MICROCIRCUIT DATA SHEET Original Creation Date: 10/05/95 Last Update Date: 10/05/98 Last Major Revision Date: 03/19/97 MN54ABT377-X REV 0B0 OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE General Description The ABT377 has eight edge-triggered D-type flip-flops with individual D inputs and Q outputs. The common buffered Clock (CP) input loads all flip-flops simultaneously, when the Clock Enable (CE) is LOW. The register is fully edge-triggered. The state of each D input, one setup time before the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flop's Q output. The CE input must be stable only one setup time prior to the LOW-to-HIGH clock transition for predictable operation. Industry Part Number NS Part Numbers 54ABT377 54ABT377E-QML * 54ABT377J-QML ** 54ABT377W-QML *** Prime Die NB377 Controlling Document See Features Page Processing Subgrp Description MIL-STD-883, Method 5004 1 2 3 4 5 6 7 8A 8B 9 10 11 Quality Conformance Inspection MIL-STD-883, Method 5005 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 Features - Eight edge-triggered D flip-flops Buffered common clock Output sink capability of 48 mA, source capability of 24 mA Guaranteed latchup protection Non-destructive hot insertion capability High impedance glitch free bus loading during entire power up and power down cycle Disable time less than enable time to avoid bus contention SMD : 5962-9314801Q2A*, QRA**, QSA*** 2 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 (Absolute Maximum Ratings) (Note 1) Vcc Pin Potential to Ground Potential -0.5V to +7.0V Input Voltage (Note 2) -0.5V to +7.0V Input Current (Note 2) -30mA to +5.0mA Voltage Applies To Any Output In the Disabled or Power-Off State In The High State Current Applies To Output In The Low State (Max) Junction Temperature (Tj) Ceramic Thermal Resistance Junction-To-Case (Theta JC) Storage Temperature -0.5V to 5.5V -0.5V to Vcc 96mA +175C See Mil-Std 1835 -65C to +150C Lead Temperature (Soldering, 10 seconds) ESD Classification +300C Class 3 Maximum Power Dissipation 500 mW Note 1: Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Either voltage limit or current limit is sufficient to protect inputs. Recommended Operating Conditions Supply Voltage (Vcc) 4.5V to 5.5V Operating Temperature -55C to +125C Minimum Input Edge Rate (dV/dt) Data Input Enable Input Maximum Output Current High Level (Ioh) Low Level (Iol) 50 mV/ns 20 mV/ns -24 mA 48 mA 3 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 Electrical Characteristics DC PARAMETERS (The following conditions apply to all the following parameters, unless otherwise specified.) DC: 4.5V to 5.5V Temp Range: -55C to 125C SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS ICCH Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 250.0 uA 1, 2, 3 ICCL Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 30.0 mA 1, 2, 3 ICCT Supply Current VCC=5.5V, OE=0.0V Input under test=3.4V Other inputs=5.5V or 0.0V 1, 4 VCC 2.5 mA 1, 2, 3 VCC=5.5V, OE=3.4V Other inputs=5.5V or 0.0V 1, 4 VCC 2.5 mA 1, 2, 3 IIH High Level Input Current VCC=5.5V, VINH=5.5V 1, 4 IN 2.0 uA 1, 2, 3 IIL Low Level Input Current VCC=5.5V, VINL=0.0V 1, 4 IN -2.0 uA 1, 2, 3 ICEX Output High Leakage Current VCC=5.5V, VOUT=5.5V VINH=5.5V 1, 4 OUT 50.0 uA 1, 2, 3 IOS Output Short Circuit Current VCC=5.5V, VOUT=0.0V VINH=5.5V 1, 4, 10 OUT -100 -275 mA 1, 2, 3 IOS1 Output Short Circuit Current VCC=5.5V, VOUT=2.5V VINH=5.5V 1, 4, 10 OUT -50 -180 mA 1, 2, 3 IBVI Input High Current Breakdown test VCC=5.5V, VINH=7.0V 1, 4 OUT 7.0 uA 1, 2, 3 IZZ Bus Drainage test VCC=0.0V, VOUT=4.5V, VINL=0.0V 1, 4 OUT 100 uA 1, 2, 3 VOL Low Level Output Voltage VCC=4.5V, IOL=48.0mA, VINH=4.5V, VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 0.55 V 1, 2, 3 VOH High Level Output Voltage VCC=4.5V, IOH=-24.0mA, VINH=4.5V, VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.0 V 1, 2, 3 VCC=4.5V, IOH=-3mA, VINH=4.5V, VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.5 V 1, 2, 3 VCC=5.0V, IOH=-3mA, VINH=5.0V, VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 3.0 V 1, 2, 3 4.75 V 1, 2, 3 -100 VID Input Leakage test VCC=0.0V, IID=1.9uA, VINL=0.0V 1, 4 IN VCD Input Clamp Diode Voltage VCC=4.5V, IKL=-18mA, VINH=4.5V, VINL=0.0V 1, 4 IN -1.2 V 1, 2, 3 VOLP Low Level Ground Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 0.70 V 4 VOLV Low Level Ground Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -1.2 V 4 4 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 Electrical Characteristics DC PARAMETERS(Continued) (The following conditions apply to all the following parameters, unless otherwise specified.) DC: 4.5V to 5.5V Temp Range: -55C to 125C SYMBOL PARAMETER CONDITIONS NOTES PINNAME MIN MAX UNIT SUBGROUPS VOHP High Level VCC Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 1.45 V 4 VOHV High Level VCC Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -0.7 V 4 CIN Input Capacitance VCC=0.0V 7 IN 10.5 pF 4 COUT Output Capacitance VCC=5.5V 7 OUT 17.0 pF 4 AC PARAMETERS (The following conditions apply to all the following parameters, unless otherwise specified.) AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS tpLH (1) Propagation Delay tpHL (1) Propagation Delay ts(H/L) 1 Setup time HIGH or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 2, 5 CP to On 1.0 6.0 ns 9 2, 5 CP to On 1.0 7.5 ns 10, 11 2, 5 CP to On 1.5 6.8 ns 9 2, 5 CP to On 1.5 7.6 ns 10, 11 7 Dn to CP 2.0 ns 9 7 Dn to CP 2.5 ns 10, 11 th(H/L) 1 Hold time HIGH or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 7 Dn to CP 1.8 ns 9, 10, 11 ts(H/L) 2 Setup time HIGH or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 7 CE to CP 3.0 ns 9, 10, 11 th(H/L) 2 Setup time HIGH or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 7 CE to CP 1.8 ns 9, 10, 11 tw(H/L) Pulse width HIGH or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 7 CP 3.3 ns 9, 10, 11 Fmax Maximum Clock Frequency VCC=5.0V @25C, VCC=4.5V & 5.5V @-55C/125C 7 CP 150 MHz 9, 10, 11 Note 1: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8. Note 2: SCREEN TESTED A11. SCREEN TESTED SAMPLE TESTED SUBGROUPS A1, SAMPLE TESTED SUBGROUPS A9, SAMPLE TESTED A9. Note 3: Note 4: Note 5: Note 6: 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS A9, A10 & 100% ON EACH DEVICE (METHOD 5005, TABLE 2, 3, 7 & 8. (METHOD 5005, TABLE 10 & 11. (METHOD 5005, TABLE AT +25C TEMP. ONLY, SUBGROUP 9. 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP., 1) ON MFG. LOT AT +25C, +125C & -55C TEMP., 1) ON EACH MFG. LOT AT +25C TEMP. ONLY, SUBGROUP 5 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 (Continued) Note 7: Note 8: NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA). MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE OUTPUT @ VOL OR @ VOH. Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V. INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), OV TO THRESHOLD (VIHD), FREQ.= 1 MHZ. Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT ONE TIME. 6 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 Graphics and Diagrams GRAPHICS# DESCRIPTION E20ARE LCC (E), TYPE C, 20 TERMINAL(P/P DWG) J20ARM CERDIP (J), 20 LEAD (P/P DWG) W20ARF CERPACK (W), 20 LEAD (P/P DWG) See attached graphics following this page. 7 MICROCIRCUIT DATA SHEET MN54ABT377-X REV 0B0 Revision History Rev ECN # 0B0 M0001569 10/05/98 Rel Date Originator Changes Bill Petcher Changed MDS MN54ABT377-X REV 0B0 8 REV 0A0 to MN54ABT377-X