_TLE4997x_Data_Sheet.book Page 1 Wednesday, October 1, 2008 5:08 PM Data Sheet, V 2.08, September 2008 TLE4997 Programmable Linear Hall Sensor Sensors N e v e r s t o p t h i n k i n g . _TLE4997x_Data_Sheet.book Page 2 Wednesday, October 1, 2008 5:08 PM Edition 2008-09 Published by Infineon Technologies AG, Am Campeon 1-12, 85579 Neubiberg, Germany (c) Infineon Technologies AG 2008. All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be considered as a guarantee of characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descriptions and charts stated herein. Information For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. _TLE4997x_Data_Sheet.book Page 3 Wednesday, October 1, 2008 5:08 PM TLE4997 Revision History: 2008-09 V 2.08 Previous Version: V 2.07, July 2008 Page Subjects (major changes since last revision) 12 Table 2: ESD specification (HBM) changed from 2kV to 4kV general spelling and typing errors We Listen to Your Comments Any information within this document that you feel is wrong, unclear or missing at all? Your feedback will help us to continuously improve the quality of this document. Please send your proposal (including a reference to this document) to: sensors@infineon.com _TLE4997x_Data_Sheet.book Page 4 Wednesday, October 1, 2008 5:08 PM TLE4997 Table of Contents Page 1 1.1 1.2 1.3 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Target Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 2.1 2.2 2.3 2.4 2.5 General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Principle of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Further Notes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Transfer Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4 Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5 Electrical and Magnetic Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 6 6.1 6.2 6.3 6.4 6.5 6.6 Signal Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Magnetic Field Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Gain Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Offset Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DSP Input Low Pass Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DAC Input Interpolation Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Clamping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 18 19 19 20 22 23 7 7.1 7.2 7.3 Error Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Voltages Outside the Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . . Open Circuit of Supply Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Not Correctable EEPROM Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 25 25 26 8 8.1 Temperature Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Parameter Calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 9 9.1 9.2 9.3 Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Calibration Data Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Programming Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Laboratory Evaluation Programmer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 Application Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 11 Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 Data Sheet 4 7 7 8 8 29 30 31 31 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 5 Wednesday, October 1, 2008 5:08 PM TLE4997 List of Figures Figure 1 Figure 2 Figure 3 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Figure 10 Figure 11 Data Sheet Page Pin Configuration and Hall Cell Location . . . . . . . . . . . . . . . . . . . . . . . . 8 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 Examples of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 Ratiometry Error Band . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 Signal Processing Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 DSP Input Filter (Magnitude Plot) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 DAC Input Filter (Magnitude Plot) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 Clamping Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 EEPROM Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 Application Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 PG-SSO-3-10 (Plastic Green Single Small Outline Package) . . . . . . . 33 5 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 6 Wednesday, October 1, 2008 5:08 PM TLE4997 List of Tables Table 1 Table 2 Table 3 Table 4 Table 5 Table 6 Table 7 Table 8 Table 9 Table 10 Table 11 Table 12 Table 13 Table 14 Table 15 Table 16 Table 17 Table 18 Data Sheet Page Pin Definitions and Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 Magnetic Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 Range Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 Gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 Low Pass Filter Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Low Pass Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 Clamping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 Undervoltage and Overvoltage (All values with RL 10k). . . . . . . . . . 25 Open Circuit (OBD Parameters) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 EEPROM Error Signalling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 Temperature Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 Calibration Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 Programming Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 6 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 7 Wednesday, October 1, 2008 5:08 PM Programmable Linear Hall Sensor 1 Overview 1.1 Features TLE4997 * High linear and ratiometric push-pull rail-to-rail output signal * 20-bit Digital Signal Processing * Digital temperature compensation * 12-bit overall resolution * Operates from -40C up to 150C * Low drift of output signal over temperature and lifetime * Programmable parameters stored in EEPROM with single bit error correction: - magnetic range and magnetic sensitivity (gain) - zero field voltage (offset) - bandwidth - polarity of the output slope - clamping option - temperature coefficient for all common magnets - memory lock * Re-programmable until memory lock * Single supply voltage 4.5 - 5.5 V (4 - 7 V in extended range) * Operation between -200 mT and +200 mT within three ranges * Slim 3-pin package (Green) * Reverse polarity and overvoltage protection for all pins * Output short circuit protection * On-board diagnostics (wire breakage detection, undervoltage, overvoltage) * Digital readout of internal temperature and magnetic field values in calibration mode. * Individual programming and operation of multiple sensors with common power supply * Two-point calibration of magnetic transfer function * Precise calibration without iteration steps * High immunity against mechanical stress, EMC, ESD Type Marking Ordering Code Package TLE4997 4997E2 SP000235288 PG-SSO-3-10 Data Sheet 7 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 8 Wednesday, October 1, 2008 5:08 PM TLE4997 Overview 1.2 Target Applications * Robust replacement of potentiometers - No mechanical abrasion - Resistant to humidity, temperature, pollution and vibration * Linear and angular position sensing in automotive applications like pedal position, suspension control, valve or throttle position, headlight levelling and steering angle * High current sensing for battery management, motor control, and electronic fuse 1.3 Pin Configuration Figure 1 shows the location of the Hall element in the chip and the distance between the Hall probe and the surface of the package. 0.38 0.05 2.03 0.1 1.625 0.1 Center of Hall Probe Branded Side Hall-Probe 1 2 3 AEP03717 Figure 1 Pin Configuration and Hall Cell Location Table 1 Pin Definitions and Functions Pin No. Symbol Function 1 VDD Supply voltage / programming interface 2 GND Ground 3 OUT Output voltage / programming interface Data Sheet 8 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 9 Wednesday, October 1, 2008 5:08 PM TLE4997 General 2 General 2.1 Block Diagram Figure 2 shows a simplified block diagram. VDD Interface Supply Bias EEPROM A HALL enable D D VDD DSP Temp. Sense OUT A A D OBD GND ROM Figure 2 2.2 Block Diagram Functional Description The linear Hall IC TLE4997has been designed specifically to meet the demands of highly accurate rotation and position detection, as well as for current measurement applications. The sensor provides a ratiometric analog output voltage, which is ideally suited to Analog-to-Digital (A/D) conversion with the supply voltage as a reference. The IC is produced in BiCMOS technology with high voltage capability and also provides reverse polarity protection. Digital signal processing using a 16-bit DSP architecture and digital temperature compensation guarantees excellent stability over a long period of time. The minimum overall resolution is 12 bits. Nevertheless, some internal stages work with resolutions up to 20 bits. Data Sheet 9 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 10 Wednesday, October 1, 2008 5:08 PM TLE4997 General 2.3 Principle of Operation * A magnetic flux is measured by a Hall-effect cell. * The output signal from the Hall-effect cell is converted from Analog to Digital signals. * The chopped Hall-effect cell and continuous-time A to D conversion provide very low and stable magnetic offset. * A programmable Low-Pass filter reduces the noise. * The temperature is measured and A to D converted. * Temperature compensation is processed digitally using a second order function. * Digital processing of output voltage is based on zero field and sensitivity value. * The output voltage range can be clamped by digital limiters. * The final output value is D to A converted. * The output voltage is proportional to the supply voltage (ratiometric DAC). * An On-Board-Diagnostics (OBD) circuit connects the output to VDD or GND in case of errors. 2.4 Further Notes Product qualification is based on "AEC Q100 Rev. G" (Automotive Electronics Council Stress test qualification for integrated circuits). Data Sheet 10 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 11 Wednesday, October 1, 2008 5:08 PM TLE4997 General 2.5 Transfer Functions The examples in Figure 3 show how easily different magnetic field ranges can be mapped to the output voltage. * Polarity Mode: - Unipolar: Only North- or South-oriented magnetic fields are measured. - Bipolar: Magnetic fields can be measured in both orientations. The limit points must not be symmetric to the zero field point. * Inversion: The gain values can be set positive or negative. B (mT) VOUT (V) 50 5 100 0 0 0 -50 VOUT (V) B (mT) 5 200 0 VOUT -100 Example 1: - Bipolar Figure 3 B (mT) VOUT (V) 5 0 VOUT 0 -200 Example 2: - Unipolar - Big offset - Output for 3.3 V Example 3: - Bipolar - Inverted (neg. gain) Examples of Operation Note: Due to the ratiometry, voltage drops at the VDD line are imaged in the output signal. Data Sheet 11 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 12 Wednesday, October 1, 2008 5:08 PM TLE4997 Maximum Ratings 3 Maximum Ratings Table 2 Absolute Maximum Ratings Parameter Symbol Limit Values min. Unit Notes max. TST TJ VDD -40 150 C -40 170 C For 96h 1) -20 2) 20 3) V 4) Supply current @ overvoltage IDDov - 52 mA Supply current @ reverse voltage IDDrev - 75 - mA -16 5) 16 3) V Storage temperature Junction temperature Voltage on VDD pins with respect to ground (VSS) Voltage on output pin with VOUTov respect to ground (VSS) Magnetic field BMAX - unlimited T ESD protection VESD - 4.0 kV RTHja 150 K/W RTHja 150 K/W Vout may be > VDD According HBM JESD22-A114-B 6) 1) For limited time only. Depends on customer temperature lifetime cycles. Please ask for support by Infineon. 2) max 24 h @ -50C Ta < 30C max 10 min. @ 30C Ta < 80C max 30 sec. @ 80C Ta < 125C max 15 sec. @ 125C Ta 150C. 3) max. 24 h @ TJ < 80C. 4) Guaranteed by laboratory characterization, tested at 18V. 5) Max. 1 ms @ TJ < 30C; -8.5 V for 100 h @ TJ < 80C. 6) 100 pF and 1.5 k Note: Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Furthermore, only single error cases are assumed. More than one stress/error case may also damage the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. During absolute maximum rating overload conditions (VIN > VDD or VIN < VSS) the voltage on VDD pins with respect to ground (VSS) must not exceed the values defined by the absolute maximum ratings. Data Sheet 12 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 13 Wednesday, October 1, 2008 5:08 PM TLE4997 Operating Range 4 Operating Range The following operating conditions must not be exceeded in order to ensure correct operation of the TLE4997. All parameters specified in the following sections of this document refer to these operating conditions, unless otherwise indicated. Table 3 Operating Range Parameter Symbol Limit Values Unit Notes min. max. 4.5 5.5 V 4 7 V Extended range 1) IOUT RL -1 1 mA 2) 10 10 - k Pull-down to GND Pull-up to VDD 0 210 nF Junction temperature 3) CL TJ -40 125 150 C Useful lifetime tLive - 16 years Supply voltage Output current Load resistance Load capacitance VDD 1) For reduced output accuracy. 2) For VOUT within the range of 5% ... 95% of VDD. 3) RTHja 150 K/W. 4) For reduced magnetic accuracy. 5) Not additive. For 5000h For 1000h4) 5) Note: Keeping signal levels within the limits specified in this table ensures operation without overload conditions. Data Sheet 13 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 14 Wednesday, October 1, 2008 5:08 PM TLE4997 Electrical and Magnetic Parameters 5 Electrical and Magnetic Parameters Table 4 Electrical Characteristics Parameter Symbol Limit Values Unit Notes 95 94 % of For TA 120C For TA > 120C min. typ. max. Output voltage range Supply current Output current @ OUT shorted to supply lines Zero field voltage Zero field voltage drift VOUT IDD IOUTsh 5 6 - 3 7.5 10 mA 1) -30 - 30 mA For operating supply voltage range only 100 % Of VDD 2) 10 mV In lifetime 3) 10 mV Error band ov. temp.4) VZERO -100 VZERO -10 -10 Ratiometry error Thermal resistance Power on time ERAT RthJA RthJC tPon VDDpon Output DAC quantization VOUT Power On Reset level Output DAC resolution - Output DAC bandwidth fDAC Vnoise Output noise Differential non-linearity Signal delay DNL tDS - VDD -0.25 - +0.25 % Of VDD4)5) - - 219 K/W Junction to air - - 47 K/W Junction to case - - 1 10 ms VOUT 5% of VDD VOUT 1% of VDD 2 - 4 V 1.22 mV 12 bit @ VDD = 5 V 3.2 - kHz Interpolation filter 6) - - 4.68 mVpp 5% exceeded 7)8) -1 - 1 LSB Of output DAC - - 250 s @ 100 Hz 9) - 1) Also in extended VDD range. For VOUT within the range of 5%... 95% of VDD, IOUT= 0mA. 2) Programmable in steps of 1.22 mV ( @ VDD = 5V ). 3) For Sensitivity S 25 mV/mT. For higher sensitivities the magnetic offset drift is dominant. This means that for the precalibrated (typical) 60mV/mT sensitivity the typical output drift might be given due to the allowed magnetic offset tolerence up to 0.4mT x 60 mV/mT = 24 mV. 4) For 4.5 VVDD5.5 V and within nominal VOUT range; see "Ratiometry" on Page 15 for details on ERAT. 5) For the maximum error in the extended voltage range, see "Ratiometry" on Page 15. 6) More information, see "DAC Input Interpolation Filter" on Page 22. 7) 100 mT range, sensitivity 60 mV/mT, LP-filter 244 Hz, 160 Hz external RC low pass filter as application circuit. 8) '5% exceeded' means that 5 of 100 continuously measured VOUT samples are out of limit. 9) A sinusoidal magnetic field is applied, VOUT shows amplitude of 20% of VDD, no LP filter is selected. Data Sheet 14 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 15 Wednesday, October 1, 2008 5:08 PM TLE4997 Electrical and Magnetic Parameters Ratiometry The linear Hall sensor works like a potentiometer. The output voltage is proportional to the supply voltage. The division factor depends on the magnetic field strength. This behavior is called "ratiometric"'. The supply voltage VDD should be used as the reference for the A/D Converter of the microcontroller. In this case, variations of VDD are compensated. The ratiometry error is defined as follows: V OUT ( V DD ) V OUT ( 5V ) - - --------------------------- x 100 % E RAT = -----------------------------5V V DD The ratiometry error band displays as a "Butterfly Curve". % E RAT 1 0.75 0.5 0.25 0 -0.25 -0.5 -0.75 -1 4 5 6 7 V DD Figure 4 V Ratiometry Error Band Note: Take care of possible voltage drops on the VDD and VOUT line degrading the result. Ideally, both values are acquired and their ratio is calculated to gain the highest accuracy. This method should be used especially during calibration. Data Sheet 15 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 16 Wednesday, October 1, 2008 5:08 PM TLE4997 Electrical and Magnetic Parameters Calculation of the Junction Temperature The total power dissipation PTOT of the chip increases its temperature above the ambient temperature. The power multiplied with the total thermal resistance RthJA (Junction to Ambient) leads to the final junction temperature. RthJA is the sum of the addition of the values of the two components Junction to Case and Case to Ambient. RthJA = RthJC + RthCA TJ = TA + T T = RthJA x PTOT = RthJA x ( VDD x IDD + VOUT x IOUT ) IDD , IOUT > 0, if direction is into IC Example (assuming no noticeable load on Vout): - VDD = 5 V - IDD = 10 mA - T = 219 [K/W] x (5 [V] x 0.01 [A] + 0 [VA]) = 11 K For moulded sensors, the calculation with RthJC is more adequate. Magnetic Parameters Table 5 Magnetic Characteristics Parameter Symbol Limit Values min. typ. Unit Notes mV/mT 1) 2) max. Sensitivity S 12.5 - Magnetic field range MFR 50 1003) 200 mT Programmable 4) Integral nonlinearity INL BOS BOS -15 - 15 mV = 0.3% of VDD5) -400 - 400 T 6) 7) 8) -5 - 5 T / C Error band 7) Magnetic offset Magnetic offset drift 300 1) Programmable in steps of 0.024%. 2) @ VDD = 5 V and TJ = 25C 3) This range is also used for temperature and offset pre-calibration of the IC. 4) Depending on the Offset and Gain settings, the output may saturate at lower fields. 5) INL = Vout - Vout,lse with Vout,lse = least square error fit of Vout. Valid in the range (5% of VDD) < VOUT < (95% of VDD) for TJ 120C and (6% of VDD) < VOUT < (94% of VDD) for 120C < TJ 150C 6) In operating temperature range and over lifetime. 7) For Sensitivity S > 25 mV / mT. For lower sensitivities, the zero field voltage drift is dominant. 8) Measured at 100 mT range. Data Sheet 16 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 17 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing 6 Signal Processing The flow diagram in Figure 5 shows the data processing algorithm. Range LP Gain Limiter (Clamp) Hall Sensor A D X X D + A out LPDAC Offset Temperature Sensor TC2 X A D -T0 X 1 + TC1 + X Temperature Compensation Figure 5 Stored in EEPROM Memory Signal Processing Flow Magnetic Field Path * The analog output signal of the chopped Hall cell is converted in the continuous-time A/D Converter. The range of the chopped A/D Converter can bet set in several steps (see Table 6). This assures a suitable level for the A/D Converter. * After the A/D conversion, a digital low pass filter reduces the bandwidth (Table 10). * A multiplier amplifies the value according to the gain setting (see Table 8) plus temperature compensation. * The offset value is added (see Table 9). * A limiter reduces the resulting signal to 12 bits and feeds the D/A converter. Temperature Compensation (Details are listed in Chapter 8) * The output signal of the temperature cell is also A/D converted. * The temperature is normalized by subtraction of the T0 value (zero point of the quadratic function). * The linear path is multiplied with the TC1 value. Data Sheet 17 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 18 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing * In the quadratic path, the difference temperature is squared and multiplied with the TC2 value. * Both path outputs are added together to the gain value from the EEPROM. 6.1 Magnetic Field Ranges The working range of the magnetic field defines the input range of the A/D Converter. It is always symmetric to the zero field point. Any two points in the magnetic range can be selected to be the end points of the output curve. The output voltage represents the range between the two points. In the case of fields higher than the range values, the output signal may be distorted. The range must be set before the calibration of offset and gain. Table 6 Range Setting Range Range in mT Parameter R Low 50 3 Mid 100 1 High 200 0 Table 7 Parameter Range Symbol Limit Values min. Register size 1) R Unit Notes bit 1) max. 2 Ranges do not have a guaranteed absolute accuracy. The temperature pre-calibration is performed in the mid range (100 mT). Data Sheet 18 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 19 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing 6.2 Gain Setting The sensitivity is defined by the range and the gain setting. The output of the A/D Converter is multiplied with the gain value. Table 8 Gain Parameter Symbol Limit Values min. Register size Gain range Gain Gain quantization steps Gain - 4.0 Notes bit Unsigned integer value - 1)2) ppm Corresponds to 1/4096 max. 15 G Unit 3.9998 244.14 1) For gain values between - 0.5 and + 0.5, the numeric accuracy decreases. To obtain a flatter output curve, it is recommended to select a higher range setting. 2) A gain value of +1.0 corresponds to a typical 40 mV/mT sensitivity (100 mT range, not guaranteed). Infineon pre-calibrates the samples to 60mV/mT (100mT range) in the final test, but does not guarantee the accuracy of this calibration. It is crucial to do a final calibration of each IC within the application using the Gain/VOS value. The gain value can be calculated by : ( G - 16384 ) Gain = -----------------------------4096 6.3 Offset Setting The offset voltage corresponds to an output voltage with zero field at the sensor. Table 9 Offset Parameter Symbol Limit Values min. Register size Offset range Offset quantization steps 1) OS VOS VOS Notes bit Unsigned integer value % VDD 1) mV @ VDD = 5 V generally VDD / 4095 max. 15 -400 Unit 399 1.22 Infineon pre-calibrates the samples at zero field to 50% of VDD (100mT range) in the final test, but does not guarantee the accuracy of this calibration. It is crucial to do a final calibration of each IC within the application using the Gain/VOS value. The offset value can be calculated by: ( OS - 16384 ) V OS = --------------------------------- x V DD 4096 Data Sheet 19 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 20 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing 6.4 DSP Input Low Pass Filter A digital Low Pass Filter is placed between the Hall A/D Converter and the DSP to reduce the noise level. The Low Pass filter has a constant DC amplification of 0 dB (this is exactly a gain of 1), which means that its setting has no influence on the internal Hall A/D Converter value. The bandwidth can be set in 8 steps. Table 10 Low Pass Filter Setting Cutoff frequency in Hz (at 3dB attenuation)1) Parameter LP 0 78 1 244 2 421 3 615 4 826 5 1060 6 1320 7 off 2) 1) As this is a digital filter running with an RC-based oscillator, the cutoff frequency may vary within 25%. 2) The output low pass-interpolation filter behavior remains as main component in the signal path. Table 11 Low Pass Filter Parameter Symbol Limit Values min. Register size Corner frequency variation LP f - 25 Unit Notes max. 3 bit + 25 % Note: In Low Pass filter setting 7 (filter off), the output noise increases. Because of higher DSP load, the current consumption also rises slightly. Data Sheet 20 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 21 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing Figure 6 shows the characteristic of the filter as a magnitude plot (the highest setting is marked). The "off" position would be a flat 0 dB line. In this case, the output decimation filter limits the bandwidth of the sensor. The update rate after the Low Pass filter is 16 kHz. 0 Magnitude (dB) -1 -2 -3 -4 -5 -6 101 102 103 Frequency (Hz) Figure 6 Data Sheet DSP Input Filter (Magnitude Plot) 21 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 22 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing 6.5 DAC Input Interpolation Filter An interpolation filter is placed between the DSP and the output DAC. It cannot be switched off. This filter limits the frequency behavior of the complete system if the DSP input filter is disabled. The update rate after the interpolation filter is 256 kHz. 0 Magnitude (dB) -1 -2 -3 -4 -5 -6 101 102 103 104 Frequency (Hz) Figure 7 DAC Input Filter (Magnitude Plot) Note: As this is a digital filter running with an RC-based oscillator, the cutoff frequency may vary within 25%. Data Sheet 22 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 23 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing 6.6 Clamping The clamping function is useful for splitting the output voltage into the operating range and error ranges. If the magnetic field is outside the selected measurement range, the output voltage Vout is limited to the clamping values. Table 12 Clamping Parameter Symbol Limit Values min. Register size Clamping voltage low Clamping voltage high Clamping quantization steps Clamping voltage drift CL,CH VCLL VCLH VCLQ VCL Unit Notes max. 2 x 12 bit 0 99.98 % VDD 1) 0 99.98 % VDD 1) 1.22 mV @ VDD = 5 V -15 15 mV in lifetime2) -15 15 over temperature2) 1) If clamping is set, it must be within the allowed output voltage range to be effective. 2) Valid in the range (5% of VDD) < VOUT < (95% of VDD) for TJ 120C and (6% of VDD) < VOUT < (94% of VDD) for 120C < TJ 150C The clamping values are calculated by: Clamping low voltage: CL V CLL = ------------ x V DD 4096 Clamping high voltage: CH V CLH = ------------ x V DD 4096 Note: For an exact setup, the register value may be re-adjusted due to the actual output voltage in the clamping condition. The output voltage range itself has electrical limits. See the Electrical Characteristics of Vout. Data Sheet 23 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 24 Wednesday, October 1, 2008 5:08 PM TLE4997 Signal Processing Figure 8 shows an example in which the magnetic field range between Bmin and Bmax is mapped to voltages between 0.8 V and 4.2 V. If it is not necessary to signal errors, the maximum output voltage range between 0.3 V and 4.7 V can be used. 5 V out (V) Error range V CLH 4 3 Operating range 2 1 VCLL Error range 0 Bmax Bmin B (mT) Figure 8 Clamping Example Note: The high value must be above the low value. If VCLL is set to a higher value than VCLH, the VCLH value is dominating. This would lead to a constant output voltage independent of the magnetic field strength. Data Sheet 24 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 25 Wednesday, October 1, 2008 5:08 PM TLE4997 Error Detection 7 Error Detection Different error cases can be detected by the On-Board-Diagnostics (OBD) and reported to the microcontroller. The OBD is useful only when the clamping function is enabled. It is important to set the clamping threshold values inside the error voltage values shown in Table 13 and Table 14 to ensure that it is possible to distinguish between correct output voltages and error signals. 7.1 Voltages Outside the Operating Range The output signals error conditions, if VDD lies * inside the ratings specified in Table 2 "Absolute Maximum Ratings" on Page 12 * outside the range specified in Table 3 "Operating Range" on Page 13. Table 13 Undervoltage and Overvoltage (All values with RL 10k) Parameter Symbol Limit Values Unit Notes min. max. 3 4 V VDDov VOUTuv 7 8.3 V 0.95 x VDD - V 3V VDD VDDuv Output voltage @ overvoltage VOUTov 0.97 x VDD - V VDDov < VDD 16 V Supply current 1) IDDuv - mA @ undervoltage Undervoltage threshold VDDuv Overvoltage threshold Output voltage @ undervoltage 1) 10 For overvoltage and reverse voltage, see Table 2 "Absolute Maximum Ratings" on Page 12. 7.2 Open Circuit of Supply Lines In the case of interrupted supply lines, the data acquisition device can alert the user. If two sensors are placed in parallel, the output of the remaining working sensor may be still used for an emergency operation. Table 14 Open Circuit (OBD Parameters) 1) Parameter Symbol Limit Values min. max. Unit Notes Output voltage @ open VDD line VOUT 0 0.18 0.2 V TJ120C 120C < TJ 150C Output voltage @ open GND line VOUT 4.82 4.8 5 V TJ120C 120C < TJ 150C 1) With VDD = 5 V and RL 10 k pull-down or RL 20 k pull-up. Data Sheet 25 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 26 Wednesday, October 1, 2008 5:08 PM TLE4997 Error Detection 7.3 Not Correctable EEPROM Errors The parity method is able to correct one single bit in one EEPROM line. One other single bit error in another line can also be detected. As this situation is not correctable, this status is signalled at the output pin by clamping the output value to VDD. Table 15 EEPROM Error Signalling Parameter Symbol Limit Values min. Output voltage @ EEPROM error Data Sheet VOUT Unit Notes max. 0.97 x VDD VDD 26 V V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 27 Wednesday, October 1, 2008 5:08 PM TLE4997 Temperature Compensation 8 Temperature Compensation The magnetic field strength of a magnet depends on the temperature. This material constant is specific to different magnet types. Therefore, the TLE4997 offers a second order temperature compensation polynomial, by which the Hall signal output is multiplied in the DSP. There are three parameters for the compensation: * Reference temperature T0 * A linear part (1st order) TC1 * A quadratic part (2nd order) TC2 The following formula describes the sensitivity dependent on the temperature in relation to the sensitivity at the reference temperature T0: S TC ( T ) = 1 + TC 1 x ( T - T 0 ) + TC 2 x ( T - T0 ) 2 For more information, see also the signal processing flow in Figure 5. The full temperature compensation of the complete system is done in two steps: 1. Pre-calibration in the Infineon final test. The parameters TC1, TC2, T0 are set to maximally flat temperature characteristics regarding the Hall probe and internal analog processing parts. 2. Overall System calibration. The typical coefficients TC1, TC2, T0 of the magnetic circuitry are programmed. This can be done deterministically, as the algorithm of the DSP is fully reproducible. The final settings of the TC1, TC2, T0 values are relative to the pre-calibrated values. Table 16 Temperature Compensation Parameter Register size TC1 1st order coefficient TC1 Quantization steps of TC1 Register size TC2 2nd order coefficient TC2 Quantization steps of TC2 Register size T0 Reference temperature Quantization steps of T0 Symbol Limit Values Unit Notes min. max. TL TC1 TC1 - 9 TQ TC2 TC2 - 8 bit Unsigned integer values -4 4 ppm/ C 2) 0.119 ppm/ C TR T0 T0 - 3 bit - 48 64 C bit -1000 2500 ppm/ C 15.26 16 Unsigned integer values 1) ppm/ C C Unsigned integer values 3) 1) Full adjustable range: -2441 to +5355 ppm/C, can be only used after confirmation by Infineon 2) Full adjustable range: -15 to +15 ppm/C, can be only used after confirmation by Infineon 3) A quantization step of 1C is handled by algorithm (See Application Note). Data Sheet 27 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 28 Wednesday, October 1, 2008 5:08 PM TLE4997 Temperature Compensation 8.1 Parameter Calculation The parameters TC1, TC2 and T0 may be calculated by: TL - 160 TC 1 = ---------------------- x 1000000 65536 TQ - 128 TC 2 = ----------------------- x 1000000 8388608 T 0 = 16TR - 48 Now the output VOUT for a given field BIN at a specific temperature can be roughly calculated by: B IN - x S TC x S TCHall x S o x V DD + V OS V OUT = ----------- B FSR BFSR is the full range magnetic field. It is dependent on the range setting (e.g 100 mT). So is the nominal sensitivity of the Hall probe times the Gain factor set in the EEPROM. STC is the temperature-dependent sensitivity factor calculated by the DSP. STCHall is the temperature behavior of the Hall probe. The pre-calibration at Infineon is performed such that the following condition is met: S TC ( T J - T 0 ) x S TCHall ( T J ) 1 Within the application, an additional factor BIN(T) / BIN(T0) will be given due to the magnetic system. STC needs now to be modified to STCnew so that the following condition is satisfied: B IN ( T ) -------------------x S TCnew ( T ) x S TCHall ( T ) S TC ( T ) x S TCHall ( T ) 1 B IN ( T 0 ) Therefore, the new sensitivity parameters STCnew can be calculated from the pre-calibrated setup STC using the relation: B IN ( T ) -------------------x S TCnew ( T ) S TC ( T ) B IN ( T 0 ) Data Sheet 28 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 29 Wednesday, October 1, 2008 5:08 PM TLE4997 Calibration 9 Calibration A special hardware interface to an external computing system and measurement equipment is required for calibration of the sensor. All calibration and setup bits can be written into a random access memory (RAM). This allows the EEPROM to remain untouched during the entire calibration process. Therefore, this temporary setup (using the RAM only) does not stress the EEPROM--and even allows a pre-verification1) of the setup before programming--as the number of EEPROM programming cycles is limited to provide a high data endurance. The digital signal processing is completely deterministic. This allows a two point calibration in one step without iterations. The two magnetic fields (here described as two "positions" of an external magnetic circuitry) need to be applied only once. Furthermore, a complete setup and calibration procedure can be performed requiring only one EEPROM programming cycle at the end2). After setting up the temperature coefficients, the calibrated Hall A/D Converter values of both positions need to be read and the sensor output signals (using a DAC test mode) need to be acquired for the corresponding end points. Using this data, the signal processing parameters can be immediately calculated with a program running on the external computing system. Note: The calibration and programming process must be performed only at the start of life of the device. Table 17 Calibration Characteristics Parameter Symbol Limit Values min. max. Unit Notes Temperature of sensor at 2 point calibration and programming tCAL 10 30 C 2 point calibration accuracy1) VCAL1 -10 10 mV Position 1 VCAL2 -10 10 mV Position 2 1) Setup and validation performed at start of life. Note: Depending on the application and external instrumentation setup, the accuracy of the 2 point calibration can be improved. 1) 2) This feature is not required for a deterministic two-point setup to fulfill the specification. Details and basic algorithms for this step are available on request. Data Sheet 29 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 30 Wednesday, October 1, 2008 5:08 PM TLE4997 Calibration 9.1 Calibration Data Memory When the MEMLOCK bits are programmed (two redundant bits), the memory contents are frozen and may no longer be changed. Furthermore, the programming interface is locked out and the chip remains in Application Mode only. This prevents accidental programming due to environmental influences. RowA Parity Bits Column Parity Bits User-Calibration Bits Pre-Calibration Bits Figure 9 EEPROM Map A matrix parity architecture allows the automatic correction of any single bit error. Each row is protected by a row parity bit. The sum of bits set including this bit must be an odd number (ODD PARITY). Each column is additionally protected by a column parity bit. The sum of all the bits in the even positions (0, 2, etc.) of all lines must be an even number (EVEN PARITY); the sum of all the bits in the odd positions (1,3, etc.) must be an odd number (ODD PARITY). This mechanism of different parity calculations protects against many block errors (such as erasing a full line or even the entire EEPROM). When modifying the application bits (such as Gain, Offset, TC, etc.) the parity bits must be updated. For the column bits, the pre-calibration area must be also read out and considered for correct parity generation. Note: A specific programming algorithm must be followed to ensure the data retention. A separate detailed programming specification is available on request. Data Sheet 30 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 31 Wednesday, October 1, 2008 5:08 PM TLE4997 Calibration Table 18 Programming Characteristics Parameter Symbol Limit Values Number of EEPROM programming cycles NPRG Ambient temperature at TPRG programming min. max. - 10 Unit Notes Cycles Programming allowed only at start of lifetime 1) 10 30 C 100 - ms For complete memory 2) Programming time tPRG Calibration memory - 135 Bit All active EEPROM bits Error correction - 25 Bit All parity EEPROM bits 1) 1 cycle is the simultaneous change of 1 bit. 2) Depending on clock frequency at VDD, write pulse 10ms 1%, erase pulse 80ms 1%. 9.2 Programming Interface The supply pin and the output pin are used as two-wire interface to transmit the EEPROM data to and from the sensor. This allows * communication with high data reliability * bus-type connection of several sensors In many applications, two sensors are used to measure the same parameter. This redundancy allows the operation to continue in an emergency mode. If both sensors use the same power supply lines, they can be programmed together in parallel. The data transfer protocol and programming is described in a separate document (TLE4997 Programming Guide). 9.3 Laboratory Evaluation Programmer For the programming of evaluation samples and QA (quality assurance) samples a programming equipment is available on request. Data Sheet 31 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 32 Wednesday, October 1, 2008 5:08 PM TLE4997 Application Circuit 10 Application Circuit Figure 10 shows the connection of multiple sensors to a microcontroller. Ref Voltage Tracker e.g. TLE4250 ADCref VDD 47nF 10k TLE out 4997 GND ADCin1 47nF 100 nF 10k 100 nF ADCin2 ADCGND C optional VDD 47nF GND Figure 10 10k TLE out 4997 47nF 100 nF 10k 100 nF Application Circuit Note: For calibration and programming, the interface must be connected directly to the output pin. The given application circuit must be regarded as only an example. It needs to be adapted according to the requirements of the specific application. Data Sheet 32 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 33 Wednesday, October 1, 2008 5:08 PM TLE4997 Package Outlines 11 Package Outlines 45 4.06 0.05 2 A 1.5 0.05 B 1.5 1) 1 0.2 (0.25) 4.05 0.05 0.1 MAX. 5 0.5 0.1 0.42 0.05 1 2 0.82 0.05 3x 0.36 0.05 0.5 B 3 2 x 1.27 = 2.54 12.7 1 1-1 19 0.5 6 0.5 18 0.5 C 33 MAX. 9 -0.50 +0.75 (10) (Useable Length) 2 C A Adhesive Tape Tape 4 0.3 6.35 0.4 12.7 0.3 Total tolerance at 19 pitches 1 0.25 -0.15 0.39 0.1 1) No solder function area Molded body dimensions do not unclude plastic or metal protrusion of 0.15 max per side P-PG-SSO-3-10-PO V02 Figure 11 Data Sheet PG-SSO-3-10 (Plastic Green Single Small Outline Package) 33 V 2.08, 2008-09 _TLE4997x_Data_Sheet.book Page 36 Wednesday, October 1, 2008 5:08 PM w w w . i n f i n e o n . c o m Published by Infineon Technologies AG