This document is a general product description and is subject t o change without notice. Hynix Semiconductor do es not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev. 0.2 / Jul. 2007 1
240pin Registered DDR2 SDRAM DIMMs based on 1Gb A ver.
This Hynix unbuffered Dual In-Line Memory Module (DIMM) series consists of 1Gb 1st ver. DDR2 SDRAMs
in Fine Ball Grid Array(FBGA) packages on a 2 40pin glass-epoxy substrate. This Hynix 1Gb v er. based Reg-
istered DDR2 DIMM series provide a high performance 8 byte interface in 5.25" width form factor of
industry standard. It is suitable for easy interchange and addition.
FEATURES
ORDERING INFORMATION
Part Name Density Organization # of
DRAMs # of
ranks Parity
Support
HYMP112P72AP8-C4/Y5 1GB 128Mx72 9 1 O
HYMP125P72AP4-C4/Y5 2GB 256Mx72 18 1 O
HYMP351P72AMP4-C4/Y5 4GB 512Mx72 36 2 O
HYMP112R72AP8-E3 1GB 128Mx72 9 1 X
HYMP125R72AP4-E3 2GB 256Mx72 18 1 X
HYMP351R72AMP4-E3 4GB 512Mx72 36 2 X
JEDEC standard Double Data Rate2 Synchro-
nous DRAMs (DDR2 SDRAMs) with 1.8V +/-
0.1V Power Supply
All inputs and outputs are comp atible with
SSTL_1.8 interface
•8 Bank architecture
•Posted CAS
Programmable CAS Latency 3 , 4 , 5
OCD (Off-Chip Driver Impedance Adjustment)
ODT (On-Die Termination)
Fully differential clock operations (CK & /CK)
Programmable Burst Length 4 / 8 with both
sequential and interleave mode
Auto refresh and self refresh supported
8192 refresh cycles / 64ms
Serial presence detect with EEPROM
DDR2 SDRAM Package: 60, 68ball FBGA
133.35 x 30.00 mm form factor
Lead-free Product s are RoHS compliant
Rev. 0.2 / Jul. 2007 2
1
240pin Registered DDR2 SDRAM DIMMs
SPEED GRADE & KEY PARAMETERS
ADDRESS TABLE
E3 (DDR2-400) C4 (DDR2-533) Y5 (DDR2-667) Unit
Speed@CL3 400 400 400 Mbps
Speed@CL4 533 533 533 Mbps
Speed@CL5 667 - 667 Mbps
CL-tRCD-tRP 3-3-3 4-4-4 5-5-5 tCK
Organization Ranks SDRAMs # of
DRAMs # of row/bank/column Address Refresh
Method
1GB 128M x 72 1 128Mb x 8 9 14(A0~A13)/3(BA0~BA2)/10(A0~A9) 8K / 64ms
2GB 256M x 72 1 256Mb x 4 18 14(A0~A13)/3(BA0~BA2)/11(A0~A9,A11) 8K / 64ms
4GB 512M x 72 2 256Mb x 4 36 14(A0~A13)/3(BA0~BA2)/11(A0~A9,A11) 8K / 64ms
Rev. 0.2 / Jul. 2007 3
1
240pin Registered DDR2 SDRAM DIMMs
Input/Output Functional Description
Symbol Type Polarity Pin Description
CK0 IN Positive
Edge Positive line of the differential pair of system clock inputs that drives input to the on-DIMM PLL.
CK0IN
Negative
Edge Negative line of the differential pair of system clock inputs that drives input to the on-DIMM PLL.
CKE[1:0] IN Active High Activates the DDR2 SDRAM CK signal when high and deactivat es the CK signal when low. By deacti-
vating the clocks, CKE low initiates the Power Down mode or t he Self Refresh mode.
S[1:0] IN Active Low Enables the associated DDR2 SDRAM command decoder when low and disables the command
decoder when high. When the command decoder is disabled, new commands are ignored but previous
operations continue. Rank 0 is selected by S0; Rank 1 is selected by S1
ODT[1:0] IN Active High On-Die Termination signals.
RAS, CAS, WE IN Active Low When sampled at the positive rising edge of the clock. RAS ,CAS and WE(ALONG WITH S) define the
command being entered.
Vref Supply Reference voltage for SSTL18 input s
VDDQ Supply Power supplies f or the DDR2 SDRAM output buffers to provide improved noise immunity. For all current
DDR2 unbuffered DIMM designs, VDDQ shares the same power plane as VDD pins.
BA[2:0] IN - Selects which DDR2 SDRAM internal bank of Eight is activated.
A[9:0],A10/AP
A[13:11] IN -
During a Bank Activate command cycle, Address input difines the row address(RA0~RA13)
During a Read or Write command cycle, Address input defines the column address when sample d at the
cross point of the rising edge of CK and falling edge of CK. I n addition to the column address, AP is used
to invoke autoprecharge operation at the end of the burst read or write cycl e. If AP is high., autopre-
charge is selected and BA0-BAn defines the bank to be precharged. If AP is low, autoprecharge is dis-
abled. During a Precharge command cycle., AP is used in conjunction with BA0-BAn to cont rol which
bank(s) to precharge. If AP is high, all banks will be precharged regardless of the state of BA0-BAn
inputs. If AP is low, then BA0-BAn are used to define which bank to precharge.
DQ[63:0],
CB[7:0] IN - Data and Check Bit Input/ Output pins.
DM[8:0] IN Active High DM is an input mask signal for wri te data. Inp ut data is masked wh en DM is sampled High coinci dent with
that input data during a write access. DM is sampled on bot h edges of DQS. Al though DM p ins are inpu t
only, the DM loading matches the DQ and DQS loadi ng.
VDD,VSS Supply Power and ground for t he DDR2 SDRAM input buffers, and core logic. VDD and VDDQ pins are tied to
VDD/VDDQ planes on these modules.
DQS[17:0] I/OPositive
Edge Positive li ne of the differential data strobe for i nput and output data
DQS[17:0] I/ONegative
Edge Negative line of the differential data strobe for input and output data
SA[2:0] IN - These signals are tied at the system planar to either VSS or VDDSPD to configure the serial SPD
EEPROM address range.
SDA I/O - This is a bidirectional pin used t o transfer data into or out of the SPD EEPROM. A resister may be con-
nected from the SDA bus line to VDDSPD on the system planar to act as a pull up.
SCL IN - This signal is used to clock data into and out of the SPD EEPROM. A resistor may be connected from
SCL to VDDSPD to act as a pull up on the system board.
VDDSPD Supply Power supply for SPD EEPROM. This supply is separate from the VDD/VDDQ power plane. EEPROM
supply is operable from 1.7V to 3.6V.
RESET IN The RESET pin is co nnected to the RST pin on the register and to the OE pin on the PLL. When low, all
register outputs will be driven low and the PLL clocks to the DRAMs and register(s) will be set to low
level (the PLL will remain synchronized with the input clock)
Par_In IN Parity bit for the Address and Control bus(“1”. Odd, “0”.Even)
Err_Out OUT Parity error found in the Address and Cont rol bus
TEST Used by memory bus analysis tools(unused on memory DIMMs)
Rev. 0.2 / Jul. 2007 4
1
240pin Registered DDR2 SDRAM DIMMs
PIN DESCRIPTION
PIN LOCATION
Pin Pin Description Pin Pin Description
CK0 Clock Input,positive li ne ODT[1:0] On Die Termination Inputs
CK0 Clock input,negative line VDDQ DQs Power Supply
CKE0~CKE1 Clock Enable Input DQ0~DQ63 Data Input/Out put
RAS Row Address Strobe CB0~CB7 Data check bits Input/Output
CAS Column Address Strobe DQS(0~8) Data strobes
WE Write Enable DQS(0~8) Data strobes,negative line
S0,S1 Chip Select Input DM(0~8),DQS(9~17) Data Maskes/Data stro bes
A0~A9,A11~A13 Address input DQS(9~17) Data strobes,nega tive line
A10/AP Address input/Autoprecharge RFU Reserved for Future Use
BA0, BA1, BA2 SDRAM Bank Address NC No Connect
SCL Serial Presence Detect(SPD) Clock Input TEST Memory bus test tool(Not Connected and Not
Usable on DIMMs)
SDA SPD Data Input/Output VDD Core Power
SA0~SA2 E2PROM Address Inputs VDDQ I/O Power Supply
Par_In Parity bit for the Address and Control bus VSS Ground
Err_Out Parity error found on the Addre VREF Reference Power Supply
RESET Reset Enable VDDSPD Power Supply for SPD
CB0~CB7 Data Strobe Inputs/ Outputs
1 pin
Front Side
64 pin 65 pin 120 pin
121 pin
Back Side
184 pin 185 pin 240 pin
Rev. 0.2 / Jul. 2007 5
1
240pin Registered DDR2 SDRAM DIMMs
PIN ASSIGNMENT
NC= No Connect, RFU= Reserved for Future Use.
Notes:
1. RESET(Pin 18) is connected to both OE of PLL and Reset of register.
2. NC/Err_out (Pin 55) and NC/Par_In(Pin68) are for optional function to check address and command parity.
3. The Test pin(Pin 102) is reserved for bus analysis probes and is not connected on normal memory modules(DIMMs)
Pin Name Pin Name Pin Name Pin Name Pin Name Pin Name
1 VREF 41 VSS 81 DQ33 121 VSS 161 CB4 201 VSS
2 VSS 42 CB0 82 VSS 122 DQ4 162 CB5 202 DM4/DQS13
3DQ043CB183DQS4 123 DQ5 163 VSS 203 DQS13
4 DQ1 44 VSS 84 DQS4 124 VSS 164 DM8,DQS17 204 VSS
5VSS45DQS8 85 VSS 125 DM0/DQS9 165 DQS17 205 DQ38
6DQS0 46 DQS8 86 DQ34 126 DQS9 166 VSS 206 DQ39
7 DQS0 47 VSS 87 DQ35 127 VSS 167 CB6 207 VSS
8 VSS48CB288VSS128DQ6168CB7208DQ44
9 DQ2 49 CB3 89 DQ40 129 DQ7 169 VSS 209 DQ45
10 DQ3 50 VSS 90 DQ41 130 VSS 170 VDDQ 210 VSS
11 VSS 51 VDDQ 91 VSS 131 DQ12 171 NC,CKE1 211 DM5/DQS14
12 DQ8 52 CKE0 92 DQS5 132 DQ13 172 VDD 212 DQS14
13 DQ9 53 VDD 93 DQS5 133 VSS 173 A15,NC 213 VSS
14 VSS 54 BA2,NC 94 VSS 134 DM1/DQS10 174 A14,NC 214 DQ46
15 DQS1 55 NC,Err_Out 95 DQ42 135 DQS10 175 VDDQ 215 DQ47
16 DQS1 56 VDDQ 96 DQ43 136 VSS 176 A12 216 VSS
17 VSS 57 A11 97 VSS 137 RFU 177 A9 217 DQ52
18 RESET 58 A7 98 DQ48 138 RFU 178 VDD 218 DQ53
19 NC 59 VDD 99 DQ49 139 VSS 179 A8 219 VSS
20 VSS 60 A5 100 VSS 140 DQ14 180 A6 220 RFU
21 DQ10 61 A4 101 SA2 141 DQ15 181 VDDQ 221 RFU
22 DQ11 62 VDDQ 102 NC(TEST) 142 VSS 182 A3 222 VSS
23 VSS 63 A2 103 VSS 143 DQ20 183 A1 223 DM6/DQS15
24 DQ16 64 VDD 104 DQS6 144 DQ21 184 VDD 224 NC,DQS15
25 DQ17 Key 105 DQS6 145 VSS Key 225 VSS
26 VSS 65 VSS 106 VSS 146 DM2/DQS11 185 CK0 226 DQ54
27 DQS2 66 VSS 107 DQ50 147 DQS11 186 CK0 227 DQ55
28 DQS2 67 VDD 108 DQ51 148 VSS 187 VDD 228 VSS
29 VSS 68 NC,Err_Out 109 VSS 149 DQ22 188 A0 229 DQ60
30 DQ18 69 VDD 110 DQ56 150 DQ23 189 VDD 230 DQ61
31 DQ19 70 A10/AP 111 DQ57 151 VSS 190 BA1 231 VSS
32 VSS 71 BA0 112 VSS 152 DQ28 191 VDDQ 232 DM7/DQS16
33 DQ24 72 VDDQ 113 DQS7 153 DQ29 192 RAS 233 NC,DQS16
34 DQ25 73 WE 114 DQS7 154 VSS 193 S0234VSS
35 VSS 74 CAS 115 VSS 155 DM3/DQS12 194 VDDQ 235 DQ62
36 DQS3 75 VDDQ 116 DQ58 156 DQS12 195 ODT0 236 DQ63
37 DQS3 76 NC, S1 117 DQ59 157 VSS 196 A13,NC 237 VSS
38 VSS 77 NC, ODT1 118 VSS 15 8 DQ30 197 VDD 238 VDDSPD
39 DQ26 78 VDDQ 119 SDA 159 DQ31 198 VSS 239 SA0
40 DQ27 79 VSS 120 SCL 160 VSS 199 DQ36 240 SA1
80 DQ32 200 DQ37
Rev. 0.2 / Jul. 2007 6
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240pin Registered DDR2 SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
1GB(128Mbx72) : HYMP112[R,P]72AP8
P
L
L
OE
PCK0 to PCK6, PCK8,PCK9 ==> CK: SDRAMs D0 toD8
/PCK0 to /PCK 6, /P CK8, /PCK9 ==> /CK: SDRA Ms D 0 toD8
PCK7 == > CK: Register
/PCK7 ==> /CK: Register
CK0
/CK0
/RESET
/RS0
D0
DQ0 I/O 0
DQ1 I/O 1
DQ2 I/O 2
DQ3 I/O 3
DQ4 I/O 4
DQ5 I/O 5
DQ6 I/O 6
I/O 7
DQ7
/DQS0
DM0,DQS9
DQS0
/C S DQS /DQS
DM
RDQS NU
/RDQS
/DQS9
D1
DQ8 I/O 0
DQ9 I/O 1
DQ10 I/O 2
DQ11 I/O 3
DQ12 I/O 4
DQ13 I/O 5
DQ14 I/O 6
I/O 7
DQ15
/DQS1
DM1,DQS10
DQS1
/C S DQS /DQS
DM
RDQS NU
/RDQS
/DQS10
D2
DQ16 I/O 0
DQ17 I/O 1
DQ18 I/O 2
DQ19 I/O 3
DQ20 I/O 4
DQ21 I/O 5
DQ22 I/O 6
I/O 7
DQ23
/DQS2
DM2,DQS11
DQS2
/C S DQS /DQS
DM
RDQS NU
/RDQS
/DQS11
D3
DQ24 I/O 0
DQ25 I/O 1
DQ26 I/O 2
DQ27 I/O 3
DQ28 I/O 4
DQ29 I/O 5
DQ30 I/O 6
I/O 7
DQ31
/DQS0
DM0,DQS9
DQS0
/C S DQS /DQS
DM
RDQS NU
/RDQS
/DQS12
D8
CB0 I/O 0
CB1 I/O 1
CB2 I/O 2
CB3 I/O 3
CB4 I/O 4
CB5 I/O 5
CB6 I/O 6
I/O 7
CB7
/DQS8
DM8DQS17
DQS8
/C S DQS /DQS
DM
RDQS NU
/RDQS
/DQS17
D4
DQ32 I/O 0
DQ33 I/O 1
DQ34 I/O 2
DQ35 I/O 3
DQ36 I/O 4
DQ37 I/O 5
DQ38 I/O 6
I/O 7
DQ39
/DQS4
DM4,DQS13
DQS4
/C S DQS / D QS
DM
RDQS NU
/RDQS
/DQS13
D5
DQ40 I/O 0
DQ41 I/O 1
DQ42 I/O 2
DQ43 I/O 3
DQ44 I/O 4
DQ45 I/O 5
DQ46 I/O 6
I/O 7
DQ47
/DQS5
DM5,DQS14
DQS5
/C S DQS / D QS
DM
RDQS NU
/RDQS
/DQS14
D6
DQ48 I/O 0
DQ49 I/O 1
DQ50 I/O 2
DQ51 I/O 3
DQ52 I/O 4
DQ53 I/O 5
DQ54 I/O 6
I/O 7
DQ55
/DQS6
DM6,DQS15
DQS6
/C S DQS / D QS
DM
RDQS NU
/RDQS
/DQS15
D7
DQ56 I/O 0
DQ57 I/O 1
DQ58 I/O 2
DQ59 I/O 3
DQ60 I/O 4
DQ61 I/O 5
DQ62 I/O 6
I/O 7
DQ63
/DQS7
DM7,DQS16
DQS7
/C S DQS / D QS
DM
RDQS NU
/RDQS
/DQS16
VDD SPD
VDD /
VDDQ
VREF
VSS
Serial PD
DO-D8
DO-D8
DO-D8
SA0 SA1 SA2
W
P
SCL SDA
A0 A1 A2
Serial PD
SCL U0 SDA
* : /S0 connects to D/CS and V DD connects to /CSR on register.
ODT0
CKE0
/PCK7
/WE
R
E
G
I
S
T
E
R
PCK7
/RESET
/CAS
/RAS
B A 0 to BA2
A0 to A13
/CS0*
RODT0 ==> ODT0: SDRAMs D0 to D8
/RW E ==> /WE: SDRA M s D0 to D8
RCKE0 ==> CKE: SDRAMs D0 to D8
/R CAS = = > /CAS: SDR A Ms D0 to D8
/R RAS = = > /RAS: SDR A Ms D0 to D8
/R A0 to R A13 = = > A0 to A 13 : SDRAMs D 0 to D8
R BA0 to RBA2 == > BA0 to B A2: S DR A Ms D 0 to D 8
/RS0 to /C S ==> /CS: SDRAMs D 0 to D8
/RST 1. Register values are 22 O hm s.
Notes :
Rev. 0.2 / Jul. 2007 7
1
240pin Registered DDR2 SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
2GB(256Mbx72): HYMP125[R,P]72AP4
/RS0
VSS
D0
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
DQ0
DQ1
DQ2
DQ3
/DQS0
/DQS
DQS0
D1
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS1
/DQS
DQS1
D2
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
DQ16
DQ17
DQ18
DQ19
/DQS2
/DQS
DQS2
D3
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS3
/DQS
DQS3
D4
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS0
/DQS
DQS0
D5
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS5
/DQS
DQS5
D6
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS6
/DQS
DQS6
D7
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS7
/DQS
DQS7
D8
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
CB0
CB1
CB2
CB3
/DQS8
/DQS
DQS8
D9
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
DQ4
DQ5
DQ6
DQ7
/DQS9
/DQS
DQS9
D10
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS10
/DQS
DQS10
D11
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS11
/DQS
DQS11
D12
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS12
/DQS
DQS12
D13
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS13
/DQS
DQS13
D14
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS14
/DQS
DQS14
D15
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS15
/DQS
DQS15
D16
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
/DQS16
/DQS
DQS16
D17
DQS /CS DM
I/O0
I/O1
I/O2
I/O3
CB4
CB5
CB6
CB7
/DQS17
/DQS
DQS17
DQ60
DQ61
DQ62
DQ63
DQ52
DQ53
DQ54
DQ55
DQ44
DQ45
DQ46
DQ47
DQ36
DQ37
DQ38
DQ39
DQ28
DQ29
DQ30
DQ31
DQ20
DQ21
DQ22
DQ23
DQ12
DQ13
DQ14
DQ15
DQ8
DQ9
DQ10
DQ11
DQ24
DQ25
DQ26
DQ27
DQ32
DQ33
DQ34
DQ35
DQ40
DQ41
DQ42
DQ43
DQ48
DQ49
DQ50
DQ51
DQ56
DQ57
DQ58
DQ59
* /S 0 connects to D /C S of Register1 and /CSR of Register2. /CS R of register and D/CS of register2 connects to V DD.
** /RE SET ,PCK7 connect to bo th Reg isters. O ther signals connect to one o f two Reg isters. /S1,CKE 1 and O D T1 are NC .
P
L
L
OE
CK0
/CK0
/RESET
PCK0 to PCK6, PCK8,PCK9 = > CK : SDRAMx D0-D17
/PCK0 to /PCK6, /PCK8,/PCK9 = > /CK : SDRAMx D0-D17
PCK7 = > CK: Register
/PCK7 = > /CK: Register
SA0 SA1 SA2
W
P
SCL SDA
A0 A1 A2
Serial PD
SCL U0 SDA
VDD SPD
VREF
VDD/VDDQ
VSS
Serial
PD
DO-D17
DO-D17
DO-D17
1. R esistor values are 22 Ohm s +/- 5% .
Notes:
ODT0
CKE0
/PCK7
/WE
R
E
G
I
S
T
E
R
PCK7
/RESET
/CAS
/RAS
B A 0 to BA2
A 0 to A 1 3
/CS0*
RODT0 ==> ODT0: SDRAMs D0 to D17
/R WE = = > /WE : S DRA Ms D0 to D17
RCKE0 ==> CKE: SDRAMs D0 to D17
/RCAS ==>/CAS: SDRAMs D0 to D17
/RRAS ==>/RAS: SDRAMs D0 to D17
/RA0 to R A13 = => A0 to A1 3 : SDR AM s D0 to D17
R BA 0 to RB A2 = => BA0 to BA2 : SD RAM s D0 to D1 7
/RS0 t o /CS ==> /CS : SDR AM s D0 to D1 7
/RST
Rev. 0.2 / Jul. 2007 8
1
240pin Registered DDR2 SDRAM DIMMs
FUNCTIONAL BLOCK DIAGRAM
4GB(512Mbx72) : HYMP351[R,P]72AMP4
/RS0
VSS
/RS1
DQ0
DQ1
DQ2
DQ3
DQS0
/DQS0
D0,D18(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ8
DQ9
DQ10
DQ11
DQS1
/DQS1
D1,D19(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
/RS0
/RS1
DQ16
DQ17
DQ18
DQ19
DQS2
/DQS2
D2,D20(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ24
DQ25
DQ26
DQ27
DQS3
/DQS3
D3,D21(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
/RS0
/RS1
DQ48
DQ49
DQ50
DQ51
DQS6
/DQS6
D6,D24(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ56
DQ57
DQ58
DQ59
DQS7
/DQS7
D7,D25(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
/RS0
/RS1
DQ32
DQ33
DQ34
DQ35
DQS4
/DQS4
D4,D2(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ40
DQ41
DQ42
DQ43
DQS5
/DQS5
D5,D23(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
CB0
CB1
CB2
CB3
DQS8
/DQS8
D8,D26(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
DQ4
DQ5
DQ6
DQ7
DQS9
/DQS9
D9,D27(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ12
DQ13
DQ14
DQ15
DQS10
/DQS10
D10,D28(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
DQ20
DQ21
DQ22
DQ23
DQS11
/DQS11
D11,D29(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ28
DQ29
DQ30
DQ31
DQS12
/DQS12
D12,D30(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
DQ52
DQ53
DQ54
DQ55
DQS15
/DQS15
D15,D33(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ60
DQ61
DQ62
DQ63
DQS9
/DQS9
D9,D34(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
DQ36
DQ37
DQ38
DQ39
DQS13
/DQS13
D13,D31(DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM /DQS
DQ44
DQ45
DQ46
DQ47
DQS14
/DQS14
D14,D32( DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
CB4
CB5
CB6
CB7
DQS17
/DQS17
D17,D35( DDP)
DQS/CSDM
I/O0
I/O1
I/O2
I/O3
/DQS DQS/CSDM
ODT0
CKE0
/PCK7**
/WE
1:2
R
E
G
I
S
T
E
R
PCK7**
/RESET**
/CAS
/RAS
BA0 ? BA2
A0?A13
/S1*
/RST
/S0*
RO DT 1 = > O DT 1: SDRAM s D18-D35
ODT1
CKE1
RO DT 0 = > O DT 0: SDRAM s D0-D17
RCK E1 = > CKE 1: SDRAM s D18-D35
RCKE0 = > CKE0: SD RAMs D0-D17
/RA 0 ? RA12 = > A0 -A12 : SDRAMs D 0- D3 5
/RW E = > /WE : SDR AM s D 0-D35
/RCAS = > /CAS: SDRAMs D0-D35
/RRAS = > /RAS: SDR AM s D0-D35
/RBA0 ? RBA2 = > BA0 -BA2 : SDRAMs D0-D35
/R S 1 to /C S : S DRA Ms D 1 8 ? D35
/R S 0 to /C S : S DRA Ms D 0 ? D17
Notes:
1. Register values are 22 O hms +/- 5% .
2. /R S 0 an d /RS 1 alternate between the back and front sides of the DIMM
* /S0 connects to D/C S0 and /S1 connects to D/CS1 on both Registe rs.
** /RES ET,PCK 7 and /P CK7 connect to both Registers. Other signals connect to two Registe rs.
SA0 SA1 SA2
W
P
SCL SDA
A0 A1 A2
Serial PD
SCL U0 SDA
VDD SPD
VREF
VDD/VDDQ
VSS
Serial
PD
D O to D 35
D O to D 35
D O to D 35
P
L
L
OE
CK0
/CK0
/RESET
PCK0 to PCK6, PCK8,PCK9 = > CK : SDRAMx D0-D35
/PCK0 t o /PCK6 , /PCK8 ,/PCK9 = > /CK : SDRAMx D 0-D3 5
PCK7 = > CK: Register
/PCK7 = > /CK: Register
Rev. 0.2 / Jul. 2007 9
1
240pin Registered DDR2 SDRAM DIMMs
ABSOLUTE MAXIMUM RATINGS
Notes :
1. S tress greater than those listed may cause permanent damage to the device. This is a stress rating only, and device
functional operation at or above th e conditions indicated is not implied. Expousure to absolute maximum rating con
ditions for extended periods may affect reliablility.
3. Up to 9850 ft.
OPERATING CONDITIONS
Notes :
1. Up to 9850 ft.
2. If the DRAM case temperature is Above 85oC, the Auto-Refresh command interval has to be reduced to
tREFI=3.9us. For Measurement conditions of TCASE, please refer to the JEDEC document JESD51-2.
DC OPERATING CONDITIONS (SSTL_1.8)
Notes :
1. VDDQ must be less than or equal to VDD.
2. Peak to peak ac noise on VREF may not exeed +/-2% VREF(dc)
3. VTT of transmitting device must track VREF of receiving device.
Parameter Symbol Value Unit Note
Voltage on VDD pin relative to Vss VDD - 1.0 V ~ 2.3 V V 1
Voltage on VDDQ pin relative to Vss VDDQ - 0.5 V ~ 2.3 V V 1
Voltage on any pin relative to Vss VIN, VOUT - 0.5 V ~ 2.3 V V 1
Storage Temperature TSTG -50 ~ +100 oC1
Storage Humidity(without condensation) HSTG 5 to 95 % 1
Parameter Symbol Rating Units Notes
DIMM Operating temperature(ambient) TOPR 0 ~ +55 oC
DIMM Barometric Pressure(operating & storage) PBAR 105 to 69 K Pascal 1
DRAM Component Case Temperature Range TCASE 0 ~+95 oC2
Parameter Symbol Min Max Unit Note
Power Supply Voltage VDD 1.7 1.9 V
VDDQ 1.7 1.9 V 1
Input Reference Voltage VREF 0.49 x VDDQ 0.51 x VDDQ V2
EEPROM Supply Voltage VDDSPD 1.7 3.6 V
Termination Voltage VTT VREF-0.04 VREF+0.04 V 3
Rev. 0.2 / Jul. 2007 10
1
240pin Registered DDR2 SDRAM DIMMs
INPUT DC LOGIC LEVEL
INPUT AC LOGIC LEVEL
AC INPUT TEST CONDITIONS
Notes:
1. Input waveform timing is referenced to the input signal crossing through the VREF level applied to the device
under test.
2. The input signal minimum slew rate is to be maintained over the range from VREF max to VIH(ac) min for rising
edges and the range from VREF min to VIL(ac) max for falling edges as shown in the below figure.
3. AC timings are referenced with input waveforms switching from VIL(ac) to VIH(ac) on the positive transitions and
VIH(ac) to VIL(ac) on the negative transitions.
Parameter Symbol Min Max Unit Note
Input High Voltage VIH(DC) VREF + 0.125 VDDQ + 0.3 V
Input Low Voltage VIL(DC) -0.30 VREF - 0.125 V
Parameter Symbol DDR2 400/53 3 DDR2 667/800 Unit Notes
Min Max Min Max
AC Input logic High VIH(AC) VREF + 0.250 - VREF + 0.200 - V
AC Input logic Low VIL(AC) -V
REF - 0.250 - VREF - 0.200 V
Symbol Condition Value Units Notes
VREF Input reference voltage 0.5 * VDDQ V1
VSWING(MAX) Input signal maximum peak to peak swing 1.0 V 1
SLEW Input sign a l mi nimu m sl ew rat e 1.0 V/ns 2, 3
VDDQ
VIH(ac) min
VIH(dc) min
VREF
VIL(dc) max
VIL(ac) max
VSS
< Figure : AC Input Test Signal W aveform >
V
SWING(MAX)
delta TRdelta TF
Start of Falling Edge Input Timing S tart of Rising Edge Input Timing
V
REF
-
VIL
(ac)
max
delta TF
Falling Slew = Rising Slew = V
IH(ac)
min - V
REF
delta TR
Rev. 0.2 / Jul. 2007 11
1
240pin Registered DDR2 SDRAM DIMMs
Differential Input AC logic Level
1. VIN(DC) specifies the allowable DC execution of each input of differential pair such as CK, CK, DQS, DQS, LDQ S,
LDQS, UDQS and UDQS.
2. VID(DC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input (such as
CK, DQS, LDQS or UDQS) level and VCP is the complementary input (such as CK, DQS, LDQS or UDQS) level. The
minimum value is equal to VIH(DC) - VIL(DC).
Notes:
1. VID(AC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input signal
(such as CK, DQS, LDQS or UDQS) and VCP is the complementary input signal (such as CK, DQS, LDQS or UDQS).
The minimum value is equal to V IH(AC) - VIL(AC).
2. The typical value of VIX(AC) is expected to be about 0.5 * V DDQ of the transmitting device and VIX(AC) is expected to
track variations in VDDQ . VIX(AC) indicates the voltage at whitch differential input signals must cross.
DIFFERENTIAL AC OUTPUT PARAMETERS
Notes:
1. The typical value of VOX(AC) is expected to be about 0.5 * VDDQ of the transmitting device and VOX(AC) is expected to
track variations in VDDQ . VOX(AC) indicates the voltage at whitch differential output signals must cross.
Symbol Parameter Min. Max. Units Note
VID (ac) ac differential input voltage 0.5 VDDQ + 0.6 V 1
VIX (ac) ac differential cross point voltage 0.5 * VDDQ - 0.175 0.5 * VDDQ + 0.175 V 2
Symbol Parameter Min. Max. Units Note
VOX (ac) ac differential cross point voltage 0.5 * VDDQ - 0.125 0.5 * VDDQ + 0.125 V 1
VDDQ
Crossing point
VSSQ
VTR
VCP
VID VIX or VOX
< Differential signal levels >
Rev. 0.2 / Jul. 2007 12
1
240pin Registered DDR2 SDRAM DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Notes:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Notes:
1. VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and
VDDQ - 280 mV.
2. VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV.
3. The dc value of VREF applied to the receiving device is set to VTT
4. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an
SSTL_18 receiver. The actual current values are derived by shifting the desired driver operating point along a 21 ohm
load line to define a convenient driver current for me asurement.
Symbol Parameter SSTL_18 Units Notes
VOTR Output Timing Measurement Reference Level 0.5 * VDDQ V1
Symbol Parameter SSTl_18 Units Notes
IOH(dc) Output Minimum Source DC Current - 13.4 mA 1, 3, 4
IOL(dc) Output Minimum Sink DC Current 13.4 mA 2, 3, 4
Rev. 0.2 / Jul. 2007 13
1
240pin Registered DDR2 SDRAM DIMMs
PIN Capacitance (VDD=1.8V,VDDQ=1.8V, TA=25℃. f=1MHz )
1GB : HYMP112[R,P]72AP8
2GB : HYMP125[R,P]72AP4
4GB : HYMP351[R,P]72AMP4
Notes :
1. Pins not under test are tied to GND.
2. These value are guaranteed by design and tested on a sample basis only.
Pin Symbol Min Max Unit
CK0, CK0CCK711
pF
CKE, ODT CI1 8 12 pF
CS CI2 8 12 pF
Address, RAS, CAS, WE CI3 8 12 pF
DQ, DM, DQS, DQS CIO 6 9 pF
Pin Symbol Min Max Unit
CK0, CK0CCK711
pF
CKE, ODT CI1 8 12 pF
CS CI2 10 15 pF
Address, RAS, CAS, WE CI3 8 12 pF
DQ, DM, DQS, DQS CIO 6 9 pF
Pin Symbol Min Max Unit
CK0, CK0CCK9.514
pF
CKE, ODT CI1 10.5 16 pF
CS CI2 10.5 16 pF
Address, RAS, CAS, WE CI3 10.5 16 pF
DQ, DM, DQS, DQS CIO 17 21 pF
Rev. 0.2 / Jul. 2007 14
1
240pin Registered DDR2 SDRAM DIMMs
IDD SPECIFICATIONS (TCASE : 0 to 95oC)
1GB, 128M x 72 Registered DIMM : HYMP112[R,P]72AP8
Notes : 1. IDD6 current alues are guaranted up to Tc ase of 85 max.
2GB, 256M x 72 Registered DIMM : HYMP125[R,P]72AP4
Notes : 1. IDD6 current alues are g uaranted up to Tcase of 85 max.
Symbol E3(DDR2 400@CL 3) C4(DDR2 533@CL 4) Y5(DDR2 667@CL 5) Unit note
IDD0 TBD TBD TBD mA
IDD1 TBD TBD TBD mA
IDD2P TBD TBD TBD mA
IDD2Q TBD TBD TBD mA
IDD2N TBD TBD TBD mA
IDD3P(F) TBD TBD TBD mA
IDD3P(S) TBD TBD TBD mA
IDD3N TBD TBD TBD mA
IDD4R TBD TBD TBD mA
IDD4W TBD TBD TBD mA
IDD5B TBD TBD TBD mA
IDD6 TBD TBD TBD mA 1
IDD7 TBD TBD TBD mA
Symbol E3(DDR2 400@CL 3) C4(DDR2 533@CL 4) Y5(DDR2 667@CL 5) Unit note
IDD0 TBD TBD TBD mA
IDD1 TBD TBD TBD mA
IDD2P TBD TBD TBD mA
IDD2Q TBD TBD TBD mA
IDD2N TBD TBD TBD mA
IDD3P(F) TBD TBD TBD mA
IDD3P(S) TBD TBD TBD mA
IDD3N TBD TBD TBD mA
IDD4R TBD TBD TBD mA
IDD4W TBD TBD TBD mA
IDD5B TBD TBD TBD mA
IDD6 TBD TBD TBD mA 1
IDD7 TBD TBD TBD mA
Rev. 0.2 / Jul. 2007 15
1
240pin Registered DDR2 SDRAM DIMMs
4GB, 512M x 72 Registered DIMM : HYMP351[R,P]72AMP4
Notes : 1. IDD6 current values are guaranted up to Tcase of 85 max.
Symbol E3(DDR2 400@CL 3) C4(DDR2 533@CL 4) Y5(DDR2 667@CL 5) Unit note
IDD0 TBD TBD TBD mA
IDD1 TBD TBD TBD mA
IDD2P TBD TBD TBD mA
IDD2Q TBD TBD TBD mA
IDD2N TBD TBD TBD mA
IDD3P(F) TBD TBD TBD mA
IDD3P(S) TBD TBD TBD mA
IDD3N TBD TBD TBD mA
IDD4R TBD TBD TBD mA
IDD4W TBD TBD TBD mA
IDD5B TBD TBD TBD mA
IDD6 TBD TBD TBD mA 1
IDD7 TBD TBD TBD mA
Rev. 0.2 / Jul. 2007 16
1
240pin Registered DDR2 SDRAM DIMMs
IDD Measurement Conditions
Notes:
1. IDD specifications are tested after the device is properly initialized
2. Input slew rate is specified by AC Parametric Test Condition
3. IDD parameters are specified with ODT disabled.
4. Data bus consist s of DQ, DM, DQS, DQS, RDQS, RDQS, LDQS, LDQS, UDQS, and UDQS. IDD values must be met with all combina-
tions of EMRS bits 10 and 11.
5. Definitions for IDD
LOW is defined as Vin VILAC(max)
HIGH is defined as Vin VIHAC(min)
STABLE is defined as inputs stable at a HIGH or LOW level
FLOATING is defined as inputs at VREF = VDDQ/2
SWITCHING is defined as:
Symbol Conditions Units
IDD0 Operating one bank active-precharge current; tCK = tCK(IDD), tRC = tRC(IDD), tRAS = tRAS-
min(IDD);CKE is HIGH, CS is HIGH between valid commands;Address bus inputs are SWITCHING;Data bus
inputs are SWITCHING mA
IDD1 Operating one bank active-read-precharge curren ; IOUT = 0mA;BL = 4, CL = CL(IDD), AL = 0;
tCK = tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin(IDD), tRCD = tRCD(IDD) ; CKE is HIGH, CS is HIGH
between valid commands ; Address bus inputs are SWITCHING ; Data pattern is same as IDD4W mA
IDD2P Precharge power-down current ; All banks idle ; tCK = tCK(IDD) ; CKE is LOW ; Other control and address
bus inputs are STABLE; Data bus inputs are FLOATING mA
IDD2Q Precharge quiet standby current;All banks idle; tCK = tCK(IDD);CKE is HIGH, CS is HIGH; Other control
and address bus inputs are STABLE; Data bus inputs are FLOATING mA
IDD2N Precharge standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS is HIGH; Other control and
address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA
IDD3P Active power-down current; All banks open; tCK = tCK(IDD); CKE is LOW;
Other control and address bus inputs are STABLE; Data bus inputs are
FLOATING
Fast PDN Exit MRS(12) = 0 mA
Slow PDN Exit MRS(12) = 1 mA
IDD3N Active standby current; All banks open; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP =tRP(IDD); CKE is
HIGH, CS is HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data
bus inputs are SWITCHING mA
IDD4W Operating burst write current; All banks open, Continuous burst writes; BL = 4, CL = CL(IDD), AL = 0; tCK =
tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands;
Address bus inputs are SWITCHING; Data bus inputs are SWITCHING mA
IDD4R Operating burst read current; All banks open, Continuous burst reads, IOUT = 0mA; BL = 4, CL = CL(IDD),
AL = 0; tCK = tCK(IDD), tRAS = tRASmax(IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid
commands; Address bus inputs are SWITCHING;; Data pattern is same as IDD4W mA
IDD5B Burst refresh current; tCK = tCK(IDD); Refresh command at every tRFC(IDD) int erval; CKE is HIGH, CS is
HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus inputs are
SWITCHING mA
IDD6 Self refresh current; CK and CK at 0V; CKE 0.2V; Other control and address bus inputs are FLOATING;
Data bus inputs are FLOATING. IDD6 current values are guaranted up to Tcase of 85 max. mA
IDD7
Operating bank interleave read current; All bank interleaving reads, IOUT = 0mA; BL = 4, CL = CL(IDD), AL
= tRCD(IDD)-1*tCK(IDD); tCK = tCK(IDD), tRC = tRC(IDD), tRRD = tRRD(IDD), tR CD = 1*tCK(IDD); CKE is
HIGH, CS is HIGH between valid commands; Address bus inputs are STABLE during DESELECTs; Data pat-
tern is same as IDD4R; - Refer to the following page for detailed timing conditions
mA
Rev. 0.2 / Jul. 2007 17
1
240pin Registered DDR2 SDRAM DIMMs
Electrical Characteristics & AC Timings
Speed Bins and CL,tRCD,tRP,tRC and tRAS for Corresponding Bin
AC Timing Parameters by Speed Grade
Speed DDR2-667 (Y5) DDR2-533 (C4) DDR2-400 (E3) Unit
Bin(CL-tRCD-tRP) 5-5-5 4-4-4 3-3-3
Parameter min min min
CAS Latency 543ns
tRCD 15 15 15 ns
tRP 15 15 15 ns
tRC 60 60 55 ns
tRAS 45 45 40 ns
Parameter Symbol DDR2-400 DDR2-533 Unit Note
Min Max Min Max
Data-Out edge to Cl ock edge Skew tAC -600 600 -500 500 ps
DQS-Out edge to Clock edge Skew tDQSCK -500 500 -500 450 ns
Clock High Level Width tCH 0.45 0.55 0.45 0.55 CK
Clock Low Level Width tCL 0.45 0.55 0.45 0.55 CK
Clock Half Period tHP min
(tCL,tCH) -min
(tCL,tCH) -ns
System Clock Cycle Time tCK 5000 8000 3750 8000 ps
DQ and DM input setup time tDS 275 - 225 - ps 1
DQ and DM input hold time tDH 150 - 100 - ps 1
Control & Address input Pulse Width for each input tIPW 0.6 - 0.6 - tCK
DQ and DM input pulse witdth for each input pulse width for
each input tDIPW 0.35 - 0.35 - tCK
Data-out high-impedance window from CK, /CK tHZ - tAC max - tAC max ps
DQS low-impedance time from CK/CK tLZ(DQS) tAC min tAC max tAC min tAC max ps
DQ low-impedance time from CK/CK tLZ(DQ) 2*tAC min tAC max 2*tAC min tAC max ps
DQS-DQ skew for DQS and associated DQ signals tDQSQ - 350 - 300 ps
DQ hold skew factor tQHS - 450 - 400 ps
DQ/DQS output hold time from DQS tQH tHP - tQHS -tHP - tQHS -ps
Write command t o first DQS latching transition tDQSS WL - 0.25 WL + 0.25 WL - 0.25 WL + 0.25 tCK
DQS input high pulse width tDQSH 0.35 -0.35 - tCK
DQS input low pulse width tDQSL 0.35 -0.35 - tCK
DQS falling edge to CK setup time tDSS 0.2 -0.2 - tCK
DQS falling edge hold time from CK tDSH 0.2 -0.2 - tCK
Mode register set command cycle time tMRD 2 - 2 - tCK
Write postamble tWPST 0.4 0.6 0.4 0.6 tCK
Write preamble tWPRE 0.35 -0.35 - tCK
Rev. 0.2 / Jul. 2007 18
1
240pin Registered DDR2 SDRAM DIMMs
- continued -
Note :
1. For details and notes, please refer to the relevant HYNIX component datasheet HY5PS1G[4/8]31AFP.
2. C TCASE 85°C
3. 85°C TCASE95°C
Parameter Symbol DDR2-400 DDR2-533 Unit Note
Min Max Min Max
Address and control input setup time tIS 350 -250-ps
Address and control input hold time tIH 475 -375-ps
Read preamble tRPRE 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 tCK
Auto-Refresh to Active/Auto-Refresh command period tRFC 127.5 -127.5 -ns
Row Active to Row Active Delay for 1KB page size tRRD 7.5 - 7.5 - ns
Row Active to Row Active Delay for 2KB page size tRRD 10 - 10 - ns
Four Activate Window for 1KB page size tFAW 37.5 - 37.5 - ns
Four Activate Window for 2KB page size tFAW 50 - 50 - ns
CAS to CAS command delay tCCD 2 2 tCK
Write recovery time tWR 15 -15-ns
Auto Precharge Write Recovery + Precharge Time tDAL tWR+tRP - tWR+tRP - tCK
Write to Read Command Delay tWTR 10 - 7.5 -ns
Internal read to precharge command delay tRTP 7.5 7.5 ns
Exit self refresh to a non-read comma nd tXSNR tRFC + 10 tRFC + 10 ns
Exit self refresh to a read command tXSRD 200 -200 -tCK
Exit precharge power down to any non-read command tXP 2 - 2 - tCK
Exit active power down to read command tXARD 2 2 tCK
Exit active power down to read command
(Slow exit, Lower power) tXARDS 6 - AL 6 - AL tCK
CKE minimum pulse width
(high and low pulse width) tCKE 33tCK
ODT turn-on delay tAOND 2222tCK
ODT turn-on tAON tAC(min) tAC(max)+1 tAC(min) tAC(max)+1 ns
ODT turn-on(Power-Down mode) tAONPD tAC(min)+2 2tCK+tAC(m
ax)+1 tAC(min)+2 2tCK+tAC(m
ax)+1 ns
ODT turn-off delay tAOFD 2.52.52.52.5tCK
ODT turn-off tAOF tAC(min) tAC(max)+
0.6 tAC(min) tAC(max)+
0.6 ns
ODT turn-off (Power-Down mode) tAOFPD tAC(min)+2 2.5tCK+tA
C(max)+1 tAC(min)+2 2.5tCK+tA
C(max)+1 ns
ODT to power down entry latency tANPD 33
tCK
ODT power down exit latency tAXPD 88
tCK
OCD drive mode output delay tOIT 012012
ns
Minimum time clocks remains ON after CKE
asynchronously drops LOW tDelay tIS+tCK+tIH tIS+tCK+tIH ns
Average periodic Refresh Interval tREFI -7.8-7.8us2
tREFI -3.9 -3.9 us 3
Rev. 0.2 / Jul. 2007 19
1
240pin Registered DDR2 SDRAM DIMMs
Parameter Symbol DDR2-667 DDR2-800 Unit Note
min max min max
DQ output access time from CK/CK tAC -450 +450 -400 +400 ps
DQS output access time from CK/CK tDQSCK -400 +400 -350 +350 ps
CK high-level width tCH 0.45 0.55 0.45 0.55 tCK
CK low-level width tCL 0.45 0.55 0.45 0.55 tCK
CK half period tHP min(tCL,
tCH) -min(tCL,
tCH) -ps
Clock cycle time, CL=x tCK 3000 8000 2500 ps
DQ and DM input setup tim e
(differen t ial strobe ) tDS 100 - 50 -ps 1
DQ and DM input hold time
(differen t ial strobe ) tDH 175 - 125 -ps 1
Control & Addres s input puls e width f or each
input tIPW 0.6 - 0.6 -tCK
DQ and DM input pulse width for each input tDIPW 0.35 - 0.35 -tCK
Data-out high-impe dan ce time from CK/CK tHZ - tAC max - tAC max ps
DQS low-impedance time from CK/CK tLZ(DQS) tAC min tAC max tAC min tAC max ps
DQ low-impedance time from CK/CK tLZ(DQ) 2*tAC min tAC max 2*tAC min tAC max ps
DQS-DQ skew for DQS and associated DQ
signals tDQSQ - 240 -200ps
DQ hold skew factor tQHS - 340 -300ps
DQ/DQS output hold time from DQS tQH tHP - tQHS -tHP - tQHS -ps
First DQS latching transition to associated
clock edge tDQSS - 0.25 + 0.25 - 0.25 + 0.25 tCK
DQS input high pulse width tDQSH 0.35 -0.35 -tCK
DQS input low pulse width tDQSL 0.35 -0.35 -tCK
DQS falling edge to CK setup time tDSS 0.2 -0.2 -tCK
DQS falling edge hold time from CK tDSH 0.2 -0.2 -tCK
Mode register set com m a nd cycle time tMRD 2 - 2 - tCK
Write postamble tWPST 0.4 0.6 0.4 0.6 tCK
Auto-Refresh to Acti ve/Auto-Refresh command
period tRFC 127.5 -127.5 -ns
Row Active to Row Active Delay for 1KB page size tRRD7.5-7.5-ns
Write preamble tWPRE 0.35 -0.35 -tCK
Address and co nt rol input setup time tIS 200 - 175 -ps
Address and co nt rol input hold tim e tIH 275 - 250 -ps
Read pr eambl e tRPRE 0.9 1.1 0.9 1.1 tCK
Read postamble tRPST 0.4 0.6 0.4 0.6 tCK
Activate to precharge command tRAS 45 70000 45 70000 ns
Active to active command period for 1KB
page size products tRRD 7.5 -7.5-ns
Row Active to Row Active Delay for 2KB page size tRRD 10 - 10 - ns
Four Active Window for 1KB page size
products tFAW 37.5 -35 -ns
Four Activate Window for 2KB p age size tFAW 50 - 50 - ns
Rev. 0.2 / Jul. 2007 20
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240pin Registered DDR2 SDRAM DIMMs
- continued -
Notes :
1. For details and notes, please refer to the relevant HYNIX component datasheet HY5PS1G[4/8]31AFP.
2. C TCASE 85°C
3. 85°C TCASE95°C
Parameter Symbol DDR2-667 DDR2-800 Unit Note
min max min max
CAS to CAS command delay tCCD 2 2 tCK
Write recovery time tWR 15 -15-ns
Auto precharge write recovery + precharge
time tDAL WR+tRP -WR+tRP -tCK
Internal write to read command delay tWTR 7.5 -7.5-ns
Internal read to precharge command delay tRTP 7.5 7.5 ns
Exit self refresh to a non-read command tXSNR tRFC + 10 tRFC + 10 ns
Exit self refresh to a read command tXSRD 200 -200 -tCK
Exit precharge power down to any non-read
command tXP 2 - 2 - tCK
Exit active power down to read command tXARD 2 2 tCK
Exit active power down to read command
(Slow exit, Lower power) tXARDS 7 - AL 8 - AL tCK
CKE minimum pulse width
(high and low pulse width) tCKE 33tCK
ODT turn-on delay tAOND 2222tCK
ODT turn-on tAON tAC(min) tAC(max)
+0.7 tAC(min) tAC(max)
+0.7 ns
ODT turn-on(Power-Down mode) tAONPD tAC(min)+2 2tCK+
tAC(max)+1 tAC(min)
+2 2tCK+
tAC(max)+1 ns
ODT turn-off delay tAOFD 2.5 2.5 2.5 2.5 tCK
ODT turn-off tAOF tAC(min) tAC(max)+
0.6 tAC(min) tAC(max)
+0.6 ns
ODT turn-off (Power-Down mode) tAOFPD tAC(min)
+2 2.5tCK+
tAC(max)+1 tAC(min)
+2 2.5tCK+
tAC(max)+1 ns
ODT to power down entry latency tANPD 3 3 tCK
ODT power down exit latency tAXPD 8 8 tCK
OCD drive mode output delay tOIT 0 12 0 12 ns
Minimum time clocks remains ON after CKE
asynchronously drops LOW tDelay tIS+tCK+tIH tIS+tCK
+tIH ns
Average periodic Refresh Interval tREFI - 7.8 - 7.8 us 2
tREFI -3.9 -3.9 us 3
Rev. 0.2 / Jul. 2007 21
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240pin Registered DDR2 SDRAM DIMMs
PACKAGE OUTLINE
128Mx72 (1 rank) - HYMP112[R,P]72AP8
Front
30.0
4.0±0.1
133.35
63.0
5.175 5.175
55.0
5.0
Back
0.8 ±0.05
1.0
0.20
Detail of Contacts A
2.50 ±0.20
De tail o f Co n tacts B
2.50
1.50 ±0.10
3.80
5.00
3.0 3.0
10.0
17.80
Detail-A Detail-B
N o te ) All dimen s io n s a r e in millime t e rs u n less o t h e r wise st a te d.
PLL
Register
Side
2. 7 m ax
1. 27 ± 0.10
(Front)
Rev. 0.2 / Jul. 2007 22
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240pin Registered DDR2 SDRAM DIMMs
PACKAGE OUTLINE
256Mx72 (1 rank) - HYMP125[R,P]72AP4
Side
4.0 max
1.27 ± 0.10
Front
30.0
4.0±0.1
133.35
63.0
5.175 5.175
55.0
5.0
Back
0.8 ±0.05
1.0
0.20
Deta il of Co nta cts A
2.50 ±0.20
Detail o f Con tacts B
2.50
1.50 ±0.10
3.80
5.00
3.0 3.0
10.0
17.80
Detail-A Detail-B
Note) All dim e n s ions are in millim eters u n le s s othe rwise st a te d.
PLL
Register
Register
Rev. 0.2 / Jul. 2007 23
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240pin Registered DDR2 SDRAM DIMMs
PACKAGE OUTLINE
512Mx72 (2 rank) - HYMP351[R,P]72AMP4
Side
4. 0 max
1. 27 ± 0.10
Front
30.0
4.0±0.1
133.35
63.0
5.175 5.175
55.0
5.0
Back
0.8 ±0.05
1.0
0.20
Deta il of C on tacts A
2.50 ±0.20
Detail of Contacts B
2.50
1.50 ±0.10
3.80
5.00
3.0 3.0
10.0
17.80
Detail-A Detail-B
Note) A ll d imen sio ns ar e in millim e te r s unle ss o t h e r w is e s ta te d.
PLL
Register
Register
Rev. 0.2 / Jul. 2007 24
1
240pin Registered DDR2 SDRAM DIMMs
REVISION HISTORY
Revisi on History Date Remark
0.1 Initial data sheet released Mar. 2006
0.2 Discarded Speed C4 for Non-parity and corrected typos Jul. 2007