Capacitance (Note 3)
TAe25§C, f e1 MHz
Symbol Test Typ Max Units
COUT Output Capacitance 5 pF
CIN Input Capacitance 5 pF
Note 1: Stress above those listed under ‘‘Absolute Maximum Ratings’’ may cause permanent damage to the device. This is a stress rating only and operation of the
device at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Note 2: CS (Chip Select) must be brought low (to VIL) for an interval of tCS in order to reset all internal device registers (device reset) prior to beginning another
opcode cycle (this is shown in the opcode diagrams in the following pages).
Note 3: This parameter is periodically sampled and not 100% tested.
Note 4: Typical leakage values are in the 20 nA range.
Note 5: The shortest allowable SK clock period e1/fSK (as shown under the fSK parameter). Maximum SK clock speed (minimum SK period) is determined by the
interaction of several AC parameters stated in the datasheet. Within this SK period, both tSKH and tSKL limits must be observed. Therefore, it is not allowable to set
1/tSK etSKH (minimum) atSKL (minimum) for shorter SK cycle time operation.
AC Test Conditions
VCC Range VIL/VIH VIL/VIH VOL/VOH IOL/IOH
Input Levels Timing Levels Timing Levels
2.7V sVCC k4.5V 0.3V/1.8V 1.0V 0.8V/1.5V g10 mA
(Extended Voltage Levels)
4.5V sVCC s5.5V 0.4V/2.4V 1.0V/2.0V 0.4V/2.4V b2.1 mA/0.4 mA
(TTL Levels)
Output Load: 1 TTL Gate (CLe100 pF)
Functional Description
The NM93C06L/C46L/C56L/C66L device have 7 instruc-
tions as described below. Note that the MSB of any instruc-
tion is a ‘‘1’’ and is viewed as a start bit in the interface
sequence. For the C06 and C46 the next 8 bits carry the op
code and the 6-bit address for register selection. For the
C56 and C66 the next 10-bits carry the op code and the 8-
bit address for register selection.
Read (READ):
The READ instruction outputs serial data on the DO pin.
After a READ instruction is received, the instruction and ad-
dress are decoded, followed by data transfer from the se-
lected memory register into a 16-bit serial-out shift register.
A dummy bit (logical 0) precedes the 16-bit data output
string. Output data changes are initiated by a low to high
transition of the SK clock.
Erase/Write Enable (WEN):
When VCC is applied to the part, it powers up in the Erase/
Write Disable (WDS) state. Therefore, all programming
modes must be preceded by an Erase/Write Enable WEN
instruction. Once an Erase/Write Enable instruction is exe-
cuted, programming remains enabled until an Erase/Write
Disable (WDS) instruction is executed or VCC is completely
removed from the part.
Erase (ERASE):
The ERASE instruction will program all bits in the selected
register to the logical ‘‘1’’ state. CS is brought low following
the loading of the last address bit. This falling edge of the
CS pin initiates the self-timed programming cycle.
The DO pin indicates the READY/BUSY status of the chip if
CS is brought high after the tCS interval. DO elogical ‘‘0’’
indicates that programming is still in progress. DO elogical
‘‘1’’ indicates that the register, at the address specified in
the instruction, has been erased, and the part is ready for
another instruction.
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