Failsafe™ 2.5V/ 3.3V Zero Delay Buffe
r
CY23FS08
Cypress Semiconductor Corporation 198 Champion Court San Jose,CA 95134-1709 408-943-2600
Document #: 38-07518 Rev. *C Revised January 2, 2006
Features
Internal DCXO for continuous glitch-free operation
Zero input-o utput propagation delay
100ps typical output cycle-to-cycle jitter
110 ps typical Output-output skew
1 MHz–200 MHz reference input
Supports industry standard input crystals
200 MHz (commercial), 166 MHz (industrial) outputs
5V-tolerant inputs
Phase-locked loop (PLL) Bypass Mode
Dual Referen c e Inputs
28-pin SSOP
Split 2.5V or 3.3V output power supplies
3.3V core power supply
Industrial temperature available
Functional Description
The CY23FS08 is a FailSafe™ Zero Delay Buffer with two
reference clock inputs and eight phase-aligned outputs. The
device provides an optimum solution for applications where
continuous operation is required in the event of a primary clock
failure.
Continuous, glitch-free operation is achieved by using a
DCXO, which serves as a redundant clock source in the event
of a reference clock failure by maintaining the last frequen cy
and phase information of the reference clock.
The unique feature of the CY23FS08 is that the DCXO is in
fact the primary clocking source, which is synchronized
(phase-aligned) to the external reference clock. When this
external clock is restored, the DCXO automatically resynchro-
nizes to the external clock.
The frequency of the crystal, which will be connected to the
DCXO must be chosen to be an integer factor of the frequency
of the reference clock. This factor is set by four select lines:
S[4:1]. please see Table 1. The CY23FS08 has three split
power supplies; one for core, another for Bank A outputs and
the third for Bank B outputs. Each output power supply , except
VDDC can be co nnected to either 2.5V or 3.3V. VDDC is the
power supply pin for internal circuits and must be connected
to 3.3V.
CLKA[1:4]
CLKB[1:4]
DCXO
Decoder
4
FailsafeTM
Block PLL
XIN XOUT
4
4
REF2
FBK
S[4:1]
FAIL# /SAFE
REF1
REFSEL
Block Diagram Pin Configuration
CLKB1
S2
S3
VDDB
CLKB2
S4
VDDB
XIN
VDDC FAIL#/SAFE
28
27
26
25
24
23
22
21
1
2
3
4
5
6
7
8
CY23FS08
28-pin SSOP
REF1
REF2
VSSB
REFSEL
FBK
VSSA
CLKA1
CLKA2
S1
VDDA
9
10
11
12
13
14
VSSB
CLKB3
CLKB4
20
19
18
17
16
15
VSSA
CLKA3
CLKA4
VDDA
XOUT
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CY23FS08
Document #: 38-07518 Rev. *C Page 2 of 12
Pin Definitions
Pin Number Pin Name Description
1,2 REF1,REF2 5V-tolerant, reference clock inputs[4].
4,5,10,11 CLKB[1:4] Bank B clock outputs.[1, 2]
25,24,19,18 CLKA[1:4] Bank A clock outputs.[1, 2]
27 FBK Feedback input to the PLL.[1, ]
23,6,7,22 S[1:4] Frequency select pins/PLL and DCXO bypass.[3]
14 XIN Reference crystal input.
15 XOUT Reference crystal output.
16 FAIL#/SAFE Valid reference indicator. A high level indicates a valid reference input.
13 VDDC 3.3V power supply for the internal circuitry.
8,12 VDDB 2.5V or 3.3V power supply for Bank B outputs.
3,9 VSSB Ground.
17,21 VDDA 2.5V or 3.3V power supply for Bank A outputs.
20,26 VSSA Ground.
28 REFSEL Reference select. Selects the active reference clock from either REF1 or REF2.
REFSEL = 1, REF1 is selected, REFSEL = 0, REF2 is selected.
Table 1. Configura t ion Table
S[4:1] XTAL (MHz) REF(MHz) OUT(MHz) REF:OUT
ratio REF:XTAL
ratio Out:XTAL ratioMin. Max. Min. Max. Min. Max.
0000 PLL and DCXO Bypass mode
1000 8.33 30 16.67 60.00 8.33 30.00 ÷22 1
1110 9.50 30 57.00 180.00 28.50 90.00 ÷26 3
0101 8.50 30 6.80 24.00 1.70 6.00 ÷44/5 1/5
1011 8.33 30 25.00 90.00 6.25 22.50 ÷43 3/4
0011 8.33 30 2.78 10.00 2.78 10.00 x1 1/3 1/3
1001 8.33 30 8.33 30.00 8.33 30.00 x1 1 1
1111 8.00 25 32.00 100.00 32.00 100.00 x1 4 4
1100 8.00 25 64.00 200.00 64.00 200.00 x1 8 8
0001 8.33 30 1.04 3.75 2.08 7.50 x2 1/8 1/4
0110 8.33 30 4.17 15.00 8.33 30.00 x2 1/2 1
1101 8.33 30 16.67 60.00 33.33 120.00 x2 2 4
0100 8.33 30 4.17 15.00 16.67 60.00 x4 1/2 2
1010 8.33 30 12.50 45.00 50.00 180.00 x4 3/2 6
0010 8.33 30 1.39 5.00 11.11 40.00 x8 1/6 4/3
0111 8.33 30 6.25 22.50 50.00 180.00 x8 3/4 6
Notes:
1. For normal operation, connect either one of the eight clock output s to the FBK input.
2. Weak pull-downs on all outputs.
3. Weak pull-ups on these inputs.
4. Weak pull- do w n s on these inputs.
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CY23FS08
Document #: 38-07518 Rev. *C Page 3 of 12
FailSafe Function
The CY23FS08 is targeted at clock distribution applications
that could or which currently require continued operation
should the main reference clock fail. Existing approaches to
this requirement have utilized multiple reference clocks with
either internal or external methods for switching between
references. The problem with this techniq ue is that it leads to
interruptions (or glitches) when transitioning from one
reference to another , often requiring complex external circuitry
or software to maintain system stability. The technique imple-
mented in this design co mpletely eliminates any switching of
references to the PLL, greatly simplifying system design.
The CY23FS08 PLL is driven by the crystal oscillator , which is
phase-aligned to an external reference clock so that the output
of the device is effectively phase-aligned to referen ce via the
external feedback loop. This is accomplished by utilizing a
digitally controlled capacitor array to pull the crystal frequency
over an approximate range of ±300 ppm from its nominal
frequency.
In this mode, should the reference freque ncy fail (i.e ., stop or
disappear), the DCXO maintains its last setting and a flag
signal (FAIL#/SAFE) is set to indicate failure of the reference
clock.
The CY23FS08 provides four select bits, S1 through S4 to
control the reference to crystal frequency ratio. The DCXO i s
internally tuned to the phase and frequency of the external
reference only when the reference frequency divided by this
ratio is within the DCXO capture range. If the frequency is out
of range, a flag will be set on the F AIL#/SAFE pin notifying the
system that the selected reference is not valid. If the reference
moves in range, then the flag will be cleared, indicating to the
system that the selected reference is valid.
Table 2. FailSafe Timing Table
Parameter Description Conditions Min. Max. Unit
tFSL Fail#/Safe Assert Delay Measured at 80% to 20%, Load = 15 pF See Figure 2 ns
tFSH Fail#/Safe Deassert Delay Measured at 80% to 20%, Load = 15 pF See Figure 2 ns
REF
OUT
FAIL#/SAFE tFSL tFSH
Figure 1. Fail#/Safe Timing for Input Reference Failing Catastrophically
n=FREF
FXTAL =4(in above exam ple)
tFSL(max) = 2 tREF x n
()+25ns
tFSH(min)= 12 tREF x n
()+25ns
Figure 2. Fail#/Saf e Timing Formula
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CY23FS08
Document #: 38-07518 Rev. *C Page 4 of 12
Reference + 300 ppm
Reference - 300 ppm
Reference
Output + 300 ppm
Output - 300 ppm
Output
Fail#/Safe
tFSH
Reference Off
tFSL Time
FrequencyVolt
Figure 3. FailSafe Timing Diagram: Input Reference Slowly Drifting Out of FailSafe Capture Range
Failsafe typical frequency settling time
Initial valid Ref1 = 20 MHz +100 ppm,
then swi tching to REF2 = 20 MHz
0
50
100
150
00.451.32.5
SETTLING TIME (ms)
OUTPUT FREQU ENC Y DELTA (ppm )
Figure 4. FailSafe Referenc e Swi t c hin g Be h av io r
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CY23FS08
Document #: 38-07518 Rev. *C Page 5 of 12
Figure 5. FailSafe Effective Loop Bandwidth (min)
REF1
REF2
REFSEL
0 ms 1.4ms
0 deg
-180deg
0 m s
Figure 6. Sample Timing of Muxing Between Two Reference Clocks 180°C Out of Phase and Resulting Output
Phase Offset Typical Settling Time (105 MHz)
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CY23FS08
Document #: 38-07518 Rev. *C Page 6 of 12
0 ms 1.4 ms
0
190 fs/cy
190 fs/cycle = 0.125 mradian/cycle
Figure 7. Resulting Output Dphase/Cycle Typical Rate of Change (105 MHz)
t1t2
Duty Cycle - tDC
tSR(O)
Slew R ate - t(SR)
VDD
0V
20%
80%80%
20%
VDD/2 VDD/2 VDD/2 VDD
0V
Ou tp u t-Ou tp u t S k e w - tSK(O)
VDD/2
VDD/2
tSK(O)
tSR(O)
P a rt to P a rt S k ew - tSK(PP)
FBK,
Part 1
VDD/2
tSK(PP)
VDD/2
FBK,
Part 2
Static Phase O ffset - t(φ)
REF
VDD/2
t(φ)
VDD/2
FBK
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CY23FS08
Document #: 38-07518 Rev. *C Page 7 of 12
XTAL Selection Criteria and Application Example
Choosing the appropriate XTAL will ensure the FailSafe device
will be able to span an appropriate frequency of operation.
Also, the XTAL parameters will determine the holdover
frequency stability. Critical parameters are as follows. Our
recommendation is to choose:
Low C0/C1 ratio (240 or less) so that the XT AL has enough
range of pullability.
Low temperature frequency variation
Low manufacturing frequency toleranc e
Low aging.
C0 is the XTAL shunt capacitance (3 pF–7 pF typ.).
C1 is the XTAL motional capacitance (10 fF–30 fF typ).
The capacitive load as “seen” by the XTAL is across its
terminals. It is named Clmin (for minimum value), and Clmax
(for maximum value).These are used for calculating the pull
range.
Please note that the Cl range “center” is approximately 20 pF,
but we may not want a XTAL calibrated to that load. This is
because the pullability is not linear, as represented in the
equation above. Plotting the pullability of the XTAL shows this
expected behavior as shown in Figure 8. In this example,
specifying a XTAL calibrated to 14 pF load provides a
balanced ppm pullability range around the nominal frequency .
Note:
5. The above example shows the maximum range the FailSafe internal capacitor array is capable of (0 to 48.6 pF).Cypress recommends the min./max capacitor
array values be programmed to a narr ower range such as 6 pF–30 pF, or 7.5 pF–27 pF. This ensures the XTAL operates between series resonance and
anti-resonance. Please contact Cypress for choosing these range settings.
Clmin = (12 pF IC input cap + 0 pF pulling cap+ 6 pF trace cap on bo ard)/2 = 9 pF
Clmax = (12 pF IC input cap + 48 pF pulling cap+ 6 pF trac e cap on board)/2 = 33 pF
Pull Range =(fClmin–fClmax)/fClmin = ((C1)/2)[(1/(C0+Clmin))–(1/(C0+Clmax))]
Pull Range in ppm = ((C1)/2)[(1/(C0+Clmin))–(1/(C0+Clmax))] × 106
Example:[5]
Figure 8. Frequency vs. Cload Behavior for Example XT AL
Pullability R a nge Vs. C load
( Normal i zed to 14pF Cl oad)
-400.00
-300.00
-200.00
-100.00
0.00
100.00
200.00
300.00
400.00
6 8 10 12 14 16 18 20 22 24 26 28 30 32 34
Cload (pF)
Delta Freq. from nom
C0/ C1 = 200
C0/ C1 = 300
C0/ C1 = 400
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CY23FS08
Document #: 38-07518 Rev. *C Page 8 of 12
Calculated value of the pullability range for the XTAL with
C0/C1 ratio of 200, 300 and 400 are shown in Table 3. For this
calculation Cl(min) = 8pF and Cl(max)= 32pF has been used.
Using a XTAL that has a n ominal frequency specified at l oad
capacitance of 14pF, almost symmetrical pullability range has
been obtained.
Next, it is important to calculate the pullability range including
error tolerances. This would be the capture range of the input
reference frequency that the FailSafe device and XT AL combi-
nation would reliably span.
Calculating the capture range involves subtracting error
tolerances as follows:
Parameter.......... ... ................. ... ... ................. .. .f error (ppm)
Manufacturing frequency tolerance ...................................15
Temperature stability ..........................................................30
Aging ......................................... ................. ................. ........ 3
Board/trace variation... ... ................ ................. ... ................. 5
Total....................................................................................53
Example: Capture Range for XT AL with C0/C1 Ratio of 200
Negative Cap t ure Range= –385 ppm + 53 ppm = –332 ppm
Positive Capture Range = 333 ppm – 53 ppm = +280 ppm
It is important to note that the XTAL with lower C0/C1 ratio has
wider pullability/capture range as compared to the higher
C0/C1 ratio. This will help the user in selecting the appropriate
XTAL for use in the FailSafe application.
T able 3. Pullability Range from XT AL with Different C0/C1
Ratio
C0/C1 Ratio Cload(min.) Cload(max.) Pullability
Range
200 8.0 32.0 –385 333
300 8.0 32.0 –256 222
400 8.0 32.0 –192 166
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CY23FS08
Document #: 38-07518 Rev. *C Page 9 of 12
Absolute Maximum Conditions
Parameter Description Condition Min. Max. Unit
VDD Supply Voltage –0.5 4.6 V
VIN Input Voltage Relative to VSS –0.5 VDD+0.5 VDC
TSTemperature, Storage Non Functional –65 +150 °C
TATemperature, Operating Ambient Commercial Grade 0 70 °C
Industrial Grade –40 85 °C
TJTemperature, Junction Functional 125 °C
ESDHBM ESD Protection (Human Body Model) MIL-STD-883, Method 3015 2000 V
ØJC Dissipation, Junction to Case Mil-Spec 883E Method 1012.1 36.17 °C/W
ØJA Dissipation, Junction to Ambient JEDEC (JESD 51) 100.6 °C/W
UL–94 Flammabili ty Rating At 1/8 in. V–0
MSL Moisture Sensitivity Level 1
Multiple Supplies: The voltage on any input or I/O pin cannot exceed the power pin during power-up. Power supply sequencing is NOT required.
Recommended Pullable Crystal Specifications[6]
Parameter Name Comments Min. Typ. Max. Unit
FNOM Nominal crystal frequency Parallel resonance, fundamental mode,
AT cut 8.00 30.00 MHz
CLNOM Nominal load capacitance 14 pF
R1Equivalent series resistance (ESR) Fundamental mode 25
R3/R1Ratio of third overtone mode ESR to
fundamental mode ESR Ratio used because typical R1 values
are much less than the maximum spec 3––
DL Crystal drive level No external series resistor assumed 0.5 2 mW
F3SEPLI Third overtone separation from 3*FNOM High side 300 ppm
F3SEPLO Third overtone separation from 3*FNOM Low side –150 ppm
C0Crystal shunt capacitance 7 pF
C0/C1Ratio of shunt to motional capacitance 180 250
C1Crystal motional capacitance 14.4 18 21.6 fF
Table 4. Operating Con ditio ns for FailSafe Commercial/Industrial Temperature Devices
Parameter Description Min. Max. Unit
VDDC 3.3V Supply Voltage 3.135 3.465 V
VDDA,
VDDB 2.5V Supply Voltage Range 2.375 2.625 V
3.3V Supply Voltage Range 3.135 3.465 V
TAAmbient Operating Temperature, Commercial 0 70 °C
Ambient Operating Temperature, Ind ustrial –40 85 ° C
CLOutput Load Capacitance (Fout < 100 MHz) 30 pF
Output Load Capacitance (Fout > 100 MHz) 15 pF
CIN Input Capacitance (except XIN) 7pF
CXIN Cryst al In pu t C apacitance (all intern al caps off) 10 13 pF
TPU Power-up time for all VDDs to reach minimum specified voltage (power ramps must be monotonic) 0.05 500 ms
Note:
6. Ecliptek ECX-5788-13.500M, ECX-5807-19.440M, ECX-5872-19.53125M, ECX-5806-18.432M, ECX-5808-27.000M, ECX-5884-17.664M,
ECX-5883-16.384M,ECX-5882-19.200M,ECX-5880-24.576M meet these specifications.
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CY23FS08
Document #: 38-07518 Rev. *C Page 10 of 12
Table 5. Electrical Characteristics for FailSafe Commercial/Industrial Temperature Devices
Parameter Description Test Conditions Min. Typ. Max. Unit
VIL Input Low Voltage CMOS Levels, 30% of VDD 0.3xVDD V
VIH Input High Voltage CMOS Levels, 70% of VDD 0.7xVDD V
IIL Input Low Current VIN = VSS (100k pull-up only) 50 µA
IIH Input High Current VIN = VDD (100k pull-down only) 50 µA
IOL Output Low Current VOL = 0.5V, VDD = 2.5V 18 mA
VOL = 0.5V, VDD = 3.3V 20 mA
IOH Output High Current VOH = VDD – 0.5V, VDD = 2.5V 18 mA
VOH = VDD – 0.5V, VDD = 3.3V 20 mA
IDDQ Quiescent Current All Inputs grounded, PLL and DCXO in
bypass mode, Reference Input = 0 250 µA
Table 6. Switching Characteristics for FailSafe Commercial/Industrial Temperature Devices
Parameter[8] Description Test Conditions Min. Typ. Max. Unit
fREF Reference Frequency Commercial Grade 1.04 200 MHz
Industrial Grade 1.04 166.7 MHz
fOUT Output Frequency 15-pF Load, Commercial Grade 1.70 200 MHz
15-pF Load, Industrial Grade 1.70 166.7 MHz
fXIN DCXO Frequency 8.0 30 M Hz
tDC Duty Cycle Measured at VDD/2 47 53 %
tSR(I) Input Slew Rate Measured on REF1 Input, 30% to 70% of VDD 0.5 4.0 V/ns
tSR(O) Output Slew Rate Measured from 20% to 80% of VDD = 3.3V , 15 pF Load 0.8 4.0 V/ns
Measured from 20% to 80% of VDD =2.5V, 15 pF Load 0.4 3.0 V/ns
tSK(O) Output to Output Skew All outputs equally loaded, measured at VDD/2 110 200 ps
tSK(IB) Intrabank Skew All outputs equally loaded, measured at VDD/2 75 ps
tSK(PP) Part to Part Skew Measured at VDD/2 500 ps
t(φ)[7] Static Phase Offset Measured at VDD/2 250 ps
tD(φ)[7] Dynamic Phase Offset Measured at VDD/2 150 200 ps
tJ(CC) Cycle-to-Cycle Jitter Load = 15 pF, fOUT 6.25 MHz 100 200 ps
–1835ps
RMS
tLOCK Lock Time At room temperature with 18.432-MHz Crystal 70 ms
Ordering Information
Part Number Package Type Product Flow
CY23FS08OI 28-pin SSOP Industrial, –40°C to 85°C
CY23FS08OIT 28-pin SSOP – Tape and Reel Industrial, –40°C to 85°C
CY23FS08OC 28-pin SSOP Commercial, 0°C to 70°C
CY23FS08OCT 28-pin SSOP – Tape and Reel Commercial, 0°C to 70°C
Lead-free
CY23FS08OXI 28-pin SSOP Industrial, –40°C to 85°C
CY23FS08OXIT 28-pin SSOP – Tape and Reel Industrial, –40°C to 85°C
CY23FS08OXC 28-pin SSOP Commercial, 0°C to 70°C
CY23FS08OXCT 28-pin SSOP – Tape and Reel Commercial, 0°C to 70°C
Notes:
7. The t(φ) reference feedback input delay is guaranteed for a maximum 4:1 input edge ratio between the two signals as long as tSR(I) is maintained.
8. Parameters guaranteed by design and characterization, not 100% tested in production.
9. Includes typical board trace capacitance of 6–7pF each XIN, XOUT.
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CY23FS08
Document #: 38-07518 Rev. *C Page 11 of 12
© Cypress Semi con duct or Cor po rati on , 20 06 . The information con t a in ed he re i n is subject to change wi t hou t n oti ce. C ypr ess S em icon ductor Corporation assumes no responsibility f or the u se
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypr ess. Furthermore , Cypress does not authorize i ts
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypre ss
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
Package Drawing and Dimensions
FailSafe is a trademark of Cypress Semiconductor. All product and company names mentioned in this document are the trademarks
of their respective holders.
28-Lead (5.3 mm) Shrunk Small Outline Package O28
51-85079-*C
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CY23FS08
Document #: 38-07518 Rev. *C Page 12 of 12
Document History Page
Document Title: CY23FS08 Failsafe™ 2.5V/ 3.3V Zero Delay Buffer
Document #: 38-07518 Rev. *C
REV. ECN NO. Issue
Date Orig. of
Change Description of Change
** 123699 04/23/03 RGL New Data Sheet
*A 224067 See ECN RGL/ZJX Changed the XTAL Specifications table.
*B 276749 See ECN RGL Removed (TLOCK) Lock Time Specification.
*C 417645 See ECN RGL Added Lead-free devices
Added typical nos. on jitters
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