QS74LCX16244 High Speed CMOS 3.3V 16-Bit Buffer/Line Driver Q QUALITY SEMICONDUCTOR, INC. QS74LCX16244 FEATURES/BENEFITS DESCRIPTION * * * * * * * * The QS74LCX16244 is a 16-bit bus interface buffer with three-state outputs that is ideal for driving address and data buses. Output enables are used to enable or disable Y ports by placing them in a high impedance condition. This device can be used as four 4-bit buffers, two 8-bit buffers, or a single 16-bit buffer. The 3.3V LCX family features low power, low switching noise, and fast switching speeds for low power portable applications as well as high-end, advanced workstation applications. 5V tolerant inputs and outputs allow this LCX product to be used in mixed 5V and 3.3V applications. Easy board layout is facilitated by the use of flow-through pinouts and byte enable controls provide architectural flexibility for systems designers. To accommodate hotplug or live insertion applications, this product is designed not to load an active bus when VCC is removed. * * * * * 5V tolerant inputs and outputs 10A ICCQ quiescent power supply current Hot insertable 2.0V-3.6V VCC supply operation 24mA balanced output drive C speed performance: tPD = 4.1ns Input hysteresis for noise immunity Meets or exceeds JEDEC Standard 36 specifications Multiple power and ground pins for low noise Operating temperature range: -40C to +85C Latch-up performance exceeds 500mA ESD performance: Human body model > 2000V Machine model > 200V Packages available: 48-pin TSSOP 48-pin SSOP y n pa m o C n a w Figure 1. Functional Block Diagram No 1OE 2OE 3OE 4OE 1A1 1Y1 2A1 2Y1 3A1 3Y1 4A1 4Y1 1A2 1Y2 2A2 2Y2 3A2 3Y2 4A2 4Y2 1A3 1Y3 2A3 2Y3 3A3 3Y3 4A3 4Y3 1A4 1Y4 2A4 2Y4 3A4 3Y4 4A4 4Y4 MDSL-00127-04 NOVEMBER 21, 1997 QUALITY SEMICONDUCTOR, INC. 1 QS74LCX16244 Figure 2. Pin Configuration (All Pins Top View) Table 1. Pin Description Name SSOP, TSSOP 1OE 1Y1 1Y2 GND 1Y3 1Y4 VCC 2Y1 2Y2 GND 2Y3 2Y4 3Y1 3Y2 GND 3Y3 3Y4 VCC 4Y1 4Y2 GND 4Y3 4Y4 4OE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 2OE 1A1 1A2 GND 1A3 1A4 VCC 2A1 2A2 GND 2A3 2A4 3A1 3A2 GND 3A3 3A4 VCC 4A1 4A2 GND 4A3 4A4 3OE Description xOE 3-State Output Enable Inputs xAx Data Inputs xYx 3-State Outputs Table 2. Function Table Inputs Outputs xOE OE xAx xYx L L L L H H H X Hi-Z y n pa m o C Table 3. Capacitance Symbol an Pins Typ Unit Conditions CIN Input Capacitance 7.0 pF VIN = 0V, VOUT = 0V, f = 1MHz CI/O I/O Capacitance 8.0 pF VIN = 0V, VOUT = 0V, f = 1MHz CPD Power Dissipation Capacitance 20 pF VCC = 3.3V, VIN = 0 or VCC f = 10MHz w o N Note: Capacitance is characterized but not production tested. Table 4. Absolute Maximum Ratings Supply Voltage to Ground ............................................... -0.5V to +7.0V DC Output Voltage VOUT Outputs HIGH-Z ............................................................ -0.5V to +7.0V Outputs Active ...................................................... -0.5V to VCC + 0.5V DC Input Voltage VIN ......................................................... -0.5V to 7.0V DC Input Diode Current with VIN < 0 ........................................... -50mA DC Output Diode Current VO < 0 ...................................................................................... -50mA VO > VCC .................................................................................. +50mA DC Output Source/Sink Current (IOH/IOL) .................................... 50mA DC Supply Current per Supply Pin ........................................... 100mA DC Ground Current per Ground Pin ......................................... 100mA TSTG Storage Temperature ........................................... -65C to +150C 2 QUALITY SEMICONDUCTOR, INC. Note: Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to this device resulting in functional or reliability type failures. MDSL-00127-04 NOVEMBER 21, 1997 QS74LCX16244 Table 5. Recommended Operating Conditions Symbol Parameter Min Max Unit VCC Supply Voltage, Operating 2.0 3.6 V VIN Input Voltage 0 5.5 V VOUT Output Voltage in Active State 0 VCC V VOUT Output Voltage in "OFF" State 0 5.5 V -- 24 12 mA -- 10 ns/V -40 +85 C IOH/IOL Output Current t/v Input Transition Slew Rate TA VCC = 3.0 - 3.6V VCC = 2.7V Operating Free Air Tempeature Table 6. DC Electrical Characteristics Over Operating Range Industrial Temperature Range, TA = -40C to +85C Symbol Parameter Test Conditions(1) Min VIH Input HIGH Voltage Logic HIGH for All Inputs 2.0 -- VIL Input LOW Voltage Logic LOW for All Inputs -- -- VOH Output HIGH Voltage VCC = 2.7V, IOH = -100A VCC = 2.7V, IOH = -12mA VCC = 3.0V, IOH = -18mA VCC = 3.0V, IOH = -24mA VCC -0.2 2.2 2.4 2.2 VOL Output LOW Voltage VCC = 2.7V, IOL = 100A VCC = 2.7V, IOL = 12mA VCC = 3.0V, IOL = 16mA VCC = 3.0V, IOL = 24mA Input Hysteresis(3) Max Unit -- V 0.8 V -- -- -- -- -- -- -- -- V -- -- -- -- -- -- -- -- 0.2 0.4 0.4 0.5 V VTLH - VTHL for All Inputs -- 150 -- mV Input Leakage Current VI = 0V, VI = 5.5V, VCC = 3.6V -- -- 1.0 A IOZ High-Z I/O Leakage VO = 0V, VO = 5.5V VI =VIH or VIL, VCC = 3.6V -- -- 1.0 A IOS Short Circuit Current(3,4) VCC = 3.6V, VO = GND -60 -- -240 mA IOFF Power Off Leakage VCC = 0V, VI or VO = 5.5V -- -- 10 A VIK Input Clamp Voltage VCC = 2.7V, IIN = -18mA -- -0.7 -1.2 V II n a w No VT I y n a Typ(2) mp Co Notes: 1. For conditions shown as Max or Min use appropriate value specified under Recommended Operating Conditions for the applicable device type. 2. Typical values are at VCC = 3.3V, and TA = 25C. 3. These parameters are guaranteed by characterization, but not production tested. 4. Not more than one output should be tested at one time. Duration of test should not exceed one second. MDSL-00127-04 NOVEMBER 21, 1997 QUALITY SEMICONDUCTOR, INC. 3 QS74LCX16244 Table 7. Power Supply Characteristics Symbol Parameter Test Conditions(1) Quiescent Power Supply Current ICC ICCD ICC IC Typ (2) Max Unit VCC = 3.6V, Freq = 0 VIN = GND or VCC 0.1 10 A Supply Current per Input @ TTL HIGH VCC = 3.6V, VIN = VCC-0.6V(3) 2.0 30 A Supply Current per Input per MHz(4) VCC = 3.6V, Outputs Open One Bit Toggling @ 50% Duty Cycle xOE = GND 50 75 A/ MHz Total Power Supply Current(6) VCC = 3.6V, Outputs Open One Bit Toggling @ 50% Duty Cycle xOE = GND, fI = 10MHz VCC = 3.6V, Outputs Open Sixteen Bits Toggling @ 50% Duty Cycle xOE = GND, fI = 2.5MHz VIN = VCC-0.6V 0.5(5) VIN = GND 0.8(5) mA VIN = VCC-0.6V 2.0(5) VIN = GND 3.3(5) y n pa m o C Notes: 1. For conditions shown as Min. or Max., use the appropriate values specified under Recommended Operating Conditions for applicable device type. 2. Typical values are at VCC = 3.3V, +25C ambient. 3. Per TTL driven input. All Other Inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed by design but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC. IC = ICCQ + ICC DHNT + ICCD f NO. ICCQ = Quiescent Current (ICCL, ICCH, and ICCZ). ICC = Power Supply Current for a TTL-High Input (VIN = VCC-0.6V). DH = Duty Cycle for TTL High Inputs. NT = Number of TTL High Inputs. ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL). f = Average Switching Frequency per Output. NO = Number of Outputs Switching n a w No Table 8. Dynamic Switching Characteristics(1) Symbol Parameter Conditions VCC TA = 25C Units (V) Typical VOLP Quiet Output Dynamic Peak VOL CL = 50pF, VIH = 3.3V, VIL = 0V 3.3 0.8 V VOLV Quiet Output Dynamic Valley VOL CL = 50pF, VIH = 3.3V, VIL = 0V 3.3 0.8 V Note: 1. Characterized but not production tested. 4 QUALITY SEMICONDUCTOR, INC. MDSL-00127-04 NOVEMBER 21, 1997 QS74LCX16244 Table 9. Switching Characteristics Over Operating Range Industrial Temperature Range, TA = -40C to +85C. CLOAD = 50 pF, RLOAD = 500 unless otherwise noted. 16244 VCC = 3.3 0.3V VCC = 2.7V(2) Symbol 16244C VCC = 3.3 0.3V Description(1) Min Max Min Max Min Max Unit tPHL tPLH Propagation Delay xAx to xYx 1.5 4.5 1.5 5.2 1.5 4.1 ns tPZH tPZL Output Enable Time xOE to xYx 1.5 5.5 1.5 6.3 1.5 5.5 ns tPHZ tPLZ Output Disable Time(2) xOE to xYx 1.5 5.4 1.5 5.7 1.5 5.2 ns tSK(O) Output Skew(3) -- 0.5 -- -- -- 0.5 ns Notes: 1. Minimums guaranteed but not tested. See Test Circuit and Waveforms. 2. Guaranteed by characterization. 3. Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by characterization but not production tested. y n pa m o C n a w No MDSL-00127-04 NOVEMBER 21, 1997 QUALITY SEMICONDUCTOR, INC. 5 QS74LCX16244 TEST CIRCUIT AND WAVEFORMS SWITCH POSITION Figure 3. Test Circuit 500 VCC 6.0V VIN VOUT DUT Pulse Generator RT 50pF CL 500 3V Data Input 1.5V 3V Timing Input 1.5V 0V tREM 1.5V Synchronous Control Preset, Clear Clock Enable, Etc. 1.5V Open 1.5V tw y n pa High-Low-High Pulse 1.5V m o C 0V 3V 0V tH n a w No Figure 5. Enable and Disable Timing 3V 1.5V 0V Control Input Figure 7. Propagation Delay 3V Same Phase Input Transition 1.5V tPLH tPZL Output Normally High GND Low-High-Low Pulse 3V Asynchronous Control Preset, Clear, Etc. Output Normally Low 6V Figure 6. Pulse Width 0V tH tSU Switch DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse generator. Figure 4. Setup, Hold, and Release Timing tSU Test Open Drain Disable LOW Enable LOW Disable HIGH Enable HIGH All Other Inputs tPHL 0V VOH 3.0V Switch Closed tPHZ 1.5V 3.0V tPZL 0.3V VOL tPLH VOL Opposite Phase Input Transition tPHZ Switch Open 1.5V Output 0.3V VOH tPHL 3V 1.5V 0V 1.5V 0V 0V Notes: 1. Input Control Enable = LOW and input Control Disable = HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; ZOUT 50; tF, tR 2.5ns. 6 QUALITY SEMICONDUCTOR, INC. MDSL-00127-04 NOVEMBER 21, 1997