May 2001
QFETTM
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
FQA47P06
60V P-Channel MOSFET
General Description
These P-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand a high energy pulse in the
avalanche and commutation modes. These devices are
well suited for low voltage appl ications such as automotive,
DC/DC converters, and high ef ficiency s witch ing fo r power
management in portable and battery operated products.
Features
• -55A, -60V, RDS(on) = 0.026Ω @VGS = -10 V
• Low gate charge ( typical 84 nC)
• Low Crss ( typical 320 pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt capability
• 175°C maximum junction temperature rating
Absolute Maxim um Ratings TC = 25°C unless otherwise noted
Thermal Characteristics
Symbol Parameter FQA47P06 Units
VDSS Drain-Source Voltage -60 V
IDDrain Current - Continuous (TC = 25°C) -55 A
- Continuous (TC = 100°C) -38.9 A
IDM Drain Current - Pulsed (Note 1) -220 A
VGSS Gate-Source Voltage ± 25 V
EAS Single Pulsed Avalanche Energy (Note 2) 820 mJ
IAR Avalanche Current (Note 1) -55 A
EAR Repetitive Avalanche Energy (Note 1) 21.4 mJ
dv/dt Peak Diode Recovery dv/dt (Note 3) -7.0 V/ns
PDPower Dissipation (TC = 25°C) 214 W
- Derate above 25°C 1.43 W/°C
TJ, TSTG Operating and Storage Temperature Range -55 to +175 °C
TLMaximum lead temperature for soldering purposes,
1/8" from case for 5 seconds 300 °C
Symbol Parameter Typ Max Units
RθJC Thermal Resistance, Junction-to-Case -- 0.7 °C/W
RθCS Thermal Resistance, Case-to-Sink 0.24 -- °C/W
RθJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W
TO-3PN
FQA Series
GSD
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FQA47P06
Rev. A2. May 2001©2001 Fairchild Semiconductor Corporation
Elerical Characteristics TC = 25°C unless otherwise noted
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 0.315mH, IAS = -55A, VDD = -25V , RG = 25 Ω, Starting TJ = 25°C
3. ISD ≤ -47A, di/dt ≤ 300A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test : Pulse width ≤300µs, Duty cycle ≤2%
5. Essentially independent of operating temperature
Symbol Parame ter Test Conditions Min Typ Max Unit s
Off Characteristics
BVDSS Drain-S ource Breakdown Voltage VGS = 0 V, I D = -250 µA-60 -- -- V
∆BVDSS
/ ∆TJ
Breakdown Vo ltage Temperature
Coefficient ID = -250 µA, Referenced to 25°C -- -0.06 -- V/°C
IDSS Zero Gate Voltage Drain Current VDS = -60 V, VGS = 0 V -- -- -1 µA
VDS = -48 V, TC = 150°C -- -- -10 µA
IGSSF Gate-Body Leakage Current, Forward VGS = -25 V, VDS = 0 V -- -- -100 nA
IGSSR Gate-Body Leakage Current, Reverse VGS = 25 V, VDS = 0 V -- -- 100 nA
On Characteri st ics
VGS(th) Gate Threshold Volt age VDS = VGS, ID = -250 µA-2.0 -- -4.0 V
RDS(on) Static Drain-Source
On-Resistance VGS = -10 V, ID = -27.5 A -- 0.021 0.026 Ω
gFS Forward Transconductance VDS = -30 V, ID = -27.5 A -- 22 -- S
Dynamic Characteristics
Ciss Input Capacitance VDS = -25 V, VGS = 0 V,
f = 1.0 MHz
-- 2800 3600 pF
Coss Output Capacitance -- 1300 1700 pF
Crss Reverse Transfer Capacit ance -- 320 420 pF
Switching Characteristics
td(on) Turn-On Delay Time VDD = -30 V, ID = -23.5 A,
RG = 25 Ω
-- 50 110 ns
trTurn-On Rise Time -- 450 910 ns
td(off) Turn-Off De l a y Time -- 10 0 210 ns
tfTurn -Off Fa ll Time -- 1 9 5 400 n s
QgTotal Gate Ch a rge VDS = -48 V, ID = -47 A,
VGS = -10 V
-- 84 110 nC
Qgs Gate-Source Charge -- 18 -- nC
Qgd Gate-Drain Charge -- 44 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
ISMaximum Continuous Drain-Source Diode Forward Current -- -- -55 A
ISM Maximum Pulsed Drain-Source Diode Forward Current -- -- -220 A
VSD Drain-Source Diode Forward Voltage VGS = 0 V, IS = -55 A -- -- -4.0 V
trr Reverse Recovery Time VGS = 0 V, I S = -47 A,
dIF / dt = 100 A/µs
-- 130 -- ns
Qrr Reverse Recovery Charge -- 0.55 -- µC
(Note 4)
(Note 4, 5)
(Note 4, 5)
(Note 4)
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
0 102030405060708090
0
2
4
6
8
10
12
VDS = -30V
VDS = -48V
※ Note : ID = -47 A
-VGS , Gate-Source Voltage [V]
QG, Total Gate Ch a rg e [nC]
10-1 100101
0
1000
2000
3000
4000
5000
6000
7000
8000 Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
※ Notes :
1. V GS = 0 V
2. f = 1 MHz
Crss
Coss
Ciss
Capacitance [pF]
VDS, Drain-Source Voltage [V]
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4 2.6 2.8
10-1
100
101
102
175℃※ Notes :
1. VGS = 0V
2. 250μs Pulse Test
25℃
-IDR , R ev e rs e D ra in Curren t [A ]
-VSD , Source-Drain Voltage [V]
0 100 200 300 400
0.00
0.02
0.04
0.06
0.08
0.10
※ N o te : TJ = 25℃
VGS = - 20V
VGS = - 10V
RDS(on) [Ω],
Drain-Source On-Resistance
-ID , Drain Curr e nt [A]
246810
10-1
100
101
102
175℃
25℃
-55℃
※ No tes :
1. VDS = -30V
2. 250μs Pu lse T es t
-ID , Dra in Curr e n t [A]
-VGS , Gate-Source Voltage [V]
10-1 100101
100
101
102
VGS
To p : - 15.0 V
- 10.0 V
- 8.0 V
- 7.0 V
- 6.0 V
- 5.5 V
- 5.0 V
Bottom : - 4.5 V
※ Notes :
1. 250μs Pulse Test
2. TC = 25℃
-ID, Drain Current [A]
-VDS, Drain-Source Voltage [V]
Typical Characteristics
Figure 5. C apacitanc e Ch aracterist i cs Figure 6. Ga te Ch arge Cha ra ct eri stics
Figu re 3. On-R esistan ce Variation vs.
Drain Current and Gate Voltage Figure 4. Body Diode Fo rwa rd Voltage
Variation vs. Source Current
and Temperature
Figure 2. Transfer CharacteristicsFigure 1. On- R egi on Character i st ic s
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
10-5 10-4 10-3 10-2 10-1 100101
10-2
10-1
100
※ No te s :
1 . Z θJC(t) = 0 .7 ℃/W M a x .
2 . D u ty F a c to r , D= t1/t2
3 . T JM - T C = PDM * Z θJC(t)
single pulse
D=0.5
0.02
0.2
0.05
0.1
0.01
ZθJC
(t), T herm al R esponse
t1, Sq u a re W a ve P u lse Du ra tio n [se c]
25 50 75 100 125 150 175
0
10
20
30
40
50
60
-ID, Drain C urrent [A ]
TC, Case Temperature [℃
]
100101102
10-1
100
101
102
103
DC 10 m s1 ms
100 µs
Operation in This Area
is Limited b y R DS(on)
※ Notes :
1. TC = 25 oC
2. TJ = 175 oC
3. Single Pulse
-ID, Drain Current [A]
-VDS, Drain-Source Voltage [V]
-100 -50 0 50 100 150 200
0.0
0.5
1.0
1.5
2.0
2.5
※ Notes :
1. VGS = -10 V
2. ID = -23.5 A
RDS(ON) , (Normalized)
Drain-Source On-Resistance
TJ, Junction Temperature [oC]
-100 -50 0 50 100 150 200
0.8
0.9
1.0
1.1
1.2
※ Notes :
1 . VGS = 0 V
2 . ID = -250 μA
-BV DSS , (N orm a liz e d )
Drain-Source Breakdow n Voltage
TJ, Junction Tem perature [oC]
Typical Characteristics (Continued)
Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current
vs. Case Temperature
Figu re 7. Breakdown Voltag e Variation
vs. Temperature Figure 8. On-Resistance Variation
vs. Temperature
Figure 11. Tr ansient Thermal Res pons e Cur ve
t1
PDM
t2
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
Charge
VGS
-10V Qg
Qgs Qgd
-3mA
VGS
DUT
VDS
300nF
50KΩ
200nF
12V
Same Type
as DUT
Charge
VGS
-10V Qg
Qgs Qgd
-3mA
VGS
DUT
VDS
300nF
50KΩ
200nF
12V
Same Type
as DUT
VDS
VGS 10%
90%
td(on) tr
ton toff
td(off) tf
VDD
-10V
VDS RL
DUT
RG
VGS
VDS
VGS 10%
90%
td(on) tr
ton toff
td(off) tf
VDD
-10V
VDS RL
DUT
RG
VGS
EAS =LI
AS2
----
2
1--------------------
BVDSS -V
DD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
-10V DUT
RG
L
ID
t p
EAS =LI
AS2
----
2
1
EAS =LI
AS2
----
2
1
----
2
1--------------------
BVDSS -V
DD
BVDSS
VDD
VDS
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
-10V DUT
RG
LL
ID
ID
t p
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & W aveforms
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
Peak Diode Recover y dv /d t Tes t Circuit & Waveforms
DUT
VDS
+
_
Driver
RGCompliment of DUT
(N-Channel)
VGS • dv/dt controlled by RG
•I
SD con trolled by pulse per iod
VDD
L
ISD
10V
VGS
( Driver )
ISD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D = Gate Pulse Width
Gate Pu lse P eri od
--------------------------
DUT
VDS
+
_
Driver
RGCompliment of DUT
(N-Channel)
VGS • dv/dt controlled by RG
•I
SD con trolled by pulse per iod
VDD
LL
ISD
10V
VGS
( Driver )
ISD
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
VSD
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D = Gate Pulse Width
Gate Pu lse P eri od
--------------------------
D = Gate Pulse Width
Gate Pu lse P eri od
--------------------------
FQA47P06
©2001 Fairchild Semiconductor Corporation Rev. A2. May 2001
Mechanical Dimensions
Dimensions in Millimeters
TO-3PN
©2001 Fairchild Semiconductor Corporation Rev. H2
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all su ch trademarks.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY A NY LICENSE UNDER ITS PATENT RIGHTS, N OR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devic es or syst em s
which, (a) ar e intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification Product Status Definition
Advance Information Formative or In
Design This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary First Production This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconduct or reserv es the right to make
changes at any time without notice in order to improve
design.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete Not In Production This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
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