INCH-POUND MIL-M-38510/2G 8 February 2005 SUPERSEDING MIL-M-38510/2E 24 December 1974 MIL-M-0038510/2F (USAF) 24 OCTOBER 1975 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, TTL, FLIP-FLOPS, MONOLITHIC SILICON Inactive for new design after 7 September 1995 This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic silicon, TTL, bistable logic microcircuits. Three product assurance classes and a choice of case outlines/lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type 01 02 03 04 05 06 07 Circuit Single J-K master-slave flip-flop Dual J-K master-slave flip-flop, no preset Dual J-K master-slave flip-flop, no preset Dual J-K master-slave flip-flop Dual D-type edge-triggered flip-flop Single edge-triggered J-K flip-flop Dual D-type edge-triggered flip-flop, buffered output 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http://assist.daps.dla.mil AMSC N/A FSC 5962 MIL-M-38510/2G 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter A B C D E F Descriptive designator Terminals GDFP5-F14 or CDFP6-F14 GDFP4-F14 GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 14 14 14 14 16 16 Package style Flat pack Flat pack Dual-in-line Flat pack Dual-in-line Flat pack 1.3 Absolute maximum ratings. Supply voltage range ............................................................................. Input voltage range ................................................................................ Storage temperature range .................................................................... Maximum power dissipation, (PD) flip-flop, 1/....................................................................................... Lead temperature (soldering, 10 seconds).............................................. Thermal resistance, junction to case (JC):.............................................. -0.5 V dc to +7.0 V dc -1.5 V dc at -12 mA to 5.5 V dc -65 to +150C 110 mW 1/ 300C 0.09C/mW for flat packs 0.08C/mW for dual-in-line pack Junction temperature (TJ)........................................................................ 175C 1.4 Recommended operating conditions. Supply voltage (VCC) .............................................................................. 4.5 V dc minimum to 5.5 V dc maximum Minimum high-level input voltage (VIH) ................................................... 2.0 V dc Maximum low-level input voltage (VIL) .................................................... 0.8 V dc Normalized fanout (each output) 2/ ....................................................... 10 maximum Case operating temperature range (TC) .................................................. -55 C to +125 C Input set up time: Device type 01, 02, 03 and 04, ......................................................... clock pulse width Device type 05, 06, and 07................................................................ 20 ns Input hold time Device types 01, 02, 03 and 04......................................................... 0 ns Device type 05, 06 and 07 ................................................................ 5 ns 2. APPLICABLE DOCUMENTS 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. _______ 1/ Must withstand the added PD due to short circuit condition (e.g. IOS) at one output for 5 seconds duration 2/ Device will fanout in both high and low levels to the specified number of IIL1/IIH1 inputs of the same device type as that being tested. 2 MIL-M-38510/2G 2.2 Government documents. 2.2.1 Specifications and Standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 - Integrated Circuits (Microcircuits) Manufacturing, General Specification for. DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 - Test Method Standard for Microelectronics. Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Terminal connections and logic diagrams. The terminal connections and logic diagrams shall be as specified on figures 1. 3.3.2 Truth tables and logic equations. The truth tables and logic equations shall be as specified on figure 2. 3.3.3 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity (DSCC-VAS) upon request. 3.3.4 Case outlines. The case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. Subgroups 7 and 8 testing requires only a summary of attributes data. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3 MIL-M-38510/2G TABLE I. Electrical performance characteristics. Test Symbol Conditions 9/ High-level output voltage VOH Low-level output voltage Input clamp voltage VOL VIC Low-level input current IIL1 Low-level input current IIL2 VCC = 5.5 V VIN = 0.4 V 2/ Low-level input current IIL3 High-level input current IIH1 High-level input current IIH2 High-level input current IIH3 High-level input current IIH4 High-level input current IIH5 High-level input current IIH6 Short-circuit output current IOS Supply current per device ICC VCC = 5.5 V VIN = 0.4 V 6/ VCC = 5.5 V VIN = 2.4 V 5/ VCC = 5.5 V VIN = 5.5 V 5/ VCC = 5.5 V VIN = 2.4 V 3/ VCC = 5.5 V VIN = 5.5 V 3/ 7/ VCC = 5.5 V VIN = 2.4 V 7/ 8/ VCC = 5.5 V VIN = 5.5 V 8/ VCC = 5.5 V VIN = 0 4/ VCC = 5.5 V VIN = 5 V Maximum clock frequency 10/ fMAX Propagation delay to high logic level (clear or preset to output) tPLH Propagation delay to low logic level (clear or preset to output) tPHL Propagation delay to high logic level (clock to output) tPLH Propagation delay to low logic level (clock to output) tPHL VCC=4.5 V IOH = -400 A VCC = 4.5 V, IOL=16 mA VCC = 4.5 V, IIC = -12 mA TC = 25C VCC = 5.5 V VIN = 0.4 V 1/ VCC = 5 V CL = 50 pF minimum RL = 390 5% Device Type All Limits Min Max 2.4 -- Units 0.4 -1.5 Volts Volts -0.7 -1.6 mA -0.5 -1.4 -1.6 -3.2 mA mA -1.0 -0.7 -3.2 -3.2 mA mA All 40 A All 100 A All 11/ 80 A All 200 A All All 01, 02, 03, 04, 05, 06 07 01, 02, 03, 04, 05 07 01, 02, 03, 04 Volts 01, 02, 03, 04, 05, 07 05, 07 -50 -850 120 300 A A A All -20 -57 mA 20 40 30 mA 01 02, 03, 04 05, 06, 07 01, 02, 03 04, 05, 07 06 01, 02, 03, 04, 05 06 07 01, 02, 03, 04, 05 06 07 06 01, 02, 03, 04, 05 07 06 01, 02, 03, 04, 05 07 10 MHz 15 5 39 ns 5 5 5 62 31 50 ns 5 5 5 5 62 39 62 39 5 5 5 31 62 50 5 39 ns ns 1/ Input condition - J or K for device types 01, 02, 03, 04, 06, and preset or D for device types 05 and 07, and clock, clear or preset for device type 06. 2/ Input condition - Clock for device types 01, 02, 03 and 04, and clear or clock for device types 05 and 07. 3/ Input condition - Clear or preset for device types 01, 02, 03, 04, 05, 06 and 07 and clock for device types 05 and 07. 4/ No more than one output should be shorted at a time. 5/ Input condition - J or K for device types 01, 02, 03, 04, 06, and D for device types 05 and 07, and clock for device type 06. 6/ Input condition - Clear or preset for device types 01, 02, 03 and 04. 7/ Input condition - Clock for device types 01, 02, 03 and 04. 4 MIL-M-38510/2G 8/ Input condition - Clear for device types 05 and 07. 9/ See table III for complete terminal conditions. 10/ Minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. 11/ For device types 02 and 03,limits are 0 to 120 A. TABLE II. Electrical test requirements. Subgroups (see table III) Class S Class B devices devices 1 1 MIL-PRF-38535 test requirements Interim electrical parameters Final electrical test parameters Group A test requirements Group B test when using the method 5005 QCI option Group C end-point electrical parameters Additional electrical subgroups for Group C periodic inspections Group D end-point electrical parameters 1*, 2, 3, 7, 8, 9 1, 2, 3, 7, 8, 9, 10, 11 1, 2, 3, 1*, 2, 3, 7, 9 1, 2, 3, 7 9 N/A 1, 2, 3, 1, 2, 3 N/A 1, 2, 3 10, 11 1, 2, 3 *PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and quality conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD883. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535, appendix B. 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 5 MIL-M-38510/2G 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6 shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End-point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burnin test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MILSTD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. Endpoint electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be specified and as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional and positive when flowing into the referenced terminal. 6 MIL-M-38510/2G FIGURE 1. Logic diagram and terminal connections. 7 MIL-M-38510/2G FIGURE 1. Logic diagram and terminal connections - Continued. 8 MIL-M-38510/2G Device type 01 Truth table tn Positive logic: tn + 1 J K Q L L Qn L H L H L H H H Qn Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset and clear are independent of clock and dominate regardless of the state of clock or J of K inputs. NOTES: 1. J = J1 * J2 * J3 2. K = K1 * K2 * K3 3. tn = Bit time before clock pulse. 4. tn + 1 = Bit time after clock pulse. Device type 02 and 03 Truth table each flip-flop tn Positive logic: tn + 1 J K Q L L Qn L H L H L H H H Qn Low input to clear sets Q to low-level Clear is independent of clock and dominate regardless of the state of clock or J or K inputs. NOTES: 1. tn = Bit time before clock pulse. 2. tn + 1 = Bit time after clock pulse. FIGURE 2. Truth tables. 9 MIL-M-38510/2G Device type 04 Truth table each flip-flop tn Positive logic: tn + 1 J K Q L L Qn L H L H L H H H Qn Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset and clear are independent of clock and dominate regardless of the state of clock or J of K inputs. NOTES: 1. tn = Bit time before clock pulse. 2. tn + 1 = Bit time after clock pulse. Device type 05 and 07 Truth table each flip-flop tn Positive logic: tn + 1 INPUT D OUTPUT Q OUTPUT L L H H H L Q Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset and clear are independent of clock and dominate regardless of the state of clock or D input. NOTES: 1. tn = Bit time before clock pulse. 2. tn + 1 = Bit time after clock pulse. FIGURE 2. Truth tables - Continued. 10 MIL-M-38510/2G Device type 06 Truth table tn Positive logic: tn + 1 J K Q L L Qn L H L H L H H H Qn Low input to preset sets Q to high-level Low input to clear sets Q to low-level Preset or clear function can occur only When clock input is low. NOTES: 1. J = J1 * J2 * J * 2. K = K1 * K2 * K * 3. tn = Bit time before clock pulse. 4. tn + 1 = Bit time after clock pulse. 5. If inputs J* or K* are not used must be grounded. FIGURE 2. Truth tables - Continued. 11 MIL-M-38510/2G FIGURE 3. Schematic circuits. 12 MIL-M-38510/2G FIGURE 3. Schematic circuits - Continued. 13 MIL-M-38510/2G FIGURE 3. Schematic circuits - Continued. 14 MIL-M-38510/2G NOTES: 1. Circuits A, B, and C are the only acceptable variations for device types 02 and 03. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits - Continued. 15 MIL-M-38510/2G FIGURE 3. Schematic circuits - Continued. 16 MIL-M-38510/2G FIGURE 3. Schematic circuits - Continued. 17 MIL-M-38510/2G NOTES: 1. Circuits A, B and C are the only acceptable variation for device type 04. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits - Continued. 18 MIL-M-38510/2G NOTES: 1. Circuits A, B, and C are the only acceptable variations for device type 05. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits - Continued. 19 MIL-M-38510/2G FIGURE 3. Schematic circuits - Continued. 20 MIL-M-38510/2G NOTE: All resistance values shown are nominal. FIGURE 3. Schematic circuits - Continued. 21 MIL-M-38510/2G NOTES: 1. Circuits A and B are the only acceptable variations for device type 07. 2. All resistance values shown are nominal. FIGURE 3. Schematic circuits - Continued. 22 MIL-M-38510/2G NOTES: 1. Clear or preset inputs dominate regardless of the state of clock or J-K inputs. 2. Clear or preset input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) = tp(preset) = 30 ns, PRR = 1 MHz, and ZOUT 50. 3. CL = 50 pF, minimum (CL includes probe and jig capacitance). 4. RL = 390 5%. 5. All diodes are 1N3064, or equivalent. 6. When testing clear to output switching, preset input shall have a negative pulse. When testing preset output switching, clear shall have a negative pulse (see table III). FIGURE 4. Clear and preset switching test circuit and waveforms for device type 01. 23 MIL-M-38510/2G NOTES: 1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock input characteristics are Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 20 ns, and PRR = see table III. 2. J = J1 * J2 * J3; and K = K1 * K2 * K3 3. All diodes are 1N3064, or equivalent. 4. CL = 50 pF minimum (CL includes probe and jig capacitance). 5. RL = 390 5% FIGURE 5. Synchronous switching test circuit for device type 01. 24 MIL-M-38510/2G NOTES: 1. Clear inputs dominate regardless of the state of clock or J-K inputs. 2. Clear input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) = 30 ns, PRR = 1 MHz. 3. All diodes are 1N3064, or equivalent. 4. CL = 50 pF, minimum (CL includes probe and jig capacitance). 5. RL = 390 5%. 6. Clock input pulse characteristics: Vgen = 3 V, tp (clock) 25 ns, PRR = 1 MHz. FIGURE 6. Clear switching test circuit and waveforms for device types 02 and 03. 25 MIL-M-38510/2G NOTES: 1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock input characteristics are Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 20 ns, and PRR = 10 MHz for subgroups 9, 10, and 11. 2. All diodes are 1N3064, or equivalent. 3. CL = 50 pF minimum (including jig and probe capacitance). 4. RL = 390 5% FIGURE 7. Synchronous switching test circuit for device type 02 and 03. 26 MIL-M-38510/2G NOTES: 1. Clear or preset inputs dominate regardless of the state of clock or J-K inputs. 2. Clear or preset input pulse characteristics: Vgen = 3 V, t0 = t1 = 10 ns, tp(clear) = tp(preset) = 30 ns, PRR = 1 MHz, and ZOUT 50. 3. CL = 50 pF, minimum (including jig and probe capacitance). 4. RL = 390 5%. 5. All diodes are 1N3064, or equivalent. 6. When testing clear to output switching, preset input shall have a negative pulse. When testing preset to output switching, clear input shall have a negative pulse (see table III). FIGURE 8. Clear and preset switching test circuit and waveforms for device type 04. 27 MIL-M-38510/2G NOTES: 1. Clock input characteristics for tPLH, tPHL (clock to output), Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 25 ns, and PRR = 1 MHz. All J and K inputs are at 2.4 V. When testing fMAX the clock input characteristics are Vgen = 3 V, t1 = t0 10 ns, tp (clock) = 20 ns, and PRR = see table III. 2. All diodes are 1N3064, or equivalent. 3. CL = 50 pF minimum (including jig and probe capacitance). 4. RL = 390 5% FIGURE 9. Synchronous switching test circuit for device type 04. 28 MIL-M-38510/2G NOTES: 1. Clear and preset inputs dominate regardless of the state of clock or D inputs. 2. All diodes are 1N3064, or equivalent. 3. Clear or preset input pulse characteristics: Vgen = 3 V, to 7 ns, tp (clear) = tp (preset) = 35 ns, and PRR = 1 MHz. 4. CL = 50 pF, minimum (including jig and probe capacitance). 5. RL = 390 5%. 6. When testing clear to output switching, preset input shall have a negative pulse. When testing preset to output switching, clear input shall have a negative pulse (see table III). FIGURE 10. Clear and preset switching test circuit and waveforms for device types 05 and 07. 29 MIL-M-38510/2G NOTES: 1. Clock input pulse has the following characteristics: Vgen = 3 V, to = t1 10 ns, tp (clock) = 30 ns, and PRR = 1 MHz. When testing fMAX, PRR = see table III. 2. D input (pulse A ) has the following characteristics: Vgen = 3 V, to = t1 10 ns, tSETUP = 25 ns, tp = 60 ns, and PRR is 50% of the clock PRR. D input (pulse B) has the following characteristics: Vgen = 3 V, to = t1 < 7 ns, thold = 6 ns, tp = 60 ns, and PRR is 50% of the clock PRR. 3. All diodes are 1N3064, or equivalent. 4. CL = 50 pF minimum (including jig and probe capacitance). 5. RL = 390 5% FIGURE 11. Synchronous switching test circuit (high level data) for device types 05 and 07. 30 MIL-M-38510/2G FIGURE 12. Synchronous switching test circuit (low-level data) for device types 05 and 07. 31 MIL-M-38510/2G NOTES: 1. Clock input pulse has the following characteristics: Vgen = 3 V, to = t1 < 10 ns, tp (clock) = 30 ns, and PRR = 1 MHz. 2. D input (pulse A ) has the following characteristics: Vgen = 3 V, to = t1 10 ns, tSETUP = 25 ns, tp = 60 ns, and PRR is 50% of the clock PRR. D input (pulse B) has the following characteristics: Vgen = 3 V, to = t1 < 10 ns, thold = 6 ns, tp = 60 ns, and PRR is 50% of the clock PRR. 3. All diodes are 1N3064, or equivalent. 4. CL = 50 pF minimum (including jig and probe capacitance). 5. RL = 390 5% FIGURE 12. Synchronous switching test circuit (low-level data) for device types 05 and 07 - Continued. 32 MIL-M-38510/2G NOTES: 1. Preset or clear function can occur only when clock input is low. Gated inputs are inhibited. 2. All diodes are 1N3064, or equivalent. 3. CL = 50 pF, minimum, including jig and probe capacitance. 4. Clear or preset input pulse characteristics: Vgen = 3.0 V, to = 5 ns, t1 10 ns, tp = 25 ns. 5. RL = 390 5%. FIGURE 13. Clear and preset switching test circuit and waveforms for device types 06. 33 MIL-M-38510/2G NOTES: 1. Clock input pulse has the following characteristics: Vgen = 3 V, t1 = t0 10 ns, tp = 30 ns, and PRR = 1 MHz. When testing fMAX, PRR = see table III. 2. All diodes are 1N3064, or equivalent. 3. CL = 50 pF minimum including jig and probe capacitance. 4. RL = 390 5% FIGURE 14. Synchronous switching test circuit for device type 06. 34 MIL-M-38510/2G NOTES: 1. Apply normal clock pulse, then sink -12 mA on the clock input. 2. The output Q is measured after -12 mA is applied to the clock to insure it is still in the low state. FIGURE 15. Input clamp voltage test circuit for device types 01, 02, 03, and 04 (circuit B). 35 TABLE III. Group A inspection for device type 01. 1/ Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 1 9 K1 2 12 Clock 0.8 V 2.0 V A A 3 13 Preset 4 14 VCC 5 2 Clear VOH " 3006 " 1 2 " " " " " " 3 4 " " VOL " 3007 " 5 6 " " " 7 0.8 V " 2.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " " " " " IIL1 " " " " " IIL2 IIL2 IIL3 " " " IIH1 " " " " " IIH2 " " " " " IIH3 IIH3 IIH4 " " " " " " " " " " " " " " 3009 " " " " " " " " " " " 3010 " " " " " " " " " " " " " " " " " 8 9 10 11 12 13 14 15 16 17 17 CKT B 18 19 20 21 22 23 24 25 26 CKT A 26 CKT B 27 CKT A 27 CKT B 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 2.0 V " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 0.8 V See notes at end of device type 01. 4.5 V " 0.8 V 2.0 V 2.0 V 0.8 V A A -12 mA 2.4 V GND GND 5.5 V GND GND 4.5 V GND GND 4.5 V GND GND -12 mA A* 4.5 V " " " " " 0.4 V 0.4 V 4.5 V " " " GND " " " " " " " " " " " A A A A 5.5 V 5.5 V B B B B 0.4 V 0.4 V GND GND GND GND GND GND 2.4 V 5.5 V GND 8 4 J2 9 5 J3 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V " " -12 mA 0.8 V GND " " 0.4 V 4.5 V 4.5 V 4.5 V " " " " " " " 7 3 J1 0.8 V 2.0 V 0.8 V 2.0 V 0.8 V 2.0 V -12 mA -12 mA -12 mA -12 mA 4.5 V B B B B 0.4 V 0.4 V GND GND GND GND GND GND 2.4 V GND GND 5.5 V GND 4.5 V 0.4 V 4.5 V 4.5 V GND GND GND 4.5 V " " " " " 2.4 V GND GND 5.5 V GND GND GND 4.5 V 4.5 V GND GND GND 4.5 V 4.5 V 0.4 V 4.5 V GND GND GND 4.5 V " " " " " GND 2.4 V GND GND 5.5 V GND GND 4.5 V 4.5 V GND GND GND 4.5 V 4.5 V 4.5 V 0.4 V GND GND GND 4.5 V " " " " " GND GND 2.4 V GND GND 5.5 V GND 4.5 V 4.5 V GND GND GND 10 6 11 7 GND 12 8 Q 13 10 K2 14 11 K3 -.4 mA -.4 mA " " 0.8 V 2.0 V 0.8 V 2.0 V " " -.4 mA -.4 mA " " 16 mA 16 mA 16 mA " Q " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Test limits Meas. terminal Q Q Q Q 2.0 V 0.8 V 2.0 V 0.8 V Min " " " " Q 0.4 " Q -12 mA -12 mA 0.8 V GND GND GND 4.5 V 0.4 V 4.5 V 4.5 V " " " " " 0.8 V GND GND GND 4.5 V 4.5 V 0.4 V 4.5 V " " " " " GND 2.4 V GND GND GND 2.4 V GND 5.5 V GND 4.5 V GND GND 4.5 V GND GND GND GND 5.5 V 4.5 V GND GND 4.5 V GND GND Q J1 J2 J3 K1 K2 K3 Clear Preset Clock Clock J1 J2 J3 K1 K2 K3 Clock Clock Preset Preset Clear Clear J1 J2 J3 K1 K2 K3 J1 J2 J3 K1 K2 K3 Clear Preset Preset Clear Clock Clock Unit V " Q 16 mA Max 2.4 " -0.7 " " " " " -1.4 -1.4 -0.7 -1.4 -0.7 -1.4 " " " " " -1.5 " " " " " " " " 0.5 -1.6 " " " " " -3.2 -3.2 -1.6 -3.2 -1.6 -3.2 40 " " " " " 100 " " " " " 80 80 200 " " " " " " " " " " " " " " mA " " " " " mA " " " " " A " " " " " " " " " " " " " " " " " MIL-M-38510/2G 36 1 2/ TC = 25C 6 1 NC TABLE III. Group A inspection for device type 01. 1/ - Continued. Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 1 9 K1 2 12 Clock 1 TC = 25C " " " " " " IIH5 " " " " " IOS IOS 3010 " " " " " 3011 3011 46 CKT A 46 CKT B 46 CKT C 47 CKT A 47 CKT B 47 CKT C 48 49 GND " " " " " 4.5 V 4.5 V 2.4 V " " " " " GND " " " ICC ICC 3005 3005 50 51 GND GND " " 3 13 Preset GND GND GND GND GND 4 14 VCC 5 2 Clear 5.5 V " " " " " 5.5 V " GND GND GND " " 6 1 NC 9 5 J3 GND GND " " " " " 4.5 V 4.5 V GND " " " " " 4.5 V 4.5 V GND " " " " " 4.5 V 4.5 V GND GND GND GND GND GND GND B B B B B B B B B B B B B B B A A A A A A A A A A A A A A A A A A A A B B A B B B B B B B B B B B B B A A A B B B A A A A A A A A A A A A A A A A A A A A A B B B B B B B B B B B B A A A A A A B B B A A A A A A A A A A A A A A A A A A Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " See notes at end of device type 01. 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 B B B B B A A A A A A A B B B B B B B B B A A A A A A A A A A A A A B B B A A B B B A B B A B B A B B B A B B A B B A B B A B A B B A B B A B A A A A B A A A B A A A A A A A A A A A A A A A A A A A A A A A A A A A B B B B A A A A A A 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " B A A A A A A A A A A B A A A A A A A A A A A A A A B B B B B B A A A A A A A B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B 10 6 Q GND H 3/ L L L L L L L L L L H H H H H H H H H H H H L L H H H H H H H L L L L H H H 11 7 GND 13 10 K2 14 11 K3 GND " " " " " " " GND " " " " " 4.5 V 4.5 V GND " " " " " 4.5 V 4.5 V " " GND GND GND GND Q VCC VCC B B A A A B B B A A A A B B B B B B B B B A A A A A A A A A A A A A A A A A A B B A A A A A A B B B B B B B B B B B B B A A A A A A A A A A A A A A A A A A All output " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 12 8 Q L 3/ H H H H H H H H H H L L L L L L L L L L L L H H L L L L H H H H H H H L L L Test limits Meas. terminal Clock " " " " " Q Min Max Unit -50 -200 -400 -50 -200 -400 -20 -20 -700 -850 -1000 -700 -850 -1000 -57 -57 A " " " " " mA " 20 20 " " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/2G 8 4 J2 2 7 2/ 4 TC = 25C 37 7 3 J1 TABLE III. Group A inspection for device type 01. 1/ - Continued. Subgroup Symbol MILSTD-883 method 7 2/ 4/ TC = 25C 8 2/ 4/ Case A, B, D Case C Test No. 1 9 K1 2 12 Clock 3 13 Preset 4 14 VCC 5 2 Clear 6 1 NC 7 3 J1 8 4 J2 9 5 J3 91 92 B B A B A A 4.5 V 4.5 V A A B B B B A A A A 10 6 Q H L 11 7 GND 12 8 Q 13 10 K2 14 11 K3 Meas. terminal Test limits GND GND L H A A A A All output GND " OUT OUT 2.4 V " 2.4 V " " " " " " " " " " " " " " " " " " " " " " " OUT " " OUT " " Min Max Unit H or L As shown 3/ Same tests, terminal conditions and limits as for subgroup 7, except TC = 125 and -55C. 9 TC = 25C FMAX 5/ FMAX 5/ (Fig. 5) (Fig. 5) 93 94 2.4 V " IN IN 5.0 V 5.0 V 5.0 V " 5.0 V 5.0 V 2.4 V " 2.4 V " 2.4 V " " " tPLH1 tPLH1 3003 (Fig. 4) 95 96 " " 2.4 V " J IN " " IN J " " " " " " " " tPHL1 tPHL1 " " 97 98 " " " " J IN " " IN J " " " " " " OUT " " " tPLH2 99 " IN 5.0 V " 5.0 V " " " OUT " " " tPLH2 tPHL2 3003 (Fig 5 " " 100 101 " " " " " " " " " " " " " " " " OUT OUT " " " 10 TC = 125C tPHL2 FMAX 5/ FMAX 5/ " (Fig 5) (Fig 5) 102 103 104 " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT " " " " tPLH1 105 " 2.4 V J " IN " " " OUT " " tPLH1 3003 (Fig. 4) " 106 " " IN " J " " " " " tPHL1 tPHL1 " " 107 108 " " " " J IN " " IN J " " " " " " OUT " " " " tPLH2 (Fig 5) 109 " IN 5.0 V " 5.0 V " " " OUT " " " " " tPLH2 tPHL2 " " 110 111 " " " " " " " " " " " " " " " " OUT OUT " " " " " " tPHL2 " 112 " " " " " " " OUT " " OUT " " OUT OUT Q Q Clear to Q Preset to Q Clear to Q Preset 10 10 MHz MHz 5 " 25 25 ns " " " 40 40 " " " 30 ns " " 30 40 " " 40 " MHz MHz 5 39 ns " 39 " " " 50 50 " " " 39 ns " " 39 50 " " " 50 " to Q Clock to Q Clock to Q Clock to Q Q Q Clear to Q Preset to Q Clear to Q Preset 10 10 38 to Q " 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. J = Input pulse tp = 100 ns, PRR = 1 MHz, VOL = 0 V, VOH = 4.5 V *After clock pulse apply -12 mA to clock pin to insure Q is still in the low state (see figure 15). 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). 2/ Input voltages shown are: A= 2.0 volts minimum and B = 0.8 volts maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double camparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. " Clock to Q Clock to Q Clock to Q Clock to Q MIL-M-38510/2G " Clock to Q TABLE III. Group A inspection for device type 02. 1/ Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 1 1 Clock 1 A A 1 TC = 25C VOH " 3006 " 1 2 " " " 3 " " " " " " 4 5 " " 6 " " VOL " 3007 " 7 8 " " " " " " " " " 9 10 11 " " " " " " " VIC " " " " " 12 13 14 15 16 17 18 18 CKT B 19 20 20 CKT B 21 22 23 24 25 26 27 CKT A, C 27 CKT B 28 CKT A, C 28 CKT B 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 CKT A, C 43 CKT B 44 CKT A, C 44 CKT B " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " IIL1 " " " IIL2 IIL2 IIL3 " " " IIH1 " " " IIH2 " " " IIH3 7/ IIH3 7/ IIH4 " " " IIH5 " " " 3009 " " " " " " " " " 3010 " " " " " " " " " " " " " " " " " See notes at end of device type 02. 3 3 K1 4 4 VCC 0.8 V 2.0 V 4.5 V " 0.8 V 5 5 Clock 2 2.0 V 0.8 V 0.8 V -12 mA 5/ 5/ 0.4 V 4.5 V 4.5 V GND GND GND GND GND 5.5 V GND 2.4 V 2.4 V 4.5 V 4.5 V B 0.8 V 0.4 V 4.5 V 0.4 V 0.4 V GND B GND B 2.4 V 5.5 V E 5.5 V E E 2.4 V Q 9 9 Q2 10 10 K2 GND GND GND " " " " " " " " " " " 5.5 V " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " 11 11 GND 12 12 Q1 GND " -.4 mA 2 2.0 V 0.8 V 0.8 V -.4 mA -.4 mA 0.8 V 2.0 V -.4 mA A A 0.8 V 2.0 V 0.8 V 16 mA 16 mA 2.0 V 0.8 V 16 mA -12 mA -12 mA -12 mA -12 mA A* 4.5 V 4.5 V 5/ 5/ 4.5 V 4.5 V 0.4 V 0.4 V B 4.5 V 4.5 V 4.5 V 0.4 V 0.4 V 4.5 V 4.5 V GND B 2.4 V GND GND GND B 5.5 V GND E GND 5.5 V GND 5.5 V F GND GND 2.4 V 2.4 V E 2.4 V 0.8 V 0.4 V GND GND 4.5 V 2.4 V 5.5 V GND GND 13 13 Q 1 -.4 mA 14 14 J1 2.0 V 0.8 V -.4 mA GND GND GND Q Q 1 Q 2 " " 16 mA " " " 16 mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Test limits Meas. terminal Q 1 Q2 " " " " " " " " -12 mA 4.5 V 8 8 " A A " -12 mA A* 7 7 J2 " " " A A 6 6 Clear 2 16 mA 0.8 V 2.0 V -12 mA 4.5 V 0.4 V 4.5 V 4.5 V 4.5 V 2.4 V 5.5 V GND GND GND GND GND Q 2 Q1 Min Unit V " " " " " " " " Q 1 Q1 Q2 Q 2 Q2 J1 J2 K1 K2 Clear 1 Clock 1 Clock 1 Clear 2 Clock 2 Clock 2 J1 K1 J2 K2 Clock 1 Clock 2 Clear 1 Clear 1 Clear 2 Clear 2 J1 K1 J2 K2 J1 K1 J2 K2 Clear 1 Clear 2 Clock 1 Clear 1 Clock 2 Clear 2 Clock 1 Clock 1 Clock 2 Clock 2 Max 2.4 " -0.7 " " " -1.4 -1.4 -0.7 -1.4 -0.7 -1.4 -50 -200 -50 -200 " 0.4 " " " " " " " " " " -1.5 " " " " " -0.5 -1.5 -1.5 -0.5 -1.6 " " " -3.2 -3.2 -1.6 -3.2 -1.6 -3.2 40 " " " 100 " " " 80 80 200 " " " -700 -850 -700 -850 " " " " " " " " " mA " " " " " " " " " A " " " " " " " " " " " " " " " " " MIL-M-38510/2G 39 " 2 2 Clear 1 TABLE III. Group A inspection for device type 02. 1/ - Continued. Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 1 1 Clock 1 2 2 Clear 1 3 3 K1 4 4 VCC 5 5 Clock 2 6 6 Clear 2 7 7 J2 1 TC = 25C " " " IOS 3011 45 2.4 V GND 2.4 V 5.5 V " " " 3011** 3011** 3011 46 47 48 A 4.5 V 0 " " " GND 2.4 V 4.5 V GND 4.5 V 2.4 V " ICC 3005 49 D " D 4.5 V 4.5 V 4.5 V GND Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 8 2/ 4/ B A B B A B B A B A B A B B A B B B A B B A B B A B A A A A B A A A B A B A A B B B B B B A A A A A A A A A A B A A A A A A A A A B A A A A A A A A A A A B B B B A A A A A A A A A A B B B B B B B B B B A A A A A A B B A B B B B B B B 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. See notes at end of device type 02. 10 10 K2 11 11 GND 12 12 Q1 2 B A B B A B B A B A B A B B A B B B A B B A B B A B A A A A B A A A B A B A A B B B B B B A A A A A A A A A A B A A A A A A A A A B A A A A A A A A A A A B A A A A A A A A A A A A A B B B B B B B A A A B B B A A B B B A A B B A A A A GND GND H 3/ H H H H H H H L L H H L L L L H H H H H H L L L H H H H H L L L L H H L L H L 3/ L L L L L L L H H L L H H H H L L L L L L H H H L L L L L H H H H L L H H L 0V 2.4 V " " " GND " B B B A A A A A A A A A A B B B B B B B B B B A A A A A A B B A B B B B B B B GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 13 13 Q 1 GND GND L 3/ L L L L L L L H H L L H H H H L L L L L L H H H L L L L L H H H H L L H H L 14 14 J1 2.4 V 4.5 V H 3/ H H H H H H H L L H H L L L L H H H H H H L L L H H H H H L L L L H H L L H Test limits Meas. terminal Q 1 Q1 Q2 4.5 V Q 2 VCC A A A A A A A A A A A A A B B B B B B B A A A B B B A A B B B A A B B A A A A All output " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Min Max Unit -20 -57 mA " " " " " " " " " 40 " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/2G 40 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 Q 9 9 Q2 GND 2 7 2/ 4/ TC = 25C 8 8 TABLE III. Group A inspection for device type 02. 1/ - Continued. Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 9 TC = 25C FMAX 6/ " (Fig 7) " 89 90 " " " " " " 91 92 " tPLH1 3003 (Fig 6) 93 " 94 " tPLH1 " tPHL1 " 95 " " tPHL1 " 96 tPLH2 3003 (Fig 7) " " " 1 1 Clock 1 2 2 Clear 1 IN IN 3 3 K1 2.4 V 2.4 V 4 4 VCC IN GND 6 6 Clear 2 7 7 J2 8 8 Q 9 9 Q2 10 10 K2 IN IN 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V " " 11 11 GND 12 12 Q1 GND " OUT 2 5.0 V " " " IN 5 5 Clock 2 IN 2.4 V OUT GND GND " " 97 IN 5.0 V 2.4 V " " 98 IN 5.0 V 2.4 V " " IN 2.4 V OUT GND 2.4 V 2.4 V Test limits Meas. terminal Q1 Q 1 Q2 Q 2 OUT 2.4 V " IN IN 14 14 J1 " " IN " Q 1 OUT " IN 13 13 OUT 2.4 V OUT 2.4 V " OUT 2.4 V Min Max Unit 10 " MHz " " " " " Clear 1 5 25 " to Q 1 Clear 2 " 25 " " 40 " " 40 " " 30 " " " " to Q 2 Clear 1 to Q1 Clear 2 to Q2 Clock 1 to Q1 Clock 1 to Q 1 " " 99 " IN 5.0 V 2.4 V " " " 100 " IN 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " 41 " tPHL2 " 101 IN 5.0 V 2.4 V " " " " " 102 IN 5.0 V 2.4 V " " " " " 103 " IN 5.0 V 2.4 V " " " 104 " IN 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " Clock 2 to Q2 Clock 2 OUT 2.4 V OUT 2.4 V " " " " " " to Q 2 Clock 1 to Q1 Clock 1 " 40 " " " " to Q 1 Clock 2 to Q2 Clock 2 " " " " " " to Q 2 10 TC = 125C FMAX 6/ " (Fig 7) " 105 106 " " " " " " 107 108 " tPLH1 3003 (Fig 6) 109 " 110 " tPLH1 IN IN 2.4 V 2.4 V " " " " IN IN GND " " IN IN 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V " " OUT OUT " " " IN IN 2.4 V OUT GND 2.4 V 2.4 V OUT 2.4 V " Q1 Q 1 Q2 10 " MHz " " " " " Q 2 Clear 1 5 39 ns to Q 1 Clear 2 " 39 " " 50 " " 50 " to Q 2 " tPHL1 " 111 " tPHL1 " 112 IN IN GND " " tPLH2 IN 5.0 V 2.4 V " " " 3003 (Fig 7) " 113 " 114 IN 5.0 V 2.4 V " " " " " 115 " IN 5.0 V 2.4 V " " " 116 " IN 5.0 V 2.4 V " " IN IN 2.4 V OUT GND OUT 2.4 V " OUT 2.4 V OUT 2.4 V Clear 1 to Q1 Clear 2 to Q2 Clock 1 to Q1 Clock 1 " 39 " " " " " " " " " " to Q 1 OUT OUT 2.4 V " 2.4 V " Clock 2 to Q2 Clock 2 to Q 2 See notes at end of device type 02. MIL-M-38510/2G " TABLE III. Group A inspection for device type 02. 1/ - Continued. Subgroup 10 TC = 125C " Symbol MILSTD-883 method Case A, B, D Case C Test No. 1 1 Clock 1 2 2 Clear 1 3 3 K1 4 4 VCC tPHL2 3003 117 IN 5.0 V 2.4 V " " 118 IN 5.0 V 2.4 V 5 5 Clock 2 6 6 Clear 2 7 7 J2 8 8 11 11 GND 12 12 Q1 5.0 V GND OUT " " Q 9 9 Q2 10 10 K2 2 13 13 Q 1 14 14 J1 2.4 V OUT 2.4 V Test limits Meas. terminal Clock 1 to Q1 Clock 1 Min Max Unit 5 50 ns " " " " " " " " " to Q 1 " " " 119 " IN 5.0 V 2.4 V " " " 120 " IN 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " Clock 2 to Q2 Clock 2 to Q 2 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. 42 * After clock pulse apply -12 mA to clock pin to insure Q is still in the low state (see figure 15). ** Test time limit 100 ms. 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open.) 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5/ Input shall be one normal clock pulse, then 4.5 V 6/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall ge one-half of the input frequency. 7/ For CKT A, IIH3 limits are 0 to 120 A. MIL-M-38510/2G NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. C = This note has been deleted. D = Momentary 4.5 V, then GND. E = Momentary ground, then 2.4 V. F = Momentary ground, then 5.5 V. J = This note has been deleted. TABLE III. Group A inspection for device type 03. 1/ Subgroup Symbol 1 TC = 25C VOH " MILSTD-883 method 3006 " Case C Test No. " " " 3 " " " " " " 4 5 1 2 " " 6 " " VOL " 3007 " 7 8 " " " " " " " " " 9 10 11 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " 12 13 14 15 16 17 18 18 CKT B 19 20 20 CKT B 21 22 23 24 25 26 27 CKT A, C 27 CKT B 28 CKT A, C 28 CKT B 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 CKT A, C 43 CKT B 44 CKT A, C 44 CKT B " " " " IIL1 " " " IIL2 IIL2 IIL3 " " " IIH1 " " " IIH2 " " " IIH3 7/ IIH3 7/ IIH4 " " " IIH5 " " " 3009 " " " " " " " " " 3010 " " " " " " " " " " " " " " " " " See notes at end of device type 03. 2.0 V 0.8 V 2 Q 3 Q1 4 K1 5 Q2 1 -.4 mA -.4 mA 6 Q 7 GND 0.8 V 2.0 V -.4 mA -.4 mA 16 mA 16 mA 2.0 V 0.8 V 16 mA 16 mA 16 mA -12 mA -12 mA 0.8 V 0.4 V 0.4 V 4.5 V 4.5 V 4.5 V 2.4 V 2.4 V 5.5 V 5.5 V GND GND GND GND GND 11 K2 12 Clock 1 GND GND GND 13 Clear 1 A A " " A A " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 14 VCC 4.5 V " 0.8 V 2.0 V 0.8 V 0.8 V 2.0 V " " 0.8 V A A 2.0 V 0.8 V " Q 1 Q1 Q2 " -12 mA " -12 mA -12 mA " -12 mA A* 4.5 V " 5/ 5/ 4.5 V 4.5 V -12 mA 0.4 V 4.5 V 4.5 V 4.5 V 2.4 V 5.5 V GND GND GND GND GND 4.5 V 0.8 V 5/ 5/ 4.5 V 4.5 V 0.4 V 0.4 V B 4.5 V 4.5 V 4.5 V GND GND GND GND GND B GND E 5.5 V GND 2.4 V 2.4 V 0.4 V B 4.5 V 4.5 V 0.4 V 0.4 V GND GND GND B GND GND GND B 0.4 V 0.4 V GND B GND F GND GND Q 2 Q1 " -12 mA A* Q 1 " 0.8 V 4.5 V Q 1 Q 2 A A 0.8 V 2.0 V Meas. terminal Q1 Q2 0.8 V " " 16 mA 4.5 V 10 Clear 2 " -.4 mA 4.5 V 9 Clock 2 GND " -.4 mA 0.8 V 2.0 V 8 J2 2 2.4 V 5.5 V GND E 5.5 V GND GND F 2.4 V 2.4 V GND GND GND GND GND " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " Q 2 Q2 J1 K1 J2 K2 Clear 1 Clock 1 Clock 1 Clear 2 Clock 2 Clock 2 J1 K1 J2 K2 Clock 1 Clock 2 Clear 1 Clear 1 Clear 2 Clear 2 J1 K1 J2 K2 J1 K1 J2 K2 Clear 1 Clear 2 Clock 1 Clear 1 Clock 2 Clear 2 Clock 1 Clock 1 Clock 2 Clock 2 Min Test limits Max Unit 2.4 " V " " " " " " " " -0.7 " " " -1.25 -1.25 -0.7 -1.4 -0.7 -1.4 -50 -200 -50 -80 " 0.4 " " " " " " " " " " -1.5 " " " " " -0.5 -1.5 -1.5 -0.5 -1.6 " " " -3.2 -3.2 -1.6 -3.2 -1.6 -3.2 40 " " " 100 " " " 80 80 200 " " " -700 -850 -700 -850 " " " " " " " " " " " mA " " " " " " " " " A " " " " " " " " " " " " " " " " " MIL-M-38510/2G 43 " 1 J1 TABLE III. Group A inspection for device type 03. 1/ - Continued. Subgroup Symbol 1 IOS MILSTD-883 method 3011 45 2.4 V GND TC = 25C " " " " " 3011 * 3011 * 3011 46 47 48 4.5 V GND " ICC 3005 49 4.5 V Case C Test No. 1 J1 2 Q 3 Q1 4 K1 5 Q2 6 Q 1 GND 14 VCC Meas. terminal Min 5.5 V 4.5 V 2.4 V A 2.4 V 4.5 V GND 2.4 V 0V " " Q 1 Q1 Q2 " 4.5 V D 4.5 V GND D 4.5 V " VCC 40 GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " A A A A A A A A A A A A A B B B B B B B A A A B B B A A B B B A A B B A A A A B A B B A B B A B A B A B B A B B B A B B A B B A B A A A A B A A A B A B A A B B B B B B A A A A A A A A A A B A A A A A A A A A B A A A A A A A A A A A B B B B A A A A A A A A A A B B B B B B B B B B A A A A A A B B A B B B B B B B B A B B A B B A B A B A B B A B B B A B B A B B A B A A A A B A A A B A B A A B B B B B B A A A A A A A A A A B A A A A A A A A A B A A A A A A A A A A A B 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " All output " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " B B B A A A A A A A A A A B B B B B B B B B B A A A A A A B B A B B B B B B B L 3/ L L L L L L L H H L L H H H H L L L L L L H H H L L L L L H H H H L L H H L H 3/ H H H H H H H L L H H L L L L H H H H H H L L L H H H H H L L L L H H L L H Q 2 -57 " " " mA " " " " MIL-M-38510/2G 44 GND GND GND -20 Test limits Max Unit 4.5 V Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. See notes at end of device type 03. 13 Clear 1 A Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. 8 2/ 4/ 12 Clock 1 2.4 V 3 L 3/ L L L L L L L H H L L H H H H L L L L L L H H H L L L L L H H H H L L H H L 11 K2 " " " GND H 3/ H H H H H H H L L H H L L L L H H H H H H L L L H H H H H L L L L H H L L H 10 Clear 2 " GND A A A A A A A A A A A A A B B B B B B B A A A B B B A A B B B A A B B A A A A 9 Clock 2 0V Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 8 J2 2.4 V 2 7 2/ 4 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 7 GND 2 TABLE III. Group A inspection for device type 03. 1/ - Continued. Subgroup Symbol 9 TC = 25C FMAX " MILSTD-883 method (Fig. 7) 6/ " " " " " " " Case C Test No. 91 92 89 90 " tPLH tPLH 3003 (Fig. 6) " 93 " " " " " tPHL tPHL tPLH " " " 3003 (Fig. 7) 95 96 97 98 " " " " " " 99 100 tPHL " " " 101 102 " " " " " " 103 104 " " " " (Fig. 7) 6/ " " " 105 106 45 tPLH tPLH 3003 (Fig 6) " 109 " " " " " tPHL tPHL tPLH " " " 3003 (Fig 7) 111 112 113 114 " " " " " " 115 116 " " tPHL " " " 117 118 11 " " " " 4 K1 OUT OUT 6 Q 7 GND OUT OUT GND OUT GND OUT OUT 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V OUT OUT OUT 2.4 V 2.4 V OUT OUT GND OUT OUT GND OUT OUT 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V 119 120 " " " " " " " " " " " " OUT 2.4 V 2.4 V IN IN 5.0 V 5.0 V 12 Clock 1 13 Clear 1 14 VCC IN IN 5.0 V 5.0 V 5.0 V " 2.4 V 2.4 V " " 2.4 V 2.4 V 2.4 V A A IN IN IN IN 5.0 V 5.0 V IN IN 5.0 V 5.0 V OUT " " A IN IN IN 5.0 V 5.0 V GND 2.4 V 2.4 V IN IN 5.0 V 5.0 V 2.4 V 2.4 V 2.4 V A A IN IN IN IN 5.0 V 5.0 V IN IN 5.0 V 5.0 V 5.0 V 5.0 V 2.4 V 2.4 V " " " " IN GND " " A IN IN IN 5.0 V 5.0 V GND 2.4 V 2.4 V 2.4 V 2.4 V " " " " " " " " " " IN IN 2.4 V 2.4 V 5.0 V 5.0 V 2.4 V 2.4 V A 2.4 V " " " " " " IN IN 2.4 V 2.4 V " " IN IN 2.4 V 2.4 V IN GND " " OUT " " A 2.4 V " 110 2.4 V 2.4 V 2.4 V " " OUT 2.4 V 11 K2 " " OUT 2.4 V 2.4 V " " " " " " OUT 2.4 V 2.4 V 10 Clear 2 " OUT 2.4 V 9 Clock 2 GND " OUT 2.4 V 8 J2 2 2.4 V 2.4 V Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. See notes at end of device type 03. 5 Q2 1 107 108 " " " Q 3 Q1 5.0 V 5.0 V " " " " Meas. terminal Q1 Q 1 Q2 Q Clr 2 to Q 10 " MHz " " " " " ns 25 " " " 5 " 40 40 30 " " " ns " " " " " " " " " 40 " " " " " " " " " 2 Clk 1 to Q1 Clk 1 to Q 1 Clk 2 to Q2 Clk 2 to Q Q1 25 " 2 Clk 1 to Q 1 Clk 2 to Q2 Clk 2 to Q 5 1 Clr 1 to Q1 Clr 2 to Q2 Clk 1 to Q1 2 10 " MHz " " " " " 1 Q2 Q Test limits Max Unit 2 Clr 1 to Q Q Min 2 Clr 1 to Q Clr 2 to Q 2 Clr 1 to Q1 Clr 2 to Q2 Clk 1 to Q1 Clk 1 to Q 1 Clk 2 to Q2 Clk 2 to Q 2 Clk 1 to Q1 Clk 1 to Q 39 ns " 39 " " " 5 " 50 50 39 " " " ns " " " " " " " " " 50 " " " " " " " " " 1 Clk 2 to Q2 Clk 2 to Q 5 1 2 MIL-M-38510/2G FMAX " 2.4 V 2.4 V 2 94 " " 10 TC = 125C 1 J1 NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. C = This note has been deleted. D = Momentary 4.5 V, then GND. E = Momentary ground, then 2.4 V. F = Momentary ground, then 5.5 V. * After clock pulse apply -12 mA to clock pin to insure Q is still in the low state (see figure 15). ** Test time limit 100 ms. 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5/ One normal clock pulse, then 4.5 V. 6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. 7/ For CKT A, IIH3 limits are 0 to 120 A. MIL-M-38510/2G 46 TABLE III. Group A inspection for device type 04. 1/ Subgroup Symbol VOH " " " " 3 2.0 V 0.8 V " " " " " " " " " " " 4 5 6 0.8 V 2.0 V " " " " " " " " " 7 " 2.0 V 0.8 V " " " " VOL " " 3007 " 8 9 10 " " " 0.8 V 2.0 V " " " 11 0.8 V 2.0 V " " " " " " " " " 12 13 14 2.0 V 0.8 V " " " 15 " 0.8 V 2.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " " " " " IIL1 " " " IIL2 " " " IIL3 " " " " " " " IIH1 " " " IIH2 " " " " 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 A, C 35 B 36 A, C 36 B 37 A, C 37 B 38 A, C 38 B 39 40 41 42 43 44 45 46 " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " 2.0 V 0.8 V 3009 " " " " " " " " " " " " " " " 3010 " " " " " " " See notes at end of device type 04. Case E & F Test No. 1 Clock 1 1 2 A A 2 Preset 1 3 Clear 1 A A 4 J1 5 VCC 2.0 V 0.8 V 4.5 V " GND " -.4 mA -.4 mA 0.8 V 2.0 V -12 mA -12 mA -12 mA -12 mA 4.5 V 4.5 V 0.4 V 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V GND GND GND GND B B 4.5 V B B 0.4 V 0.4 V 0.4 V 0.4 V GND 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 2.4 V GND GND GND 5.5 V 6 Clock 2 7 Preset 2 8 Clear 2 A A 9 J2 2.0 V 0.8 V 10 Q 2 11 Q2 -.4 mA -.4 mA 12 K2 0.8 V 2.0 V -.4 mA 13 GND 14 Q 1 16 mA " 16 mA " " " " " " 16 mA 16 mA 2.0 V 0.8 V 16 mA 16 mA -12 mA -12 mA -12 mA -12 mA 0.4 V 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V B B B GND GND GND GND 0.4 V 4.5 V 4.5 V 0.4 V 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V GND 2.4 V 0.4 V 0.4 V GND GND 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 2.4 V GND 5.5 V 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Q 1 Q 1 Q1 Q2 16 mA 2.0 V 0.8 V Q 2 Q2 Q1 Min " " " " " " " " " " " Q 2 Q 2 -12 mA 0.4 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 4.5 V 2.4 V 5.5 V Unit V " Q 1 Q2 J1 K1 J2 K2 Clock 1 Preset 1 Clear 1 Clock 2 Preset 2 Clear 2 J1 K1 J2 K2 Clock 1 Clock 1 Clock 2 Clock 2 Clear 1 Clear 1 Preset 1 Preset 1 Clear 2 Clear 2 Preset 2 Preset 2 J1 K1 J2 K2 J1 K1 J2 K2 Test limits Max 2.4 " Q 1 Q1 Q2 16 mA " -12 mA B 4.5 V 0.8 V 2.0 V Meas. terminal Q1 Q 2 " 4.5 V 4.5 V -.4 mA " -.4 mA 0.8 V 2.0 V 16 K1 -.4 mA " " " A A 15 Q1 -0.7 " " " -1.25 " " " -0.7 -1.4 -0.7 -1.4 -0.7 -1.4 -0.7 -1.4 0.4 " " " " " " " " " " " " " " " -1.5 " " " " " " " " " -1.6 " " " -3.2 " " " -1.6 -3.2 -1.6 -3.2 -1.6 -3.2 -1.6 -3.2 40 " " " 100 " " " " " " " " " " " " " " mA " " " " " " " " " " " " " " " A " " " " " " " MIL-M-38510/2G 47 1 TC = 25C MILSTD-883 method 3006 " TABLE III. Group A inspection for device type 04. 1/ - Continued. Subgroup Symbol Case E & F Test No. 1 Clock 1 2 Preset 1 IIH3 " " " IIH4 " " " " " IIH5 " " " IOS " 47 48 49 50 51 52 53 54 55 56 57 CKT A, C 57 CKT B 58 CKT A, C 58 CKT B 59 ** 60 GND GND E " " " " " " 61** 62 " " ICC ICC 3005 3005 63 64 GND GND 3 Clear 1 4 J1 5 VCC E GND 4.5 V F GND 4.5 V 5.5 V " " " " " " " " " " " " " " " F 5.5 V GND GND 2.4 V 2.4 V GND GND GND GND 2.4 V 2.4 V GND GND GND 4.5 V 4.5 V GND 4.5 V GND GND 4.5 V 2.4 V 2.4 V GND GND 6 Clock 2 GND GND GND GND 7 Preset 2 E E 5.5 V 2.4 V 2.4 V 48 See notes at end of device type 04. B A B B A B B A B B A B B A B B B A B B A B A A A A A A B B B B B B A A A A A A A A A A B B B B B B A A A A A A A A A B A A A A A A A A A A A A A A A B B B B B B B B B B A A A GND GND GND GND 4.5 V GND 2.4 V 2.4 V " " GND GND 4.5 V GND GND 4.5 V GND GND B B B B B B A A A A A A A A A B A A A A A A A A A A A A A A A B B B B B B B B B B A A A B A B B A B B A B B A B B A B B B A B B A B A A A A A A B B B B B B A A A A A A A A A A 4.5 V GND GND GND 4.5 V 4.5 V " " " " " " " " " " " " " " " " " " " " " 12 K2 4.5 V GND 2.4 V 2.4 V Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. 11 Q2 GND 4.5 V " " 3 10 Q 2 GND 4.5 V GND GND Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 9 J2 F F 2 7 2/ 4/ TC = 25C " " " " " " " " " " " " " " " " " " " " 8 Clear 2 GND GND GND GND H 3/ H H H H H L L L L L L L L L H H H H H H L L 3/ L L L L L H H H H H H H H H L L L L L L H 13 GND GND " " " " " " " " " " " " " " " 2.4 V 2.4 V " " GND GND " " B B B A A A A A A A A A B B B B B B B B B B GND " " " " " " " " " " " " " " " " " " " " " 14 Q 1 15 Q1 16 K1 4.5 V GND 4.5 V GND GND GND GND GND GND 2.4 V 2.4 V Meas. terminal Clear 1 Preset 1 Clear 2 Preset 2 Clear 1 Preset 1 Clear 2 Preset 2 Clock 1 Clock 2 Clock 1 Clock 1 Clock 2 Clock 2 Q1 Q 1 Q2 Q 2 H 3/ H H H H H L L L L L L L L L H H H H H H L L 3/ L L L L L H H H H H H H H H L L L L L L H GND GND VCC VCC B B B A A A A A A A A A B B B B B B B B B B All output " " " " " " " " " " " " " " " " " " " " Min Test limits Max Unit -50 -200 -50 -200 -20 " 160 " " " 200 " " " " " -700 -850 -700 -850 -57 " A " " " " " " " " " " " " " mA " " " " " " " 40 40 " " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " MIL-M-38510/2G 1 TC = 25C " " " " " " " " " " " " " " MILSTD-883 method 3010 " " " " " " " " " " " " " 3011 " TABLE III. Group A inspection for device type 04. 1/ - Continued. Subgroup Symbol MILSTD-883 method 7 2/ 4/ TC = 25C " " " " " " " " " " " " " " " " 8 2/ 4/ Case E & F Test No. 1 Clock 1 2 Preset 1 3 Clear 1 4 J1 5 VCC 6 Clock 2 7 Preset 2 8 Clear 2 9 J2 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 B A B B A B A B A A A A A B A A A B A A A A A A A A B B A A A A A A A A A A A A A A A A B A A A A A A A A A B B B A A A A A B A A A B B A B B B 4.5 V " " " " " " " " " " " " " " " " " B A B B A B A B A A A A A B A A A B A A A A A A A A B B A A A A A A A A A A A A A A A A B A A A A A A A A A B B B A A A A A B A A A B B A B B B 10 Q 2 L 3/ L H H H L L H H L L L L H H H H L 11 Q2 12 K2 13 GND 14 H 3/ H L L L H H L H H H H H L L L L H A A A A A A A A B A A B B B A A B B GND " " " " " " " " " " " " " " " " " L 3/ L H H H L L H H L L L L H H H H L GND " OUT Q 1 15 Q1 16 K1 H 3/ H L L L H H L H H H H H L L L L H A A A A A A A A B A A B B B A A B B OUT 2.4 V 2.4 V Test limits Max Unit Meas. terminal All Output " " " " " " " " " " " " " " " " Min Q1 10 " MHz " " " " " H or L as shown 3/ " " " " " " " " " " " " " " " " Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. FMAX " (Fig. 9) 5/ 105 106 " " " " " " 107 108 " tPLH1 3003 (Fig 8) 109 49 " " " 110 " " " 111 IN IN 5.0 V 5.0 V 2.4 V 2.4 V 5.0 V " " " 2.4 V 2.4 V 5.0 V IN IN 5.0 V 2.4 V 2.4 V IN IN 5.0 V 5.0 V 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V " " " " " " Q 2 OUT " 2.4 V 5.0 V IN 2.4 V OUT 2.4 V Q 1 Q2 OUT 2.4 V Clear 1 5 25 ns 2.4 V to Q 1 Preset 1 to Q1 Clear 2 " " " " " " " " " " 40 " " " " " " " " " " to Q 2 Clock 1 to Q1 Clock 1 5 30 ns " " " to Q 1 Clock 2 to Q2 Clock 2 " " " " " " " 40 " " to Q 2 " " " 112 " tPHL1 " 113 2.4 V 5.0 V IN 2.4 V " " 2.4 V IN 5.0 V 2.4 V OUT 2.4 V " " " " " 114 2.4 V IN 5.0 V 2.4 V " " OUT OUT 2.4 V 2.4 V Preset 2 to Q2 Clear 1 to Q1 Preset 1 to Q 1 " " " 115 " 2.4 V 5.0 V IN 2.4 V " " " 116 " 2.4 V IN 5.0 V 2.4 V " tPLH2 " " 3003 (Fig 9) " OUT OUT 2.4 V " 2.4 V " 117 IN 5.0 V 5.0 V 2.4 V " " 118 IN 5.0 V 5.0 V 2.4 V " " " " " 119 " IN 5.0 V 5.0 V 2.4 V " " " 120 " IN 5.0 V 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " Clear 2 to Q2 Preset 2 OUT OUT 2.4 V 2.4 V to Q 2 " tPHL2 " See notes at end of device type 04. 121 IN 5.0 V 5.0 V 2.4 V " " OUT 2.4 V Clock 1 to Q1 MIL-M-38510/2G 9 TC = 25C TABLE III. Group A inspection for device type 04. 1/ - Continued. Subgroup Symbol MILSTD-883 method 3003 (Fig 8) Case E & F Test No. 1 Clock 1 2 Preset 1 122 IN 5.0 V 3 Clear 1 4 J1 5 VCC 2.4 V 5.0 V 6 Clock 2 7 Preset 2 8 Clear 2 9 J2 9 TC = 25C tPHL2 " " " 123 " IN 5.0 V 5.0 V 2.4 V " " " 124 " IN 5.0 V 5.0 V 2.4 V 10 Q 2 11 Q2 12 K2 13 GND GND OUT OUT 2.4 V " 2.4 V " 14 Q 1 OUT 15 Q1 16 K1 OUT 2.4 V Meas. terminal Clock 1 to Q 1 Clock 2 to Q2 Clock 2 Min Test limits Max Unit 5 40 ns " " " " " " to Q 2 10 TC = 125C FMAX 5/ " (Fig 9) " 125 126 " " " " " " 127 128 " tPLH1 3003 (Fig 8) 129 " " " 130 " " " 131 " " " 5.0 V 5.0 V 2.4 V 2.4 V " " " " 2.4 V 2.4 V 5.0 V IN IN 5.0 V 2.4 V 2.4 V " " IN IN 5.0 V 5.0 V 5.0 V 5.0 V 2.4 V 2.4 V OUT OUT 2.4 V 2.4 V " " OUT " 2.4 V 2.4 V 5.0 V IN IN 5.0 V 2.4 V OUT 2.4 V 2.4 V 132 tPHL1 " 133 2.4 V 5.0 V IN 2.4 V " " " " 134 2.4 V IN 5.0 V 2.4 V " " " " 135 " 2.4 V 5.0 V IN 2.4 V " " " 136 " 2.4 V IN 5.0 V 2.4 V OUT OUT 2.4 V 2.4 V OUT 2.4 V " " " OUT 2.4 V 2.4 V " " " " " OUT OUT " 2.4 V " 2.4 V " OUT OUT 2.4 V 2.4 V Q1 Q 1 Q2 10 " MHz " " " " " Q 2 Clear 1 5 39 ns to Q 1 Preset 1 to Q1 Clear 2 " " " " " " " " " to Q 2 Preset 2 to Q2 Clear 1 to Q1 Preset 1 to Q 1 Clear 2 to Q2 Preset 2 " 50 " " " " " " " " " " 5 39 ns " " " " " " " " " to Q 2 " tPLH2 " " 3003 (Fig 9) " 137 IN 5.0 V 5.0 V 2.4 V " " 138 IN 5.0 V 5.0 V 2.4 V " " " " " 139 " IN 5.0 V 5.0 V 2.4 V " " " 140 " IN 5.0 V 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " OUT OUT 2.4 V 2.4 V Clock 1 to Q1 Clock 1 to Q 1 Clock 2 to Q2 Clock 2 to Q 2 " tPHL2 " 141 IN 5.0 V 5.0 V 2.4 V " " " " " 142 IN 5.0 V 5.0 V 2.4 V " " " " " 143 " IN 5.0 V 5.0 V 2.4 V " " " 144 " IN 5.0 V 5.0 V 2.4 V OUT OUT 2.4 V " 2.4 V " OUT OUT 2.4 V 2.4 V Clock 1 to Q1 Clock 1 to Q 1 Clock 2 to Q2 Clock 2 to Q 2 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. See notes at end of device type 04. " 50 " " " " " " " " " " MIL-M-38510/2G 50 " IN IN NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. C = This note has been deleted. E = Momentary ground, then 2.4 V. F = Momentary ground, then 5.5 V. ** = Test time limit 100 ms. J = This note has been deleted. 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open.) 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. MIL-M-38510/2G 51 TABLE III. Group A inspection for device type 05. 1/ Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 3 Clock 1 2 2 D1 2.0 V 0.8 V 3 1 Clear 1 4 14 VCC VOH " 3006 " 1 2 A A " " " 3 GND " " " " " " " " " 4 5 6 " " " 7 " " " VOL " 3007 8 9 " " " " " " " " " 10 11 12 " " " 13 " " " " " " " " " " 14 15 16 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " " " IIL1 " " " IIL2 " " " IIH1 IIH1 IIH2 IIH2 IIH3 " " " IIH4 " " " IIH5 IIH5 IIH6 IIH6 3009 " " " " " " " 3010 " " " " " " " " " " " " " " " 17 18 19 20 21 22 23 24 25 26 27 28 29 30 7/ 31 32 7/ 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 See notes at end of device type 05. A 2.0 V A 0.8 V 0.4 V 4.5 V 4.5 V GND 4.5 V 2.4 V 12 6 Q 1 " " -.4 mA " " " -.4 mA " " " -.4 mA " 4.5 V GND 4.5 V 0.4 V GND 4.5 V 5.5 V GND 4.5 V 4.5 V GND 4.5 V 5.5 V B 4.5 V 4.5 V GND 4.5 V B GND 2.4 V GND Q 2 11 7 GND GND 2.4 V B B 10 8 0.8 V -12 mA GND 9 9 Q2 -.4 mA -12 mA GND 8 10 Preset 2 GND " -12 mA 0.4 V 7 11 Clock 2 4.5 V " 0.8 V 2.0 V 4.5 V 6 12 D2 5.5 V 2.0 V 0.8 V " 0.8 V " " GND A A GND -.4 mA GND 0.8 V -.4 mA " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " 2.0 V A 0.8 V A 0.8 V 2.0 V 2.0 V 0.8 V -12 mA -12 mA -12 mA -12 mA 4.5 V 0.4 V 4.5 V GND GND GND GND 0.4 V 4.5 V 0.4 V GND 4.5 V 0.4 V 4.5 V GND GND GND 2.4 V 4.5 V 4.5 V GND 5.5 V 4.5 V 4.5 V GND 4.5 V 4.5 V 4.5 V 2.4 V B 4.5 V 2.4 V GND 4.5 V 4.5 V 4.5 V 5.5 V B 4.5 V 5.5 V 2.4 V GND B 4.5 V 5.5 V GND B 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND 0.8 V Q 1 Q1 Q2 Q 2 16 mA " " " Q1 Q 2 " " " 16 mA 16 mA 16 mA Test limits Meas. terminal Q 1 -.4 mA 16 mA " 14 4 Preset 1 -.4 mA " " 16 mA 13 5 Q1 Q2 16 mA 16 mA 2.0 V 0.8 V Min V " " " " " " " " " " " " Q 1 Q 2 Q2 Q2 Q 2 -12 mA GND 0.4 V GND GND 4.5 V 4.5 V 4.5 V 2.4 V 4.5 V 5.5 V 4.5 V 4.5 V Unit 2.4 " Q 1 Q1 Q1 D1 Clock 1 Clear 1 Preset 1 D2 Clock 2 Clear 2 Preset 2 D1 D2 Preset 1 Preset 2 Clock 1 Clear 1 Clock 2 Clear 2 D1 D2 D1 D2 Clock 1 Preset 1 Clock 2 Preset 2 Clock 1 Preset 1 Clock 2 Preset 2 Clear 1 Clear 2 Clear 1 Clear 2 Max -0.7 -0.7 -1.4 -1.4 -1.4 -2.1 -1.4 -2.1 0.4 " " " " " " " " " " " " " " " " -1.5 " " " " " " " -1.6 -1.6 -3.2 -3.2 -3.2 -4.8 -3.2 -4.8 40 40 100 100 80 " " " 200 " " " 120 120 300 300 " " " " " " " " mA " " " " " " " A " " " " " " " " " " " " " " " MIL-M-38510/2G 52 1 TC = 25C 5 13 Clear 2 TABLE III. Group A inspection for device type 05. 1/ - Continued. Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 TC = 25C IOS " 3011 " 49 50 " " " " " " 51 52 " " ICC ICC 3005 3005 53 54 1 3 Clock 1 GND GND 2 2 D1 GND GND 3 1 Clear 1 4 14 VCC GND 5.5 V " GND 5 13 Clear 2 6 12 D2 7 11 Clock " " GND GND " " GND GND GND GND GND Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. B B B B B B A A A A A A B B B A B B B A A A A A A B B B B A B B A A A B B B A A A A A A A B B B A A A A A B A A A B A A 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Q 2 11 7 GND B B A A A B B B A A A A A A A B B B A A A A A B A A A B A A GND B B B B B B A A A A A A B B B A B B B A A A A A A B B B B A B B B B A A A A A A A B B A A A A A A B A A A A A A A A A A GND B A A B B B B A A B A A A A B B B A A A A B A A A B A A A A 12 6 Q 1 13 5 Q1 GND GND H 3/ H H L L H H H H L L L L H L H H H H H L L L H H L L H H H Test limits Meas. terminal Q1 Q 1 Q2 " " Q 2 " " H 3/ L L H H H H L L H H H H L H H H L L L H H H L L H H L L L 14 4 Preset 1 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " H 3/ H H L L H H H H L L L L H L H H H H H L L L H H L L H H H GND " OUT GND VCC VCC H L L H H H H L L H H H H L H H H L L L H H H L L H H L L L B A A B B B B A A B A A A A B B B A A A A B A A A B A A A A All outputs " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT 5.0 V 5.0 V Min Max Unit -20 " -57 " mA " " " " " " " 30 30 " " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/2G 53 8 2/ 4/ B B B B A A A A A A A B B A A A A A A B A A A A A A A A A A 10 8 GND 3 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 9 9 Q2 GND " 2 7 2/ 4/ TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " 8 10 Preset 2 Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. 9 TC = 25C FMAX 6/ " (Fig. 11) " 85 86 " " " " " " 87 88 See notes at end of device type 05. IN IN E E 5.0 V " " " E E IN IN 5.0 V 5.0 V OUT OUT " " Q1 Q 1 Q2 Q 2 10 " MHz " " " " " TABLE III. Group A inspection for device type 05. 1/ - Continued. Subgroup Symbol MILSTD-883 method Case A, B, D Case C Test No. 3003 (Fig 10) 89 9 TC = 25C tPLH1 " " " 90 " " " 91 1 3 Clock 1 2 2 D1 3 1 Clear 1 4 14 VCC IN 5.0 V 5 13 Clear 2 6 12 D2 7 11 Clock 2 8 10 Preset 2 9 9 Q2 10 8 Q 2 11 7 GND GND J " " " " IN J J IN OUT " " 92 tPHL1 " 93 IN " " " " " 94 J " " " " " 95 " IN J " " " 96 " J IN " " 3003 5/ (Fig 11) (Fig 12) 14 4 Preset 1 Meas. terminal Min Max Unit J Clear 1 5 25 ns OUT OUT " " " " " " " 40 " " " " IN " " tPLH2 Q 1 OUT 13 5 Q1 Test limits to Q 1 " " 12 6 " OUT OUT OUT J IN " OUT " 97 IN IN (A) B " " 98 IN IN (A) 5.0 V " " OUT OUT 5.0 V B Preset 1 to Q1 Clear 2 to Q 2 Preset 2 to Q2 Clear 1 to Q1 Preset 1 " " " to Q 1 Clear 2 to Q2 Preset 2 " " " " " " to Q 2 Clock 1 to Q1 Clock 1 5 30 ns " " " " " " " " " to Q 2 Clock 1 to Q1 Clock 1 " 40 " " " " to Q 1 Clock 2 to Q2 Clock 2 " " " " " " 10 " MHz " " " " " " " " 5 39 ns " " " " " " to Q 1 " (Fig 11) 99 " B IN (A) IN 5.0 V " " (Fig 12) 100 " 5.0 V IN (A) IN B OUT " OUT 54 " tPHL2 (Fig 12) 101 IN IN (B) 5.0 V " " " " (Fig 11) 102 IN IN (B) B " " " " (Fig 12) 103 " 5.0 V IN (B) IN B " " (Fig 11) 104 " B IN (B) IN 5.0 V OUT Clock 2 to Q2 Clock 2 " OUT OUT B 5.0 V " OUT " to Q 2 10 TC = 125C FMAX 6/ (Fig 11) 105 IN E " " " " 106 IN E " " " " " " " " 107 108 " tPLH1 3003 (Fig 10) 109 " " IN E E IN IN 5.0 V 5.0 V OUT OUT " OUT OUT 5.0 V 5.0 V " " " Q1 Q 1 Q2 OUT J Q 2 Clear 1 to Q 1 " " " 110 " " " 111 J " " " " IN J J IN OUT " " 112 " tPHL1 " 113 IN " " " " " 114 J " " " " 115 " IN J " " " 116 " J IN IN " " " OUT OUT " OUT " OUT " OUT OUT J IN Preset 1 to Q1 Clear 2 to Q 2 Preset 2 to Q2 Clear 1 to Q1 Preset 1 to Q 1 Clear 2 to Q2 Preset 2 to Q 2 " " " " 50 " " " " " " " " " " MIL-M-38510/2G " See notes at end of device type 05. TABLE III. Group A inspection for device type 05. 1/ - Continued. Subgroup 10 TC = 125C Symbol tPLH2 " MILSTD-883 method Case A, B, D Case C Test No. Clock 1 D1 Clear 1 VCC 3003 5/ (Fig 11) (Fig 12) 117 IN IN (A) B " " 118 IN IN (A) 5.0 V " " 1 2 3 4 5 Clear 2 6 D2 7 Clock 2 8 Preset 2 9 Q2 10 Q 2 11 GND 12 Q 1 13 14 Q1 Preset 1 OUT 5.0 V OUT B Test limits Meas. terminal Min Max Unit 5 39 ns " " " " " " " " " to Q 2 Clock 1 to Q1 Clock 1 " 40 " " " " to Q 1 Clock 2 to Q2 Clock 2 " " " " " " Clock 1 to Q1 Clock 1 to Q 1 " " (Fig 11) 119 " B IN (A) IN 5.0 V " " (Fig 12) 120 " 5.0 V IN (A) IN B OUT " OUT " tPHL2 (Fig 12) 121 IN IN (B) 5.0 V " " " " (Fig 11) 122 IN IN (B) B " " " " (Fig 12) 123 " 5.0 V IN (B) IN B " " (Fig 11) 124 " B IN (B) IN 5.0 V OUT " OUT Clock 2 to Q2 Clock 2 " " OUT OUT B 5.0 V to Q 2 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. E = Input D connected to Q . J = Input pulse, tp 100 ns, PRR = 1 MHz, VOL = 0 V, VOH = 4.5 V. 55 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5/ Tests shall be performed for both D input pulses (A and B). 6 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. 7/ CKT C limits are -0.7 to -4.8 mA for these tests. MIL-M-38510/2G NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. TABLE III. Group A inspection for device type 06. 1/ Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 10 K1 2 12 Clock 0.8 V 2.0 V A A 3 13 Preset 4 14 VCC 5 2 Clear 6 1 NC 8 4 J2 9 5 J* 10 6 2.0 V 0.8 V 2.0 V 0.8 V 0.8 V 2.0 V -.4 mA Q 11 7 GND 12 8 Q 13 9 K* 14 11 K2 GND " -.4 mA 2.0 V 0.8 V 0.8 V 2.0 V VOH " 3006 " 1 2 " " " 3 GND 2.0 V " 0.8 V GND -.4 mA " " " " " VOL " " 3007 " 4 5 6 GND A A 0.8 V " " " 2.0 V GND 2.0 V 0.8 V 16 mA " " " " " " 7 GND 0.8 V " 2.0 V GND 16 mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " " " " IIL1 " " " " " " " " IIH1 " " " " " " IIH2 " GND 2.0 V GND IIH3 " IIH4 " IOS " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " 0.8 V 3009 " " " " " " " " 3010 " " " " " " " " " " " " " " " " " 3011 " 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " ICC " 3005 " 47 48 " " " " -12 mA -12 mA -12 mA GND GND 0.4 V 4.5 V GND GND B B 4.5 V 0.4 V GND GND 0.4 V 2.4 V GND GND GND 2.4 V 5.5 V GND GND 4.5 V GND 4.5 V GND GND 5.5 V A A A A GND GND 2.4 V 5.5 V GND GND " " 0.8 V 2.0 V -12 mA -12 mA -12 mA -12 mA B B 0.4 V GND GND GND GND 2.4 V 5.5 V 0.4 V 4.5 V 4.5 V 2.4 V GND 5.5 V GND 4.5 V GND 4.5 V GND GND GND 2 Same tests, terminal conditions and limits as for subgroup 1, except TC = 125C and VIC tests are omitted. 3 Same tests, terminal conditions and limits as for subgroup 1, except TC = -55C and VIC tests are omitted. See notes at end of device type 06. 0.8 V 2.0 V 4.5 V 0.4 V 4.5 V GND 2.4 V GND 5.5 V 4.5 V GND 4.5 V GND 0.4 V 0.4 V 0.4 V 0.4 V 4.5 V 4.5 V 2.4 V 4.5 V 4.5 V 5.5 V GND 4.5 V GND 4.5 V GND GND " " GND -.4 mA 16 mA GND 0.8 V 2.0 V 2.0 V 0.8 V Test limits Meas. terminal Q Q Q Q Q Min " " " Q -12 mA -12 mA GND 0.4 V 0.4 V 0.4 V 4.5 V 0.4 V 0.4 V 4.5 V 4.5 V 4.5 V 2.4 V GND 2.4 V 4.5 V 4.5 V 5.5 V GND 5.5 V 4.5 V GND 4.5 V GND GND GND GND 4.5 V GND 4.5 V Q J1 J2 J* K1 K2 K* Clock Preset Clear J1 J2 J* K1 K2 K* Clock Preset Clear J1 J2 J* K1 K2 K* Clock J1 J2 J* K1 K2 K* Clock Preset Clear Preset Clear Q Q VCC VCC Unit V " Q 16 mA Max 2.4 " -0.7 " " " " " " " " -20 -20 0.4 " " " " " " " -1.5 " " " " " " " " -1.6 " " " " " " " " 40 " " " " " " 100 " " " " " " 80 80 200 200 -57 -57 " " " " " " " " " " mA " " " " " " " " A " " " " " " " " " " " " " " " " " mA " 30 30 " " MIL-M-38510/2G 56 1 TC = 25C 2.0 V 0.8 V 4.5 V " 7 3 J1 TABLE III. Group A inspection for device type 06. 1/ - Continued. Subgroup Symbol MIL-STD883 method 8 2/ 4/ 1 10 K1 2 12 Clock 3 13 Preset 4 14 VCC 5 2 Clear 6 1 NC 7 3 J1 8 4 J2 9 5 J* 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 B B B B B A A A A A A A B B B B B B B B B A A A A A A A A A A A B B B B B B B B B A A A B B B A B B A B B A B B B A B B A B B A B B A B A B B A B B A B B B A A B B A A A B B A A B A A A A A A A A A A A A A A A A A A A A A A A A A A A B B B A A A B B A A A A A B B 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " B A A A A A A A A A A B A A A A A A A A A A A A A A B B B B B B B A A A A A A B A A A A B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B B A A A B B B A A A A A A A A A A A A A A B B B B B B B B B A A A B B B B B B B B B B B B B B B A A A A A A A A A A A A A A A A A B B B B B B B B B A A A A A A A A A A A A A A A B B B B B B A A A B B B B B B B B B B B A A A A A A A A A B B B Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. See notes at end of device type 06. 10 6 Q H 3/ L L L L L L L L L L H H H H H H H H H H H L L H H H H H L L L H H H L L L L L L L L L 11 7 GND 12 8 Q 13 9 K* 14 11 K2 Meas. terminal Test limits GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " L 3/ H H H H H H H H H H L L L L L L L L L L L H H L L L L L L L L L L L L H H H L H H H H A A B B B B B B A A A A A A A A A A A A A B B B B B B B B B B B A A A A A A A A A B B B B B A A A B B B A A A A B B B B B B B B B A A A A A A A A A A A B B B B B B B B B A A A All output " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Min Max H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Unit MIL-M-38510/2G 57 7 2/ 4/ TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Case A, B D Case C Test No. TABLE III. Group A inspection for device type 06. 1/ - Continued. Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 10 K1 2 12 Clock 3 13 Preset 4 14 VCC 5 2 Clear 6 1 NC 7 3 J1 8 4 J2 9 5 J* 10 6 Q 11 7 GND 12 8 Q 13 9 K* 14 11 K2 OUT GND GND 2.4 V 2.4 V GND 5.0 V FMAX 5/ FMAX 5/ (Fig. 14) (Fig. 14) 93 94 2.4 V 2.4 V IN IN 5.0 V 5.0 V 5.0 V " 5.0 V 5.0 V 2.4 V 2.4 V 2.4 V 2.4 V GND GND OUT GND " " tPLH 95 5.0 V 0.8 V IN " IN 5.0 V 5.0 V GND OUT " " " " tPLH tPHL tPHL 3003 (Fig. 13) " " " 96 97 98 " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT " " " " " " " " " " " (Fig. 15) tPLH 3003 (Fig. 14) 99 100 2.4 V " IN " 5.0 V " " " 5.0 V " 2.4 V " 2.4 V " GND " OUT OUT " " GND " 2.4 V " " " tPHL tPHL " " 101 102 " " " " " " " " " " " " " " " " " " OUT OUT " " " " 10 TC = 125C FMAX 5/ FMAX 5/ (Fig. 14) (Fig. 14) 103 104 2.4 V 2.4 V IN IN 5.0 V 5.0 V " " 5.0 V 5.0 V 2.4 V 2.4 V 2.4 V 2.4 V GND GND " " OUT OUT GND GND 2.4 V 2.4 V " tPLH 5.0 V 0.8 V IN " IN 5.0 V 5.0 V GND OUT " GND 5.0 V tPLH tPHL tPHL 3003 (Fig. 13) " " " 105 " " " 106 107 108 " " " " " " " " " " " " " " " " " " " " " " " " OUT OUT OUT " " " " " " " " " " " tPLH tPLH 3003 (Fig. 14) 109 110 2.4 V " IN " 5.0 V " " " 5.0 V " 5.0 V " 5.0 V " GND " OUT OUT " " GND " 2.4 V " " " tPHL tPHL " " 111 112 " " " " " " " " " " " " " " " " " " OUT OUT " " " " 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5 FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. Q Q Clear to Q Preset to Q Clear to Q Preset to Q Clock to Q Clock to Q Clock to Q Clock to Q Q Q Clear to Q Preset to Q Clear to Q Preset to Q Clock to Q Clock to Q Clock to Q Clock to Q Min Max 20 20 Unit MHz MHz 5 50 ns " " " " " " " " " 5 " 50 " ns " " " " " " " 15 15 MHz MHz 5 62 ns " " " " " " " " " 5 " 62 " ns " " " " " " " MIL-M-38510/2G 58 9 TC = 25C Test limits Meas. terminal TABLE III. Group A inspection for device type 07. 1/ Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 3 Clock 1 A A 2 2 D1 3 1 Clear 1 5 13 Clear 2 6 12 D2 7 11 Clock 2 8 10 Preset 2 VOH " 3006 " 1 2 " " " 3 " " " " " " " " " 4 5 6 " " " 7 " 0.8 V 2.0 V " " " VOL " 3007 8 9 " " 2.0 V 0.8 V " " " " " " 10 11 " " " " " " 12 13 " " " " " " " " " 14 15 16 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VIC " " " " " " " IIL1 " " " IIL2 " " " IIH1 " IIH2 " IIH3 " " " IIH4 " " " IIH5 " IIH6 " 3009 " " " " " " " 3010 " " " " " " " " " " " " " " " 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 A 2.0 V A 0.8 V " " -.4 mA 2.0 V " " " -.4 mA " " " -.4 mA " -12 mA -12 mA 4.5 V 4.5 V 4.5 V 0.4 V 4.5 V 2.4 V GND 4.5 V 5.5 V GND 2.4 V B 5.5 V B Q 1 0.8 V -12 mA 0.4 V 4.5 V 12 6 -.4 mA 4.5 V B 4.5 V 4.5 V B 4.5 V GND GND 2.4 V GND GND 5.5 V 2.0 V 0.8 V A A -.4 mA -.4 mA " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " " " " 2.0 V A 0.8 V A 0.8 V 2.0 V 2.0 V 0.8 V -12 mA -12 mA -12 mA -12 mA 4.5 V 4.5 V 0.4 V 0.4 V 4.5 V 0.4 V 0.4 V 0.4 V 4.5 V 0.4 V 0.4 V 4.5 V 0.4 V 0.8 V GND 4.5 V GND 2.4 V 4.5 V GND GND 5.5 V 4.5 V GND B 4.5 V 4.5 V 2.4 V B B 4.5 V 4.5 V 5.5 V B 2.4 v GND GND 5.5 V GND GND GND 2.4 V GND 5.5 V 16 mA " " 16 mA " " " 16 mA 16 mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 13 5 Q1 14 4 Preset 1 -.4 mA Test limits Meas. terminal Q1 Q 1 2.0 V -.4 mA 0.8 V Q 1 Q1 Q2 Q 2 Q 2 Q2 16 mA " " " " " " " 0.4 V 0.8 V Q 2 11 7 GND GND " 2.0 V 0.4 V 0.4 V 10 8 4.5 V " 0.8 V 4.5 V 0.4 V 9 9 Q2 16 mA 16 mA 16 mA Min 0.8 V " " " " " " " " " " " Q 1 Q1 Q 2 Q2 Q2 Q 2 -12 mA 0.4 V 0.4 V GND 4.5 V GND GND GND 2.4 V GND 5.5 V D1 Clock 1 Clear 1 Preset 1 D2 Clock 2 Clear 2 Preset 2 D1 Preset 1 D2 Preset 2 Clock 1 Clear 1 Clock 2 Clear 2 D1 D2 D1 D2 Clock 1 Preset 1 Clock 2 Preset 2 Clock 1 Preset 1 Clock 2 Preset 2 Clear 1 Clear 2 Clear 1 Clear 2 Unit V " Q 1 Q1 2.0 V Max 2.4 " -0.5 " " " -1.0 " " " 0.4 V " " " " " " " " " " " " " " " " -1.5 " " " " " " " -1.6 " " " -3.2 " " " 40 40 100 100 80 " " " 200 " " " 120 120 300 300 " " " " " " " " mA " " " " " " " A " " " " " " " " " " " " " " " MIL-M-38510/2G 59 1 TC = 25C See notes at end of device type 07. 2.0 V 0.8 V 4 14 VCC TABLE III. Group A inspection for device type 07. 1/ - Continued. Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 1 TC = 25C IOS " 3011 " 49 50 " " " " " " 51 52 " " ICC ICC 3005 3005 53 54 1 3 Clock 1 2 2 D1 3 1 Clear 1 GND GND GND GND GND GND 4 14 VCC 5 13 Clear 2 6 12 D2 " " GND GND " " GND GND GND Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. B B A A A B B B A A A A A A A B B B A A A A A B A A A 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " B B A A A B B B A A A A A A A B B B A A A A A B A A A Same tests, terminal conditions and limits as for subgroup 7, except TC = 125C and -55C. See notes at end of device type 07. Q 2 11 7 GND GND B B B B B B A A A A A A B B B A B B B A A A A A A B B GND GND GND GND GND B B B B A A A A A A A B B A A A A A A B A A A A A A A B A A B B B B A A B A A A A B B B A A A A B A A A B A H 3/ L L H H H H L L H H H H L H H H L L L H H H L L H H 12 6 Q 1 13 5 Q1 GND GND " " GND " " " " " " " " " " " " " " " " " " " " " " " " " " Test limits Meas. terminal Q1 Q 1 Q2 Q 2 " " H 3/ H H L L H H H H L L L L H L H H H H H L L L H H L L 14 4 Preset 1 GND H 3/ H H L L H H H H L L L L H L H H H H H L L L H H L L H 3/ L L H H H H L L H H H H L H H H L L L H H H L L H H Min Max Unit -20 " -57 " mA " " " " " " " " " GND VCC VCC 30 30 B A A B B B B A A B A A A A B B B A A A A B A A A B A All outputs " " " " " " " " " " " " " " " " " " " " " " " " " H or L as shown 3/ " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/2G 60 8 2/ 4/ B B B B B B A A A A A A B B B A B B B A A A A A A B B 10 8 GND 3 B B B B A A A A A A A B B A A A A A A B A A A A A A A 9 9 Q2 GND " Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 8 10 Preset 2 5.5 V " 2 7 2/ 4/ TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " 7 11 Clock 2 TABLE III. Group A inspection for device type 07. 1/ - Continued. Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 9 TC = 25C FMAX " (Fig. 11) " 82 83 " " " " " " 84 85 " tPLH 3003 ((Fig. 10) 86 " " " 87 " " " 88 1 3 Clock 1 IN IN 2 2 D1 E E 3 1 Clear 1 5.0 V 5.0 V 4 14 VCC IN 6 12 D2 7 11 Clock 2 8 10 Preset 2 9 9 Q2 10 8 Q 2 5.0 V " " " IN 5 13 Clear 2 GND " 5.0 V 5.0 V E E IN IN 5.0 V 5.0 V OUT OUT " 12 6 Q 1 OUT OUT IN OUT 14 4 Preset 1 5.0 V 5.0 V Test limits Meas. terminal Q1 Q 1 Q2 Q 2 OUT " IN 13 5 Q1 " " " " " 11 7 GND OUT Min Max Unit 10 " MHz " " " " " IN Clear 1 5 25 ns IN to Q 1 Preset 1 to Q1 Clear 2 " " " " " " " to Q 2 " " " 89 " tPHL " 90 IN " " IN IN OUT " " " " " 91 IN " " OUT OUT IN IN Preset 2 to Q2 Clear 1 to Q1 Preset 1 " " " " 33 " " 36 " " 36 " to Q 1 " " " 92 " IN IN IN OUT " " " 93 " tPLH 94 IN IN (A) B " " " " 3003 5/ (Fig. 11) (Fig. 12) 95 IN IN (A) 5.0 V " " 61 " " (Fig. 11) 96 " B IN (A) IN 5.0 V " " (Fig. 12) 97 " 5.0 V IN (A) IN B OUT " Clear 2 " OUT OUT OUT 5.0 V B to Q 1 Clock 2 to Q2 Clock 2 " OUT to Q 2 Preset 2 to Q2 Clock 1 to Q1 Clock 1 " " 33 " 5 25 ns " " " " " " " " " " 33 " " " " " " " " " " to Q 2 " tPHL (Fig. 12) 98 IN IN (B) 5.0 V " " " " (Fig. 11) 99 IN IN (B) B " " " " (Fig. 12) 100 " 5.0 V IN (B) IN B " " (Fig. 11) 101 " B IN (B) IN 5.0 V OUT " OUT " OUT OUT B 5.0 V Clock 1 to Q1 Clock 1 to Q 1 Clock 2 to Q2 Clock 2 to Q 2 See notes at end of device type 07. MIL-M-38510/2G " IN TABLE III. Group A inspection for device type 07. 1/ - Continued. Subgroup Symbol MIL-STD883 method Case A, B D Case C Test No. 10 TC = 125C FMAX 6/ " (Fig. 11) " 102 103 " " " " " " 104 105 " tPLH 3003 ((Fig. 10) 106 " " 107 " " 108 " 1 3 Clock 1 IN IN 2 2 D1 E E 3 1 Clear 1 5.0 V 5.0 V 4 14 VCC IN 6 12 D2 7 11 Clock 2 8 10 Preset 2 9 9 Q2 10 8 Q 2 5.0 V " " " IN 5 13 Clear 2 GND " 5.0 V 5.0 V E E IN IN 5.0 V 5.0 V OUT OUT " 12 6 Q 1 OUT OUT IN OUT 14 4 Preset 1 5.0 V 5.0 V Test limits Meas. terminal Q1 Q 1 Q2 Q 2 OUT " IN 13 5 Q1 " " " " " 11 7 GND OUT Min Unit 10 " MHz " " " " " IN Clear 1 5 IN to Q 1 Preset 1 to Q1 Clear 2 " " Max 31 ns " " " " " " " " 39 " " 42 " " 42 " to Q 2 " " " 109 " tPHL " 110 IN " " " 111 IN " " " " IN IN OUT " OUT OUT IN IN Preset 2 to Q2 Clear 1 to Q1 Preset 1 to Q 1 " " " 112 " " IN IN IN IN OUT " " 113 " tPLH 114 IN IN (A) B " " " " 3003 5/ (Fig. 11) (Fig. 12) 115 IN IN (A) 5.0 V " " 62 " (Fig. 11) 116 " B IN (A) IN 5.0 V " " (Fig. 12) 117 " 5.0 V IN (A) IN B Preset 2 " OUT OUT OUT 5.0 V B to Q 1 Clock 2 to Q2 Clock 2 " OUT to Q 2 Clear 2 to Q2 Clock 1 to Q1 Clock 1 " " 39 " 5 31 ns " " " " " " " " " " 39 " " " " " " " " " " to Q 2 " tPHL (Fig. 12) 118 IN IN (B) 5.0 V " " " " (Fig. 11) 119 IN IN (B) B " " " " (Fig. 12) 120 " 5.0 V IN (B) IN B " " (Fig. 11) 121 " B IN (B) IN 5.0 V OUT " OUT " OUT OUT B 5.0 V Clock 1 to Q1 Clock 1 to Q 1 Clock 2 to Q2 Clock 2 to Q 2 11 Same tests, terminal conditions and limits as for subgroup 10, except TC = -55C. NOTES: A = Normal clock pulse. B = Momentary GND, then 4.5 V. E = Input D connected to Q . 1/ Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). 2/ Input voltages shown are: A = 2.0 V minimum and B = 0.8 V maximum. 3/ Output voltages shall be either: (a) H = 2.4 V, minimum and L = 0.4 V, maximum when using a high speed checker double comparator; or (b) H 1.5 V and L < 1.5 V when using a high speed checker single comparator. 4/ Tests shall be performed in sequence. 5/ Tests shall be performed for both D input pulses (A and B). 6/ FMAX, minimum limit specified is the frequency of the input pulse. The output frequency shall be one-half of the input frequency. MIL-M-38510/2G " " OUT " MIL-M-38510/2G 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature which may be helpful, but is not mandatory.) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirements for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective action, and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements shall not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. I Requirements for "JAN" marking. j. Packaging Requirements (see 5.1) 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43218-3990. 6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 63 MIL-M-38510/2G 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535, MIL-HDBK-1331, and as follows: GND ............................................ Electrical ground (common terminal) VIN ............................................... Voltage level at an input terminal 6.6 Logistic support. Lead materials and finishes (see 3.4) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer length leads and lead forming should not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-38510 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type____ Generic-industry type_____ 01 01 01 02 02 02 03 03 03 04 04 04 05 05 06 07 07 SN5472 (Circuit A) DM5472 (Circuit B) MC5472 (Circuit C) SN5473 (Circuit A) DM5473 (Circuit B) S5473 (Circuit C) SN54107 (Circuit A) DM54107 (Circuit B) S54107 (Circuit C) SN5476 (Circuit A) DM5476 (Circuit B) S5476 (Circuit C) 5474 (Circuit A) DM5474 (Circuit B) 5470 SN5479 (Circuit A) MC5479 (Circuit B) 6.8 Change from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue, due to the extensiveness of the changes. 64 MIL-M-38510/2G Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Preparing activity: DLA - CC Review activities: Army - SM, MI Navy - AS, CG, MC, SH TD Air Force - 03, 19, 99 (Project 5962-2096) NOTE: The activities listed above were interested in this document as of the date of this document. Since organization and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil. 65