TLP2631
2002-09-25
1
TOSHIBA photocoupler GaAAs IRed & Photo IC
TLP2631
Isolated Line Receiver
Simplex / Multiplex Data Transmission
Computer-Peripheral Interface
Microprocessor System Iinterface
Digital Isolation For A / D, D / A Conversion
The TOSHIBA TLP2631 dual photocoupler consists of a pair of GaAAs
light emitting diode and integrated high gain, high speed photodetector.
This unit is 8-lead DIP.
The output of the detector circuit is an open collector, Schottky clamped
transistor.
A Faraday shield integrated on the photodetector chip reduces the effects
of capacitive coupling between the input LED emitter and the high gain
stages of the detector. This provides an effective common mode transient
immunity of 1000V / µs.
· Input current threshold: IF = 5mA(max.)
· Switching speed: 10MBd(typ.)
· Common mode transient immunity: ±1000V / µs(min.)
· Guaranteed performance over temperature: 0~70°C
· Isolation voltage: 2500Vrms(min.)
· UL recognized: UL1577, file no. E67349
Truth Table (positive logic)
Input Output
H L
L H
A 0.01 to 0.1mF bypass capacitor must
connected between pins 8 and 5(see Note 1).
Pin Configuration (top view)
VCC
1
2
3
4GND
8
7
6
5
1 : Anode 1
2 : Cathode 1
3 : Cathode 2
4 : Anode 2
5 : GND
6 : VO2 (Output 2)
7 : VO1 (Output 1)
8 : VCC
Shield
Schematic
VF1
VF2
IF1
IF2
ICC
VCC
VO1
VO2
GND
+
-
-
+
1
2
3
4
8
7
6
5
IO1
IO2
Shield
Unit in mm
TOSHIBA 1110C4
Weight: 0.54g
TLP2631
2002-09-25
2
Maximum Ratings (no derating required up to 70°C)
Characteristic Symbol Rating Unit
Forward current (each channel) IF 20 mA
Pulse forward current
(each channel)*
IFP 30 mA
LED
Reverse voltage (each channel) VR 5 V
Output current (each channel) IO 16 mA
Output voltage (each channel) VO -0.5~7 V
Supply voltage
(1 minute maximum)
VCC 7 V
Detector
Output collector power
dissipation (each channel)
PO 40 mW
Operating temperature range Tstg -55~125 °C
Storage temperature range Topr -40~85 °C
Lead soldering temperature
(10s)**
Tsol 260 °C
Isolation voltage
(AC, 1 min., R.H. 60%, Note 3)
BVS 2500 Vrms
* t 1 msec duration.
** 2mm below seating plane.
Recommended Operating Conditions
Characteristic Symbol Min. Typ. Max. Unit
Input current, low level, each channel IFL 0 250 µA
Input current, high level, each channel IFH 6.3* 20 mA
Supply voltage, output VCC 4.5 5 5.5 V
Fan out (TTL load, each channel) N 8
Operating temperature Topr 0 70 °C
*6.3mA is a guard banded value which allows for at least 20% CTR degradation.
Initial input current threshold value is 5.0mA or less.
TLP2631
2002-09-25
3
Electrical Characteristics (Ta = 0~70°C unless otherwise noted)
Characteristic Symbol Test Condition Min. Typ. * Max. Unit
Input forward voltage
(each channel) VF I
F = 10mA, Ta = 25°C 1.65 1.75 V
Input diode temperature
coefficient (each channel) VF / Ta IF = 10mA 2.0 mV / °C
Input reverse breakdown
voltage (each channel) BVR I
R = 10mA, Ta = 25°C 5 V
Input capacitance
(each channel) CT V
F = 0, f = 1MHz 45 pF
High level output current
(each channel) IOH VCC = 5.5V, VO = 5.5V
IF = 250mA 1 250 µA
Low level output voltage
(each channel) VOL VCC = 5.5V, IF = 5mA
IOL(sinking) = 13mA 0.4 0.6 V
High level supply current
(both channels) ICCH V
CC = 5.5V, IF = 0 14 30 mA
Low level supply current
(both channels) ICCL V
CC = 5.5V, IF = 10mA 24 38 mA
Isolation voltage RS V
S = 500V, R.H. 60% (Note 3) 5×1010 1014 W
Capacitance (input-output) CS f = 1MHz (Note 3) 0.6 pF
Input-input leakage
current II-I R.H. 60%, t = 5s
VI-I = 500V (Note 6) 0.005 µA
Resistance (input-input) RI-I V
I-I = 500V (Note 6) 1011 W
Capacitance (input-input) CI-I f = 1MHZ (Note 6) 0.25 pF
* All typical values are at VCC = 5V, Ta = 25°C.
TLP2631
2002-09-25
4
Switching Characteristics (Ta = 25°C, VCC = 5V)
Characteristic Symbol
Test
Circuit Test Condition Min. Typ. Max. Unit
Propagation delay time to
low output level tpHL 1
IF = 0®7.5mA, RL = 350W
CL = 15pF (each channel) 60 75 ns
Propagation delay time to
high output level tpLH 1
IF = 7.5mA®0, RL = 350W
CL = 15pF (each channel) 60 75 ns
Output rise time, output
fall time (10~90%) tr, tf 1
IF = 0 7.5mA, RL = 350W
CL = 15pF (each channel) 30 ns
Common mode transient
immunity at high output
level
CMH 2
IF = 0, RL = 350W
VCM = 400V,
VO(min.) = 2V
(each channel, Note 4)
1000 10000 V / µs
Common mode transient
immunity at low output
level
CML 2
IF = 7.5mA, RL = 350W
VCM = 400V
VO(max.) = 0.8V
(each channel, Note 5)
-1000 -10000 V / µs
(Note 1) 2mm below seating plane
(Note 2) The VCC supply voltage to each TLP2631 isolator must be bypassed by a 0.01mF capacitor or larger. This
can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should
be connected as close as possible to the package VCC and GND pins each device.
(Note 3) Device considered a twoterminal device: Pins 1, 2, 3 and 4 shorted together, and pins 5, 6, 7 and 8
shorted together.
(Note 4) CMHthe maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in
the high state (i.e., VOUT > 2.0V).
Measured in volts per microsecond (V / µs).
Volts/ microsecond can be translated to sinusoidial voltages:
(p.p.)
CM
V
CM
fMax.
dt
(dVCM)
µsV / ==
Example:
VCM = 319Vpp when fCM = 1MHz using CML and CMH = 1000V / µs data sheet specified minimum.
(Note 5) CMLthe maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in
the low output state (i.e., VOUT > 0.8V).
Measured in volts per microsecond (V / µs).
(Note 6) Measured between pins 1 and 2 shorted together, and pins 3 and 4 shorted together.
TLP2631
2002-09-25
5
Test Circuit 1. tpHL and tpLH
Test Circuit 2. Ttansient Immunity And Typical Waveforms.
)(
=,
)(
=µs
r
t
320(V)
L
CM
µs
r
t
320(V)
H
CM
* CL is approximately 15pF which includes probe and stray
wiring capacitance.
VCC
1
2
3
4GND
8
7
6
5
5V
RL
CL
350
100
0.1µF
PW = 10µs
Pulse input
Duty cycle = 1/10
IF Monitor
CL is approximately 15pF which includes probe and stray
wiring capacitance.
VO Monitor
IF
VO
VOL
1.5V
0.5V
4.5V
5V
trtf
tpHL tpLH
7.5mA
3.75mA
0mA
VCC
1
2
3
4 GND
8
7
6
5
5V
RL
CL
350
0.1µF
ZO = 50
Pulse generator
VO Monitor
IF
VFF
VCM
A B
+-
VCM
VO
VOL
5V
0.8V
0V
trtf
2V
400V
VO
(IF = 0mA)
(IF = 7.5mA)
90%
10%
TLP2631
2002-09-25
6
I
F – VF
Forward voltage VF (V)
Forward current IF (mA)
100
0.01
1.0 2.0
0.1
1
10
1.2 1.4 1.6 1.8
Ta = 25 ° C
VF / Ta – IF
Forward current IF (mA)
Forward voltage temperature
coefficient VF / Ta (m V / ° C )
-1.4
0.1 0.3 1 3 10 30
-1.6
-1.8
-2.0
-2.2
-2.4
-2.6
50
V
O – IF
Forward current IF (mA)
Output voltage VO (V)
8
6
4
2
0
01234 56
VCC = 5 V
Ta = 25 ° C
RL = 350
1k
4k
I
OH – Ta
Ambient temperature Ta (°C)
High level output current IOH (µA)
1
0
3
5
10
30
50
100
10 20 30 40 50 60 70
IF = 250 µA
VCC = 5.5 V
VO = 5.5 V
V
O – IF
Forward current IF (mA)
Output voltage VO (V)
8
6
4
2
0
01234 56
10
Ta = 70°C
0°C
VCC = 5 V
RL = 350
RL = 4k
V
OLTa
Low level output voltage VOL (V)
Ambient temperature Ta (°C)
0.2
0 80
20 40 60
0.3
0.4
0.5
IF = 5 mA
VCC = 5.5 V
VE = 2 V
IOL=16mA
12.8m
A
6.4m
A
9.6m
A
TLP2631
2002-09-25
7
tpHL, tpLH – IF
Forward current IF (mA)
Propagation delay time
tpHL, tpLH (ns)
120
0
5 19
7 9 11 13 15 17
20
40
60
80
100
RL = 4k
1k
350
350
1k
4k
tpLH
tpLH
tpHL
Ta = 25 °C
VCC = 5 V
tr, tf – Ta
Rise, fall time tr, tf (ns)
Ambient temperature Ta (°C)
0 70
20
40
60
80
10 20 30 40 50 60
280
300
320
0
VCC = 5 V
IF = 7.5 mA
RL = 4k
1k
350
350
1k
4k
tf
tf
tf
tr
tpHL, tpLH – Ta
Ambient temperature Ta (°C)
Propagation delay time
tpHL, tpLH (ns)
0 70
120
0
20
40
60
80
100
10 20 30 40 50 60
RL = 4k
1k
350k
1k
4k
tpLH
tpLH
tpHL
350
VCC = 5 V
IF = 7.5 mA
TLP2631
2002-09-25
8
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devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
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000707EBC
RESTRICTIONS O N PRODUCT USE