_ FAIRCHILD August 1998 SEMICONDUCTOR tT NDT3055L N-Channel Logic Level Enhancement Mode Field Effect Transistor NDT3055L General Description Features These logic level N-Channel enhancement mode power B 4A, 60 V. Rogoy = 0.100 2 @ V,,= 10 V, field effect transistors are produced using Fairchild's R =0.1202 @V..=45V. proprietary, high cell density, DMOS technology. This PSICN) as very high density process is especially tailored to = Low drive requirements allowing operation directly from logic minimize on-state resistance and provide superior drivers. Vasc < 2V. switching performance, and withstand high energy pulse : , ; in the avalanche and commutation modes. These devices # High density cell design for extremely low Rosioy- are particularly suited for low voltage applications such as DC motor control and DC/DC conversion where fast switching, low in-line power loss, and resistance to transients are needed. High power and current handling capability in a widely used surface mount package. SOT-223 SOT-223* G (3232) SOT-223 G Absolute Maximum Ratings T, = 25C unless otherwise noted Symbol | Parameter NDT3055L Units Voss Drain-Source Voltage 60 Voss Gate-Source Voltage - Continuous +20 I Maximum Drain Current - Continuous (Note 1a) 4 - Pulsed 25 P, Maximum Power Dissipation (Note 1a) 3 Ww (Note 1b} 1.3 (Note 1c) 14 Ti Tete Operating and Storage Temperature Range -65 to 150 Cc THERMAL CHARACTERISTICS Pasa Thermal Resistance, Junction-to-Ambient (noe ta) 42 Cw Rac Thermal Resistance, Junction-to-Case (Note 1) 12 Cw * Order option J23Z for cropped center drain lead. 4-282 NDT3055L Rev.A1 Electrical Characteristics (T, = 25C unless otherwise noted) Symbol _ [Parameter | Conditions | min I Typ | Max | Units OFF CHARACTERISTICS BV ose Drain-Source Breakdown Voltage Veg = 0 V, |= 250 pA 60 Vv ABV, < oO Ww Qo rc 3 9 Zz 3.5V zt ec oa a 3.0V 0 1 2 3 4 Vpg : DRAIN-SOURCE VOLTAGE (V) Figure 1. On-Region Characteristics. 1.8 Wu g Z 18 [Vog=10V 3 a GS N z zi4 2S 8 w 12 os a Zz GB 1 6 cz =z 0.8 a 06 -50 25 9 25 50 75 100 125 T,, JUNCTION TEMPERATURE ( C) Figure 3. On-Resistance Variation with Temperature. 10 Porn = y=50f// 7 [ Vps = 5V J be = | ff 125C = dl / Zz ut . ze oF J 2 oO 2 gz 4 xc i s | 2 yi ft... o- o 1 1.5 2 25 3 3.5 4 45 5 Vg. GATE TO SOURCE VOLTAGE (V) Figure . Transfer Characteristics. R ps(on). NORMALIZED DRAIN-SOURCE ON-RESISTANCE R ps(on). ON-RESISTANCE (OHM) 150 REVERSE DRAIN CURRENT (A) Is nD eo > to S od 5 10 15 20 25 |p, ORAIN CURRENT (A) Figure 2. On-Resistance Variation with Drain Current and Gate Voltage. S Ny o o ip & 2 Ny S a Ta =125C o | es = & 8 2 & 2 4 6 8 10 Vg GATE TO SOURCE VOLTAGE (Vv) Figure 4. On-Resistance Variation with Gate-to-Source Voltage. 30 O41 2 g 0.001 0.0001 0 02 0.4 0.6 0.8 1 12 14 Ven. BODY DIODE FORWARD VOLTAGE (V) Figure 6. Body Diode Forward Voltage Variation with Current and Temperature. 4-284 NDT3055L Rev.A1 Typical Electrical Characteristics (continued) oO 1000 8 ee if ol 2 = we lo a Vg = 10V Ve 500 a 2 BF bom - ae S30V 4 c r~ a 3 : 40v S200 8) 4 g c | e 100 FE $ ea | a ui 2 50 & oO : o oe f=1MHz 3 J | Sy Near av 0 ~ 10 0 2 4 6 8 10 42 14 0.1 0.3 1 4 10 30 60 Qg . GATE CHARGE (nC) Vig. DRAIN TO SOURCE VOLTAGE (V) Figure 7. Gate Charge Characteristics. Figure 8. Capacitance Characteristics. 50 80. 4 = 10 204 SINGLE PULSE = 7; 60 Resa =110 CW a 3 Ta=25C e = c Oo > S 40 0.3 2 Oo Vg = 10V 2 SINGLE PULSE === 20 0.03, Ryja= 110 CW 0.01 bmn 0 O41 02 0.5 1 2 5 10 30 60 100 6.001 0.01 O41 1 10 100 300 Vos , DRAIN-SOURCE VOLTAGE (V) SINGLE PULSE TIME (SEC) Figure 9. Maximum Safe Operating Area. Figure 10. Single Pulse Maximum Power Dissipation. 0.2 a4 0.05 Raya =n * Rosa Raia = 110 CW 0.02 == 0.02: 0.01 = 0.005 - r(t}, NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE 9.002 0.001 - 0.0001 0.001 0.01 of 1 10 100 300 t,. TIME (sec) Figure 11. Transient Thermal Response Curve. Thermal characterization performed using the conditions described in note 1c. Transient thermal response will change depending on the circuit board design. 4-285 NDTSO55L Rev.A1