SLIC Products 5
FINAL
ABSOLUTE MAXIMUM RATINGS
Storage temperature . . . . . . . . . . . . –60°C to +150°C
VCC with respect to AGND/DGND . . . . . 0.5 V to +7 V
VEE with respect to A GND/DGND . . . . . 0.5 V to –7 V
VBAT with respect to AGND/DGND . . . 0.5 V to –70 V
BGND with respect to AGND/DGND . . . +3 V to –3 V
A(TIP) or B(RING) to BGND:
Continuous . . . . . . . . . . . . . . . . . . . VBAT to +2 V
10 ms (f = 0.1 Hz) . . . . . . . . .VBAT – 20 V to +5 V
1µs (f = 0.1 Hz). . . . . . . . . .VBAT – 40 V to +10 V
250 ns (f = 0.1 Hz). . . . . . . .VBAT – 70 V to +15 V
Current from A(TIP) or B(RING). . . . . . . . . . . . 70 mA
Current through relay driver. . . . . . . . . . . . . . . 50 mA
Ring relay supply voltage. . . . . . . .0 V to VBAT +75V
DA and DB inputs:
Voltage on ring-trip inputs . . . . . . . . . .VBAT to 0 V
Current into ring-trip inputs . . . . . . . . . . . . ±5mA
C2–C1, E0, E1, DET
Input voltage . . . . . . . . . . . . . . . . . . . . 0 V to VCC
Output voltage (DET not active) . . . . . 0 V to VCC
Output current (DET). . . . . . . . . . . . . . . . . . 5 mA
Power Dissipation (TA≤70°C):
Continuous . . . . . . . . . . . . . . . . . . . . . . . . . 1.5 W
Pea k (t < 1 00 ms, tREP > 1 s). . . . . . . . . . . . . 4 W
Note: Thermal limiting circuitry on chip will shut down the
circuit at a junction temperature of about 165
°
C. The devi ce
should never be exposed to this temperature. Operation
above 145
°
C junction temperature may degrade device
reliability. See the SLIC Packaging Considerations for more
information.
Stresses above those listed under Absolute Maximum
Ratings may cause permanent device failure. Functionality
at or abo ve these limits is not impl ied. Exposure to Absolute
Maximum Ratings for extended periods may affect device
reliability.
OPERATING RANGES
Commercial (C) Devices
Ambient temperature . . . . . . . . . . . . . .0°C to +70°C*
VCC . . . . . . . . . . . . . . . . . . . . . . . . . . 4.75 V to 5.25 V
VEE . . . . . . . . . . . . . . . . . . . . . . . . –4.75 V to –5.25 V
VBAT . . . . . . . . . . . . . . . . . . . . . . . . . . –24 V to –58 V
AGND/DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V
BGND with respect to
AGND/DGND . . . . . . . . . . . –100 mV to +100 mV
Operat ing Ran ges def ine thos e limit s bet ween which device
functionality is guaranteed.
* Funct ionality of the de vice from 0
°
C to +70
°
C is g uarantee d
by production testing. Perfor mance from
–
40
°
C to + 85
°
C is
guaranteed by characterization and periodic sampling of
produ cti on uni ts.