.0 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V -18 mA 18 19 20 21 22 23 24 25 26 27 28 IIH1 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V -18 mA -18 mA -18 mA -18 mA -18 mA 2.7 V 2.7 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 7.0 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 7.0 V 7.0 V 7.0 V 7.0 V 20 mA " " " " " " " " " " " " " " -3 mA " " " 20 mA " " " 2.0 V 2.0 V 2.0 V 2.0 V 0.8 V 0.8 V 0.8 V 0.8 V S0 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V OE b 0.8 V " " " 0.8 V " " " -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " 2.7 V 2.7 V 2.7 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 2.7 V 2.7 V " " " " " " " " " " " " " " " " " " " " " " " " 7.0 V 7.0 V 7.0 V 7.0 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 7.0 V 7.0 V Measured terminal Limits Min Za " " " Zb " " " Za " " " " " " " OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b Unit Max 2.4 " " " " " " " 0.5 " " " " " " " -1.2 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 20 A " " " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/339E Cases E, F 1 MIL-STD- TABLE III. Group A inspection for device type 08 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a Za GND Zb I0b I1b I2b I3b S0 Test no. 1 IIL1 Tc = 25C IOS 3009 53 " " " " " " " " " " " 54 55 56 57 58 59 60 61 62 63 64 3011 3011 OE a 0.5 V 0.5 V 4.5 V 4.5 V 0.0 V " " " 4.5 V 4.5 V 0.5 V 0.5 V 0.5 V 0.5 V Limits Unit 48 Min Max 5.5 V 2/ 2/ mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " -60 -60 35 35 -150 -150 50 50 -50 -50 23 16 23 " " " " A " " " mA " " 7.0 " " " " " " " 7.0 " " " " " " " ns " " " " " " " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V OE b 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.5 V 0.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V " " " " " 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V B A B " " " " " B B B A B " " " B " " " " A B B B " " " " " " A B B A A B B A A 0.0 V 4.5 V 2.5 V 0.0 V 2.7 V 0.0 V 0.5 V L H L H L H L H OUT " " " IN OUT " " " IN IN IN IN IN IN IN 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V 0.0 V 2.7 V OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b Za Zb Za Zb Za Zb Za Zb VCC VCC VCC 2.0 V 0.0 V 0.0 V 4.5 V " " 4.5 V 4.5 V 5.5 V " " " " " " B " " " " " " " 4/ " " " " " " " All outputs 5.0 V " " " " " " " " " " " " " " " I0a to Za I1a to Za I2a to Za I3a to Za I0b to Zb I1b to Zb I2b to Zb I3b to Zb I0a to Za I1a to Za I2a to Za I3a to Za I0b to Zb I1b to Zb I2b to Zb I3b to Zb 0.0 V 0.0 V 0.0 V 2.0 V 0.0 V " " " 0.0 V " " " 3.0 " " " " " " " 2.5 " " " " " " " MIL-M-38510/339E VCC GND 65 0.0 V 0.0 V 4.5 V 0.0 V " 66 0.0 V " IOD 67 0.0 V 0.0 V 0.0 V 2.5 V " 68 0.0 V 0.0 V " IOZH 69 2.0 V 0.0 V 0.0 V 2.7 V " 70 0.0 V " IOZL 71 2.0 V 4.5 V 4.5 V 0.5 V " 72 4.5 V " ICCL 3005 73 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " ICCH 3005 74 0.0 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V " ICCZ 3005 75 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 76 B B B B B B L GND " 77 " " " " B A H " Tc = 25C tional test " 78 " " " " B B L " 3/ " 79 " " " " A " H " " 80 " A " " B " L " " 81 " " " A " " H " " 82 " " " B " " L " " 83 " " A B " " H " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH1 3003 84 0.0 V 0.0 V IN OUT GND Fig. 4 85 " 0.0 V IN " " TC = 25C " 86 " 2.7 V IN " " " 87 " 2.7 V IN " " " 88 0.0 V " " 89 0.0 V " " 90 2.7 V " " 91 2.7 V " tPHL1 " 92 0.0 V 0.0 V IN OUT " " 93 " 0.0 V IN " " " 94 " 2.7 V IN " " " 95 " 2.7 V IN " " " 96 0.0 V " " 97 0.0 V " " 98 2.7 V " " 99 2.7 V " See footnotes at end of table. Measured terminal TABLE III. Group A inspection for device type 08 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a Zb I0b I1b I2b I3b S0 Test no. 9 TC = 25C tPLH3 tPHL3 tPZH5 tPZL5 tPHZ5 49 tPLZ5 3003 Fig. 4 " " " " " " " 100 101 102 103 104 105 106 107 108 " 109 " 110 " 111 " 112 " 113 " 114 " 115 OE a 0.0 V 0.0 V 0.0 V 0.0 V IN 0.0 V 0.0 V IN IN 0.0 V 0.0 V IN IN 2.7 V I1a I0a Za GND 2.7 V 0.0 V OUT GND " " " " " " " " 2.7 V 0.0 V 0.0 V 0.0 V OUT 2.7 V OUT 2.7 V OUT 2.7 V OUT 2.7 V IN " 0.0 V 0.0 V OUT 0.0 V IN 2.7 V OUT 2.7 V IN 0.0 V OUT 0.0 V OUT 0.0 V OUT 2.7 V OUT 2.7 V OUT 2.7 V 2.7 V 0.0 V 0.0 V 2.7 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V OUT 2.7 V 2.7 V " IN " " " IN 0.0 V OUT 0.0 V 0.0 V VCC 5.0 V " " " " " " " " IN 2.7 V " " 2.7 V OE b 0.0 V OUT " " 0.0 V 0.0 V " " 2.7 V OUT IN IN 0.0 V 0.0 V IN IN 0.0 V 0.0 V 2.7 V " " IN Measured terminal " S0 to Za S0 to Zb S1 to Za S1 to Zb S0 to Za S0 to Zb S1 to Za S1 to Zb OE a to Za OE b to Zb OE a to Za OE b to Zb OE a to Za OE b to Zb OE a to Za OE b to Zb Limits Unit Min Max 4.5 " " " 3.0 " " " 3.0 11.5 " " " 9.0 " " " 8.0 ns " " " " " " " " " " " " " " " " " 2.0 5.0 " 2.0 5.0 " 2.0 6.0 " 2.0 6.0 " 10 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Test IIL Min/Max limits in mA for circuit A B C D -.25/-.60 -.03/-.60 -.03/-.60 0.0/-0.30 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. tPHZ5 = 2.0 to 6.5 ns tPLZ5 = 2.0 to 8.0 ns MIL-M-38510/339E Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH1 = 2.5 to 9.0 ns tPHL1 = 2.5 to 8.0 ns tPZH5 = 2.5 to 10.0 ns tPLH3 = 3.5 to 15.0 ns tPHL3 = 2.5 to 11.0 ns tPZL5 = 2.5 to 10.0 ns TABLE III. Group A inspection for device type 09. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 Test no. 1 VOH Tc = 25C VOL 1 E a 2.0 V " " " " 2 3 4 5 0.8 V " " " " " " " " 3007 6 7 8 9 10 11 " " " " 12 13 14 15 " " " 16 17 18 19 VI C 0.8 V " " " IIH2 3010 31 " " " " " " " " " " " 32 33 34 35 36 37 38 39 40 41 42 " 43 " " " " " 44 45 46 47 48 See footnotes at end of table. 0.8 V 0.8 V 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 2.0 V 2.0 V 2.0 V 2.0 V 20 mA " " " " " " " " " " -18 mA " " " " " " " " " " " -18 mA -18 mA 2.7 V 2.7 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 4.5 V " " " " " " " " " " " -18 mA 7.0 V 0.0 V 0.0 V 4.5 V 4.5 V 7.0 V 7.0 V 7.0 V 7.0 V Zb E b GND 0.8 V 2.0 V 2.0 V -18 mA 4.5 V " " " GND " " " " " " " -18 mA 20 21 22 23 24 25 26 27 28 29 30 IIH1 0.8 V 0.8 V 2.0 V 2.0 V Za -1 mA VCC 4.5 V 0.8 V 2.0 V 0.8 V 2.0 V -1 mA " " " " 20 mA 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V " " " 2.0 V 2.0 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V " " " " 2.0 V 0.8 V " " 2.0 V 0.8 V 2.0 V 0.8 V 0.8 V 2.0 V 0.8 V 2.0 V " " " -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA " " " " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " 2.7 V 2.7 V 2.7 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 2.7 V 4.5 V " " " 2.7 V " " " " " " " " " " " " 0.0 V 4.5 V 0.0 V 4.5 V Limits Min Za " " " Zb " " " " " Za " " " Zb " " " E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 E b E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 E b E a S1 I3a I2a I1a I0a Unit Max 2.5 V " " " " " " " " " " " " " 0.5 " " " " " " " " " " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " " " " " " " " 20 A " " " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " MIL-M38510/339E 50 3006 Measured terminal TABLE III. Group A inspection for device type 09 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a I0b I1b I2b I3b Test no. 1 Tc = 25C IIH2 IIL1 49 50 51 52 53 54 3009 55 " " " " " " " " " " " 56 57 58 59 60 61 62 63 64 65 66 3011 67 3011 68 IOD 69 Ea Za 4.5 V 4.5 V 0.0 V 0.0 V 0.0 V " " " 0.0 V 0.5 V 0.5 V 0.5 V 0.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 70 5.5 V 2.5 V 0.0 V Fig. 3 92 " 2.7 V " 93 " 0.0 V " 94 " 0.0 V See footnotes at end of table. IN IN 7.0 V 7.0 V E b 4.5 V " " " 7.0 V VCC 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V " 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.5 V 0.0 V " " " " 0.5 V 0.0 V 0.0 V 0.0 V 0.0 V " " IN 7.0 V S0 4.5 V 0.0 V 4.5 V 0.0 V 7.0 V " " 0.0 V 7.0 V " ICCH 3005 71 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " ICCL 3005 72 0.0 V 0.0 V 4.5 V 4.5 V 4.5 V 4.5 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 73 A A A A A A H GND " 74 B B " " A B H " Tc = 25C tional test " 75 " " " " A A L " 3/ " 76 " " " " B " H " " 77 " " " " A " L " " 78 " A " B " " H " " 79 " " " A " " L " " 80 " " B A " " H " " 81 " " A A " " L " " 82 A B B B B B H " " 83 B " " " " B H " " 84 " " " " " A L " " 85 " " " " " B H " " 86 " " " " A " L " " 87 " A " " B " H " " 88 " " " A " " L " " 89 " " " B " " H " " 90 " " A B " " L " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. 9 tPLH2 3003 91 0.0 V 2.7 V IN OUT GND TC = 25C Zb GND " " " " " 0.5 V 0.5 V 4.5 V 4.5 V 0.0 V " " " 4.5 V 4.5 V GND " 0.0 V 0.0 V 2.5 V H H L H L H L H L H H L H L H L H L 5.5 V " 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 5.5 V 5.5 V A B A " " " " " " B B A B B " " " " A A A B A " " " " B " " " A B " " " A " " " " B A A A B " " " " " A B B A " " " " " " B A B " " " " " " " A A B B A A B B A A B B B A A B B A A A B " " " " " " " A B " " " " " " " 4/ " " " " " " " " " " " " " " " " " 2.7 V 5.0 V " " 0.0 V " " " 2.7 V " " " 0.0 V " Limits Min A " " " " " 2/ 2/ m " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " -60 -150 " -60 -150 E b E b Za Zb Za Zb VCC VCC Max 100 " " " " " I0b I1b I2b I3b S0 E a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 Unit 60 " " 60 " 14 20 " " 2.0 7.0 ns " " " " " " " " " All outputs I3a to Z a I2a to Z a I1a to Z a I0a to Z a MIL-M-38510/339E 51 IOS 3010 " " " " " Measured terminal TABLE III. Group A inspection for device type 09 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a I0b I1b I2b I3b E b 0.0 V VCC Min Max 0.0 V 5.0 V 2.0 7.0 2.7 V " " " " " 0.0 V " " " " " 2.7 V " " Test no. 9 tPLH2 TC = 25C tPHL2 tPHL4 tPLH6 tPHL6 95 0.0 V " Zb OUT Fig. 4 96 0.0 V " " " 97 2.7 V " " " 98 " " " 99 0.0 V 2.7 V " 100 " 2.7 V " 101 " 0.0 V " 102 " " " 103 " " OUT " 104 " " " " 105 2.7 V " " " " " 106 " 107 " 108 " 109 " 110 " 111 " 112 " 113 " 114 " 115 " 116 " 117 " 118 Za 2.7 V IN IN IN IN 2.7 V 2.7 V 0.0 V IN " " " 0.0 V " " " 2.7 V " " " 0.0 V " OUT 2.7 V OUT IN 0.0 V 2.7 V 0.0 V OUT 0.0 V 0.0 V IN IN 0.0 V 0.0 V OUT 2.7 V OUT IN IN " OUT " 10 11 Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH2 = 2.0 to 9.0 ns tPHL2 = 1.5 to 7.5 ns tPLH4 = 3.5 to 14.5 ns tPHL4 = 3.5 to 15.0 ns tPLH6 = 3.5 to 17.0 ns tPHL6 = 3.5 to 13.0 ns Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: Test IIL Min/Max limits in mA for circuit A B C -.25/-.60 -.03/-.60 -.03/-.60 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. IN OUT 0.0 V 0.0 V " 2.7 V " " 0.0 V " " 2.7 V " " 2.7 V IN " 0.0 V 2.7 V OUT 2.7 V 0.0 V 2.7 V OUT 0.0 V 2.7 V IN 0.0 V 0.0 V 2.7 V 0.0 V 0.0 V 2.7 V " " 0.0 V 2.7 V " " " IN " OUT " " 0.0 V OUT " " 0.0 V OUT " " IN " " 0.0 V IN " " 2.7 V IN " " " IN " " 2.7 V IN " " 0.0 V IN 2.7 V " 0.0 V IN " 2.7 V 0.0 V IN S0 OUT 2.7 V 0.0 V IN " " IN " I0b to Z b I1b to Z b I2b to Z b I3b to Z b I3a to Z a I2a to Z a I1a to Z a I0a to Z a I0b to Z b I1b to Z b I2b to Z b I3b to Z b S0 to Z a S0 to Z b S1 to Z a S1 to Z b S0 to Z a S0 to Z b S1 to Z a S1 to Z b E a to Z a E b to Z b E a to Z a E b to Z b Limits Unit ns " " " 1.7 6.0 " " " " " " " " " " " " " " " " " " " " " " 3.5 13.0 " " " " " " " " " " " " " " " " " " " " " " 3.5 14.0 " 3.5 14.0 " 3.0 11.0 " 3.0 11.0 " MIL-M-38510/339E 52 tPLH4 Ea GND 3003 Measured terminal TABLE III. Group A inspection for device type 10. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 OE a 0.8 V S1 I3a I2a I1a I0b I1b I2b I3b 0.8 V Test no. 1 VOH Tc = 25C VOL 1 " " " " 2 3 4 5 " " " 3007 6 7 8 9 " " " " 10 11 12 13 " " " 14 15 16 17 VI C " " " 0.8 V " " " 53 IIH2 3010 29 " " " " " " " " " " " 30 31 32 33 34 35 36 37 38 39 40 " 41 " " " " " 42 43 44 45 46 See footnotes at end of table. 0.8 V 0.8 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 0.8 V 2.0 V 2.0 V 0.8 V 2.0 V 2.0 V 2.0 V 2.0 V 4.5 V 2.4 V " " " " " " " 2.0 V 0.8 V 2.0 V 0.8 V " " " " " " " " " " " " " " " 0.5 " " " " " " " " " " " " " " " -1.2 " " " " " " " " " " " " " " " " " " " " " " " " " " 20 A " " " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " 20 mA " " " " " " " " " " " " -18 mA " " " " " " " " " " " -18 mA -18 mA -18 mA 2.7 V 2.7 V 0.0 V 0.0 V 4.5 V " " " 0.0 V 0.0 V 2.7 V 2.7 V 2.7 V 2.7 V 7.0 V 4.5 V " " " Min 0.8 V 0.8 V 2.0 V 2.0 V -18 mA 4.5 V " " " VCC GND Za GND 7.0 V 0.0 V 0.0 V 4.5 V 4.5 V 7.0 V 7.0 V 7.0 V 7.0 V Zb -3 mA 0.8 V " " " 20 mA 0.8 V 0.8 V 0.8 V 2.0 V " " " 2.0 V 2.0 V 2.0 V S0 Unit -3 mA " " " -18 mA 18 19 20 21 22 23 24 25 26 27 28 IIH1 0.8 V 2.0 V 2.0 V 0.8 V I0a 0.8 V Limits 2.0 V 0.8 V 2.0 V 0.8 V OE b 0.8 V " " " 2.0 V 0.8 V 2.0 V 0.8 V 0.8 V 2.0 V 0.8 V 2.0 V " " " -18 mA -18 mA -18 mA -18 mA -18 mA -18 mA " " " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " 2.7 V 2.7 V 2.7 V 2.7 V 0.0 V 4.5 V 0.0 V 4.5 V 4.5 V 0.0 V 4.5 V 0.0 V 2.7 V 4.5 V " " " 2.7 V " " " " " " " " " " " " 0.0 V 4.5 V 0.0 V 4.5 V Za " " " Zb " " " Za " " " Zb " " " OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 OE b OE a S1 I3a I2a I1a I0a Max MIL-M-38510/339E 3006 Measured terminal TABLE III. Group A inspection for device type 10 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 S1 I3a I2a I1a I0a I0b I1b I2b I3b Test no. 1 Tc = 25C IIH2 IIL 54 IOZH 3010 " " " " " 47 48 49 50 51 52 3009 53 " " " " " " " " " " " 54 55 56 57 58 59 60 61 62 63 64 65 OE a 0.0 V " " " 2.0 V 67 69 2.0 V 72 " 0.0 V 0.0 V 0.5 V 0.5 V 2.0 V 2.7 V 0.8 V 0.5 V 0.0 V 0.0 V 5.5 V 2.5 V 0.0 V 7.0 V 7.0 V OE b 4.5 V " " " 7.0 V VCC 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " 0.5 V 0.5 V 0.5 V 0.5 V 2.7 V 2.0 V " " 2.0 V " 0.5 V 0.8 V " " 0.0 V 0.0 V " 2.0 V H L H L H L H L H L H L H L H L 5.5 V " " 0.0 V " 2.5 V " " " " " 0.0 V " " " 0.0 V " " 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 4.5 V 0.0 V 4.5 V 0.5 V 0.5 V " ICCH 73 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " ICCL 74 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 4.5 V " ICCZ 75 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V " 2 Same tests, terminal conditions, and limits as subgroup 1, except TC = +125C and VI C tests are omitted. 3 Same tests, terminal conditions, and limits as subgroup 1, except TC = -55C and VI C tests are omitted. 7 Func3014 76 B B B B B B H GND " 77 " " " " B A L " Tc = 25C tional test " 78 " " " " B B H " 3/ " 79 " " " " A " L " " 80 " A " " B " H " " 81 " " " A " " L " " 82 " " " B " " H " " 83 " " A B " " L " " 84 " B " A A " H " " 85 " " " " A A L " " 86 " " " " B " H " " 87 " " " " A " L " " 88 " A " B " " H " " 89 " " " A " " L " " 90 " " B A " " H " " 91 " " A A " " L " 8 Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125C and TC = -55C. See footnotes at end of table. 7.0 V S0 4.5 V 0.0 V 4.5 V 0.0 V 7.0 V " " 0.0 V 7.0 V " " 0.0 V 0.0 V Zb " 4.5 V " 0.0 V 4.5 V 0.0 V 4.5 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 0.0 V 4.5 V 5.5 V " " B A B " " " " " " A " " " " " " B B B A B " " " A A B A " " " " B " " " " A B B A " " " B A A A B " " " " " " A B " " " " " B A B B A A B B A A B B A A B B A A B " " " " " " " " " " " " " " " 4/ " " " " " " " " " " " " " " " Limits Min A " " " " " 2/ 2/ mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 50 A OE b OE b Za Zb Za Zb Za Zb VCC VCC VCC All outputs 50 " -50 " -50 " -60 -150 " -60 -150 Zb Za Max 100 " " " " " I0b I1b I2b I3b S0 OE a S1 I3a I2a I1a I0a I0b I1b I2b I3b S0 Unit 35 " " 35 " 14 20 23 " " " MIL-M-38510/339E 71 0.5 V " 70 IOD 0.0 V 0.5 V " 68 IOS 0.5 V 4.5 V 4.5 V 0.0 V " " " 4.5 V 4.5 V GND GND " " " " " 0.5 V 66 IOZL Za 4.5 V 4.5 V 0.0 V 0.0 V Measured terminal TABLE III. Group A inspection for device type 10 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Subgroup Symbol Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD883 method Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 I2a I1a I0a I0b I1b I2b I3b Test no. 9 tPLH2 TC = 25C tPHL2 55 tPHL4 tPLZ6 tPHZ6 2.7 V IN Fig. 4 93 " 2.7 V " 94 " 0.0 V " 95 " " " 96 IN IN IN VCC Min Max 2.7 V 5.0 V 1.5 7.0 " " 0.0 V " " " " " " 2.7 V " " " " " " 0.0 V " Zb " " OUT " 97 " " " " 98 2.7 V " " " 99 2.7 V " " " 100 0.0 V 2.7 V " 101 " 2.7 V " 102 " 0.0 V " 103 " " " 104 " " IN IN IN IN " " " 0.0 V " " 107 2.7 V " " " 108 " 109 " 110 " 111 " 112 " 113 " 114 " 115 " 116 " 117 " 118 " 119 See footnotes at end of table. OUT 2.7 V OUT OUT 0.0 V OUT 0.0 V IN IN IN 0.0 V OUT " IN " " OUT OUT 0.0 V 0.0 V " 2.7 V " " 0.0 V " " 2.7 V " " 2.7 V IN " 0.0 V 2.7 V OUT 2.7 V 0.0 V 2.7 V OUT 0.0 V 2.7 V IN 0.0 V 0.0 V 2.7 V " 0.0 V 2.7 V " 0.0 V 0.0 V " " " IN " OUT " " " OUT " " 0.0 V OUT " " IN " " 0.0 V IN " " 0.0 V IN " " 2.7 V IN " " 2.7 V IN " " 0.0 V IN " " IN 0.0 V " 2.7 V " 2.7 V " " " 0.0 V 2.7 V " " 0.0 V " " " 2.7 V " " 0.0 V " 0.0 V " 0.0 V " 2.7 V IN 2.7 V " 106 0.0 V " " 105 0.0 V IN 0.0 V 2.7 V OUT 2.7 V IN 0.0 V " " 2.7 V IN OE b OUT " 0.0 V IN S0 Unit GND Za OUT GND Limits " " IN " I3a to Z a I2a to Z a I1a to Z a I0a to Z a I0b to Z b I1b to Z b I2b to Z b I3b to Z b I3a to Z a I2a to Z a I1a to Z a I0a to Z a I0b to Z b I1b to Z b I2b to Z b I3b to Z b S0 to Z a S0 to Z b S1 to Z a S1 to Z b S0 to Z a S0 to Z b S1 to Z a S1 to Z b OE a to Z a OE b to Z b OE a to Z a OE b to Z b ns " " " " " " " " " " " " " " " " 6.0 " " " " " " " " " " " " " " " " " " " " " " 4.0 14.0 " " " " " " " " " " " 11.0 " " " " " " " " " " 2.0 6.0 " " " " " " " " " " MIL-M-38510/339E tPLH4 I3a 92 OE a 0.0 V S1 3003 Measured terminal TABLE III. Group A inspection for device type 10 - Continued. Terminal conditions (pins not designated may be high 2.0 V; low 0.8 V; or open). Cases E, F 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 MIL-STD- Case 2 1/ 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 OE a IN S1 I3a I2a I1a Za OUT I0b I1b I2b I3b 0.0 V GND Subgroup Symbol 883 method 9 tPZL6 3003 120 Fig. 4 121 " 122 " 123 Test no. TC = 25C tPZH6 I0a 2.7 V " IN " GND " 0.0 V OUT " Zb OUT 2.7 V " " S0 OE b 0.0 V " IN " OUT 0.0 V " Limits Unit VCC Min Max 5.0 V 3.0 11.0 ns 3.0 11.0 " 3.0 8.0 " 3.0 8.0 " " " IN Measured terminal " OE a to Z a OE b to Z b OE a to Z a OE b to Z b 10 Same tests and terminal conditions as subgroup 9, except TC = +125C and for the following limits. tPLH2 = 1.5 to 9.0 ns tPHL2 = 1.5 to 7.5 ns tPLZ6 = 2.0 to 8.5 ns tPLH4 = 4.0 to 16.0 ns tPHL4 = 4.0 to 14.0 ns tPHZ6 = 2.0 to 6.5 ns 11 tPZL6 = 3.5 to 15.5 ns tPZH6 = 3.0 to 11.0 ns Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 1/ For case 2 pins not referenced are N/C. 2/ IIL limits shall be as follows: 56 Test IIL Min/Max limits in mA for circuit A B C -.25/-.60 -.03/-.60 -.03/-.60 MIL-M-38510/339E 3/ A = 2.5 V, B = 0.5 V. H 1.5 V, L 1.5 V. 4/ Perform function sequence at VCC = 4.5 V and repeat at VCC = 5.5 V. MIL-M-38510/339E 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When actual packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective action, and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. j. Packaging requirements (see 5.1). 6.3 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 6.4 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DLA Land and Maritime-VQ, P.O. Box, Columbus, Ohio 43218-3990. 57 MIL-M-38510/339E 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ............................................ Ground zero voltage potential IIN ................................................. Current flowing into an input terminal VIN ............................................... Voltage level at an input terminal 6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer length leads and lead forming should not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type Generic-industry type 01 02 03 04 05 06 07 08 09 10 54F151A 54F153 54F157A 54F158A 54F251A 54F257A 54F258A 54F253 54F352 54F353 6.8 Manufacturers' designation. Manufacturers' circuits which form a part of this specification are designated with an "X" as shown in table IV herein. TABLE IV. Manufacturers' designations. Device type 01 02 03 04 05 06 07 08 09 10 A National Semiconductor/ Fairchild Semiconductor X X X X X X X X Circuits B Motorola Inc. X X C Signetics Corp. D Texas Instruments X X X X X X X 58 X MIL-M-38510/339E 6.9 Changes from previous issue. Asterisks are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. CONCLUDING MATERIAL Custodians: Army - CR Navy - EC Air Force - 85 DLA - CC Preparing activity: DLA Land and Maritime- CC (Project 5962-2011-001) Review activities: Army - MI, SM Navy - AS, CG, MC, SH, TD Air Force - 03, 19, 99 NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at https://assist.daps.dla.mil. 59