1CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774 |Copyright Intersil Americas Inc. 2012. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
36V Rad Hard Dual Precision Operational Amplifier
ISL70227SEH
The ISL70227SEH is a high precision dual operational
amplifier featuring very low noise, low offset voltage, low input
bias current and low temperature drift. These features plus its
radiation tolerance make the ISL70227SEH the ideal choice
for applications requiring both high DC accuracy and AC
performance. The combination of precision, low noise, and
small footprint provides the user with outstanding value and
flexibility relative to similar competitive parts.
Applications for these amplifiers include precision and
analytical instrumentation, active filters, and power supply
controls.
The ISL70227SEH is available in a 10 lead hermetic ceramic
flatpack and operates over the extended temperature range of
-55°C to +125°C.
Applications
Power Supply Control
Industrial Controls
Active Filter Blocks
Data Acquisition
Features
Electrically Screened to DLA SMD# 5962-12223
Wide Supply Range . . . . . . . . . . . . . . . . . . . .4.5V to 42V Max.
Very Low Voltage Noise . . . . . . . . . . . . . . . . . .2.5nV/Hz, Typ.
Gain-bandwidth Product . . . . . . . . . . . . . . . . . . . . . . . . 10MHz
Superb Offset Drift . . . . . . . . . . . . . . . . . . . . . . . . 1µV/°C, Max
Operating Temperature Range. . . . . . . . . . .-55°C to +125°C
Low Input Voltage Offset. . . . . . . . . . . . . . . . . . . . . . 10µV, Typ.
Input Bias Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1nA, Typ.
Unity Gain Stable
No Phase Reversal
Radiation Tolerance
- SEL/SEB LETTH . . . . . . . . . . . . . . . . . . . . . . 86MeV•cm2/mg
- High Dose Rate. . . . . . . . . . . . . . . . . . . . . . . . . . 100krad(Si)
- Low Dose Rate . . . . . . . . . . . . . . . . . . . . . . . . . 100krad(Si)*
* Product capability established by initial characterization. The
EH version is acceptance tested on a wafer by wafer basis to
50krad(Si) at low dose rate.
Related Literature
AN1669, “ISL70227SRH Evaluation Board User’s Guide”
AN1756, “Single Events Effects Testing of the ISL70227RH,
Dual 36V Rad Hard Precision Operational Amplifiers”
-
+
OUTPUT
V+
R1
V-
R2
C1
C2
Sallen-Key Low Pass Filter (1MHz)
VIN
95.3 232
680pF
1.5nF
FIGURE 1. TYPICAL APPLICATION
ISL70227SEH
R3
243
FIGURE 2. OFFSET VOLTAGE vs LOW DOSE RADIATION
V
OS
(µV)
TOTAL DOSE (krad(Si))
0
5
10
15
20
25
0 102030405060708090100
GROUNDED
BIASED
August 24, 2012
FN7958.1
ISL70227SEH
2FN7958.1
August 24, 2012
Pin Configuration
Ordering Information
ORDERING NUMBER
(Notes 1, 2)
PART
MARKING
TEMP RANGE
(°C)
PACKAGE
(Pb-free)
PKG.
DWG. #
5962R1222301VXA ISL70227SEHVF -55 to +125 10 Ld Flatpack K10.A
ISL70227SEHF/PROTO ISL70227 SEHF/PROTO -55 to +125 10 Ld Flatpack K10.A
5962R1222301V9A ISL70227SEHVX -55 to +125 Die
ISL70227SEHX/SAMPLE ISL70227SEHVX/SAMPLE -55 to +125 Die
ISL70227MHEVAL1Z Evaluation Board
NOTES:
1. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both
SnPb and Pb-free soldering operations.
2. For Moisture Sensitivity Level (MSL), please see device information page for ISL70227SEH. For more information on MSL please see techbrief TB363.
ISL70227SEH
(10 LD FLATPACK)
TOP VIEW
Pin Descriptions
PIN NUMBER PIN NAME EQUIVALENT CIRCUIT DESCRIPTION
3 +IN A Circuit 1 Amplifier A non-inverting input
5 V- Circuit 3 Negative power supply
7 +IN B Circuit 1 Amplifier B non-inverting input
8 -IN B Circuit 1 Amplifier B inverting input
9 OUT B Circuit 2 Amplifier B output
10 V+ Circuit 3 Positive power supply
1 OUT A Circuit 2 Amplifier A output
2 -IN A Circuit 1 Amplifier A inverting input
4, 6 NC - Not Connected – This pin is not electrically connected internally.
10
9
8
7
6
2
3
4
5
1OUTA
-IN A
+IN A
NC
V-
V+
OUT B
-IN B
+IN B
NC
+
-
+-
V+
V-
OUT
CIRCUIT 2CIRCUIT 1
V+
V-
CIRCUIT 3
IN-
V+
V-
IN+ CAPACITIVELY
TRIGGERED ESD
CLAMP
ISL70227SEH
3FN7958.1
August 24, 2012
Absolute Maximum Ratings Thermal Information
Maximum Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42V
Maximum Supply Voltage (LET = 86.4 MeVcm2/mg). . . . . . . . . . . . . 36V
Maximum Differential Input Current . . . . . . . . . . . . . . . . . . . . . . . . . . 20mA
Maximum Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . .0.5V
Min/Max Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . V- - 0.5V to V+ + 0.5V
Max/Min Input Current for
Input Voltage >V+ or <V- . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20mA
Output Short-Circuit Duration
(1 output at a Time) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Indefinite
ESD Tolerance
Human Body Model (Tested per MIL-PRF-883 3015.7). . . . . . . . . . . 2kV
Machine Model (Tested per JESD22-A115-A) . . . . . . . . . . . . . . . . . . 300V
Charged Device Model (Tested per CDM-22CI0ID). . . . . . . . . . . . . . 750V
Di-electrically Isolated PR40 Process . . . . . . . . . . . . . . . . . . . Latch-up free
Thermal Resistance (Typical) θJA (°C/W) θJC (°C/W)
10 Ld Ceramic Flatpack (Notes 3, 4) . . . . . 130 20
Storage Temperature Range. . . . . . . . . . . . . . . . . . . . . . . .-65°C to +150°C
Pb-Free Reflow Profile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . see link below
http://www.intersil.com/pbfree/Pb-FreeReflow.asp
Recommended Operating Conditions
Ambient Operating Temperature Range . . . . . . . . . . . . . .-55°C to +125°C
Maximum Operating Junction Temperature . . . . . . . . . . . . . . . . . .+150°C
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . 4.5V (±2.25V) to 30V (±15V)
CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product
reliability and result in failures not covered by warranty.
NOTES:
3. θJA is measured with the component mounted on a low effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
4. For θJC, the “case temp” location is the center of the ceramic on the package underside.
Electrical Specifications VS ±15V, VCM = 0, VO = 0V, RL = Open, TA = +25°C, unless otherwise noted. Boldface limits apply over
the operating temperature range, -55°C to +125°C.
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
VOS Offset Voltage -75 -10 75 µV
-100 100 µV
TCVOS Offset Voltage Drift -1 .1 1µV/°C
IOS Input Offset Current -10 1 10 nA
-12 12 nA
IB Input Bias Current -10 1 10 nA
-12 12 nA
VCM Input Voltage Range Guaranteed by CMRR -13 13 V
-12 12 V
CMRR Common-Mode Rejection Ratio VCM = -13V to +13V 115 120 dB
VCM = -12V to +12V 115 dB
PSRR Power Supply Rejection Ratio VS = ±2.25V to ±5V 110 117 dB
VS = ±3V to ±15V 110 dB
AVOL Open-Loop Gain VO = -13V to +13V
RL = 10k to ground
1000 1500 V/mV
VOH Output Voltage High RL = 10k to ground 13.5 13.65 V
13.2 V
RL = 2k to ground 13.4 13.5 V
13.1 V
VOL Output Voltage Low RL = 10k to ground -13.65 -13.5 V
-13.2 V
RL = 2k to ground -13.5 -13.4 V
-13.1 V
ISL70227SEH
4FN7958.1
August 24, 2012
ISSupply Current/Amplifier 2.2 2.8 mA
3.7 mA
ISC Short-Circuit RL = 0 to ground ±45 mA
VSUPPLY Supply Voltage Range Guaranteed by PSRR ±2.25 ±15 V
AC SPECIFICATIONS
GBW Gain Bandwidth Product 10 MHz
enp-p Voltage Noise 0.1Hz to 10Hz 85 nVP-P
enVoltage Noise Density f = 10Hz 3 nV/Hz
enVoltage Noise Density f = 100Hz 2.8 nV/Hz
enVoltage Noise Density f = 1kHz 2.5 nV/Hz
enVoltage Noise Density f = 10kHz 2.5 nV/Hz
in Current Noise Density f = 10kHz 0.4 pA/Hz
THD + N Total Harmonic Distortion + Noise 1kHz, G = 1, VO = 3.5VRMS,
RL = 2k
0.00022 %
TRANSIENT RESPONSE
SR Slew Rate AV = 10, RL = 2k, VO = 4VP-P ±2.5 ±3.6 V/µs
±2.0 V/µs
tr, tf, Small
Signal
Rise Time
10% to 90% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
36 100 ns
100 ns
Fall Time
90% to 10% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
38 100 ns
100 ns
tsSettling Time to 0.1%
10V Step; 10% to VOUT
AV = -1, VOUT = 10VP-P,
Rg = Rf = 10k, RL = 2k to VCM
3.4 µs
Settling Time to 0.01%
10V Step; 10% to VOUT
AV = -1, VOUT = 10VP-P,
RL = 2k to VCM
3.8 µs
tOL Output Overload Recovery Time AV = 100, VIN = 0.2V,
RL = 2k to VCM
1.7 µs
OS+ Positive Overshoot AV
= 1,
VOUT = 10VP-P, Rf = 0Ω
R
L
=2k
Ω to VCM
20 %
35 %
OS- Negative Overshoot AV
= 1,
VOUT = 10VP-P, Rf = 0Ω
R
L
=2k
Ω to VCM
20 %
35 %
Electrical Specifications VS ±15V, VCM = 0, VO = 0V, RL = Open, TA = +25°C, unless otherwise noted. Boldface limits apply over
the operating temperature range, -55°C to +125°C. (Continued)
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
ISL70227SEH
5FN7958.1
August 24, 2012
Electrical Specifications VS ±15V, VCM = 0, VO = 0V, RL = Open, TA= +25°C, unless otherwise noted. Boldface limits apply over a
total ionizing dose of 100krad(Si) with exposure at a high dose rate of 50 - 300krad(Si)/s; and over a total ionizing dose of 50krad(Si) with
exposure at a low dose rate of <10mrad(Si)/s.
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
VOS Offset Voltage -75 -10 75 µV
-100 100 µV
TCVOS Offset Voltage Drift -1 .1 1µV/°C
IOS Input Offset Current -10 1 10 nA
-25 25 nA
IB Input Bias Current -10 1 10 nA
-25 25 nA
VCM Input Voltage Range Guaranteed by CMRR -13 13 V
-12 12 V
CMRR Common-Mode Rejection Ratio VCM = -13V to +13V 115 120 dB
VCM = -12V to +12V 115 dB
PSRR Power Supply Rejection Ratio VS = ±2.25V to ±5V 110 117 dB
VS = ±3V to ±15V 110 dB
AVOL Open-Loop Gain VO = -13V to +13V
RL = 10k to ground
1000 1500 V/mV
VOH Output Voltage High RL = 10k to ground 13.5 13.65 V
13.2 V
RL = 2k to ground 13.4 13.5 V
13.1 V
VOL Output Voltage Low RL = 10k to ground -13.65 -13.5 V
-13.2 V
RL = 2k to ground -13.5 -13.4 V
-13.1 V
ISSupply Current/Amplifier 2.2 2.8 mA
3.7 mA
ISC Short-Circuit RL = 0 to ground ±45 mA
VSUPPLY Supply Voltage Range Guaranteed by PSRR ±2.25 ±15 V
AC SPECIFICATIONS
GBW Gain Bandwidth Product 10 MHz
enp-p Voltage Noise 0.1Hz to 10Hz 85 nVP-P
enVoltage Noise Density f = 10Hz 3 nV/Hz
enVoltage Noise Density f = 100Hz 2.8 nV/Hz
enVoltage Noise Density f = 1kHz 2.5 nV/Hz
enVoltage Noise Density f = 10kHz 2.5 nV/Hz
in Current Noise Density f = 10kHz 0.4 pA/Hz
THD + N Total Harmonic Distortion + Noise 1kHz, G = 1, VO = 3.5VRMS,
RL = 2k
0.00022 %
ISL70227SEH
6FN7958.1
August 24, 2012
TRANSIENT RESPONSE
SR Slew Rate AV = 10, RL = 2k, VO = 4VP-P ±2.5 ±3.6 V/µs
±2.0 V/µs
tr, tf, Small
Signal
Rise Time
10% to 90% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
36 100 ns
100 ns
Fall Time
90% to 10% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
100 ns
100 ns
tsSettling Time to 0.1%
10V Step; 10% to VOUT
AV = -1, VOUT = 10VP-P,
Rg = Rf = 10k, RL = 2k to VCM
3.4 µs
Settling Time to 0.01%
10V Step; 10% to VOUT
AV = -1, VOUT = 10VP-P,
RL = 2k to VCM
3.8 µs
tOL Output Overload Recovery Time AV = 100, VIN = 0.2V,
RL = 2k to VCM
1.7 µs
OS+ Positive Overshoot AV
= 1,
VOUT = 10VP-P, Rf = 0Ω
R
L
=2k
Ω to VCM
20 %
35 %
OS- Negative Overshoot AV
= 1,
VOUT = 10VP-P, Rf = 0Ω
R
L
=2k
Ω to VCM
20 %
35 %
Electrical Specifications VS ±5V, VCM = 0, VO = 0V, TA = +25°C, unless otherwise noted. Boldface limits apply over the operating
temperature range, -55°C to +125°C.
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
VOS Offset Voltage -10 µV
TCVOS Offset Voltage Drift .1 µV/°C
IOS Input Offset Current 1 nA
IB Input Bias Current 1nA
CMRR Common-Mode Rejection Ratio VCM = -3V to +3V 120 dB
PSRR Power Supply Rejection Ratio VS = ±2.25V to ±5V 125 dB
AVOL Open-Loop Gain VO = -3V to +3V
RL = 10k to ground
1500 V/mV
VOH Output Voltage High RL = 10k to ground 3.65 V
RL = 2k to ground 3.5 V
VOL Output Voltage Low RL = 10k to ground -3.65 V
RL = 2k to ground -3.5 V
ISSupply Current/Amplifier 2.2 mA
ISC Short-Circuit ±45 mA
Electrical Specifications VS ±15V, VCM = 0, VO = 0V, RL = Open, TA= +25°C, unless otherwise noted. Boldface limits apply over a
total ionizing dose of 100krad(Si) with exposure at a high dose rate of 50 - 300krad(Si)/s; and over a total ionizing dose of 50krad(Si) with
exposure at a low dose rate of <10mrad(Si)/s. (Continued)
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
ISL70227SEH
7FN7958.1
August 24, 2012
AC SPECIFICATIONS
GBW Gain Bandwidth Product 10 MHz
THD + N Total Harmonic Distortion + Noise 1kHz, G = 1, Vo = 2.5VRMS,
RL = 2k
0.0034 %
TRANSIENT RESPONSE
SR Slew Rate AV = 10, RL = 2kOH ±3.6 V/µs
tr, tf, Small
Signal
Rise Time
10% to 90% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
36 ns
Fall Time
90% to 10% of VOUT
AV = -1, VOUT = 100mVP-P,
Rf = Rg = 2k, RL = 2k to VCM
38 ns
tsSettling Time to 0.1% AV = -1, VOUT = 4VP-P,
Rf = Rg = 2k, RL = 2k to VCM
1.6 µs
Settling Time to 0.01% AV = -1, VOUT = 4VP-P,
Rf = Rg = 2k, RL = 2k to VCM
4.2 µs
NOTE:
5. Compliance to datasheet limits is assured by one or more methods: production test, characterization and/or design.
High Dose Rate Post Radiation Characteristics VS ±15V, VCM = 0V, VO = 0V, RL = Open, TA = +25°C, unless otherwise
noted. This data is typical test data post radiation exposure at a rate of 50 to 300rad(Si)/s. This data is intended to show typical parameter shifts due to
high dose rate radiation. These are not limits nor are they guaranteed.
PARAMETER DESCRIPTION CONDITIONS 50k RAD 75k RAD 100k RAD UNIT
VOS Offset Voltage 34 30 30 µV
IOS Input Offset Current -1 -1 -2 nA
IBInput Bias Current -1 -2 -3 nA
CMRR Common-Mode Rejection Ration VCM = -13V to +13V 155 155 155 dB
PSRR Power Supply Rejection Ratio VS = ±2.25V to ±15V 116 116 116 dB
AVOL Open-Loop Gain VO = -13V to +13V
RL = 10k to ground
3500 3500 3500 V/mV
ISSupply Current/Amplifier 2.2 2.2 2.2 mA
Electrical Specifications VS ±5V, VCM = 0, VO = 0V, TA = +25°C, unless otherwise noted. Boldface limits apply over the operating
temperature range, -55°C to +125°C. (Continued)
PARAMETER DESCRIPTION CONDITIONS
MIN
(Note 5) TYP
MAX
(Note 5) UNIT
ISL70227SEH
8FN7958.1
August 24, 2012
Low Dose Rate Post Radiation Characteristics VS ±15V, VCM = 0V, VO = 0V, RL = Open, TA = +25°C, unless otherwise noted.
This data is typical test data post radiation exposure at a rate of 10mrad(Si)/s. This data is intended to show typical parameter shifts due to low dose
rate radiation. These are not limits nor are they guaranteed .
FIGURE 3. OFFSET VOLTAGE vs RADIATION FIGURE 4. POSITIVE INPUT BIAS CURRENT vs RADIATION
FIGURE 5. NEGATIVE INPUT BIAS CURRENT vs RADIATION FIGURE 6. OFFSET CURRENT vs RADIATION
FIGURE 7. TOTAL SUPPLY CURRENT vs RADIATION
V
OS
(µV)
TOTAL DOSE (krad(Si))
0
5
10
15
20
25
0 102030405060708090100
GROUNDED
BIASED
TOTAL DOSE (krad(Si))
I
B+
(nA)
-25
-20
-15
-10
-5
0
5
0 102030405060708090100
GROUNDED
BIASED
I
B-
(nA)
TOTAL DOSE (krad(Si))
-25
-20
-15
-10
-5
0
0 102030405060708090100
GROUNDED
BIASED
TOTAL DOSE (krad(Si))
I
IO
(nA)
-25
-20
-15
-10
-5
0
0 102030405060708090100
GROUNDED
BIASED
TOTAL DOSE (krad(Si))
SUPPLY CURRENT (mA)
0
5
10
0 102030405060708090100
GROUNDED
BIASED
ISL70227SEH
9FN7958.1
August 24, 2012
Typical Performance Curves VS = ±15V, VCM = 0V, RL = Open, TA = +25°C, unless otherwise specified.
FIGURE 8. INPUT NOISE VOLTAGE 0.1Hz TO 10Hz FIGURE 9. INPUT NOISE VOLTAGE SPECTRAL DENSITY
FIGURE 10. INPUT NOISE CURRENT SPECTRAL DENSITY FIGURE 11. PSRR vs FREQUENCY, VS = ±5V, ±15V
FIGURE 12. CMRR vs FREQUENCY, VS = ±2.25, ±5V, ±15V FIGURE 13. VOS vs TEMPERATURE
TIME (s)
INPUT NOISE VOLTAGE (nV)
-60
-40
-20
0
20
60
80
100
012345678910
40
-80
-100
V+ = 38V
RL = 10k
Rg = 10, Rf = 100k
AV = 10,000
CL = 3.5pF
FREQUENCY (Hz)
1
10
100
0.1 1 10 100 1k 10k 100k
VS = ±19V
AV = 1
INPUT NOISE VOLTAGE (nV/Hz)
FREQUENCY (Hz)
1
10
100
INPUT NOISE CURRENT (pA/Hz)
0.1 1 10 100 1k 10k 100k
0.1
VS = ±19V
AV = 1
0
PSRR (dB )
100 1k 10k 100k 1M 10M
FREQUENCY (Hz)
10
20
40
60
80
100
120
-10
10
30
50
70
90
110
130
RL = INF
AV = +1
VS = 1VP-P
CL = 5.25pF
PSRR+ and PSRR- VS = ±15V
PSRR+ AND PSRR- VS = ±5V
0
CMRR (dB)
100 1k 10k 100k 1M 10M
FREQUENCY (Hz)
10
20
40
60
80
100
120
-10
10
30
50
70
90
110
130
RL = INF
AV = +1
VCM = 1VP-P
CL = 5.25pF
VS = ±15V
VS = ±2.25V
VS = ±5V
0
10
20
30
40
50
60
70
-60 -40 -20 0 20 40 60 80 100 120 140
VOS (µV)
TEMPERATURE (°C)
VS = ±15V
ISL70227SEH
10 FN7958.1
August 24, 2012
FIGURE 14. IB+ vs TEMPERATURE FIGURE 15. IB- vs TEMPERATURE
FIGURE 16. IOS vs TEMPERATURE FIGURE 17. SUPPLY CURRENT vs TEMPERATURE
FIGURE 18. VOH vs TEMPERATURE, VS = ±15V FIGURE 19. VOL vs TEMPERATURE, VS = ±15V
Typical Performance Curves VS = ±15V, VCM = 0V, RL = Open, TA = +25°C, unless otherwise specified. (Continued)
-0.4
-0.2
0
0.2
0.4
0.6
0.8
1.0
-60 -40 -20 0 20 40 60 80 100 120 140
IB+ (nA)
IB+
TEMPERATURE (°C)
V
S
= ±15V
-0.9
-0.8
-0.7
-0.6
-0.5
-0.4
-0.3
-0.2
-0.1
0
-60 -40 -20 0 20 40 60 80 100 120 140
IB- (nA)
IB-
TEMPERATURE (°C)
V
S
= ±15V
-1.4
-1.2
-1.0
-0.8
-0.6
-0.4
-0.2
0
-60 -40 -20 0 20 40 60 80 100 120 140
IIO (nA)
IIO
TEMPERATURE (°C)
V
S
= ±15V
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
-60 -40 -20 0 20 40 60 80 100 120 140
ICC
ICC (mA)
TEMPERATURE (°C)
V
S
= ±15V
12.2
12.3
12.4
12.5
12.6
12.7
12.8
12.9
13.0
13.1
13.2
-60 -40 -20 0 20 40 60 80 100 120
VOUT (V)
TEMPERATURE (°C)
VOH @ RL = 100k
VOH @ RL = 2k
AV = 10,
VIN = 1.31V
VS = ±15V
-13.2
-13.1
-13.0
-12.9
-12.8
-12.7
-12.6
-12.5
-12.4
-12.3
-12.2
-60 -40 -20 0 20 40 60 80 100 120
VOUT (V)
TEMPERATURE (°C)
VOL @ RL = 2k
VOL @ RL = 100k
AV = 10,
VIN = - 1.31V
VS = ±15V
ISL70227SEH
11 FN7958.1
August 24, 2012
FIGURE 20. VOH vs OUTPUT CURRENT FIGURE 21. OPEN-LOOP GAIN, PHASE vs FREQUENCY, RL=10k,
CL = 10pF
FIGURE 22. VOL vs OUTPUT CURRENT FIGURE 23. OPEN-LOOP GAIN, PHASE vs FREQUENCY, RL=10k,
CL = 100pF
FIGURE 24. FREQUENCY RESPONSE vs CLOSED LOOP GAIN FIGURE 25. GAIN vs FREQUENCY vs TEMPERATURE
Typical Performance Curves VS = ±15V, VCM = 0V, RL = Open, TA = +25°C, unless otherwise specified. (Continued)
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
0.0001 0.001 0.01 0.1 1 10
VOH (V)
OUTPUT CURRENT (mA)
VOUT (V) 0°C
VOUT (V) +25°C
VOUT (V) +125°C
VOUT (V) -55°C
AV = 10,
VIN = 1.31V
VS = ±15V
OPEN LOOP GAIN (dB)/PHASE (°)
FREQUENCY (Hz)
-100
-80
-60
-40
-20
0
20
40
60
80
100
120
140
160
180
200
0.1m 1m 10m 100m 1 10 100 1k 10k 100k 1M 10M 100M
RL = 10k
SIMULATION
CL = 10pF
GAIN
PHASE
-14
-13
-12
-11
-10
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
0.0001 0.001 0.01 0.1 1 10
VOUT (V) 0°C
VOUT (V) +25°C
VOUT (V) +125°C
VOUT (V) -55°C
VOL (V)
OUTPUT CURRENT (mA)
AV = 10,
VIN = - 1.31V
VS = ±15V
OPEN LOOP GAIN (dB)/PHASE(°)
FREQUENCY (Hz)
-100
-80
-60
-40
-20
0
20
40
60
80
100
120
140
160
180
200
0.1m 1m 10m 100m 1 10 100 1k 10k 100k 1M 10M 100M
RL = 10k
SIMULATION
CL = 100pF
GAIN
PHASE
FREQUENCY (Hz)
GAIN (dB)
100k 1M 10M 100M
10k
1k
-10
0
10
20
30
40
50
60
70
100
AV = 1
AV = 100
AV = 1000
VS = ±15V
VOUT = 100mVP-P
CL = 3.5pF
RL = INF
Rg = 100, Rf = 100k
Rg = 10k, Rf = 100k
AV = 10
Rg = 1k, Rf = 100k
Rg = OPEN, Rf = 0
11
12
13
14
15
16
17
18
19
20
21
100 1k 10k 100k 1M 10M
FREQUENCY (Hz)
GAIN (dB)
A
V
= 10,
V
OUT
= 100mV
P-P
,
V
S
= +-15V, R
L
= 2k
+25°C
-60°C
+125°C
+130°C
ISL70227SEH
12 FN7958.1
August 24, 2012
FIGURE 26. FREQUENCY RESPONSE vs FEEDBACK RESISTANCE
Rf/Rg
FIGURE 27. GAIN vs FREQUENCY vs RL
FIGURE 28. GAIN vs FREQUENCY vs CLFIGURE 29. GAIN vs FREQUENCY vs SUPPLY VOLTAGE
FIGURE 30. LARGE SIGNAL 10V STEP RESPONSE, VS= ±15V FIGURE 31. LARGE SIGNAL 10V STEP RESPONSE, VS = ±15V vs
TEMPERATURE
Typical Performance Curves VS = ±15V, VCM = 0V, RL = Open, TA = +25°C, unless otherwise specified. (Continued)
NORMALIZED GAIN (dB)
-5
-3
-1
1
3
5
7
9
11
13
15
FREQUENCY (Hz)
100k 1M 10M 100M
10k
1k
Rf = Rg = 100k
Rf = Rg = 100
Rf = Rg = 10k
Rf = Rg = 1k
VS = ±15V
RL = 10k
AV = +2
VOUT = 100mVP-P
CL = 3.5pF
-5
-4
-3
-2
-1
0
1
2
FREQUENCY (Hz)
NORMALIZED GAIN (dB)
100k 1M 10M 100M
10k
1k
VS = ±15V
AV = +1
VOUT = 100mVP-P
CL = 3.5pF
RL = 100
RL = 49.9
RL = 10k
RL = 1k
RL = 499
NORMALIZED GAIN (dB)
FREQUENCY (Hz)
100k 1M 10M 100M
10k
1k
-3
-2
-1
0
1
2
3
4
5
6
7
VS = ±15V
RL = 10k
AV = +1
VOUT = 100mVP-P
CL = 1000pF
CL = 220pF
CL = 100pF
CL = 25.5pF
CL = 3.5pF
NORMALIZED GAIN (dB)
FREQUENCY (Hz)
100k 1M 10M 100M
10k
1k
-3
-2
-1
0
1
CL = 3.5pF
RL = 10k
AV = +1
VOUT = 100mVP-P
VS = ±2.25V
VS = ±5V
VS = ±15V
-6
-5
-4
-3
-2
1
0
1
2
3
4
5
6
0 5 10 15 20 25 30
TIME (µs)
LARGE SIGNAL (V)
VS = ±15V
AV = 1
CL = 3.5pF
VOUT = 10VP-P
Rf = 0 Rg = inf
RL = 2k
RL = 10k
-6
-5
-4
-3
-2
-1
0
1
2
3
4
5
6
0 10203040
LARGE SIGNAL (V)
TIME (µs)
OUTPUT -55°C
OUTPUT +125°C
OUTPUT +25°C
VS = ±15V
AV = 1
RL = 2k
VOUT = 10VP-P
Rf = 0 Rg = inf
ISL70227SEH
13 FN7958.1
August 24, 2012
FIGURE 32. LARGE SIGNAL TRANSIENT RESPONSE vs RL,
VS= ±5V, ±15V
FIGURE 33. SMALL SIGNAL TRANSIENT RESPONSE,
VS= ±5V, ±15V
FIGURE 34. POSITIVE OUTPUT OVERLOAD RESPONSE TIME,
VS= ±15V
FIGURE 35. NEGATIVE OUTPUT OVERLOAD RESPONSE TIME,
VS15V
FIGURE 36. % OVERSHOOT vs LOAD CAPACITANCE, VS = ±15V
Typical Performance Curves VS = ±15V, VCM = 0V, RL = Open, TA = +25°C, unless otherwise specified. (Continued)
TIME (µs)
LARGE SIGNAL (V)
-2.4
-2.0
-1.6
-1.2
-0.8
-0.4
0
0.4
0.8
1.2
1.6
2.0
2.4
0 5 10 15 20 25 30 35 40
AV = 1
CL = 3.5pF
VOUT = 4VP-P
VS = ±15V, RL = 2k, 10k
VS = ±5V, RL = 2k, 10k
80
60
40
20
0
20
40
60
80
0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0
TIME (ms)
SMALL SIGNAL (mV)
RL = 2k
AV = 1
CL = 3.5pF
VOUT = 100mVP-P
VS = ±5V, ±15V
TIME (µs)
-0.26
-0.20
-0.18
-0.14
-0.10
-0.06
-0.02
0.02
0.06
0 5 10 15 20 25 30 35 40
-1
1
3
5
7
9
11
13
15
OUTPUT (V)
INPUT (V)
INPUT
OUTPUT
VS = ±15V
RL = 10k
AV = 100
CL = 3.5pF
Rf = 100k, Rg = 1k
VIN = 200mVP-P
TIME (µs)
-0.06
-0.02
0.02
0.06
0.10
0.04
0.08
0.22
0.26
0 5 10 15 20 25 30 35 40
-14
-12
-10
-8
-6
-4
-2
0
2
OUTPUT (V)
INPUT (V)
INPUT
OUTPUT
VS = ±15V
RL = 10k
AV = 100
CL = 3.5pF
Rf = 100k, Rg = 1k
VIN = 200mVP-P
CAPACITANCE (pF)
0
10
20
30
40
50
60
70
80
90
10 100 1000 10000
OVERSHOOT +
VS = ±15V
RL = 10k
AV = 1
VOUT = 100mVP-P
OVERSHOOT -
OVERSHOOT (%)
ISL70227SEH
14 FN7958.1
August 24, 2012
Applications Information
Functional Description
The ISL70227SEH is a dual, low noise 10MHz BW precision
op amp fabricated in a new precision 40V complementary
bipolar DI process. A super-beta NPN input stage with input bias
current cancellation provides low input bias current (1nA typical),
low input offset voltage (10µV typ), low input noise voltage
(3nV/Hz), and low 1/f noise corner frequency (5Hz). These
amplifiers also feature high open loop gain (1500V/mV) for
excellent CMRR (120dB) and THD+N performance (0.0002% @
3.5VRMS, 1kHz into 2k). A complimentary bipolar output stage
enables high capacitive load drive without external
compensation.
Operating Voltage Range
The devices are designed to operate over the 4.5V (±2.25V) to
36V (±18V) range and are fully characterized at 30V (±15V).
Parameter variation with operating voltage is shown in the
“Typical Performance Curves” beginning on page 9.
Input ESD Diode Protection
The input terminals (IN+ and IN-) have internal ESD protection
diodes to the positive and negative supply rails, and an additional
anti-parallel diode pair across the inputs (see Figures 37 and 38).
For unity gain applications (see Figure 37) where the output is
connected directly to the non-inverting input a current limiting
resistor (RIN) will be needed under the following conditions to
protect the anti-parallel differential input protection diodes.
The amplifier input is supplied from a low impedance source.
The input voltage rate-of-rise (dV/dt) exceeds the maximum
slew rate of the amplifier (±3.6V/µs).
If the output lags far enough behind the input, the anti-parallel
input diodes can conduct. For example, if an input pulse ramps
from 0V to +10V in 1µs, then the output of the ISL70227SEH will
reach only +3.6V (slew rate = 3.6V/µs) while the input is at 10V,
The input differential voltage of 6.4V will force input ESD diodes to
conduct, dumping the input current directly into the output stage
and the load. The resulting current flow can cause permanent
damage to the ESD diodes. The ESD diodes are rated to 20mA,
and in the previous example, setting RIN to 1k resistor (see
Figure 37) would limit the current to <6.4mA, and provide
additional protection up to ±20V at the input.
In applications where one or both amplifier input terminals are at
risk of exposure to high voltage, current limiting resistors may be
needed at each input terminal (see Figure 38 RIN+, RIN-) to limit
current through the power supply ESD diodes to 20mA.
Output Current Limiting
The output current is internally limited to approximately ±45mA
at +25°C and can withstand a short circuit to either rail as long
as the power dissipation limits are not exceeded. This applies to
only one amplifier at a time. Continuous operation under these
conditions may degrade long term reliability.
Output Phase Reversal
Output phase reversal is a change of polarity in the amplifier
transfer function when the input voltage exceeds the supply
voltage. The ISL70227SEH are immune to output phase reversal,
even when the input voltage is 1V beyond the supplies.
Power Dissipation
It is possible to exceed the +150°C maximum junction
temperatures under certain load and power supply conditions. It
is therefore important to calculate the maximum junction
temperature (TJMAX) for all applications to determine if power
supply voltages, load conditions, or package type need to be
modified to remain in the safe operating area. These parameters
are related using Equation 1:
where:
•P
DMAXTOTAL is the sum of the maximum power dissipation of
each amplifier in the package (PDMAX)
•PD
MAX for each amplifier can be calculated using Equation 2:
where:
•T
MAX = Maximum ambient temperature
θJA = Thermal resistance of the package
•PD
MAX = Maximum power dissipation of one amplifier
•V
S = Total supply voltage
•I
qMAX = Maximum quiescent supply current of one amplifier
•V
OUTMAX = Maximum output voltage swing of the application
•R
L = Load resistance
FIGURE 37. INPUT ESD DIODE CURRENT LIMITING - UNITY GAIN
-
+
RIN
RL
VIN
VOUT
V+
V-
FIGURE 38. INPUT ESD DIODE CURRENT LIMITING - DIFFERENTIAL
INPUT
-
+
RIN-
RL
VIN-VOUT
V+
V-
RIN+
VIN+
TJMAX TMAX θJAxPDMAXTOTAL
+= (EQ. 1)
PDMAX VSIqMAX VS
( - VOUTMAX)VOUTMAX
RL
------------------------
×+×=(EQ. 2)
ISL70227SEH
15 FN7958.1
August 24, 2012
Package Characteristics
Weight of Packaged Device
0. 4029 grams (Typical)
Lid Characteristics
Finish: Gold
Case Isolation to Any Lead: 20 x 109 (min)
Die Characteristics
Die Dimensions
1565µm x 2125µm (62mils x 84mils)
Thickness: 355µm ± 25µm (14 mils ± 1 mil)
Interface Materials
GLASSIVATION
Type: Nitrox
Thickness: 15kÅ
TOP METALLIZATION
Type: AlCu (99.5%/0.5%)
Thickness: 30kÅ
BACKSIDE FINISH
Silicon
PROCESS
Dielectrically Isolated Complementary Bipolar - PR40
ASSEMBLY RELATED INFORMATION
SUBSTRATE POTENTIAL
Floating
ADDITIONAL INFORMATION
WORST CASE CURRENT DENSITY
< 2 x 105 A/cm2
Metallization Mask Layout
PLACE HOLDER
V+
OUT_B
-IN_B
+IN_B
V-
+IN_A
-IN_A
OUT_A
ISL70227SEH
16
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN7958.1
August 24, 2012
For additional products, see www.intersil.com/product_tree
TABLE 1. DIE LAYOUT X-Y COORDINATES
PAD NAME PAD NUMBER
X
(µm)
Y
(µm)
dX
(µm)
dY
(µm)
BOND WIRES
PER PAD
OUT_A 11 0 1530 70 70 1
-IN_A 13 -20.5 976 70 70 1
+IN_A 14 -20.5 732 70 70 1
V- 9 0 070701
+IN_B 16 1272.5 595.5 70 70 1
-IN_B 15 1272.5 839.5 70 70 1
OUT_B 12 1259.5 993.5 70 70 1
V+ 10 1295.5 1708 70 70 1
NOTE:
6. Origin of coordinates is the centroid of pad 9.
ISL70227SEH
17 FN7958.1
August 24, 2012
Products
Intersil Corporation is a leader in the design and manufacture of high-performance analog semiconductors. The Company's products
address some of the industry's fastest growing markets, such as, flat panel displays, cell phones, handheld products, and notebooks.
Intersil's product families address power management and analog signal processing functions. Go to www.intersil.com/products for a
complete list of Intersil product families.
For a complete listing of Applications, Related Documentation and Related Parts, please see the respective device information page on
intersil.com: ISL70227SEH
To report errors or suggestions for this datasheet, please go to www.intersil.com/askourstaff
FITs are available from our website at: http://rel.intersil.com/reports/search.php
Revision History
The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to web to make
sure you have the latest Rev.
DATE REVISION CHANGE
August 24, 2012 FN7958.1 Initial release.
ISL70227SEH
18 FN7958.1
August 24, 2012
Ceramic Metal Seal Flatpack Packages (Flatpack)
NOTES:
1. Index area: A notch or a pin one identification mark shall be located ad-
jacent to pin one and shall be located within the shaded area shown.
The manufacturer s identification shall not be us ed as a pin one identi-
fication mark. Alternately, a tab (dimension k) may be used to identify
pin one.
2. If a pin one identification mark is used in addition to a tab, the limits of
dimension k do not apply.
3. This dimension allows for off-center lid, meniscus, and glass overrun.
4. Dimensions b1 and c1 apply to lead b ase metal only. Dimension M ap-
plies to lead plating and finish thickness. The maximum limits of lead
dimensions b and c or M shall be measured at the centroid of the fin-
ished lead surfaces, when solder dip or tin plate lead finish is applied.
5. N is the maximum number of terminal positions.
6. Measure dimension S1 at all four corners.
7. For bottom-brazed lead packages, no organic or polymeric materials
shall be molded to the bottom of the package to cover the leads.
8. Dimension Q shall be measured at the point of exit (beyon d the menis-
cus) of the lead from the b ody . Dimension Q minimum shall be reduced
by 0.0015 inch (0.038mm) maximum when solder dip lead finish is
applied.
9. Dimensioning and tolera ncing per ANSI Y14.5M - 1982.
10. Controlling dimension: INCH.
-D-
-C-
0.004 H A - B
MD
S S
-A- -B-
0.036 H A - B
MD
S S
e
E
A
Q
L
A
E1
SEATING AND
LE2
E3 E3
BASE PLANE
-H-
b
C
S1
M
c1
b1
(c)
(b)
SECTION A-A
BASE
LEAD FINISH
METAL
PIN NO. 1
ID AREA
A
M
D
K10.A MIL-STD-1835 CDFP3-F10 (F-4A, CONFIGURATION B)
10 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE
SYMBOL
INCHES MILLIMETERS
NOTESMIN MAX MIN MAX
A 0.045 0.115 1.14 2.92 -
b 0.015 0.022 0.38 0.56 -
b1 0.015 0.019 0.38 0.48 -
c 0.004 0.009 0.10 0.23 -
c1 0.004 0.006 0.10 0.15 -
D - 0.290 - 7.37 3
E 0.240 0.260 6.10 6.60 -
E1 -0.280-7.11 3
E2 0.125 - 3.18 - -
E3 0.030 - 0.76 - 7
e 0.050 BSC 1.27 BSC -
k 0.008 0.015 0.20 0.38 2
L 0.250 0.370 6.35 9.40 -
Q 0.026 0.045 0.66 1.14 8
S1 0.005 - 0.13 - 6
M - 0.0015 - 0.04 -
N10 10-
Rev. 0 3/07