M25P80-VMP6TP - Micron Technology, Inc.

July 2008 Rev 17 1/53

M25P80

8 Mbit, low voltage, serial Flash memory

with 75 MHz SPI bus interface

Features

■SPI bus compatible serial interface

■75 MHz Clock rate (maximum)

■2.7 V to 3.6 V single supply voltage

■8 Mbit of Flash memory

■Page Program (up to 256 bytes) in 0.64 ms

(typical)

■Sector Erase (512 Kbit) in 0.6 s (typical)

■Bulk Erase (8 Mbit) in 8 s (typical)

■Hardware Write protection: protected area size

defined by three non-volatile bits (BP0, BP1

and BP2)

■Deep Power-down mode 1 μA (typical)

■Electronic signatures

– JEDEC Standard two-byte signature

(2014h)

– Unique ID code (UID) +16 bytes of CFI

data

– RES instruction one-byte signature (13h)

for backward compatibility

■More than 100 000 Program/Erase cycles per

sector

■More than 20 years’ data retention

■Packages

– ECOPACK® (RoHS compliant)

SO8W (MW)

208 mils width

VFQFPN8 (MP)

6 × 5 mm (MLP8)

SO8N (MN)

150 mils width

www.numonyx.com

Contents M25P80
2/53   
Contents
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
1 Serial Data output (Q)   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
2 Serial Data input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
3 Serial Clock (C)   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
4 Chip Select (S)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
5 Hold (HOLD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
6 Write Protect (W)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  8
7 VCC supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  9
8 VSS ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  9
SPI modes  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Operating features   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1 Page Programming   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  12
2 Sector Erase and Bulk Erase  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  12
3 Polling During a Write, Program or Erase Cycle   . . . . . . . . . . . . . . . . . . .  12
4 Active Power, Standby Power and Deep Power-down modes . . . . . . . . .  13
5 Status Register  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  13
6 Protection modes  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  13
7 Hold condition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  14
Memory organization  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Instructions  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
1 Write Enable (WREN)   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  19
2 Write Disable (WRDI)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  20
3 Read Identification (RDID)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  21
4 Read Status Register (RDSR)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  23
4.1 WIP bit  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
4.2 WEL bit   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
4.3 BP2, BP1, BP0 bits  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23

M25P80 Contents
 3/53
4.4 SRWD bit  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
5 Write Status Register (WRSR)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  25
6 Read Data Bytes (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  27
7 Read Data Bytes at Higher Speed (FAST_READ)  . . . . . . . . . . . . . . . . . .  28
8 Page Program (PP)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  29
9 Sector Erase (SE)   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  31
10 Bulk Erase (BE)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  32
11 Deep Power-down (DP)  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  33
12 Release from Deep Power-down and Read Electronic Signature (RES) .  34
Power-up and Power-down  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
DC and AC parameters  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Part numbering  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Revision history   . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

List of tables M25P80
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List of tables
Table 1. Signal names  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Table 2. Protected area sizes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Table 3. Memory organization  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Table 4. Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Table 5. Read Identification (RDID) data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Table 6. Status Register format  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Table 7. Protection modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Table 8. Power-up timing and VWI threshold . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Table 9. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Table 10. Operating conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 11. Data retention and endurance  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 12. AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 13. Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Table 14. DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Table 15. AC characteristics (75 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 16. AC characteristics (25 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 17. VFQFPN8 (MLP8) 8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Table 18. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width,
package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47
Table 19. SO8N – 8 lead Plastic Small Outline, 150 mils body width, package
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48
Table 20. Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49
Table 21. Document revision history  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51

M25P80 List of figures
 5/53
List of figures
Figure 1. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 2. VFQFPN and SO8 connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 3. Bus Master and memory devices on the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 4. SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Figure 5. Hold condition activation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Figure 6. Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Figure 7. Write Enable (WREN) instruction sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Figure 8. Write Disable (WRDI) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Figure 9. Read Identification (RDID) instruction sequence and data-out sequence  . . . . . . . . . . . . . 22
Figure 10. Read Status Register (RDSR) instruction sequence and data-out sequence  . . . . . . . . . . 24
Figure 11. Write Status Register (WRSR) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Figure 12. Read Data Bytes (READ) instruction sequence and data-out sequence . . . . . . . . . . . . . . 27
Figure 13. Read Data Bytes at Higher Speed (FAST_READ) instruction sequence
and data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Figure 14. Page Program (PP) instruction sequence  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Figure 15. Sector Erase (SE) instruction sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
Figure 16. Bulk Erase (BE) instruction sequence  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 17. Deep Power-down (DP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Figure 18. Release from Deep Power-down and Read Electronic Signature (RES) instruction
sequence and data-out sequence  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 19. Release from Deep Power-down (RES) instruction sequence . . . . . . . . . . . . . . . . . . . . . . 35
Figure 20. Power-up timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 21. AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 22. Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Figure 23. Write Protect setup and hold timing during WRSR when SRWD = 1 . . . . . . . . . . . . . . . . . 44
Figure 24. Hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Figure 25. Output timing  . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Figure 26. VFQFPN8 (MLP8) 8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46
Figure 27. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, package outline . . . . . . . . 47
Figure 28. SO8N – 8 lead Plastic Small Outline, 150 mils body width, package outline . . . . . . . . . . . 48

Description M25P80

6/53

1 Description

The M25P80 is an 8 Mbit (1 Mbit × 8) Serial Flash memory, with advanced write protection

mechanisms, accessed by a high speed SPI-compatible bus.

The memory can be programmed 1 to 256 bytes at a time, using the Page Program

instruction.

The memory is organized as 16 sectors, each containing 256 pages. Each page is 256

bytes wide. Thus, the whole memory can be viewed as consisting of 4096 pages, or

1,048,576 bytes.

The whole memory can be erased using the Bulk Erase instruction, or a sector at a time,

using the Sector Erase instruction.

In order to meet environmental requirements, Numonyx offers the M25P80 in ECOPACK®

packages. ECOPACK® packages are Lead-free and RoHS compliant.

Figure 1. Logic diagram

Table 1. Signal names

Signal name Function Direction

C Serial Clock Input

D Serial Data input Input

Q Serial Data output Output

S Chip Select Input

W Write Protect Input

HOLD Hold Input

VCC Supply voltage

VSS Ground

AI04964

VCC

M25P80

HOLD

VSS

M25P80 Description

7/53

Figure 2. VFQFPN and SO8 connections

1. There is an exposed central pad on the underside of the VFQFPN package. This is pulled, internally, to

VSS, and must not be allowed to be connected to any other voltage or signal line on the PCB.

2. See Package mechanical section for package dimensions, and how to identify pin-1.

AI04965B

5DVSS C

HOLDQ

M25P80

Signal description M25P80

8/53

2 Signal description

2.1 Serial Data output (Q)

This output signal is used to transfer data serially out of the device. Data is shifted out on the

falling edge of Serial Clock (C).

2.2 Serial Data input (D)

This input signal is used to transfer data serially into the device. It receives instructions,

addresses, and the data to be programmed. Values are latched on the rising edge of Serial

Clock (C).

2.3 Serial Clock (C)

This input signal provides the timing of the serial interface. Instructions, addresses, or data

present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on

Serial Data Output (Q) changes after the falling edge of Serial Clock (C).

2.4 Chip Select (S)

When this input signal is High, the device is deselected and Serial Data Output (Q) is at high

impedance. Unless an internal Program, Erase or Write Status Register cycle is in progress,

the device will be in the Standby mode (this is not the Deep Power-down mode). Driving

Chip Select (S) Low enables the device, placing it in the active power mode.

After Power-up, a falling edge on Chip Select (S) is required prior to the start of any

instruction.

2.5 Hold (HOLD)

The Hold (HOLD) signal is used to pause any serial communications with the device without

deselecting the device.

During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data

Input (D) and Serial Clock (C) are Don’t Care.

To start the Hold condition, the device must be selected, with Chip Select (S) driven Low.

2.6 Wr ite Pr otect (W)

The main purpose of this input signal is to freeze the size of the area of memory that is

protected against program or erase instructions (as specified by the values in the BP2, BP1

and BP0 bits of the Status Register).

M25P80 Signal description

9/53

2.7 VCC supply volt age

VCC is the supply voltage.

2.8 VSS ground

VSS is the reference for the VCC supply voltage.

SPI modes M25P80

10/53

3 SPI modes

These devices can be driven by a microcontroller with its SPI peripheral running in either of

the two following modes:

●CPOL=0, CPHA=0

●CPOL=1, CPHA=1

For these two modes, input data is latched in on the rising edge of Serial Clock (C), and

output data is available from the falling edge of Serial Clock (C).

The difference between the two modes, as shown in Figure 4, is the clock polarity when the

bus master is in Standby mode and not transferring data:

●C remains at 0 for (CPOL=0, CPHA=0)

●C remains at 1 for (CPOL=1, CPHA=1)

Figure 3. Bus Master and memory devices on the SPI bus

1. The Write Protect (W) and Hold (HOLD) signals should be driven, High or Low as appropriate.

Figure 3 shows an example of three devices connected to an MCU, on an SPI bus. Only

one device is selected at a time, so only one device drives the Serial Data Output (Q) line at

a time, the other devices are high impedance. Resistors R (represented in Figure 3) ensure

that the M25P80 is not selected if the Bus Master leaves the S line in the high impedance

state. As the Bus Master may enter a state where all inputs/outputs are in high impedance at

the same time (for example, when the Bus Master is reset), the clock line (C) must be

connected to an external pull-down resistor so that, when all inputs/outputs become high

impedance, the S line is pulled High while the C line is pulled Low (thus ensuring that S and

C do not become High at the same time, and so, that the tSHCH requirement is met). The

typical value of R is 100 kΩ, assuming that the time constant R*Cp (Cp = parasitic

capacitance of the bus line) is shorter than the time during which the Bus Master leaves the

SPI bus in high impedance.

AI12836b

SPI Bus Master

SPI Memory

Device

SDO

SDI

SCK

CQD

SPI Memory

Device

CQD

SPI Memory

Device

CQD

CS3 CS2 CS1

SPI Interface with

(CPOL, CPHA) =

(0, 0) or (1, 1)

WHOLD WHOLD WHOLD

RR R

VCC VCC VCC

VSS VSS VSS

M25P80 SPI modes

11/53

Example: Cp = 50 pF, that is R*Cp = 5 μs <=> the application must ensure that the Bus

Master never leaves the SPI bus in the high impedance state for a time period shorter than

5μs.

Figure 4. SPI modes supported

AI01438

MSB

CPHA

CPOL

MSB

Ope rating f eatures M25P80

12/53

4 Operating features

4.1 Page Programming

To program one data byte, two instructions are required: Write Enable (WREN), which is

one byte, and a Page Program (PP) sequence, which consists of four bytes plus data. This

is followed by the internal Program cycle (of duration tPP).

To spread this overhead, the Page Program (PP) instruction allows up to 256 bytes to be

programmed at a time (changing bits from 1 to 0), provided that they lie in consecutive

addresses on the same page of memory.

For optimized timings, it is recommended to use the Page Program (PP) instruction to

program all consecutive targeted bytes in a single sequence versus using several Page

Program (PP) sequences with each containing only a few bytes (see Page Program (PP),

and Table 15: AC characteristics (75 MHz operation)).

4.2 Sector Erase and Bulk Erase

The Page Program (PP) instruction allows bits to be reset from 1 to 0. Before this can be

applied, the bytes of memory need to have been erased to all 1s (FFh). This can be

achieved either a sector at a time, using the Sector Erase (SE) instruction, or throughout the

entire memory, using the Bulk Erase (BE) instruction. This starts an internal Erase cycle (of

duration tSE or tBE).

The Erase instruction must be preceded by a Write Enable (WREN) instruction.

4.3 Polling During a Write, Program or Erase Cycle

A further improvement in the time to Write Status Register (WRSR), Program (PP) or Erase

(SE or BE) can be achieved by not waiting for the worst case delay (tW, tPP

, tSE, or tBE). The

Write In Progress (WIP) bit is provided in the Status Register so that the application program

can monitor its value, polling it to establish when the previous Write cycle, Program cycle or

Erase cycle is complete.

M25P80 Op erati n g fe atures

13/53

4.4 Active Power, S tandby Power and Deep Power-down modes

When Chip Select (S) is Low, the device is enabled, and in the Active Power mode.

When Chip Select (S) is High, the device is disabled, but could remain in the Active Power

mode until all internal cycles have completed (Program, Erase, Write Status Register). The

device then goes in to the Standby Power mode. The device consumption drops to ICC1.

The Deep Power-down mode is entered when the specific instruction (the Enter Deep

Power-down mode (DP) instruction) is executed. The device consumption drops further to

ICC2. The device remains in this mode until another specific instruction (the Release from

Deep Power-down mode and Read Electronic Signature (RES) instruction) is executed.

All other instructions are ignored while the device is in the Deep Power-down mode. This

can be used as an extra software protection mechanism, when the device is not in active

use, to protect the device from inadvertent Write, Program or Erase instructions.

4.5 Status Register

The Status Register contains a number of status and control bits that can be read or set (as

appropriate) by specific instructions. For a detailed description of the Status Register bits,

see Section 6.4: Read Status Register (RDSR).

4.6 Protection modes

The environments where non-volatile memory devices are used can be very noisy. No SPI

device can operate correctly in the presence of excessive noise. To help combat this, the

M25P80 boasts the following data protection mechanisms:

●Power-On Reset and an internal timer (tPUW) can provide protection against

inadvertent changes while the power supply is outside the operating specification.

●Program, Erase and Write Status Register instructions are checked that they consist of

a number of clock pulses that is a multiple of eight, before they are accepted for

execution.

●All instructions that modify data must be preceded by a Write Enable (WREN)

instruction to set the Write Enable Latch (WEL) bit. This bit is returned to its reset state

by the following events:

– Power-up

– Write Disable (WRDI) instruction completion

– Write Status Register (WRSR) instruction completion

– Page Program (PP) instruction completion

– Sector Erase (SE) instruction completion

– Bulk Erase (BE) instruction completion

●The Block Protect (BP2, BP1, BP0) bits allow part of the memory to be configured as

read-only. This is the Software Protected Mode (SPM).

●The Write Protect (W) signal allows the Block Protect (BP2, BP1, BP0) bits and Status

Mode (HPM).

●In addition to the low power consumption feature, the Deep Power-down mode offers

extra software protection from inadvertent Write, Program and Erase instructions, as all

instructions are ignored except one particular instruction (the Release from Deep

Power-down instruction).

Ope rating f eatures M25P80

14/53

4.7 Hold condition

The Hold (HOLD) signal is used to pause any serial communications with the device without

resetting the clocking sequence. However, taking this signal Low does not terminate any

Write Status Register, Program or Erase cycle that is currently in progress.

To enter the Hold condition, the device must be selected, with Chip Select (S) Low.

The Hold condition starts on the falling edge of the Hold (HOLD) signal, provided that this

coincides with Serial Clock (C) being Low (as shown in Figure 5).

The Hold condition ends on the rising edge of the Hold (HOLD) signal, provided that this

coincides with Serial Clock (C) being Low.

If the falling edge does not coincide with Serial Clock (C) being Low, the Hold condition

starts after Serial Clock (C) next goes Low. Similarly, if the rising edge does not coincide

with Serial Clock (C) being Low, the Hold condition ends after Serial Clock (C) next goes

Low. (This is shown in Figure 5).

During the Hold condition, the Serial Data Output (Q) is high impedance, and Serial Data

Input (D) and Serial Clock (C) are Don’t Care.

Normally, the device is kept selected, with Chip Select (S) driven Low, for the whole duration

of the Hold condition. This is to ensure that the state of the internal logic remains unchanged

from the moment of entering the Hold condition.

If Chip Select (S) goes High while the device is in the Hold condition, this has the effect of

resetting the internal logic of the device. To restart communication with the device, it is

necessary to drive Hold (HOLD) High, and then to drive Chip Select (S) Low. This prevents

the device from going back to the Hold condition.

Table 2. Pro tect ed area sizes

St atus Register

content Memory content

BP2

bit BP1

bit BP0

bit Protected area Unprotected area

0 0 0 none All sectors(1) (sixteen sectors: 0 to 15)

1. The device is ready to accept a Bulk Erase instruction if, and only if, all Block Protect (BP2, BP1, BP0) are

0 0 1 Upper sixteenth (Sector 15) Lower fifteen-sixteenths (fifteen sectors:

0 to 14)

0 1 0 Upper eighth (two sectors: 14 and 15) Lower seven-eighths (fourteen sectors:

0 to 13)

0 1 1 Upper quarter (four sectors: 12 to 15) Lower three-quarters (twelve sectors: 0

to 11)

1 0 0 Upper half (eight sectors: 8 to 15) Lower half (eight sectors: 0 to 7)

1 0 1 All sectors (sixteen sectors: 0 to 15) none

1 1 0 All sectors (sixteen sectors: 0 to 15) none

1 1 1 All sectors (sixteen sectors: 0 to 15) none

M25P80 Op erati n g fe atures

15/53

Figure 5. Hold conditi on activat ion

AI02029

HOLD

Hold

Condition

(standard use)

Hold

Condition

(non-standard use)

Memory organization M25P80

16/53

5 Memory organization

The memory is organized as:

●1,048,576 bytes (8 bits each)

●16 sectors (512 Kbits, 65536 bytes each)

●4096 pages (256 bytes each).

Each page can be individually programmed (bits are programmed from 1 to 0). The device is

Sector or Bulk Erasable (bits are erased from 0 to 1) but not Page Erasable.

Table 3. Memory organization

Sector Address range

15 F0000h FFFFFh

14 E0000h EFFFFh

13 D0000h DFFFFh

12 C0000h CFFFFh

11 B0000h BFFFFh

10 A0000h AFFFFh

9 90000h 9FFFFh

8 80000h 8FFFFh

7 70000h 7FFFFh

6 60000h 6FFFFh

5 50000h 5FFFFh

4 40000h 4FFFFh

3 30000h 3FFFFh

2 20000h 2FFFFh

1 10000h 1FFFFh

0 00000h 0FFFFh

M25P80 Memory organi za tion

17/53

Figure 6. Block diagram

AI04987

OLD

WControl Logic High Voltage

Generator

I/O Shift Register

Address Register

and Counter 256 Byte

Data Buffer

256 Bytes (Page Size)

X Decoder

Y Decoder

Size of the

read-only

memory are

Status

00000h

FFFFFh

000FFh

Instructions M25P80

18/53

6 Instructions

All instructions, addresses and data are shifted in and out of the device, most significant bit

first.

Serial Data Input (D) is sampled on the first rising edge of Serial Clock (C) after Chip Select

(S) is driven Low. Then, the one-byte instruction code must be shifted in to the device, most

significant bit first, on Serial Data input (D), each bit being latched on the rising edges of

Serial Clock (C).

The instruction set is listed in Ta bl e 4 .

Every instruction sequence starts with a one-byte instruction code. Depending on the

instruction, this might be followed by address bytes, or by data bytes, or by both or none.

In the case of a Read Data Bytes (READ), Read Data Bytes at Higher Speed (Fast_Read),

Read Status Register (RDSR), Read Identification (RDID) or Release from Deep Power-

down, and Read Electronic Signature (RES) instruction, the shifted-in instruction sequence

is followed by a data-out sequence. Chip Select (S) can be driven High after any bit of the

data-out sequence is being shifted out.

In the case of a Page Program (PP), Sector Erase (SE), Bulk Erase (BE), Write Status

instruction, Chip Select (S) must be driven High exactly at a byte boundary, otherwise the

instruction is rejected, and is not executed. That is, Chip Select (S) must driven High when

the number of clock pulses after Chip Select (S) being driven Low is an exact multiple of

eight.

All attempts to access the memory array during a Write Status Register cycle, Program

cycle or Erase cycle are ignored, and the internal Write Status Register cycle, Program

cycle or Erase cycle continues unaffected.

M25P80 Instructions

19/53

6.1 Write Enable (WREN)

The Write Enable (WREN) instruction (Figure 7) sets the Write Enable Latch (WEL) bit.

The Write Enable Latch (WEL) bit must be set prior to every Page Program (PP), Sector

Erase (SE), Bulk Erase (BE) and Write Status Register (WRSR) instruction.

The Write Enable (WREN) instruction is entered by driving Chip Select (S) Low, sending the

instruction code, and then driving Chip Select (S) High.

Table 4. Instr u ction set

Instruction Description One-byte

instruction code Address

bytes Dummy

bytes Data

bytes

WREN Write Enable 0000 0110 06h 0 0 0

WRDI Write Disable 0000 0100 04h 0 0 0

RDID(1)

1. The RDID instruction is available only for parts made with Technology T9HX (0.11μm), identified with

Process letter '4'. (Details of how to find the Technology Process in the part marking are given in AN1995,

see also Section 12: Part numbering.)

Read Identification 1001 1111 9Fh 0 0 1 to 20

RDSR Read Status Register 0000 0101 05h 0 0 1 to ∞

WRSR Write Status Register 0000 0001 01h 0 0 1

READ Read Data Bytes 0000 0011 03h 3 0 1 to ∞

FAST_READ Read Data Bytes at Higher

Speed 0000 1011 0Bh 3 1 1 to ∞

PP Page Program 0000 0010 02h 3 0 1 to 256

SE Sector Erase 1101 1000 D8h 3 0 0

BE Bulk Erase 1100 0111 C7h 0 0 0

DP Deep Power-down 1011 1001 B9h 0 0 0

RES

Release from Deep Power-

down, and Read Electronic

Signature 1010 1011 ABh

0 3 1 to ∞

Release from Deep Power-

down 0 0 0

Instructions M25P80

20/53

Figu r e 7. Write E n ab l e (WR EN ) i n struction seq uence

6.2 Write Disable (WRDI)

The Write Disable (WRDI) instruction (Figure 8) resets the Write Enable Latch (WEL) bit.

The Write Disable (WRDI) instruction is entered by driving Chip Select (S) Low, sending the

instruction code, and then driving Chip Select (S) High.

The Write Enable Latch (WEL) bit is reset under the following conditions:

●Power-up

●Write Disable (WRDI) instruction completion

●Write Status Register (WRSR) instruction completion

●Page Program (PP) instruction completion

●Sector Erase (SE) instruction completion

●Bulk Erase (BE) instruction completion

Fig u re 8. Write Disabl e (WRDI) instructio n sequence

AI02281E

21 34567

High Impedance

Instruction

AI03750D

21 34567

High Impedance

Instruction

M25P80 Instructions

21/53

6.3 Read Identification (RDID)

The Read Identification (RDID) instruction allows to read the device identification data:

●Manufacturer identification (one byte)

●Device identification (two bytes)

●A Unique ID code (UID) followed by 16 bytes of CFI data

The manufacturer identification is assigned by JEDEC, and has the value 20h for Numonyx.

The device identification is assigned by the device manufacturer, and indicates the memory

type in the first byte (20h), and the memory capacity of the device in the second byte (14h).

The UID contains the length of the following data in the first byte (set to 10h), and 16 bytes

of the optional Customized Factory Data (CFD) content. The CFD bytes are read-only and

can be programmed with customers data upon their request. If the customers do not make

requests, the devices are shipped with all the CFD bytes programmed to zero (00h).

Note: See Section 12: Part numbering on page 49 for CFD programmed devices.

Any Read Identification (RDID) instruction while an Erase or Program cycle is in progress, is

not decoded, and has no effect on the cycle that is in progress.

The device is first selected by driving Chip Select (S) Low. Then, the 8-bit instruction code

for the instruction is shifted in. After this, the 24-bit device identification, stored in the

memory, the 8-bit Unique ID code followed by 16 bytes of CFI content will be shifted out on

Serial Data Output (Q). Each bit is shifted out during the falling edge of Serial Clock (C).

The instruction sequence is shown in Figure 9.

The Read Identification (RDID) instruction is terminated by driving Chip Select (S) High at

any time during data output.

When Chip Select (S) is driven High, the device is put in the Standby Power mode. Once in

the Standby Power mode, the device waits to be selected, so that it can receive, decode and

execute instructions.

Table 5. Read Identification (RDID) dat a-out sequence

Manufacturer

identification

Device identification UID CFI content

Memory type Memory capacity

20h 20h 14h 10h 16 bytes

Instructions M25P80

22/53

Figure 9. Read Identifica tion (RDID) instruction seque nce and data-out seque nce

213456789101112131415

Instruction

AI06809c

Manufacturer Identification

High Impedance

MSB

Device Identification

MSB

15 14 13 3 2 1 0

16 17 18 28 29 30 31

MSB

UID + CFI Data

M25P80 Instructions

23/53

6.4 Read Status Register (RDSR)

The Read Status Register (RDSR) instruction allows the Status Register to be read. The

Status Register may be read at any time, even while a Program, Erase or Write Status

check the Write In Progress (WIP) bit before sending a new instruction to the device. It is

also possible to read the Status Register continuously, as shown in Figure 10.

The status and control bits of the Status Register are as follows:

6.4.1 WIP bit

The Write In Progress (WIP) bit indicates whether the memory is busy with a Write Status

0 no such cycle is in progress.

6.4.2 WEL bit

The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch.

When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable

Latch is reset and no Write Status Register, Program or Erase instruction is accepted.

6.4.3 BP2, BP1, BP0 bits

The Block Protect (BP2, BP1, BP0) bits are non-volatile. They define the size of the area to

be software protected against Program and Erase instructions. These bits are written with

the Write Status Register (WRSR) instruction. When one or both of the Block Protect (BP2,

BP1, BP0) bits is set to 1, the relevant memory area (as defined in Tabl e 2 ) becomes

protected against Page Program (PP) and Sector Erase (SE) instructions. The Block Protect

(BP2, BP1, BP0) bits can be written provided that the Hardware Protected mode has not

been set. The Bulk Erase (BE) instruction is executed if, and only if, both Block Protect

(BP2, BP1, BP0) bits are 0.

6.4.4 SRWD bit

The Status Register Write Disable (SRWD) bit is operated in conjunction with the Write

Protect (W) signal. The Status Register Write Disable (SRWD) bit and Write Protect (W)

signal allow the device to be put in the Hardware Protected mode (when the Status Register

Write Disable (SRWD) bit is set to 1, and Write Protect (W) is driven Low). In this mode, the

non-volatile bits of the Status Register (SRWD, BP2, BP1, BP0) become read-only bits and

the Write Status Register (WRSR) instruction is no longer accepted for execution.

Table 6. Status Re g ister fo rmat

b7 b0

SRWD 0 0 BP2 BP1 BP0 WEL WIP

Status Register Write Protect

Block Protect bits

Write Enable Latch bit

Write In Progress bit

Instructions M25P80

24/53

Figure 10. Re ad Stat us R egist er (RDSR) instruction sequence and data-out

sequence

21 3456789101112131415

Instruction

AI02031E

Q76543210

Status Register Out

High Impedance

MSB

76543210

Status Register Out

MSB

M25P80 Instructions

25/53

6.5 Write Stat us Register (WRSR )

The Write Status Register (WRSR) instruction allows new values to be written to the Status

have been executed. After the Write Enable (WREN) instruction has been decoded and

executed, the device sets the Write Enable Latch (WEL).

The Write Status Register (WRSR) instruction is entered by driving Chip Select (S) Low,

followed by the instruction code and the data byte on Serial Data input (D).

The instruction sequence is shown in Figure 11.

The Write Status Register (WRSR) instruction has no effect on b6, b5, b1 and b0 of the

Status Register. b6 and b5 are always read as 0.

Chip Select (S) must be driven High after the eighth bit of the data byte has been latched in.

If not, the Write Status Register (WRSR) instruction is not executed. As soon as Chip Select

(S) is driven High, the self-timed Write Status Register cycle (whose duration is tW) is

initiated. While the Write Status Register cycle is in progress, the Status Register may still

be read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP)

bit is 1 during the self-timed Write Status Register cycle, and is 0 when it is completed.

When the cycle is completed, the Write Enable Latch (WEL) is reset.

The Write Status Register (WRSR) instruction allows the user to change the values of the

Block Protect (BP2, BP1, BP0) bits, to define the size of the area that is to be treated as

read-only, as defined in Ta ble 2 . The Write Status Register (WRSR) instruction also allows

the user to set or reset the Status Register Write Disable (SRWD) bit in accordance with the

Write Protect (W) signal. The Status Register Write Disable (SRWD) bit and Write Protect

(W) signal allow the device to be put in the Hardware Protected Mode (HPM). The Write

Status Register (WRSR) instruction is not executed once the Hardware Protected Mode

(HPM) is entered.

Figure 11. Write Stat us Regi ster (WRSR) instruction sequence

AI02282D

21 3456789101112131415

High Impedance

Instruction Status

765432 0

MSB

Instructions M25P80

26/53

The protection features of the device are summarized in Table 7.

When the Status Register Write Disable (SRWD) bit of the Status Register is 0 (its initial

delivery state), it is possible to write to the Status Register provided that the Write Enable

Latch (WEL) bit has previously been set by a Write Enable (WREN) instruction, regardless

of the whether Write Protect (W) is driven High or Low.

When the Status Register Write Disable (SRWD) bit of the Status Register is set to 1, two

cases need to be considered, depending on the state of Write Protect (W):

●If Write Protect (W) is driven High, it is possible to write to the Status Register provided

that the Write Enable Latch (WEL) bit has previously been set by a Write Enable

(WREN) instruction.

●If Write Protect (W) is driven Low, it is not possible to write to the Status Register even

if the Write Enable Latch (WEL) bit has previously been set by a Write Enable (WREN)

instruction. (Attempts to write to the Status Register are rejected, and are not accepted

for execution). As a consequence, all the data bytes in the memory area that are

software protected (SPM) by the Block Protect (BP2, BP1, BP0) bits of the Status

Regardless of the order of the two events, the Hardware Protected Mode (HPM) can be

entered:

●by setting the Status Register Write Disable (SRWD) bit after driving Write Protect (W)

Low

●or by driving Write Protect (W) Low after setting the Status Register Write Disable

(SRWD) bit.

The only way to exit the Hardware Protected Mode (HPM) once entered is to pull Write

Protect (W) High.

If Write Protect (W) is permanently tied High, the Hardware Protected Mode (HPM) can

never be activated, and only the Software Protected Mode (SPM), using the Block Protect

(BP2, BP1, BP0) bits of the Status Register, can be used.

Table 7. Protection modes

signal SRWD

bit Mode Write Pr otection of the

Status Register

Memory content

Protected area(1)

1. As defined by the values in the Block Protect (BP2, BP1, BP0) bits of the Status Register, as shown in

Table 2.

Unprotected area(1)

Software

Protected

(SPM)

Status Register is

Writable (if the WREN

instruction has set the

WEL bit)

The values in the SRWD,

BP2, BP1 and BP0 bits

can be changed

Protected against

Page Program,

Sector Erase and

Bulk Erase

Ready to accept

Page Program and

Sector Erase

instructions

Hardware

Protected

(HPM)

Status Register is

Hardware write protected

The values in the SRWD,

BP2, BP1 and BP0 bits

cannot be changed

Protected against

Page Program,

Sector Erase and

Bulk Erase

Ready to accept

Page Program and

Sector Erase

instructions

M25P80 Instructions

27/53

6.6 Read Data Bytes (READ)

The device is first selected by driving Chip Select (S) Low. The instruction code for the Read

Data Bytes (READ) instruction is followed by a 3-byte address (A23-A0), each bit being

latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that

address, is shifted out on Serial Data Output (Q), each bit being shifted out, at a maximum

frequency fR, during the falling edge of Serial Clock (C).

The instruction sequence is shown in Figure 12.

The first byte addressed can be at any location. The address is automatically incremented

to the next higher address after each byte of data is shifted out. The whole memory can,

therefore, be read with a single Read Data Bytes (READ) instruction. When the highest

address is reached, the address counter rolls over to 000000h, allowing the read sequence

to be continued indefinitely.

The Read Data Bytes (READ) instruction is terminated by driving Chip Select (S) High. Chip

Select (S) can be driven High at any time during data output. Any Read Data Bytes (READ)

instruction, while an Erase, Program or Write cycle is in progress, is rejected without having

any effects on the cycle that is in progress.

Fig u re 12. Read Data Byte s (READ) i nst ruct i on sequence and data-out sequence

1. Address bits A23 to A20 are Don’t Care.

AI03748

21 345678910 2829303132333435

2221 3210

36 37 38

76543 1 7

High Impedance Data Out 1

Instruction 24-Bit Address

MSB

Data Out 2

Instructions M25P80

28/53

6.7 Read Data Bytes at Higher Spe ed (FAST_READ)

The device is first selected by driving Chip Select (S) Low. The instruction code for the Read

Data Bytes at Higher Speed (FAST_READ) instruction is followed by a 3-byte address (A23-

A0) and a dummy byte, each bit being latched-in during the rising edge of Serial Clock (C).

Then the memory contents, at that address, is shifted out on Serial Data Output (Q), each

bit being shifted out, at a maximum frequency fC, during the falling edge of Serial Clock (C).

The instruction sequence is shown in Figure 13.

The first byte addressed can be at any location. The address is automatically incremented

to the next higher address after each byte of data is shifted out. The whole memory can,

therefore, be read with a single Read Data Bytes at Higher Speed (FAST_READ)

instruction. When the highest address is reached, the address counter rolls over to

000000h, allowing the read sequence to be continued indefinitely.

The Read Data Bytes at Higher Speed (FAST_READ) instruction is terminated by driving

Chip Select (S) High. Chip Select (S) can be driven High at any time during data output. Any

Read Data Bytes at Higher Speed (FAST_READ) instruction, while an Erase, Program or

Write cycle is in progress, is rejected without having any effects on the cycle that is in

progress.

Figure 13. Re ad Data Bytes at Higher Speed (FAST_READ) instruc tion se quenc e

and data-out sequence

1. Address bits A23 to A20 are Don’t Care.

AI04006

21 345678910 28293031

2221 3210

High Impedance

Instruction 24 BIT ADDRESS

32 33 34 36 37 38 39 40 41 42 43 44 45 46

765432 0

DATA OUT 1

Dummy Byte

MSB

76543210

DATA OUT 2

MSB MSB

765432 0

M25P80 Instructions

29/53

6.8 Page Program (PP)

The Page Program (PP) instruction allows bytes to be programmed in the memory

(changing bits from 1 to 0). Before it can be accepted, a Write Enable (WREN) instruction

must previously have been executed. After the Write Enable (WREN) instruction has been

decoded, the device sets the Write Enable Latch (WEL).

The Page Program (PP) instruction is entered by driving Chip Select (S) Low, followed by

the instruction code, three address bytes and at least one data byte on Serial Data input (D).

If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data that goes

beyond the end of the current page are programmed from the start address of the same

page (from the address whose 8 least significant bits (A7-A0) are all zero). Chip Select (S)

must be driven Low for the entire duration of the sequence.

The instruction sequence is shown in Figure 14.

If more than 256 bytes are sent to the device, previously latched data are discarded and the

last 256 data bytes are guaranteed to be programmed correctly within the same page. If less

than 256 Data bytes are sent to device, they are correctly programmed at the requested

addresses without having any effects on the other bytes of the same page.

For optimized timings, it is recommended to use the Page Program (PP) instruction to

program all consecutive targeted bytes in a single sequence versus using several Page

Program (PP) sequences with each containing only a few bytes (see Table 15: AC

characteristics (75 MHz operation)).

Chip Select (S) must be driven High after the eighth bit of the last data byte has been

latched in, otherwise the Page Program (PP) instruction is not executed.

As soon as Chip Select (S) is driven High, the self-timed Page Program cycle (whose

duration is tPP) is initiated. While the Page Program cycle is in progress, the Status Register

may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress

(WIP) bit is 1 during the self-timed Page Program cycle, and is 0 when it is completed. At

some unspecified time before the cycle is completed, the Write Enable Latch (WEL) bit is

reset.

A Page Program (PP) instruction applied to a page which is protected by the Block Protect

(BP2, BP1, BP0) bits (see Table 3 and Table 2 ) is not executed.

Instructions M25P80

30/53

Figure 14. P age Program (PP) inst ruct ion sequence

1. Address bits A23 to A20 are Don’t Care.

AI04082B

4241 43 44 45 46 47 48 49 50 52 53 54 5540

21 345678910 2829303132333435

2221 3210

36 37 38

Instruction 24-Bit Address

765432 0

Data Byte 1

765432 0

Data Byte 2

765432 0

Data Byte 3 Data Byte 256

2079

2078

2077

2076

2075

2074

2073

765432 0

2072

MSB MSB

MSB MSB MSB

M25P80 Instructions

31/53

6.9 Sector Erase (SE)

The Sector Erase (SE) instruction sets to 1 (FFh) all bits inside the chosen sector. Before it

can be accepted, a Write Enable (WREN) instruction must previously have been executed.

After the Write Enable (WREN) instruction has been decoded, the device sets the Write

Enable Latch (WEL).

The Sector Erase (SE) instruction is entered by driving Chip Select (S) Low, followed by the

instruction code, and three address bytes on Serial Data Input (D). Any address inside the

Sector (see Tab le 3) is a valid address for the Sector Erase (SE) instruction. Chip Select (S)

must be driven Low for the entire duration of the sequence.

The instruction sequence is shown in Figure 15.

Chip Select (S) must be driven High after the eighth bit of the last address byte has been

latched in, otherwise the Sector Erase (SE) instruction is not executed. As soon as Chip

Select (S) is driven High, the self-timed Sector Erase cycle (whose duration is tSE) is

initiated. While the Sector Erase cycle is in progress, the Status Register may be read to

check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1

during the self-timed Sector Erase cycle, and is 0 when it is completed. At some unspecified

time before the cycle is completed, the Write Enable Latch (WEL) bit is reset.

A Sector Erase (SE) instruction applied to a page which is protected by the Block Protect

(BP2, BP1, BP0) bits (see Table 3 and Table 2 ) is not executed.

Fig ur e 15. Sect or E r ase (SE) instruction sequence

1. Address bits A23 to A20 are Don’t Care.

24 Bit Address

AI03751D

21 3456789 293031

Instruction

23 22 2 0

MSB

Instructions M25P80

32/53

6.10 Bulk Erase (BE)

The Bulk Erase (BE) instruction sets all bits to 1 (FFh). Before it can be accepted, a Write

Enable (WREN) instruction must previously have been executed. After the Write Enable

(WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL).

The Bulk Erase (BE) instruction is entered by driving Chip Select (S) Low, followed by the

instruction code on Serial Data Input (D). Chip Select (S) must be driven Low for the entire

duration of the sequence.

The instruction sequence is shown in Figure 16.

Chip Select (S) must be driven High after the eighth bit of the instruction code has been

latched in, otherwise the Bulk Erase instruction is not executed. As soon as Chip Select (S)

is driven High, the self-timed Bulk Erase cycle (whose duration is tBE) is initiated. While the

Bulk Erase cycle is in progress, the Status Register may be read to check the value of the

Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Bulk

Erase cycle, and is 0 when it is completed. At some unspecified time before the cycle is

completed, the Write Enable Latch (WEL) bit is reset.

The Bulk Erase (BE) instruction is executed only if all Block Protect (BP2, BP1, BP0) bits

are 0. The Bulk Erase (BE) instruction is ignored if one, or more, sectors are protected.

Figure 16. Bulk Erase (BE) inst ruction sequence

AI03752D

21 345670

Instruction

M25P80 Instructions

33/53

6.11 Deep Power-down (DP)

Executing the Deep Power-down (DP) instruction is the only way to put the device in the

lowest consumption mode (the Deep Power-down mode). It can also be used as an extra

software protection mechanism, while the device is not in active use, since in this mode, the

device ignores all Write, Program and Erase instructions.

Driving Chip Select (S) High deselects the device, and puts the device in the Standby mode

(if there is no internal cycle currently in progress). But this mode is not the Deep Power-

down mode. The Deep Power-down mode can only be entered by executing the Deep

Power-down (DP) instruction, to reduce the standby current (from ICC1 to ICC2, as specified

in Table 14).

Once the device has entered the Deep Power-down mode, all instructions are ignored

except the Release from Deep Power-down and Read Electronic Signature (RES)

instruction. This releases the device from this mode. The Release from Deep Power-down

and Read Electronic Signature (RES) instruction also allows the Electronic Signature of the

device to be output on Serial Data Output (Q).

The Deep Power-down mode automatically stops at Power-down, and the device always

Powers-up in the Standby mode.

The Deep Power-down (DP) instruction is entered by driving Chip Select (S) Low, followed

by the instruction code on Serial Data Input (D). Chip Select (S) must be driven Low for the

entire duration of the sequence.

The instruction sequence is shown in Figure 17.

Chip Select (S) must be driven High after the eighth bit of the instruction code has been

latched in, otherwise the Deep Power-down (DP) instruction is not executed. As soon as

Chip Select (S) is driven High, it requires a delay of tDP before the supply current is reduced

to ICC2 and the Deep Power-down mode is entered.

Any Deep Power-down (DP) instruction, while an Erase, Program or Write cycle is in

progress, is rejected without having any effects on the cycle that is in progress.

Figure 17. Deep Power-do wn (D P ) instru ction se quence

AI03753D

21 345670t

Deep Power-down Mode

Stand-by Mode

Instruction

Instructions M25P80

34/53

6.12 Release from Deep Power-down and Read Electronic

Signature (RES)

Once the device has entered the Deep Power-down mode, all instructions are ignored

except the Release from Deep Power-down and Read Electronic Signature (RES)

instruction. Executing this instruction takes the device out of the Deep Power-down mode.

The instruction can also be used to read, on Serial Data Output (Q), the 8-bit Electronic

Signature, whose value for the M25P80 is 13h.

Please note that this is not the same as, or even a subset of, the JEDEC 16-bit Electronic

Signature that is read by the Read Identifier (RDID) instruction. The old-style Electronic

Signature is supported for reasons of backward compatibility, only, and should not be used

for new designs. New designs should, instead, make use of the JEDEC 16-bit Electronic

Signature, and the Read Identifier (RDID) instruction.

Except while an Erase, Program or Write Status Register cycle is in progress, the Release

from Deep Power-down and Read Electronic Signature (RES) instruction always provides

access to the 8-bit Electronic Signature of the device, and can be applied even if the Deep

Power-down mode has not been entered.

Any Release from Deep Power-down and Read Electronic Signature (RES) instruction while

an Erase, Program or Write Status Register cycle is in progress, is not decoded, and has no

effect on the cycle that is in progress.

The device is first selected by driving Chip Select (S) Low. The instruction code is followed

by 3 dummy bytes, each bit being latched-in on Serial Data Input (D) during the rising edge

of Serial Clock (C). Then, the 8-bit Electronic Signature, stored in the memory, is shifted out

on Serial Data Output (Q), each bit being shifted out during the falling edge of Serial Clock

(C).

The instruction sequence is shown in Figure 18.

The Release from Deep Power-down and Read Electronic Signature (RES) instruction is

terminated by driving Chip Select (S) High after the Electronic Signature has been read at

least once. Sending additional clock cycles on Serial Clock (C), while Chip Select (S) is

driven Low, cause the Electronic Signature to be output repeatedly.

When Chip Select (S) is driven High, the device is put in the Standby Power mode. If the

device was not previously in the Deep Power-down mode, the transition to the Standby

Power mode is immediate. If the device was previously in the Deep Power-down mode,

though, the transition to the Standby Power mode is delayed by tRES2, and Chip Select (S)

must remain High for at least tRES2(max), as specified in Table 1 5 . Once in the Standby

Power mode, the device waits to be selected, so that it can receive, decode and execute

instructions.

Driving Chip Select (S) High after the 8-bit instruction byte has been received by the device,

but before the whole of the 8-bit Electronic Signature has been transmitted for the first time

(as shown in Figure 19), still insures that the device is put into Standby Power mode. If the

device was not previously in the Deep Power-down mode, the transition to the Standby

Power mode is immediate. If the device was previously in the Deep Power-down mode,

though, the transition to the Standby Power mode is delayed by tRES1, and Chip Select (S)

must remain High for at least tRES1(max), as specified in Table 1 5 . Once in the Standby

Power mode, the device waits to be selected, so that it can receive, decode and execute

instructions.

M25P80 Instructions

35/53

Figure 18. Relea se from Deep P ower-down and Read Electroni c Sign atu re (RES ) instruction

sequence and dat a-out sequence

1. The value of the 8-bit Electronic Signature, for the M25P80, is 13h.

Figure 19. Release from Deep Power-down (RES) instruction sequence

AI04047C

21 345678910 2829303132333435

2221 3210

36 37 38

765432 0

High Impedance Electronic Signature Out

Instruction 3 Dummy Bytes

MSB

Stand-by Mode

Deep Power-down Mode

MSB

tRES2

AI04078B

21 345670t

RES1

Stand-by Mode

Deep Power-down Mode

QHigh Impedance

Instruction

Power-up and Power-down M25P80

36/53

7 Power-up and Power-down

At Power-up and Power-down, the device must not be selected (that is Chip Select (S) must

follow the voltage applied on VCC) until VCC reaches the correct value:

●VCC(min) at Power-up, and then for a further delay of tVSL

●VSS at Power-down

A safe configuration is provided in Section 3: SPI modes.

To avoid data corruption and inadvertent write operations during Power-up, a Power On

Reset (POR) circuit is included. The logic inside the device is held reset while VCC is less

than the POR threshold value, VWI – all operations are disabled, and the device does not

respond to any instruction.

Moreover, the device ignores all Write Enable (WREN), Page Program (PP), Sector Erase

(SE), Bulk Erase (BE) and Write Status Register (WRSR) instructions until a time delay of

tPUW has elapsed after the moment that VCC rises above the VWI threshold. However, the

correct operation of the device is not guaranteed if, by this time, VCC is still below VCC(min).

No Write Status Register, Program or Erase instructions should be sent until the later of:

●tPUW after VCC passed the VWI threshold

●tVSL after VCC passed the VCC(min) level

These values are specified in Table 8.

If the delay, tVSL, has elapsed, after VCC has risen above VCC(min), the device can be

selected for READ instructions even if the tPUW delay is not yet fully elapsed.

At Power-up, the device is in the following state:

●The device is in the Standby mode (not the Deep Power-down mode).

●The Write Enable Latch (WEL) bit is reset.

●The Write In Progress (WIP) bit is reset.

Normal precautions must be taken for supply rail decoupling, to stabilize the VCC feed. Each

device in a system should have the VCC rail decoupled by a suitable capacitor close to the

package pins. (Generally, this capacitor is of the order of 100 nF).

At Power-down, when VCC drops from the operating voltage, to below the Power On Reset

(POR) threshold value, VWI, all operations are disabled and the device does not respond to

any instruction. (The designer needs to be aware that if a Power-down occurs while a Write,

Program or Erase cycle is in progress, some data corruption can result.)

M25P80 Power-up and Power-down

37/53

Figure 20. P ower-up timing

Table 8. Powe r- up tim i ng and VWI thre shol d

Symbol Parameter Min. Max. Unit

tVSL(1)

1. These parameters are characterized only.

VCC(min) to S low 10 μs

tPUW(1) Time delay to Write instruction 1 10 ms

VWI(1) Write Inhibit voltage 1 2 V

VCC

AI04009C

VCC(min)

VWI

Reset State

of the

device

Chip selection Not Allowed

Program, Erase and Write commands are Rejected by the device

tVSL

tPUW

time

Read Access allowed Device fully

accessible

VCC(max)

Init ial de liver y st a te M25P80

38/53

8 Initial delivery state

The device is delivered with the memory array erased: all bits are set to 1 (each byte

contains FFh). The Status Register contains 00h (all Status Register bits are 0).

9 Maximum rating

Stressing the device above the rating listed in the absolute maximum ratings table may

cause permanent damage to the device. These are stress ratings only and operation of the

device at these or any other conditions above those indicated in the operating sections of

this specification is not implied. Exposure to absolute maximum rating conditions for

extended periods may affect device reliability. Refer also to the Numonyx SURE Program

and other relevant quality documents.

Table 9. Absol u te ma ximum ratin g s

Symbol Parameter Min. Max. Unit

TSTG Storage temperature –65 150 °C

TLEAD Lead temperature during soldering see (1)

1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the Numonyx

ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances

(RoHS) 2002/95/EU.

°C

VIO Input and output voltage (with respect to ground) –0.6 VCC + 0.6 V

VCC Supply voltage –0.6 4.0 V

VESD Electrostatic discharge voltage (Human Body model) (2)

2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω, R2=500 Ω)

–2000 2000 V

M2 5P80 DC and AC p ar amete rs

39/53

10 DC and AC parameters

This section summarizes the operating and measurement conditions, and the DC and AC

characteristics of the device. The parameters in the DC and AC Characteristic tables that

follow are derived from tests performed under the Measurement Conditions summarized in

the relevant tables. Designers should check that the operating conditions in their circuit

match the measurement conditions when relying on the quoted parameters.

1. Output Hi-Z is defined as the point where data out is no longer driven.

Fig u re 21. AC me asureme nt I/ O waveform

Table 10. Operating condi tions

Symbol Parameter Min. Max. Unit

VCC Supply voltage 2.7 3.6 V

TAAmbient operating temperature

grade 3 –40 125 °C

grade 6 –40 85 °C

Table 11. Da ta retenti on and endur anc e

Parameter Condition Min. Max. Unit

Erase/Program cycles

Device grade 6 100 000

cycles per sector

Device grade 3 10 000

Data Retention at 55 °C 20 years

Table 12. AC measureme n t con dition s

Symbol Parameter Min. Max. Unit

CLLoad capacitance 30 pF

Input rise and fall times 5 ns

Input pulse voltages 0.2VCC to 0.8VCC V

Input timing reference voltages 0.3VCC to 0.7VCC V

Output timing reference voltages VCC / 2 V

Table 13. Capacitance (1)

1. Sampled only, not 100% tested, at TA = 25 °C and a frequency of 20 MHz.

Symbol Parameter Test condition Min. Max. Unit

COUT Output capacitance (Q) VOUT = 0 V 8 pF

CIN Input capacitance (other pins) VIN = 0 V 6 pF

AI07455

0.8VCC

0.2VCC

0.7VCC

0.3VCC

Input and Outpu

Timing Reference Level

Input Levels

0.5VCC

DC and AC parameters M25P80

40/53

Tabl e 14. DC cha r acter istics

Symbol Parameter Test condition (in addition

to those in Table 10)Min. Max. Unit

ILI Input leakage current ± 2 μA

ILO Output leakage current ± 2 μA

ICC1 Standby current

Grade 6

S = VCC, VIN = VSS or VCC

μA

Grade 3 100

ICC2 Deep Power-down current

Grade 6

S = VCC, VIN = VSS or VCC

μA

Grade 3 100

ICC3 Operating current (READ)

C=0.1V

CC / 0.9.VCC at

75 MHz, Q = open 12 mA

C=0.1V

CC / 0.9.VCC at

20 MHz, Q = open 4mA

ICC4 Operating current (PP) S = VCC 15 mA

ICC5 Operating current (WRSR) S = VCC 15 mA

ICC6 Operating current (SE) S = VCC 15 mA

ICC7 Operating current (BE) S = VCC 15 mA

VIL Input low voltage –0.5 0.3VCC V

VIH Input high voltage 0.7VCC VCC + 0.4 V

VOL Output low voltage IOL = 1.6 mA 0.4 V

VOH Output high voltage IOH = –100 μAV

CC – 0.2 V

M2 5P80 DC and AC p ar amete rs

41/53

Table 15. AC characteristics (75 MHz operation)

75 MHz available only for products made in T9HX technology, identified with Process digit “4”(1)

Test conditions specified in Table 10 and Table 12

Symbol Alt. Parameter Min. Typ.(2) Max. Unit

fCfC

Clock frequency for the following instructions:

FAST_READ, PP, SE, BE, DP, RES, WREN, WRDI,

RDID, RDSR, WRSR

D.C. 75 MHz

fRClock frequency for READ instructions D.C. 33 MHz

tCH(3) tCLH Clock High time 11 ns

tCL(3) tCLL Clock Low time 11 ns

tCLCH(4) Clock Rise time(5) (peak to peak) 0.1 V/ns

tCHCL(4) Clock Fall time(4) (peak to peak) 0.1 V/ns

tSLCH tCSS S active setup time (relative to C) 5 ns

tCHSL S not active hold time (relative to C) 5 ns

tDVCH tDSU Data In setup time 2 ns

tCHDX tDH Data In hold time 5 ns

tCHSH S active hold time (relative to C) 5 ns

tSHCH S not active setup time (relative to C) 5 ns

tSHSL tCSH S deselect time 100 ns

tSHQZ(4) tDIS Output disable time 9 ns

tCLQV tVClock Low to Output Valid 9 ns

tCLQX tHO Output hold time 0 ns

tHLCH HOLD setup time (relative to C) 5 ns

tCHHH HOLD hold time (relative to C) 5 ns

tHHCH HOLD setup time (relative to C) 5 ns

tCHHL HOLD hold time (relative to C) 5 ns

tHHQX(4) tLZ HOLD to Output Low-Z 9 ns

tHLQZ(4) tHZ HOLD to Output High-Z 9 ns

tWHSL(6) Write Protect setup time 20 ns

tSHWL(6) Write Protect hold time 100 ns

tDP(4) S High to Deep Power-down mode 3 μs

tRES1(4) S High to Standby mode without Electronic Signature

Read 3μs

tRES2(4) S High to Standby mode with Electronic Signature

Read 1.8 μs

tWWrite Status Register cycle time 1.3 15 ms

DC and AC parameters M25P80

42/53

tPP (7)

Page Program cycle time (256 byte) 0.64

5ms

Page Program cycle time (n bytes, where n = 1 to 4) 0.01

Page Program cycle time (n bytes, where n = 5 to

256) int(n/8) × 0.02(8)

tSE Sector erase cycle time 0.6 3 s

tBE Bulk erase cycle time 8 20 s

1. Details of how to find the Technology Process in the marking are given in AN1995, see also Section 12: Part numbering.

2. Typical values given for TA = 25°C.

3. tCH + tCL must be greater than or equal to 1/ fC

4. Value guaranteed by characterization, not 100% tested in production.

5. Expressed as a slew-rate.

6. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.

7. When using the Page Program (PP) instruction to program consecutive bytes, optimized timings are obtained with one

sequence including all the bytes versus several sequences of only a few bytes. (1 ≤ n ≤ 256)

8. int(A) corresponds to the upper integer part of A. E.g. int(12/8) = 2, int(32/8) = 4 int(15.3) =16.

Table 15. AC c hara cteri stic s (75 MHz operation) (continu ed)

75 MHz available only for products made in T9HX technology, identified with Process digit “4”(1)

Test conditions specified in Table 10 and Table 12

Symbol Alt. Parameter Min. Typ.(2) Max. Unit

M2 5P80 DC and AC p ar amete rs

43/53

Table 16. AC characteristics (25 MHz operation)

Test conditions specified in Table 10 and Table 12

Symbol Alt. Parameter Min. Typ. Max. Unit

fCfC

Clock frequency for the following instructions:

FAST_READ, PP, SE, BE, DP, RES, WREN,

WRDI, RDSR, WRSR

D.C. 25 MHz

fRClock frequency for READ instructions D.C. 20 MHz

tCH(1) tCLH Clock high time 18 ns

tCL(1) tCLL Clock low time 18 ns

tCLCH(2) Clock rise time(3) (peak to peak) 0.1 V/ns

tCHCL(2) Clock fall time(3) (peak to peak) 0.1 V/ns

tSLCH tCSS S active setup time (relative to C) 10 ns

tCHSL S not active hold time (relative to C) 10 ns

tDVCH tDSU Data in setup time 5 ns

tCHDX tDH Data in hold time 5 ns

tCHSH S active hold time (relative to C) 10 ns

tSHCH S not active setup time (relative to C) 10 ns

tSHSL tCSH S deselect time 100 ns

tSHQZ(2) tDIS Output disable time 15 ns

tCLQV tVClock low to output valid 15 ns

tCLQX tHO Output hold time 0 ns

tHLCH HOLD setup time (relative to C) 10 ns

tCHHH HOLD hold time (relative to C) 10 ns

tHHCH HOLD setup time (relative to C) 10 ns

tCHHL HOLD hold time (relative to C) 10 ns

tHHQX(2) tLZ HOLD to Output low-Z 15 ns

tHLQZ(2) tHZ HOLD to Output high-Z 20 ns

tWHSL(4) Write Protect setup time 20 ns

tSHWL(4) Write Protect hold time 100 ns

tDP(2) S High to Deep Power-down mode 3 μs

tRES1(2) S High to Standby mode without Electronic

Signature Read 3μs

tRES2(2) S High to Standby mode with Electronic

Signature Read 1.8 μs

tW(5) Write Status Register cycle time 1.5 15 ms

tPP(5) Page Program cycle time (256 bytes) 0.8

5ms

Page Program cycle time (n bytes) int(n/8) × 0.025(6)

DC and AC parameters M25P80

44/53

Figure 22. Se rial input timing

Figure 23. Write Protect setup and hold timi ng duri ng WR SR whe n SRWD = 1

tSE(5) Sector Erase cycle time 0.8 3 s

tBE(5) Bulk Erase cycle time 10 20 s

1. tCH + tCL must be greater than or equal to 1/ fC

2. Value guaranteed by characterization, not 100% tested in production.

3. Expressed as a slew-rate.

4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.

5. Typical values given for TA = 85 °C.

6. int(A) corresponds to the upper integer part of A. E.g. int(12/8) = 2, int(32/8) = 4 int(15.3) =16.

Table 16. AC chara cteri stic s (25 MHz operation) (continued)

Test conditions specified in Table 10 and Table 12

Symbol Alt. Parameter Min. Typ. Max. Unit

AI01447C

MSB IN

tDVCH

High Impedance

LSB IN

tSLCH

tCHDX

tCHCL

tCLCH

tSHCH

tSHSL

tCHSHtCHSL

High Impedance

tWHSL tSHWL

AI07439

M2 5P80 DC and AC p ar amete rs

45/53

Figure 24. Hold timing

Figure 25. Output timing

AI02032

HOLD

tCHHL

tHLCH

tHHCH

tCHHH

tHHQXtHLQZ

AI01449

LSB OUT

DADDR.

LSB IN

tSHQZ

tCH

tCL

tQLQH

tQHQL

tCLQX

tCLQV

tCLQX

tCLQV

Package mechanical M25P80

46/53

11 Package mechanical

Figure 26. V FQFP N 8 (MLP8 ) 8-lead Ver y thin Fine Pitch Qua d Flat Pac kag e No lead ,

6 × 5 mm, package outline

1. Drawing is not to scale.

2. The circle in the top view of the package indicates the position of pin 1.

Table 17. VFQFPN8 (MLP8 ) 8-lead Ver y thin Fine Pitch Qua d Flat Pac kag e No lead,

6 × 5 mm, package mechan ical data

Symbol millimeters inches

Typ Min Max Typ Min Max

A 0.85 0.80 1.00 0.0335 0.0315 0.0394

A1 0.00 0.05 0.0000 0.0020

A2 0.65 0.0256

A3 0.20 0.0079

b 0.40 0.35 0.48 0.0157 0.0138 0.0189

D 6.00 0.2362

D1 5.75 0.2264

D2 3.40 3.20 3.60 0.1339 0.1260 0.1417

E 5.00 0.1969

E1 4.75 0.1870

E2 4.00 3.80 4.30 0.1575 0.1496 0.1693

e 1.27 – – 0.0500 – –

R1 0.10 0.00 0.0039 0.0000

L 0.60 0.50 0.75 0.0236 0.0197 0.0295

Θ12° 12°

aaa 0.15 0.0059

bbb 0.10 0.0039

ddd 0.05 0.0020

70-M

AA3

eE2

ddd

bbb

CAB

aaa CAA

aaa CB

0.10 CA

0.10 CB

M25P80 Pac kage me ch ani cal

47/53

Figure 27. S O8 wide – 8 lead Plastic Small Outline, 20 8 mils body width, pac kag e

outline

1. Drawing is not to scale.

2. The ‘1’ that appears in the top view of the package shows the position of pin 1.

Table 18. SO8 wide – 8 lead Plast ic Sma ll Out line, 20 8 m ils body wi dth,

package mechanical data

Symbol millimeters inches

Typ Min Max Typ Min Max

A 2.50 0.098

A1 0.00 0.25 0.000 0.010

A2 1.51 2.00 0.059 0.079

b 0.40 0.35 0.51 0.016 0.014 0.020

c 0.20 0.10 0.35 0.008 0.004 0.014

CP 0.10 0.004

D 6.05 0.238

E 5.02 6.22 0.198 0.245

E1 7.62 8.89 0.300 0.350

e 1.27 – – 0.050 – –

k 0° 10° 0° 10°

L 0.50 0.80 0.020 0.031

N8 8

6L_ME

LA1 k

Package mechanical M25P80

48/53

Figure 28. SO8N – 8 lead Plastic Small Outline, 150 mils body width, package outline

1. Package is not to scale.

Table 19. S O8N – 8 lead Plastic Smal l Outline, 150 mils body width, packa g e

mechani cal data

Symbol millimeters inches

Typ Min Max Typ Min Max

A 1.75 0.069

A1 0.10 0.25 0.004 0.010

A2 1.25 0.049

b 0.28 0.48 0.011 0.019

c 0.17 0.23 0.007 0.009

ccc 0.10 0.004

D 4.90 4.80 5.00 0.193 0.189 0.197

E 6.00 5.80 6.20 0.236 0.228 0.244

E1 3.90 3.80 4.00 0.154 0.150 0.157

e 1.27 – – 0.050 – –

h 0.25 0.50 0.010 0.020

k0°8°0°8°

L 0.40 1.27 0.016 0.050

L1 1.04 0.041

SO-A

ccc

h x 45˚

0.25 mm

GAUGE PLANE

M25P80 Par t numberin g

49/53

12 Part numbering

Note: For a list of available options (speed, package, etc.), for further information on any aspect of

this device or when ordering parts operating at 75 MHz (0.11 μm, process digit “4”), please

contact your nearest Numonyx Sales Office.

Table 20. Ordering inform at io n scheme

Example: M25P80 – V MW 6 T P

Device type

M25P = Serial Flash memory for Code Storage

Device function

80 = 8 Mbit (1 Mbit × 8)

Secu rity feat ures(1)

1. Secure options are available upon customer request.

– = no extra security

S = CFD programmed with UID

O per a t in g vo l tag e

V = VCC = 2.7 V to 3.6 V

Package

MW = SO8W (208 mils width)

MN = SO8N (150 mils width)(2)

2. Package only available for products in the T9HX process.

MP = VDFPN8 (MLP8)

Tem p e r at ure r ange

6 = Industrial temperature range, –40 to 85 °C.

Device tested with standard test flow

3(3) = Automotive temperature range, –40 to 125 °C.

Device tested with High Reliability Certified Flow.

3. Grade 3 is available only in devices delivered in SO8N packages.

Option

blank = Standard Packing

T = Tape and Reel Packing

Plating technology

P or G = ECOPACK® (RoHs compliant)

Part numbering M25P80

50/53

The category of second Level Interconnect is marked on the package and on the inner box

label, in compliance with JEDEC Standard JESD97. The maximum ratings related to

soldering conditions are also marked on the inner box label.

M25P80 Revision history

51/53

13 Revision history

Table 21. Doc um ent revision history

Date Revision Changes

24-Apr-2002 1.0

Document released as a Product Preview data sheet

Clarification of descriptions of entering Standby Power mode from Deep

Power-down mode, and of terminating an instruction sequence or data-out

sequence.

27-Sep-2002 1.1 VFQFPN8 package (MLP8) added. Order code (MW) corrected on page 1

for SO8 package. Document promoted to Preliminary Data.

13-Dec-2002 1.2

Typical Page Program time improved. Write Protect setup and hold times

specified, for applications that switch Write Protect to exit the Hardware

Protection mode immediately before a WRSR, and to enter the Hardware

Protection mode again immediately after.

24-Oct-2003 2.0

Table of contents, warning about exposed paddle on MLP8, and Pb-free

options added.

40MHz AC Characteristics table included as well as 25MHz. Change of

naming for VDFPN8 package. Document promoted to full datasheet

24-Nov-2003 2.1 Improvement to description of reading the 8-bit electronic signature.

21-Apr-2004 3.0 SO16 package added. SO8W package removed. Soldering temperature

information clarified for RoHS compliant devices. Device Grade clarified

07-May-2004 4.0 Automotive range added

18-May-2004 5.0 SO8W package re-instated, but under limited availability

05-Aug-2004 6.0 Data-retention measurement temperature corrected. Details of how to find

the date of marking added.

01-Aug-2005 7.0 Updated Page Program (PP) instructions in Page Programming, Page

Program (PP), Instruction times and Instruction Times (Device Grade 3).

20-Oct-2005 8.0

SO16 package removed. All packages are ECOPACK®. MLP8 package

renamed as VFQFPN8. Plating technology clarified in Table 20: Ordering

information scheme. VFQFPN silhouette modified (see silhouette on page

1). tSHQZ timing modified in Figure 25: Output timing.

13-Apr-2006 9

Device grade 3 specifications removed from datasheet. Data retention

conditions changed in Table 11: Data retention and endurance.

Figure 3: Bus Master and memory devices on the SPI bus modified and

Note 2 added.

Note 2 added below Figure 26 and Note 2 added below Figure 27.

Note on SO8 package removed below Table 20: Ordering information

scheme.

20-Jul-2006 10 SO8N package added (see Figure 28 and Tab le 19 ).

Revisio n  h i stor y M25P80
52/53   
22-Sep-2006 11
Endurance and data retention information added to Features.
50 MHz frequency added, Read Identification (RDID) instruction added, 
Instruction times table removed, data appended to Table 15: AC 
characteristics (40 MHz operation, Grade 6) and Table 1 6. AC 
characteristics (25MHz operation). Typical tW, tSE and tPP values modified 
in Table 15: AC characteristics (40 MHz operation, Grade 6) and Note 2 
added.
VFQFPN8 package specifications updated (see Table 17). Small text 
changes. Process Technology information added to part numbering (see 
Table 2 0).
12-Oct-2006 12
VIO max changed in Table 9: Absolute maximum ratings.
Data in Table 15: AC characteristics (75 MHz operation) are preliminary 
data. tBE typ and fR modified in Table 15.
15-Dec-2006 13
Small text changes. Hardware Write protection added to Features.
VCC supply voltage and VSS ground added. Figure 3: Bus Master and 
memory devices on the SPI bus updated, Note 2 removed and replaced 
by an explanatory paragraph.
Behavior of WIP bit specified at Power-up in Section 7: Power-up and 
Power-down.
TLEAD added to Table 9: Absolute maximum ratings.
SO8W and VFQFPN8 package specifications updated (see Section 11: 
Package mechanical). Note 2 added to Table 20: Ordering information 
scheme.
09-Jan-2007 14 Temperature grade 3 added (available in products delivered in the SO8N 
package only).
15-Jun-2007 15
Read Identification instruction modified in Section 6.3: Read Identification 
(RDID).
Inserted UID and CFI content columns in Table 5: Read Identification 
(RDID) data-out sequence.
Modified Data bytes for RDID instruction in Table 4: Instruction set.
Modified Q signal in Figure 9: Read Identification (RDID) instruction 
sequence and data-out sequence.
Modified Test condition and maximum value for ICC3 in Table 14: DC 
characteristics.
Table 15: AC characteristics (40 MHz operation, Grade 6) removed.
Modified the maximum value for fC in Table 15: AC characteristics 
(75 MHz operation).
10-Dec-2007 16 Applied Numonyx branding.
3-July 2008 17
Added a reference to customer’s ability to request dedicated part number 
in Section 6.3: Read Identification (RDID) on page 21.
Moved specifications in “max” column to “min” column and changed the 
“min” for grade 3 to 10,000 in Table 11: Data retention and endurance on 
page 39.
Deleted “grade 6” reference in Table 15: AC characteristics (75 MHz 
operation) on page 41.
Deleted “grade 3” reference and “preliminary note” in Table 16: AC 
characteristics (25 MHz operation) on page 43.
Revised Section 12: Part numbering on page 49.
Table 21. Doc um ent  revision history
Date Revision Changes

M25P80

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