CY7C197BN
256-Kb (256 K × 1) Static RAM
Cypress Semiconductor Corporation 198 Champion Court San Jose,CA 95134-1709 408-943-2600
Document #: 001-06447 Rev. *C Revised April 6, 2011
256-Kb (256 K × 1) Static RAM
Features
Fast access time: 15 ns
Wide voltage range: 5.0 V ± 10% (4.5 V to 5.5 V)
CMOS for optimum speed and power
TTL compatible inputs and outputs
Available in 24-pin DIP and 24-pin SOJ
General Description [1]
The CY7C197BN is a high performance CMOS Asynchronous
SRAM organized as 256 K × 1 bits that supports an
asynchronous memory interface. The device features an
automatic power down feature that significantly reduces power
consumption when deselected.
See the Truth Table on page 8 for a complete description of Read
and Write modes.
The CY7C197BN is available in 24-pin DIP and 24-pin SOJ
package(s).
Note
1. For best practice recommendations, refer to the Cypress application note System Design Guidelines on www.cypress.com.
Row Decoder
Column
Decoder
Input
Buffer
Sense Amps
Ax
x
Dout
WE
CE
Din
Power
Down
Circuit
RAM Array
Logic Block Diagram
Product Portfolio
Description -15 -25 Unit
Maximum Access Time 15 25 ns
Maximum Operating Current 150 95 mA
Maximum CMOS Standby Current 10 10 mA
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Contents
Pin Layout and Specification ......................................... 3
Pin Description ................................................................. 3
Maximum Ratings .............................................................4
Operating Range ............................................................... 4
DC Electrical Characteristics ..........................................4
Capacitance ......................................................................4
Thermal Resistance ..........................................................4
AC Test Loads ..................................................................5
AC Test Conditions ..........................................................5
AC Electrical Characteristics ..........................................6
Timing Waveforms ...........................................................6
Read Cycle No. 1 ........................................................6
Read Cycle No. 2 ........................................................7
Write Cycle No. 1 (WE Controlled) .............................. 7
Write Cycle No. 2 (CE Controlled) ...............................8
Truth Table ........................................................................ 8
Ordering Information ........................................................ 9
Ordering Code Definitions ........................................... 9
Package Diagrams .......................................................... 10
Acronyms ........................................................................ 11
Document Conventions ................................................. 11
Units of Measure ....................................................... 11
Document History Page ................................................. 12
Sales, Solutions, and Legal Information ...................... 13
Worldwide Sales and Design Support ....................... 13
Products .................................................................... 13
PSoC Solutions ......................................................... 13
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Document #: 001-06447 Rev. *C Page 3 of 13
Pin Layout and Specification
Pin Description
Pin Type Description DIP SOJ
AXInput Address Inputs 1, 2, 3, 4, 5, 6, 7, 8, 9, 15, 16, 17,
18, 19, 20, 21, 22, 23
1, 2, 3, 4, 5, 6, 7, 8, 9, 15, 16, 17,
18, 19, 20, 21, 22, 23
CE Control Chip Enable 13 13
Din Input Data Input Pins 14 14
Dout Output Data Output Pins 10 10
VCC Supply Power (5.0 V) 24 24
WE Control Write Enable 11 11
A0
A1
A2
A3
A4
A5
A6
A7
A8
Dout
WE
GND CE
Din
A9
A10
A11
A12
A13
A14
A15
A16
A17
VCC 1
2
3
4
5
6
7
8
9
10
11
12 13
14
15
16
17
18
19
20
21
22
23
24
24-pin DIP (6.6 × 31.8 × 3.5 mm)
A0
A1
A2
A3
A4
A5
A6
A7
A8
Dout
WE
GND CE
Din
A9
A10
A11
A12
A13
A14
A15
A16
A17
VCC 1
2
3
4
5
6
7
8
9
10
11
12 13
14
15
16
17
18
19
20
21
22
23
24
24-pin SOJ (8 × 15 × 3.5 mm)
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Document #: 001-06447 Rev. *C Page 4 of 13
Maximum Ratings
Exceeding the maximum rating may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ............................... –65 °C to +150 °C
Ambient Temperature with
Power Applied ......................................... –55 °C to +125 °C
Supply Voltage on VCC to Relative GND ......–0.5 V to +7.0 V
DC Voltage Applied to Outputs
in High Z State[2] .................................. –0.5 V to VCC + 0.5 V
DC Input Voltage[2] .............................. –0.5 V to VCC + 0.5 V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage...............................................2001 V
(per MIL-STD-883, Method 3015)
Latch Up Current .................................................... > 200 mA
Operating Range
Range
Ambient
Temperature[3] VCC
Commercial 0 °C to 70 °C 5.0 V ± 10%
DC Electrical Characteristics[2]
Parameter Description Condition 15 ns 25 ns Unit
Min Max Min Max
VIH Input HIGH Voltage 2.2 VCC + 0.3 2.2 VCC + 0.3 V
VIL Input LOW Voltage –0.3 0.8 –0.3 0.8 V
VOH Output HIGH Voltage VCC = Min, IOH = –4.0 mA 2.4 2.4 V
VOL Output LOW Voltage VCC = Min, lOL = 8.0 mA 0.4 0.4 V
IOZ Output Leakage Current GND Vi VCC, Output Disabled –5 +5 –5 +5 µA
IIX Input Leakage Current GND Vi VCC –5 +5 –5 +5 µA
ICC VCC Operating Supply
Current
VCC = Max, IOUT = 0 mA,
f = FMAX = 1/tRC
150 95 mA
ISB1 Automatic CE Power Down
Current TTL Inputs
VCC = Max, CE VIH, VIN VIH or
VIN VIL, f = FMAX
30 30 mA
ISB2 Automatic CE Power Down
Current CMOS Inputs
VCC = Max, CE VCC – 0.3 V,
VIN VCC – 0.3 V or VIN < 0.3 V,
f = 0
10 10 mA
Capacitance[4]
Parameter Description Conditions Max (ALL – PACKAGES) Unit
CIN Input Capacitance TA = 25 °C, f = 1 MHz,
VCC = 5.0 V
8pF
COUT Output Capacitance 10
Thermal Resistance[4]
Parameter Description Conditions 24-pin DIP 24-pin SOJ Unit
JA Thermal Resistance
(Junction to Ambient)
Still Air, soldered on a 3 × 4.5
square inches, two-layer
printed circuit board
75.69 84.15 °C/W
JC Thermal Resistance
(Junction to Case)
33.80 37.56
Notes
2. VIL(min) = –2.0 V for pulse durations of less than 20 ns.
3. TA is the “instant on” case temperature.
4. Tested initially and after any design or process change that may affect these parameters.
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AC Test Loads[5]
Note
5. Test Conditions assume a transition time of 3 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to 3.0 V.
AC Test Conditions
Parameter Description Nom. Unit
C1 Capacitor 1 30 pF
C2 Capacitor 2 5
R1 Resistor 1 480
R2 Resistor 2 255
R3 Resistor 3 480
R4 Resistor 4 255
RTH Resistor Thevenin 167
VTH Voltage Thevenin 1.73 V
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AC Electrical Characteristics[4, 6, 7, 8]
Parameter Description 15 ns 25 ns Unit
Min Max Min Max
tRC Read Cycle Time 15 25 ns
tAA Address to Data Valid 15 25 ns
tOHA Data Hold from Address Change 3 3 ns
tACE CE to Data Valid 15 25 ns
tLZCE CE to Low Z 3 3 ns
tHZCE CE to High Z –5–11 ns
tPU CE to Power-up 0 0 ns
tPD CE to Power-down 15 20 ns
tWC Write Cycle Time 15 25 ns
tSCE CE to Write End 9 20 ns
tAW Address Set-up to Write End 10 20 ns
tHA Address Hold from Write End 0 0 ns
tSA Address Set-up to Write Start 0 0 ns
tPWE WE Pulse Width 9 20 ns
tSD Data Set-Up to Write End 9 15 ns
tHD Data Hold from Write End 0 0 ns
tHZWE WE LOW to High Z –7–11 ns
tLZWE WE HIGH to Low Z 2 3 ns
Notes
6. At any given temperature and voltage condition, tHZCE is less than tLZCE, and tHZWE is less than tLZWE for any given device.
7. The internal Write time of the memory is defined by the overlap of CE LOW and WE LOW. CE and WE must be LOW to initiate a write, and the transition of any of
these signals can terminate the Write. The input data setup and hold timing should be referenced to the leading edge of the signal that terminates the write.
8. tHZCE, tHZWE are specified as in part (b) of the AC Test Loads[5] on page 5. Transitions are measured ±200 mV from steady state voltage.
9. Device is continuously selected. CE = VIL.
10. WE is HIGH for Read Cycle.
Timing Waveforms
Read Cycle No. 1 [9, 10]
Address
Data Out Previous Data Valid Data Valid
tRC
tAA
tOHA
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Read Cycle No. 2 [11, 12, 13]
Write Cycle No. 1 (WE Controlled) [11, 14]
Notes
11. Tested initially and after any design or process change that may affect these parameters.
12. WE is HIGH in read cycle.
13. Address valid prior to or coincident with CE transition LOW.
14. The minimum write cycle time is the sum of tHZWE and tSD.
Timing Waveforms (continued)
Address
CE
Data Out Data Valid
tRC
High Z
tACE tHZCE
ICC
ISB
tPU
50% 50%
tPD
High Z
Vcc Supply Current
tLZCE
Address
Data In
tWC
Data
Valid
tSCE
tSA
tAW
tPWE
tHA
tHD
tSD
Data Out Data
Undefined
High Impedance
tHZWE tLZWE
CE
WE
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Document #: 001-06447 Rev. *C Page 8 of 13
Write Cycle No. 2 (CE Controlled)[15, 16]
Timing Waveforms (continued)
Address
CE
WE
Data In
tWC
Data Valid
tSCE
tSA
tAW
tPWE
tHA
tHD
tSD
Data Out High Z
Notes
15. This cycle is CE controlled.
16. If CE goes HIGH simultaneously with WE going HIGH, the output remains in a high impedance state.
Truth Table
CE WE I/Ox Mode Power
H X High Z Deselect/Power-Down Standby (ISB)
L H Data Out Read Active (ICC)
L L Data In Write Active (ICC)
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Document #: 001-06447 Rev. *C Page 9 of 13
Ordering Information
Speed (ns) Ordering Code Package
Diagram Package Type Operating
Range
15 CY7C197BN-15VC 51-85030 24-pin SOJ (8 × 15 × 3.5 mm) Commercial
25 CY7C197BN-25PC 51-85013 24-pin DIP (6.6 × 31.8 × 3.5 mm) Commercial
Ordering Code Definitions
Please contact local sales representative regarding availability of these parts.
Temperature Range:
C = Commercial
Package Type: XX = V or P
V = 24-pin SOJ
P = 24-pin DIP
Speed: XX = 15 ns or 25 ns
BN = 0.25 µm Technology
97 = 256-Kbit density with datawidth × 1 bit
1 = Fast Asynchronous SRAM family
Technology Code: C = CMOS
7 = SRAM
CY = Cypress
CCY 1 - XX X797 CBN
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Document #: 001-06447 Rev. *C Page 10 of 13
Package Diagrams
Figure 1. 24-pin (300-mil) SOJ, 51-85030
Figure 2. 24-pin DIP (6.6 × 31.8 × 3.5 mm), 51-85013
51-85030 *C
51-85013 *C
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Document #: 001-06447 Rev. *C Page 11 of 13
Acronyms Document Conventions
Units of Measure
Acronym Description
CMOS complementary metal oxide semiconductor
CE chip enable
DIP dual in-line package
SOJ small outline J-lead
SRAM static random access memory
TTL transistor-transistor logic
WE write enable
Symbol Unit of Measure
ohms
ns nano seconds
VVolts
µA micro Amperes
mA milli Amperes
mm milli meter
ms milli seconds
MHz Mega Hertz
pF pico Farad
WWatts
% percent
°C degree Celcius
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Document #: 001-06447 Rev. *C Page 12 of 13
Document History Page
Document Title: CY7C197BN 256-Kb (256 K × 1) Static RAM
Document Number: 001-06447
REV. ECN No. Issue Date Orig. of
Change Description of Change
** 901742 See ECN NXR New Data Sheet
*A 2892510 03/18/2010 VKN Removed 12ns speed bin
Updated Ordering Information table
Updated Package Diagrams
Added Sales, Solutions, and Legal Information
*B 3108898 12/13/2010 AJU Added Ordering Code Definitions.
*C 3217480 04/06/2011 PRAS Added Acronyms and Units of Measure.
Updated in new template.
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Document #: 001-06447 Rev. *C Revised April 6, 2011 Page 13 of 13
All products and company names mentioned in this document may be the trademarks of their respective holders.
CY7C197BN
© Cypress Semiconductor Corporation, 2007-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),
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and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without
the express written permission of Cypress.
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Use may be limited by and subject to the applicable Cypress software license agreement.
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