©2008 Fairchild Semiconductor Corporation
N
FDD8880 Rev. B3
FDD8880
FDD8880
N-Channel PowerTrench® MOSFET
30V, 58A, 9m
General Description
This N-Channel MOSFET has been designed specifically to
improve the overall efficiency of DC/DC converters using
either synchronous or conventional switching PWM
controllers. It has been optimized for low gate charge, low
rDS(ON) and fast switching speed.
Applications
DC/DC converters
Features
•r
DS(ON) = 9m, VGS = 10V, ID = 35A
•r
DS(ON) = 12m, VGS = 4.5V, ID = 35A
High performance trench technology for extremely low
rDS(ON)
Low gate charge
High power and current handling capability
MOSFET Maximum Ratings TC = 25°C unless otherwise noted
Thermal Characteris tics
Package Marking and Ordering Information
Symbol Parameter Ratings Units
VDSS Drain to Source Voltage 30 V
VGS Ga te to Sou rce Voltage ±20 V
ID
Drain Current 58 A
Continuous (TC = 25oC, VGS = 10V) (Note 1)
Continuous (TC = 25oC, VGS = 4.5V) (Note 1) 51 A
Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 52oC/W) 13 A
Pulsed Figure 4 A
EAS Single Pulse Avalanche Energy (Note 2) 53 mJ
PDPower dissipation 55 W
Derate abov e 25oC0.37W/
oC
TJ, TSTG Operating and Storage Temperature -55 to 175 oC
RθJC Thermal Resistance Junction to Case TO-252 2.73 oC/W
RθJA Thermal Resistance Junction to Ambient TO-252 100 oC/W
RθJA Thermal Resistance Junction to Ambient TO-252, 1in2 copper pad area 52 oC/W
Device Marking Device Package Reel Size Tape Width Quantity
FDD8880 FDD8880 TO-252AA 13” 12mm 2500 units
G
S
D
TO-252
D-PAK
(TO-252)
D
G
S
tm
April 2008
RoHS Compliant
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Electrical Characteristics TC = 25°C unless otherwise noted
Off Characteristics
On Characteri st ics
Dynamic Characteristics
Switching Characteristics (VGS = 10V)
Drain-Source Diode Characteristics
Notes:
1: Package current limitation is 35A.
2: Starting TJ = 25°C, L = 0.14mH, IAS = 28A, VDD = 27V, VGS = 10V.
3
Symbol Par a m e ter Test Conditio ns Min Typ Max Units
BVDSS Drain to Source Breakdown Voltage ID = 250µA, VGS = 0V 30 - - V
IDSS Zero Gate Voltage Drain Current VDS = 24V - - 1 µA
VGS = 0V TC = 150oC - - 250
IGSS Gate to Source Leakage Current V GS = ±20V - - ±100 nA
VGS(TH) Gate to Source Threshold Voltage V GS = VDS, ID = 250µA 1.2 - 2.5 V
rDS(ON) D rain to Source On Resistance
ID = 35A, VGS = 10V - 0.007 0.009
ID = 35A, VGS = 4.5V - 0.009 0.012
ID = 35A, VGS = 10V,
TJ = 175oC- 0.013 0.015
CISS Input Capacitance VDS = 15V, VGS = 0V,
f = 1M H z
- 1260 - pF
COSS Output Capacitance - 260 - pF
CRSS Rev erse Transfer Capacitance - 150 - pF
RGGate Resista n ce VGS = 0.5 V, f = 1M H z - 2.3 -
Qg(TOT) Total Gate Charge at 10V V GS = 0V to 10V
VDD = 15V
ID = 35A
Ig = 1.0mA
-2331nC
Qg(5) Total Gate Charge at 5V V GS = 0V to 5V - 13 17 nC
Qg(TH) Threshold Gate Charge V GS = 0V to 1V - 1.3 1.7 nC
Qgs Gate to Sour ce Ga te Ch a rge - 3.8 - nC
Qgs2 Gate Charge Threshold to Plateau - 2.5 - nC
Qgd Gate to Drai n Miller Charge - 5.0 - nC
tON Turn-On Time
VDD = 15V, ID = 35A
VGS = 10V, RGS = 10
- - 147 ns
td(ON) Tur n-On Delay Time - 8 - ns
trRi s e Time - 91 - ns
td(OFF) Turn-Off Delay Time - 38 - ns
tfFa ll Time - 32 - ns
tOFF Tur n -Of f Time - - 108 ns
VSD Source to Drain Diode Voltage ISD = 35A - - 1.25 V
ISD = 15A - - 1.0 V
trr Reverse Reco very Time I SD = 35A, dISD/dt = 100A/µs- -27ns
QRR Reverse Recovered Charge ISD = 35A, dISD/dt = 100A/µs- -14nC
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Typical Characteristics TC = 25°C unless otherwise noted
Figure 1. Normalize d Po we r Dis sip ation vs Ca se
Temperature Figure 2. Maxim um Contin uous Drain Current vs
Case Tem peratur e
Figure 3. Normalized Maximum Transient Thermal Impedance
Figure 4. Peak Current Capability
TC, CASE TEMPERATURE (oC)
POWER DISSIPATION MULTIPLIER
00 25 50 75 100 175
0.2
0.4
0.6
0.8
1.0
1.2
125 150 0
10
20
30
40
50
60
25 50 75 100 125 150 175
ID, DRAIN CURRENT (A)
TC, CASE TEMPERATURE (oC)
CURRENT LIMITED
BY PACKAGE
VGS = 4.5V
VGS = 10V
0.1
1
10-5 10-4 10-3 10-2 10-1 100101
0.01
2
t, RECTANGULAR PULSE DURATION (s)
ZθJC, NORMALIZED
THERMAL IMPEDANCE
NOTES:
DUTY FACTOR: D = t1/t2
PEAK TJ = PDM x ZθJC x RθJC + TC
PDM
t1t2
0.5
0.2
0.1
0.05
0.01
0.02
DUTY CYCLE - DESCENDING ORDER
SINGLE PULSE
100
30
500
IDM, PEAK CURRENT (A)
t, PULSE WIDTH (s)
10-5 10-4 10-3 10-2 10-1 100101
TC = 25oC
I = I25 175 - TC
150
FOR TEMPER ATURES
ABOVE 25oC DERATE PEAK
CURRENT AS FOLLOWS:
TRANSCONDUCTANCE
MAY LIMIT CURRENT
IN THIS REGION
VGS = 4.5V
VGS = 10V
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Figure 5. Forward Bias Safe Operating Area NOTE: Refer to Fairchi ld Appl ica t ion Note s AN75 14 and AN75 15
Figure 6. Unclamped Inductive Switching
Capability
Figure 7. Tr ansfer Characteristic s Figure 8. Sat ura tion Characteristics
Figure 9 . Drain to Source On Resis tanc e vs Ga te
Voltage and Drain Current Figure 10. Normalized Drain to Source On
Resistance vs Junction Temperature
Typical Characteristics TC = 25°C unless otherwise noted
0.1
1
10
100
1000
110
60
VDS, DRAIN TO SOURCE VOLTAGE (V)
ID, DRAIN CURRENT (A)
TJ = MAX RATED
TC = 25oC
SINGLE PULSE
LIMITED B Y rDS(ON)
AREA MAY BE
OPERATION IN THIS
10µs
1ms
DC
100µs
10ms
1
10
100
0.01 0.1 1
500
10
IAS, AVALANCHE CURRENT (A)
tAV, TIME IN AVALANCH E (ms)
STARTING TJ = 25oC
STARTING TJ = 150oC
tAV = (L)(IAS)/(1.3*RATED BVDSS - VDD)
If R = 0
If R 0
tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1]
0
20
40
60
80
1.5 2.0 2.5 3.0 3.5 4.0
ID, DRAIN CURRENT (A)
VGS, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0. 5% MAX
VDD = 15V
TJ = 175oC TJ = -55oC
TJ = 25oC
0
20
40
60
80
0 0.25 0.5 0.75 1.0
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
TC = 25oC
VGS = 10V VGS = 4V
VGS = 3V
VGS = 5V
5
10
15
20
25
246810
ID = 1A
VGS, GATE TO SOURCE VOLTAGE (V)
ID = 35A
rDS(ON), DRAIN TO SOURCE
ON RESISTANCE (m)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0.6
0.8
1.0
1.2
1.4
1.6
1.8
-80 -40 0 40 80 120 160 200
NORMALIZED DRAIN TO SOURCE
TJ, JUNCTION TEMPERATURE (oC)
ON RESISTANCE
VGS = 10V, ID = 35A
PULSE DURATION = 80 µs
DUTY CYCLE = 0.5% MAX
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Figure 11. Normalized Gate Threshold Voltage vs
Junction Tem peratu re Figure 12. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
Figure 13. Capacitance vs Drain to Source
Voltage Figu re 14. Gate Charge Waveforms for Cons tant
Gate Current
Typical Characteristics TC = 25°C unless otherwise noted
0.4
0.6
0.8
1.0
1.2
-40 0 40 80 120 160 200-80
VGS = VDS, ID = 250µA
NORMALIZED GATE
TJ, JUNCTION TEMPERATURE (oC)
THRESHOLD VOLTAGE
0.90
0.95
1.00
1.05
1.10
-80 -40 0 40 80 120 160 200
TJ, JUNCTION TEMPERATURE (oC)
NORMALIZED DRAIN TO SOURCE
ID = 250µA
BREAKDOWN VOLTAGE
100
1000
0.1 1 10
2000
30
C, CAPACITANCE (pF)
VDS, DRAIN TO SOURCE VOLTAGE (V)
VGS = 0V, f = 1MHz
CISS = CGS + CGD
COSS CDS + CGD
CRSS = CGD
0
2
4
6
8
10
0 5 10 15 20 25
VGS, GATE TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
VDD = 15V
ID = 35A
ID = 1A
WAVEFORMS IN
DESCENDING ORDER:
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Test Circuits and Waveforms
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
tP
VGS
0.01
L
IAS
+
-
VDS
VDD
RG
DUT
VARY tP TO OBTAIN
REQUIRED PEAK IAS
0V
VDD
VDS
BVDSS
tP
IAS
tAV
0
VGS +
-
VDS
VDD
DUT
Ig(REF)
L
VDD
Qg(TH)
VGS = 1V
Qgs2
Qg(TOT)
VGS = 10V
VDS VGS
Ig(REF)
0
0
Qgs Qgd
Qg(5)
VGS = 5V
VGS
RL
RGS
DUT
+
-VDD
VDS
VGS
tON
td(ON)
tr
90%
10%
VDS 90%
10%
tf
td(OFF)
tOFF
90%
50%
50%
10% PULSE WIDTH
VGS
0
0
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
Thermal Resistance vs. Mounting Pad Area
The maximum rated junction temperature, TJM, and the
thermal resistance of the heat dissipating path determines
the maximum allowable device power dissipation, PDM, in an
application. Therefore the applications ambient
temperature, TA (oC), and thermal resistance RθJA (oC/W)
must be reviewed to ensure that TJM is never exceeded.
Equation 1 mathematically represents the relationship and
serves as the basis for establishing the rating of the part.
In using surface mount devices such as the TO-252
package, the environment in which it is applied will have a
significant influence on the parts current and maximum
power dissipation ratings. Precise determination of PDM is
complex and influenced by many factors:
1. Mounting pad area onto which the device is at tached and
whether there is copper on one side or both sides of the
board.
2. The number of copper layers and the thickness of the
board.
3. The use of external heat sinks.
4. The use of thermal vias.
5. Air flow and board orientation.
6. For non steady state applications, the pulse width, the
duty cycle and the transient thermal response of the part,
the board and the environment they are in.
Fairchild provides thermal information to assist the
designers preliminary application evaluation. Figure 21
defines the RθJA for the device as a function of the top
copper (component side) area. This is for a horizontally
positioned FR-4 board with 1oz copper af ter 1000 seconds
of steady state power with no air flow. This graph provides
the necessary information for calculation of the steady state
junction temperature or power dissipation. Pulse
applications can be evaluated using the Fairchild device
Spice thermal model or manually utilizing the normalized
maximum transient thermal impedance curve.
Thermal resistances corresponding to other copper areas
can be obtained from Figure 21 or by calculation using
Equation 2 or 3. Equation 2 is used for c opper area def ined
in inches square and equation 3 is for area in centimeters
square. The area, in square inches or square centimeters is
the top copper area including the gate and source pads.
(EQ. 1)
PDM
TJM TA
()
RθJA
-----------------------------=
Area in Inches Squared
(EQ. 2)
RθJA 33.32 23.84
0.268 Area+()
-------------------------------------+=
(EQ. 3)
RθJA 33.32 154
1.73 Area+()
----------------------------------+=
Area in Centimeters Squared
25
50
75
100
125
0.01 0.1 1 10
Figure 21. Thermal Resist anc e vs Mounting
Pad Area
RθJA = 33.32+ 23.84/(0.268+Area) EQ.2
RθJA (oC/W)
AREA, TOP COPPER AREA in2 (cm2)
RθJA = 33.32+ 154/(1.73+Area) EQ.3
(0.645) (6.45) (64.5)(0.0645)
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
PSPICE Electrical Model
.SUBCKT FDD8880 2 1 3 ; rev April 2004
Ca 12 8 9.5e-10
Cb 15 14 9.5e-10
Cin 6 8 1.15e-9
Dbody 7 5 DbodyMOD
Dbreak 5 11 D breakMOD
Dplcap 10 5 DplcapMOD
Ebreak 11 7 17 18 33.15
Eds 14 8 5 8 1
Egs 13 8 6 8 1
Esg 6 10 6 8 1
Evthres 6 21 19 8 1
Evtemp 20 6 18 22 1
It 8 17 1
Lgate 1 9 5.3e-9
Ldrain 2 5 1.0e-9
Lsou r c e 3 7 1. 7e-9
RLgate 1 9 53
RLdrai n 2 5 10
RLs ou r c e 3 7 17
Mmed 16 6 8 8 M m ed M OD
Mstro 16 6 8 8 MstroMOD
Mweak 16 21 8 8 MweakMOD
Rbreak 17 18 RbreakMOD 1
Rdrain 50 16 Rd rainMOD 3.2e-3
Rgate 9 20 2.2
RSLC1 5 51 RSLCMOD 1e-6
RSLC2 5 50 1e3
Rsource 8 7 Rs ourceMOD 3.2e-3
Rvthres 22 8 RvthresMOD 1
Rvtemp 18 19 Rvt empMOD 1
S1a 6 12 13 8 S1AMOD
S1b 13 12 13 8 S1BMOD
S2a 6 15 1 4 13 S2AMOD
S2b 13 1 5 14 13 S2BMOD
Vbat 22 19 DC 1
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/( 1e-6*170),5))}
.MODEL DbodyMOD D (IS=2E-12 IKF=10 N=1.01 RS=3.76e-3 TRS1=8e-4 TRS2=2e-7
+ CJO=4. 8e-10 M=0.55 TT =1e-17 XTI=2)
.MODEL DbreakMOD D (RS=0 .2 TRS1=1e - 3 T RS2=-8.9e-6)
.MODEL DplcapMOD D (CJO=5.5e-10 IS=1e-30 N=10 M=0.45)
.MODEL MmedMOD NMOS (VTO=2.0 KP=10 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.2)
.MODEL MstroMOD NMOS (VTO=2.5 KP=170 IS=1e-30 N=10 TOX=1 L=1u W=1u)
.MODEL MweakMOD NMOS (VTO=1.69 KP=0.05 IS=1e-30 N= 10 TOX=1 L=1u W=1u RG=22 RS=0.1)
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7 )
.MODEL RdrainMOD RES (TC1=1.8e- 3 TC2=8e-6)
.MODEL RSLCMOD RES (TC1=9e-4 TC2=1e-6)
.MODEL Rs ourceMOD RES (TC1= 5e-3 TC2=1e-6)
.MODEL RvthresMOD RES (TC1=-1e-3 TC2=-8.2e-6)
.MODEL Rv tempMOD RES (TC1=-2.6e-3 TC 2=2e-7)
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3.5)
.MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-4)
.MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1.3 VOFF=-0.8)
.MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.8 VOFF=-1.3)
.ENDS
Note : For furt her discuss ion of th e PSPIC E model, cons ult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank
Wheatley.
18
22
+-
6
8
+
-
5
51
+
-
19
8
+-
17
18
6
8
+
-
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
814
13
MWEAK
EBREAK DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ESLC
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG
LGATE
RLGATE 20
+
-
+
-
+
-
6
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
SABER Electrical Model
rev April 2004
template FDD8880 n2,n1,n3
electrical n2,n 1,n3
{
var i iscl
dp..model dbodymod = (isl=2e-12,ikf=10,nl=1.01,rs=3.76e-3,trs1=8e-4,trs2=2e-7,cjo=4.8e-10,m=0.55,tt=1e-17,xti=2)
dp..model dbreakmod = (rs=0.2,trs1=1e-3,trs2=-8.9e-6)
dp..model dplcapmod = (cjo=5.5e-10,isl=10e-30,nl=10,m=0.45)
m..model mmedmod = (type=_n,vto=2.0,kp=10,is=1e-30, tox=1)
m..model mstrongmod = (type=_n,vto=2.5,kp=170,is=1e-30, tox =1)
m..model mweakmod = (type=_n,vto=1.69,kp=0.05,is=1e-30, tox=1,rs=0.1)
sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-3.5)
sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-4)
sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1.3,voff=-0.8)
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.8,voff=-1.3)
c.ca n12 n8 = 9.5e -10
c.cb n15 n14 = 9.5e-10
c.ci n n6 n8 = 1.15 e-9
dp.dbody n7 n5 = mode l=dbodymod
dp.dbreak n5 n11 = model=dbreakmod
dp.dplc ap n10 n5 = mo del=dplcapmod
spe.e break n11 n7 n17 n18 = 33.15
spe.eds n14 n8 n5 n8 = 1
spe.egs n13 n8 n6 n8 = 1
spe.esg n6 n10 n6 n8 = 1
spe.evthres n6 n21 n19 n8 = 1
spe.evtemp n20 n6 n18 n22 = 1
i.it n8 n17 = 1
l.lgate n1 n9 = 5.3e- 9
l.ldrain n2 n5 = 1.0e-9
l.lsou rce n3 n7 = 1.7e -9
res.r l gate n1 n9 = 53
res.rldrain n2 n5 = 10
res.rlsource n3 n7 = 17
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u
m.mstr ong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u
m.mweak n16 n21 n8 n8 = mod el=mweakmod, l=1u, w=1u
res.rbreak n17 n18 = 1, tc1=8.3e-4,tc 2=-8e-7
res.rdrain n50 n16 = 3.2e-3, tc1=1.8e-3,tc2=8e-6
res.rgate n9 n20 = 2.2
res.rslc1 n5 n5 1 = 1e-6, tc1=9e-4,tc2=1e-6
res.rslc2 n5 n5 0 = 1e3
res.rsource n8 n7 = 3.2e-3, tc1=5e-3,tc2=1e-6
res.rvthres n22 n8 = 1, tc1=-1 e-3,tc2=-8.2e-6
res.rvtemp n18 n19 = 1, tc1=-2.6e-3,tc2=2e-7
sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod
sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod
sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod
sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod
v.vbat n22 n19 = dc=1
equations {
i (n51- >n50) +=i scl
iscl: v( n51,n50) = ((v(n5,n51)/ (1e-9+abs(v(n5,n51))))*((abs (v(n5,n5 1)*1e6/170 ))** 5))
}
}
18
22
+-
6
8
+
-
19
8
+-
17
18
6
8
+
-
5
8+
-
RBREAK
RVTEMP
VBAT
RVTHRES
IT
17 18
19
22
12
13
15
S1A
S1B
S2A
S2B
CA CB
EGS EDS
14
8
13
814
13
MWEAK
EBREAK
DBODY
RSOURCE
SOURCE
11
73
LSOURCE
RLSOURCE
CIN
RDRAIN
EVTHRES 16
21
8
MMED
MSTRO
DRAIN
2
LDRAIN
RLDRAIN
DBREAK
DPLCAP
ISCL
RSLC1
10
5
51
50
RSLC2
1
GATE RGATE EVTEMP
9
ESG
LGATE
RLGATE 20
+
-
+
-
+
-
6
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©2008 Fairchild Semiconductor Corporation FDD8880 Rev. B3
FDD8880
PSPICE Thermal Model
REV 23 April 2004
FDD8880T
CTHERM1 TH 6 8e-4
CTHERM2 6 5 1e-3
CTHERM3 5 4 2.5e-3
CTHERM4 4 3 2.6e-3
CTHERM5 3 2 8e-3
CTHERM6 2 TL 1.5e-2
RTHER M 1 TH 6 1. 44 e- 1
RTHERM2 6 5 1.9e-1
RTHERM3 5 4 3.0e-1
RTHERM4 4 3 4.0e-1
RTHERM5 3 2 5.7e-1
RTHERM6 2 TL 5.8e-1
SABER Thermal Model
SABER thermal model FDD8880T
template thermal_model th tl
therma l _c th, tl
{
ctherm.ctherm1 th 6 =8e-4
ctherm.ctherm2 6 5 =1e-3
ctherm.ctherm3 5 4 =2.5e-3
ctherm.ctherm4 4 3 =2.6e-3
ctherm.ctherm5 3 2 =8e-3
ctherm.cthe rm6 2 tl =1.5e-2
rtherm. rtherm1 th 6 =1.44e-1
rtherm. rtherm2 6 5 =1. 9e-1
rtherm. rtherm3 5 4 =3. 0e-1
rtherm. rtherm4 4 3 =4. 0e-1
rtherm. rtherm5 3 2 =5. 7e-1
rtherm. rtherm6 2 tl =5.8e-1
}
RTHERM4
RTHERM6
RTHERM5
RTHERM3
RTHERM2
RTHERM1
CTHERM4
CTHERM6
CTHERM5
CTHERM3
CTHERM2
CTHERM1
tl
2
3
4
5
6
th JUNCTION
CASE
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Rev. I34
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* EZSWITCH™ and FlashWriter® are trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
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As used herein:
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significant injury of the user.
2. A critical component in any component of a life support,
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PRODUCT STATUS DEFINITIONS
Definition of Terms
ACEx®
Build it Now™
CorePLUS™
CorePOWER™
CROSSVOLT
CTL™
Current Transfer Logic™
EcoSPARK®
EfficentMax™
EZSWITCH™ *
Fairchild®
Fairchild Semiconductor®
FACT Quiet Series™
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FastvCore™
FlashWriter® *
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GTO™
IntelliMAX™
ISOPLANAR™
MegaBuck™
MICROCOUPLER™
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MicroPak™
MillerDrive™
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Motion-SPM™
OPTOLOGIC®
OPTOPLANAR®
®
PDP-SPM™
Power-SPM™
PowerTrench®
Programmable Active Droop™
QFET®
QS™
Quiet Series™
RapidConfigure™
Saving our world 1mW at a time™
SmartMax™
SMART START™
SPM®
STEALTH™
SuperFET™
SuperSOT™-3
SuperSOT™-6
SuperSOT™-8
SuperMOS™
®
The Power Franchise®
TinyBoost™
TinyBuck™
TinyLogic®
TINYOPTO
TinyPower™
TinyPWM™
TinyWire™
µSerDes™
UHC®
Ultra FRFET™
UniFET™
VCX™
VisualMax™
®
tm
tm
Datasheet Identification Product Status Definition
Advance Information Formative or In Design This datasheet contains the design specifications for product development.
Specifications may change in any manner without notice.
Preliminary First Production
This datasheet contains preliminary data; supplementary data will be pub-
lished at a later date. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve design.
No Identification Needed Full Production This datasheet contains final specifications. Fairchild Semiconductor reserves
the right to make changes at any time without notice to improve the design.
Obsolete Not In Production This datasheet contains specifications on a product that is discontinued by
Fairchild Semiconductor. The datasheet is for reference information only.
@2008 Fairchild Semiconductor Corporation
FDD8880 Rev. B3
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