LP2997
LP2997 DDR-II Termination Regulator
Literature Number: SNVS295D
LP2997
March 28, 2011
DDR-II Termination Regulator
General Description
The LP2997 linear regulator is designed to meet the JEDEC
SSTL-18 specifications for termination of DDR-II memory.
The device contains a high-speed operational amplifier to
provide excellent response to load transients. The output
stage prevents shoot through while delivering 500mA contin-
uous current and transient peaks up to 900mA in the appli-
cation as required for DDR-II SDRAM termination. The
LP2997 also incorporates a VSENSE pin to provide superior
load regulation and a VREF output as a reference for the
chipset and DIMMs.
An additional feature found on the LP2997 is an active low
shutdown (SD) pin that provides Suspend To RAM (STR)
functionality. When SD is pulled low the VTT output will tri-
state providing a high impedance output, but, VREF will remain
active. A power savings advantage can be obtained in this
mode through lower quiescent current.
Features
Source and sink current
Low output voltage offset
No external resistors required
Linear topology
Suspend to Ram (STR) functionality
Low external component count
Thermal Shutdown
Available in SO-8, PSOP-8 packages
Applications
DDR-II Termination Voltage
SSTL-18 Termination
Typical Application Circuit
20109418
© 2011 National Semiconductor Corporation 201094 www.national.com
LP2997 DDR-II Termination Regulator
Connection Diagrams
20109403
PSOP-8 Layout
20109404
SO-8 Layout
Pin Descriptions
SO-8 Pin or PSOP-8 Pin Name Function
1 GND Ground
2 SD Shutdown
3 VSENSE Feedback pin for regulating VTT.
4 VREF Buffered internal reference voltage of VDDQ/2
5 VDDQ Input for internal reference equal to VDDQ/2
6 AVIN Analog input pin
7 PVIN Power input pin
8 VTT Output voltage for connection to termination resistors
EP Exposed pad thermal connection Connect to soft Ground
Ordering Information
Order Number Package Type NSC Package Drawing Supplied As
LP2997M SO-8 M08A 95 Units per Rail
LP2997MX SO-8 M08A 2500 Units Tape and Reel
LP2997MR PSOP-8 MRA08A 95 Units Tape and Reel
LP2997MRX PSOP-8 MRA08A 2500 Units Tape and Reel
www.national.com 2
LP2997
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
AVIN to GND −0.3V to +6V
PVIN to GND -0.3V to AVIN
VDDQ (Note 2) −0.3V to +6V
Storage Temp. Range −65°C to +150°C
Junction Temperature 150°C
Lead Temperature (Soldering, 10 sec) 260°C
SO-8 Thermal Resistance (θJA)151°C/W
PSOP-8 Thermal Resistance (θJA)43°C/W
Minimum ESD Rating (Note 3) 1kV
Operating Range
Junction Temp. Range (Note 4) 0°C to +125°C
AVIN to GND 2.2V to 5.5V
Electrical Characteristics Specifications with standard typeface are for TJ = 25°C and limits in boldface type
apply over the full Operating Temperature Range (TJ = 0°C to +125°C) (Note 5). Unless otherwise specified,
AVIN = 2.5V, PVIN = 1.8V, VDDQ = 1.8V.
Symbol Parameter Conditions Min Typ Max Units
VREF VREF Voltage PVIN = VDDQ = 1.7V
PVIN = VDDQ = 1.8V
PVIN = VDDQ = 1.9V
0.837
0.887
0.936
0.860
0.910
0.959
0.887
0.937
0.986
V
ZVREF VREF Output Impedance IREF = -30 to +30 μA 2.5 k
VTT VTT Output Voltage IOUT = 0A
PVIN = VDDQ = 1.7V
PVIN = VDDQ = 1.8V
PVIN = VDDQ = 1.9V
0.822
0.874
0.923
0.856
0.908
0.957
0.887
0.939
0.988 V
IOUT = ±0.5A (Note 8)
PVIN = VDDQ = 1.7V
PVIN = VDDQ = 1.8V
PVIN = VDDQ = 1.9V
0.828
0.878
0.928
0.856
0.908
0.957
0.890
0.940
0.990
VosTT/VTT VTT Output Voltage Offset
(VREF-VTT)
IOUT = 0A
IOUT = -0.5A
IOUT = +0.5A
-25
-25
-25
0
0
0
25
25
25
mV
IQQuiescent Current (Note 6) IOUT = 0A (Note 6) 320 500 µA
ZVDDQ VDDQ Input Impedance 100 k
ISD Quiescent Current in
Shutdown (Note 6)
SD = 0V 115 150 µA
IQ_SD Shutdown Leakage Current SD = 0V 2 5µA
VIH Minimum Shutdown High
Level
1.9 V
VIL Maximum Shutdown Low
Level
0.8 V
ISENSE VSENSE Input Current 13 nA
TSD Thermal Shutdown (Note 7) 165 Celsius
TSD_HYS Thermal Shutdown
Hysteresis
10 Celsius
3 www.national.com
LP2997
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics.
The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under
the listed test conditions.
Note 2: VDDQ voltage must be less than 2 x (AVIN - 1) or 6V, whichever is smaller.
Note 3: The human body model is a 100pF capacitor discharged through a 1.5k resistor into each pin.
Note 4: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θJA = 151.2° C/W
junction to ambient with no heat sink.
Note 5: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality
Control (SQC) methods. The limits are used to calculate National's Average Outgoing Quality Level (AOQL).
Note 6: Quiescent current defined as the current flow into AVIN.
Note 7: The maximum allowable power dissipation is a function of the maximum junction temperature, TJ(MAX), the junction to ambient thermal resistance, θJA,
and the ambient temperature, TA. Exceeding the maximum allowable power dissipation will cause excessive die temperature and the regulator will go into thermal
shutdown.
Note 8: VTT load regulation is tested by using a 10 ms current pulse and measuring VTT.
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LP2997
Typical Performance Characteristics
Iq vs AVIN in SD
20109420
Iq vs AVIN
20109421
VIH and VIL
20109422
VREF vs VDDQ
20109424
VTT vs VDDQ
20109426
Iq vs AVIN in SD Temperature
20109427
5 www.national.com
LP2997
Iq vs AVIN Temperature
20109428
Maximum Sourcing Current vs AVIN
(VDDQ = 1.8V, PVIN = 1.8V)
20109435
Maximum Sinking Current vs AVIN
(VDDQ = 1.8V)
20109436
Block Diagram
20109405
www.national.com 6
LP2997
Description
The LP2997 is a linear bus termination regulator designed to
meet the JEDEC requirements of SSTL-18. The output, VTT
is capable of sinking and sourcing current while regulating the
output voltage equal to VDDQ / 2. The output stage has been
designed to maintain excellent load regulation while prevent-
ing shoot through. The LP2997 also incorporates two distinct
power rails that separates the analog circuitry from the power
output stage. This allows a split rail approach to be utilized to
decrease internal power dissipation. It also permits the
LP2997 to provide a termination solution for the next gener-
ation of DDR-SDRAM memory (DDRII).
Pin Descriptions
AVIN AND PVIN
AVIN and PVIN are the input supply pins for the LP2997. AVIN
is used to supply all the internal control circuitry. PVIN, how-
ever, is used exclusively to provide the rail voltage for the
output stage used to create VTT. These pins have the capa-
bility to work off separate supplies, under the condition that
AVIN is always greater than or equal to PVIN. For SSTL-18
applications, it is recommended to connect PVIN to the 1.8V
rail used for the memory core and AVIN to a rail within its
operating range of 2.2V to 5.5V (typically a 2.5V supply). PVIN
should always be used with either a 1.8V or 2.5V rail. This
prevents the thermal limit from tripping because of excessive
internal power dissipation. If the junction temperature ex-
ceeds the thermal shutdown than the part will enter a shut-
down state identical to the manual shutdown where VTT is tri-
stated and VREF remains active. A lower rail such as 1.5V can
be used but it will reduce the maximum output current, there-
fore it is not recommended for most termination schemes.
VDDQ
VDDQ is the input used to create the internal reference volt-
age for regulating VTT. The reference voltage is generated
from a resistor divider of two internal 50k resistors. This
guarantees that VTT will track VDDQ / 2 precisely. The optimal
implementation of VDDQ is as a remote sense. This can be
achieved by connecting VDDQ directly to the 1.8V rail at the
DIMM instead of PVIN. This ensures that the reference volt-
age tracks the DDR memory rails precisely without a large
voltage drop from the power lines. For SSTL-18 applications
VDDQ will be a 1.8V signal, which will create a 0.9V termina-
tion voltage at VTT (See Electrical Characteristics Table for
exact values of VTT over temperature).
VSENSE
The purpose of the sense pin is to provide improved remote
load regulation. In most motherboard applications the termi-
nation resistors will connect to VTT in a long plane. If the output
voltage was regulated only at the output of the LP2997 then
the long trace will cause a significant IR drop resulting in a
termination voltage lower at one end of the bus than the other.
The VSENSE pin can be used to improve this performance, by
connecting it to the middle of the bus. This will provide a better
distribution across the entire termination bus. If remote load
regulation is not used then the VSENSE pin must still be con-
nected to VTT. Care should be taken when a long VSENSE trace
is implemented in close proximity to the memory. Noise pick-
up in the VSENSE trace can cause problems with precise
regulation of VTT. A small 0.1uF ceramic capacitor placed next
to the VSENSE pin can help filter any high frequency signals
and preventing errors.
SHUTDOWN
The LP2997 contains an active low shutdown pin that can be
used for suspend to RAM functionality. In this condition the
VTT output will tri-state while the VREF output remains active
providing a constant reference signal for the memory and
chipset. During shutdown VTT should not be exposed to volt-
ages that exceed PVIN. With the shutdown pin asserted low
the quiescent current of the LP2997 will drop, however, VD-
DQ will always maintain its constant impedance of 100k for
generating the internal reference. Therefore, to calculate the
total power loss in shutdown both currents need to be con-
sidered. For more information refer to the Thermal Dissipation
section. The shutdown pin also has an internal pull-up current;
therefore, to turn the part on the shutdown pin can either be
connected to AVIN or left open
VREF
VREF provides the buffered output of the internal reference
voltage VDDQ / 2. This output should be used to provide the
reference voltage for the Northbridge chipset and memory.
Since these inputs are typically an extremely high impedance,
there should be little current drawn from VREF. For improved
performance, an output bypass capacitor can be used, locat-
ed close to the pin, to help with noise. A ceramic capacitor in
the range of 0.1 µF to 0.01 µF is recommended. This output
remains active during the shutdown state and thermal shut-
down events for the suspend to RAM functionality.
VTT
VTT is the regulated output that is used to terminate the bus
resistors. It is capable of sinking and sourcing current while
regulating the output precisely to VDDQ / 2. The LP2997 is
designed to handle continuous currents of up to +/- 0.5A with
excellent load regulation. If a transient is expected to last
above the maximum continuous current rating for a significant
amount of time, then the bulk output capacitor should be sized
large enough to prevent an excessive voltage drop. If the
LP2997 is to operate in elevated temperatures for long dura-
tions care should be taken to ensure that the maximum junc-
tion temperature is not exceeded. Proper thermal de-rating
should always be used. (Please refer to the Thermal Dissi-
pation section) If the junction temperature exceeds the ther-
mal shutdown point than VTT will tri-state until the part returns
below the temperature hysteresis trip-point
Component Selections
INPUT CAPACITOR
The LP2997 does not require a capacitor for input stability,
but it is recommended for improved performance during large
load transients to prevent the input rail from dropping. The
input capacitor should be located as close as possible to the
PVIN pin. Several recommendations exist dependent on the
application required. A typical value recommended for AL
electrolytic capacitors is 22 µF. Ceramic capacitors can also
be used. A value in the range of 10 µF with X5R or better
would be an ideal choice. The input capacitance can be re-
duced if the LP2997 is placed close to the bulk capacitance
from the output of the 1.8V DC-DC converter. For the AVIN
pin, a small 0.1uF ceramic capacitor is sufficient to prevent
excessive noise from coupling into the device.
OUTPUT CAPACITOR
The LP2997 has been designed to be insensitive of output
capacitor size or ESR (Equivalent Series Resistance). This
allows the flexibility to use any capacitor desired. The choice
for output capacitor will be determined solely on the applica-
7 www.national.com
LP2997
tion and the requirements for load transient response of VTT.
As a general recommendation the output capacitor should be
sized above 100 µF with a low ESR for SSTL applications with
DDR-SDRAM. The value of ESR should be determined by the
maximum current spikes expected and the extent at which the
output voltage is allowed to droop. Several capacitor options
are available on the market and a few of these are highlighted
below:
AL - It should be noted that many aluminum electrolytics only
specify impedance at a frequency of 120 Hz, which indicates
they have poor high frequency performance. Only aluminum
electrolytics that have an impedance specified at a higher fre-
quency (100 kHz) should be used for the LP2997. To improve
the ESR several AL electrolytics can be combined in parallel
for an overall reduction. An important note to be aware of is
the extent at which the ESR will change over temperature.
Aluminum electrolytic capacitors can have their ESR rapidly
increase at cold temperatures.
Ceramic - Ceramic capacitors typically have a low capaci-
tance, in the range of 10 to 100 µF range, but they have
excellent AC performance for bypassing noise because of
very low ESR (typically less than 10 m). However, some
dielectric types do not have good capacitance characteristics
as a function of voltage and temperature. Because of the typ-
ically low value of capacitance it is recommended to use
ceramic capacitors in parallel with another capacitor such as
an aluminum electrolytic. A dielectric of X5R or better is rec-
ommended for all ceramic capacitors.
Hybrid - Several hybrid capacitors such as OS-CON and SP
are available from several manufacturers. These offer a large
capacitance while maintaining a low ESR. These are the best
solution when size and performance are critical, although
their cost is typically higher than any other capacitors.
Thermal Dissipation
Since the LP2997 is a linear regulator any current flow from
VTT will result in internal power dissipation generating heat.
To prevent damaging the part from exceeding the maximum
allowable junction temperature, care should be taken to der-
ate the part dependent on the maximum expected ambient
temperature and power dissipation. The maximum allowable
internal temperature rise (TRmax) can be calculated given the
maximum ambient temperature (TAmax) of the application and
the maximum allowable junction temperature (TJmax).
TRmax = TJmax − TAmax
From this equation, the maximum power dissipation (PDmax)
of the part can be calculated:
PDmax = TRmax / θJA
The θJA of the LP2997 will be dependent on several variables:
the package used; the thickness of copper; the number of vias
and the airflow. For instance, the θJA of the SO-8 is 163°C/W
with the package mounted to a standard 8x4 2-layer board
with 1oz. copper, no airflow, and 0.5W dissipation at room
temperature. This value can be reduced to 151.2°C/W by
changing to a 3x4 board with 2 oz. copper that is the JEDEC
standard. Figure 1 shows how the θJA varies with airflow for
the two boards mentioned.
20109407
FIGURE 1. θJA vs Airflow (SO-8)
Additional improvements can be made by the judicious use of
vias to connect the part and dissipate heat to an internal
ground plane. Using larger traces and more copper on the top
side of the board can also help. With careful layout it is pos-
sible to reduce the θJA further than the nominal values shown
in Figure 1
Optimizing the θJA and placing the LP2997 in a section of a
board exposed to lower ambient temperature allows the part
to operate with higher power dissipation. The internal power
dissipation can be calculated by summing the three main
sources of loss: output current at VTT, either sinking or sourc-
ing, and quiescent current at AVIN and VDDQ. During the
active state (when shutdown is not held low) the total internal
power dissipation can be calculated from the following equa-
tions:
PD = PAVIN + PVDDQ + PVTT
Where,
PAVIN = IAVIN * VAVIN
PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ
To calculate the maximum power dissipation at VTT both con-
ditions at VTT need to be examined, sinking and sourcing
current. Although only one equation will add into the total,
VTT cannot source and sink current simultaneously.
PVTT = VVTT x ILOAD (Sinking) or
PVTT = ( VPVIN - VVTT) x ILOAD (Sourcing)
The power dissipation of the LP2997 can also be calculated
during the shutdown state. During this condition the output
VTT will tri-state, therefore that term in the power equation will
disappear as it cannot sink or source any current (leakage is
negligible). The only losses during shutdown will be the re-
duced quiescent current at AVIN and the constant impedance
that is seen at the VDDQ pin.
PD = PAVIN + PVDDQ
PAVIN = IAVIN x VAVIN
PVDDQ = VVDDQ * IVDDQ = VVDDQ2 x RVDDQ
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LP2997
Typical Application Circuits
Several different application circuits have been shown to il-
lustrate some of the options that are possible in configuring
the LP2997. Graphs of the individual circuit performance can
be found in the Typical Performance Characteristics section
in the beginning of the datasheet. These curves illustrate how
the maximum output current is affected by changes in AVIN
and PVIN.
Figure 2 shows the recommended circuit configuration for
DDR-II applications. The output stage is connected to the
1.8V rail and the AVIN pin can be connected to either a 2.5V,
3.3V or 5V rail.
This circuit permits termination in a minimum amount of board
space and component count. Capacitor selection can be var-
ied depending on the number of lines terminated and the
maximum load transient. However, with motherboards and
other applications where VTT is distributed across a long plane
it is advisable to use multiple bulk capacitors and addition to
high frequency decoupling. The bulk output capacitors should
be situated at both ends of the VTT plane for optimal place-
ment. Large aluminum electrolytic capacitors are used for
their low ESR and low cost.
20109413
FIGURE 2. Recommended DDR-II Termination
PCB Layout Considerations
1. The input capacitor for the power rail should be placed
as close as possible to the PVIN pin.
2. VSENSE should be connected to the VTT termination bus
at the point where regulation is required. For
motherboard applications an ideal location would be at
the center of the termination bus.
3. VDDQ can be connected remotely to the VDDQ rail input at
either the DIMM or the Chipset. This provides the most
accurate point for creating the reference voltage.
4. For improved thermal performance excessive top side
copper should be used to dissipate heat from the
package. Numerous vias from the ground connection to
the internal ground plane will help. Additionally these can
be located underneath the package if manufacturing
standards permit.
5. Care should be taken when routing the VSENSE trace to
avoid noise pickup from switching I/O signals. A 0.1uF
ceramic capacitor located close to the SENSE can also be
used to filter any unwanted high frequency signal. This
can be an issue especially if long SENSE traces are used.
6. VREF should be bypassed with a 0.01 µF or 0.1 µF
ceramic capacitor for improved performance. This
capacitor should be located as close as possible to the
VREF pin.
9 www.national.com
LP2997
Physical Dimensions inches (millimeters) unless otherwise noted
8-Lead Small Outline Package (M8)
NS Package Number M08A
8-Lead PSOP Package (PSOP-8)
NS Package Number MRA08A
www.national.com 10
LP2997
Notes
11 www.national.com
LP2997
Notes
LP2997 DDR-II Termination Regulator
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