CY74FCT16244T/2244T
CY74FCT16444T/2H244
3
Electrical Characteristics O ver the Operating Range
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHInput Hysteresis[6] 100 mV
VIK Input Clamp Diode Voltage VCC=Min., IIN= –18 mA –0.7 –1.2 V
IIH Input HIGH Current Standard VCC=Max., VI=VCC ±1µA
Bus Hold ±100
IIL Input LOW Current Standard VCC=Max., VI=GND ±1µA
Bus Hold ±100 µA
IBBH
IBBL Bu s Ho ld Sus tai n Current on Bus Hold Input[7] VCC=Min. VI=2.0V –50 µA
VI=0.8V +50
IBHHO
IBHLO Bus Hold Overdrive Current on Bus Hold Input[7] VCC=Max., VI=1.5V TBD mA
IOZH High Imp edance Output Cu rrent
(Three-Stat e O utput pins) VCC=Max., VOUT=2.7V ±1µA
IOZL High Imp edance Output Cu rrent
(Three-Stat e O utput pins) VCC=Max., VOUT=0.5V ±1µA
IOS Sh ort Circuit Current[8] VCC=Max., VOUT=GND –80 –140 –200 mA
IOOutput Drive Current[8] VCC=Max., VOUT=2.5V –50 –180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[9] ±1µA
Output D rive Characteristics for CY74FCT16244T, CY74FCT16444T
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VOH Output HIGH Voltage VCC=Mi n ., IOH=–3 mA 2.5 3.5 V
VCC=Mi n ., IOH=–15 mA 2.4 3.5 V
VCC=Mi n ., IOH=–32 mA 2.0 3.0 V
VOL Output LOW Voltage VCC=Mi n ., IOL=64 mA 0.2 0.55 V
Output D rive Characteristics for CY74FCT162244T, CY74FCT162H244T
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
IODL Output LOW Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA
IODH Output HIGH Current[8] VCC=5V, VIN=VIH or VIL, VOUT=1.5V –60 –115 –150 mA
VOH Output HIGH Voltage VCC=Min., IOH=–24 mA 2.4 3.3 V
VOL Output LOW Voltage VCC=Min., IOL=24 mA 0.3 0.55 V
Notes:
5. Typical values are at VCC=5.0V, TA = +25°C ambient.
6. This parameter is guaranteed but not tested.
7. Pins with bus hold are described in Pin Description.
8. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting
of a high output may raise the chip temperature well abo ve normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
9. Tested at +25°C.