S29WS-P MirrorBit(R) Flash Family S29WS512P, S29WS256P, S29WS128P 512/256/128 Mb (32/16/8 M x 16 bit) 1.8 V Burst Simultaneous Read/Write MirrorBit Flash Memory S29WS-P Cover Sheet Data Sheet Notice to Readers: This document states the current technical specifications regarding the Spansion product(s) described herein. Each product described herein may be designated as Advance Information, Preliminary, or Full Production. See Notice On Data Sheet Designations for definitions. Publication Number S29WS-P_00 Revision A Amendment 12 Issue Date January 28, 2008 D at a S hee t Notice On Data Sheet Designations Spansion Inc. issues data sheets with Advance Information or Preliminary designations to advise readers of product information or intended specifications throughout the product life cycle, including development, qualification, initial production, and full production. In all cases, however, readers are encouraged to verify that they have the latest information before finalizing their design. The following descriptions of Spansion data sheet designations are presented here to highlight their presence and definitions. Advance Information The Advance Information designation indicates that Spansion Inc. is developing one or more specific products, but has not committed any design to production. Information presented in a document with this designation is likely to change, and in some cases, development on the product may discontinue. Spansion Inc. therefore places the following conditions upon Advance Information content: "This document contains information on one or more products under development at Spansion Inc. The information is intended to help you evaluate this product. Do not design in this product without contacting the factory. Spansion Inc. reserves the right to change or discontinue work on this proposed product without notice." Preliminary The Preliminary designation indicates that the product development has progressed such that a commitment to production has taken place. This designation covers several aspects of the product life cycle, including product qualification, initial production, and the subsequent phases in the manufacturing process that occur before full production is achieved. Changes to the technical specifications presented in a Preliminary document should be expected while keeping these aspects of production under consideration. Spansion places the following conditions upon Preliminary content: "This document states the current technical specifications regarding the Spansion product(s) described herein. The Preliminary status of this document indicates that product qualification has been completed, and that initial production has begun. Due to the phases of the manufacturing process that require maintaining efficiency and quality, this document may be revised by subsequent versions or modifications due to changes in technical specifications." Combination Some data sheets contain a combination of products with different designations (Advance Information, Preliminary, or Full Production). This type of document distinguishes these products and their designations wherever necessary, typically on the first page, the ordering information page, and pages with the DC Characteristics table and the AC Erase and Program table (in the table notes). The disclaimer on the first page refers the reader to the notice on this page. Full Production (No Designation on Document) When a product has been in production for a period of time such that no changes or only nominal changes are expected, the Preliminary designation is removed from the data sheet. Nominal changes may include those affecting the number of ordering part numbers available, such as the addition or deletion of a speed option, temperature range, package type, or VIO range. Changes may also include those needed to clarify a description or to correct a typographical error or incorrect specification. Spansion Inc. applies the following conditions to documents in this category: "This document states the current technical specifications regarding the Spansion product(s) described herein. Spansion Inc. deems the products to have been in sufficient production volume such that subsequent versions of this document are not expected to change. However, typographical or specification corrections, or modifications to the valid combinations offered may occur." Questions regarding these document designations may be directed to your local sales office. 2 S29WS-P S29WS-P_00_A12 January 28, 2008 S29WS-P MirrorBit(R) Flash Family S29WS512P, S29WS256P, S29WS128P 512/256/128 Mb (32/16/8 M x 16 bit) 1.8 V Burst Simultaneous Read/Write MirrorBit Flash Memory Data Sheet Features Single 1.8 V read/program/erase (1.70-1.95 V) Hardware (WP#) protection of top and bottom sectors 90 nm MirrorBitTM Technology Dual boot sector configuration (top and bottom) Simultaneous Read/Write operation with zero latency Handshaking by monitoring RDY Random page read access mode of 8 words with 20 ns intra page access time Offered Packages 32 Word / 64 Byte Write Buffer - WS512P/WS256P/WS128P: 84-ball FBGA (11.6 mm x 8 mm) Low VCC write inhibit Sixteen-bank architecture consisting of 32/16/8 Mwords for 512/256/128P, respectively Four 16 Kword sectors at both top and bottom of memory array Persistent and Password methods of Advanced Sector Protection 510/254/126 64Kword sectors (WS512/256/128P) Write operation status bits indicate program and erase operation completion Programmable linear (8/16/32) with or without wrap around and continuous burst read modes Suspend and Resume commands for Program and Erase operations Secured Silicon Sector region consisting of 128 words each for factory and 128 words for customer Unlock Bypass program command to reduce programming time 20-year data retention (typical) Synchronous or Asynchronous program operation, independent of burst control register settings Cycling Endurance: 100,000 cycles per sector (typical) ACC input pin to reduce factory programming time Command set compatible with JEDEC (42.4) standard Support for Common Flash Interface (CFI) General Description The Spansion S29WS512/256/128P are Mirrorbit(R) Flash products fabricated on 90 nm process technology. These burst mode Flash devices are capable of performing simultaneous read and write operations with zero latency on two separate banks using separate data and address pins. These products can operate up to 104 MHz and use a single VCC of 1.7 V to 1.95 V that makes them ideal for today's demanding wireless applications requiring higher density, better performance and lowered power consumption. Performance Characteristics Read Access Times Speed Option (MHz) Max. Synch Access Time (tIACC) Current Consumption (typical values) 104 103.8 Continuous Burst Read @ 104 MHz 36 mA Simultaneous Operation 104 MHz 40 mA Max. Synch. Burst Access, ns (tBACC) 7.6 Program 20 mA Max OE# Access Time, ns (tOE) 7.6 Standby Mode 20 A Max. Asynch. Access Time, ns (tACC) 80 Typical Program & Erase Times Single Word Programming 40 s Effective Write Buffer Programming (VCC) Per Word 9.4 s Effective Write Buffer Programming (VACC) Per Word Publication Number S29WS-P_00 Revision A 6 s Sector Erase (16 Kword Sector) 350 ms Sector Erase (64 Kword Sector) 600 ms Amendment 12 Issue Date January 28, 2008 D at a S hee t Table of Contents Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 General Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Performance Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 4 1. Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 1.1 Valid Combinations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 2. Input/Output Descriptions & Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 3. Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4. Physical Dimensions/Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.1 Related Documents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.2 Special Handling Instructions for FBGA Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.3 MCP Look-ahead Connection Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5. Additional Resources. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 6. Product Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 6.1 Memory Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 7. Device Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.1 Device Operation Table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.2 Asynchronous Read. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.3 Page Mode Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.4 Synchronous (Burst) Read Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.5 Synchronous (Burst) Read Mode & Configuration Register . . . . . . . . . . . . . . . . . . . . . . . . . 7.6 Autoselect . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.7 Program/Erase Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.8 Simultaneous Read/Program or Erase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.9 Writing Commands/Command Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.10 Handshaking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.11 Hardware Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7.12 Software Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 19 19 20 20 28 32 34 51 51 52 52 52 8. Advanced Sector Protection/Unprotection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.1 Advanced Sector Protection Software Examples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.2 Lock Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.3 Persistent Protection Bits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.4 Dynamic Protection Bits. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.5 Persistent Protection Bit Lock Bit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.6 Password Protection Method . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8.7 Hardware Data Protection Methods. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 55 55 56 58 58 59 60 9. Power Conservation Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.1 Standby Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.2 Automatic Sleep Mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.3 Hardware RESET# Input Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9.4 Output Disable (OE#). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62 62 62 62 62 10. Secured Silicon Sector Flash Memory Region . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10.1 Factory Secured Silicon Sector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10.2 Customer Secured Silicon Sector . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10.3 Secured Silicon Sector Entry/Exit Command Sequences . . . . . . . . . . . . . . . . . . . . . . . . . . . 63 63 64 64 11. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.1 Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.2 Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.3 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.4 Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.5 Key to Switching Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.6 Switching Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11.7 Power-up/Initialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 66 66 67 68 68 68 69 S29WS-P 11 11 11 13 S29WS-P_00_A12 January 28, 2008 Data She et 11.8 CLK Characterization. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69 11.9 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 11.10 Erase and Programming Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 83 12. Appendix . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 84 12.1 Common Flash Memory Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88 13. Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 92 January 28, 2008 S29WS-P_00_A12 S29WS-P 5 D at a S hee t Figures Figure 4.1 Figure 4.2 Figure 7.1 Figure 7.2 Figure 7.3 Figure 7.4 Figure 7.5 Figure 7.6 Figure 8.1 Figure 8.2 Figure 8.3 Figure 11.1 Figure 11.2 Figure 11.3 Figure 11.4 Figure 11.5 Figure 11.6 Figure 11.7 Figure 11.8 Figure 11.9 Figure 11.10 Figure 11.11 Figure 11.12 Figure 11.13 Figure 11.14 Figure 11.15 Figure 11.16 Figure 11.17 Figure 11.18 Figure 11.19 Figure 11.20 Figure 11.21 Figure 11.22 Figure 11.23 Figure 11.24 Figure 11.25 6 84-Ball Fine-Pitch Ball Grid Array, 512, 256 & 128 Mb . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VBH084--84-ball Fine-Pitch Ball Grid Array, 11.6 x 8 mm MCP Compatible Package. . . . . Synchronous/Asynchronous State Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Synchronous Read Flow Chart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Single Word Program. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Buffer Programming Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Sector Erase Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Write Operation Status Flowchart . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Advanced Sector Protection/Unprotection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PPB Program/Erase Algorithm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Lock Register Program Algorithm . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Maximum Negative Overshoot Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Maximum Positive Overshoot Waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Test Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Input Waveforms and Measurement Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VCC Power-up Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CLK Characterization. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-Word Linear Synchronous Single Data Rate Burst with Wrap Around . . . . . . . . . . . . . . . . 8-word Linear Single Data Read Synchronous Burst without Wrap Around . . . . . . . . . . . . . Asynchronous Read Mode (AVD# Toggling - Case 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Asynchronous Read Mode (AVD# Toggling - Case 2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Asynchronous Read Mode (AVD# Toggling - Case 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Asynchronous Read Mode (AVD# tied to CE#) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Asynchronous Page Mode Read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Reset Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Asynchronous Program Operation Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Synchronous Program Operation Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Chip/Sector Erase Command Sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Accelerated Unlock Bypass Programming Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Data# Polling Timings (During Embedded Algorithm) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Toggle Bit Timings (During Embedded Algorithm). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Synchronous Data Polling Timings/Toggle Bit Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . DQ2 vs. DQ6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Latency with Boundary Crossing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Wait State Configuration Register Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Back-to-Back Read/Write Cycle Timings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . S29WS-P 12 13 28 29 35 39 42 48 54 57 60 66 66 68 68 69 69 71 71 72 73 73 74 74 75 77 77 78 78 79 79 80 80 81 81 82 S29WS-P_00_A12 January 28, 2008 Data She et Tables Table 2.1 Table 6.1 Table 6.2 Table 6.3 Table 7.1 Table 7.2 Table 7.3 Table 7.4 Table 7.5 Table 7.6 Table 7.7 Table 7.8 Table 7.9 Table 7.10 Table 7.11 Table 7.12 Table 7.13 Table 7.14 Table 7.15 Table 7.16 Table 7.17 Table 7.18 Table 7.19 Table 7.20 Table 7.21 Table 7.22 Table 7.23 Table 7.24 Table 7.25 Table 7.26 Table 7.27 Table 7.28 Table 7.29 Table 7.30 Table 7.31 Table 7.32 Table 7.33 Table 7.34 Table 7.35 Table 7.36 Table 7.37 Table 7.38 Table 7.39 Table 7.40 Table 7.41 Table 7.42 Table 7.43 Table 7.44 Table 7.45 Table 7.46 Table 7.47 Table 7.48 Table 8.1 Table 8.2 Input/Output Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .10 S29WS512P Sector & Memory Address Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 S29WS256P Sector & Memory Address Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17 S29WS128P Sector & Memory Address Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18 Device Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 Page Select . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 Address Latency for 11 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 Address Latency for 10 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Address Latency for 09 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Address Latency for 8 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Address Latency for 7 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .21 Address Latency for 6 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22 Address Latency for 5 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22 Address Latency for 4 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22 Address Latency for 3 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .22 Address Latency for 11 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 Address Latency for 10 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 Address Latency for 9 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 Address Latency for 8 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .23 Address Latency for 7 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 Address Latency for 6 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 Address Latency for 5 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 Address Latency for 4 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 Address Latency for 3 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25 Address Latency for 11 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25 Address Latency for 10 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25 Address Latency for 9 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .25 Address Latency for 8 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26 Address Latency for 7 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26 Address Latency for 6 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26 Address Latency for 5 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .26 Address Latency for 4 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27 Address Latency for 3 Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27 Burst Address Groups . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30 Configuration Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31 Autoselect Addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32 Autoselect Entry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33 Autoselect Exit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33 Single Word Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36 Write Buffer Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .37 Program Suspend . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 Program Resume . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .40 Sector Erase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .41 Chip Erase . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .43 Erase Suspend . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 Erase Resume . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .44 Unlock Bypass Entry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46 Unlock Bypass Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46 Unlock Bypass Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46 DQ6 and DQ2 Indications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .49 Write Operation Status . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .51 Reset (LLD Function = lld_ResetCmd) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .52 Sector Protection Schemes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55 Lock Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .55 January 28, 2008 S29WS-P_00_A12 S29WS-P 7 D at a Table 8.3 Table 8.4 Table 8.5 Table 10.1 Table 10.2 Table 10.3 Table 10.4 Table 11.1 Table 11.2 Table 11.3 Table 11.4 Table 11.5 Table 11.6 Table 11.7 Table 12.1 Table 12.2 Table 12.3 Table 12.4 Table 12.5 Table 12.6 8 S hee t S29WS512P Sector Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61 S29WS256P Sector Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61 S29WS128P Sector Protection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .61 Secured Silicon Sector Addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .63 Secured Silicon Sector Entry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .64 Secured Silicon Sector Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65 Secured Silicon Sector Exit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .65 CMOS Compatible . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .67 Test Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68 VCC Power-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68 Non-Continuous Burst Mode with Wrap Around Burst Mode. . . . . . . . . . . . . . . . . . . . . . . . . .70 Continuous Burst Mode with No Wrap Around Burst Mode. . . . . . . . . . . . . . . . . . . . . . . . . . .70 Hardware Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .75 Example of Programmable Wait States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .82 Memory Array Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .84 Sector Protection Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .86 CFI Query Identification String . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88 System Interface String . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .88 Device Geometry Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .89 Primary Vendor-Specific Extended Query . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .90 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 1. She et Ordering Information The ordering part number is formed by a valid combination of the following: S29WS 512 P xx BA W 00 0 Packing Type 0 = Tray (standard; see note 1) 2 = 7-inch Tape and Reel 3 = 13-inch Tape and Reel Model Number (Chip Enable Options) 00 = Default Temperature Range W = Wireless (-25C to +85C) Package Type And Material BA = Very Thin Fine-Pitch BGA, Lead (Pb)-free Compliant Package BF = Very Thin Fine-Pitch BGA, Lead (Pb)-free Package Speed Option (Burst Frequency) 0L = 54 MHz 0P = 66 MHz 0S = 80 MHz AB = 104 MHz Process Technology P = 90 nm MirrorBit(R)Technology Flash Density 512= 512 Mb 256= 256 Mb 128= 128 Mb Device Family S29WS =1.8 Volt-only Simultaneous Read/Write, Burst Mode Flash Memory 1.1 Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult your local sales office to confirm availability of specific valid combinations and to check on newly released combinations. S29WS512P Valid Combinations (Notes 1, 2) Base Ordering Part Number Product Status Speed Option Package Type, Material, & Temperature Range 0L, 0P, 0S, AB BAW (Lead (Pb)-free Compliant), BFW (Lead (Pb)-free) Packing Type Model Numbers 11.6 mm x 8 mm 84-ball MCP-Compatible S29WS512P S29WS256P Advance 0, 2, 3 (Note 1) S29WS128P Package Type (Note 2) 00 11.6 mm x 8 mm 84-ball MCP-Compatible Notes: 1. Type 0 is standard. Specify other options as required. 2. BGA package marking omits leading S29 and packing type designator from ordering part number. January 28, 2008 S29WS-P_00_A12 S29WS-P 9 D at a 2. S hee t Input/Output Descriptions & Logic Symbol Table identifies the input and output package connections provided on the device. Table 2.1 Input/Output Descriptions Symbol AMAX-A0 Type Description Input Address lines (Amax = 24 for WS512P 1CE# option, 23 for WS512P 2CE# option, 23 for WS256P, and 22 for WS128P) DQ15-DQ0 I/O CE# Input Chip Enable. Asynchronous relative to CLK. Data input/output. OE# Input Output Enable. Asynchronous relative to CLK. WE# Input Write Enable. VCC Supply Device Power Supply VCCQ Supply Device Input/Output Power Supply (Must be ramped simultaneously with VCC) VSS Supply Ground. NC No Connect RDY Output CLK Input Not connected internally. Ready. Indicates when valid burst data is ready to be read. Clock Input. In burst mode, after the initial word is output, subsequent active edges of CLK increment the internal address counter. Should be at VIL or VIH while in asynchronous mode. Address Valid. Indicates to device that the valid address is present on the address inputs. When low during asynchronous mode, indicates valid address; when low during burst mode, causes starting address to be latched at the next active clock edge. AVD# Input RESET# Input Hardware Reset. Low = device resets and returns to reading array data. WP# Input Write Protect. At VIL, disables program and erase functions in the four outermost sectors. Should be at VIH for all other conditions. ACC Input Acceleration Input. At VHH, accelerates programming; automatically places device in unlock bypass mode. At VIL, disables all program and erase functions. Should be at VIH for all other conditions. RFU Reserved When high, device ignores address inputs. 10 Reserved for future use (see MCP look-ahead pinout for use with MCP). S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et 3. Block Diagrams Bank Address Bank 0 Latches and Control Logic VSS VCCQ Y-Decoder VCC DQ15-DQ0 AMAX-A0 X-Decoder OE# WP# ACC RESET# WE# CEx# AVD# RDY Bank 1 Latches and Control Logic Y-Decoder Bank Address DQ15-DQ0 X-Decoder AMAX-A0 STATE CONTROL & COMMAND REGISTER DQ15-DQ0 Status Control AMAX-A0 DQ15-DQ0 Bank (n-1) Latches and Control Logic Bank Address AMAX-A0 Y-Decoder X-Decoder DQ15-DQ0 Bank (n) Latches and Control Logic Bank Address Y-Decoder X-Decoder DQ15-DQ0 Notes: 1. AMAX-A0 = A24-A0 for the WS512P, A23-A0 for the WS256P, and A22-A0 for the WS128P. 2. n = 15 for WS512P / WS256P / WS128P. 4. Physical Dimensions/Connection Diagrams This section shows the I/O designations and package specifications for the S29WS-P. 4.1 Related Documents The following documents contain information relating to the S29WS-P devices. Click on the title or go to www.spansion.com to download the PDF file, or request a copy from your sales office. Considerations for X-ray Inspection of Surface-Mounted Flash Integrated Circuits 4.2 Special Handling Instructions for FBGA Package Special handling is required for Flash Memory products in FBGA packages. Flash memory devices in FBGA packages may be damaged if exposed to ultrasonic cleaning methods. The package and/or data integrity may be compromised if the package body is exposed to temperatures above 150C for prolonged periods of time. January 28, 2008 S29WS-P_00_A12 S29WS-P 11 D at a S hee t Figure 4.1 84-Ball Fine-Pitch Ball Grid Array, 512, 256 & 128 Mb (Top View, Balls Facing Down, MCP Compatible) A1 A10 NC NC B2 B3 B4 B5 B6 B7 B8 B9 AVD# VSS CLK RFU VCC RFU RFU RFU C2 C3 C4 C5 C6 C7 C8 C9 WP# A7 RFU ACC WE# A8 A11 RFU D2 D3 D4 D5 D6 D7 D8 D9 A3 A6 RFU RESET# RFU A19 A12 A15 E2 E3 E4 A2 A5 A18 E5 E6 E7 E8 E9 RDY A20 A9 A13 A21 F2 F3 F4 F5 F6 F7 F8 F9 A1 A4 A17 RFU A23 A10 A14 A22 Legend Reserved for Future Use Do Not Use Ground G2 G3 G4 G5 G6 G7 G8 G9 A0 VSS DQ1 RFU RFU DQ6 A24 A16 H2 H3 H4 H5 H6 H7 H8 H2 F-CE# OE# DQ9 DQ3 DQ4 DQ13 DQ15 RFU J2 J3 J4 J5 J6 J7 J8 J9 RFU DQ0 DQ10 VCC RFU DQ12 DQ7 VSS K2 K3 K4 K5 K6 K7 K8 K9 RFU DQ8 DQ2 DQ11 RFU DQ5 DQ14 RFU L2 L3 L4 L5 L6 L7 L8 L9 VCCQ RFU RFU RFU VSS VCC RFU RFU Power M1 M10 NC NC Notes: 1. Balls F6 and G8 are RFU on the WS128P. 2. Ball G8 is RFU on the WS256P. 3. VCC pins must ramp simultaneously. 12 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 4.2 VBH084--84-ball Fine-Pitch Ball Grid Array, 11.6 x 8 mm MCP Compatible Package 0.05 C (2X) D D1 A e 10 9 e 7 8 SE 7 6 E1 E 5 4 3 2 1 M A1 CORNER INDEX MARK L K J H G F B 10 SD 6 0.05 C (2X) E D C B A A1 CORNER 7 NXb 0.08 M C TOP VIEW 0.15 M C A B BOTTOM VIEW 0.10 C A2 A A1 C 0.08 C SEATING PLANE SIDE VIEW NOTES: PACKAGE VBH 084 JEDEC 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. N/A 2. ALL DIMENSIONS ARE IN MILLIMETERS. 11.60 mm x 8.00 mm NOM PACKAGE SYMBOL MIN NOM MAX A --- --- 1.00 A1 0.18 --- --- A2 0.62 --- 0.76 D 11.60 BSC. 3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010 (EXCEPT AS NOTED). NOTE OVERALL THICKNESS BALL HEIGHT N IS THE TOTAL NUMBER OF SOLDER BALLS. 8.00 BSC. BODY SIZE 8.80 BSC. BALL FOOTPRINT E1 7.20 BSC. MD 12 ROW MATRIX SIZE D DIRECTION ME 10 ROW MATRIX SIZE E DIRECTION N 84 --- BALL FOOTPRINT TOTAL BALL COUNT 0.43 BALL DIAMETER e 0.80 BSC. BALL PITCH SD / SE 0.40 BSC. SOLDER BALL PLACEMENT (A2-A9, B10-L10, M2-M9, B1-L1) SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE "E" DIRECTION. BODY SIZE E 0.33 e REPRESENTS THE SOLDER BALL GRID PITCH. 5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE "D" DIRECTION. BODY THICKNESS D1 b 4. DEPOPULATED SOLDER BALLS 6 DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL DIAMETER IN A PLANE PARALLEL TO DATUM C. 7 SD AND SE ARE MEASURED WITH RESPECT TO DATUMS A AND B AND DEFINE THE POSITION OF THE CENTER SOLDER BALL IN THE OUTER ROW. WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN THE OUTER ROW PARALLEL TO THE D OR E DIMENSION, RESPECTIVELY, SD OR SE = 0.000. WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN THE OUTER ROW, SD OR SE = e/2 8. NOT USED. 9. "+" INDICATES THE THEORETICAL CENTER OF DEPOPULATED BALLS. 10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, LASER OR INK MARK, METALLIZED MARK INDENTATION OR OTHER MEANS. 3339 \ 16-038.25b Note: BSC is an ANSI standard for Basic Space Centering. 4.3 MCP Look-ahead Connection Diagram Spansion Inc. provides this standard look-ahead connection diagram that supports NOR Flash and SRAM densities up to 4 Gigabits NOR Flash and pSRAM densities up to 4 Gigabits NOR Flash and pSRAM and data storage densities up to 4 Gigabits The physical package outline may vary between connection diagrams and densities. The connection diagram for any MCP, however, is a subset of the pinout. January 28, 2008 S29WS-P_00_A12 S29WS-P 13 D at a S hee t In some cases, outrigger balls may exist in locations outside the grid shown. These outrigger balls are reserved; do not connect them to any other signal. For further information about the MCP look-ahead pinout, refer to the Design-In Scalable Wireless Solutions with Spansion Products application note (publication number: Design_Scalable_Wireless_AN), available on the web or through a Spansion sales office. 14 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 5. She et Additional Resources Visit www.spansion.com to obtain the following related documents: Application Notes Using the Operation Status Bits in AMD Devices Understanding Burst Mode Flash Memory Devices Simultaneous Read/Write vs. Erase Suspend/Resume MirrorBit(R) Flash Memory Write Buffer Programming and Page Buffer Read Design-In Scalable Wireless Solutions with Spansion Products Common Flash Interface Version 1.4 Vendor Specific Extensions Specification Bulletins Contact your local sales office for details. Drivers and Software Support Spansion low-level drivers True Flash File System CAD Modeling Support VHDL and Verilog IBIS ORCAD(R) Schematic Symbols Technical Support Contact your local sales office or contact Spansion Inc. directly for additional technical support: http://www.spansion.com/flash_memory_products/support/ses/index.html Spansion Inc. Locations 915 DeGuigne Drive, P.O. Box 3453 Sunnyvale, CA 94088-3453, USA Telephone: 408-962-2500 or 1-866-SPANSION Spansion Japan Limited Cube-Kawasaki 9F/10F, 1-14 Nisshin-cho, Kawasaki-ku, Kawasaki-shi, Kanagawa, 210-0024, Japan Phone: 044-223-1700 (active from Nov.28th) http://www.spansion.com January 28, 2008 S29WS-P_00_A12 S29WS-P 15 D at a 6. S hee t Product Overview The S29WS-P family consists of 512, 256, and 128 Mbit, 1.8 volts-only, simultaneous read/write burst mode Flash device optimized for today's wireless designs that demand a large storage array, rich functionality, and low power consumption. These devices are organized in 32, 16, or 8 Mwords of 16 bits each and are capable of continuous, synchronous (burst) read or linear read (8-, 16-, or 32-word aligned group) with or without wrap around. These products also offer single word programming or a 32-word buffer for programming with program/erase and suspend functionality. Additional features include: Advanced Sector Protection methods for protecting sectors as required 256 words of Secured Silicon area for storing customer and factory secured information. The Secured Silicon Sector is One Time Programmable. 6.1 Memory Map The S29WS512/256/128P Mbit devices consist of 16 banks organized as shown in Tables 6.1-6.3. Table 6.1 S29WS512P Sector & Memory Address Map Bank Size Sector Count Sector Size (KB) Bank Sector/ Sector Range Address Range 32 SA000 000000h-003FFFh 32 SA001 004000h-007FFFh 32 SA002 008000h-00BFFFh SA003 00C000h-00FFFFh SA004 010000h-01FFFFh 4 4 MB 32 0 ... ... ... 128 31 SA034 1F0000h-1FFFFFh 4 MB 32 128 1 SA035-SA066 200000h-3FFFFFh 4 MB 32 128 2 SA067-SA098 4 MB 32 128 3 SA099-SA130 4 MB 32 128 4 SA131-SA162 4 MB 32 128 5 SA163-SA194 32 128 6 SA195-SA226 ... ... ... ... 4 MB 32 128 7 SA227-SA258 E00000h-FFFFFFh 4 MB 32 128 8 SA259-SA290 1000000-11FFFFF 4 MB 32 128 9 SA291-SA322 4 MB 32 128 10 SA323-SA354 4 MB 32 128 11 SA355-SA386 4 MB 32 128 12 SA387-SA418 4 MB 32 128 13 SA419-SA450 4 MB 32 128 14 SA451-SA482 1C00000h-1DFFFFFh SA483 1E00000h-1E0FFFFh 31 ... 4 MB ... ... ... ... ... 128 128 SA513 4 MB 15 4 1FE0000h-1FEFFFFh SA514 1FF0000h-1FF3FFFh SA515 1FF4000h-1FF7FFFh SA516 1FF8000h-1FFBFFFh SA517 1FFC000h-1FFFFFFh 32 Notes Sector Starting Address - Sector Ending Address Sector Starting Address - Sector Ending Address (see note) First Sector, Starting Address - Last Sector, Ending Address (see note) Sector Starting Address - Sector Ending Address (see note) Sector Starting Address - Sector Ending Address Note This table has been condensed to show sector-related information for an entire device on a single page. Sectors and their address ranges that are not explicitly listed (such as SA005-SA033) have sector starting and ending addresses that form the same pattern as all other sectors of that size. For example, all 128 KB sectors have the pattern xx00000h-xxFFFFh. 16 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 6.2 S29WS256P Sector & Memory Address Map Bank Size Sector Count 4 Sector Size (KB) Bank Sector/ Sector Range Address Range SA000 000000h-003FFFh SA001 004000h-007FFFh SA002 008000h-00BFFFh 32 2 MB 0 SA003 00C000h-00FFFFh SA004 to SA018 010000h-01FFFFh to 0F0000h-0FFFFFh 1 SA019 to SA034 100000h-10FFFFh to 1F0000h-1FFFFFh 2 SA035 to SA050 200000h-20FFFFh to 2F0000h-2FFFFFh 128 3 SA051 to SA066 300000h-30FFFFh to 3F0000h-3FFFFFh 128 4 SA067 to SA082 400000h-40FFFFh to 4F0000h-4FFFFFh 16 128 5 SA083 to SA098 500000h-50FFFFh to 5F0000h-5FFFFFh 2 MB 16 128 6 SA099 to SA114 600000h-60FFFFh to 6F0000h-6FFFFFh 2 MB 16 128 7 SA115 to SA130 700000h-70FFFFh to 7F0000h-7FFFFFh 2 MB 16 128 8 SA131 to SA146 800000h-80FFFFh to 8F0000h-8FFFFFh 2 MB 16 128 9 SA147 to SA162 900000h-90FFFFh to 9F0000h-9FFFFFh 2 MB 16 128 10 SA163 to SA178 A00000h-A0FFFFh to AF0000h-AFFFFFh 15 128 2 MB 16 128 2 MB 16 128 2 MB 16 2 MB 16 2 MB 2 MB 16 128 11 SA179 to SA194 B00000h-B0FFFFh to BF0000h-BFFFFFh 2 MB 16 128 12 SA195 to SA210 C00000h-C0FFFFh to CF0000h-CFFFFFh 2 MB 16 128 13 SA211 to SA226 D00000h-D0FFFFh to DF0000h-DFFFFFh 2 MB 16 128 14 SA227 to SA242 E00000h-E0FFFFh to EF0000h-EFFFFFh 15 128 SA243 to SA257 F00000h-F0FFFFh to FE0000h-FEFFFFh SA258 FF0000h-FF3FFFh 2 MB 15 4 SA259 FF4000h-FF7FFFh SA260 FF8000h-FFBFFFh SA261 FFC000h-FFFFFFh 32 Notes Contains four smaller sectors at bottom of addressable memory. All 128 KB sectors. Pattern for sector address range is xx0000h-xxFFFFh. (see note) Contains four smaller sectors at top of addressable memory. Note This table has been condensed to show sector-related information for an entire device on a single page. Sectors and their address ranges that are not explicitly listed (such as SA005-SA017) have sector starting and ending addresses that form the same pattern as all other sectors of that size. For example, all 128 KB sectors have the pattern xx00000h-xxFFFFh. January 28, 2008 S29WS-P_00_A12 S29WS-P 17 D at a S hee t Table 6.3 S29WS128P Sector & Memory Address Map Bank Size Sector Count Sector Size (KB) Bank 32 32 Sector/ Sector Range Address Range SA000 000000h-003FFFh Notes SA001 004000h-007FFFh SA002 008000h-00BFFFh 4 32 1 MB 0 32 SA003 00C000h-00FFFFh 7 128 SA004 to SA010 010000h-01FFFFh to 070000h-07FFFFh 1 MB 8 128 1 SA011 to SA018 080000h-08FFFFh to 0F0000h-0FFFFFh 1 MB 8 128 2 SA019 to SA026 100000h-10FFFFh to 170000h-17FFFFh 1 MB 8 128 3 SA027 to SA034 180000h-18FFFFh to 1F0000h-1FFFFFh 1 MB 8 128 4 SA035 to SA042 200000h-20FFFFh to 270000h-27FFFFh 1 MB 8 128 5 SA043 to SA050 280000h-28FFFFh to 2F0000h-2FFFFFh 1 MB 8 128 6 SA051 to SA058 300000h-30FFFFh to 370000h-37FFFFh 1 MB 8 128 7 SA059 to SA066 380000h-38FFFFh to 3F0000h-3FFFFFh 1 MB 8 128 8 SA067 to SA074 400000h-40FFFFh to 470000h-47FFFFh 1 MB 8 128 9 SA075 to SA082 480000h-48FFFFh to 4F0000h-4FFFFFh 1 MB 8 128 10 SA083 to SA090 500000h-50FFFFh to 570000h-57FFFFh 1 MB 8 128 11 SA091 to SA098 580000h-58FFFFh to 5F0000h-5FFFFFh 1 MB 8 128 12 SA099 to SA106 600000h-60FFFFh to 670000h-67FFFFh 1 MB 8 128 13 SA107 to SA114 680000h-68FFFFh to 6F0000h-6FFFFFh 1 MB 8 128 14 SA115 to SA122 700000h-70FFFFh to 770000h-77FFFFh 7 128 SA123 to SA129 780000h-78FFFFh to 7E0000h-7EFFFFh 32 SA130 7F0000h-7F3FFFh 32 1 MB SA131 7F4000h-7F7FFFh 32 SA132 7F8000h-7FBFFFh 32 SA133 7FC000h-7FFFFFh 15 4 Contains four smaller sectors at bottom of addressable memory. All 128 KB sectors. Pattern for sector address range is xx0000h-xxFFFFh. (see note) Contains four smaller sectors at top of addressable memory. Note: This table has been condensed to show sector-related information for an entire device on a single page. Sectors and their address ranges that are not explicitly listed (such as SA005-SA009) have sector starting and ending addresses that form the same pattern as all other sectors of that size. For example, all 128 KB sectors have the pattern xx00000h-xxFFFFh. 7. Device Operations This section describes the read, program, erase, simultaneous read/write operations, handshaking, and reset features of the Flash devices. Operations are initiated by writing specific commands or a sequence with specific address and data patterns into the command registers (see Table 12.1 on page 84 and Table 12.2 on page 86). The command register itself does not occupy any addressable memory location; rather, it is composed of latches that store the commands, along with the address and data information needed to execute the command. The contents of the register serve as input to the internal state machine and the state machine outputs dictate the function of the device. Writing incorrect address and data values or writing them in an improper sequence may place the device in an unknown state, in which case the system must write the reset command to return the device to the reading array data mode. 18 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.1 She et Device Operation Table The device must be setup appropriately for each operation. Table 7.1 describes the required state of each control pin for any particular operation. Table 7.1 Device Operations Operation CE# OE# WE# CLK Asynchronous Read - Addresses Latched L L H X Asynchronous Read AVD# Steady State L L H X Asynchronous Write L H X L H L H X X X X X X X Latch Starting Burst Address by CLK L X Advance Burst read to next address L Terminate current Burst read cycle Terminate current Burst read cycle via RESET# Terminate current Burst read cycle and start new Burst read cycle Synchronous Write Standby (CE#) Hardware Reset AVD# Amax-A0 DQ15-0 RDY RESET# Addr In Output Valid H H L Addr In Output Valid H H L Addr In Input Valid H H Addr In I/O H H X X HIGH Z HIGH Z H X X HIGH Z HIGH Z H L Addr In Output Invalid X H L H H X Output Valid H H H X H X X X HIGH Z HIGH Z H X X H X X X HIGH Z HIGH Z L L X H Addr In Output Invalid X H Burst Read Operations Legend: L = Logic 0, H = Logic 1, X = can be either VIL or VIH., = rising edge, = high to low, = toggle. Note: Address is latched on the rising edge of clock. 7.2 Asynchronous Read All memories require access time to output array data. In an asynchronous read operation, data is read from one memory location at a time. Addresses are presented to the device in random order, and the propagation delay through the device causes the data on its outputs to arrive asynchronously with the address on its inputs. The device defaults to reading array data asynchronously after device power-up or hardware reset. To read data from the memory array, the system must first assert a valid address on Amax-A0, while driving AVD# and CE# to VIL. WE# must remain at VIH. The rising edge of AVD# latches the address, preventing changes to the address lines from effecting the address being accessed.. Data is output on DQ15-DQ0 pins after the access time (tACC) has elapsed from the falling edge of AVD#, or the last time the address lines changed while AVD# was low. January 28, 2008 S29WS-P_00_A12 S29WS-P 19 D at a 7.3 S hee t Page Mode Read The device is capable of fast page mode read. This mode provides fast (tPACC) random read access speed for locations within a page. Address bits Amax-A3 select an 8 word page, and address bits A2-A0 select a specific word within that page. This is an asynchronous operation with the microprocessor supplying the specific word location. It does not matter if AVD# stays low or toggles. However, the address input must be always valid and stable if AVD# is low during the page read. The random or initial page access is tACC or tCE (depending on how the device was accessed) and subsequent page read accesses (as long as the locations specified by the microprocessor falls within that page) is equivalent to tPACC. When CE# is deasserted (=VIH), the reassertion of CE# for subsequent access has access time of tCE. Here again, CE# selects the device and OE# is the output control and should be used to gate data to the output inputs if the device is selected. Fast page mode accesses are obtained by keeping Amax-A3 constant and changing A2-A0 to select the specific word within that page. Table 7.2 Page Select 7.4 Word A2 A1 A0 Word 0 0 0 0 Word 1 0 0 1 Word 2 0 1 0 Word 3 0 1 1 Word 4 1 0 0 Word 5 1 0 1 Word 6 1 1 0 Word 7 1 1 1 Synchronous (Burst) Read Operation The device is capable of continuous sequential burst operation and linear burst operation of a preset length. When the device first powers up, it is enabled for asynchronous read operations and can be automatically enabled for burst mode. To enter into synchronous mode, the configuration register will need to be set. Prior to entering burst mode, the system should determine how many wait states are desired for the initial word (tIACC) of each burst access, what mode of burst operation is desired and how the RDY signal will transition with valid data. The system would then write the configuration register command sequence. Once the system has written the Set Configuration Register command sequence, the device is enabled for synchronous reads only. The data is output tIACC after the rising edge of the first CLK. Subsequent words are output tBACC after the rising edge of each successive clock cycle, which automatically increments the internal address counter. Note that data is output only at the rising edge of the clock. RDY indicates the initial latency. 7.4.1 Latency Tables for Variable Wait State The following tables show the latency for variable wait state in a continuous Burst operation Table 7.3 Address Latency for 11 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 1 D1 D2 D3 D4 D5 D6 D7 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 2 D2 D3 D4 D5 D6 D7 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 3 D3 D4 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 D4 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 11 ws 4 20 5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 2 ws D0 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 7.4 Address Latency for 10 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 1 D1 D2 D3 D4 D5 D6 D7 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 2 D2 D3 D4 D5 D6 D7 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 3 D3 D4 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 4 D4 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 1 ws D0 10 ws Table 7.5 Address Latency for 09 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 ... D124 D125 D126 D127 D0 1 D1 D2 D3 D4 D5 D6 D7 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 2 D2 D3 D4 D5 D6 D7 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 3 D3 D4 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 4 D4 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 ... D124 D125 D126 D127 D0 9 ws Table 7.6 Address Latency for 8 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 1 ws D8 D9 3 D3 D4 D5 D6 D7 1 ws 1 ws D8 D9 4 D4 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D8 8 ws Table 7.7 Address Latency for 7 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 D8 D9 D10 3 D3 D4 D5 D6 D7 1 ws D8 D9 D10 4 D4 D5 D6 D7 1 ws 1 ws D8 D9 D10 5 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 6 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 7 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10 7 ws January 28, 2008 S29WS-P_00_A12 S29WS-P 21 D at a S hee t Table 7.8 Address Latency for 6 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 D8 D9 D10 3 D3 D4 D5 D6 D7 D8 D9 D10 D11 4 D4 D5 D6 D7 1 ws D8 D9 D10 D11 5 D5 D6 D7 1 ws 1 ws D8 D9 D10 D11 6 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 D11 7 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 D11 D8 6 ws Table 7.9 Address Latency for 5 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 D8 D9 D10 3 D3 D4 D5 D6 D7 D8 D9 D10 D11 4 D4 D5 D6 D7 D8 D9 D10 D11 D12 5 D5 D6 D7 1 ws D8 D9 D10 D11 D12 6 D6 D7 1 ws 1 ws D8 D9 D10 D11 D12 7 D7 1 ws 1 ws 1 ws D8 D9 D10 D11 D12 5 ws Table 7.10 Address Latency for 4 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 D8 D9 D10 3 D3 D4 D5 D6 D7 D8 D9 D10 D11 4 D4 D5 D6 D7 D8 D9 D10 D11 D12 5 D5 D6 D7 D8 D9 D10 D11 D12 D13 4 ws 6 D6 D7 1 ws D8 D9 D10 D11 D12 D13 7 D7 1 ws 1 ws D8 D9 D10 D11 D12 D13 Table 7.11 Address Latency for 3 Wait States Word Initial Wait 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 1 D1 D2 D3 D4 D5 D6 D7 D8 D9 2 D2 D3 D4 D5 D6 D7 D8 D9 D10 3 D3 D4 D5 D6 D7 D8 D9 D10 D11 4 D4 D5 D6 D7 D8 D9 D10 D11 D12 5 D5 D6 D7 D8 D9 D10 D11 D12 D13 6 D6 D7 D8 D9 D10 D11 D12 D13 D14 7 D7 1 ws D8 D9 D10 D11 D12 D13 D14 3 ws 22 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.4.2 She et Latency for Boundary Crossing during First Read The following tables show the latency at End of Word Line for boundary corssing during First Read in continuous burst operation Table 7.12 Address Latency for 11 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 1 D121 D122 D123 D124 D125 D126 D127 1 ws 2 ws D0 2 D122 D123 D124 D125 D126 D127 1 ws 1 ws 2 ws D0 3 D123 D124 D125 D126 D127 1 ws 1 ws 1 ws 2 ws D0 4 D124 D125 D126 D127 1 ws 1 ws 1 ws 1 ws 2 ws D0 5 D125 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws 2 ws D0 6 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 2 ws D0 7 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 2 ws D0 11 ws Table 7.13 Address Latency for 10 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 1 D121 D122 D123 D124 D125 D126 D127 1 ws 1 ws D0 2 D122 D123 D124 D125 D126 D127 1 ws 1 ws 1 ws D0 3 D123 D124 D125 D126 D127 1 ws 1 ws 1 ws 1 ws D0 4 D124 D125 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws D0 5 D125 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 6 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 7 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 10 ws Table 7.14 Address Latency for 9 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D121 D122 D123 D124 D125 D126 D127 1 ws D0 2 D122 D123 D124 D125 D126 D127 1 ws 1 ws D0 3 D123 D124 D125 D126 D127 1 ws 1 ws 1 ws D0 4 D124 D125 D126 D127 1 ws 1 ws 1 ws 1 ws D0 5 D125 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws D0 6 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 7 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 9 ws Table 7.15 Address Latency for 8 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 1 ws D0 D1 3 D123 D124 D125 D126 D127 1 ws 1 ws D0 D1 4 D124 D125 D126 D127 1 ws 1 ws 1 ws D0 D1 5 D125 D126 D127 1 ws 1 ws 1 ws 1 ws D0 D1 6 D126 D127 1 ws 1 ws 1 ws 1 ws 1 ws D0 D1 7 D127 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D0 D1 8 ws January 28, 2008 S29WS-P_00_A12 S29WS-P 23 D at a S hee t Table 7.16 Address Latency for 7 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 D0 D1 D2 D123 D124 D125 D126 D127 1 ws D0 D1 D2 4 D124 D125 D126 D127 1 ws 1 ws D0 D1 D2 5 D125 D126 D127 1 ws 1 ws 1 ws D0 D1 D2 6 D126 D127 1 ws 1 ws 1 ws 1 ws D0 D1 D2 7 D127 1 ws 1 ws 1 ws 1 ws 1 ws D0 D1 D2 D125 D126 D127 D0 3 D0 7 ws Table 7.17 Address Latency for 6 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 D0 D1 D2 3 D123 D124 D125 D126 D127 D0 D1 D2 D3 D124 D125 D126 D127 1 ws D0 D1 D2 D3 6 ws 4 5 D125 D126 D127 1 ws 1 ws D0 D1 D2 D3 6 D126 D127 1 ws 1 ws 1 ws D0 D1 D2 D3 7 D127 1 ws 1 ws 1 ws 1 ws D0 D1 D2 D3 Table 7.18 Address Latency for 5 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 D0 D1 D2 3 D123 D124 D125 D126 D127 D0 D1 D2 D3 4 D124 D125 D126 D127 D0 D1 D2 D3 D4 5 D125 D126 D127 1 ws D0 D1 D2 D3 D4 6 D126 D127 1 ws 1 ws D0 D1 D2 D3 D4 7 D127 1 ws 1 ws 1 ws D0 D1 D2 D3 D4 5 ws Table 7.19 Address Latency for 4 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 D0 D1 D2 3 D123 D124 D125 D126 D127 D0 D1 D2 D3 4 D124 D125 D126 D127 D0 D1 D2 D3 D4 5 D125 D126 D127 D0 D1 D2 D3 D12 D5 6 D126 D127 1 ws D0 D1 D2 D3 D12 D5 7 D127 1 ws 1 ws D0 D1 D2 D3 D12 D5 4 ws 24 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 7.20 Address Latency for 3 Wait States Word Initial Wait 0 D120 D121 D122 D123 D124 D125 D126 D127 1 D121 D122 D123 D124 D125 D126 D127 D0 D1 2 D122 D123 D124 D125 D126 D127 D0 D1 D2 D123 D124 D125 D126 D127 D0 D1 D2 D3 D4 3 D0 3 ws 7.4.3 4 D124 D125 D126 D127 D0 D1 D2 D3 5 D125 D126 D127 D0 D1 D2 D3 D4 D5 6 D126 D127 D0 D1 D2 D3 D4 D5 D6 7 D127 1 ws D0 D1 D2 D3 D4 D5 D6 Latency at End of Word Line for Boundary Crossing After Second Read in Continuous Burst Operation The following tables show the latency for boundary crossing after Second Read in a continuous Burst operation. Table 7.21 Address Latency for 11 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 1 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 2 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 3 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 4 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 5 D117 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 6 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 7 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 2 ws D0 11 ws Table 7.22 Address Latency for 10 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 1 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 2 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 3 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 4 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 5 D117 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 6 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 7 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 1 ws D0 10 ws Table 7.23 Address Latency for 9 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D117 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 9 ws January 28, 2008 S29WS-P_00_A12 S29WS-P 25 D at a S hee t Table 7.24 Address Latency for 8 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D117 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 8 ws Table 7.25 Address Latency for 7 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D117 D118 D119 1 ws 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 ws Table 7.26 Address Latency for 6 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D116 D117 D118 D119 1 ws 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 ws Table 7.27 Address Latency for 5 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D115 D116 D117 D118 D119 1 ws 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 5 ws 26 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 7.28 Address Latency for 4 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D114 D115 D116 D117 D118 D119 1 ws 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 4 ws Table 7.29 Address Latency for 3 Wait States Word Initial Wait 0 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 1 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 2 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 3 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 4 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 5 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 6 D112 D113 D114 D115 D116 D117 D118 D119 D120 D121 D122 D123 D124 D125 D126 D127 D0 7 D113 D114 D115 D116 D117 D118 D119 1 ws D120 D121 D122 D123 D124 D125 D126 D127 D0 4 ws January 28, 2008 S29WS-P_00_A12 S29WS-P 27 D at a 7.5 S hee t Synchronous (Burst) Read Mode & Configuration Register See Configuration Registers on page 31, and Table 12.1, Memory Array Commands on page 84, for further details. Figure 7.1 Synchronous/Asynchronous State Diagram Power-up/ Hardware Reset Asynchronous Read Mode Only Set Burst Mode Configuration Register Command for Synchronous Mode (CR15 = 0) Set Burst Mode Configuration Register Command for Asynchronous Mode (CR15 = 1) Synchronous Read Mode Only 28 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 7.2 Synchronous Read Flow Chart Note: Setup Configuration Register parameters Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Write Set Configuration Register Command and Settings: Address 555h, Data D0h Address X00h, Data CR Load Initial Address Address = RA Wait tIACC + Programmable Wait State Setting Read Initial Data RD = DQ[15:0] Wait X Clocks: Additional Latency Due to Starting Address, Clock Frequency, and Boundary Crossing Unlock Cycle 1 Unlock Cycle 2 Command Cycle CR = Configuration Register Bits CR15-CR0 RA = Read Address CR13-CR11 sets initial access time (from address latched to valid data) from 2 to 7 clock cycles RD = Read Data Refer to the Latency tables. Read Next Data RD = DQ[15:0] Delay X Clocks Yes Crossing Boundary? No End of Data? Yes Completed 7.5.1 Continuous Burst Read Mode In the continuous burst read mode, the device outputs sequential burst data from the starting address given and then wraps around to address 000000h when it reaches the highest addressable memory location. The burst read mode continues until the system drives CE# high, or RESET#= VIL. Continuous burst mode can also be aborted by asserting AVD# low and providing a new address to the device. If the address being read crosses a 128-word line boundary with in the same bank, but not into a program or erase suspended sector (as mentioned above), additional latency cycles are required as reflected by the configuration register table (Table 7.31). If the address crosses a bank boundary while the subsequent bank is programming or erasing, the device provides read status information and the clock is ignored. Upon completion of status read or program or erase operation, the host can restart a burst read operation using a new address and AVD# pulse. January 28, 2008 S29WS-P_00_A12 S29WS-P 29 D at a 7.5.2 S hee t 8-, 16-, 32-Word Linear Burst Read with Wrap Around In a linear burst read operation, a fixed number of words (8, 16, or 32 words) are read from consecutive addresses that are determined by the group within which the starting address falls. The groups are sized according to the number of words read in a single burst sequence for a given mode (see Table 7.30). For example, if the starting address in the 8-word mode is 3Ch, the address range to be read would be 383Fh, and the burst sequence would be 3C-3D-3E-3F-38-39-3A-3Bh. Thus, the device outputs all words in that burst address group until all word are read, regardless of where the starting address occurs in the address group, and then terminates the burst read. In a similar fashion, the 16-word and 32-word Linear Wrap modes begin their burst sequence on the starting address provided to the device, then wrap back to the first address in the selected address group. Note In this mode the address pointer does not cross the boundary that occurs every 128 words; thus, no additional wait states are inserted due to boundary crossing. Table 7.30 Burst Address Groups 7.5.3 Mode Group Size 8-word 8 words 0-7h, 8-Fh, 10-17h,... Group Address Ranges 16-word 16 words 0-Fh, 10-1Fh, 20-2Fh,... 32-word 32 words 00-1Fh, 20-3Fh, 40-5Fh,... 8-, 16-, 32-Word Linear Burst without Wrap Around If wrap around is not enabled for linear burst read operations, the 8-word, 16-word, or 32-word burst executes up to the maximum memory address of the selected number of words. The burst stops after 8, 16, or 32 addresses and does not wrap around to the first address of the selected group. For example, if the starting address in the 8-word mode is 3Ch, the address range to be read would be 3Ch43h, and the burst sequence would be 3C-3D-3E-3F-40-41-42-43h if wrap around is not enabled. The next address to be read requires a new address and AVD# pulse. Note that in this burst read mode, the address pointer may cross the boundary that occurs every 128 words, which will incur the additional boundary crossing wait state. 30 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.5.4 She et Configuration Registers This device uses two 16-bit configuration registers to set various operational parameters. Upon power-up or hardware reset, the device defaults to the asynchronous read mode, and the configuration register settings are in their default state. The host system should determine the proper settings for the entire configuration register, and then execute the Set Configuration Register command sequence before attempting burst operations. The Configuration Register can also be read using a command sequence (see Table 12.1 on page 84). The following list describes the register settings. Table 7.31 Configuration Register CR Bit Function CR0.15 Set Device Read Mode CR0.14 Reserved (Not used) Settings (Binary) 0 = Synchronous Read (Burst Mode) Enabled 1 = Asynchronous Mode (Default) 0 = Reserved 1 = Reserved (Default) CR1.0 0000 = initial data is valid on the 2nd rising CLK edge after addresses are latched CR0.13 0001 = initial data is valid on the 3rd rising CLK edge after addresses are latched CR0.12 0010 = initial data is valid on the 4th rising CLK edge after addresses are latched 0011 = initial data is valid on the 5th rising CLK edge after addresses are latched 0100 = initial data is valid on the 6th rising CLK edge after addresses are latched 0101 = initial data is valid on the 7th rising CLK edge after addresses are latched 0110 = Reserved Programmable Wait State 0111 = Reserved 1000 = initial data is valid on the 8th rising CLK edge after addresses are latched 1001 = initial data is valid on the 9th rising CLK edge after addresses are latched CR0.11 1010 = initial data is valid on the 10th rising CLK edge after addresses are latched 1011 = initial data is valid on the 11th rising CLK edge after addresses are latched 1100 = Reserved 1101 = default 1110 = Reserved 1111 = Reserved CR0.10 RDY Polarity CR0.9 Reserved (Not used) CR0.8 RDY CR0.7 Reserved (Not used) CR0.6 Reserved CR0.5 Reserved CR0.4 RDY Function CR0.3 Burst Wrap Around CR0.2 0 = RDY signal is active low 1 = RDY signal is active high (Default) 0 = Reserved 1 = Reserved (Default) 0 = RDY active one clock cycle before data 1 = RDY active with data (Default) 0 = Reserved 1 = Reserved (Default) 0 = Reserved 1 = Reserved (Default) 0 = Reserved (Default) 1 = Reserved 0 = RDY (Default) 1 = Reserved 0 = No Wrap Around Burst 1 = Wrap Around Burst (Default) 000 = Continuous (Default) 010 = 8-Word Linear Burst CR0.1 Burst Length CR0.0 011 = 16-Word Linear Burst 100 = 32-Word Linear Burst (All other bit settings are reserved) Notes: 1. Device will be in the Asynchronous Mode upon power-up or hardware reset. 2. CR1.0 to CR1.3 and CR1.5 to CR1.15 = 1 (Default). 3. CR0.3 is ignored if in continuous read mode (no warp around). 4. A software reset command is required after reading or writing the configuration registers in order to set the device back to array read mode. January 28, 2008 S29WS-P_00_A12 S29WS-P 31 D at a S hee t 5. Refer to Table 12.1 on page 84 for reading the settings and writing onto configuration registers command sequences. 6. Configuration Registers can not be programmed out of order. CR0 must be programmed prior to CR01 otherwise the configuration registers will retain their previous settings. 7.6 Autoselect The Autoselect is used for manufacturer ID, Device identification, and sector protection information. This mode is primarily intended for programming equipment to automatically match a device with its corresponding programming algorithm. The Autoselect codes can also be accessed in-system. When verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Table 7.32 on page 32). The remaining address bits are don't care. The most significant four bits of the address during the third write cycle selects the bank from which the Autoselect codes are read by the host. All other banks can be accessed normally for data read without exiting the Autoselect mode. To access the Autoselect codes, the host system must issue the Autoselect command. The Autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend-read mode. The Autoselect command may not be written while the device is actively programming or erasing. Autoselect does not support simultaneous operations or burst mode. The system must write the reset command to return to the read mode (or erase-suspend-read mode if the bank was previously in Erase Suspend). See Table 12.1 on page 84 for command sequence details. Table 7.32 Autoselect Addresses Description Manufacturer ID Word 00 Device ID, Word 01 Sector Lock/Unlock Word 02 Address Read Data (BA) + 00h 0001h (BA) + 01h 227Eh (SA) + 02h 0001h = Locked, 0000h = Unlocked DQ15 - DQ8 = reserved DQ7 - Factory Lock Bit; 1 = Locked, 0 = Not Locked DQ6 -Customer Lock Bit; 1 = Locked, 0 = Not Locked Indicator Bits Word 03 (BA) + 03h DQ5 - Handshake Bit; 1 = Reserved, 0 = Standard Handshake DQ4 & DQ3 - WP# Protection Boot Code; 00 = WP# Protects both Top Boot and Bottom Boot Sectors, DQ2 - DQ0 = reserved Device ID, Word 0E Device ID, Word 0F 32 223Dh (WS512P)-1CE# (BA) + 0Eh 2242h (WS256P) 2244h (WS128P) (BA) + 0Fh S29WS-P 2200h S29WS-P_00_A12 January 28, 2008 Data She et Software Functions and Sample Code Table 7.33 Autoselect Entry (LLD Function = lld_AutoselectEntryCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write BA+AAAh BA+555h 0x00AAh Unlock Cycle 2 Write BA+555h BA+2AAh 0x0055h Autoselect Command Write BA+AAAh BA+555h 0x0090h Table 7.34 Autoselect Exit (LLD Function = lld_AutoselectExitCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write xxxxh xxxxh 0x00F0h Notes: 1. Any offset within the device works. 2. BA = Bank Address. The bank address is required. 3. base = base address. The following is a C source code example of using the autoselect function to read the manufacturer ID. Refer to the Spansion Low Level Driver User's Guide for general information on Spansion Flash memory software development guidelines. /* Here is an example of Autoselect mode (getting manufacturer ID) */ /* Define UINT16 example: typedef volatile unsigned short UINT16; */ UINT16 manuf_id; /* Auto Select Entry */ *( (UINT16 *)bank_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)bank_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)bank_addr + 0x555 ) = 0x0090; /* write autoselect command */ /* multiple reads can be performed after entry */ manuf_id = *( (UINT16 *)bank_addr + 0x000 ); /* read manuf. id */ /* Autoselect exit */ *( (UINT16 *)base_addr + 0x000 ) = 0x00F0; /* exit autoselect (write reset command) */ January 28, 2008 S29WS-P_00_A12 S29WS-P 33 D at a 7.7 S hee t Program/Erase Operations These devices are capable of several modes of programming and or erase operations which are described in detail in the following sections. However, prior to any programming and or erase operation, devices must be setup appropriately as outlined in the configuration register (Table 7.31 on page 31). During synchronous write operations, including writing command sequences, the system must drive AVD# and CE# to VIL, and OE# to VIH when providing an address to the device, and drive WE# and CE# to VIL, and OE# to VIH when writing commands or programming data. Addresses are latched on the rising edge of AVD# pulse or rising edge of CLK or falling edge of WE#, whichever occurs first. During asynchronous write operations, addresses are latched on the rising edge of AVD# or falling edge of WE# while data is latched on the 1st rising edge of WE#, or CE# whichever comes first. Note the following: When the Embedded Program/Erase algorithm is complete, the device returns to the read mode. The system can determine the status of the Program/Erase operation. Refer to Write Operation Status on page 47 for further information. While 1 can be programmed to 0, a 0 cannot be programmed to a 1. Any such attempt will be ignored as only an erase operation can covert a 0 to a 1. For example: Old Data = 0011 New Data = 0101 Result = 0001 Any commands written to the device during the Embedded Program/Erase Algorithm are ignored except the Program/Erase Suspend commands. Secured Silicon Sector, Autoselect, and CFI functions are unavailable when a Program/Erase operation is in progress. A hardware reset and/or power removal immediately terminates the Program/Erase operation and the Program/Erase command sequence should be reinitiated once the device has returned to the read mode to ensure data integrity. Programming is allowed in any sequence and across sector boundaries only for single word programming operation. See Write Buffer Programming on page 36 when using the write buffer. 34 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.7.1 She et Single Word Programming Single word programming mode is the simplest method of programming. In this mode, four Flash command write cycles are used to program an individual Flash address. While the single word programming method is supported by all Spansion devices, in general it is not recommended for devices that support Write Buffer Programming. See Table 12.1 on page 84 for the required bus cycles and Figure 7.3 for the flowchart. When the Embedded Program algorithm is complete, the device returns to the read mode and addresses are no longer latched. The system can determine the status of the program operation by using DQ7 or DQ6. Refer to the Write Operation Status section for information on these status bits. Figure 7.3 Single Word Program Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Unlock Cycle 1 Unlock Cycle 2 Write Program Command: Address 555h, Data A0h Setup Command Program Address (PA), Program Data (PD) Program Data to Address: PA, PD Perform Polling Algorithm (see Write Operation Status flowchart) Polling Status = Busy? Yes No Yes Polling Status = completed Error condition (Exceeded Timing Limits) No Operation successfully completed January 28, 2008 S29WS-P_00_A12 S29WS-P Operation failed 35 D at a S hee t Software Functions and Sample Code Table 7.35 Single Word Program (LLD Function = lld_ProgramCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Program Setup Write Base + AAAh Base + 555h 00A0h Program Write Word Address Word Address Data Word Note: Base = Base Address. The following is a C source code example of using the single word program function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program Command */ *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)base_addr + 0x2AA ) *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)pa ) /* Poll for program completion */ 7.7.2 = = = = 0x00AA; 0x0055; 0x00A0; data; /* /* /* /* write write write write unlock cycle 1 unlock cycle 2 program setup command data to be programmed */ */ */ */ Write Buffer Programming Write Buffer Programming allows the system to write a maximum of 32 words in one programming operation. This results in a faster effective word programming time than the standard word programming algorithms. The Write Buffer Programming command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the Write Buffer Load command written at the Sector Address in which programming will occur. At this point, the system writes the number of word locations minus 1 that will be loaded into the page buffer at the Sector Address in which programming will occur. This tells the device how many write buffer addresses will be loaded with data and therefore when to expect the Program Buffer to Flash confirm command. The number of locations to program cannot exceed the size of the write buffer or the operation will abort. (NOTE: the size of the write buffer is dependent upon which data are being loaded. Also note that the number loaded = the number of locations to program minus 1. For example, if the system will program 6 address locations, then 05h should be written to the device.) The write-buffer addresses must be in the same sector for all address/data pairs loaded into the write buffer. It is to be noted that Write Buffer Programming cannot be performed across multiple sectors. If the system attempts to load programming data outside of the selected write-buffer addresses, the operation aborts after the Write to Buffer command is executed. Also, the starting address must be the least significant address. All subsequent addresses and write buffer data must be in sequential order. The system then writes the starting address/data combination. This starting address is the first address/data pair to be programmed, and selects the write-buffer-page address. All subsequent address/data pairs must be in sequential order. After writing the Starting Address/Data pair, the system then writes the remaining address/data pairs into the write buffer. Write buffer locations must be loaded in sequential order starting with the lowest address in the page. Note that if the number of address/data pairs do no match the word count, the program buffer to flash command is ignored. Note that if a Write Buffer address location is loaded multiple times, the address/data pair counter will be decremented for every data load operation. Also, the last data loaded at a location before the Program Buffer to Flash confirm command will be programmed into the device. It is the software's responsibility to comprehend ramifications of loading a write-buffer location more than once. The counter decrements for each data load operation, NOT for each unique write-buffer-address location. Once the specified number of write buffer locations have been loaded, the system must then write the Program Buffer to Flash command at the Sector Address. Any other address/data write combinations will abort the Write Buffer Programming operation. The device will then go busy. The Data Bar polling techniques 36 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et should be used while monitoring the last address location loaded into the write buffer. This eliminates the need to store an address in memory because the system can load the last address location, issue the program confirm command at the last loaded address location, and then data bar poll at that same address. DQ7, DQ6, DQ5, DQ2, and DQ1 should be monitored to determine the device status during Write Buffer Programming. The write-buffer embedded programming operation can be suspended using the standard suspend/resume commands. Upon successful completion of the Write Buffer Programming operation, the device will return to READ mode. The Write Buffer Programming Sequence is ABORTED in the following ways: Load a value that is greater than the buffer size during the Number of Locations to Program step (DQ7 is not valid in this condition). Write to an address in a sector different than the one specified during the Write-Buffer-Load command. Write an Address/Data pair to a different write-buffer-page than the one selected by the Starting Address during the write buffer data loading stage of the operation. Write data other than the Confirm Command after the specified number of data load cycles. Software Functions and Sample Code Table 7.36 Write Buffer Program (LLD Functions Used = lld_WriteToBufferCmd, lld_ProgramBufferToFlashCmd) Cycle Description Operation Byte Address Word Address Data 1 Unlock Write 2 Unlock Write Base + AAAh Base + 555h 00AAh Base + 554h Base + 2AAh 3 Write Buffer Load Command Write Program Address 0055h 0025h 4 Write Word Count Write Program Address Word Count (N-1)h 5 to 36 Load Buffer Word N Write Program Address, Word N Word N Last Write Buffer to Flash Write Sector Address 0029h Number of words (N) loaded into the write buffer can be from 1 to 32 words. Notes: 1. Base = Base Address. 2. Last = Last cycle of write buffer program operation; depending on number of words written, the total number of cycles may be from 6 to 37. 3. For maximum efficiency, it is recommended that the write buffer be loaded with the highest number of words (N words) possible. January 28, 2008 S29WS-P_00_A12 S29WS-P 37 D at a S hee t The following is a C source code example of using the write buffer program function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Write Buffer Programming Command */ /* NOTES: Write buffer programming limited to 16 words. */ /* All addresses to be written to the flash in */ /* one operation must be within the same write buffer. */ /* A write buffer begins at addresses evenly divisible */ /* by 0x20. UINT16 i; */ UINT16 *src = source_of_data; /* address of source data */ UINT16 *dst = destination_of_data; /* flash destination address */ UINT16 wc = words_to_program -1; /* word count (minus 1) */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)dst ) = 0x0025; /* write write buffer load command */ *( (UINT16 *)dst ) = wc; /* write word count (minus 1) */ for (i=0;i<=wc;i++) { *dst++ = *src++; /* ALL dst MUST BE in same Write Buffer */ } *( (UINT16 *)sector_address ) = 0x0029; /* write confirm command */ /* poll for completion */ /* Example: Write Buffer Abort Reset */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x00F0; /* write buffer abort reset */ 38 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 7.4 Write Buffer Programming Operation Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Unlock Cycle 1 Unlock Cycle 2 Issue Write Buffer Load Command: Program Address Data 25h Load Word Count to Program Program Data to Address: SA = wc wc = number of words - 1 Yes Confirm command: 29h wc = 0? No Write Next Word, Decrement wc: PA data , wc = wc - 1 Perform Polling Algorithm (see Write Operation Status flowchart) Polling Status = Done? Yes No No Yes Write Buffer Abort? Error? Yes No RESET. Issue Write Buffer Abort Reset Command 7.7.3 FAIL. Issue reset command to return to read array mode. PASS. Device is in read mode. Program Suspend/Program Resume Commands The Program Suspend command allows the system to interrupt an embedded programming operation or a Write to Buffer programming operation so that data can read from any non-suspended sector. When the Program Suspend command is written during a programming process, the device halts the programming operation within tPSL (program suspend latency). Bank address needs to be provided when writing the Program Suspend Command. The status bits are undefined during the tPSL period. To verify that the device is in the suspended state, either: wait until after tPSL to check the status bits perform a read and check that the status bits return array data check whether any Autoselect commands are accepted. After the programming operation has been suspended, the system can read array data from any nonsuspended sector. The Program Suspend command may also be issued during a programming operation January 28, 2008 S29WS-P_00_A12 S29WS-P 39 D at a S hee t while an erase is suspended. In this case, data may be read from any addresses not in Erase Suspend or Program Suspend. If a read is needed from the Secured Silicon Sector area, then user must use the proper command sequences to enter and exit this region. The system may also write the Autoselect command sequence when the device is in Program Suspend mode. The device allows reading Autoselect codes in the suspended sectors, since the codes are not stored in the memory array. When the device exits the Autoselect mode, the device reverts to Program Suspend mode, and is ready for another valid operation. See Autoselect on page 32 for more information. After the Program Resume command is written, the device reverts to programming. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. See Write Operation Status on page 47 for more information. Note: While a program operation can be suspended and resumed multiple times, a minimum delay of tPRS (Program Resume to Suspend) is required from resume to the next suspend. The system must write the Program Resume command (address bits are don't care) to exit the Program Suspend mode and continue the programming operation. Further writes of the Program Resume command are ignored. Another Program Suspend command can be written after the device has resumed programming. Software Functions and Sample Code Table 7.37 Program Suspend (LLD Function = lld_ProgramSuspendCmd) Cycle Operation Byte Address Word Address Data 1 Write Bank Address Bank Address 00B0h The following is a C source code example of using the program suspend function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program suspend command */ *( (UINT16 *)base_addr + 0x000 ) = 0x00B0; /* write suspend command */ Table 7.38 Program Resume (LLD Function = lld_ProgramResumeCmd) Cycle Operation Byte Address Word Address Data 1 Write Bank Address Bank Address 0030h The following is a C source code example of using the program resume function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program resume command */ *( (UINT16 *)base_addr + 0x000 ) = 0x0030; 7.7.4 /* write resume command */ Sector Erase The sector erase function erases one or more sectors in the memory array (see Table 12.1 on page 84 and Figure 7.5 on page 42). The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically programs and verifies the entire memory for an all zero data pattern prior to electrical erase. After a successful sector erase, all locations within the erased sector contain FFFFh. The system is not required to provide any controls or timings during these operations. After the command sequence is written, a sector erase time-out of no less than tSEA occurs. During the timeout period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than tSEA. Any sector erase address and command following the exceeded time-out (tSEA) may or may not be accepted. Any command other than Sector Erase or Erase Suspend during the time-out period resets that bank to the read mode. The system can monitor DQ3 to determine if the sector erase timer has timed out (see DQ3: Sector Erase Timeout State Indicator on page 50). The time-out begins from the rising edge of the final WE# pulse in the command sequence. 40 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et When the Embedded Erase algorithm is complete, the bank returns to reading array data and addresses are no longer latched. Note that while the Embedded Erase operation is in progress, the system can read data from the non-erasing banks. The system can determine the status of the erase operation by reading DQ7 or DQ6/DQ2 in the erasing bank. Refer to Write Operation Status on page 47 for information on these status bits. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Figure 7.5 on page 42 illustrates the algorithm for the erase operation. Refer to Program/Erase Operations on page 34 for parameters and timing diagrams. Software Functions and Sample Code Table 7.39 Sector Erase (LLD Function = lld_SectorEraseCmd) Cycle Description Operation Byte Address Word Address Data 1 Unlock Write 2 Unlock Write Base + AAAh Base + 555h 00AAh Base + 554h Base + 2AAh 3 Setup Command 0055h Write Base + AAAh Base + 555h 0080h 4 Unlock Write Base + AAAh Base + 555h 00AAh 5 Unlock Write Base + 554h Base + 2AAh 0055h 6 Sector Erase Command Write Sector Address Sector Address 0030h Unlimited additional sectors may be selected for erase; command(s) must be written within tSEA. The following is a C source code example of using the sector erase function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Sector Erase Command *( (UINT16 *)base_addr + 0x555 *( (UINT16 *)base_addr + 0x2AA *( (UINT16 *)base_addr + 0x555 *( (UINT16 *)base_addr + 0x555 *( (UINT16 *)base_addr + 0x2AA *( (UINT16 *)sector_address ) January 28, 2008 S29WS-P_00_A12 */ ) = ) = ) = ) = ) = = 0x00AA; 0x0055; 0x0080; 0x00AA; 0x0055; 0x0030; S29WS-P /* /* /* /* /* /* write write write write write write unlock cycle 1 */ unlock cycle 2 */ setup command */ additional unlock cycle 1 */ additional unlock cycle 2 */ sector erase command */ 41 D at a S hee t Figure 7.5 Sector Erase Operation Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Unlock Cycle 1 Unlock Cycle 2 Write Sector Erase Cycles: Address 555h, Data 80h Address 555h, Data AAh Address 2AAh, Data 55h Sector Address, Data 30h Command Cycle 1 Command Cycle 2 Command Cycle 3 Specify first sector for erasure Select Additional Sectors? No Yes Write Additional Sector Addresses * Each additional cycle must be written within tSEA timeout * Timeout resets after each additional cycle is written * The host system may monitor DQ3 or wait tSEA to ensure acceptance of erase commands No Yes Poll DQ3. DQ3 = 1? Last Sector Selected? No Yes Perform Write Operation Status Algorithm Yes * No limit on number of sectors * Commands other than Erase Suspend or selecting additional sectors for erasure during timeout reset device to reading array data Status may be obtained by reading DQ7, DQ6 and/or DQ2. Done? No DQ5 = 1? No Error condition (Exceeded Timing Limits) Yes PASS. Device returns to reading array. FAIL. Write reset command to return to reading array. Notes: 1. See Table 12.1 on page 84 for erase command sequence. 2. See the section on DQ3 for information on the sector erase timeout. 42 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.7.5 She et Chip Erase Command Sequence Chip erase is a six-bus cycle operation as indicated by Table 12.1 on page 84. These commands invoke the Embedded Erase algorithm, which does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. After a successful chip erase, all locations of the chip contain FFFFh. The system is not required to provide any controls or timings during these operations. Table 12.1 shows the address and data requirements for the chip erase command sequence. When the Embedded Erase algorithm is complete, that bank returns to the read mode and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7 or DQ6/DQ2. Refer to Write Operation Status on page 47 for information on these status bits. Any commands written during the chip erase operation are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Software Functions and Sample Code Table 7.40 Chip Erase (LLD Function = lld_ChipEraseCmd) Cycle Description Operation Byte Address Word Address Data 1 Unlock Write Base + AAAh Base + 555h 00AAh 2 Unlock Write Base + 554h Base + 2AAh 0055h 3 Setup Command Write Base + AAAh Base + 555h 0080h 4 Unlock Write Base + AAAh Base + 555h 00AAh 5 Unlock Write Base + 554h Base + 2AAh 0055h 6 Chip Erase Command Write Base + AAAh Base + 555h 0010h The following is a C source code example of using the chip erase function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Chip Erase Command */ /* Note: Cannot be suspended */ *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)base_addr + 0x2AA ) *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)base_addr + 0x2AA ) *( (UINT16 *)base_addr + 0x000 ) January 28, 2008 S29WS-P_00_A12 = = = = = = 0x00AA; 0x0055; 0x0080; 0x00AA; 0x0055; 0x0010; S29WS-P /* /* /* /* /* /* write write write write write write unlock cycle 1 */ unlock cycle 2 */ setup command */ additional unlock cycle 1 */ additional unlock cycle 2 */ chip erase command */ 43 D at a 7.7.6 S hee t Erase Suspend/Erase Resume Commands The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. The bank address is required when writing this command. This command is valid only during the sector erase operation, after the minimum tSEA time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation. When the Erase Suspend command is written after the tSEA time-out period has expired and during the sector erase operation, the device requires a minimum of tESL (erase suspend latency) to suspend the erase operation. The status bits are undefined during the tESL period. To verify that the device is in the suspended state, either: wait until after tESL to check the status bits perform a read and check that the status bits return array data check whether any Autoselect commands are accepted After the erase operation has been suspended, the bank enters the erase-suspend-read mode. The system can read data from or program data to any sector not selected for erasure. (The device erase suspends all sectors selected for erasure.) Reading at any address within erase-suspended sectors produces status information on DQ7-DQ0. The system can use DQ7, or DQ6, and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. Refer to Table 7.47 on page 51 for information on these status bits. After an erase-suspended program operation is complete, the bank returns to the erase-suspend-read mode. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. Note: While an erase operation can be suspended and resumed multiple times, a minimum delay of tERS (Erase Resume to Suspend) is required from resume to the next suspend. In the erase-suspend-read mode, the system can also issue the Autoselect command sequence. Refer to Write Buffer Programming on page 36 and Autoselect on page 32 for details. To resume the sector erase operation, the system must write the Erase Resume command. The bank address of the erase-suspended bank is required when writing this command. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the chip has resumed erasing. Software Functions and Sample Code Table 7.41 Erase Suspend (LLD Function = lld_EraseSuspendCmd) Cycle Operation Byte Address Word Address Data 1 Write Bank Address Bank Address 00B0h The following is a C source code example of using the erase suspend function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Erase suspend command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x00B0; /* write suspend command */ Table 7.42 Erase Resume (LLD Function = lld_EraseResumeCmd) Cycle Operation Byte Address Word Address Data 1 Write Bank Address Bank Address 0030h The following is a C source code example of using the erase resume function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Erase resume command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x0030; /* write resume command /* The flash needs adequate time in the resume state */ 44 S29WS-P */ S29WS-P_00_A12 January 28, 2008 Data 7.7.7 She et Accelerated Program/Erase Accelerated single word programming, write buffer programming, sector erase, and chip erase operations are enabled through the ACC function. This method is faster than the standard chip program and erase command sequences. The accelerated program and erase functions must not be used more than 10 times per sector. In addition, accelerated program and erase should be performed at room temperature (25C 10C). If the system asserts VHH on this input, the device automatically enters the accelerated mode and uses the higher voltage on the input to reduce the time required for program and erase operations. The system can then use the Write Buffer Load command sequence provided by the Unlock Bypass mode. Note that if a Write-to-Buffer-Abort Reset is required while in Unlock Bypass mode, the full 3-cycle RESET command sequence must be used to reset the device. Removing VHH from the ACC input, upon completion of the embedded program or erase operation, returns the device to normal operation. Sectors must be unlocked prior to raising ACC to VHH. The ACC pin must not be at VHH for operations other than accelerated programming accelerated erase, or device damage may result. The ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result. ACC locks all sector if set to VIL; ACC should be set to VIH for all other conditions. 7.7.8 Unlock Bypass The unlock bypass feature allows the system to primarily program faster than using the standard program command sequence, and it is not intended for use during erase. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. The device then enters the unlock bypass mode. A two-cycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. The erase command sequences are four cycles in length instead of six cycles. Table 12.1 on page 84 shows the requirements for the unlock bypass command sequences. During the unlock bypass mode, only the Read, Unlock Bypass Program, and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset command sequence. The first cycle must contain the bank address and the data 90h. The second cycle need only contain the data 00h. The bank then returns to the read mode. The device offers accelerated program operations through the ACC input. When the system asserts VHH on this input, the device automatically enters the Unlock Bypass mode. The system may then write the two-cycle Unlock Bypass program command sequence. The device uses the higher voltage on the ACC input to accelerate the operation. Refer to Erase/Program Timing on page 76 for parameters, and Figure 11.15 on page 77 and Figure 11.16 on page 77 for timing diagrams. January 28, 2008 S29WS-P_00_A12 S29WS-P 45 D at a S hee t Software Functions and Sample Code The following are C source code examples of using the unlock bypass entry, program, and exit functions. Refer to the Spansion Low Level Driver User's Guide (available soon on www.spansion.com) for general information on Spansion Flash memory software development guidelines. Table 7.43 Unlock Bypass Entry (LLD Function = lld_UnlockBypassEntryCmd) Cycle Description Operation Byte Address Word Address Data 1 Unlock Write Base + AAAh Base + 555h 00AAh 2 Unlock Write Base + 554h Base + 2AAh 0055h 3 Entry Command Write Base + AAAh Base + 555h 0020h /* Example: Unlock Bypass Entry Command */ *( (UINT16 *)bank_addr + 0x555 ) = 0x00AA; /* write unlock *( (UINT16 *)bank_addr + 0x2AA ) = 0x0055; /* write unlock *( (UINT16 *)bank_addr + 0x555 ) = 0x0020; /* write unlock /* At this point, programming only takes two write cycles. /* Once you enter Unlock Bypass Mode, do a series of like /* operations (programming or sector erase) and then exit /* Unlock Bypass Mode before beginning a different type of /* operations. cycle 1 cycle 2 bypass command */ */ */ */ */ */ */ */ Table 7.44 Unlock Bypass Program (LLD Function = lld_UnlockBypassProgramCmd) Cycle Description Operation Byte Address Word Address Data 1 Program Setup Command Write Base + xxxh Base +xxxh 00A0h 2 Program Command Write Program Address Program Address Program Data /* Example: Unlock Bypass Program Command */ /* Do while in Unlock Bypass Entry Mode! */ *( (UINT16 *)bank_addr + 0x555 ) = 0x00A0; *( (UINT16 *)pa ) = data; /* Poll until done or error. */ /* If done and more to program, */ /* do above two cycles again. */ /* write program setup command /* write data to be programmed */ */ Table 7.45 Unlock Bypass Reset (LLD Function = lld_UnlockBypassResetCmd) Cycle Description Operation Byte Address Word Address Data 1 Reset Cycle 1 Write Base + xxxh Base +xxxh 0090h 2 Reset Cycle 2 Write Base + xxxh Base +xxxh 0000h /* Example: Unlock Bypass Exit Command */ *( (UINT16 *)base_addr + 0x000 ) = 0x0090; *( (UINT16 *)base_addr + 0x000 ) = 0x0000; 46 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 7.7.9 She et Write Operation Status The device provides several bits to determine the status of a program or erase operation. The following subsections describe the function of DQ1, DQ2, DQ3, DQ5, DQ6, and DQ7. DQ7: Data# Polling The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Program or Erase algorithm is in progress or completed, or whether a bank is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the command sequence. Note that the Data# Polling is valid only for the last word being programmed in the write-buffer when write buffer programming is used. Reading Data# Polling status on any word other than the last word to be programmed in the write-buffer-page returns false status information. Similarly, attempting to program 1 over a 0 does not return valid Date# information. During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. The system must provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# polling on DQ7 is active for approximately tPSP, then that bank returns to the read mode. During the Embedded Erase Algorithm, Data# polling produces a 0 on DQ7. When the Embedded Erase algorithm is complete, or if the bank enters the Erase Suspend mode, Data# Polling produces a 1 on DQ7. The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. After an erase command sequence is written, if all sectors selected for erasing are protected, Data# Polling on DQ7 is active for approximately tASP, then the bank returns to the read mode. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. However, if the system reads DQ7 at an address within a protected sector, the status may not be valid. Just prior to the completion of an Embedded Program or Erase operation, DQ7 may change asynchronously with DQ6-DQ1 while Output Enable (OE#) is asserted low. That is, the device may change from providing status information to valid data on DQ7. Even if the device has completed the program or erase operation and DQ7 has valid data, the data outputs on DQ6-DQ1 may be still invalid. Valid data on DQ7-DQ1 appears on successive read cycles. See the following for more information: Table 7.47 on page 51, shows the outputs for Data# Polling on DQ7. Figure 7.6 on page 48, shows the Data# Polling algorithm; and Figure 11.19 on page 79, shows the Data# Polling timing diagram. January 28, 2008 S29WS-P_00_A12 S29WS-P 47 D at a S hee t Figure 7.6 Write Operation Status Flowchart START Read 1 (Note 6) YES Erase Operation Complete DQ7=valid data? NO Read 1 DQ5=1? YES YES Read 2 Read3= valid data? NO NO Read 3 Read 2 YES Program Operation Failed Write Buffer Programming? YES NO Programming Operation? Read 3 NO Device BUSY, Re-Poll (Note 3) (Note 1) (Note 4) (Note 1) YES DQ6 toggling? DQ6 toggling? TIMEOUT NO YES Read3 DQ1=1? DEVICE ERROR NO (Note 2) NO (Note 5) YES Device BUSY, Re-Poll DQ2 toggling? YES NO Read 2 Device BUSY, Re-Poll Erase Operation Complete Read 3 Read3 DQ1=1 AND DQ7 Valid Data? YES Device in Erase/Suspend Mode Write Buffer Operation Failed NO Device BUSY, Re-Poll Notes: 1. DQ6 is toggling if Read2 DQ6 does not equal Read3 DQ6. 2. DQ2 is toggling if Read2 DQ2 does not equal Read3 DQ2. 3. May be due to an attempt to program a 0 to 1. Use the RESET command to exit operation. 4. Write buffer error if DQ1 of last read =1. 5. Invalid state, use RESET command to exit operation. 6. Valid data is the data that is intended to be programmed or all 1's for an erase operation. 7. Data polling algorithm valid for all operations except advanced sector protection. 48 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et DQ6: Toggle Bit I Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address in the same bank, and is valid after the rising edge of the final WE# pulse in the command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. When the operation is complete, DQ6 stops toggling. After an erase command sequence is written, if all sectors selected for erasing are protected, DQ6 toggles for approximately tASP [all sectors protected toggle time], then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erasesuspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling). If a program address falls within a protected sector, DQ6 toggles for approximately tPAP after the program command sequence is written, then returns to reading array data. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program Algorithm is complete. See the following for additional information: Figure 7.6 on page 48, Figure 11.20 on page 79, and Table 7.46 on page 49 and Table 7.47 on page 51. Toggle Bit I on DQ6 requires Read address to be relatched by toggling AVD# for each reading cycle. DQ2: Toggle Bit II The Toggle Bit II on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. DQ2 toggles when the system reads at addresses within those sectors that have been selected for erasure. But DQ2 cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 7.46 to compare outputs for DQ2 and DQ6. See the following for additional information: Figure 7.6 on page 48, DQ6: Toggle Bit I on page 49, and Figures 11.19-11.22. Read address has to be relatched by toggling AVD# for each reading cycle. Table 7.46 DQ6 and DQ2 Indications If device is and the system reads then DQ6 and DQ2 programming, at any address at the bank being programmed toggles, does not toggle. at an address within a sector selected for erasure, toggles, also toggles. at an address within sectors not selected for erasure, toggles, does not toggle. at an address within a sector selected for erasure, does not toggle, toggles. at an address within sectors not selected for erasure, returns array data, returns array data. The system can read from any sector not selected for erasure. at any address at the bank being programmed toggles, is not applicable. actively erasing, erase suspended, programming in erase suspend January 28, 2008 S29WS-P_00_A12 S29WS-P 49 D at a S hee t Reading Toggle Bits DQ6/DQ2 Whenever the system initially begins reading toggle bit status, it must read DQ7-DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erases operation. The system can read array data on DQ7-DQ0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erases operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation. Refer to Figure 7.6 on page 48 for more details. Note: When verifying the status of a write operation (embedded program/erase) of a memory bank, DQ6 and DQ2 toggle between high and low states in a series of consecutive and contiguous status read cycles. In order for this toggling behavior to be properly observed, the consecutive status bit reads must not be interleaved with read accesses to other memory banks. If it is not possible to temporarily prevent reads to other memory banks, then it is recommended to use the DQ7 status bit as the alternative method of determining the active or inactive status of the write operation. DQ5: Exceeded Timing Limits DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under these conditions DQ5 produces a 1, indicating that the program or erase cycle was not successfully completed. The device does not output a 1 on DQ5 if the system tries to program a 1 to a location that was previously programmed to 0. Only an erase operation can change a 0 back to a 1. Under this condition, the device ignores the bit that was incorrectly instructed to be programmed from a 0 to a 1, while any other bits that were correctly requested to be changed from 1 to 0 are programmed. Attempting to program a 0 to a 1 is masked during the programming operation. Under valid DQ5 conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previously in the erase-suspend-program mode). DQ3: Sector Erase Timeout State Indicator After writing a sector erase command sequence, the system may read DQ3 to determine whether or not erasure has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. When the time-out period is complete, DQ3 switches from a 0 to a 1. If the time between additional sector erase commands from the system can be assumed to be less than tSEA, the system need not monitor DQ3. See Sector Erase Command Sequence for more details. After the sector erase command is written, the system should read the status of DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure that the device has accepted the command sequence, and then read DQ3. If DQ3 is 1, the Embedded Erase algorithm has begun; all further commands (except Erase Suspend) are ignored until the erase operation is complete. If DQ3 is 0, the device accepts additional sector erase commands. To ensure the command has been accepted, the system software should check the status of DQ3 prior to and following each sub-sequent sector erase command. If DQ3 is high on the second status check, the last command might not have been accepted. Table 7.47 on page 51 shows the status of DQ3 relative to the other status bits. DQ1: Write to Buffer Abort DQ1 indicates whether a Write to Buffer operation was aborted. Under these conditions DQ1 produces a 1. The system must issue the Write to Buffer Abort Reset command sequence to return the device to reading array data. See Write Buffer Programming Operation for more details. 50 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 7.47 Write Operation Status Status DQ7 (Note 2) DQ6 Standard Mode Embedded Program Algorithm DQ7# 0 Program Suspend Mode (Note 3) Reading within Program Suspended Sector Erase Suspend Mode Write to Buffer (Note 5) DQ5 (Note 1) DQ3 DQ2 (Note 2) Toggle 0 N/A No toggle 0 Toggle 0 1 Toggle N/A INVALID INVALID INVALID INVALID INVALID INVALID (Not Allowed) (Not Allowed) (Not Allowed) (Not Allowed) (Not Allowed) (Not Allowed) Data Data Data Data Data Data 1 No toggle 0 N/A Toggle N/A Data Data Data Data Data Data Embedded Erase Algorithm Reading within Non-Program Suspended Sector Erase-SuspendRead Erase Suspended Sector Non-Erase Suspended Sector DQ1 (Note 4) Erase-Suspend-Program DQ7# Toggle 0 N/A N/A N/A BUSY State DQ7# Toggle 0 N/A N/A 0 Exceeded Timing Limits DQ7# Toggle 1 N/A N/A 0 ABORT State DQ7# Toggle 0 N/A N/A 1 Notes: 1. DQ5 switches to `1' when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. Refer to the section on DQ5 for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details. 3. Data are invalid for addresses in a Program Suspended sector. 4. DQ1 indicates the Write to Buffer ABORT status during Write Buffer Programming operations. 5. The data-bar polling algorithm should be used for Write Buffer Programming operations. Note that DQ7# during Write Buffer Programming indicates the data-bar for DQ7 data for the LAST LOADED WRITE-BUFFER ADDRESS location. 7.8 Simultaneous Read/Program or Erase The simultaneous read/program or erase feature allows the host system to read data from one bank of memory while programming or erasing another bank of memory. An erase operation may also be suspended to read from or program another location within the same bank (except the sector being erased). Figure 11.25 on page 82 shows how read and write cycles may be initiated for simultaneous operation with zero latency. Refer to DC Characteristics on page 67 for read-while-program and read-while-erase current specification. 7.9 Writing Commands/Command Sequences When the device is configured for Asynchronous read, only Asynchronous write operations are allowed, and CLK is ignored. When in the Synchronous read mode configuration, the device is able to perform both Asynchronous and Synchronous write operations. CLK and AVD# induced address latches are supported in the Synchronous programming mode. During a synchronous write operation, to write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive AVD# and CE# to VIL, and OE# to VIH when providing an address to the device, and drive WE# and CE# to VIL, and OE# to VIH when writing commands or data. During an asynchronous write operation, the system must drive CE# and WE# to VIL and OE# to VIH when providing an address, command, and data. Addresses are latched on the last falling edge of WE# or CE#, while data is latched on the 1st rising edge of WE# or CE#. An erase operation can erase one sector, multiple sectors, or the entire device. Table 6.2 on page 17 and Table 6.3 on page 18 indicate the address space that each sector occupies. The device address space is divided into sixteen banks: Banks 1 through 14 contain only 64 Kword sectors, while Banks 0 and 15 contain both 16 Kword boot sectors in addition to 64 Kword sectors. A bank address is the set of address bits required to uniquely select a bank. Similarly, a sector address is the address bits required to uniquely select a sector. ICC2 in DC Characteristics on page 67 represents the active current specification for the write mode. AC Characteristics-Synchronous and AC Characteristics-Asynchronous contain timing specification tables and timing diagrams for write operations. January 28, 2008 S29WS-P_00_A12 S29WS-P 51 D at a 7.10 S hee t Handshaking The handshaking feature allows the host system to detect when data is ready to be read by simply monitoring the RDY pin which is a dedicated output and is controlled by CE#. 7.11 Hardware Reset The RESET# input provides a hardware method of resetting the device to reading array data. When RESET# is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all outputs, resets the configuration register, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. To ensure data integrity the operation that was interrupted should be reinitiated once the device is ready to accept another command sequence. When RESET# is held at VSS, the device draws CMOS standby current (ICC4). If RESET# is held at VIL, but not at VSS, the standby current is greater. RESET# may be tied to the system reset circuitry which enables the system to read the boot-up firmware from the Flash memory upon a system reset. See Figure 11.5 on page 69 and Figure 11.14 on page 75 for timing diagrams. 7.12 Software Reset Software reset is part of the command set (see Table 12.1 on page 84) that also returns the device to array read mode and must be used for the following conditions: to exit Autoselect mode when DQ5 goes high during write status operation that indicates program or erase cycle was not successfully completed exit sector lock/unlock operation. to return to erase-suspend-read mode if the device was previously in Erase Suspend mode. after any aborted operations Exiting Read Configuration Registration Mode Software Functions and Sample Code Table 7.48 Reset (LLD Function = lld_ResetCmd) Cycle Operation Byte Address Word Address Data Reset Command Write Base + xxxh Base + xxxh 00F0h Note: Base = Base Address. The following is a C source code example of using the reset function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Reset (software reset of Flash state machine) */ *( (UINT16 *)base_addr + 0x000 ) = 0x00F0; The following are additional points to consider when using the reset command: This command resets the banks to the read and address bits are ignored. Reset commands are ignored once erasure has begun until the operation is complete. Once programming begins, the device ignores reset commands until the operation is complete The reset command may be written between the cycles in a program command sequence before programming begins (prior to the third cycle). This resets the bank to which the system was writing to the read mode. 52 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et If the program command sequence is written to a bank that is in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode. The reset command may be also written during an Autoselect command sequence. If a bank has entered the Autoselect mode while in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode. If DQ1 goes high during a Write Buffer Programming operation, the system must write the "Write to Buffer Abort Reset" command sequence to RESET the device to reading array data. The standard RESET command does not work during this condition. To exit the unlock bypass mode, the system must issue a two-cycle unlock bypass reset command sequence [see command table for details]. January 28, 2008 S29WS-P_00_A12 S29WS-P 53 D at a S hee t 8. Advanced Sector Protection/Unprotection The Advanced Sector Protection/Unprotection feature disables or enables programming or erase operations in any or all sectors and can be implemented through software and/or hardware methods, which are independent of each other. This section describes the various methods of protecting data stored in the memory array. An overview of these methods in shown in Figure 8.1 on page 54. Figure 8.1 Advanced Sector Protection/Unprotection Hardware Methods Software Methods Lock Register (One Time Programmable) ACC = VIL (All sectors locked) Password Method Persistent Method (DQ2) (DQ1) WP# = VIL (All boot sectors locked) 64-bit Password (One Time Protect) 1,2,3 PPB Lock Bit 0 = PPBs Locked Memory Array Persistent Protection Bit (PPB)5, 6 Sector 0 PPB 0 DYB 0 Sector 1 PPB 1 DYB 1 Sector 2 PPB 2 DYB 2 Sector N-2 PPB N-2 DYB N-2 Sector N-1 PPB N-1 DYB N-1 PPB N DYB N 4 Sector N 4. N = Highest Address Sector. 54 1 = PPBs Unlocked 1. Bit is volatile, and defaults to "1" on reset. 2. Programming to "0" locks all PPBs to their current state. 3. Once programmed to "0", requires hardware reset to unlock. 5. 0 = Sector Protected, 1 = Sector Unprotected. 6. PPBs programmed individually, but cleared collectively S29WS-P Dynamic Protection Bit (DYB)7, 8, 9 7. 0 = Sector Protected, 1 = Sector Unprotected. 8. DYB bits are only effective for sectors that not protected via PPB locking mechanism. 9. Volatile Bits: defaults to unprotected after power up. S29WS-P_00_A12 January 28, 2008 Data 8.1 She et Advanced Sector Protection Software Examples Table 8.1 Sector Protection Schemes Unique Device PPB Lock Bit 0 = locked 1 = unlocked Sector PPB 0 = protected 1 = unprotected Sector DYB 0 = protected 1 = unprotected Sector Protection Status Any Sector 0 0 x Protected through PPB Any Sector 0 0 x Protected through PPB Any Sector 0 1 1 Unprotected Any Sector 0 1 0 Protected through DYB Any Sector 1 0 x Protected through PPB Any Sector 1 0 x Protected through PPB Any Sector 1 1 0 Protected through DYB Any Sector 1 1 1 Unprotected Table 8.1 contains all possible combinations of the DYB, PPB, and PPB Lock Bit relating to the status of the sector. 8.2 Lock Register The Lock Register consists of 4 bits. The Secured Silicon Sector Protection Bit is DQ0, Persistent Protection Mode Lock Bit is DQ1, Password Protection Mode Lock Bit is DQ2, Persistent Sector Protection OTP bit is DQ3. If DQ0 is `0', it means that the Customer Secured Silicon area is locked and if DQ0 is `1', it means that it is unlocked. When DQ2 is set to `1' and DQ1 is set to `0', the device can only be used in the Persistent Protection Mode. When the device is set to Password Protection Mode, DQ1 is required to be set to `1' and DQ2 is required to be set to `0'. DQ3 is programmed in the Spansion factory. When the device is programmed to disable all PPB erase command, DQ3 outputs a `0', when the lock register bits are read. Similarly, if the device is programmed to enable all PPB erase command, DQ3 outputs a `1' when the lock register bits are read. Likewise the DQ4 bit is also programmed in the Spansion Factory. DQ4 is the bit which indicates whether Volatile Sector Protection Bit (DYB) is protected or not after boot-up. When the device is programmed to set all Volatile Sector Protection Bit protected after power-up, DQ4 outputs a `0' when the lock register bits are read. Similarly, when the device is programmed to set all Volatile Sector Protection Bit unprotected after power-up, DQ4 outputs a `1'. Each of these bits in the lock register are non-volatile. DQ15DQ5 are reserved and will be 1's. For programming lock register bits refer to Table 12.2 on page 86. Table 8.2 Lock Register DQ15-5 DQ4 DQ3 DQ2 DQ1 DQ0 Password Protection Mode Lock Bit Persistent Protection Mode Lock Bit Secured Silicon Sector Protection Bit PPB One Time Programmable Bit 1's Reserved (default = 1) 0 = All PPB Erase Command disabled 1 = All PPB Erase Command enabled Notes: 1. If the password mode is chosen, the password must be programmed and verified before setting the corresponding lock register bit (DQ2). Failing to program and verifying the password prior to setting lock register (DQ2), causes all sectors to lock out. 2. It is recommended a sector protection method to be chosen by programming DQ1 or DQ2 prior to shipment. 3. After the Lock Register Bits Command Set Entry sequence is written, reads and writes for Bank 0 are disabled, while reads from other banks are allowed until exiting this mode. Simultaneous operation is only valid as long as lock register program command is not executed. 4. If both lock bits are selected to be programmed (to zeros) at the same time, the operation aborts. 5. Once the Password Mode Lock Bit is programmed, the Persistent Mode Lock Bit is permanently disabled, and no changes to the protection scheme are allowed. Similarly, if the Persistent Mode Lock Bit is programmed, the Password Mode is permanently disabled. 6. During erase/program suspend, ASP entry commands are not allowed. 7. Data Polling can be done immediately after the lock register programming command sequence (no delay required). Note that status polling can be done only in bank 0 8. Reads from other banks (simultaneous operation) are not allowed during lock register programming. This restriction applies to both synchronous and asynchronous read operations. January 28, 2008 S29WS-P_00_A12 S29WS-P 55 D at a S hee t After selecting a sector protection method, each sector can operate in any of the following three states: 1. Constantly locked. The selected sectors are protected and can not be reprogrammed unless PPB lock bit is cleared via a password, hardware reset, or power cycle. 2. Dynamically locked. The selected sectors are protected and can be altered via software commands. 3. Unlocked. The sectors are unprotected and can be erased and/or programmed. These states are controlled by the bit types described in Sections 8.3-8.6. 8.3 Persistent Protection Bits The Persistent Protection Bits are unique and nonvolatile for each sector and have the same endurances as the Flash memory. Preprogramming and verification prior to erasure are handled by the device, and therefore do not require system monitoring. Notes: 1. Each PPB is individually programmed and all are erased in parallel. 2. While programming PPB for a sector, array data can not be read from any other banks. 3. Entry command disables reads and writes for the bank selected. 4. Reads within that bank return the PPB status for that sector. 5. Reads from other banks are allowed while program/erase is not allowed. 6. All Reads must be performed using the Asynchronous mode. 7. The specific sector address (Amax-A14) are written at the same time as the program command. 8. If the PPB Lock Bit is set, the PPB Program or erase command does not execute and times-out without programming or erasing the PPB. 9. There are no means for individually erasing a specific PPB and no specific sector address is required for this operation. 10. The PPB Exit command must be issued after the execution which resets the device to read mode and re-enables reads and writes for Bank 0 11. The programming state of the PPB for a given sector can be verified by writing a PPB Status Read Command to the device as described by the flow chart shown in Figure 8.2 on page 57. 12. During PPB program / erase data polling can be done synchronously. 13. If the user attempts to program or erase a protected sector, the device ignores the command and returns to read mode. 56 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 8.2 PPB Program/Erase Algorithm Enter PPB Command Set. Addr = BA Program PPB Bit. Addr = SA0 Read Byte Twice Addr = SA0 No DQ6 = Toggle? Yes No DQ5 = 1? Wait 500 s Yes Read Byte Twice Addr = SA0 DQ6 = Toggle? No Read Byte. Addr = SA Yes No DQ0 = '1' (Erase) '0' (Pgm.)? FAIL Yes PASS End Exit PPB Command Set January 28, 2008 S29WS-P_00_A12 S29WS-P 57 D at a 8.4 S hee t Dynamic Protection Bits Dynamic Protection Bits are volatile and unique for each sector and can be individually modified. DYBs only control the protection scheme for unprotected sectors that have their PPBs cleared (erased to 1). By issuing the DYB Set or Clear command sequences, the DYBs are set (programmed to 0) or cleared (erased to 1), thus placing each sector in the protected or unprotected state respectively. This feature allows software to easily protect sectors against inadvertent changes yet does not prevent the easy removal of protection when changes are needed. Notes 1. The DYBs can be set (programmed to 0) or cleared (erased to 1) as often as needed. When the parts are first shipped, the PPBs are cleared (erased to 1). 2. The default state of DYB is unprotected after power up and all sectors can be modified depending on the status of PPB bit for that sector, (erased to 1). Then the sectors can be modified depending upon the PPB state of that sector (see Table 8.1 on page 55). 3. It is possible to have sectors that are persistently locked with sectors that are left in the dynamic state. 4. The DYB Set or Clear commands for the dynamic sectors signify protected or unprotected state of the sectors respectively. However, if there is a need to change the status of the persistently locked sectors, a few more steps are required. First, the PPB Lock Bit must be cleared by either putting the device through a power-cycle, or hardware reset. The PPBs can then be changed to reflect the desired settings. Setting the PPB Lock Bit once again locks the PPBs, and the device operates normally again. 5. Data polling is not available for DYB program / erase. 6. DYB read data can be done synchronously. 7. If the user attempts to program or erase a protected sector, the device ignores the command and returns to read mode. 8.5 Persistent Protection Bit Lock Bit The Persistent Protection Bit Lock Bit is a global volatile bit for all sectors. When set (programmed to 0), it locks all PPBs and when cleared (programmed to 1), allows the PPBs to be changed. There is only one PPB Lock Bit per device. Notes 1. No software command sequence unlocks this bit unless the device is in the password protection mode; only a hardware reset or a power-up clears this bit. 2. The PPB Lock Bit must be set (programmed to 0) only after all PPBs are configured to the desired settings. 58 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 8.6 She et Password Protection Method The Password Protection Method allows an even higher level of security than the Persistent Sector Protection Mode by requiring a 64 bit password for unlocking the device PPB Lock Bit. In addition to this password requirement, after power up and reset, the PPB Lock Bit is set 0 to maintain the password mode of operation. Successful execution of the Password Unlock command by entering the entire password clears the PPB Lock Bit, allowing for sector PPBs modifications. Notes 1. If the password mode is chosen, the password must be programmed and verified before setting the corresponding lock register bit (DQ2). Failing to program and verifying the password prior to setting lock register (DQ2), causes all sectors to lock out. 2. There is no special addressing order required for programming the password. Once the Password is written and verified, the Password Mode Locking Bit must be set in order to prevent access. 3. The Password Program Command is only capable of programming 0s. Programming a 1 after a cell is programmed as a 0 results in a time-out with the cell as a 0. 4. The password is all 1s when shipped from the factory. 5. All 64-bit password combinations are valid as a password. 6. There is no means to verify what the password is after it is set. 7. The Password Mode Lock Bit, once set, prevents reading the 64-bit password on the data bus and further password programming. 8. The Password Mode Lock Bit is not erasable. 9. The lower two address bits (A1-A0) are valid during the Password Read, Password Program, and Password Unlock. 10. The exact password must be entered in order for the unlocking function to occur. 11. The Password Unlock command cannot be issued any faster than 1 s at a time to prevent a hacker from running through all the 64-bit combinations in an attempt to correctly match a password. 12. Approximately 1 s is required for unlocking the device after the valid 64-bit password is given to the device. 13. Password verification is only allowed during the password programming operation. 14. All further commands to the password region are disabled and all operations are ignored. 15. If the password is lost after setting the Password Mode Lock Bit, there is no way to clear the PPB Lock Bit. 16. Entry command sequence must be issued prior to any of any operation and it disables reads and writes for Bank 0. Reads and writes for other banks excluding Bank 0 are allowed. 17. If the user attempts to program or erase a protected sector, the device ignores the command and returns to read mode. 18. A program or erase command to a protected sector enables status polling and returns to read mode without having modified the contents of the protected sector. 19. The programming of the DYB, PPB, and PPB Lock for a given sector can be verified by writing individual status read commands DYB Status, PPB Status, and PPB Lock Status to the device. January 28, 2008 S29WS-P_00_A12 S29WS-P 59 D at a S hee t Figure 8.3 Lock Register Program Algorithm Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Unlock Cycle 1 Unlock Cycle 2 Write Enter Lock Register Command: Address 555h, Data 40h XXXh = Address don't care Program Lock Register Data Address XXXh, Data A0h Address 77h*, Data PD * Not on future devices Program Data (PD): See text for Lock Register definitions Caution: Lock register can only be progammed once. Perform Polling Algorithm (see Write Operation Status flowchart) Yes Done? No No DQ5 = 1? Error condition (Exceeded Timing Limits) Yes PASS. Write Lock Register Exit Command: Address XXXh, Data 90h Address XXXh, Data 00h Device returns to reading array. 8.7 FAIL. Write rest command to return to reading array. Hardware Data Protection Methods The device offers two main types of data protection at the sector level via hardware control: When WP# is at VIL, the four outermost sectors (including Secured Silicon Area) are locked. When ACC is at VIL, all sectors (including Secured Silicon Area) are locked. There are additional methods by which intended or accidental erasure of any sectors can be prevented via hardware means. The following subsections describes these methods: 60 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 8.7.1 She et WP# Method The Write Protect feature provides a hardware method of protecting the four outermost sectors. This function is provided by the WP# pin and overrides the previously discussed Sector Protection/Unprotection method. Table 8.3 S29WS512P Sector Protection Dual Boot Configuration Bank 0 SA000-SA003 WP# Protected Bank 1-7 No Sector WP# Protection Bank 8-14 No Sector WP# Protection Bank 15 SA514-SA517 WP# Protected Table 8.4 S29WS256P Sector Protection Dual Boot Configuration Bank 0 SA000-SA003 WP# Protected Bank 1-7 No Sector WP# Protection Bank 8-14 No Sector WP# Protection Bank 15 SA258-SA261 WP# Protected Table 8.5 S29WS128P Sector Protection Dual Boot Configuration Bank 0 SA000-SA003 WP# Protected Bank 1-7 No Sector WP# Protection Bank 8-14 No Sector WP# Protection Bank 15 SA130-SA133 WP# Protected If the system asserts VIL on the WP# pin, the device disables program and erase functions in the outermost boot sectors, as well as Secured Silicon Area. The outermost boot sectors are the sectors containing both the lower and upper set of sectors in a dual-boot-configured device. If the system asserts VIH on the WP# pin, the device reverts to whether the boot sectors were last set to be protected or unprotected. That is, sector protection or unprotection for these sectors depends on whether they were last protected or unprotected. Note that the WP# pin must not be left floating or unconnected as inconsistent behavior of the device may result. The WP# pin must be held stable during a command sequence execution 8.7.2 ACC Method This method is similar to above, except it protects all sectors. Once ACC input is set to VIL, all program and erase functions are disabled and hence all sectors (including the Secured Silicon Area) are protected. 8.7.3 Low VCC Write Inhibit When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets to reading array data. Subsequent writes are ignored until VCC is greater than VLKO. The system must provide the proper signals to the control inputs to prevent unintentional writes when VCC is greater than VLKO. January 28, 2008 S29WS-P_00_A12 S29WS-P 61 D at a 8.7.4 S hee t Write Pulse Glitch Protection Noise pulses of less than 3 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. 8.7.5 Power-Up Write Inhibit If WE# = CE# = RESET# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to the read mode on power-up. 9. Power Conservation Modes 9.1 Standby Mode When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# inputs are both held at VCC 0.2 V. The device requires standard access time (tCE) for read access, before it is ready to read data. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. ICC3 in DC Characteristics on page 67 represents the standby current specification 9.2 Automatic Sleep Mode The automatic sleep mode minimizes Flash device energy consumption only while in asynchronous main array read mode. the device automatically enables this mode when addresses remain stable for tACC + 20 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. While in synchronous mode, the automatic sleep mode is disabled. Note that a new burst operation is required to provide new data. ICC6 in DC Characteristics on page 67 represents the automatic sleep mode current specification. 9.3 Hardware RESET# Input Operation The RESET# input provides a hardware method of resetting the device to reading array data. When RESET# is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all outputs, resets the configuration register, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence to ensure data integrity. When RESET# is held at VSS 0.2 V, the device draws CMOS standby current (ICC4). If RESET# is held at VIL but not within VSS 0.2 V, the standby current is greater. RESET# may be tied to the system reset circuitry and thus, a system reset would also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory. 9.4 Output Disable (OE#) When the OE# input is at VIH, output from the device is disabled. The outputs are placed in the high impedance state. 62 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et 10. Secured Silicon Sector Flash Memory Region The Secured Silicon Sector provides an extra Flash memory region that enables permanent part identification through an Electronic Serial Number (ESN). The Secured Silicon Sector is 256 words in length that consists of 128 words for factory data and 128 words for customer-secured areas. All Secured Silicon reads outside of the 256-word address range returns invalid data. The Factory Indicator Bit, DQ7, (at Autoselect address 03h) is used to indicate whether or not the Factory Secured Silicon Sector is locked when shipped from the factory. The Customer Indicator Bit (DQ6) is used to indicate whether or not the Customer Secured Silicon Sector is locked when shipped from the factory. Please note the following general conditions: While Secured Silicon Sector access is enabled, simultaneous operations are allowed except for Bank 0. On power-up, or following a hardware reset, the device reverts to sending commands to the normal address space. Reads can be performed in the Asynchronous or Synchronous mode. Burst mode reads within Secured Silicon Sector wrap from address FFh back to address 00h. Reads outside of sector 0 return memory array data. Continuous burst read past the maximum address is undefined. Sector 0 is remapped from memory array to Secured Silicon Sector array. Once the Secured Silicon Sector Entry Command is issued, the Secured Silicon Sector Exit command must be issued to exit Secured Silicon Sector Mode. The Secured Silicon Sector is not accessible when the device is executing an Embedded Program or Embedded Erase algorithm. Table 10.1 Secured Silicon Sector Addresses 10.1 Sector Sector Size Address Range Customer 128 words 000080h-0000FFh Factory 128 words 000000h-00007Fh Factory Secured Silicon Sector The Factory Secured Silicon Sector is always protected when shipped from the factory and has the Factory Indicator Bit (DQ7) permanently set to a 1. This prevents cloning of a factory locked part and ensures the security of the ESN and customer code once the product is shipped to the field. These devices are available pre programmed with one of the following: A random, 8 Word secure ESN only within the Factory Secured Silicon Sector Customer code within the Customer Secured Silicon Sector through the Spansion(R) programming service. Both a random, secure ESN and customer code through the Spansion programming service. Customers may opt to have their code programmed through the Spansion programming services. Spansion programs the customer's code, with or without the random ESN. The devices are then shipped from the Spansion factory with the Factory Secured Silicon Sector and Customer Secured Silicon Sector permanently locked. Contact your local representative for details on using Spansion programming services. January 28, 2008 S29WS-P_00_A12 S29WS-P 63 D at a 10.2 S hee t Customer Secured Silicon Sector The Customer Secured Silicon Sector is typically shipped unprotected (DQ6 set to 0), allowing customers to utilize that sector in any manner they choose. If the security feature is not required, the Customer Secured Silicon Sector can be treated as an additional Flash memory space. Please note the following: Once the Customer Secured Silicon Sector area is protected, the Customer Indicator Bit is permanently set to 1. The Customer Secured Silicon Sector can be read any number of times, but can be programmed and locked only once. The Customer Secured Silicon Sector lock must be used with caution as once locked, there is no procedure available for unlocking the Customer Secured Silicon Sector area and none of the bits in the Customer Secured Silicon Sector memory space can be modified in any way. The accelerated programming (ACC) and unlock bypass functions are not available when programming the Customer Secured Silicon Sector, but reading in Banks 1 through 15 is available. Once the Customer Secured Silicon Sector is locked and verified, the system must write the Exit Secured Silicon Sector Region command sequence which return the device to the memory array at sector 0. 10.3 Secured Silicon Sector Entry/Exit Command Sequences The system can access the Secured Silicon Sector region by issuing the three-cycle Enter Secured Silicon Sector command sequence. The device continues to access the Secured Silicon Sector region until the system issues the four-cycle Exit Secured Silicon Sector command sequence. See Command Definition Table [Secured Silicon Sector Command Table, Appendix Table 12.1 on page 84 for address and data requirements for both command sequences. The Secured Silicon Sector Entry Command allows the following commands to be executed Read customer and factory Secured Silicon areas Program the customer Secured Silicon Sector After the system has written the Enter Secured Silicon Sector command sequence, it may read the Secured Silicon Sector by using the addresses normally occupied by sector SA0 within the memory array. This mode of operation continues until the system issues the Exit Secured Silicon Sector command sequence, or until power is removed from the device. Software Functions and Sample Code The following are C functions and source code examples of using the Secured Silicon Sector Entry, Program, and exit commands. Refer to the Spansion Low Level Driver User's Guide (available soon on www.spansion.com) for general information on Spansion Flash memory software development guidelines. Table 10.2 Secured Silicon Sector Entry (LLD Function = lld_SecSiSectorEntryCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Entry Cycle Write Base + AAAh Base + 555h 0088h Note: Base = Base Address. /* Example: Secured Silicon Sector *( (UINT16 *)base_addr + 0x555 ) *( (UINT16 *)base_addr + 0x2AA ) *( (UINT16 *)base_addr + 0x555 ) = */ 64 Entry Command */ = 0x00AA; /* write unlock cycle 1 */ = 0x0055; /* write unlock cycle 2 */ 0x0088; /* write Secured Silicon Sector Entry Cmd S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 10.3 Secured Silicon Sector Program (LLD Function = lld_ProgramCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Program Setup Write Base + AAAh Base + 555h 00A0h Program Write Word Address Word Address Data Word Note: Base = Base Address. /* Once in the Secured Silicon Sector mode, you program */ /* words using the programming algorithm. */ Table 10.4 Secured Silicon Sector Exit (LLD Function = lld_SecSiSectorExitCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Exit Cycle 3 Write Base + AAAh Base + 555h 0090h Exit Cycle 4 Write Any address Any address 0000h Note: Base = Base Address. /* Example: Secured Silicon Sector Exit Command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x0090; /* write Secured Silicon Sector Exit cycle 3 */ *( (UINT16 *)base_addr + 0x000 ) = 0x0000; /* write Secured Silicon Sector Exit cycle 4 */ January 28, 2008 S29WS-P_00_A12 S29WS-P 65 D at a S hee t 11. Electrical Specifications 11.1 Absolute Maximum Ratings Storage Temperature Plastic Packages -65C to +150C Ambient Temperature with Power Applied -65C to +125C Voltage with Respect to Ground: All Inputs and I/Os except as noted below (Note 1) -0.5 V to + 2.5 V VCC (Note 1) -0.5 V to +2.5 V ACC (Note 2) -0.5 V to +9.5 V Output Short Circuit Current (Note 3) 100 mA Notes: 1. Minimum DC voltage on input or I/Os is -0.5 V. During voltage transitions, inputs or I/Os may undershoot VSS to -2.0 V for periods of up to 20 ns. See Figure 11.1. Maximum DC voltage on input or I/Os is VCC + 0.5 V. During voltage transitions outputs may overshoot to VCC + 2.0 V for periods up to 20 ns. See Figure 11.2. 2. Minimum DC input voltage on pin ACC is -0.5V. During voltage transitions, ACC may overshoot VSS to -2.0 V for periods of up to 20 ns. See Figure 11.1. Maximum DC voltage on pin ACC is +9.5 V, which may overshoot to 10.5 V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. 4. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. Figure 11.1 Maximum Negative Overshoot Waveform 20 ns 20 ns +0.8 V -0.5 V -2.0 V 20 ns Figure 11.2 Maximum Positive Overshoot Waveform 20 ns VCC +2.0 V VCC +0.5 V 1.0 V 20 ns 11.2 20 ns Operating Ranges Wireless (I) Devices Ambient Temperature (TA) Supply Voltages VCC Supply Voltages -25C to +85C +1.70 V to +1.95 V Note Operating ranges define those limits between which the functionality of the device is guaranteed. 66 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 11.3 She et DC Characteristics 11.3.1 CMOS Compatible Table 11.1 CMOS Compatible Parameter Description Test Conditions (Note 1) Min Typ Max Unit A ILI Input Load Current VIN = VSS to VCC, VCC = VCCmax 1 ILO Output Leakage Current VOUT = VSS to VCC, VCC = VCCmax 1 A CE# = VIL, OE# = VIH, WE# = VIH, burst length = 8 CE# = VIL, OE# = VIH, WE# = VIH, burst length = 16 ICCB VCC Active burst Read Current CE# = VIL, OE# = VIH, WE# = VIH, burst length = 32 CE# = VIL, OE# = VIH, WE# = VIH, burst length = Continuous 32 37 mA 66 Mhz 35 41 mA 80 Mhz 39 46 mA 104 Mhz 44 51 mA 54 Mhz 32 37 mA 66 Mhz 35 41 mA 80 Mhz 39 46 mA 104 Mhz 44 51 mA 54 Mhz 33 38 mA 66 Mhz 36 42 mA 80 Mhz 40 47 mA 104 Mhz 45 52 mA 54 Mhz 34 39 mA 66 Mhz 37 43 mA 80 Mhz 41 48 mA 104 Mhz 50 57 mA 10 MHz 40 80 mA 5 MHz 20 40 mA 1 MHz 10 20 mA VACC 1 5 A VCC 20 60 mA CE# = RESET# = VACC 1 5 A VCC 0.2 V VCC 20 70 A 30 60 A CE# = VIL, OE# = VIH, ACC = VIH, 5 MHz 40 60 mA VCC Sleep Current CE# = VIL, OE# = VIH, (VCCQ or VSSQ biased at Rail to Rail for all inputs) 5 40 A VCC Active Page Read Current OE# = VIH, 8 word Page Read ICC1 VCC Active Asynchronous Read Current (Note 2) ICC2 VCC Active Program/Erase Current (Note 2) ICC3 VCC Standby Current (Note 3) ICC4 VCC Reset Current RESET# = VIL, CLK = VIL ICC5 VCC Active Current (Read While Program/Erase) ICC6 ICC7 IACC 54 Mhz Accelerated Program Current (Note 4) CE# = VIL, OE# = VIH, WE# = VIH CE# = VIL, OE# = VIH, ACC = VIH CE# = VIL, OE# = VIH, VACC = 9.5 V 10 15 mA VACC 7 10 mA VCC 15 20 mA V Input Low Voltage -0.2 0.4 VIH Input High Voltage VCC - 0.4 VCC + 0.4 VOL Output Low Voltage IOL = 100 A, VCC = VCC min VOH Output High Voltage IOH = -100 A, VCC = VCC min VHH Voltage for Accelerated Program VLKO Low VCC Lock-out Voltage VIL 0.1 VCC - 0.1 8.5 V V 9.5 V 1.4 V Notes: 1. Maximum ICC specifications are tested with VCC = VCCmax. 2. ICC active while Embedded Erase or Embedded Program is in progress. 3. Device enters automatic sleep mode when addresses are stable for tACC + 20 ns. Typical sleep mode current is equal to ICC3. 4. Total current during accelerated programming is the sum of VACC and VCC currents. 5. VCCQ = VCC during all ICC measurements. 6. VIH = VCC <Helv> 0.2V and VIL 0.1V January 28, 2008 S29WS-P_00_A12 S29WS-P 67 D at a 11.4 S hee t Test Conditions Figure 11.3 Test Setup Device Under Test CL Table 11.2 Test Specifications Test Condition All Speed Options Unit 30 pF Input Rise and Fall Times 1.0 - 1.50 ns Input Pulse Levels 0.0-VCC V Input timing measurement reference levels VCC/2 V Output timing measurement reference levels VCC/2 V Output Load Capacitance, CL (including jig capacitance) 11.5 Key to Switching Waveforms Waveform Inputs Outputs Steady Changing from H to L Changing from L to H 11.6 Don't Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) Switching Waveforms Figure 11.4 Input Waveforms and Measurement Levels All Inputs and Outputs VCC Input VCC/2 Measurement Level VCC/2 Output 0.0 V Table 11.3 VCC Power-up 68 Parameter Description Test Setup Time Unit tVCS VCC Setup Time Min 30 s tRH Time between RESET# (high) and CE# (low) Min 200 ns S29WS-P S29WS-P_00_A12 January 28, 2008 Data 11.7 She et Power-up/Initialization Power supply must reach its minimum voltage range before applying/removing the next supply voltage. RESET# must ramp down to VIL level before VCC/VCCQ can start ramp up. VCC and VCCQ must be ramped simultaneously for proper power-up. The S29WS-P device ramp rate is > 1V/400 s. For VCC ramp rate <1V/400 s, a hardware reset is required. Figure 11.5 VCC Power-up Diagram tVCS VCC min VCC/ VCCQ VIH RESET# tRH CE# 11.8 CLK Characterization Parameter Description Max fCLK CLK Frequency tCLK CLK Period tCL/tCH 54 MHz 66 MHz 80 MHz 104 MHz Unit 54 66 80 104 MHz 9.62 ns 60 KHz in 8 word Burst, 120 KHz in 16 word Burst, 250 KHz in 32 word Burst, 1 MHz in Continuous Mode Min Min 18.5 15.1 0.45 tCLK Max 0.55 tCLK CLK Low/High Time tCR CLK Rise Time tCF CLK Fall Time 12.5 Min Max 3.0 3.0 ns 2.5 1.5 ns Figure 11.6 CLK Characterization tCLK tCH CLK January 28, 2008 S29WS-P_00_A12 tCL tCF tCR S29WS-P 69 D at a 11.9 S hee t AC Characteristics 11.9.1 Synchronous/Burst Read Parameter JEDEC Standard Description 54 MHz tIACC Synchronous Access Time Max tBACC Burst Access Time Valid Clock to Output Delay Max 66 MHz 80 MHz 104 MHz (WS-1) * tCK + tBACC 13.5 11.2 Unit ns 9 7.6 ns tACS Address Setup Time to CLK (Note 1) Min 5 4 4 3.5 ns tACH Address Hold Time from CLK (Note 1) Min 6 6 5 5 ns tBDH Data Hold Time Min 4 3 3 2 ns tRDY Chip Enable to RDY Active Max tOE Output Enable to RDY Low Max 13.5 11.2 9 7.6 ns 10 ns tCEZ Chip Enable to High Z Max 10 10 10 7 ns tOEZ Output Enable to High Z Max 10 10 10 7 ns tCES CE# Setup Time to CLK Min Ready Access Time from CLK Max 13.5 11.2 9 7.6 tCAS CE# Setup Time to AVD# Min 0 ns tAVC AVD# Low to CLK Setup Time Min 6 ns tAVD AVD# Pulse Min tCLK ns tRACC 6 ns ns Notes: 1. Addresses are latched on the rising edge of CLK 2. Synchronous Access Time is calculated using the formula (#of WS - 1)*(clock period) + (tBACC or Clock to Out) Table 11.4 Non-Continuous Burst Mode with Wrap Around Burst Mode. Max Frequency Wait State Requirement Frequency 27 MHz 3 27 MHz < Frequency 40 MHz 4 40 MHz < Frequency 54 MHz 5 54 MHz < Frequency 66 MHz 6 66 MHz < Frequency 80 MHz 7 80 MHz < Frequency 95 MHz 8 95 MHz < Frequency 104 MHz 11 Table 11.5 Continuous Burst Mode with No Wrap Around Burst Mode. Max Frequency 70 Wait State Requirement Frequency 27 MHz 3 27 MHz < Frequency 40 MHz 4 40 MHz < Frequency 54 MHz 6 54 MHz < Frequency 66 MHz 7 67 MHz < Frequency 80 MHz 8 80 MHz < Frequency 95 MHz 9 95 MHz < Frequency 104 MHz 11 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 11.7 8-Word Linear Synchronous Single Data Rate Burst with Wrap Around 1 2 3 4 5 6 7 CLK tCES 7 cycles for initial access is shown as an illustration. CE# tCLKH tCLKL tAVC AVD# tCEZ tCLK tAVD tACS tBACC tOEZ High-Z Data tACH Address DC tIACC DE DB AC tBDH OE# tRDY RDY DD tRACC tOE tCEZ Hi-Z High-Z Notes: 1. Figure shows for illustration the total number of wait states set to seven cycles. 2. The device is configured synchronous single data rate mode and RDY active with data. 3. CE# (High) drives the RDY to Hi-Z while OE# (High) drives the DQ(15:0) pins to Hi-Z. Figure 11.8 8-word Linear Single Data Read Synchronous Burst without Wrap Around tCES 7? cycles for initial access shown. CE# 1 2 3 4 5 6 7 CLK tAVC AVD# tAVD tACS Addresses Ac tBACC tACH Data tIACC DC DD DE DF D10 D13 tBDH OE# tRDY RDY tRACC tOE tRACC Hi-Z tRDYS Notes: 1. Figure shows for illustration the total number of wait states set to seven cycles. 2. The device is configured synchronous single data rate mode and RDY active with data. 3. CE# (High) drives the RDY to Hi-Z while OE# (High) drives the DQ(15:0) pins to HI-Z. January 28, 2008 S29WS-P_00_A12 S29WS-P 71 D at a 11.9.2 S hee t Asynchronous Mode Read Parameter JEDEC Standard Description Asynchronous Unit tCE Access Time from CE# Low Max 83 ns tACC Asynchronous Access Time Max 80 ns ns tAVDP AVD# Low Time Min 7.5 tAAVDS Address Setup Time to Rising Edge of AVD# Min 6 ns tAAVDH Address Hold Time from Rising Edge of AVD# Min 4 ns tOE Output Enable to Output Valid Max 13.5 ns Read Min 0 ns tOEH Output Enable Hold Time Toggle and Data# Polling Min 4 ns tOEZ Output Enable to High Z Max 7.6 ns tCAS CE# Setup Time to AVD# Min 0 ns tPACC Intra Page Access Time Max 20 ns tCEZ Chip Enable to High Z Max 7.6 ns Figure 11.9 Asynchronous Read Mode (AVD# Toggling - Case 1) CLK VIL or VIH CE# tCEZ tAVDP AVD# tOE tWEA OE# tOEH WE# tCE DQ15-DQ0 tAAVDS Amax-A0 RDY tOEZ tAAVDH RD VA Hi-Z tRDY tCEZ Hi-Z Notes: 1. Valid Address and AVD# Transition occur before CE# is driven Low. 2. VA = Valid Read Address, RD = Read Data. 72 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 11.10 Asynchronous Read Mode (AVD# Toggling - Case 2) VIL or VIH CLK tCAS CE# tCEZ tAVDP AVD# tOE OE# tWEA tOEH WE# tOEZ DQ15-DQ0 tAAVDH tAAVDS Amax-A0 RD VA tCEZ tACC RDY tRDY Hi-Z Hi-Z Notes: 1. AVD# Transition occurs after CE# is driven to Low and Valid Address Transition occurs before AVD# is driven to Low. 2. VA = Valid Read Address, RD = Read Data. Figure 11.11 Asynchronous Read Mode (AVD# Toggling - Case 3) VIL or VIH CLK tCAS CE# tCEZ tAVDP AVD# tOE OE# tWEA tOEH WE# tOEZ DQ15-DQ0 tAAVDH tAAVDS Amax-A0 VA tRDY RDY RD tACC tCEZ Hi-Z Hi-Z Notes: 1. AVD# Transition occurs after CE# is driven to Low and AVD# is driven low before Valid Address Transition. 2. VA = Valid Read Address, RD = Read Data. January 28, 2008 S29WS-P_00_A12 S29WS-P 73 D at a S hee t Figure 11.12 Asynchronous Read Mode (AVD# tied to CE#) CLK VIL or VIH tRC CE# tCEZ AVD# OE# WE# tOE tOEH tOEZ tCE tWEA RD DQ15-DQ0 tACC Amax-A0 VA tCEZ tRDY RDY Hi-Z Hi-Z Notes: 1. AVD# is tied to CE# 2. VA = Valid Read Address, RD = Read Data. Figure 11.13 Asynchronous Page Mode Read Amax-A3 A2-A0 Page A0 tACC Data Bus A1 tPACC D0 Ax A2 tPACC D1 tPACC Dx D7 CE# OE# AVD# Note RA = Read Address, RD = Read Data. 74 S29WS-P S29WS-P_00_A12 January 28, 2008 Data 11.9.3 She et Hardware Reset (RESET#) Table 11.6 Hardware Reset Parameter JEDEC Std Description All Speed Options Unit tRP RESET# Pulse Width Min 30 s tRH Reset High Time Before Read Min 200 ns Figure 11.14 Reset Timings CE#, OE# tRH RESET# tRP January 28, 2008 S29WS-P_00_A12 S29WS-P 75 D at a 11.9.4 S hee t Erase/Program Timing Parameter JEDEC Standard tAVAV tWC 54 MHz Description Write Cycle Time (Note 1) 66 MHz Min Synchronous tAVWL tAS Address Setup Time (Note 2) tWLAX tAH Address Hold Time (Note 2) 80 MHz 104 MHz 60 ns 5 5 5 3.5 6 6 6 6 Min Asynchronous Synchronous ns 7 7 6 5 7 7 6 5 Min Asynchronous Unit ns tAVDP AVD# Low Time Min 6 ns tDVWH tDS Data Setup Time Min 20 ns tWHDX tDH Data Hold Time Min 0 ns tGHWL tGHWL Read Recovery Time Before Write Min 0 ns tCAS CE# Setup Time to AVD# Min 0 ns tWHEH tCH CE# Hold Time Min 0 ns tWLWH tWP Write Pulse Width Min 25 ns tWHWL tWPH Write Pulse Width High Min 20 ns tSR/W Latency Between Read and Write Operations Min 0 ns tELWL tVID VACC Rise and Fall Time Min 500 ns tVIDS VACC Setup Time (During Accelerated Programming) Min 1 s CE# Setup Time to WE# Min 4 ns tAVSW tCS AVD# Setup Time to WE# Min 4 ns tAVHW AVD# Hold Time to WE# Min tAVSC AVD# Setup Time to CLK Min 5 5 tAVHC AVD# Hold Time to CLK Min 5 5 tSEA Sector Erase Accept Time-out Min tESL Erase Suspend Latency Max 40 s tPSL Program Suspend Latency Max 40 s tASP Toggle Time During Erase within a Protected Sector Typ 0 s tPSP Toggle Time During Programming Within a Protected Sector Typ 0 s 4 50 ns 5 3 5 3 ns ns s Notes 1. Sampled, not 100% tested. 2. In programming operations, addresses are latched on the active edge of CLK for programming synchronously or rising edge of AVD# for programming asynchronously. 3. See the Erase and Programming Performance on page 83 section for more information. Does not include the preprogramming time. 76 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 11.15 Asynchronous Program Operation Timings Program Command Sequence (last two cycles) VIH Read Status Data CLK VIL tAVDP AVD# tAH tAS Addresses VA PA 555h Data A0h VA In Progress PD Complete tDS tDH tCAS CE# tCH OE# tWP WE# tCS tWPH tWC Notes: 1. PA = Program Address, PD = Program Data, VA = Valid Address for reading status bits. 2. In progress and complete refer to status of program operation. 3. CLK can be either VIL or VIH. Figure 11.16 Synchronous Program Operation Timings Program Command Sequence (last two cycles) Read Status Data tAVHC CLK tAS tAH tAVSC AVD# tAVDP Addresses Data A0h Complete tDS tDH tAVHW CE# VA In Progress PD tCAS OE# VA PA 555h tCH tAVSW tWP WE# tWC tWPH tWC Notes: 1. PA = Program Address, PD = Program Data, VA = Valid Address for reading status bits. 2. In progress and complete refer to status of program operation. 3. Addresses are latched on the first rising edge of CLK. January 28, 2008 S29WS-P_00_A12 S29WS-P 77 D at a S hee t Figure 11.17 Chip/Sector Erase Command Sequence Erase Command Sequence (last two cycles) VIH Read Status Data CLK VIL tAVDP AVD# tAH tAS Addresses VA SA 2AAh 555h for chip erase Data 55h VA 10h for chip erase In Progress 30h Complete tDS tDH CE# tCH OE# tWP WE# tWHWH2 tCS tWPH tWC Note: SA is the sector address for Sector Erase. Figure 11.18 Accelerated Unlock Bypass Programming Timing CE# AVD# WE# Addresses PA Don't Care Data OE# ACC 1 s A0h Don't Care PD Don't Care tVIDS VHH VIL or VIH Note: Use setup and hold times from conventional program operation. 78 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 11.19 Data# Polling Timings (During Embedded Algorithm) AVD# tCEZ tCE CE# tCH tOEZ tOE OE# tOEH WE# tACC High Z Addresses VA VA High Z Status Data Data Status Data Notes: 1. Status reads in figure are shown as asynchronous. 2. VA = Valid Address. Two read cycles are required to determine status. When the Embedded Algorithm operation is complete, and Data# Polling will output true data. Figure 11.20 Toggle Bit Timings (During Embedded Algorithm) AVD# tCEZ tCE CE# tCH tOEZ tOE OE# tOEH WE# tACC Addresses Data High Z VA VA High Z Status Data Status Data Notes: 1. Status reads in figure are shown as asynchronous. 2. VA = Valid Address. Two read cycles are required to determine status. When the Embedded Algorithm operation is complete, the toggle bits will stop toggling. January 28, 2008 S29WS-P_00_A12 S29WS-P 79 D at a S hee t Figure 11.21 Synchronous Data Polling Timings/Toggle Bit Timings CE# CLK AVD# Addresses VA VA OE# tIACC tIACC Data Status Data Status Data RDY Notes: 1. The timings are similar to synchronous read timings. 2. VA = Valid Address. Two read cycles are required to determine status. When the Embedded Algorithm operation is complete, the toggle bits will stop toggling. 3. RDY is active with data (D8 = 0 in the Configuration Register). When D8 = 1 in the Configuration Register, RDY is active one clock cycle before data. Figure 11.22 DQ2 vs. DQ6 Enter Embedded Erasing WE# Erase Suspend Erase Enter Erase Suspend Program Erase Suspend Read Erase Suspend Program Erase Resume Erase Suspend Read Erase Erase Complete DQ6 DQ2 Note: DQ2 toggles only when read at an address within an erase-suspended sector. The system may use OE# or CE# to toggle DQ2 and DQ6. 80 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Figure 11.23 Latency with Boundary Crossing Address boundary occurs every 128 words, beginning at address 00007Fh: (0000FFh, 00017Fh, etc.) Address 000000h is also a boundary crossing. Address (hex) 7C 7D 7E 7F 7F 80 81 82 83 CLK AVD# (stays high) tRACC tRACC latency RDY(Note 1) tRACC tRACC RDY(Note 2) latency Data OE#, CE# D124 D125 D126 D127 D128 Invalid D129 D130 D0 D1 (stays low) Notes: 1. RDY active with data (CR0.8 = 0 in the Configuration Register). 2. RDY active one clock cycle before data (CR0.8 = 1 in the Configuration Register). 3. Figure shows the device not crossing a bank in the process of performing an erase or program. Figure 11.24 Wait State Configuration Register Setup Data Rising edge of next clock cycle following last wait state triggers next burst data AVD# total number of clock cycles following addresses being latched OE# 1 2 3 4 5 6 7 CLK 0 1 2 4 6 8 10 12 13 14 Total number of clock edges following addresses being latched January 28, 2008 S29WS-P_00_A12 S29WS-P 81 D at a S hee t Table 11.7 Example of Programmable Wait States CR1.0 0000 = initial data is valid on the 2rd rising CLK edge after addresses are latched CR0.13 0001 =initial data is valid on the 3rd rising CLK edge after addresses are latched CR0.12 0010 = initial data is valid on the 4th rising CLK edge after addresses are latched 0011 = initial data is valid on the 5th rising CLK edge after addresses are latched 0100 = initial data is valid on the 6th rising CLK edge after addresses are latched 0101 = initial data is valid on the 7th rising CLK edge after addresses are latched 0110 = Reserved Programmable Wait State 0111 = Reserved 1000 = initial data is valid on the 8th rising CLK edge after addresses are latched 1001 = initial data is valid on the 9th rising CLK edge after addresses are latched CR0.11 101 1= initial data is valid on the 10th rising CLK edge after addresses are latched . . 1101 = Reserved 1110 = Reserved 1111 = Reserved Figure 11.25 Back-to-Back Read/Write Cycle Timings Last Cycle in Program or Sector Erase Command Sequence Read status (at least two cycles) in same bank and/or array data from other bank tWC tRC Begin another write or program command sequence tRC tWC CE# OE# tOE tOEH tGHWL WE# tWPH tWP tOEZ tACC tDS tOEH tDH Data RD PD/30h AAh RD tSR/W Addresses PA/SA RA RA 555h tAS AVD# tAH Note: Breakpoints in waveforms indicate that system may alternately read array data from the non-busy bank while checking the status of the program or erase operation in the busy bank. The system should read status twice to ensure valid information. 82 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et 11.10 Erase and Programming Performance Parameter Typ (Note 1) Max (Note 2) 64 Kword VCC 0.6 3.0 16 Kword VCC 0.35 1.75 78.4 (WS128P) 154 (WS128P) VCC 155.2 (WS256P) 308 (WS256P) 308.8 (WS512P) 616 (WS512P) Unit Comments s Excludes 00h programming prior to erasure (Note 3) Sector Erase Time Chip Erase Time Single Word Programming Time Effective Word Programming Time utilizing Program Write Buffer VCC 40 400 ACC 24 240 s s VCC 9.4 94 ACC 6 60 VCC 300 3000 Excludes system level overhead (Note 4) s Total 32-Word Buffer Programming Time ACC VCC Chip Programming Time (using 32 word buffer) 192 1920 50.4 (WS128P) 157.3 (WS128P) 100.8 (WS256P) 314.6 (WS256P) 201.6 (WS512P) 1008 (WS512P) 33.6 (WS128P) 100.7 (WS128P) 67.2 (WS256P) 201.3 (WS256P) 134.4 (WS512P) 402.6 (WS512P) s ACC Erase Suspend/Erase Resume (tERS) 40 s Program Suspend/Program Resume (tPRS) 40 s Excludes system level overhead (Note 4) Notes: 1. Typical program and erase values are measured at TC = 25C, 1.8 V VCC, 10,000 cycles using checkerboard patterns. Sampled, but not 100% tested. 2. Under worst case conditions of 90C, VCC = 1.70 V, 100,000 cycles. 3. In the pre-programming step of the Embedded Erase algorithm, all words are programmed to 00h before erasure. 4. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 12.1 on page 84 and Table 12.2 on page 86 for further information on command definitions. 11.10.1 BGA Ball Capacitance Parameter Symbol Parameter Description Test Setup Typ Max CIN Input Capacitance VIN = 0 2 10 pF COUT Output Capacitance VOUT = 0 2 10 pF Unit Notes 1. Sampled, not 100% tested. 2. Test conditions tA - 25C; f = 1.0 MHz January 28, 2008 S29WS-P_00_A12 S29WS-P 83 D at a S hee t 12. Appendix This section contains information relating to software control or interfacing with the Flash device. For additional information and assistance regarding software, see Additional Resources on page 15, or explore the Web at www.spansion.com. Table 12.1 Memory Array Commands Command Sequence (Notes) Cycles Bus Cycles (Note 1 - 6) First Second Addr Data (19) Addr Data (19) Third Addr 1 RA RD Reset (8) 1 XXX F0 Manufacturer ID 4 555 AA 2AA 55 Device ID (10) 6 555 AA 2AA 55 Indicator Bits 4 555 AA 2AA 55 Sector Unlock/Lock Verify (11) 4 555 AA 2AA 55 Single word 4 555 AA 2AA 55 555 Write Buffer to Flash Program (17) 6 555 AA 2AA 55 Autoselect (9) Asynchronous Read (7) (BA) 555 (BA) 555 (BA) 555 (SA) Fourth Data (19) 90 90 90 Addr (BA) X00 (BA) X01 (BA) X03 Data (19) 227E Addr Data (19) (BA)X 0E (10) (BA) X0F (10) PD WBL PD (12) 0000/ X02 0001 A0 PA Data SA 25 SA WC 90 Addr Sixth Data (19) 0001 (SA) 555 Fifth PA (20) Program Buffer to Flash 1 SA 29 Write to Buffer Abort Reset (12) 3 555 AA 2AA 55 555 F0 Chip Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 Sector Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30 B0 2AA 55 555 D0 X00 CR0 X01 CR1 X0 (0 or 1) CR (0 or 1) Program/Erase Suspend (15) 1 BA Program/Erase Resume (16) 1 BA 30 Set Configuration Register (21) 5 555 AA Read Configuration Register 4 555 AA CFI Query (17) 1 (BA) 55 98 Unlock Bypass Entry (18) 3 555 Unlock Bypass Program (13, 14) 2 Unlock Bypass Sector Erase (13, 14) Unlock Bypass Erase (13, 14) Unlock Bypass Mode 2AA 55 555 C6 AA 2AA 55 555 20 XX A0 PA PD 2 XX 80 SA 30 2 XX 80 XXX 10 XXX 00 Unlock Bypass CFI (13, 14) 1 XX 98 Unlock Bypass Reset 2 XX 90 Legend X = Don't care RA = Read Address RD = Read Data PA = Program Address. Addresses latch on the rising edge of the AVD# pulse or active edge of CLK, whichever occurs first. PD = Program Data. Data latches on the rising edge of WE# or CE# pulse, whichever occurs first. Notes 1. See Table 7.1 on page 19 for description of bus operations. 2. All values are in hexadecimal. 3. Except for the following, all bus cycles are write cycle: read cycle, fourth through sixth cycles of the Autoselect commands, fourth cycle of the configuration register verify and password verify commands, and any cycle reading at RD(0) and RD(1). 4. Data bits DQ15-DQ8 are don't care in command sequences, except for RD, PD, WD, PWD, and PWD3-PWD0. 5. Unless otherwise noted, address bits Amax-A14 are don't cares. 84 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et 6. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. The system must write the reset command to return the device to reading array data. 7. No unlock or command cycles required when bank is reading array data. 8. The Reset command is required to return to reading array data (or to the erase-suspend-read mode if previously in Erase Suspend) when a bank is in the autoselect mode, or if DQ5 goes high (while the bank is providing status information) or performing sector lock/unlock. 9. The fourth cycle of the autoselect address is a read cycle. The system must provide the bank address. 10. (BA) + 0Eh ----> For WS128 = 2244h, WS256 = 2242h, WS512 = 223Dh. (BA) + 0Fh ----> For WS064/128/256/512 = 2200h 11. The data is 0000h for an unlocked sector and 0001h for a locked sector 12. See Table 7.32, Autoselect Addresses on page 32. 13. The Unlock Bypass command sequence is required prior to this command sequence. 14. The Unlock Bypass Reset command is required to return to reading array data when the bank is in the unlock bypass mode. 15. The system may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. The Program/Erase Suspend command is valid only during a program/ erase operation, and requires the bank address. 16. The Program/Erase Resume command is valid only during the Program/Erase Suspend mode, and requires the bank address. 17. The total number of cycles in the command sequence is determined by the number of words written to the write buffer. The maximum number of cycles in the command sequence is 37. 18. Write Buffer Programming can be initiated after Unlock Bypass Entry. 19. Data is always output at the rising edge of clock. 20. Must be the lowest address. 21. Configuration Registers can not be programmed out of order. CR0 must be programmed prior to CR01 otherwise the configuration registers will retain their previous settings January 28, 2008 S29WS-P_00_A12 S29WS-P 85 D at a S hee t Table 12.2 Sector Protection Commands (Sheet 1 of 2) Command Sequence (Notes) Cycles Bus Cycles (Note 1 - 6) First Second Addr Data (10) Third Fourth Addr Data( (10) Addr Data( (10) Addr Data( (10) AA 2AA 55 555 88 2AA 55 555 A0 PA PD XX 00 Entry (5) 3 555 Program Secured Silicon Sector Read 4 555 AA 1 SA data Exit (7) 4 555 AA 2AA 55 555 90 Register Command Set Entry (5) 3 555 AA 2AA 55 555 40 Register Bits Program (6) 2 XX A0 00 data Register Bits Read 1 00 data Register Command Set Exit (7) 2 XX 90 XX 00 Protection Command Set Entry 3 555 AA 2AA 55 555 60 00/ PWD 0/ 02 PWD 2 03 PWD 3 00 PWD 0 01 PWD 1 (BA) 555 C0 555 50 (BA) 555 E0 Fifth Addr Data( (10) Sixth Addr Data( (10) Seventh Addr Data( (10) 00 29 Lock Register Password Program (9) PPB 2 XX A0 01/ 02/ 03 1/ 2/ 3/ 01 PWD 1 Read Password (10) 4 00 PWD 0 Unlock (9) 7 00 25 00 03 Protection Command Set Exit 2 XX 90 XX 00 Non-Volatile Sector Protection Command Set Entry (5) 3 555 AA 2AA 55 Program 2 XX A0 (BA) SA 00 All Erase (8) 2 XX 80 XX 30 Status Read 1 (BA) SA RD(0) Non-Volatile Sector Protection Command Set Exit (7) 2 XX 90 XX 00 Global Volatile Sector Protection Freeze Command Set Entry (5) 3 555 AA 2AA 55 Set 2 XX A0 XX 00 Status Read 1 XX RD(0) Global Volatile Sector Protection Freeze Command Set Exit (7) 2 XX 90 XX 00 Volatile Sector Protection Command Set Entry (5) 3 555 AA 2AA 55 Set 2 XX A0 (BA) SA 00 Clear 2 XX A0 (BA) SA 01 Status Read 1 (BA) SA RD(0) Volatile Sector Protection Command Set Exit (7) 2 XX 90 XX 00 02 PWD 2 03 PWD 3 PPB Lock Bit DYB 86 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 12.2 Sector Protection Commands (Sheet 2 of 2) Command Sequence (Notes) Cycles Bus Cycles (Note 1 - 6) First Second Addr Data (10) Addr Data( (10) PA Data Program 2 555 A0 Sector Erase 2 555 80 SA 30 Chip Erase 2 555 80 555 10 Asynchronous Read 1 RA RD Write to Buffer 4 SA 25 SA WC Program Buffer to Flash 1 SA 29 Third Fourth Addr Data( (10) Addr Data( (10) PA PD WBL PD Fifth Addr Data( (10) Sixth Addr Data( (10) Seventh Addr Data( (10) Accelerated Legend X = Don't care RA = Read Address RD = Read Data PA = Program Address. Addresses latch on the rising edge of the AVD# pulse or active edge of CLK, whichever occurs first. PD = Program Data. Data latches on the rising edge of WE# or CE# pulse, whichever occurs first. SA = Sector Address: WS128P = A22-A14, WS256P = 23-A14 BA = Bank Address: WS128P = A22-A20, and A19; WS256P = A23-A20 CR = Configuration Register data bits D15-D0 PWD3-PWD0 = Password Data. PD3-PD0 present four 16 bit combinations that represent the 64-bit Password. PWA = Password Address. Address bits A1 and A0 are used to select each 16-bit portion of the 64-bit entity. PWD = Password Data RD(0) = DQ0 protection indicator bit. If protected, DQ0 = 0, if unprotected, DQ0 = 1. WBL = Write Buffer Location. Address must be within the same write buffer page as PA. WC = Word Count. Number of write buffer locations to load minus 1. Notes 1. See Table 7.1 for description of bus operations. 2. All values are in hexadecimal. 3. Except for the following, all bus cycles are write cycle: read cycle, fourth through sixth cycles of the Autoselect commands, fourth cycle of the configuration register verify and password verify commands, and any cycle reading at RD(0) and RD(1). 4. Data bits DQ15-DQ8 are don't care in command sequences, except for RD, PD, WD, PWD, and PWD3-PWD0. 5. Entry commands are required to enter a specific mode to enable instructions only available within that mode. 6. If both the Persistent Protection Mode Locking Bit and the Password Protection Mode Locking Bit are set at the same time, the command operation aborts and returns the device to the default Persistent Sector Protection Mode during 2nd bus cycle. Note that on all future devices, addresses equal 00h, but is currently 77h for the WS512P only. 7. Exit command must be issued to reset the device into read mode; device may otherwise be placed in an unknown state. 8. "All PPB Erase" command pre-programs all PPBs before erasure to prevent over-erasure. 9. Entire two bus-cycle sequence must be entered for each portion of the password. 10. Full address range is required for reading password. January 28, 2008 S29WS-P_00_A12 S29WS-P 87 D at a 12.1 S hee t Common Flash Memory Interface The Common Flash Interface (CFI) specification outlines device and host system software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can standardize their existing interfaces for long-term compatibility. This device enters the CFI Query mode when the system writes the CFI Query command, 98h, to address (BA)555h any time the device is ready to read array data. The system can read CFI information at the addresses given in Tables 12.3-12.6 within that bank. All reads outside of the CFI address range, within the bank, returns non-valid data. Reads from other banks are allowed, writes are not. To terminate reading CFI data, the system must write the reset command. The following is a C source code example of using the CFI Entry and Exit functions. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: CFI Entry command */ *( (UINT16 *)bank_addr + 0x555 ) = 0x0098; /* write CFI entry command */ /* Example: CFI Exit command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x00F0; /* write cfi exit command */ For further information, please refer to the CFI Specification (see JEDEC publications JEP137-A and JESD68.01). Please contact your sales office for copies of these documents. Table 12.3 CFI Query Identification String Addresses Data 10h 11h 12h 0051h 0052h 0059h Description Query Unique ASCII string QRY 13h 14h 0002h 0000h Primary OEM Command Set 15h 16h 0040h 0000h Address for Primary Extended Table 17h 18h 0000h 0000h Alternate OEM Command Set (00h = none exists) 19h 1Ah 0000h 0000h Address for Alternate OEM Extended Table (00h = none exists) Table 12.4 System Interface String Addresses 88 Data Description 1Bh 0017h VCC Min. (write/erase) D7-D4: volt, D3-D0: 100 millivolt 1Ch 0019h VCC Max. (write/erase) D7-D4: volt, D3-D0: 100 millivolt 1Dh 0000h VPP Min. voltage (00h = no VPP pin present) 1Eh 0000h VPP Max. voltage (00h = no VPP pin present) 1Fh 0005h Typical Program Time per single word write 2N s (e.g. 30us) 20h 0009h Typical Program Time using buffer 2N s (e.g. 300us) (00h = not supported) 21h 000Ah Typical time for sector erase 2N ms 22h 0000h Typical time for full chip erase 2N ms (00h = not supported) 23h 0003h Max. Program Time per single word [2N times typical value] 24h 0003h Max. Program Time using buffer [2N times typical value] 25h 0003h Max. time for sector erase [2N times typical value] 26h 0000h Max. time for full chip erase [2N times typical value] (00h = not supported) S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 12.5 Device Geometry Definition Addresses Data Description 27h 0018h (WS128P) 0019h (WS256P) 001Ah (WS512P) 28h 29h 0001h 0000h Flash Device Interface 0h=x8; 1h=x16; 2h=x8/x16; 3h=x32 [lower byte] [upper byte] (00h = not supported) 2Ah 2Bh 0006h 0000h Max. number of bytes in multi-byte buffer write = 2N [lower byte] [upper byte] (00h = not supported) 2Ch 0003h 2Dh 2Eh 2Fh 30h 0003h 0000h 0080h 0000h Device Size = 2N byte Number of Erase Block Regions within device 01h = Uniform Sector; 02h = Boot + Uniform; 03h = Boot + Uniform + Boot Erase Block Region 1 Information (Small Sector Section) [lower byte] - Number of sectors. 00h=1 sector; 01h=2 sectors ... 03h=4 sectors [upper byte] [lower byte] - Equation =>(n = Density in Bytes of any 1 sector/256)h [upper byte] Erase Block Region 2 Information (Large Sector Section) 31h 32h 33h 007Dh (WS128P) 00FDh (WS256P) 00FDh (WS512P) 0001h 0000h 0002h 34h [lower byte] - Number of sectors. [upper byte] [lower byte] - Equation =>(n = Density in Bytes of any 1 sector/256)h [upper byte] Erase Block Region 3 Information (Small Sector Section) 35h 36h 37h 38h 0003h 0000h 0080h 0000h 39h 3Ah 3Bh 3Ch 0000h 0000h 0000h 0000h January 28, 2008 S29WS-P_00_A12 [lower byte] - Number of sectors. 00h=1 sector; 01h=2 sectors ... 03h=4 sectors [upper byte] [lower byte] - Equation =>(n = Density in Bytes of any 1 sector/256)h [upper byte] Erase Block Region 4 Information S29WS-P 89 D at a S hee t Table 12.6 Primary Vendor-Specific Extended Query (Sheet 1 of 2) 90 Addresses Data Description 40h 41h 42h 0050h 0052h 0049h Query-unique ASCII string PRI 43h 0031h Major CFI version number, ASCII 44h 0034h Minor CFI version number, ASCII 45h 0101b Address Sensitive Unlock (Bits 1-0) 00b = Required, 01b = Not Required Silicon Technology (Bits 5-2) 0011b = 130nm; 0100b = 110nm; 0101b = 90nm 001010b = 000Ah 46h 0002h Erase Suspend 0 = Not Supported, 1 = To Read Only, 2 = To Read & Write 47h 0001h Sector Protection per Group 0 = Not Supported, X = Number of sectors in per group 48h 0000h Sector Temporary Unprotect 00 = Not Supported, 01 = Supported 49h 0008h Sector Protect/Unprotect scheme 08h = Advanced Sector Protection; 07h = New Sector Protection Scheme 4Ah 07Bh (WS128P) 0F3h (WS256P) 1E3h (WS512P) 4Bh 0001h Burst Mode Type 00 = Not Supported, 01 = Supported 4Ch 0002h Page Mode Type 00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page, 04 = 16 Word Page 4Dh 0085h 4Eh 0095h 4Fh 0001h 50h 0001h 51h 0001h 52h 0008h Secured Silicon Sector (Customer OTP Area) Size 2N bytes 53h 0014h Hardware Reset Low Time-out during an embedded algorithm to read mode Maximum 2N ns (e.g. 10us => n=14) 54h 0014h Hardware Reset Low Time-out not during an embedded algorithm to read mode Maximum 2N ns (e.g. 10us => n=14) 55h 0005h Erase Suspend Time-out Maximum 2N s 56h 0005h Program Suspend Time-out Maximum 2N s 57h 0010h Bank Organization: X = Number of banks 58h 0007h (WS064P) 000Bh (WS128P) 0013h (WS256P) 0023h (WS512P) Bank 0 Region Information. X = Number of sectors in bank 59h 0004h (WS064P) 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 1 Region Information. X = Number of sectors in bank 5Ah 0004h (WS064P) 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 2 Region Information. X = Number of sectors in bank 5Bh 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 3 Region Information. X = Number of sectors in bank Simultaneous Operation Number of Sectors in all banks except boot bank ACC (Acceleration) Supply Minimum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV ACC (Acceleration) Supply Maximum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV Write Protect Function 00h = No Boot, 01h = Dual Boot, 02h = Bottom Boot, 03h = Top Boot Program Suspend. 00h = not supported Unlock Bypass 00 = Not Supported, 01=Supported S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Table 12.6 Primary Vendor-Specific Extended Query (Sheet 2 of 2) Addresses Data 5Ch 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 4 Region Information. X = Number of sectors in bank 5Dh 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 5 Region Information. X = Number of sectors in bank 5Eh 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 6 Region Information. X = Number of sectors in bank 5Fh 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 7 Region Information. X = Number of sectors in bank 60h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 8 Region Information. X = Number of sectors in bank 61h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 9 Region Information. X = Number of sectors in bank 62h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 10 Region Information. X = Number of sectors in bank 63h 0008h (WS128P) 0010h (WS256P) Description Bank 11 Region Information. X = Number of sectors in bank 0020h (WS512P) 64h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 12 Region Information. X = Number of sectors in bank 65h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 13 Region Information. X = Number of sectors in bank 66h 0008h (WS128P) 0010h (WS256P) 0020h (WS512P) Bank 14 Region Information. X = Number of sectors in bank 67h 000Bh (WS128P) 0013h (WS256P) 0023h (WS512P) Bank 15 Region Information. X = Number of sectors in bank January 28, 2008 S29WS-P_00_A12 S29WS-P 91 D at a S hee t 13. Revision History Section Description Revision A6 (November 3, 2006) Features Removed Zero Hold mode Switching Waveforms Revised VCC Power-up diagram Timing Diagrams Changed tCR to tRDY in figure 11.7 and figure 11.8 Revision A7 (November 8, 2006) Features Erase/Program Timing CMOS Compatible Updated Effective Write Buffer Programming Per Word tESL changed to Max tPSL changed to Max Removed Note 2 from table. Revision A8 (March 9, 2007) Asynchronous Mode Read Changed tCR to tRDY in figures 11.9 through 11.12 Revised Device Geometry table: * Changed WS512P data to 00FDh Common Flash Memory Interface * Address 32h - Data changed to 001h * Address 33h - Data changed to 000h * Address 34h - Data changed to 002h Revised CFI table: removed Uniform Bottom, Uniform Top, and All sectors for Address 4Fh DC Characteristics Revised ICCB Burst table Revision A9 (March 28, 2007) DC Characteristics Revised ICCB for 108 MHz frequencies to TBA Synchronous/Burst Read Revised tRACC to 7.6 ns Asynchronous Mode Read Revised tAAVDH to 4 ns Revision A10 (April 20, 2007) Removed wait state below 14 MHz, wait state 2 AC Characteristics Added additional wait state to all wait state frequency in table 11.4 Added Continuous Burst Mode Synchronous Wait State Requirement table Revised Burst Access Time to (WS-1) * tCK + (tBACC) Revision A11 (September 28, 2007) Data Sheet Status Changed to Production Global Changed all 108 MHz to 104 MHz Latency Added 10 wait state and 11 wait state latency tables Configuration Registers Added two more configurations to CR0.11 for 10th and 11th rising CLK edge AC Characteristics DC Characteristics Revised tCES to 6 ns Revised tAVD to tCLK Changed description of ICC2 to VCC Active Program/Erase Current Change descritpion of ICC5 to VCC Active Current (Read while Program/Erase) Revised: tERS to 40 s Erase/Program Timing and Performance tESL to 40 s tPSL to 40 s tPRS to 40 s Output Slew Rate Deleted Programmable Outuput Slew Rate Control section Revision A12 (January 28, 2008) Configuration Registers 92 Changed CR0.14 default setting to 1 S29WS-P S29WS-P_00_A12 January 28, 2008 Data She et Section Description AC Characteristics Added device Vcc ramp rate limit. Updated timing diagrams for Synchronous/Burst Read, Asynchronous Program Operation, Synchronous Program Operation, and Chip Sector Erase Command Sequence. Program/Erase Operations Added details to Program and Erase Suspend/Resume operations January 28, 2008 S29WS-P_00_A12 S29WS-P 93 D at a S hee t Colophon The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products. Trademarks and Notice The contents of this document are subject to change without notice. This document may contain information on a Spansion product under development by Spansion. Spansion reserves the right to change or discontinue work on any product without notice. The information in this document is provided as is without warranty or guarantee of any kind as to its accuracy, completeness, operability, fitness for particular purpose, merchantability, non-infringement of third-party rights, or any other warranty, express, implied, or statutory. Spansion assumes no liability for any damages of any kind arising out of the use of the information in this document. Copyright (c) 2006-2008 Spansion Inc. All rights reserved. Spansion(R), the Spansion Logo, MirrorBit(R), MirrorBit(R) EclipseTM, ORNANDTM, HD-SIMTM and combinations thereof, are trademarks of Spansion LLC in the US and other countries. Other names used are for informational purposes only and may be trademarks of their respective owners. 94 S29WS-P S29WS-P_00_A12 January 28, 2008