Integrated Device Technology, Inc.
FUNCTIONAL BLOCK DIAGRAM
1Y1
1Y2
1Y3
1Y4
1A1
1A2
1A3
1A4
2OE
2A1
2A2
2A3
2A4
2Y1
2Y2
2Y3
2Y4
2544 drw 01
1OE 3OE
3A1
3A2
3A3
3A4
3Y1
3Y2
3Y3
3Y4
4OE
4A1
4A2
4A3
4A4
4Y1
4Y2
4Y3
4Y4
2544 drw 02
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES OCTOBER 1996
1996 Integrated Device Technology, Inc. 5.2 DSC-2544/9
15
FAST CMOS 16-BIT
BUFFER/LINE DRIVER IDT54/74FCT16244T/AT/CT/ET
IDT54/74FCT162244T/AT/CT/ET
IDT54/74FCT166244T/AT/CT
IDT54/74FCT162H244T/AT/CT/ET
FEATURES:
• Common features:
– 0.5 MICRON CMOS Technology
– High-speed, low-power CMOS replacement for
ABT functions
–Typical tSK(o) (Output Skew) < 250ps
– Low input and output leakage ≤ 1µA (max.)
– ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
– Packages include 25 mil pitch SSOP, 19.6 mil pitch
TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack
– Extended commercial range of -40°C to +85°C
• Features for FCT16244T/AT/CT/ET:
– High drive outputs (-32mA IOH, 64mA IOL)
– Power off disable outputs permit “live insertion”
– Typical VOLP (Output Ground Bounce) < 1.0V at
VCC = 5V, TA = 25°C
• Features for FCT162244T/AT/CT/ET:
– Balanced Output Drivers: ±24mA (commercial),
±16mA (military)
– Reduced system switching noise
– Typical VOLP (Output Ground Bounce) < 0.6V at
VCC = 5V,TA = 25°C
• Features for FCT166244T/AT/CT:
– Light Drive Balanced Output: ±8mA (commercial),
±6mA (military)
– Minimal system switching noise
– Typical VOLP (Output Ground Bounce) < 0.25V at
VCC = 5V,TA = 25°C
• Features for FCT162H244T/AT/CT/ET:
– Bus-Hold retains last active bus state during 3-state
– Eliminates the need for external pull up resistors
DESCRIPTION:
The 16-Bit Buffer/Line Driver is for bus interface or signal buffering
applications requiring high speed and low power dissipation. These
devices have a flow through pin organization, and shrink packaging
to simplify board layout. All inputs are designed with hysteresis for
improved noise margin. The three-state controls allow independent
4-bit, 8-bit or combined 16-bit operation. These parts are plug in
replacements for 54/74ABT16244 where higher speed, lower noise
or lower power dissipation levels are desired.
The FCT16244T/AT/CT/ET are ideally suited for driving
high capacitance loads (>200pF) and low impedance
backplanes. These "high drive" buffers are designed with
power off disable capability to allow "live insertion" of boards
when used in a backplane interface.
The FCT162244T/AT/CT/ET have balanced output current
levels and current limiting resistors. These offer low ground
bounce, minimal undershoot, and controlled output fall times,
reducing the need for external series terminating resistors
while still providing very high speed operation for loads of less
than 200pF.
The FCT166244T/AT/CT are suited for very low noise,
point-to-point driving where there is a single receiver, or a very
light lumped load (<100pF). The buffers are designed to limit
the output current to levels which will avoid noise and ringing
on the signal lines without using external series terminating
resistors.
The FCT162H244T/AT/CT/ET have "Bus-Hold" which re-
tains the input's last state whenever the input goes to high
impedance. This prevents "floating" inputs and eliminates the
need for pull-up/down resistors.
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
5.2 2
PIN CONFIGURATIONS
1Y1
GND
1Y3
VCC
1OE
GND
3Y2
GND
VCC
GND
1Y2
1Y4
2Y1
2Y2
2Y3
2Y4
3Y1
3Y3
3Y4
4Y1
4Y3
4Y4
4Y2
4OE
1A1
1A2
GND
1A3
1A4
VCC
2A1
2A2
2A3
2A4
3A1
3A2
3A3
3A4
VCC
4A1
4A3
4A4
4A2
GND
GND
GND
2OE
3OE
39
29
30
31
32
33
34
35
36
37
38
25
26
27
28
48
47
41
42
43
44
45
46
40
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
2544 drw 04
CERPACK
TOP VIEW
E48-1
PIN DESCRIPTION
2544 tbl 01
NOTE:
1. On FCT16xH these pins have “Bus-hold”. All other pins are standard
inputs, outputs or I/Os.
Pin Names Description
x
OE
3–State Output Enable Inputs (Active LOW)
xAx Data Inputs
(1)
xYx 3-State Outputs
1Y1
GND
1Y3
VCC
GND
3Y2
GND
VCC
GND
1Y2
1Y4
2Y1
2Y2
2Y3
2Y4
3Y1
3Y3
3Y4
4Y1
4Y3
4Y4
4Y2
4OE
1A1
1A2
GND
1A3
1A4
VCC
2A1
2A2
2A3
2A4
3A1
3A2
3A3
3A4
VCC
4A1
4A3
4A4
4A2
GND
GND
GND
2OE
3OE
2544 drw 03
39
29
30
31
32
33
34
35
36
37
38
25
26
27
28
48
47
41
42
43
44
45
46
40
1
2
3
4
5
6
7
8
9
10
12
13
14
15
16
17
18
19
20
11
21
22
23
24
SSOP/
TSSOP/TVSOP
TOP VIEW
SO48-1
SO48-2
SO48-3
1OE
5.2 3
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
NOTE:
1. This parameter is measured at characterization but not tested.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
FUNCTION TABLE(1)
2544 lnk 04
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
2544 tbl 02
Symbol Parameter
(1)
Conditions Typ. Max. Unit
C
IN
Input
Capacitance V
IN
= 0V 3.5 6.0
pF
C
OUT
Output
Capacitance V
OUT
= 0V 3.5 8.0
pF
ABSOLUTE MAXIMUM RATINGS(1)
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (STANDARD PARTS)
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = –40°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Inputs Outputs
x
OE
OE
xAx xYx
LLL
LHH
HXZ
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — —V
VIL Input LOW Level Guaranteed Logic LOW Level — —0.8 V
II H Input HIGH Current (Input pins)(5) VCC = Max. VI = VCC ——±1µA
Input HIGH Current (I/O pins)(5) ——±1
II L Input LOW Current (Input pins)(5) VI = GND — —±1
Input LOW Current (I/O pins)(5) ——±1
IOZH High Impedance Output Current VCC = Max. VO = 2.7V — —±1µA
IOZL (3-State Output pins)(5) VO = 0.5V — —±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND(3) –80 –140 –225 mA
VHInput Hysteresis — — 100 —mV
ICCL
ICCH
ICCZ
Quiescent Power Supply Current VCC = Max., VIN = GND or VCC — 5 500 µA
2544 lnk 05
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ± 5µA at TA = –55°C.
Symbol Description Max. Unit
VTERM(2) Terminal Voltage with Respect to
GND –0.5 to +7.0 V
VTERM(3) Terminal Voltage with Respect to
GND –0.5 to
VCC +0.5 V
TSTG Storage Temperature –65 to +150 °C
IOUT DC Output Current –60 to +120 mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS
may cause permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not
implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. All device terminals except FCT162XXXT and FCT166XXXT output and
I/O terminals.
3. Output and I/O terminals for FCT162XXXT and FCT166XXXT.
2544 lnk 03
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
5.2 4
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE (BUS-HOLD)
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = –40°C to +85°C, VCC = 5.0V ± 10%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
2544 lnk 06
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2.0 — —V
VIL Input LOW Level Guaranteed Logic LOW Level — — 0.8 V
II H Input Standard Input(5) VCC = Max. VI = VCC ——±1µA
HIGH Standard I/O(5) ——±1
Current(4) Bus-hold Input — — ±100
Bus-hold I/O — — ±100
II L Input Standard Input(5) VI = GND — — ±1
LOW Standard I/O(5) ——±1
Current(4) Bus-hold Input — — ±100
Bus-hold I/O — — ±100
IBHH Bus Hold Bus-hold Input VCC = Min. VI = 2.0V –50 — — µA
IBHL Sustain
Current(4) VI = 0.8V +50 — —
IOZH High Impedance Output Current VCC = Max. VO = 2.7V — —±1µA
IOZL (3-State Output pins)(5,6) VO = 0.5V — —±1
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND(3) –80 –140 –225 mA
VHInput Hysteresis — — 100 —mV
ICCL
ICCH
ICCZ
Quiescent Power Supply Current VCC = Max., VIN = GND or VCC — 5 500 µA
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Pins with Bus-hold are identified in the pin description.
5. The test limit for this parameter is ± 5µA at TA = –55°C.
6. Does not include Bus-hold I/O pins.
5.2 5
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
OUTPUT DRIVE CHARACTERISTICS FOR FCT16244T
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
IOOutput Drive Current VCC = Max., VO = 2.5V(3) –50 —–180 mA
VOH Output HIGH Voltage VCC = Min. IOH = –3mA 2.5 3.5 — V
VIN = VIH or VIL IOH = –12mA MIL.
IOH = –15mA COM'L. 2.4 3.5 — V
IOH = –24mA MIL.
IOH = –32mA COM'L.(4) 2.0 3.0 — V
VOL Output LOW Voltage VCC = Min.
VIN = VIH or VIL IOL = 48mA MIL.
IOL = 64mA COM'L. — 0.2 0.55 V
IOFF Input/Output Power Off Leakage(5) VCC = 0V, VIN or VO ≤ 4.5V — — ±1µA
OUTPUT DRIVE CHARACTERISTICS FOR FCT162244T 2544 lnk 07
2544 lnk 08
OUPUT DRIVE CHARACTERISTICS FOR FCT166244T
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max.
Unit
I
ODL
Output LOW Current V
CC
= 5V, V
IN
= V
IH
or
V
IL,
V
OUT
= 1.5V
(3)
16 48 96 mA
I
ODH
Output HIGH Current V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
–16 –48 –96 mA
V
OH
Output HIGH Voltage V
CC
= Min.
V
IN
= V
IH
or
V
IL
I
OH
= –6mA MIL.
I
OH
= –8mA COM'L. 2.4 3.3 — V
V
OL
Output LOW Voltage V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OL
= 6mA MIL.
I
OL
= 8mA COM'L. — 0.3 0.55 V
2544 lnk 09
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is ± 5µA at TA = –55°C.
Symbol Parameter Test Conditions(1) Min. Typ.(2) Max. Unit
IODL Output LOW Current VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3) 60 115 200 mA
IODH Output HIGH Current VCC = 5V, VIN = VIH or V IL, VOUT = 1.5V(3) –60 –115 –200 mA
VOH Output HIGH Voltage VCC = Min.
VIN = VIH or VIL IOH = –16mA MIL.
IOH = –24mA COM'L. 2.4 3.3 — V
VOL Output LOW Voltage VCC = Min.
VIN = VIH or VIL IOL = 16mA MIL.
IOL = 24mA COM'L. — 0.3 0.55 V
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
5.2 6
POWER SUPPLY CHARACTERISTICS
2544 tbl 10
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi)
ICC = Quiescent Current (ICCL, ICCH and ICCZ)
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
NCP = Number of Clock Inputs at fCP
fi = Input Frequency
Ni = Number of Inputs at fi
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
∆I
CC
Quiescent Power Supply Current
TTL Inputs HIGH V
CC
= Max.
V
IN
= 3.4V
(3)
— 0.5 1.5 mA
I
CCD
Dynamic Power Supply
Current
(4)
V
CC
= Max.
Outputs Open
x
OE
= GND
One Input Toggling
50% Duty Cycle
V
IN
= V
CC
V
IN
= GND — 60 100
µ
A/
MHz
I
C
Total Power Supply Current
(6)
V
CC
= Max.
Outputs Open
fi = 10MHz
V
IN
= V
CC
V
IN
= GND — 0.6 1.5 mA
50% Duty Cycle
x
OE
= GND
One Bit Toggling
V
IN
= 3.4V
V
IN
= GND — 0.9 2.3
V
CC
= Max.
Outputs Open
fi = 2.5MHz
V
IN
= V
CC
V
IN
= GND — 2.4 4.5
(5)
50% Duty Cycle
x
OE
= GND
Sixteen Bits Toggling
V
IN
= 3.4V
V
IN
= GND — 6.4 16.5
(5)
5.2 7
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE FOR FCT16244T/FCT162244T
2544 tbl 11
2544 tbl 12
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.
FCT16244T/162244T/166244T FCT16244AT/162244AT/166244AT
Com'l. Mil. Com'l. Mil.
Symbol Parameter Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit
tPLH
tPHL Propagation Delay
xAx to xYx CL = 50pF
RL = 500Ω1.5 6.5 1.5 7.0 1.5 4.8 1.5 5.1 ns
tPZH
tPZL Output Enable Time 1.5 8.0 1.5 8.5 1.5 6.2 1.5 6.5 ns
tPHZ
tPLZ Output Disable Time 1.5 7.0 1.5 7.5 1.5 5.6 1.5 5.9 ns
tSK(o) Output Skew(3) — 0.5 — 0.5 — 0.5 — 0.5 ns
FCT16244CT/162244CT/166244CT FCT16244ET/162244ET
Com'l. Mil. Com'l. Mil.
Symbol Parameter Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit
tPLH
tPHL Propagation Delay
xAx to xYx CL = 50pF
RL = 500Ω1.5 4.1 1.5 4.6 1.5 3.2 — — ns
tPZH
tPZL Output Enable Time 1.5 5.8 1.5 6.5 1.5 4.4 — — ns
tPHZ
tPLZ Output Disable Time 1.5 5.2 1.5 5.7 1.5 3.6 — — ns
tSK(o) Output Skew(3) — 0.5 — 0.5 — 0.5 — — ns
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
5.2 8
SWITCH POSITION
TEST CIRCUITS AND WAVEFORMS
TEST CIRCUITS FOR ALL OUTPUTS
DEFINITIONS:
CL= Load capacitance: includes jig and probe capacitance.
RT =Termination resistance: should be equal to ZOUT of the Pulse
Generator.
2544 lnk 13
Test Switch
Disable Low
Enable Low
Closed
All Other Tests Open
Open Drain
Pulse
Generator
RT
D.U.T.
VCC
VIN
CL
VOUT
50pF 500Ω
500Ω
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
tSU tH
tREM
tSU tH
HIGH-LOW-HIGH
PULSE
LOW-HIGH-LOW
PULSE
tW
1.5V
1.5V
SAME PHASE
INPUT TRANSITION
3V
1.5V
0V
1.5V
VOH
tPLH
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
3V
1.5V
0V
tPLH tPHL
tPHL
VOL
CONTROL
INPUT
3V
1.5V
0V
3.5V
0V
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
SWITCH
CLOSED
SWITCH
OPEN
VOL
0.3V
0.3V
tPLZtPZL
tPZH tPHZ
3.5V
0V
1.5V
1.5V
ENABLE DISABLE
VOH
PRESET
CLEAR
CLOCK ENABLE
ETC.
SET-UP, HOLD AND RELEASE TIMES PULSE WIDTH
2544 drw 05
ENABLE AND DISABLE TIMESPROPAGATION DELAY
2544 drw 07
2544 drw 06
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control
Disable-HIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns
2544 drw 09
2544 drw 08
5.2 9
IDT54/74FCT16244T/AT/CT/ET, 162244T/AT/CT/ET,
166244T/AT/CT, 162H244T/AT/CT/ET FAST CMOS 16-BIT BUFFER/LINE DRIVER MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT XX
Temp. Range XXXX
Device Type X
Package X
Process
Blank
B
PV
PA
PF
E
244T
244AT
244CT
244ET
Commercial
MIL-STD-883, Class B
Shrink Small Outline Package (SO48-1)
Thin Shrink Small Outline Package (SO48-2)
Thin Very Small Outline Package (SO48-3)
CERPACK (E48-1)
Non-Inverting 16-Bit Buffer/Line Driver
54
74 –55
°
C to +125
°
C
–40
°
C to +85
°
C
FCT
2544 drw 10
X
Drive
Blank
HStandard
Bus-hold
X
Bus Hold
16
162
166
16-Bit High Drive
16-Bit Balanced Drive
16-Bit Light Drive
