8304I Data Sheet
©2015 Integrated Device Technology, Inc December 10, 20154
TABLE 3D. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = 3.3V±5%, VDDO = 2.5V±5%, TA = -40°C TO 85°C
TABLE 4A. AC CHARACTERISTICS, VDD = VDDO = 3.3V±5%, TA = -40°C TO 85°C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
fMAX Output Frequency 166 MHz
tpLH
Propagation Delay,
Low-to-High; NOTE 1 ƒ ≤ 166MHz 2 3.3 ns
tjit Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter Section
125MHz,
Integration Range
12kHz – 20MHz
0.17 ps
tsk(o) Output Skew; NOTE 2, 4 ƒ = 133MHz 50 ps
tsk(pp) Part-to-Part Skew; NOTE 3, 4 600 ps
tROutput Rise Time 30% to 70% 250 500 ps
tFOutput Fall Time 30% to 70% 250 500 ps
odc Output Duty Cycle 40 60 %
NOTE: Electrical parameters are guaranteed over the specifi ed ambient operating temperature range, which is established
when the device is mounted in a test socket with maintained transverse airfl ow greater than 500 lfpm. The device will meet
specifi cations after thermal equilibrium has been reached under these conditions.
NOTE: All parameters measured at 166MHz unless noted otherwise.
NOTE 1: Measured from VDD/2 of the input to VDDO/2 of the output.
NOTE 2: Defi ned as skew between outputs at the same supply voltage and with equal load conditions.
Measured at VDDO/2.
NOTE 3: Defi ned as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at VDDO/2.
NOTE 4: This parameter is defi ned in accordance with JEDEC Standard 65.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
VIH Input High Voltage 2 VDD + 0.3 V
VIL Input Low Voltage -0.3 1.3 V
IIH Input High Current VDD = VIN = 3.465V 150 µA
IIL Input Low Current VDD = 3.465V, VIN = 0V -5 µA
VOH Output High Voltage; NOTE 1 2.1 V
VOL Output Low Voltage; NOTE 1 0.5 V
NOTE 1: Outputs terminated with 50ΩΩΩΩ to VDDO/2. See Parameter Measurement Section, “3.3V/2.5V Output Load Test Circuit”.