10
Chip Resistor Arrays
CR, CJ, CRA, CRB, CRC Series - Test Conditions
MECHANICAL CHARACTERISTICS
ENVIRONMENTAL CHARACTERISTICS
Item Standard Test Conditions
Resistor Jumper Resistor Jumper
R/R ±(1%+0.05Ω) max. 50mΩmax. Apply the load as shown:
of the initial value Measure resistance during load application
Terminal
Strength
Visual No evidence of mechanical damage after loading
PC Board = Glass epoxy t = 1.60 (0.063)
Soldering R/R ±(1%+0.05Ω) max. 50mΩmax. Immerse into molten solder at 260±5°C for 10±1 sec.
Heat of the initial value Stabilize component at room temperature for 1 hr.
Resistance Visual No evidence of leaching Measure resistance.
Solderability Coverage ≥95% each termination end Immerse in Rogin Flux for 2±0.5 sec. and in
SN62 solder at 235±5°C for 2±0.5 sec.
Anti-Vibration R/R ±(1%+0.1Ω) max. 50mΩmax. 2 hrs. each in X, Y and Z axis. (TTL 6 hrs.) 10 to 55 Hz
Test
of the initial value sweep in 1 min. at 1.5mm amplitude.
Visual No evidence of mechanical damage
Solvent R/R ±(0.5%+0.05Ω) max. 50mΩmax. Immerse in static state butyl acetate at 20°C to 25°C
for 30±5 sec.
Resistance
of the initial value Stabilize component at room temperature for 30 min.
Visual No evidence of mechanical damage then measure value.
millimeters (inches)
Item Standard Test Conditions
Resistor Jumper Resistor Jumper
Temperature R/R ±(1%+0.05Ω) max. 50mΩmax. (1) Run 5 cycles as follows: -55±3°C for 30 min.
Cycle
of the initial value 125±3°C for 30 min. Room temp. for 10-15 min.
Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
Low R/R ±(2%+0.1Ω) max. 50mΩmax. (1) Dwell in -55°C chamber without loading for 1000
Temperature of the initial value hrs.
Storage Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
High R/R ±(3%+0.1Ω) max. 50mΩmax. (1) Dwell in 125°C chamber without loading for 1000
Temperature of the initial value hrs.
Storage Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R ±(3%+0.1Ω) max. 50mΩmax. (1) Dwell in temp.: 65°C RH90 to 95% RH chamber
Moisture of the initial value without loading for 1000 hrs.
Resistance Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R ±(3%+0.1Ω) max. 50mΩmax. (1) Temp.: 70±3°C Voltage: (rated voltage) on 90 min.
Life Test of the initial value off 30 min. Duration: 1000 hrs.
Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
R/R ±(3%+0.1Ω) max. 50mΩmax. (1) Temp.: 40±2°C RH: 90-95% Voltage Cycle: on 90
Loading Life of the initial value min. (rated voltage) off 30 min. Duration: 1000 hrs.
in Moisture Visual No evidence of mechanical damage (2) Stabilize component at room temperature for 1 hr.
then measure value.
+48
-0
+48
-0
+48
-0
+48
-0
+48
-0