
IXYS reserves the right to change limits, test conditions, and dimensions.
IXTD110N25T-8W
Notes:
1. Tested 100% on wafer.
2. Not tested at the wafer level. Die must be properly attached to a suitable substrate,
e.g. copper lead frame, in order to measure RDS(on).
3. The curves attached to this Data Sheet were derived using this die in the IXTH110N25T
Trench Gate MOSFET package.
4. Pulse test, t ≤ 300 μs, duty cycle, d ≤ 2 %.
Symbol Test Conditions2 Characteristic Values3
(TJ = 25°C, unless otherwise specified)
Min. Typ. Max.
gfs VDS= 10V, ID = 0.5 • ID25, Note 4 65 110 S
Ciss 9400 pF
Coss VGS = 0V, VDS = 25V, f = 1MHz 851 pF
Crss 55 pF
td(on) Resistive Switching Times 19 ns
trVGS = 15V, VDS =0.5 • VDSS, ID = 0.5 • ID25 27 ns
td(off) RG = 2Ω (External) 60 ns
tf27 ns
Qg(on) 157 nC
Qgs VGS= 10V, VDS = 0.5 • VDSS, ID = 25A 40 nC
Qgd 50 nC
Source-Drain Diode Characteristic Values2
(TJ = 25 °C, unless otherwise specified)
Symbol Test Conditions2Min. Typ. Max.
ISVGS = 0V 110 A
ISM Repetitive, pulse width limited by TJM 350 A
VSD IF = 55A, VGS = 0V, 1.2 V
Trr 170 ns
QRM 2.3 μC
IRM 27 Α
IXYS MOSFETs and IGBTs are covered by 4,835,592 4,931,844 5,049,961 5,237,481 6,162,665 6,404,065 B1 6,683,344 6,727,585 7,005,734 B2
one or moreof the following U.S. patents: 4,850,072 5,017,508 5,063,307 5,381,025 6,259,123 B1 6,534,343 6,710,405 B2 6,759,692 7,063,975 B2
4,881,106 5,034,796 5,187,117 5,486,715 6,306,728 B1 6,583,505 6,710,463 6,771,478 B2 7,071,537
PRELIMINARY TECHNICAL INFORMATION
The product presented herein is under development. The Technical Specifications offered are
derived from data gathered during objective characterizations of preliminary engineering lots; but
also may yet contain some information supplied during a pre-production design evaluation. IXYS
reserves the right to change limits, test conditions, and dimensions without notice.
IF = 55A,
-di/dt = 250 A/μs
VR = 100 V