ANALOG Programmable Gain DEVICES Instrumentation Amplifier AD625 REV. B 1.1 Scope. This specification covers the detail requirements for a programmable gain instrumentation amplifier. The . ._, 2Rp gain equation is Re +1. 1.2 Part Number. The complete part number per Table 1 of this specification is as follows: Device Part Number -1 AD625S(X)/883B 1.2.3 Case Outline. See Appendix 1 of General Specification ADI-M-1000: package outline: (X) Package Description D D-16 16-Pin Ceramic DIP E E-20A4 20-Terminal LCC 1.3 Absolute Maximum Ratings. (T, = +25C unless otherwise noted) Supply Voltage 2.0... cee eee eee eee tena eee n een enna +18V Internal Power Dissipation 22... 1... cee ete renee eter tne enneee 450 mW Input Voltage 2.0... cee ee een eee een tenet teen e ree eenee +Vs5 max Rated Operating Temperature Range ...... 0.0... ccc eee eee tee eee 55C to +125C Storage Temperature Range ... 2... ee eee tener tee nee eee 65C to +150C Lead Temperature Range (Soldering 10 seconds) .... 0... 0c cece et eee eee eens +300C 1.5 Thermal Characteristics. Thermal Resistance 0), = 22C/W for D-16 Os, = 95C/W for D16 Oc = 25C/W for E-20A 84 = 150C/W for E-20A INSTRUMENTATION AMPLIFIERS 10-21 INSTRUMENTATION AMPLIFIERS a ao AD625 SPECIFICATIONS Table 1 Sub Sub Group Group Test Symbol Device 1 2,3 Test Condition! Unit Gain Error 1 GE, -1 0.05 G=1 +% max Input Offset Voltage Vost -1 200 Vin = 0V +pV max Input Offset Voltage Drift TCVos1 -1 2 Vin =0V +pV/C max Output Offset Voltage Voso -1 5 Vin =0V +mV max Output Offset Drift TCVos0 -1 50 Vin =0V +pVPC max Input Bias Current Ip -1 50 G=1 +nA max Input Offset Current los -1 20 los = (+Ig)(Ip) +nA max Common-Mode Rejection CMRR, -1 70 G=1 dB min Common- Mode Rejection CMRR, -1 70 G=1 dB min Common-Mode Rejection +CMRR j 000 -1 110 G = 1000 dB min Common-Mode Rejection CMRR 00 1 110 G = 1000 dB min Power Supply Current lec -1 5 G= mA max Power Supply Rejection PSRR, -1 70 G= dB min Power Supply Rejection PSRR, ooo -1 100 G = 1000 dB min Vs = +15 V, Ry = 2 kO, unless otherwise noted. 3.2.1 Functional Block Diagram and Terminal wh 5 uw Assignments. gfe 2 22 O42 2 Fak 3.92 1 20 19 poe AD625 + INPUT (16 + + tox RTINULL 4 tf 18 RTO NULL -GAIN Ge 11) SENSE RTINULL 5 AD625 17 RTO NULL ee c I. > NC 6 TOP VIEW 16 NC prive V2, Ve . 40) OUTPUT +GAIN DRIVE 7 (Not to Scale) 15 -GAIN DRIVER sGAIN (g we I ncrenence Ne 8 14 SENSE sense @ 10k 9 10 11 12 13 wo o wn Ee anpur ()-AW-|* -* uP? 2 s NC = NO CONNECT 3.2.4 Microcircuit Technology Group. aneuT GI e Fe] anpuT This microcircuit is covered by technology group (49). saan sense [ 2| [15] -GaIN sense 4.2.1 Life Test/Burn-In Circuit. RTINULL 3 14 RTO NULL . . Vg PE 10K2 Ape2s 10kQ St -Vg Steady state life test is per MIL-STD-883 Method 1005. ATINULL topview | lRto nue Burn-in is per MIL-STD-883 Method 1015 test condition +GAIN DRIVE | 5 | (Notte Scale) iz] -GAIN DRIVE (B). ne | 6 11] SENSE wv VL rma REFERENCE [7] 10] Vout SINEWAVE (3 -Vs | 8 re} +V5 A 3 NC = NO CONNECT 20k AD625 S) top view 10-22 INSTRUMENTATION AMPLIFIERS 18V {Not to Scale) REV. B