6.4V TEMPERATURE COMPENSATED ZENER DIODE 1N4565 - 1N4584AD2A 1N4565 - 1N4584AD2B * Hermetic Ceramic Surface Mount Package * 6.4V 5% Reference Voltage * Stable over a wide temperature range * Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25C unless otherwise stated) VZM IZM(1) Reference Voltage Continuous DC Current PT Total Power Dissipation at 6.4V 70mA 500mW TA = 25C De-rate TA > 25C 3.33mW/C TJ Junction Temperature Range -55 to +175C TSTG Storage Temperature Range -55 to +175C TSP Maximum Soldering Pad Temperature for 20s 260C THERMAL PROPERTIES Symbol Parameter Min RJA Thermal Resistance Junction to Ambient Typ Max Units 260 C/W ELECTRICAL CHARACTERISTICS (TA = 25C unless otherwise stated) Symbol Parameter Test Conditions Min Typ Max Units VZ Zener Voltage At IZT 6.08 6.4 6.72 V VZ Zener Voltage Coefficient from VZ See Electrical Stability Table IR Reverse Leakage Current VR = 3V 2.0 A ZZ Dynamic Impedance See Electrical Stability Table Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing an order. Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8251 Issue 3 Page 1 of 4 6.4V TEMPERATURE COMPENSATED ZENER DIODE 1N4565 - 1N4584AD2A 1N4565 - 1N4584AD2B ELECTRICAL STABILITY CHARACTERISTICS (TA = 25C unless otherwise stated) Type IZT VZ Zener Test Current Zener Voltage Coefficient (1) 0.01mA dc (1) At IZT Dynamic Impedance At IZT, Isig = 10% IZT rms TA 2C max. 1N4565 1N4566 1N4567 1N4568 1N4569 1N4565A 1N4566A 1N4567A 1N4568A 1N4569A 1N4570 1N4571 1N4572 1N4573 1N4574 1N4570A 1N4571A 1N4572A 1N4573A 1N4574A 1N4575 1N4576 1N4577 1N4578 1N4579 1N4575A 1N4576A 1N4577A 1N4578A 1N4579A 1N4580 1N4581 1N4582 1N4583 1N4584 1N4580A 1N4581A 1N4582A 1N4583A 1N4584A ZZ max. mA mV C 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 2.0 2.0 2.0 2.0 2.0 2.0 2.0 2.0 2.0 2.0 4.0 4.0 4.0 4.0 4.0 4.0 4.0 4.0 4.0 4.0 48 24 10 5 2 100 50 20 10 5 48 24 10 5 2 100 50 20 10 5 48 24 10 5 2 100 50 20 10 5 48 24 10 5 2 100 50 20 10 5 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 0, +25, +75 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 -55, 0, +25, +75, +100 200 200 200 200 200 200 200 200 200 200 100 100 100 100 100 100 100 100 100 100 50 50 50 50 50 50 50 50 50 50 25 25 25 25 25 25 25 25 25 25 Notes (1) To guarantee voltage temperature stability, it is necessary to maintain a stable IZ as specified Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8251 Issue 3 Page 2 of 4 6.4V TEMPERATURE COMPENSATED ZENER DIODE 1N4565 - 1N4584AD2A 1N4565 - 1N4584AD2B MECHANICAL DATA DLCC2 Variant A (D2A) PAD 1 PAD 2 ANODE CATHODE DIMENSION A mm Inches 5.00 0.10 0.197 0.004 B 2.61 0.10 0.103 0.004 C 1.08 0.10 0.043 0.004 D 1.76 0.10 0.069 0.004 DLCC2 Variant B (D2B) PAD 1 PAD 2 PAD 3 ANODE CATHODE LID CONTACT TO ANODE* DIMENSION A mm Inches 5.00 0.10 0.197 0.004 B 2.61 0.10 0.103 0.004 C 1.08 0.10 0.043 0.004 SOLDER PAD LAYOUT D-5A DLCC2/ D-5A MELF OVERLAY DIMENSION A B C mm 6.25 1.70 2.67 Inches 0.246 0.067 0.105 C A B * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/dlcc2.html on the Semelab web site. Package variant to be specified at order. Other Package Outlines may be available - Contact Semelab Sales to Enquire Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8251 Issue 3 Page 3 of 4 6.4V TEMPERATURE COMPENSATED ZENER DIODE 1N4565 - 1N4584AD2A 1N4565 - 1N4584AD2B SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type - See Electrical Stability Characteristics Table Package Variant - See Mechanical Data Screening Level - See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: 1N4565-A 001 Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All `Additional Options' are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 1N4565A part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N4565AD2A-JQRS (Include quantity for flight parts) 1N4565AD2A-JQRS.GRPC (chargeable conformance option) 1N4565AD2A-JQRS.GCDE (charge for destructive parts) 1N4565AD2A-JQRS.GCDM (charge for destructive parts) 1N4565AD2A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries. High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Telephone +44 (0) 1455 556565 Email: sales@semelab-tt.com Coventry Road, Lutterworth, Leicestershire, LE17 4JB Fax +44 (0) 1455 552612 Website: http://www.semelab-tt.com Document Number 8251 Issue 3 Page 4 of 4