2651A-US - KEITHLEY - Datasheet.Directory

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The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize

and test high power electronics. This SMU instrument can help you improve productivity in applica-

tions across the R&D, reliability, and production spectrums, including high brightness LEDs, power

semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, compo-

nents, modules, and subassemblies.

The Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with

precision voltage and current meters. It can be used as a:

•Semiconductor characterization instrument

•V or I waveform generator

•V or I pulse generator

•Precision power supply

•True current source

•Digital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)

•Precision electronic load

+20A

+50A

–50A

–10A

+10A

+5A

–5A

–20A

+10V

–10V +20V–20V 0V

+40V–40V

DC and

Pulse

only

The Model 2651A can source or sink up to ±40V and ±50A.

Two Measurement Modes: Digitizing or Integrating

Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects,

with the two measurement modes in the Model 2651A. Each mode is defined by its independent

analog-to-digital (A/D) converters.

The Digitizing Measurement mode enables 1µs per point measurements. Its 18-bit A/D converters

allow you to precisely measure transient characteristics. For more accurate measurements, use its

Integrating Measurement mode, which is based on 22-bit A/D converters.

2651A

50A, High Power System

SourceMeter® SMU Instrument

•Source or sink:

– 2,000W of pulsed power

(±40V, ±50A)

– 200W of DC power

(±10V@±20A, ±20V@±10A,

±40V@±5A)

•Easily connect two units (in

series or parallel) to create

solutions up to ±100A or ±80V

•1pA resolution enables precise

measurement of very low

leakage currents

•1µs per point (1MHz),

18-bit sampling, accurately

characterizes transient behavior

•1% to 100% pulse duty cycle for

pulse width modulated (PWM)

drive schemes and device-

specific drive stimulus

•Combines a precision power

supply, current source, DMM,

arbitrary waveform generator,

V or I pulse generator with

measurement, electronic load,

and trigger controller—all in one

instrument

•Includes TSP® Express I-V

characterization software,

LabVIEW® driver, and Keithley’s

Test Script Builder software

development environment

APPLICATIONS

•Power semiconductor,

HBLED, and optical device

characterization and testing

• Solar cell characterization

and testing

• Characterization of GaN, SiC, and

other compound materials and

devices

•Semiconductor junction

temperature characterization

• High speed, high precision

digitization

•Electromigration studies

• High current, high power

device testing

High power System SourceMeter SMU instrument

SMU INSTRUMENTS

www.keithley.com

1.888.KEITHLEY (U.S. only)

A Greater Measure of Conﬁdence

2651A

50A, High Power System

SourceMeter® SMU Instrument

Two A/D converters are used with each

measurement mode (one for current and the

other for voltage), which run simultaneously for

accurate source readback that does not sacrifice

test throughput.

00 25 50 75 100 125 150 175 200

Voltage (V)

Current (A)

Time (µs)

Volts Current

The dual digitizing A/D converters sample at

up to 1µs/point, enabling full simultaneous

characterization of both current and

voltage waveforms.

High Speed Pulsing

The Model 2651A minimizes the unwanted

effects of self heating during tests by accurately

sourcing and measuring pulses as short as

100µs. Additional control flexibility enables you

to program the pulse width from 100µs to DC

and the duty cycle from 1% to 100%. A single

unit can pulse up to 50A; combine two units

to pulse up to 100A.

Expansion Capabilities

Through TSP-Link Technology technology, mul-

tiple Model 2651As and selected Series 2600B

SMU instruments can be combined to form a

larger integrated system with up to 64 channels.

Precision timing and tight channel synchroniza-

tion are guaranteed with built-in 500ns trigger

controllers. True SMU instrument-per-pin testing

is assured with the fully isolated, independent

channels of the SourceMeter SMU instruments.

26xxB

2651A

Up to

100A

TSP-Link

LXI or GPIB

to PC

Controller

Keithley’s TSP and TSP-Link Technologies

enable true SMU-per-pin testing without

the power and/or channel limitations of a

mainframe-based system.

Also, when two Model 2651As are connected in

parallel with TSP-Link Technology, the current

range is expanded from 50A to 100A. When two

units are connected in series, the voltage range

is expanded from 40V to 80V. Built-in intel-

ligence simplifies testing by enabling the units

to be addressed as a single instrument, thus

creating an industry-best dynamic range (100A

to 1pA). This capability enables you to test a

much wider range of power semiconductors and

other devices.

0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0

Vgs = 2.01

Vgs = 2.25

Vgs = 2.50

Vgs = 2.75

Vgs = 3.00

Vgs = 3.25

Vgs = 3.51

Vds (V)

Id (A)

Precision measurements to 50A (100A with

two units) enable a more complete and

accurate characterization.

Standard Capabilities of Series

2600B SMU Instruments

Each Model 2651A includes all the features and

capabilities provided in most Series 2600B SMU

instruments, such as:

•Ability to be used as either a bench-top

I-V characterization tool or as a building

block component of multiple-channel I-V

test systems

•TSP Express software to quickly and

easily perform common I-V tests without

programming or installing software

•ACS Basic Edition software for semiconductor

component characterization (optional).

ACS Basic now features a Trace mode for

generating a suite of characteristic curves.

•Keithley’s Test Script Processor (TSP®)

Technology, which enables creation of

custom user test scripts to further automate

testing, and also supports the creation of

programming sequences that allow the

instrument to operate asynchronously

without direct PC control.

•Parallel test execution and precision

timing when multiple SMU instruments are

connected together in a system

•LXI compliance

•14 digital I/O lines for direct interaction with

probe stations, component handlers, or other

automation tools

•USB port for extra data and test program

storage via USB memory device

Ordering Information

2651A High Power System

SourceMeter® SMU

Instrument

Accessories Supplied

2651A-KIT-1A: Low Impedance

Cable Assembly (1m)

CS-1592-2: High Current

Phoenix Connector (male)

CS-1626-2: High Current

Phoenix Connector (female)

CA-557-1: Sense Line

Cable Assembly (1m)

7709-308A: Digital I/O Connector

CA-180-3A: TSP-Link/Ethernet Cable

Documentation CD

Software Tools and Drivers CD

0.020

0.018

0.016

0.014

0.012

0.010

0.008

0.006

0.004

0.002

0.0002.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 6.5

Vgs (V)

Rds (ohms)

Id = 10A

Id = 20A

Id = 30A

Id = 40A

Id = 50A

1µV measurement resolution and current

sourcing up to 50A (100A with two units)

enable low-level Rds measurements to

support next-generation devices.

ACCESSORIES AVAILABLE

2600-KIT Screw Terminal Connector Kit

ACS-BASIC Component Charaterization Software

4299-6 Rack Mount Kit

8011 Test Socket Kit

High power System SourceMeter SMU instrument

SMU INSTRUMENTS

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2651A 50A, High Power System

SourceMeter® SMU Instrument

Specification Conditions

This document contains specifications and supplemental information for the Model 2651A High

Power System SourceMeter SMU instrument. Specifications are the standards against which the

Model 2651A is tested. Upon leaving the factory, the Model 2651A meets these specifications.

Supplemental and typical values are non-warranted, apply at 23°C, and are provided solely as

useful information.

Accuracy specifications are applicable for both normal and high-capacitance modes.

Source and measurement accuracies are specified at the Model 2651A terminals under

these conditions:

• 23° ±5°C, <70 percent relative humidity

• After two-hour warm-up

• Speed normal (1 NPLC)

• A/D autozero enabled

• Remote sense operation or properly zeroed local operation

• Calibration period: One year

VOLTAGE ACCURACY SPECIFICATIONS 1, 2

SOURCE MEASURE

Range

Programming

Resolution

Accuracy

±(% reading + volts)

Noise (Vpp) (typical)

0.1 Hz to 10 Hz

Default

Display

Resolution

Integrating ADC Accuracy 3

±(% reading + volts)

High-Speed ADC Accuracy 4

±(% reading + volts)

100.000 mV 5 µV 0.02% + 500 µV 100 µV 1 µV 0.02% + 300 µV 0.05% + 600 µV

1.00000 V 50 µV 0.02% + 500 µV 50 0 µV 10 µV 0.02% + 300 µV 0.05% + 600 µV

10.0000 V 500 µV 0.02% + 5 mV 1 mV 100 µV 0.02% + 3 mV 0.05% + 8 mV

20.0000 V 500 µV 0.02% + 5 mV 1 mV 100 µV 0.02% + 5 mV 0.05% + 8 mV

40.0000 V 500 µV 0.02% + 12 mV 2 mV 100 µV 0.02% + 12 mV 0.05% + 15 mV

CURRENT ACCURACY SPECIFICATIONS 5

SOURCE MEASURE

Range

Programming

Resolution

Accuracy

±(% reading + amps)

Noise (Ipp) (typical)

0.1Hz to 10Hz

Default

Display

Resolution

Integrating ADC Accuracy 3

±(% reading + amps)

High-Speed ADC Accuracy 4

±(% reading + amps)

100.000 nA 2 pA 0.1 % + 500 pA 50 pA 1 pA 0.08% + 500 pA 0.08% + 800 pA

1.00000 µA 20 pA 0.1 % + 2 nA 250 pA 10 pA 0.08% + 2 nA 0.08% + 4 nA

10.0000 µA 200 pA 0.1 % + 10 nA 500 pA 100 pA 0.08% + 8 nA 0.08% + 10 nA

100.000 µA 2 nA 0.03% + 60 nA 5 nA 1 nA 0.02% + 25 nA 0.05% + 60 nA

1.00000 mA 20 nA 0.03% + 300 nA 10 nA 10 nA 0.02% + 200 nA 0.05% + 500 nA

10.0000 mA 200 nA 0.03% + 8 µA 500 nA 100 nA 0.02% + 2.5 µA 0.05% + 10 µA

100.000 mA 2 µA 0.03% + 30 µA 1 µA 1 µA 0.02% + 20 µA 0.05% + 50 µA

1.00000 A 200 µA 0.08% + 3.5 mA 300 µA 10 µA 0.05% + 3 mA 0.05% + 5 mA

5.00000 A 200 µA 0.08% + 3.5 mA 300 µA 10 µA 0.05% + 3 mA 0.05% + 5 mA

10.0000 A 500 µA 0.15% + 6 mA 500 µA 100 µA 0.12% + 6 mA 0.12% + 12 mA

20.0000 A 500 µA 0.15% + 8 mA 500 µA 100 µA 0.08% + 8 mA 0.08% + 15 mA

50.0000 A 62 mA 0.15% + 80 mA N/A 100 µA 0.05% + 50 mA 7 0.05% + 90 mA 8

NOTES

1. Add 50µV to source accuracy specifications per volt of HI lead drop.

2. For temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0.15 × accuracy specification)/°C.

High-capacitance mode accuracy is applicable at 23° ±5°C only.

3. Derate accuracy specification for NPLC setting <1 by increasing error term.

Add appropriate typical percent of range term for resistive loads using the table below.

NPLC Setting 100mV Range 1V to 40V Ranges 100nA Range 1µA to 100mA Ranges 1A to 20A Ranges

0.1 0.01% 0.01% 0.01% 0.01% 0.01%

0.01 0.08% 0.07% 0.1 % 0.05% 0.1 %

0.001 0.8 % 0.6 % 1 % 0.5 % 1.8 %

4. 18-bit ADC. Average of 1000 samples taken at 1µs intervals.

5. At temperatures 0° to 18°C and 28° to 50°C; 100nA to 10µA accuracy is degraded by ±(0.35 × accuracy specification)/°C.

100µA to 50A accuracy is degraded by ±(0.15 × accuracy specification)/°C.

High-capacitance mode accuracy is applicable at 23° ±5°C only.

6. 50A range accessible only in pulse mode.

7. 50A range accuracy measurements are taken at 0.008 NPLC.

8. Average of 100 samples taken at 1µs intervals.

Model 2651A specifications

SMU INSTRUMENTS

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2651A 50A, High Power System

SourceMeter® SMU Instrument

DC POWER SPECIFICATIONS

MAXIMUM OUTPUT POWER: 202W maximum.

SOURCE/SINK LIMITS 1:

Voltage: ±10.1V at ±20.0A, ±20.2V at ±10.0A, ±40.4V at ±5.0A 2.

Four-quadrant source or sink operation.

Current: ±5.05A at ±40V 2, ±10.1A at ±20V, ±20.2A at ±10V

Four-quadrant source or sink operation.

CAUTION: Carefully consider and configure the appropriate output-off state and source and

compliance levels before connecting the Model 2651A to a device that can deliver energy. Failure to

consider the output-off state and source and compliance levels may result in damage to the instru-

ment or to the device under test.

PULSE SPECIFICATIONS

MINIMUM PROGRAMMABLE PULSE WIDTH 3: 100µs. Note: Minimum pulse width for settled

source at a given I/V output and load can be longer than 100µs.

PULSE WIDTH PROGRAMMING RESOLUTION: 1µs.

PULSE WIDTH PROGRAMMING ACCURACY 3: ±5µs.

PULSE WIDTH JITTER: 2µs (typical).

PULSE RISE TIME (TYPICAL):

Current Range Rload Rise Time (typical)

50 A 0.05 W 26 µs

50 A 0.2 W 57 µs

50 A 0.4 W 85 µs

20 A 0.5 W 95 µs

50 A 0.8 W 130 µs

20 A 1 W 180 µs

10 A 2 W 330 µs

5 A 8.2 W 400 µs

+20A

+30A

+50A

–50A

–10A

+10A

+5A

–5A

–20A

–30A

+10V

–10V +20V–20V 0V

+40V–40V

Pulse

Region

Maximums

Maximum

Pulse Width 3

Maximum

Duty Cycle 4

1 5 A at 40 V DC, no limit 100%

110 A at 20 V DC, no limit 100%

120 A at 10 V DC, no limit 100%

230 A at 10 V 1 ms 50%

320 A at 20 V 1.5 ms 40%

410 A at 40 V 1.5 ms 40%

550 A at 10 V 1 ms 35%

650 A at 20 V 330 µs 10%

750 A at 40 V 300 µs 1%

NOTES

1. Full power source operation regardless of load to 30°C ambient. Above 30°C or power sink operation, refer to

“Operating Boundaries” in the Model 2651A Reference manual for additional power derating information.

2. Quadrants 2 and 4 power envelope is trimmed at 36V and 4.5A.

3. Times measured from the start of pulse to the start off-time; see figure below.

Pulse Level

Bias Level

Start ton Start toff

90%

10%

ton toff

10%

4. Thermally limited in sink mode (quadrants 2 and 4) and ambient temperatures above 30°C. See power equa-

tions in the Model 2651A Reference Manual for more information.

Model 2651A specifications

The Model 2651A supports GPIB, LXI, Digital I/O, and Keithley’s TSP-Link Technology for multi-channel synchronization.

SMU INSTRUMENTS

A Greater Measure of Conﬁdence

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2651A 50A, High Power System

SourceMeter® SMU Instrument

ADDITIONAL SOURCE SPECIFICATIONS

NOISE (10Hz to 20MHz): <100mV peak-peak (typical), <30mV RMS (typical), 10V range with a

20A limit.

OVERSHOOT:

Voltage: <±(0.1% + 10mV) (typical). Step size = 10% to 90% of range, resistive load, maximum

current limit/compliance.

Current: <±(0.1% + 10mV) (typical). Step Size = 10% to 90% of range, resistive load. See

Current Source Output Settling Time specifications for additional test conditions.

RANGE CHANGE OVERSHOOT:

Voltage: <300mV + 0.1% of larger range (for <20V ranges) (typical).

<400mV + 0.1% of larger range (for ≥20V ranges) (typical).

Overshoot into a 100kW load, 20MHz bandwidth.

Current: <5% of larger range + 360mV/Rload (for >10µA ranges) (typical). Iout × Rload = 1V.

VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value

after source level command is processed on a fixed range. 1

Range Settling Time (typical)

1 V < 70 µs

10 V <160 µs

20 V <190 µs

40 V <175 µs

CURRENT SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1% of final value

after source level command is processed on a fixed range. Values below for Iout × Rload.

Current Range Rload Settling time (typical)

20 A 0.5 W<195 µs

10 A 1.5 W<540 µs

5 A 5 W<560 µs

1 A 1 W< 80 µs

100 mA 10 W< 80 µs

10 mA 100 W<210 µs

1 mA 1 kW <300 µs

100 µA 10 kW <500 µs

10 µA 100 kW < 15 ms

1 µA 1 MW < 35 ms

100 nA 10 MW<110 ms

TRANSIENT RESPONSE TIME:

10V and 20V Ranges: <70µs for the output to recover to within 0.1% for a 10% to 90% step

change in load.

40V Range: <110µs for the output to recover to within 0.1% for a 10% to 90% step change in load.

GUARD OFFSET VOLTAGE: <4mV, current <10mA.

REMOTE SENSE OPERATING RANGE 2:

Maximum Voltage between HI and SENSE HI: 3V.

Maximum Voltage between LO and SENSE LO: 3V.

MAXIMUM IMPEDANCE PER SOURCE LEAD:

Maximum impedance limited by 3V drop by remote sense operating range.

Maximum resistance = 3V/source current value (amperes) (maximum of 1W per source lead).

3V = L di/dt.

VOLTAGE OUTPUT HEADROOM:

5A Range: Maximum output voltage = 48.5V – (Total voltage drop across source leads).

10A Range: Maximum output voltage = 24.5V – (Total voltage drop across source leads).

20A Range: Maximum output voltage = 15.9V – (Total voltage drop across source leads).

OVERTEMPERATURE PROTECTION: Internally sensed temperature overload puts unit in

standby mode.

LIMIT/COMPLIANCE: Bipolar limit (compliance) set with single value.

Voltage 3: Minimum value is 10mV; accuracy is the same as voltage source.

Current 4: Minimum value is 10nA; accuracy is the same as current source.

NOTES

1. With measure and compliance set to the maximum current for the specified voltage range.

2. Add 50µV to source accuracy specifications per volt of HI lead drop.

3. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding voltage source

accuracy specifications. For 100mV range add an additional 60mV of uncertainty. Specifications apply with sink

mode enabled.

4. For sink mode operation (quadrants II and IV), add 0.6% of limit range to the corresponding current limit

accuracy specifications. Specifications apply with sink mode enabled.

Model 2651A specifications

ADDITIONAL MEASUREMENT SPECIFICATIONS

CONTACT CHECK 1

Speed

Maximum Measurement

Time to Memory

for 60Hz (50Hz)

Accuracy (1 Year)

23° ±5°C

±(% reading + ohms)

Fast 1.1 ms (1.2 ms) 5% + 15 W

Medium 4.1 ms (5 ms) 5% + 5 W

Slow 36 ms (42 ms) 5% + 3 W

NOTES

1. Includes measurement of SENSE HI to HI and SENSE LO to LO contact resistances.

ADDITIONAL METER SPECIFICATIONS

MAXIMUM LOAD IMPEDANCE:

Normal Mode: 10nF (typical), 3µH (typical).

High-Capacitance Mode: 50µF (typical), 3µH (typical).

COMMON MODE VOLTAGE: 250V DC.

COMMON MODE ISOLATION: >1GW, <4500pF.

MEASURE INPUT IMPEDANCE: >10GW.

SENSE HIGH INPUT IMPEDANCE: >10GW.

MAXIMUM SENSE LEAD RESISTANCE: 1kW for rated accuracy.

OVERRANGE: 101% of source range, 102% of measure range.

HIGH-CAPACITANCE MODE 1,2

ACCURACY SPECIFICATIONS 3: Accuracy specifications are applicable in both normal and high-

capacitance modes.

VOLTAGE SOURCE OUTPUT SETTLING TIME: Time required to reach within 0.1 % of final value

after source level command is processed on a fixed range. 4

Voltage Source

Range

Settling Time with

Cload = 4.7µF (typical)

1 V 75 µs

10 V 170 µs

20 V 200 µs

40 V 180 µs

MODE CHANGE DELAY:

100µA Current Range and Above:

Delay into High-Capacitance Mode: 11ms.

Delay out of High-Capacitance Mode: 11ms.

1µA and 10µA Current Ranges:

Delay into High-Capacitance Mode: 250ms.

Delay out of High-Capacitance Mode: 11ms.

MEASURE INPUT IMPEDANCE: >10GW in parallel with 25nF.

VOLTAGE SOURCE RANGE CHANGE OVERSHOOT: <400mV + 0.1% of larger range (typical).

Overshoot into a 100kW load, 20MHz bandwidth.

NOTES

1. High-capacitance mode specifications are for DC measurements only and use locked ranges. Autorange is dis-

abled.

2. 100nA range is not available in high-capacitance mode.

3. Add an additional 2nA to the source current accuracy and measure current accuracy offset for the 1µA range.

4. With measure and compliance set to the maximum current for the specified voltage range.

SMU INSTRUMENTS

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2651A 50A, High Power System

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MEASUREMENT SPEED SPECIFICATIONS 1, 2

MAXIMUM SWEEP OPERATION RATES (operations per second) FOR 60Hz (50Hz):

A/D Converter

Speed Trigger Origin

Measure

To Memory Using

User Scripts

Measure

To GPIB Using

User Scripts

Source Measure

To Memory Using

User Scripts

Source Measure

To GPIB Using

User Scripts

Source Measure

To Memory Using

Sweep API

Source Measure

To GPIB Using

Sweep API

0.001 NPLC Internal 20000 (20000) 9800 (9800) 7000 (7000) 6200 (6200) 12000 (12000) 5900 (5900)

0.001 NPLC Digital I/O 8100 (8100) 7100 (7100) 5500 (5500) 5100 (5100) 11200 (11200) 5700 (5700)

0.01 NPLC Internal 4900 (4000) 3900 (3400) 3400 (3000) 3200 (2900) 4200 (3700) 4000 (3500)

0.01 NPLC Digital I/O 3500 (3100) 3400 (3000) 3000 (2700) 2900 (2600) 4150 (3650) 3800 (3400)

0.1 NPLC Internal 580 (480) 560 (470) 550 (465) 550 (460) 560 (470) 545 (460)

0.1 NPLC Digital I/O 550 (460) 550 (460) 540 (450) 540 (450) 560 (470) 545 (460)

1.0 NPLC Internal 59 (49) 59 (49) 59 (49) 59 (49) 59 (49) 59 (49)

1.0 NPLC Digital I/O 58 (48) 58 (49) 59 (49) 59 (49) 59 (49) 59 (49)

HS ADC Internal 38500 (38500) 18000 (18000) 10000 (10000) 9500 (9500) 14300 (14300) 6300 (6300)

HS ADC Digital I/O 12500 (12500) 11500 (11500) 7500 (7500) 7000 (7000) 13200 (13200) 6000 (6000)

HIGH SPEED ADC BURST MEASUREMENT RATES 3

Burst Length

(readings)

Readings per

Second Bursts per Second

100 1,000,000 400

500 1,000,000 80

1000 1,000,000 40

2500 1,000,000 16

5000 1,000,000 8

MAXIMUM SINGLE MEASUREMENT RATES (operations per

second) FOR 60Hz (50Hz)

A/D Converter

Speed

Trigger

Origin

Measure

To GPIB

Source

Measure

To GPIB

Source

Measure

Pass/Fail

To GPIB

0.001 NPLC Internal 1900 (1800) 1400 (1400) 1400 (1400)

0.01 NPLC Internal 1450 (1400) 1200 (1100) 1100 (1100)

0.1 NPLC Internal 450 (390) 425 (370) 425 (375)

1.0 NPLC Internal 58 (48) 57 (48) 57 (48)

MAXIMUM MEASUREMENT RANGE CHANGE RATE: >4000 per second for >10µA (typical).

MAXIMUM SOURCE RANGE CHANGE RATE: >325 per second for >10µA, typical. When chang-

ing to or from a range ≥1A, maximum rate is >250 per second, typical.

COMMAND PROCESSING TIME: Maximum time required for the output to begin to change fol-

lowing the receipt of the smua.source.levelv or smua.source.leveli command. <1ms typical.

NOTES

1. Tests performed with a Model 2651A on channel A using the following equipment: Computer hardware (Intel®

Pentium® 4 2.4GHz, 2GB RAM, National Instruments™ PCI-GPIB). Driver (NI-488.2 Version 2.2 PCI-GPIB).

Software (Microsoft® Windows® XP, Microsoft Visual Studio® 2010, VISA™ version 4.1).

2. Exclude current measurement ranges less than 1mA.

3. smua.measure.adc has to be enabled and the smua.measure.count set to the burst length.

TRIGGERING AND SYNCHRONIZATION

SPECIFICATIONS

TRIGGERING:

Trigger In to Trigger Out: 0.5µs (typical).

Trigger In to Source Change 1: 10µs (typical).

Trigger Timer Accuracy: ±2µs (typical).

Source Change 1 After LXI Trigger: 280µs (typical).

SYNCHRONIZATION:

Single-Node Synchronized Source Change 1: <0.5µs (typical).

Multi-Node Synchronized Source Change 1: <0.5µs (typical).

NOTES

1. Fixed source range with no polarity change.

Model 2651A specifications

SMU INSTRUMENTS

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2651A 50A, High Power System

SourceMeter® SMU Instrument

SUPPLEMENTAL INFORMATION

FRONT PANEL INTERFACE: Two-line vacuum fluorescent display (VFD) with keypad and

navigation wheel.

DISPLAY:

Show error messages and user defined messages. Display source and limit settings.

Show current and voltage measurements

(6½-digit to 4½-digit).

View measurements stored in dedicated

reading buffers.

KEYPAD OPERATIONS:

Change host interface settings.

Save and restore instrument setups.

Load and run factory and user defined test scripts that prompt for input and send results to

the display.

Store measurements into dedicated reading buffers.

PROGRAMMING: Embedded Test Script Processor (TSP®) scripting engine is accessible from any

host interface.

Responds to individual instrument control commands.

Responds to high speed test scripts comprised of instrument control commands and Test Script

Language (TSL) statements (for example, branching, looping, and math).

Able to execute high speed test scripts stored in memory without host intervention.

MINIMUM USER MEMORY AVAILABLE: 16MB (approximately 250,000 lines of TSP code).

TEST SCRIPT BUILDER: Integrated development environment for building, running, and

managing TSP scripts. Includes an instrument console for communicating with any TSP enabled

instrument in an interactive manner. Requires:

VISA (NI-VISA included on CD),

Microsoft® .NET Framework (included on CD),

Keithley I/O Layer (included on CD),

Intel® Pentium III 800MHz or faster personal computer,

Microsoft Windows® 2000, XP, Vista®, or 7.

TSP EXPRESS (embedded): Tool that allows users to quickly and easily perform common I-V tests

without programming or installing software. To run TSP Express, you need:

Java™ Platform, Standard Edition 6,

Microsoft Internet Explorer®, Mozilla® Firefox®, or another Java-compatible web browser.

SOFTWARE INTERFACE: TSP Express (embedded), direct GPIB/VISA, read/write with Microsoft

Visual Basic®, Visual C/C++®, Visual C#®, LabVIEW™, CEC TestPoint™ Data Acquisition

Software Package, NI LabWindows™/CVI, etc.

READING BUFFERS: Nonvolatile memory uses dedicated storage areas reserved for measurement

data. Reading buffers are arrays of measurement elements. Each element can hold the

following items:

Measurement

Measurement status

Timestamp

Source setting (at the time the measurement was taken)

Range information

Two reading buffers are reserved for each Model 2651A channel. Reading buffers can be filled

using the front panel STORE key and retrieved using the RECALL key or host interface.

Buffer Size, with timestamp and source setting: >60,000 samples.

Buffer Size, without timestamp and source setting: >140,000 samples.

SYSTEM EXPANSION: The TSP-Link expansion interface allows TSP-enabled instruments to

trigger and communicate with each other. See figure below.

To Additional Nodes

Node 1

Node 2

To Host Computer

Each Model 2651A has two TSP-Link connectors to make it easier to connect instruments

together in sequence.

Once source-measure instruments are interconnected through the TSP-Link expansion interface,

a computer can access all the resources of each source-measure instrument through the host

interface of any Model 2651A.

A maximum of 32 TSP-Link nodes can be interconnected. Each source-measure instrument

consumes one TSP-Link node.

TIMER: Free-running 47-bit counter with 1MHz clock input. Resets each time instrument power is

turned on. If the instrument is not turned off, the timer is reset to zero every 4 years.

Timestamp: TIMER value is automatically saved when each measurement is triggered.

Resolution: 1µs.

Timestamp Accuracy: ±100ppm.

Model 2651A specifications

GENERAL

DIGITAL I/O INTERFACE:

+5VDC

5.1kW

100W

600mA

Solid State

Fuse

Read by

firmware

Written by

firmware

+5V Pin

(on DIGITAL I/O

connector)

Dig

ital I/O Pin

(on DIGITAL I/O

connector)

GND Pin

(on DIGITAL I/O

connector)

Rear Panel

Connector: 25-pin female D.

Input/Output Pins: 14 open drain I/O bits.

Absolute Maximum Input Voltage: 5.25V.

Absolute Minimum Input Voltage: –0.25V.

Maximum Logic Low Input Voltage: 0.7V, +850µA max.

Minimum Logic High Input Voltage: 2.1V, +570µA.

Maximum Source Current (flowing out of digital I/O bit): +960µA.

Maximum Sink Current At Maximum Logic Low Voltage (0.7): –5.0mA.

Absolute Maximum Sink Current (flowing into digital I/O pin): –11mA.

5V Power Supply Pin: Limited to 250mA, solid-state fuse protected.

Output Enable Pin: Active high input pulled down internally to ground with a 10kW

resistor; when the output enable input function has been activated, the Model 2651A

channel will not turn on unless the output enable pin is driven to >2.1V (nominal

current = 2.1V/10kW = 210µA).

IEEE-488: IEEE-488.1 compliant. Supports IEEE-488.2 common commands and status model

topology.

RS-232: Baud rates from 300bps to 115200bps. Programmable number of data bits, parity

type, and flow control (RTS/CTS hardware or none). When not programmed as the

active host interface, the Model 2651A can use the RS-232 interface to control other

instrumentation.

ETHERNET: RJ-45 connector, LXI, 10/100BT, Auto MDIX.

LXI COMPLIANCE: LXI Class C 1.2.

Total Output Trigger Response Time: 245µs minimum, 280µs (typical), (not specified)

maximum.

Receive Lan[0-7] Event Delay: Unknown.

Generate Lan[0-7] Event Delay: Unknown.

EXPANSION INTERFACE: The TSP-Link Technology expansion interface allows TSP-enabled

instruments to trigger and communicate with each other.

Cable Type: Category 5e or higher LAN crossover cable. 3 meters maximum between each

TSP-enabled instrument.

USB: USB 2.0 host controller.

POWER SUPPLY: 100V to 250V AC, 50Hz to 60Hz (autosensing), 550VA maximum.

COOLING: Forced air; side and top intake and rear exhaust.

WARR A NT Y: 1 year.

EMC: Conforms to European Union EMC Directive.

SAFETY: UL listed to UL61010-1:2004. Conforms to European Union Low Voltage Directive.

DIMENSIONS: 89mm high × 435mm wide × 549mm deep (3.5 in. × 17.1 in. × 21.6 in.).

BENCH CONFIGURATION (with handle and feet): 104mm high × 483mm wide × 620mm

deep (4.1 in. × 19 in. × 24.4 in.).

WEIGHT: 9.98kg (22 lbs).

ENVIRONMENT: For indoor use only.

ALTITUDE: Maximum 2000 meters above sea level.

OPERATINg: 0° to 50°C, 70% relative humidity up to 35°C. Derate 3% relative humidity/°C,

35° to 50°C.

STORAGE: –25° to 65°C.