S34ML08G1 8Gb, 3 V, 1-bit ECC, x8 I/O, SLC NAND Flash Memory for Embedded General Description The SkyHigh S34ML08G1 8-Gb NAND is offered in 3.3 VCC with x8 I/O interface. This document contains information for the S34ML08G1 device, which is a dual-die stack of two S34ML04G1 die. For detailed specifications, please refer to the discrete diedatasheet: S34ML04G1. Distinctive Characteristics Density - 8 Gb (4 Gb 2) Architecture (For each 4 Gb device) - Input / Output Bus Width: 8-bits - Page Size: (2048 + 64) bytes; 64 bytes is spare area - Block Size: 64 Pages or (128k + 4k) bytes - Plane Size - 2048 Blocks per Plane or (256M + 8M) bytes - Device Size - 2 Planes per Device or 512 Mbyte NAND Flash Interface - Open NAND Flash Interface (ONFI) 1.0 compliant - Address, Data and Commands multiplexed Supply Voltage - 3.3 V device: Vcc = 2.7 V ~ 3.6 V Security - One Time Programmable (OTP) area - Hardware program/erase disabled during power transition Additional Features - Supports Multiplane Program and Erase commands - Supports Copy Back Program - Supports Multiplane Copy Back Program - Supports Read Cache Electronic Signature - Manufacturer ID: 01h Operating Temperature - Industrial: 40 C to 85 C - Automotive: 40 C to 105 C Performance Page Read / Program - Random access: 25 s (Max) - Sequential access: 25 ns (Min) - Program time / Multiplane Program time: 200 s (Typ) Block Erase / Multiplane Erase (S34ML04G1) - Block Erase time: 3.5 ms (Typ) SkyHigh Memory Limited Document Number: 002-00483 Rev. *L Reliability - 100,000 Program / Erase cycles (Typ) (with 1 bit / 512 + 16 byte ECC) - 10 Year Data retention (Typ) - Blocks zero and one are valid and will be valid for at least 1000 program-erase cycles with ECC Package Options - Lead Free and Low Halogen - 48-Pin TSOP 12 20 1.2 mm - 63-Ball BGA 9 11 1 mm Suite 4401-02, 44/F One Island East, 18 Westlands Road Hong Kong www.skyhighmemory.com Revised May 06, 2019 S34ML08G1 Contents 1. Connection Diagram .................................................... 3 2. Pin Description............................................................. 5 3. Block Diagrams............................................................ 6 4. Addressing ................................................................... 8 5. Read Status Enhanced ................................................ 8 6. Extended Read Status ................................................. 8 7. 7.1 Read ID.......................................................................... 9 Read Parameter Page ................................................. 10 Document Number: 002-00483 Rev. *L 8. 8.1 8.2 8.3 8.4 8.5 Electrical Characteristics ........................................... 12 Valid Blocks .................................................................. 12 Recommended Operating Conditions........................... 12 DC Characteristics ........................................................ 13 Pin Capacitance............................................................ 13 Power Consumptions and Pin Capacitance for Allowed Stacking Configurations ............................. 13 9. 9.1 Physical Interface ....................................................... 14 Physical Diagram .......................................................... 14 10. Ordering Information .................................................. 16 11. Appendix A -- Errata .................................................. 17 12. Document History ....................................................... 18 Page 2 of 19 S34ML08G1 1. Connection Diagram Figure 1.1 48-Pin TSOP1 Contact x8 Device (1 CE 8 Gb) NC NC NC NC NC NC R/B# RE# CE# NC NC VCC VSS NC NC CLE ALE WE# WP# NC NC NC NC NC 1 12 13 48 NAND Flash TSOP1 37 36 (x8) 25 24 VSS (1) NC NC NC I/O7 I/O6 I/O5 I/O4 NC (1) VCC NC VCC VSS NC VCC (1) NC I/O3 I/O2 I/O1 I/O0 NC NC NC VSS (1) Note: 1. These pins should be connected to power supply or ground (as designated) following the ONFI specification, however they might not be bonded internally. Figure 1.2 48-Pin TSOP1 Contact x8 Device (2 CE 8 Gb) NC NC NC NC NC R/B2# R/B1# RE# CE1# CE2# NC VCC VSS NC NC CLE ALE WE# WP# NC NC NC NC NC 1 12 13 48 NAND Flash TSOP1 37 36 (x8) 24 25 VSS (1) NC NC NC I/O7 I/O6 I/O5 I/O4 NC VCC(1) NC VCC VSS NC VCC(1) NC I/O3 I/O2 I/O1 I/O0 NC NC NC VSS (1) Note: 1. These pins should be connected to power supply or ground (as designated) following the ONFI specification, however they might not be bonded internally. Document Number: 002-00483 Rev. *L Page 3 of 19 S34ML08G1 Figure 1.3 63-BGA Contact, x8 Device, Single CE (Top View) A1 A2 A9 A10 NC NC NC NC B1 B9 B10 NC NC NC C3 C4 C5 C6 C7 C8 WP# ALE VSS CE# WE# RB# D3 VCC (1) D4 D5 D6 D7 D8 RE# CLE NC NC NC E3 E4 E5 E6 E7 E8 NC NC NC NC NC NC F3 F4 F5 F6 NC NC NC NC G3 NC G4 VCC(1) F7 VSS (1) F8 NC G5 G6 G7 G8 NC NC NC NC H3 H4 H5 H6 H7 H8 NC I/O0 NC NC NC Vcc J3 J4 J5 J6 J7 J8 NC I/O1 NC VCC I/O5 I/O7 K3 K4 K5 K6 K7 K8 VSS I/O2 I/O3 I/O4 I/O6 VSS L1 L2 L9 L10 NC NC NC NC M1 M2 M9 M10 NC NC NC NC Note: 1. These pins should be connected to power supply or ground (as designated) following the ONFI specification, however they might not be bonded internally. Document Number: 002-00483 Rev. *L Page 4 of 19 S34ML08G1 2. Pin Description Table 2.1 Pin Description Pin Name I/O0 - I/O7 Description Inputs/Outputs. The I/O pins are used for command input, address input, data input, and data output. The I/O pins float to High-Z when the device is deselected or the outputs are disabled. CLE Command Latch Enable. This input activates the latching of the I/O inputs inside the Command Register on the rising edge of Write Enable (WE#). ALE Address Latch Enable. This input activates the latching of the I/O inputs inside the Address Register on the rising edge of Write Enable (WE#). CE# Chip Enable. This input controls the selection of the device. When the device is not busy CE# low selects the memory. WE# Write Enable. This input latches Command, Address and Data. The I/O inputs are latched on the rising edge of WE#. RE# Read Enable. The RE# input is the serial data-out control, and when active drives the data onto the I/O bus. Data is valid tREA after the falling edge of RE# which also increments the internal column address counter by one. WP# Write Protect. The WP# pin, when low, provides hardware protection against undesired data modification (program / erase). R/B# Ready Busy. The Ready/Busy output is an Open Drain pin that signals the state of the memory. VCC Supply Voltage. The VCC supplies the power for all the operations (Read, Program, Erase). An internal lock circuit prevents the insertion of Commands when VCC is less than VLKO. VSS Ground. NC Not Connected. Notes: 1. A 0.1 F capacitor should be connected between the VCC Supply Voltage pin and the VSS Ground pin to decouple the current surges from the power supply. The PCB track widths must be sufficient to carry the currents required during program and erase operations. 2. An internal voltage detector disables all functions whenever VCC is below 1.8V to protect the device from any involuntary program/erase during power transitions. Document Number: 002-00483 Rev. *L Page 5 of 19 S34ML08G1 3. Block Diagrams Figure 3.1 Functional Block Diagram -- 4 Gb Address Register/ Counter Program Erase Controller HV Generation X 4096 Mbit + 128 Mbit (4 Gb Device) NAND Flash Memory Array ALE CLE WE# CE# WP# D E C O D E R Command Interface Logic RE# Page Buffer Command Register Y Decoder I/O Buffer Data Register I/O0~I/O7 Document Number: 002-00483 Rev. *L Page 6 of 19 S34ML08G1 Figure 3.2 Block Diagram -- 1 CE (4 Gb x 8) IO0~IO7 CE# WE# RE# 4 G b x8 N A N D F lash M em o ry#2 R/B# VSS ALE VCC CLE WP# IO0~IO7 CE# CE# W E# WE# RE# RE# AL E ALE CL E CLE W P# WP# 4 G b x8 N A N D F lash M em o ry#1 IO0~IO7 R/B# R /B # VSS VSS VCC V CC Figure 3.3 Block Diagram -- 2 CE (4 Gb x 8) IO0~IO7 C E#2 CE# WE# RE# 4 G b x8 N A N D F lash M em o ry#2 R/B# R/B#2 VSS ALE VCC CLE WP# IO0~IO7 C E#1 CE# W E# WE# R E# RE# AL E ALE CLE CLE W P# WP# Document Number: 002-00483 Rev. *L 4 G b x8 N A N D F lash M em o ry#1 IO0~IO7 R/B# R/B#1 VSS VSS VCC V CC Page 7 of 19 S34ML08G1 4. Addressing Table 4.1 Address Cycle Map Bus Cycle I/O0 I/O1 I/O2 I/O3 I/O4 I/O5 I/O6 I/O7 A7 (CA7) 1st / Col. Add. 1 A0 (CA0) A1 (CA1) A2 (CA2) A3 (CA3) A4 (CA4) A5 (CA5) A6 (CA6) 2nd / Col. Add. 2 A8 (CA8) A9 (CA9) A10 (CA10) A11 (CA11) Low Low Low Low 3rd / Row Add. 1 A12 (PA0) A13 (PA1) A14 (PA2) A15 (PA3) A16 (PA4) A17 (PA5) A18 (PLA0) A19 (BA0) 4th / Row Add. 2 A20 (BA1) A21 (BA2) A22 (BA3) A23 (BA4) A24 (BA5) A25 (BA6) A26 (BA7) A27 (BA8) 5th / Row Add. 3 (6) A28 (BA9) A29 (BA10) A30 (BA11) Low Low Low Low Low Notes: 1. CAx = Column Address bit. 2. PAx = Page Address bit. 3. PLA0 = Plane Address bit zero. 4. BAx = Block Address bit. 5. Block address concatenated with page address and plane address = actual page address, also known as the row address. 6. A30 for 8 Gb (4 Gb x 2 - DDP) (1CE). For the address bits, the following rules apply: A0 - A11: column address in the page A12 - A17: page address in the block A18: plane address (for multiplane operations) / block address (for normal operations) A19 - A30: block address 5. Read Status Enhanced Read Status Enhanced is used to retrieve the status value for a previous operation in the following cases: In the case of concurrent operations on a multi-die stack. When two dies are stacked to form a dual-die package (DDP), it is possible to run one operation on the first die, then activate a different operation on the second die, for example: Erase while Read, Read while Program, etc. In the case of multiplane operations in the same die. 6. Extended Read Status Multi-die stack devices support the Extended Read Status operation. When two operations are active in separate dies at the same time, this feature allows the host to check the status of a given die. For example, the first die could be executing a Page Program while the second die is performing a Page Read. Refer to Table 6.1 for a description of each command. Table 6.1 Extended Read Status Command Die Row Address with 4 Gb Dies F2h First 0 to 3FFFFh F3h Second 40000h to 7FFFFh Document Number: 002-00483 Rev. *L Page 8 of 19 S34ML08G1 7. Read ID The device contains a product identification mode, initiated by writing 90h to the command register, followed by an address input of 00h. Note: If you want to execute Read Status command (0x70) after Read ID sequence, you should input dummy command (0x00) before Read Status command (0x70). For the S34ML04G1 device, five read cycles sequentially output the manufacturer code (01h), and the device code and 3rd, 4th, and 5th cycle ID, respectively. The command register remains in Read ID mode until further commands are issued to it. Table 7.1 Read ID for Supported Configurations (1) Density Org VCC 1st 2nd 3rd 4th 5th 4 Gb x8 3.3V 01h DCh 90h 95h 54h 8 Gb (4 Gb x 2 - DDP with two CE#) x8 3.3V 01h DCh 90h 95h 54h 8 Gb (4 Gb x 2 - DDP with one CE#) (1) x8 3.3V 01h D3h D1h 95h 58h Note: 1. See See Appendix A -- Errata on page 17. for information on READ ID in MCPs. Figure 7.1 Read ID Operation Timing -- 8 Gb CLE CE# WE# tWHR tAR ALE tREA RE# 8 Gb Device (4 Gb x 2 - DDP with one CE#) I/Ox 90h Read ID Command 00h 01h Address 1 Cycle Maker Code Document Number: 002-00483 Rev. *L D3h Device Code D1h 3rd Cycle 95h 4th Cycle 58h 5th Cycle Page 9 of 19 S34ML08G1 5th ID Data Table 7.2 Read ID Byte 5 Description -- S34ML04G1 Description Plane Number I/O7 I/O6 I/O5 I/O4 00 2 01 4 10 8 Plane Size (without spare area) I/O1 I/O0 0 0 11 64 Mb 000 128 Mb 001 256 Mb 010 512 Mb 011 1 Gb 100 2 Gb 101 4 Gb 110 8 Gb 111 Reserved 7.1 I/O3 I/O2 1 0 Read Parameter Page The device supports the ONFI Read Parameter Page operation, initiated by writing ECh to the command register, followed by an address input of 00h. The command register remains in Parameter Page mode until further commands are issued to it. Table 7.3 explains the parameter fields. Note: For 41nm 2Gb/4Gb SkyHigh NAND, for a particular condition, the Read Parameter Page command does not give the correct values. To overcome this issue, the host must issue a Reset command before the Read Parameter Page command. Issuance ofReset before the Read Parameter Page command will provide the correct values and will not output 00h values. This does not apply to 48nm 1Gb. Table 7.3 Parameter Page Description (Sheet 1 of 3) Byte O/M Description Values Revision Information and Features Block 0-3 M Parameter page signature Byte 0: 4Fh, "O" Byte 1: 4Eh, "N" Byte 2: 46h, "F" Byte 3: 49h, "I" 4-5 M Revision number 2-15 Reserved (0) 1 1 = supports ONFI version 1.0 0 Reserved (0) 02h, 00h M Features supported 5-15 Reserved (0) 4 1 = supports odd to even page Copyback 3 1 = supports interleaved operations 2 1 = supports non-sequential page programming 1 1 = supports multiple LUN operations 0 1 = supports 16-bit data bus width 1Eh, 00h M Optional commands supported 6-15 Reserved (0) 5 1 = supports Read Unique ID 4 1 = supports Copyback 3 1 = supports Read Status Enhanced 2 1 = supports Get Features and Set Features 1 1 = supports Read Cache commands 0 1 = supports Page Cache Program command 1Bh, 00h Reserved (0) 00h 6-7 8-9 10-31 Document Number: 002-00483 Rev. *L 4Fh, 4Eh, 46h, 49h Page 10 of 19 S34ML08G1 Table 7.3 Parameter Page Description (Sheet 2 of 3) Byte O/M Description Values Manufacturer Information Block 32-43 M Device manufacturer (12 ASCII characters) 53h, 50h, 41h, 4Eh, 53h, 49h, 4Fh, 4Eh, 20h, 20h, 20h, 20h 44-63 M Device model (20 ASCII characters) 53h, 33h, 34h, 4Dh, 4Ch, 30h, 38h, 47h, 31h, 20h, 20h, 20h, 20h, 20h, 20h, 20h, 20h, 20h, 20h, 20h 64 M JEDEC manufacturer ID 01h 65-66 O 67-79 Date code 00h Reserved (0) 00h Memory Organization Block 80-83 M Number of data bytes per page 00h, 08h, 00h, 00h 84-85 M Number of spare bytes per page 40h, 00h 86-89 M Number of data bytes per partial page 00h, 02h, 00h, 00h 90-91 M Number of spare bytes per partial page 10h, 00h 92-95 M Number of pages per block 40h, 00h, 00h, 00h 96-99 M Number of blocks per logical unit (LUN) 00h, 10h, 00h, 00h 100 M Number of logical units (LUNs) 02h 101 M Number of address cycles 4-7 Column address cycles 0-3 Row address cycles 23h 102 M Number of bits per cell 01h 103-104 M Bad blocks maximum per LUN 50h, 00h 105-106 M Block endurance 01h, 05h 01h 107 M Guaranteed valid blocks at beginning of target 108-109 M Block endurance for guaranteed valid blocks 01h, 03h 110 M Number of programs per page 04h 111 M Partial programming attributes 5-7 Reserved 4 1 = partial page layout is partial page data followed by partial page spare 1-3 Reserved 0 1 = partial page programming has constraints 00h 112 M Number of bits ECC correctability 01h 113 M Number of interleaved address bits 4-7 Reserved (0) 0-3 Number of interleaved address bits 01h O Interleaved operation attributes 4-7 Reserved (0) 3 Address restrictions for program cache 2 1 = program cache supported 1 1 = no block address restrictions 0 Overlapped / concurrent interleaving support 04h Reserved (0) 00h 114 115-127 Electrical Parameters Block 128 129-130 M I/O pin capacitance 0Ah M Timing mode support 6-15 Reserved (0) 5 1 = supports timing mode 5 4 1 = supports timing mode 4 3 1 = supports timing mode 3 2 1 = supports timing mode 2 1 1 = supports timing mode 1 0 1 = supports timing mode 0, shall be 1 1Fh, 00h Document Number: 002-00483 Rev. *L Page 11 of 19 S34ML08G1 Table 7.3 Parameter Page Description (Sheet 3 of 3) Byte O/M Description 131-132 O Program cache timing mode support 6-15 Reserved (0) 5 1 = supports timing mode 5 4 1 = supports timing mode 4 3 1 = supports timing mode 3 2 1 = supports timing mode 2 1 1 = supports timing mode 1 0 1 = supports timing mode 0 133-134 M tPROG Maximum page program time (s) Values 1Fh, 00h BCh, 02h 135-136 M tBERS Maximum block erase time (s) 10h, 27h 137-138 M tR Maximum page read time (s) 19h, 00h 139-140 M tCCS Minimum Change Column setup time (ns) 64h, 00h Reserved (0) 00h 141-163 Vendor Block 164-165 M 166-253 Vendor specific Revision number 00h Vendor specific 00h 7Bh, 09h 254-255 M Integrity CRC 256-511 M Value of bytes 0-255 512-767 M Value of bytes 0-255 Repeat Value of bytes 0-255 768+ O Additional redundant parameter pages FFh Redundant Parameter Pages Repeat Value of bytes 0-255 Note: 1. O" Stands for Optional, "M" for Mandatory. 8. Electrical Characteristics 8.1 Valid Blocks Table 8.1 Valid Blocks -- 4 Gb Symbol Min Typ Max Unit S34ML04G1 Device NVB 4016 -- 4096 Blocks S34ML08G1 NVB 8032 (1) -- 8192 Blocks Note: 1. Each 4 Gb has maximum 80 bad blocks. 8.2 Recommended Operating Conditions Table 8.2 Recommended Operating Conditions Symbol Min Typ Max Units Vcc Supply Voltage Parameter Vcc 2.7 3.3 3.6 V Ground Supply Voltage Vss 0 0 0 V Document Number: 002-00483 Rev. *L Page 12 of 19 S34ML08G1 8.3 DC Characteristics Table 8.3 DC Characteristics and Operating Conditions (Values listed are for each 4 Gb NAND, 8 Gb (4 Gb x 2) will be additive accordingly) Parameter Symbol Test Conditions Min Typ Max Units ICC0 Power up Current -- 15 30 mA Sequential Read ICC1 tRC = tRC (min), CE# = VIL, IOUT = 0 mA -- 15 30 mA Program ICC2 Normal -- -- 30 mA Cache -- -- 40 mA Erase ICC3 -- -- 15 30 mA -- -- 1 mA -- 10 50 A Power-On Current Operating Current Standby current, (TTL) ICC4 Standby current, (CMOS) ICC5 CE# = VIH, WP# = 0V/Vcc CE# = VCC-0.2, WP# = 0/VCC Input Leakage Current ILI VIN = 0 to 3.6V -- -- 10 A Output Leakage Current ILO VOUT = 0 to 3.6V -- -- 10 A Input High Voltage VIH -- VCC x 0.8 -- VCC + 0.3 V Input Low Voltage VIL -- -0.3 -- VCC x 0.2 V Output High Voltage VOH IOH = -400 A 2.4 -- -- V Output Low Voltage VOL IOL = 2.1 mA -- -- 0.4 V IOL(R/B#) VOL = 0.4V 8 10 -- mA VLKO -- -- 1.8 -- V Output Low Current (R/B#) Erase and Program Lockout Voltage Notes: 1. All VCC pins, and VSS pins respectively, are shorted together. 2. Values listed in this table refer to the complete voltage range for VCC and to a single device in case of device stacking. 3. All current measurements are performed with a 0.1 F capacitor connected between the VCC Supply Voltage pin and the VSS Ground pin. 4. Standby current measurement can be performed after the device has completed the initialization process at power-up. 8.4 Pin Capacitance Table 8.4 Pin Capacitance (TA = 25C, f=1.0 MHz) Symbol Test Condition Min Max Unit Input Parameter CIN VIN = 0V -- 10 pF Input / Output CIO VIL = 0V -- 10 pF Note: 1. For the stacked devices version the Input is 10 pF x [number of stacked chips] and the Input/Output is 10 pF x [number of stacked chips]. 8.5 Power Consumptions and Pin Capacitance for Allowed Stacking Configurations When multiple dies are stacked in the same package, the power consumption of the stack will increase according to the number of chips. As an example, the standby current is the sum of the standby currents of all the chips, while the active power consumption depends on the number of chips concurrently executing different operations. When multiple dies are stacked in the same package the pin/ball capacitance for the single input and the single input/output of the combo package must be calculated based on the number of chips sharing that input or that pin/ball. Document Number: 002-00483 Rev. *L Page 13 of 19 S34ML08G1 9. Physical Interface 9.1 9.1.1 Physical Diagram 48-Pin Thin Small Outline Package (TSOP1) Figure 9.1 48-pin TSOP (18.4 x 12.0 x 1.2 mm) Package Outline, 51-85183 STANDARD PIN OUT (TOP VIEW) 2X (N/2 TIPS) 0.10 2X 2 1 0.10 2X N SEE DETAIL B A 0.10 C A2 8 R B E (c) 5 e N/2 +1 N/2 5 D1 D 0.20 2X (N/2 TIPS) GAUGE PLANE 9 C PARALLEL TO SEATING PLANE C SEATING PLANE 4 0.25 BASIC 0 A1 L DETAIL A B A B SEE DETAIL A 0.08MM M C A-B b 6 7 WITH PLATING REVERSE PIN OUT (TOP VIEW) e/2 3 1 N 7 c c1 X X = A OR B b1 N/2 N/2 +1 SYMBOL DIMENSIONS MIN. NOM. A MAX. 1. 2. PIN 1 IDENTIFIER FOR STANDARD PIN OUT (DIE UP). PIN 1 IDENTIFIER FOR REVERSE PIN OUT (DIE DOWN): INK OR LASER MARK. 4. TO BE DETERMINED AT THE SEATING PLANE A2 0.95 1.00 1.05 0.17 0.20 0.23 0.22 b 0.17 c1 0.10 0.16 c 0.10 0.21 D 20.00 BASIC 18.40 BASIC E 12.00 BASIC 5. DIMENSIONS D1 AND E DO NOT INCLUDE MOLD PROTRUSION. ALLOWABLE MOLD PROTRUSION ON E IS 0.15mm PER SIDE AND ON D1 IS 0.25mm PER SIDE. 6. DIMENSION b DOES NOT INCLUDE DAMBAR PROTRUSION. ALLOWABLE DAMBAR PROTRUSION SHALL BE 0.08mm TOTAL IN EXCESS OF b DIMENSION AT MAX. MATERIAL CONDITION. DAMBAR CANNOT BE LOCATED ON LOWER RADIUS OR THE FOOT. MINIMUM SPACE BETWEEN PROTRUSION AND AN ADJACENT LEAD TO BE 0.07mm . 7. THESE DIMENSIONS APPLY TO THE FLAT SECTION OF THE LEAD BETWEEN 0.10mm AND 0.25mm FROM THE LEAD TIP. 8. LEAD COPLANARITY SHALL BE WITHIN 0.10mm AS MEASURED FROM THE SEATING PLANE. 0.50 BASIC 0 0 R 0.08 0.60 0.70 8 0.20 48 -C- . THE SEATING PLANE IS DEFINED AS THE PLANE OF CONTACT THAT IS MADE WHEN THE PACKAGE LEADS ARE ALLOWED TO REST FREELY ON A FLAT HORIZONTAL SURFACE. 0.27 D1 0.50 DIMENSIONS ARE IN MILLIMETERS (mm). 3. b1 N NOTES: 0.15 0.05 L DETAIL B 1.20 A1 e BASE METAL SECTION B-B 9. DIMENSION "e" IS MEASURED AT THE CENTERLINE OF THE LEADS. 10. JEDEC SPECIFICATION NO. REF: MO-142(D)DD. 51-85183 *F Document Number: 002-00483 Rev. *L Page 14 of 19 S34ML08G1 9.1.2 63-Pin Ball Grid Array (BGA) Figure 9.2 63-ball VFBGA (11.00 x 9.00 x 1.00 mm) Package Outline, 002-19064 002-19064 ** Document Number: 002-00483 Rev. *L Page 15 of 19 S34ML08G1 10. Ordering Information The ordering part number is formed by a valid combination of the following: S34ML 08G 1 01 T F I 00 0 Packing Type 0 = Tray 3 = 13" Tape and Reel Model Number 00 = Standard Interface / ONFI (x8) 20 = Two Chip Enables with Standard ONFI (x8) Temperature Range A = Industrial with AECQ-100 and GT Grade (-40C to +85C) B = Industrial Plus with AECQ-100 and GT Grade (-40C to +105C) I = Industrial (-40C to + 85C) V = Industrial Plus (-40C to + 105C) Materials Set F = Lead (Pb)-free H = Lead (Pb)-free and Low Halogen Package B = BGA T = TSOP Bus Width 00 = x8 NAND, single die 04 = x16 NAND, single die 01 = x8 NAND, dual die 05 = x16 NAND, dual die Technology 1 = SkyHigh NAND Revision 1 (4x nm) Density 01G= 1 Gb 02G= 2 Gb 04G= 4 Gb 08G= 8 Gb Device Family S34ML SkyHigh SLC NAND Flash Memory for Embedded Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult your local sales office to confirm availability of specific valid combinations and to check on newly released combinations. Valid Combinations Device Family Density Technology Bus Width S34ML 08G 1 01 Package Type TF BH Temperature Range A, B, I, V Additional Ordering Options 00, 20 00 Packing Type 0, 3 Package Description TSOP BGA (1) Note: 1. BGA package marking omits the leading "S34" and the Packing Type designator from the ordering part number. Document Number: 002-00483 Rev. *L Page 16 of 19 S34ML08G1 11. Appendix A -- Errata For SkyHigh NAND MCPs (Multi-Chip Package) like the 8 Gb (2 x 4 Gb), due to the internal bonding, READ ID automatically changes to the hard-wired values and currently there is no way to change it electrically. Therefore, the SkyHigh NAND 8 Gb with one CE# will not follow the same methodology of READ ID as SDPs (Single Die Package). The READ ID values for the 8-Gb SkyHigh NAND with one CE# will be as follows: 1st Byte: 01h 2nd Byte: D3h 3rd Byte: D1h 4th Byte: 95h 5th Byte: 58h 1st Byte 2nd Byte 3rd Byte 4th Byte 5th Byte 8 Gb with one CE# (Currently with error) 01h D3h D1h 95h 58h 8 Gb with one CE# (SkyHigh methodology) 01h DCh 91h 95h 54h Currently, SkyHigh does not plan to fix the problem. If there are any issues related to this, please contact SkyHigh NAND Product Marketing for further questions. Document Number: 002-00483 Rev. *L Page 17 of 19 S34ML08G1 12. Document History Document Title: S34ML08G1, 8 Gb, 1-bit ECC, x8 I/O, 3 V VCC, NAND Flash Memory for Embedded Document Number: 002-00483 Rev. ECN No. Orig. of Change Submission Date ** - XILA 08/23/2012 Initial release *A - XILA 10/01/2012 Addressing: Address Cycle Map table: corrected data Read ID: Read ID for Supported Configurations table: added row - 8 Gb (4 Gb x 2 - DDP with two CE#) Read Parameter Page: Parameter Page Description table corrected Electrical Parameters Block values for bytes 129-130 and bytes 131-132 corrected Vendor Block values for bytes 254-255 Appendix A: Added text *B - XILA 11/29/2012 Ordering Information: Added Model Number *C - XILA 12/19/2012 Read Parameter Page: Parameter Page Description table corrected Description for Bytes 129-130 and bytes 131-132 DC Characteristics: DC Characteristics and Operating Conditions table corrected Test Conditions for ICC1 Output High Voltage: removed IOH = 100 A row Output Low Voltage: removed IOL = 100 A row Output Low Current (R/B#): removed VOL = 0.1V row Ordering Information: Valid Combinations table: removed Bus Width 05 *D - XILA 08/09/2013 Distinctive Characteristics: Security - Removed Serial number (unique ID) Operating Temperature - removed Commercial and Extended temperatures Performance: Updated Reliability Connection Diagram: Added figure - 48-Pin TSOP1 Contact x8 Device (1 CE 8 Gb) Addressing: Address Cycle Map table - appended Note Added text to Bus Cycle column Extended Read Status: Extended Read Status table - removed Commands F4h and F5h Read Parameter Page: Parameter Page Description table - corrected Byte 44-63, 100, and 254-255 Values Valid Blocks: Valid Blocks table - clarified Device values Document Number: 002-00483 Rev. *L Description of Change Page 18 of 19 S34ML08G1 Document Title: S34ML08G1, 8 Gb, 1-bit ECC, x8 I/O, 3 V VCC, NAND Flash Memory for Embedded Document Number: 002-00483 Rev. ECN No. Orig. of Change Submission Date Description of Change *D (cont.) - XILA 08/09/2013 DC Characteristics: DC Characteristics and Operating Conditions table - added row, `VCC Supply Voltage' Physical Interface: Updated figures TS2 48 -- 48-lead Plastic Thin Small Outline, 12 x 20 mm, Package Outline VLD063 -- 63-Pin BGA, 11 mm x 9 mm Package Ordering Information: Updated Materials Set: H = Low Halogen to H = Lead (Pb)-free and Low Halogen Valid Combinations table: removed 04G; Added Note *E - XILA 04/01/2014 Ordering Information: Updated Temperature Range to include A (-40C to 85C GT Grade), B (40C to 105C GT Grade), and V (-40C to 105C) Valid Combinations table - added A, B, V to Temperature Range *F - XILA 01/14/2015 Global: Changed data sheet designation from Advance Information to Full Production *G 4953915 XILA 10/14/2015 Updated to Cypress template. *H 5022236 XILA 11/20/2015 Updated General Description: Updated description. Completing Sunset Review. *I 5160512 XILA 04/25/2016 Updated Read ID: Updated Read Parameter Page: Updated description. Updated Electrical Characteristics: Added Recommended Operating Conditions. Updated DC Characteristics: Updated Table 8.3 (Replaced "VCC supply Voltage (erase and program lockout)" with "Erase and Program Lockout voltage"). Updated Ordering Information: Updated details. Updated to new template. *J 5770454 AESATMP8 06/13/2017 Updated logo and Copyright. *K 6455270 MNAD 01/23/2019 Updated Physical Interface: Updated Physical Diagram: Updated 48-Pin Thin Small Outline Package (TSOP1): Removed existing spec (f16-038). Added spec 51-85183 *F. Updated 63-Pin Ball Grid Array (BGA): Removed existing spec (16-038.28). Added spec 002-19064 **. Updated to new template. Completing Sunset Review. 05/06/2019 Updated to SkyHigh format *L MNAD Document Number: 002-00483 Rev. *L Page 19 of 19