5962-9314801QSA(54ABT377W-QML) - National Semiconductor

Original Creation Date: 10/05/95

Last Update Date: 10/05/98

Last Major Revision Date: 03/19/97

MN54ABT377-X REV 0B0 MICROCIRCUIT DATA SHEET

OCTAL D-TYPE FLIP-FLOP WITH CLOCK ENABLE

General Description

The ABT377 has eight edge-triggered D-type flip-flops with individual D inputs and Q

outputs. The common buffered Clock (CP) input loads all flip-flops simultaneously, when

the Clock Enable (CE) is LOW.

The register is fully edge-triggered. The state of each D input, one setup time before

the LOW-to-HIGH clock transition, is transferred to the corresponding flip-flop's Q

output. The CE input must be stable only one setup time prior to the LOW-to-HIGH clock

transition for predictable operation.

NS Part Numbers

54ABT377E-QML *

54ABT377J-QML **

54ABT377W-QML ***

Industry Part Number

54ABT377

Prime Die

NB377

Controlling Document

See Features Page

Processing

MIL-STD-883, Method 5004

Quality Conformance Inspection

MIL-STD-883, Method 5005

Subgrp Description Temp ( C)

1 Static tests at +25

2 Static tests at +125

3 Static tests at -55

4 Dynamic tests at +25

5 Dynamic tests at +125

6 Dynamic tests at -55

7 Functional tests at +25

8A Functional tests at +125

8B Functional tests at -55

9 Switching tests at +25

10 Switching tests at +125

11 Switching tests at -55

MICROCIRCUIT DATA SHEET

MN54ABT377-X REV 0B0

Features

- Eight edge-triggered D flip-flops

- Buffered common clock

- Output sink capability of 48 mA, source capability of 24 mA

- Guaranteed latchup protection

- Non-destructive hot insertion capability

- High impedance glitch free bus loading during entire power up and power down cycle

- Disable time less than enable time to avoid bus contention

- SMD : 5962-9314801Q2A*, QRA**, QSA***

MICROCIRCUIT DATA SHEET

MN54ABT377-X REV 0B0

(Absolute Maximum Ratings)

(Note 1)

Vcc Pin Potential to Ground Potential -0.5V to +7.0V

Input Voltage

(Note 2) -0.5V to +7.0V

Input Current

(Note 2) -30mA to +5.0mA

Voltage Applies To Any Output -0.5V to 5.5VIn the Disabled or Power-Off State -0.5V to VccIn The High State

Current Applies To Output 96mAIn The Low State (Max)

Junction Temperature (Tj) +175CCeramic

Thermal Resistance See Mil-Std 1835Junction-To-Case (Theta JC)

Storage Temperature -65C to +150C

Lead Temperature +300C(Soldering, 10 seconds)

ESD Classification Class 3

Maximum Power Dissipation 500 mW

Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have

its useful life impaired. Functional operation under these conditions is not

implied.

Note 2: Either voltage limit or current limit is sufficient to protect inputs.

Recommended Operating Conditions

Supply Voltage (Vcc) 4.5V to 5.5V

Operating Temperature -55C to +125C

Minimum Input Edge Rate (dV/dt) 50 mV/nsData Input 20 mV/nsEnable Input

Maximum Output Current -24 mAHigh Level (Ioh) 48 mALow Level (Iol)

MN54ABT377-X REV 0B0 MICROCIRCUIT DATA SHEET

Electrical Characteristics

DC PARAMETERS

(The following conditions apply to all the following parameters, unless otherwise specified.)

DC: 4.5V to 5.5V Temp Range: -55C to 125C

SYMBOL PARAMETER CONDITIONS NOTES PIN-

NAME MIN MAX UNIT SUB-

GROUPS

ICCH Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 250.0 uA 1, 2,

ICCL Supply Current VCC=5.5V, VINH=5.5V, VINL=0.0V 1, 4 VCC 30.0 mA 1, 2,

ICCT Supply Current VCC=5.5V, OE=0.0V Input under

test=3.4V Other inputs=5.5V or 0.0V 1, 4 VCC 2.5 mA 1, 2,

VCC=5.5V, OE=3.4V Other inputs=5.5V or

0.0V 1, 4 VCC 2.5 mA 1, 2,

IIH High Level Input

Current VCC=5.5V, VINH=5.5V 1, 4 IN 2.0 uA 1, 2,

IIL Low Level Input

Current VCC=5.5V, VINL=0.0V 1, 4 IN -2.0 uA 1, 2,

ICEX Output High

Leakage Current VCC=5.5V, VOUT=5.5V VINH=5.5V 1, 4 OUT 50.0 uA 1, 2,

IOS Output Short

Circuit Current VCC=5.5V, VOUT=0.0V VINH=5.5V 1,

OUT -100 -275 mA 1, 2,

IOS1 Output Short

Circuit Current VCC=5.5V, VOUT=2.5V VINH=5.5V 1,

OUT -50 -180 mA 1, 2,

IBVI Input High

Current Breakdown

test

VCC=5.5V, VINH=7.0V 1, 4 OUT 7.0 uA 1, 2,

IZZ Bus Drainage test VCC=0.0V, VOUT=4.5V, VINL=0.0V 1, 4 OUT -100 100 uA 1, 2,

VOL Low Level Output

Voltage VCC=4.5V, IOL=48.0mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 0.55 V 1, 2,

VOH High Level Output

Voltage VCC=4.5V, IOH=-24.0mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.0 V 1, 2,

VCC=4.5V, IOH=-3mA, VINH=4.5V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 2.5 V 1, 2,

VCC=5.0V, IOH=-3mA, VINH=5.0V,

VINL=0.0V, VIH=2.0V, VIL=0.8V 1, 4 OUT 3.0 V 1, 2,

VID Input Leakage

test VCC=0.0V, IID=1.9uA, VINL=0.0V 1, 4 IN 4.75 V 1, 2,

VCD Input Clamp Diode

Voltage VCC=4.5V, IKL=-18mA, VINH=4.5V,

VINL=0.0V 1, 4 IN -1.2 V 1, 2,

VOLP Low Level Ground

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 0.70 V 4

VOLV Low Level Ground

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -1.2 V 4

MN54ABT377-X REV 0B0 MICROCIRCUIT DATA SHEET

Electrical Characteristics

DC PARAMETERS(Continued)

(The following conditions apply to all the following parameters, unless otherwise specified.)

DC: 4.5V to 5.5V Temp Range: -55C to 125C

SYMBOL PARAMETER CONDITIONS NOTES PIN-

NAME MIN MAX UNIT SUB-

GROUPS

VOHP High Level VCC

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN 1.45 V 4

VOHV High Level VCC

Bounce VCC=5.0V, LOAD : 50pF / 500 OHMS 7, 8 IN -0.7 V 4

CIN Input Capacitance VCC=0.0V 7 IN 10.5 pF 4

COUT Output

Capacitance VCC=5.5V 7 OUT 17.0 pF 4

AC PARAMETERS

(The following conditions apply to all the following parameters, unless otherwise specified.)

AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS

tpLH (1) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 CP to

On 1.0 6.0 ns 9

2, 5 CP to

On 1.0 7.5 ns 10, 11

tpHL (1) Propagation Delay VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 2, 5 CP to

On 1.5 6.8 ns 9

2, 5 CP to

On 1.5 7.6 ns 10, 11

ts(H/L) 1 Setup time HIGH

or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 Dn to

CP 2.0 ns 9

7 Dn to

CP 2.5 ns 10, 11

th(H/L) 1 Hold time HIGH or

LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 Dn to

CP 1.8 ns 9, 10,

ts(H/L) 2 Setup time HIGH

or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 CE to

CP 3.0 ns 9, 10,

th(H/L) 2 Setup time HIGH

or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 CE to

CP 1.8 ns 9, 10,

tw(H/L) Pulse width HIGH

or LOW VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 CP 3.3 ns 9, 10,

Fmax Maximum Clock

Frequency VCC=5.0V @25C, VCC=4.5V & 5.5V

@-55C/125C 7 CP 150 MHz 9, 10,

Note 1: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS 1,2,3,7 & 8.

Note 2: SCREEN TESTED 100% ON EACH DEVICE AT -55C, +125C & +25C TEMP., SUBGROUPS A9, A10 &

A11.

Note 3: SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMP. ONLY, SUBGROUP 9.

Note 4: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C TEMP.,

SUBGROUPS A1, 2, 3, 7 & 8.

Note 5: SAMPLE TESTED (METHOD 5005, TABLE 1) ON MFG. LOT AT +25C, +125C & -55C TEMP.,

SUBGROUPS A9, 10 & 11.

Note 6: SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C TEMP. ONLY, SUBGROUP

A9.

MN54ABT377-X REV 0B0 MICROCIRCUIT DATA SHEET

(Continued)

Note 7: NOT TESTED (GUARANTEED BY DESIGN CHARACTERIZATION DATA).

Note 8: MAX NUMBER OF OUTPUTS DEFINED AS (N). N-1 DATA INPUTS ARE DRIVEN 0V TO 3.0V. ONE

OUTPUT @ VOL OR @ VOH.

Note 9: MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3.0V.

INPUT-UNDERTEST SWITCHING: 3V TO THRESHOLD (VILD), OV TO THRESHOLD (VIHD), FREQ.= 1

MHZ.

Note 10: MAXIMUM TEST DURATION NOT TO EXCEED ONE SECOND, NOT MORE THAN ONE OUTPUT SHORTED AT

ONE TIME.

MICROCIRCUIT DATA SHEET

MN54ABT377-X REV 0B0

Graphics and Diagrams

GRAPHICS# DESCRIPTION

E20ARE LCC (E), TYPE C, 20 TERMINAL(P/P DWG)

J20ARM CERDIP (J), 20 LEAD (P/P DWG)

W20ARF CERPACK (W), 20 LEAD (P/P DWG)

See attached graphics following this page.

MICROCIRCUIT DATA SHEET

MN54ABT377-X REV 0B0

Revision History

Rev ECN # Rel Date Originator Changes

0B0 M0001569 10/05/98 Bill Petcher Changed MDS MN54ABT377-X REV 0A0 to MN54ABT377-X

REV 0B0