CY74FCT16823T
CY74FCT162823T
3
Electrica l Characteris tics Over the O perating Range
Parameter Description Test Conditi ons Min. Typ.[5] Max. Unit
VIH Input HIGH Voltage 2.0 V
VIL Input LOW Voltage 0.8 V
VHInput Hysteresi s[6] 100 mV
VIK Input Clamp Diode Volta ge VCC=Min., IIN=−18 mA −0.7 −1.2 V
IIH Input HIGH Current VCC=Max., VI=VCC ±1µA
IIL Input LOW Current VCC=Max., VI=GND ±1µA
IOZH High Impedance Output Current
(Three-State Outp ut pins) VCC=Max., VOUT=2.7V ±1µA
IOZL High Impedance Output Current
(Three-State Outp ut pins) VCC=Max., VOUT=0.5V ±1µA
IOS Short Circuit Current[7] VCC=Max., VOUT=GND −80 −140 −200 mA
IOOutput Driv e Current[7] VCC=Max., VOUT=2.5V −50 −180 mA
IOFF Power-Off Disable VCC=0V, VOUT≤4.5V[8] 1µA
Output Drive Characteristics for CY 74FCT16823T
Parameter Description Test Conditions Min. Typ.[5] Max. Unit
VOH Output HIGH Voltage VCC=M in ., IOH=−3 mA 2.5 3.5 V
VCC=M in ., IOH=−15 mA 2.4 3.5
VCC=M in ., IOH=−32 mA 2.0 3.0
VOL Output LO W Voltage VCC=M in ., IOL=64 mA 0.2 0.55 V
Output Drive Characteristics for CY 74FCT162823T
Parameter Description Test Conditi ons Min. Typ.[5] Max. Unit
IODL Out put LOW Voltage[7] VCC=5V, VIN=VIH or VIL, VOUT=1.5V 60 115 150 mA
IODH Out put HIGH Voltage[7] VCC=5V, VIN=VIH or VIL, VOUT=1.5V −60 −115 −150 mA
VOH Output HIGH Voltage VCC=Min., IOH=−24 mA 2.4 3.3 V
VOL Output LO W Voltage VCC=Min., IOL=24 m A 0.3 0.55 V
Capacitance[9] (TA = +25°C, f = 1.0 M Hz)
Parameter Description Test Conditions Typ.[5] Max. Unit
CIN Input Capacitance VIN = 0V 4.5 6.0 pF
COUT Output Capacitance VOUT = 0 V 5.5 8.0 pF
Notes:
5. Typical values are at VCC= 5.0V, TA= +25°C ambient.
6. This input is guaranteed but not tested.
7. Not more than one output should be shorted at a time . Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
8. Tested at +25°C.
9. This parameter is guaranteed but not tested.