IKA06N60T (R) TrenchStop Series Low Loss DuoPack : IGBT in TrenchStop(R) and Fieldstop technology with soft, fast recovery anti-parallel Emitter Controlled HE diode Features Very low VCE(sat) 1.5 V (typ.) Maximum Junction Temperature 175 C Short circuit withstand time - 5s (R) TrenchStop and Fieldstop technology for 600 V applications offers : - very tight parameter distribution - high ruggedness, temperature stable behavior - very high switching speed Low EMI Very soft, fast recovery anti-parallel Emitter Controlled HE diode 1 Qualified according to JEDEC for target applications Pb-free lead plating; RoHS compliant Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/ C G E PG-TO-220-3-31 / -111 (FullPAK) Applications Washing Machine Inverter and Variable Speed Drive Type IKA06N60T VCE IC VCE(sat),Tj=25C Tj,max Marking Code Package 600V 6A 1.5V 175C K06T60 PG-TO-220-3-31 / -111 Maximum Ratings Parameter Symbol Collector-emitter voltage VCE DC collector current, limited by Tjmax IC Value 600 Unit V A TC = 25C 10 TC = 100C 6.2 Pulsed collector current, tp limited by Tjmax ICpul s 18 Turn off safe operating area VCE 600V, Tj 175C - 18 Diode forward current, limited by Tjmax IF TC = 25C 10.2 TC = 100C 6.5 Diode pulsed current, tp limited by Tjmax IFpul s 18 Gate-emitter voltage VGE 20 V tSC 5 s Ptot 28 W C 2) Short circuit withstand time VGE = 15V, VCC 400V, Tj 150C Power dissipation TC = 25C Operating junction temperature Tj -40...+175 Storage temperature Tstg -55...+175 Isolation voltage Visol 2500 1 2) J-STD-020 and JESD-022 Allowed number of short circuits: IFAG IPC TD VLS Vr m s <1000; time between short circuits: >1s. 1 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series Thermal Resistance Parameter Symbol Conditions Max. Value Unit RthJC 5.3 K/W RthJCD 6.5 RthJA 80 Characteristic IGBT thermal resistance, junction - case Diode thermal resistance, junction - case Thermal resistance, junction - ambient Electrical Characteristic, at Tj = 25 C, unless otherwise specified Parameter Symbol Conditions Value min. typ. max. 600 - - T j =2 5 C - 1.5 2.05 T j =1 7 5 C - 1.8 T j =2 5 C - 1.6 2.05 T j =1 7 5 C - 1.6 - 4.1 4.6 5.7 Unit Static Characteristic Collector-emitter breakdown voltage V ( B R ) C E S V G E = 0V , I C = 0. 25m A Collector-emitter saturation voltage VCE(sat) VF Diode forward voltage Gate-emitter threshold voltage VGE(th) V V G E = 15 V , I C = 6 A V G E = 0V , I F = 6 A I C = 0. 18m A , VCE=VGE Zero gate voltage collector current ICES V C E = 60 0 V , V G E =0 V A T j =2 5 C - - 40 T j =1 7 5 C - - 700 Gate-emitter leakage current IGES V C E = 0V , V G E =2 0 V - - 100 nA Transconductance gfs V C E = 20 V , I C = 6 A - 3.6 - S Integrated gate resistor RGint none Dynamic Characteristic Input capacitance Ciss V C E = 25 V , - 368 - Output capacitance Coss V G E = 0V , - 28 - Reverse transfer capacitance Crss f= 1 MH z - 11 - Gate charge QGate V C C = 48 0 V, I C =6 A - 42 - nC - 7 - nH - 55 - A pF V G E = 15 V LE Internal emitter inductance measured 5mm (0.197 in.) from case Short circuit collector current 1) 1) IC(SC) V G E = 15 V ,t S C 5 s V C C = 4 0 0 V, T j = 25 C Allowed number of short circuits: <1000; time between short circuits: >1s. IFAG IPC TD VLS 2 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series Switching Characteristic, Inductive Load, at Tj=25 C Parameter Symbol Conditions Value min. Typ. max. - 9.4 - - 5.6 - - 130 - - 58 - - 0.09 - - 0.11 - - 0.2 - Unit IGBT Characteristic Turn-on delay time td(on) Rise time tr Turn-off delay time td(off) Fall time tf Turn-on energy Eon Turn-off energy Eoff Total switching energy Ets T j =2 5 C , V C C = 40 0 V, I C = 6 A, V G E = 0/ 15 V , R G = 23 , 2) L =6 0 nH , 2) C = 4 0p F Energy losses include "tail" and diode reverse recovery. Diode reverse recovery time trr T j =2 5 C , - 123 - ns Diode reverse recovery charge Qrr V R = 4 00 V , I F = 6 A, - 190 - nC Diode peak reverse recovery current Irrm d i F / d t =5 5 0 A/ s - 5.3 - A Diode peak rate of fall of reverse recovery current during t b d i r r /d t - 450 - A/s ns mJ Anti-Parallel Diode Characteristic Switching Characteristic, Inductive Load, at Tj=175 C Parameter Symbol Conditions Value min. typ. max. - 8.8 - - 8.2 - - 165 - - 84 - - 0.14 - - 0.18 - - 0.335 - Unit IGBT Characteristic Turn-on delay time td(on) Rise time tr Turn-off delay time td(off) Fall time tf Turn-on energy Eon Turn-off energy Eoff Total switching energy Ets T j =1 7 5 C, V C C = 40 0 V, I C = 6 A, V G E = 0/ 15 V , R G = 2 3 1) L =6 0 nH , 1) C = 4 0p F Energy losses include "tail" and diode reverse recovery. Diode reverse recovery time trr T j =1 7 5 C - 180 - ns Diode reverse recovery charge Qrr V R = 4 00 V , I F = 6 A, - 500 - nC Diode peak reverse recovery current Irrm d i F / d t =5 5 0 A/ s - 7.6 - A Diode peak rate of fall of reverse recovery current during t b d i r r /d t - 285 - A/s ns mJ Anti-Parallel Diode Characteristic 2) 1) Leakage inductance L a nd Stray capacity C due to dynamic test circuit in Figure E. Leakage inductance L a nd Stray capacity C due to dynamic test circuit in Figure E. IFAG IPC TD VLS 3 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series t p=1s 5s 10A 10s IC, COLLECTOR CURRENT IC, COLLECTOR CURRENT 15A T C =80C 10A T C =110C Ic 5A 50s 1A 500s 5ms 0,1A Ic 0A 10Hz DC 100H z 1kHz 10kHz 100kH z f, SWITCHING FREQUENCY Figure 1. Collector current as a function of switching frequency (Tj 175C, D = 0.5, VCE = 400V, VGE = 0/+15V, RG = 23) 1V 100V 1000V VCE, COLLECTOR-EMITTER VOLTAGE Figure 2. Safe operating area (D = 0, TC = 25C, Tj 175C;VGE=15V) 8A IC, COLLECTOR CURRENT 25W Ptot, POWER DISSIPATION 10V 20W 15W 10W 6A 4A 2A 5W 0W 25C 50C 75C 0A 25C 100C 125C 150C TC, CASE TEMPERATURE Figure 3. Power dissipation as a function of case temperature (Tj 175C) IFAG IPC TD VLS 4 75C 125C TC, CASE TEMPERATURE Figure 4. Collector current as a function of case temperature (VGE 15V, Tj 175C) Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series 15A 15A 12A V G E =20V IC, COLLECTOR CURRENT IC, COLLECTOR CURRENT V G E =20V 15V 13V 11V 9A 9V 7V 6A 3A 15V 13V 11V 9A 9V 7V 6A 3A 0A 0A 0V 1V 2V 3V 0V 15A 12A 9A 6A T J = 1 7 5 C 3A 2 5 C 0A 0V 2V 4V 6V 8V 10V VGE, GATE-EMITTER VOLTAGE Figure 7. Typical transfer characteristic (VCE=20V) IFAG IPC TD VLS 1V 2V 3V VCE, COLLECTOR-EMITTER VOLTAGE Figure 6. Typical output characteristic (Tj = 175C) VCE(sat), COLLECTOR-EMITT SATURATION VOLTAGE VCE, COLLECTOR-EMITTER VOLTAGE Figure 5. Typical output characteristic (Tj = 25C) IC, COLLECTOR CURRENT 12A 3,0V IC =12A 2,5V 2,0V IC =6A 1,5V I C =3A 1,0V 0,5V 0,0V -50C 0C 50C 100C TJ, JUNCTION TEMPERATURE Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature (VGE = 15V) 5 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series t d(off) td(off) 100ns 100ns t, SWITCHING TIMES t, SWITCHING TIMES tf t d(on) 10ns tf td(on) tr 10ns tr 1ns 0A 3A 6A 9A 12A 1ns 15A IC, COLLECTOR CURRENT Figure 9. Typical switching times as a function of collector current (inductive load, TJ=175C, VCE = 400V, VGE = 0/15V, RG = 23, Dynamic test circuit in Figure E) tf t d(on) 10ns tr 1ns 50C 100C 150C TJ, JUNCTION TEMPERATURE Figure 11. Typical switching times as a function of junction temperature (inductive load, VCE = 400V, VGE = 0/15V, IC = 6A, RG = 23, Dynamic test circuit in Figure E) IFAG IPC TD VLS RG, GATE RESISTOR Figure 10. Typical switching times as a function of gate resistor (inductive load, TJ=175C, VCE = 400V, VGE = 0/15V, IC = 6A, Dynamic test circuit in Figure E) VGE(th), GATE-EMITT TRSHOLD VOLTAGE t, SWITCHING TIMES 100ns td(off) 6V 5V m ax. 4V typ. 3V m in. 2V 1V 0V -50C 0C 50C 100C 150C TJ, JUNCTION TEMPERATURE Figure 12. Gate-emitter threshold voltage as a function of junction temperature (IC = 0.18mA) 6 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series *) E on and E ts include losses E ts* due to diode recovery E ts * 0,5 mJ 0,4 mJ 0,3 mJ E off 0,2 mJ E on* E, SWITCHING ENERGY LOSSES E, SWITCHING ENERGY LOSSES *) E on and E ts include losses due to diode recovery 0,6 mJ 0,4 mJ 0,3 mJ E on* 0,2 mJ E off 0,1 mJ 0,1 mJ 0,0 mJ 0A 2A 4A 6A 8A 0,0 mJ 10A IC, COLLECTOR CURRENT Figure 13. Typical switching energy losses as a function of collector current (inductive load, TJ=175C, VCE=400V, VGE=0/15V, RG=23, Dynamic test circuit in Figure E) RG, GATE RESISTOR Figure 14. Typical switching energy losses as a function of gate resistor (inductive load, TJ=175C, VCE = 400V, VGE = 0/15V, IC = 6A, Dynamic test circuit in Figure E) *) E on and E ts include losses *) E on and E ts include losses due to diode recovery 0,5m J E, SWITCHING ENERGY LOSSES 0,4mJ E, SWITCHING ENERGY LOSSES 0,3mJ E ts * 0,2mJ E off 0,1mJ due to diode recovery E ts * 0,4m J 0,3m J E off 0,2m J E on * 0,1m J E on* 0,0mJ 50C 100C 0,0m J 200V 150C TJ, JUNCTION TEMPERATURE Figure 15. Typical switching energy losses as a function of junction temperature (inductive load, VCE=400V, VGE = 0/15V, IC = 6A, RG = 23, Dynamic test circuit in Figure E) IFAG IPC TD VLS 300V 400V 500V VCE, COLLECTOR-EMITTER VOLTAGE Figure 16. Typical switching energy losses as a function of collector emitter voltage (inductive load, TJ = 175C, VGE = 0/15V, IC = 6A, RG = 23, Dynamic test circuit in Figure E) 7 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series VGE, GATE-EMITTER VOLTAGE 1nF C iss c, CAPACITANCE 15V 120V 10V 48 0V 100pF C oss 5V C rss 10pF 0V 0nC 10 nC 20n C 30nC 40nC 50nC 0V QGE, GATE CHARGE Figure 17. Typical gate charge (IC=6 A) 10V 20V VCE, COLLECTOR-EMITTER VOLTAGE Figure 18. Typical capacitance as a function of collector-emitter voltage (VGE=0V, f = 1 MHz) tSC, SHORT CIRCUIT WITHSTAND TIME IC(sc), short circuit COLLECTOR CURRENT 12s 80A 60A 40A 20A 0A 12V 14V 16V 8s 6s 4s 2s 0s 10V 18V VGE, GATE-EMITTETR VOLTAGE Figure 19. Typical short circuit collector current as a function of gateemitter voltage (VCE 400V, Tj 150C) IFAG IPC TD VLS 10s 11V 12V 13V 14V VGE, GATE-EMITETR VOLTAGE Figure 20. Short circuit withstand time as a function of gate-emitter voltage (VCE=600V, start at TJ=25C, TJmax<150C) 8 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series 0 10 K/W 0.2 R,(K/W) 0.381 2.57 0.645 1.454 0.062 0.186 0.1 0.05 0.02 0.01 -1 10 K/W ZthJC, TRANSIENT THERMAL RESISTANCE ZthJC, TRANSIENT THERMAL RESISTANCE D=0.5 D=0.5 , (s) 1.867*10-2 1.350 2.208*10-3 5.474*10-4 5.306*10-5 5.926*10-1 R1 C 1 = 1 /R 1 0 10 K/W 6.53*10 R2 C 2 = 2 /R 2 single pulse R,(K/W) 0.403 2.57 0.938 2.33 0.071 175 0.2 0.1 0.05 0.02 0.01 -1 R1 , (s) 1.773*10-2 1.346 1.956*10-3 4.878*10-4 4.016*10-5 5.684*10-1 6.53*10 R2 10 K/W C 1 = 1 /R 1 C 2 = 2 /R 2 single pulse -2 10 K/W 10s 100s 1ms 10ms 100m s 1s 10s tP, PULSE WIDTH Figure 21. IGBT transient thermal resistance (D = tp / T) 10s 100s 1m s 10m s 100ms 1s tP, PULSE WIDTH Figure 22. Diode transient thermal impedance as a function of pulse width (D=tP/T) 0,5C Qrr, REVERSE RECOVERY CHARGE trr, REVERSE RECOVERY TIME 250ns 200ns TJ=175C 150ns 100ns TJ=25C 50ns 0ns 200A/s 400A/s 600A/s 0,4C 0,3C 0,2C T J=25C 0,1C 0,0C 800A/s 200A/s diF/dt, DIODE CURRENT SLOPE Figure 23. Typical reverse recovery time as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E) IFAG IPC TD VLS T J=175C 9 400A/s 600A/s 800A/s diF/dt, DIODE CURRENT SLOPE Figure 24. Typical reverse recovery charge as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E) Rev. 2.4 12.06.2013 10s IKA06N60T (R) TrenchStop Series T J =175C T J =25C 6A 4A 2A dirr/dt, DIODE PEAK RATE OF FALL OF REVERSE RECOVERY CURRENT Irr, REVERSE RECOVERY CURRENT -500A/s 8A 0A 200A/s 400A /s 600A /s -400A/s -300A/s T J=175C -200A/s -100A/s 0A/s 200A/s 800A/s diF/dt, DIODE CURRENT SLOPE Figure 25. Typical reverse recovery current as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E) 400A/s 600A/s 800A/s diF/dt, DIODE CURRENT SLOPE Figure 26. Typical diode peak rate of fall of reverse recovery current as a function of diode current slope (VR = 400V, IF = 6A, Dynamic test circuit in Figure E) 10A 2,0V I F =12A VF, FORWARD VOLTAGE IF, FORWARD CURRENT T J=25C 8A 6A 4A T J =175C 2A 6A 1,5V 3A 1,0V 0,5V 25C 0,0V 0A 0,0V 0,5V 1,0V 1,5V 2,0V VF, FORWARD VOLTAGE Figure 27. Typical diode forward current as a function of forward voltage IFAG IPC TD VLS 10 0C 50C 100C 150C TJ, JUNCTION TEMPERATURE Figure 28. Typical diode forward voltage as a function of junction temperature Rev. 2.4 12.06.2013 (R) IKA06N60T TrenchStop Series PG-TO220-3-31/ -111 Please refer to mounting instructions IFAG IPC TD VLS 11 Rev. 2.4 12.06.2013 IKA06N60T (R) TrenchStop Series i,v tr r =tS +tF diF /dt Qr r =QS +QF tr r IF tS QS Ir r m tF QF 10% Ir r m dir r /dt 90% Ir r m t VR Figure C. Definition of diodes switching characteristics 1 2 r1 r2 n rn Tj (t) p(t) r1 r2 rn Figure A. Definition of switching times TC Figure D. Thermal equivalent circuit Figure E. Dynamic test circuit Leakage inductance L =60nH an d Stray capacity C =40pF. Figure B. Definition of switching losses IFAG IPC TD VLS 12 Rev. 2.4 12.06.2013 (R) IKA06N60T TrenchStop Series Published by Infineon Technologies AG 81726 Munich, Germany (c) 2013 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. IFAG IPC TD VLS 13 Rev. 2.4 12.06.2013