Advance Product Information July 30, 2003 30 GHz 5-Bit Phase Shifter TGP2100-EPU Key Features and Performance * * * * * * Positive Control Voltage Single-Ended Logic CMOS Compatible Frequency Range: 28 - 32 GHz 0.25m pHEMT 3MI Technology Chip dimensions: 1.58 x 0.75 x 0.1 mm (0.062 x 0.030 x 0.004 inches) Preliminary Measured Performance 2 9 RMS Phase Shift Error 1.8 8 RMS Amplitude Error 1.6 7 1.4 6 1.2 5 1 4 0.8 3 0.6 2 0.4 1 0.2 0 0 28 29 30 Frequency (GHz) 20 31 32 28GHz 29GHz 30GHz 31GHz 32GHz 15 Phase Error (deg) RMS Amplitude Error (dB) RMS Phase Shft Err (deg) 10 10 5 0 -5 -10 -15 -20 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 State Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 1 Advance Product Information July 30, 2003 TGP2100-EPU TABLE I MAXIMUM RATINGS Symbol Parameter Value Notes VC Control Voltage Range 0 - +8 V 1/ 2/ ID Control Supply Current 1 mA 1/ 2/ PIN Input Continuous Wave Power 20 dBm 1/ 2/ PD Power Dissipation 0.1 W 1/ 2/ TCH TM TSTG Operating Channel Temperature Mounting Temperature (30 Seconds) Storage Temperature 0 150 C 3/ 0 320 C 0 -65 to 150 C 1/ These ratings represent the maximum operable values for this device 2/ Combinations of supply voltage, supply current, input power, and output power shall not exceed PD at a package base temperature of 70C 3/ Junction operating temperature will directly affect the device median time to failure (MTTF). For maximum life, it is recommended that junction temperatures be maintained at the lowest possible levels. Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 2 Advance Product Information July 30, 2003 TGP2100-EPU Preliminary Measured Data -3 -4 -5 -6 S21 (dB) -7 -8 -9 -10 -11 -12 -13 28 29 30 31 32 Frequency (GHz) 2 RMS Phase Shift Error 9 1.8 RMS Amplitude Error 8 1.6 7 1.4 6 1.2 5 1 4 0.8 3 0.6 2 0.4 1 0.2 0 0 28 29 30 31 RMS Amplitude Error (dB) RMS Phase Shift Error (deg) 10 32 Frequency (GHz) Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 3 Advance Product Information July 30, 2003 TGP2100-EPU S11 (dB) Preliminary Measured Data 0 -2 -4 -6 -8 -10 -12 -14 -16 -18 -20 -22 -24 -26 -28 -30 28 29 30 31 32 31 32 S22 (dB) Frequency (GHz) 0 -2 -4 -6 -8 -10 -12 -14 -16 -18 -20 -22 -24 -26 -28 -30 28 29 30 Frequency (GHz) Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 4 Advance Product Information July 30, 2003 TGP2100-EPU Preliminary Measured Data 20 28GHz 29GHz 30GHz 31GHz 32GHz Phase Error (deg) 15 10 5 0 -5 -10 -15 -20 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 State 5 28GHz 29GHz 30GHz 31GHz 32GHz Amplitude Error (dB) 4 3 2 1 0 -1 -2 -3 -4 -5 1 3 5 7 9 11 13 15 17 19 21 23 25 27 29 31 State Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 5 Advance Product Information July 30, 2003 TGP2100-EPU State Table State 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 V-Supply +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V V-11.25 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V 0V +5V V-22.5 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V 0V 0V +5V +5V V-45 0V 0V 0V 0V +5V +5V +5V +5V 0V 0V 0V 0V +5V +5V +5V +5V 0V 0V 0V 0V +5V +5V +5V +5V 0V 0V 0V 0V +5V +5V +5V +5V V-90 0V 0V 0V 0V 0V 0V 0V 0V +5V +5V +5V +5V +5V +5V +5V +5V 0V 0V 0V 0V 0V 0V 0V 0V +5V +5V +5V +5V +5V +5V +5V +5V V-180 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V 0V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V +5V Phase Shift Reference 11.25 22.5 33.75 45 56.25 67.5 78.75 90 101.25 112.5 123.75 135 146.25 157.5 168.75 180 191.25 202.5 213.75 225 236.25 247.5 258.75 270 281.25 292.5 303.75 315 326.25 337.5 348.75 Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 6 Advance Product Information July 30, 2003 TGP2100-EPU 1.47 [0.058] .43 [0.017] .12 [0.005] Mechanical Drawing .75 [0.030] 2 .63 [0.025] .38 [0.015] .63 [0.025] 1 8 7 6 5 .42 [0.016] .67 [0.026] .81 [0.032] .95 [0.037] .12 [0.005] 3 .13 [0.005] 4 1.58 [0.062] 1.48 [0.058] 1.23 [0.048] .11 [0.004] .00 [0.000] .00 [0.000] Units: millimeters [inches] Thickness: 0.10 [0.004] (reference only) Chip edge to bond pad dimensions are shown to center of bond pads. Chip size tolerance: 0.05 [0.002] RF ground through backside Bond Pad #1 Bond Pad #2 Bond Pad #3 Bond Pad #4 Bond Pad #5 Bond Pad #6 Bond Pad #7 Bond Pad #8 RF Input V-Supply (+5V) RF Output V-11.25 (ON V=+5V) V-22.5 (ON V=+5V) V-45 (ON V=+5V) V-90 (ON V=+5V) V-180 (ON V=+5V) 0.10 x 0.20 0.10 x 0.10 0.10 x 0.20 0.10 x 0.10 0.10 x 0.10 0.10 x 0.10 0.10 x 0.10 0.10 x 0.10 [0.004 x 0.008] [0.004 x 0.004] [0.004 x 0.008] [0.004 x 0.004] [0.004 x 0.004] [0.004 x 0.004] [0.004 x 0.004] [0.004 x 0.004] Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 7 Advance Product Information July 30, 2003 TGP2100-EPU Chip Assembly & Bonding Diagram V-Supply RF Input RF Output V-180 V-45 V-11.25 V-90 V-22.5 Devices were tested with 500W resistors in series with control lines GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should be observed during handling, assembly and test. Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 8 Advance Product Information July 30, 2003 TGP2100-EPU Assembly Process Notes Reflow process assembly notes: * * * * * Use AuSn (80/20) solder with limited exposure to temperatures at or above 300C. (30 seconds maximum) An alloy station or conveyor furnace with reducing atmosphere should be used. No fluxes should be utilized. Coefficient of thermal expansion matching is critical for long-term reliability. Devices must be stored in a dry nitrogen atmosphere. Component placement and adhesive attachment assembly notes: * * * * * * * Vacuum pencils and/or vacuum collets are the preferred method of pick up. Air bridges must be avoided during placement. The force impact is critical during auto placement. Organic attachment can be used in low-power applications. Curing should be done in a convection oven; proper exhaust is a safety concern. Microwave or radiant curing should not be used because of differential heating. Coefficient of thermal expansion matching is critical. Interconnect process assembly notes: * * * * Thermosonic ball bonding is the preferred interconnect technique. Force, time, and ultrasonics are critical parameters. Aluminum wire should not be used. Maximum stage temperature is 200C. GaAs MMIC devices are susceptible to damage from Electrostatic Discharge. Proper precautions should be observed during handling, assembly and test. Note: Devices designated as EPU are typically early in their characterization process prior to finalizing all electrical and process specifications. Specifications are subject to change without notice. TriQuint Semiconductor Texas Phone : (972)994-8465 Fax: (972)994-8504 Web: www.triquint.com 9