TLP2631 TOSHIBA photocoupler GaAAs IRed & Photo IC TLP2631 Isolated Line Receiver Simplex / Multiplex Data Transmission Computer-Peripheral Interface Microprocessor System Iinterface Digital Isolation For A / D, D / A Conversion Unit in mm The TOSHIBA TLP2631 dual photocoupler consists of a pair of GaAAs light emitting diode and integrated high gain, high speed photodetector. This unit is 8-lead DIP. The output of the detector circuit is an open collector, Schottky clamped transistor. A Faraday shield integrated on the photodetector chip reduces the effects of capacitive coupling between the input LED emitter and the high gain stages of the detector. This provides an effective common mode transient immunity of 1000V / s. * Input current threshold: IF = 5mA(max.) * Switching speed: 10MBd(typ.) * Common mode transient immunity: 1000V / s(min.) * Guaranteed performance over temperature: 0~70C * Isolation voltage: 2500Vrms(min.) * UL recognized: UL1577, file no. E67349 TOSHIBA Weight: 0.54g Truth Table(positive logic) Input Output H L L H 11-10C4 Pin Configuration (top view) VCC 1 8 2 7 A 0.01 to 0.1mF bypass capacitor must 3 6 connected between pins 8 and 5(see Note 1). 4 GND Shield 5 1 : Anode 1 2 : Cathode 1 3 : Cathode 2 4 : Anode 2 5 : GND 6 : VO2 (Output 2) 7 : VO1 (Output 1) 8 : VCC Schematic + VF1 + VF2 - 1 I 1 F1 Shield ICC 8 IO1 7 2 4 IF2 IO2 6 VCC VO1 VO2 3 5 GND 2002-09-25 TLP2631 Maximum Ratings (no derating required up to 70C) Characteristic Symbol Rating Unit IF 20 mA IFP 30 mA Reverse voltage (each channel) VR 5 V Output current (each channel) IO 16 mA Output voltage (each channel) VO -0.5~7 V VCC 7 V PO 40 mW Operating temperature range Tstg -55~125 C Storage temperature range Topr -40~85 C Tsol 260 C BVS 2500 Vrms Detector LED Forward current (each channel) Pulse forward current (each channel)* Supply voltage (1 minute maximum) Output collector power dissipation (each channel) Lead soldering temperature (10s)** Isolation voltage (AC, 1 min., R.H. 60%, Note 3) * t 1 msec duration. ** 2mm below seating plane. Recommended Operating Conditions Characteristic Symbol Min. Typ. Max. Unit Input current, low level, each channel IFL 0 250 A Input current, high level, each channel IFH 6.3* 20 mA Supply voltage, output VCC 4.5 5 5.5 V N 8 Topr 0 70 Fan out (TTL load, each channel) Operating temperature C *6.3mA is a guard banded value which allows for at least 20% CTR degradation. Initial input current threshold value is 5.0mA or less. 2 2002-09-25 TLP2631 Electrical Characteristics (Ta = 0~70C unless otherwise noted) Characteristic Input forward voltage (each channel) Symbol VF Input diode temperature coefficient (each channel) VF / Ta Input reverse breakdown voltage (each channel) BVR Test Condition Min. Typ. * Max. Unit IF = 10mA, Ta = 25C 1.65 1.75 V IF = 10mA -2.0 mV / C IR = 10mA, Ta = 25C 5 V Input capacitance (each channel) CT VF = 0, f = 1MHz 45 pF High level output current (each channel) IOH VCC = 5.5V, VO = 5.5V IF = 250mA 1 250 A Low level output voltage (each channel) VOL VCC = 5.5V, IF = 5mA IOL(sinking) = 13mA 0.4 0.6 V High level supply current (both channels) ICCH VCC = 5.5V, IF = 0 14 30 mA Low level supply current (both channels) ICCL VCC = 5.5V, IF = 10mA 24 38 mA Isolation voltage RS VS = 500V, R.H. 60% (Note 3) 5x1010 1014 W Capacitance (input-output) CS f = 1MHz (Note 3) 0.6 pF Input-input leakage current II-I R.H. 60%, t = 5s VI-I = 500V (Note 6) 0.005 A Resistance (input-input) RI-I VI-I = 500V (Note 6) 1011 W Capacitance (input-input) CI-I f = 1MHZ (Note 6) 0.25 pF * All typical values are at VCC = 5V, Ta = 25C. 3 2002-09-25 TLP2631 Switching Characteristics (Ta = 25C, VCC = 5V) Symbol Test Circuit Propagation delay time to low output level tpHL 1 Propagation delay time to high output level tpLH Output rise time, output fall time (10~90%) tr, tf Characteristic Test Condition Min. Typ. Max. Unit IF = 0(R)7.5mA, RL = 350W CL = 15pF (each channel) 60 75 ns 1 IF = 7.5mA(R)0, RL = 350W CL = 15pF (each channel) 60 75 ns 1 IF = 0 7.5mA, RL = 350W CL = 15pF (each channel) 30 ns 1000 10000 V / s -1000 -10000 V / s Common mode transient immunity at high output level CMH 2 IF = 0, RL = 350W VCM = 400V, VO(min.) = 2V (each channel, Note 4) Common mode transient immunity at low output level CML 2 IF = 7.5mA, RL = 350W VCM = 400V VO(max.) = 0.8V (each channel, Note 5) (Note 1) 2mm below seating plane (Note 2) The VCC supply voltage to each TLP2631 isolator must be bypassed by a 0.01mF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins each device. (Note 3) Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8 shorted together. (Note 4) CMHthe maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0V). Measured in volts per microsecond (V / s). Volts/ microsecond can be translated to sinusoidial voltages: V / s = (dVCM) Max. = fCM VCM (p.p.) dt Example: VCM = 319Vpp when fCM = 1MHz using CML and CMH = 1000V / s data sheet specified minimum. (Note 5) CMLthe maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT > 0.8V). Measured in volts per microsecond (V / s). (Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together. 4 2002-09-25 TLP2631 Test Circuit 1. tpHL and tpLH 5V 100 IF Monitor VCC 1 2 7 3 6 4 GND 5 7.5mA 3.75mA 0mA IF 8 0.1F Pulse input PW = 10s Duty cycle = 1/10 RL 350 CL tf tr 5V VO Monitor VO tpHL CL is approximately 15pF which includes probe and stray wiring capacitance. 4.5V 1.5V 0.5V VOL tpLH Test Circuit 2. Ttansient Immunity And Typical Waveforms. VCC 1 2 B A VFF 7 3 6 4 GND 5 + VCM 5V 8 0.1F IF CL 10% tr VO Monitor VO (IF = 0mA) - 0V tf 5V 2V 0.8V VO Pulse generator VOL (IF = 7.5mA) ZO = 50 CMH = VCM RL 350 400V 90% 320(V) 320(V) , CML = t r (s) t r (s ) * CL is approximately 15pF which includes probe and stray wiring capacitance. 5 2002-09-25 TLP2631 IF - VF Ta = 25 C 10 1 0.1 0.01 1.0 1.2 1.4 1.6 Forward voltage VF (A) IOH High level output current (V) Output voltage VO -1.6 1 0.3 3 IF 10 30 50 (mA) IOH - Ta RL = 350 1k 4k 2 2 -1.8 100 6 3 Forward current -2.0 Forward current VCC = 5 V Ta = 25 C 1 -2.2 (V) VO - IF 0 0 -2.4 -1.4 0.1 2.0 1.8 8 4 VF / Ta - IF -2.6 Forward voltage temperature coefficient VF / Ta (mV / C) Forward current IF (mA) 100 4 IF 5 IF = 250 A VCC = 5.5 V VO = 5.5 V 50 30 10 5 3 6 1 (mA) 10 0 20 30 40 50 60 70 Ambient temperature Ta (C) VO - IF 10 VOL - Ta IF = 5 mA Low level output voltage VOL (V) VCC = 5 V RL = 350 8 Output voltage VO (V) RL = 4k 6 Ta = 70C 4 0C 2 VCC = 5.5 V VE = 2 V 0.5 IOL=16mA 0.4 12.8mA 9.6mA 6.4mA 0.3 0.2 0 0 0 1 2 3 Forward current 4 IF 5 20 40 60 80 Ambient temperature Ta (C) 6 (mA) 6 2002-09-25 TLP2631 tpHL, tpLH - IF tpHL, tpLH - Ta 120 120 RL = 4k RL = 4k tpLH tpLH 100 tpLH 1k tpHL 350 350 80 60 1k 4k 40 350k 1k tpLH 80 350 60 1k 4k tpHL 40 Ta = 25 C 20 0 Propagation delay time tpHL, tpLH (ns) Propagation delay time tpHL, tpLH (ns) 100 VCC = 5 V 5 7 9 11 13 Forward current 15 IF VCC = 5 V IF = 7.5 mA 20 19 17 0 0 (mA) 10 20 30 40 50 60 70 Ambient temperature Ta (C) tr, tf - Ta 320 VCC = 5 V IF = 7.5 mA Rise, fall time tr, tf (ns) 300 RL = 4k tf 280 80 tf 1k tf 350 tr 350 60 40 20 0 0 1k 4k 10 20 30 40 50 60 70 Ambient temperature Ta (C) 7 2002-09-25 TLP2631 RESTRICTIONS ON PRODUCT USE 000707EBC * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with domestic garbage. * * * The products described in this document are subject to the foreign exchange and foreign trade laws. The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. The information contained herein is subject to change without notice. 8 2002-09-25