TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
1
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r
Copyright E 2011, TAOS Inc.
www.taosinc.com
D102 × 1 Sensor Element Organization
D300 Dots-per-Inch Pixel Pitch
DHigh Sensitivity
DOn-Chip 8-Bit Analog-to-Digital Conversion
DThree-Zone Programmable Offset (Dark Level) and Gain
DHigh Speed Serial Interface
D1 MHz Pixel Rate
DSingle 3-V to 5.5-V Supply
DReplacement for TSL3301
DRoHS Compliant
Description
The TSL3301CL is a high-sensitivity 300-dpi, linear optical sensor array with integrated 8-bit analog-to-digital
converters. The array consists of 102 pixels: 100 inner pixels and 2 end pixels. The inner pixels measure 85 μm
(H) by 77 μm (W) on 85-μm centers and the end pixels are 132 μm (H) by 49 μm (W). Associated with each pixel
is a charge integrator/amplifier and sample-hold circuit. All pixels have concurrent integration periods and
sampling times. The array is split into three 34-pixel zones, with each zone having programmable gain and offset
levels. Data communication is accomplished through a three-wire serial interface.
Intended for use in high performance, cost-sensitive scanner applications, the TSL3301CL is based on a linear
sensor array die that has expanded capability, including multi-die addressing and cascade options. Please
contact TAOS for additional information on die and multi-die package availability.
Functional Block Diagram
PIXEL ARRAY WITH INTEGRATORS AND S−H
(51-bit shift register)
SCLK
SDIN
SDOUT
DIGITAL I/O
AND
CONTROL
DB<7:0>
ADDR<4:0>
READ
WRITE
OUTPUT CHARGE-TO-
VOLTAGE CONVERTER
WITH PROGRAMMABLE
GAINS AND OFFSETS
SECTOR
VREF
IREF
RESET/SAMPLE
START
ADCLK
DUAL 8−BIT
SA ADC
VREF
IREF
BIAS
BLOCK
PIXCLK SI HOLD ZERO LEFT EVEN RIGHT ODD RIGHT EVEN IREF
8
5
3
LEFT ODD
r
r
Texas Advanced Optoelectronic Solutions Inc.
1001 Klein Road S Suite 300 S Plano, TX 75074 S (972) 673-0759
NC − No internal connection
8 NC
7 GND
6 GND
5 NC
CL PACKAGE
(TOP VIEW)
SCLK 1
VDD 2
SDIN 3
SDOUT 4
Package Drawing is Not to Scale
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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Copyright E 2011, TAOS Inc. The LUMENOLOGY r Company
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Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME NO. I/O DESCRIPTION
GND 6, 7 Ground
SCLK 1 I System clock input for serial I/O and all internal logic.
SDIN 3 I Serial data input. Data is clocked in on the rising edge of SCLK.
SDOUT 4 O Serial data output. Data is clocked out on the falling edge of SCLK.
VDD 2Positive supply voltage.
Detailed Description
The TSL3301CL is a 102 × 1 linear optical array with onboard A/D conversion. It communicates over a serial
digital interface and operates over a 3 V to 5.5 V range. The array is divided into three 34-pixel zones (left, center,
and right), with each zone having programmable gain and offset (dark signal) correction.
The sensor consists of 102 photodiodes, also called pixels, arranged in a linear array. Light energy impinging
on a pixel generates a photocurrent, which is then integrated by the active integration circuitry associated with
that pixel. During the integration period, a sampling capacitor connects to the output of the integrator through
an analog switch. The amount of charge accumulated at each pixel is directly proportional to the light intensity
(Ee) on that pixel and to the integration time (tint). At maximum programmed gain, one LSB corresponds to
approximately 300 electrons.
Integration, sampling, output, and reset of the integrators are performed by the control logic in response to
commands input via the SDIN pin. Data is read out on the SDOUT pin. A normal sequence of operation consists
of a pixel reset (RESET), start of integration (STARTInt), integration period, sampling of integrators
(SAMPLEInt), and pixel output (READPixel). Reset sets all the integrators to zero. Start of integration releases
the integrators from the reset state and defines the beginning of the integration period. Sampling the integrators
ends the integration period and stores the charge accumulated in each pixel in a sample and hold circuit.
Reading the pixels causes the sampled value of each pixel to be converted to 8-bit digital format and output on
the SDOUT pin. All 102 pixels are output sequentially unless interrupted by an abort (ABORTPixel) command
or reset by a RESET command.
Gain adjustment is controlled by three 5-bit DACs, one for each of the the three zones. Table 1 lists the gain
settings and the corresponding pixel values. Offset is affected by the gain setting and may have to be adjusted
after gain changes are made.
Offset correction is controlled by three 8-bit sign-magnitude DACs and is performed in the analog domain prior
to the digital conversion. There is a separate offset DAC for each of the three zones. Codes 0h − 7Fh correspond
to positive offset values and codes 80h – FFh correspond to negative offset values.
The offset correction is proportional to the gain setting. At minimal gain, one LSB of the offset DAC corresponds
to approximately 1/3 LSB of the device output, and at maximum gain, to about 1 LSB of the device output.
Note that the gain and offset registers are in indeterminate states after power up and must be set by the controller
as required.
Sign-magnitude is a binary representation in which the most significant bit (MSB) is used to represent the sign of the number, with the
remaining bits representing the magnitude. An MSB of 1 indicates a negative number.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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Table 1. Gain Settings and Results
GAIN CODE RELATIVE GAIN % INCREASE GAIN CODE RELATIVE GAIN % INCREASE
0 1 16 1.52 3.23
1 1.02 2.17 17 1.57 3.33
2 1.05 2.22 18 1.62 3.45
3 1.07 2.27 19 1.68 3.57
4 1.09 2.33 20 1.74 3.70
5 1.12 2.38 21 1.81 3.85
6 1.15 2.44 22 1.88 4.00
7 1.18 2.50 23 1.96 4.17
8 1.21 2.56 24 2.05 4.35
9 1.24 2.63 25 2.14 4.55
10 1.27 2.70 26 2.24 4.76
11 1.31 2.78 27 2.35 5.00
12 1.34 2.86 28 2.48 5.26
13 1.38 2.94 29 2.61 5.56
14 1.43 3.03 30 2.77 5.88
15 1.47 3.13 31 2.94 6.25
Serial Interface
The serial interface follows a USART format, with start bit, 8 data bits, and one or more stop bits. Data is clocked
in synchronously on the rising edge of SCLK and clocked out on the falling edge of SCLK. Stop bits are not
required on the input. When clocking data out continuously (i.e., reading out pixels) there will be one stop bit
between data words.
The receive and transmit state machines are independent, which means commands can be issued while
reading data. This feature allows starting new integration cycles while reading data. Note that this allows
undefined conditions so care must be taken not to issue commands that will cause outputs (such as register
read) while reading out data. For instance, issuing a register read command while reading out image data will
result in garbage out. Likewise, it is possible to change offset and gain registers during a readout, which can
give unpredictable results.
It is not necessary to have a continuously active clock, but a minimum of 5 clocks after the stop bit is required
after any command has been issued to ensure that the corresponding internal logic actions have been
completed. When reading register contents, there will be a 4-clock delay from the completion of the REGRead
command before the register contents are output (see Figure 5). When reading out pixel values, there will be
a 44-clock delay from completion of the READPixel command until the first pixel data is output. When starting
integration (STARTInt), it is necessary to have 22 clocks to complete the pixel reset cycle (see Imaging below).
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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Register Address Map
The TSL3301CL contains seven registers as defined in Table 2. Data in these registers may be written to or read
from using the REGWrite and REGRead commands. Three registers control the gain of the analog-to-digital
converters (ADC). Three other registers allow the offset of the system to be adjusted. Together the gain and
offset registers are used to maximize the achievable dynamic range.
Table 2. Register Address Map
ADDRESS REGISTER DESCRIPTION REGISTER WIDTH
0x00 Left (pixels 0−33) offset 8
0x01 Left (pixels 0−33) gain 5
0x02 Center (pixels 34−67) offset 8
0x03 Center (pixels 34−67) gain 5
0x04 Right (pixels 68−101) offset 8
0x05 Right (pixels 68−101) gain 5
0x1F Mode 8
The offset registers are 8-bit sign-magnitude values and the gain registers are 5-bit values. The programmed
offset correction is applied to the sampled energy, and then the gain is applied. (i.e., the gain will affect the offset
correction.) These registers allow the user to maximize the dynamic range achievable in the given system.
The last register is the mode register. Bits in this register select the sleep mode as well as options for multichip
arrays and production testing. Note that test and multichip options do not apply to the 8-pin packaged device.
Users should always write 0s into the production test and multichip control bits.
07
0x1F
654321
P2 MODE0 0 SLP P1 P0 C1 C0
SLP = Sleep Mode:
1 places device into sleep mode
0 places device in normal operating mode
C1, C0 are Reserved (should be written 0)
P2 to P0 are factory test bits (should be written 0)
Figure 1. Mode Register Bit Assignments
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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Command Description
The TSL3301CL is a slave device that reacts strictly to commands received from the digital controller. These
commands cause the device to perform functions such as reset, integrate, sample, etc. Table 3 summarizes
the command types and formats and Table 4 lists the command set for the TSL3301CL. Each command is
described in more detail below.
Table 3. Command Type and Format Summary
COMMAND TYPE FORMAT
Action command < Command byte >
Register write < Command byte > < Data byte >
Table 4. TSL3301CL Command Set
COMMAND HEX CODE DESCRIPTION
IRESET SDIN held low for 30
clocks Interface Reset
RESET 0x1B Reset Integration and read blocks
STARTInt 0x08 Start pixel integration
SAMPLEInt 0x10 Stop light integration and sample results
READPixel 0x02 Dump serial the contents of each sampled integrator
ABORTPixel 0x19 Abort any READPixel operation in progress
READHold 0x12 Combination of SAMPLEInt and READPixel commands
READHoldNStart 0x16 Combination of SAMPLEInt, READPixel and STARTInt commands
REGWrite 0x40 + address Write a gain, offset, or mode register
REGRead 0x60 + address Read a gain, offset, or mode register
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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PROGRAMMING INFORMATION
A minimum of 5 clock cycles after the stop bit is required after any command to ensure that the internal logic
actions have been completed.
Reset Commands
Reset commands are used to put the TSL3301CL into a known state.
IRESET — Interface Initialization
Encoding: Break Character (10 or more consecutive start bits, or zeros)
The commands vary in length from one to three bytes. IRESET initializes the internal state machine that keeps
track of which command bytes have been received. This command should be first and given only once after
power-up to synchronize the TSL3301CL internal command interpreter.
An alternative is to issue three successive RESET commands.
RESET — Main Reset
Encoding: 0x1b: <0001_1011>
RESET resets most of the internal control logic of the TSL3301CL and any READPixel command currently in
progress is aborted. RESET puts the pixel integrators into the auto-zero/reset state. Any values that were being
held in the array’s sample/hold circuits are lost.
NOTE:
The value on the SDOUT pin is not guaranteed from the time power is applied until 30 clocks after
the first RESET command is issued.
Pixel Action Commands
Pixel action commands allow the user to control pixel integration and reading of pixel data.
STARTInt — Start Integration
Encoding: 0x08: <0000_1000>
STARTInt causes each pixel to leave the reset state and to start integrating light. The actual execution
of STARTInt is delayed 22 clock cycles until the pixel reset cycle has been completed. (See imaging below.)
SAMPLEInt — Stop Integration
Encoding: 0x10: <0001_0000>
SAMPLEInt causes each pixel to store its integrator’s contents into a sample and hold circuit. Also, the Integrator
is returned to the reset state.
READPixel — Read Pixel Data
Encoding: 0x02: <0000_0010>
READPixel causes the sampled value of each pixel to be converted to an 8-bit digital value that is clocked out
on the SDOUT pin. The LSB is the first data bit, which is preceded by a START bit (logic 0) and followed by a
STOP bit (logic 1). Each pixel in the device is presented on SDOUT starting from pixel 00 and completes with
pixel 101. There is a 44-clock cycle delay from the completion of the READPixel command until the first pixel
data is output.
Gain and offset registers are used to adjust the ADC converter to maximize dynamic range and should be
programmed prior to invoking the READPixel command.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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ABORTPixel — Abort Pixel Data Read
Encoding: 0x19: <0001_1001>
ABORTPixel is an optional command that stops a READPixel command during its execution. It also causes pixel
integration to terminate and the device to enter the auto-zero/reset state. Any values that were being held in
the array’s sample/hold circuits are lost.
READHold — Sample and Read Combination
Encoding: 0x12: <0001_0010>
READHold is a macro command that combines both the SAMPLEInt and READPixel commands into a single
command.
READHoldNStart Combination
Encoding: 0x16: <0001_0110>
READHold is a macro command that combines the SAMPLEInt, READPixel, and StartInt commands into a
single command. 22 clock cycles are necessary to complete the pixel reset cycle.
Register Commands
The register commands provide the user the capability of setting gain and offset corrections for each of the three
zones of pixels. a4−a0 refer to the register address as given in Table 2.
REGWrite — Write a Gain/Offset/Mode Register
Encoding (2 bytes): 0x40 <data>: <010a4_a3a2a1a0> <d7d6d5d4_d3d2d1d0>
REGWrite writes a value into either a gain, offset, or mode register. The 5-bit address of the register is encoded
into the lower 5 bits of the command byte (the first byte). A second byte, which contains the data to be written,
follows the command byte.
REGRead — Read a Gain/Offset/Mode Register
Encoding: 0x60: <011a4_a3a2a1a0>
REGRead reads the value previously stored in a gain, offset, or mode register. The 5-bit address of the register
is encoded into the lower 5 bits of the command byte. Following receipt of the REGRead command, the device
places the contents of the selected register onto the SDOUT pin, LSB first.
There is a 4-clock cycle delay from the completion of the REGRead command until the register contents are
output.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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OPERATION
Initialization Sequence
After powering on the device, a minimum of 10 clocks with SDIN held high must be received by the TSL3301CL
to clear the receiver logic so that a start bit will be detected correctly. The control logic may then be cleared by
either issuing an IRESET command (break character) or 3 RESET (0x1b) commands. An additional 30 clocks
must be received by the device to assure the state of SDOUT.
Sleep Mode
The device can be put into a power down or sleep mode by writing a 0x10 to the mode register. This turns off
all the analog circuitry on the chip. Normal operation is restored by writing a 0x00 to the mode register. The
analog circuitry will require a minimum of 1 millisecond to recover from the sleep mode.
Note that putting the device in the sleep mode does not affect the logic states of the machine. If, for example,
a READPixel command is issued, the device will respond but the resulting data will be meaningless. Also note
that 0x00 and 0x10 are the only two legitimate user programmable values for the single-chip version of the
TSL3301CL. Other values may put the device into a non-operational mode.
For minimum sleep mode current consumption, voltage levels on logic inputs must be at either VDD or ground.
Imaging
After powering up the device and completing the initialization sequence, it is necessary to allow a minimum of
1 millisecond for the internal analog circuitry to settle. This delay is also required when coming out of the sleep
mode.
Issuing a STARInt (0x08) command will release the pixel integrators from the reset state. After an appropriate
delay to integrate the image, the pixel data may be sampled by issuing a SAMPLEInt (0x10) command and then
read out by issuing a READPixel (0x02) command.
A STARTInt command can be issued anytime after the SAMPLEInt command is issued to start another cycle.
Thus, it is possible to be reading out one sample while integrating the next. However, the sampled data from
the previous SAMPLEInt must be completely read out before the next SAMPLEInt command is issued.
The compound commands READHold (0x12) and READHoldNStart ((0x16) are shortcut commands to simplify
the imaging sequence.
It is important to note that a pixel reset sequence is initiated with the receipt of a STARTInt or READHoldNStart
command. The next integration sequence cannot start until the pixel reset sequence has been completed, which
requires 22 clocks AFTER the receipt of one of these commands. These clocks can also be used to clock
commands or data into or out of the device.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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Absolute Maximum Ratings over operating free-air temperature (unless otherwise noted)
Supply voltage, VDD 6 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital output voltage range, VO −0.3 V to VDD +0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital output current −10 to +10 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input current range, II −20 mA to 20 mA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA −25°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range −25_C to 85_C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
ESD tolerance, human body model 2000 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Not recommended for solder reflow.
Recommended Operating Conditions
MIN NOM MAX UNIT
Supply voltage, VDD 3 5 5.5 V
High-level input voltage at SCLK, SDIN, VIH 2 VDD V
Low-level input voltage at SCLK, SDIN, VIL 0.8 V
Power supply ripple, 100 kHz sawtooth waveform 60 mVp-p
Input clock (SCLK) rise time, 10% to 90% 30 ns
Operating junction temperature, TJ0 70 °C
Maximum clock frequency, fSCLK 10 MHz
Electrical Characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V5V
IO = 50 μA 4.5 4.95
V
High level output voltage SDOUT
VDD = 5 V IO = 4 mA 4.6
V
VOH High-level output voltage, SDOUT
V33V
IO = 50 μA 2.9 V
VDD = 3.3 V IO = 4 mA 2.7
V
Low level output voltage SDOUT
IO = 50 μA 0.01 0.1
V
VOL Low-level output voltage, SDOUT IO = 4 mA 0.4 V
A/D active 11 17
mA
IDD Supply current A/D inactive 611 mA
IDD
Supply
current
Sleep mode 10 μΑ
VIL Low-level input voltage (SCLK, SDIN) 0.8 V
VIH High-level input voltage (SCLK, SDIN) 2 V
IIH High-level input current (SCLK, SDIN) VI = VDD ±10 μΑ
IIL Low-level input current (SCLK, SDIN) VI = 0 ±10 μΑ
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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Light-to-Digital Transfer Characteristics at VDD = 5 V, TJ = 25°C, λp = 660 nm, tint = 250 μs (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
A-to-D converter resolution 8 Bits
Full scale reference
Gain register = 00000b 3.6
nJ/cm2
Full-scale reference Gain register = 11111b 1.24 nJ/cm2
Full-scale reference temperature sensitivity For converter only, does not include
photodiode characteristics ±150 ppm/°C
Average dark level offset
Gain register = 00000b
Offset register 00000000b
0 7 30
LSB
Average dark-level offset Gain register = 11111b Offset register = 00000000b 20 LSB
Gain register = 00000b, see Note 1 5 10
LSB
Dark signal nonuniformity (DSNU) Gain register = 11111b, see Note 1 14 LSB
Average white level output
Offset re
g
ister =
Gain register = 00000b
Ee = 11.3 μW/cm2160 200 240
LSB
Average white level output
Offset
register
=
00000000b Gain register = 11111b
Ee = 3.77 μW/cm2200
LSB
Pixel-response non-uniformity (PRNU) Ee = 11.3 μW/cm2, See Notes 2 and 3 ±8±10 %
Programmable offset steps ±128
Programmable offset step size
Gain register = 00000b 0.5
LSB
Programmable offset step size Gain register = 11111b 1.5 LSB
Dark-level change with temperature 0°C < TJ < 70°C 2 LSB
Differential nonlinearity ±0.5 LSB
Integral nonlinearity ±1 LSB
Dark level noise
Gain register = 00000b 0.5
LSB
Dark level noise Gain register = 11111b 1.5 LSB
NOTES: 1. DSNU is the difference between the highest value pixel and the lowest value pixel of the device under test when the array is not
illuminated.
2. PRNU does not include DSNU.
3. PRNU is the difference between the highest value pixel and the lowest value pixel of the device under test when the array is uniformly
illuminated at nominal white level (typical average output level = 200).
Timing Requirements over recommended operating range (unless otherwise noted) (Figure 2)
MIN NOM MAX UNIT
fmax Maximum clock frequency 10 MHz
tw(CLKH) Clock high pulse duration 30 ns
tw(CLKL) Clock low pulse duration 30 ns
tsu Input setup time 20 ns
thInput hold time 20 ns
Switching Characteristics over recommended operating range (unless otherwise noted) (Figure 3)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
trRise time, output
C 20 pF
10 ns
tfFall time, output CL = 20 pF 10 ns
tdDelay from clock edge to data-out stable 20 ns
CiInput pin capacitance 10 pF
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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TYPICAL CHARACTERISTICS
SDIN
tsu
tw(CLKL)
tw(CLKH)
SCLK
th
VIH
VIH
VIL
VIL
Figure 2. TSL3301CL Input Timing Requirements
SDOUT
SCLK
td
VIH
VOH
VIL
VOL
Figure 3. TSL3301CL Output Switching Characteristics
B0 B1 B2 B3 B4 B5 B6 B7 Stop
Start
SDIN
SCLK
SDOUT
SCLK
Serial Input Data Format
Serial Output Data Format
B0 B1 B2 B3 B4 B5 B6 B7 Stop
Start
Figure 4. TSL3301CL Serial I/O
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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TYPICAL CHARACTERISTICS
B0
Start
SDIN
SDOUT
SCLK
Beginning of Output Response
END of REGRead Command
B7 Stop
1234
Figure 5. TSL3301CL REGRead Output Response Timing
0.6
0
300 500 700 900
Relative Responsivity
1.2
1100
1.0
0.8
0.4
λ − Wavelength − nm
TA = 25°C
0.2
PHOTODIODE SPECTRAL RESPONSIVITY
Normalized to
660 nm
Figure 6. TSL3301CL Photodiode Spectral Response
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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APPLICATION INFORMATION
Normal Sequence
A typical programming sequence for the TSL3301CL device appears below:
Send(IRESET);
Send(RESET);
Calibration Cycle
*
*
while(1) {
for(i=0;i<=2;i++) {/* for each pixel page */
Write page gain register
Write page offset register
Read page gain register and verify (optional)
Read page offset register and verify (optional)
}
}
Send(STARTInt);
DelayIntegrationTime(); /* wait for appropriate time interval to elapse */
Send(SAMPLEInt);
Send(READPixel);
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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APPLICATION INFORMATION: HARDWARE
PCB Pad Layout
Suggested PCB pad layout guidelines for the CL package are shown in Figure 7.
0.8
0.8
1.3
1.4
2.5
Pin 1
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
Figure 7. Suggested CL Package PCB Layout
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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PACKAGE INFORMATION
Pb
TOP VIEW
SIDE VIEW
BOTTOM
VIEW
END VIEW
Pin 1
1.0
0.8
2.5
0.95 0.95
0.6
0.6
1.8
7.5 0.08
0.22
0.085
(Note B)
8.573 (Note B)
1.2 0.2
9.4 0.2
Pin 1
3.0 0.2
Photodiode Array
(Not to Scale)
C
Lof Package
of Photodiode Array Area (Note C)
C
L
0.37 Nominal
0.011 Nominal
C
Lof Pixel 7 (Note C) Photodiode Array
(Not to Scale)
C
Lof Solder Contact
NOTES: A. All linear dimensions are in millimeters. Dimension tolerance is ± 0.05 mm unless otherwise noted.
B. Nominal photodiode array dimension. The array is made up of 100 inner pixels and 2 end pixels with pixel #1 closer to
Pin 1. The inner pixel is 77 μm wide by 85 μm high, spaced on 85μm centers. The end pixel is 49μm wide by 132 μm high.
C. The die is centered within the package within a tolerance of ± 0.05 mm.
D. Package top surface is molded with an electrically nonconductive clear plastic compound having an index of refraction of 1.56.
E. Contact finish is soft gold plated.
F. This package contains no lead (Pb).
G. This drawing is subject to change without notice.
Figure 8. Package CL Configuration
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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CARRIER TAPE AND REEL INFORMATION
TOP VIEW
DETAIL B
DETAIL A
3.45
Ao
9.85
Bo
1.53
Ko
0.30
0.02
8 Max
8.00
2.00
4.00
1.50
+ 0.10
− 0.00
1.50
+ 0.25
− 0.00
16.00
+ 0.30
− 0.10
1.75
7.50
AA
B
B
7 Max
NOTES: A. All linear dimensions are in millimeters. Dimension tolerance is ± 0.10 mm unless otherwise noted.
B. The dimensions on this drawing are for illustrative purposes only. Dimensions of an actual carrier may vary slightly.
C. Symbols on drawing Ao, Bo, and Ko are defined in ANSI EIA Standard 481−B 2001.
D. Each reel is 178 millimeters in diameter and contains 1000 parts.
E. TAOS packaging tape and reel conform to the requirements of EIA Standard 481−B.
F. In accordance with EIA standard, device pin 1 is located next to the sprocket holes in the tape.
G. This drawing is subject to change without notice.
Figure 9. Package CL Carrier Tape
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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SOLDERING INFORMATION
The CL package has been tested and has demonstrated an ability to be reflow soldered to a PCB substrate.
The solder reflow profile describes the expected maximum heat exposure of components during the solder
reflow process of product on a PCB. Temperature is measured on top of component. The components should
be limited to a maximum of three passes through this solder reflow profile.
Table 5. Solder Reflow Profile
PARAMETER REFERENCE DEVICE
Average temperature gradient in preheating 2.5°C/sec
Soak time tsoak 2 to 3 minutes
Time above 217°C (T1) t1Max 60 sec
Time above 230°C (T2) t2Max 50 sec
Time above Tpeak −10°C (T3) t3Max 10 sec
Peak temperature in reflow Tpeak 260°C
Temperature gradient in cooling Max −5°C/sec
t3
t2
t1
tsoak
T3
T2
T1
Tpeak
Not to scale — for reference only
Time (sec)
Temperature (C)
Figure 10. Solder Reflow Profile Graph
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
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STORAGE INFORMATION
Moisture Sensitivity
Optical characteristics of the device can be adversely affected during the soldering process by the release and
vaporization of moisture that has been previously absorbed into the package. To ensure the package contains
the smallest amount of absorbed moisture possible, each device is dry-baked prior to being packed for shipping.
Devices are packed in a sealed aluminized envelope called a moisture barrier bag with silica gel to protect them
from ambient moisture during shipping, handling, and storage before use.
The CL package has been assigned a moisture sensitivity level of MSL 5a and the devices should be stored
under the following conditions:
Temperature Range 5°C to 50°C
Relative Humidity 60% maximum
Total Time 6 months from the date code on the aluminized envelope — if unopened
Opened Time 24 hours or fewer
Rebaking will be required if the devices have been stored unopened for more than 6 months or if the aluminized
envelope has been open for more than 24 hours. If rebaking is required, it should be done at 60°C for 24 hours.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
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PRODUCTION DATA — information in this document is current at publication date. Products conform to
specifications in accordance with the terms of Texas Advanced Optoelectronic Solutions, Inc. standard
warranty. Production processing does not necessarily include testing of all parameters.
LEAD-FREE (Pb-FREE) and GREEN STATEMENT
Pb-Free (RoHS) TAOS’ terms Lead-Free or Pb-Free mean semiconductor products that are compatible with the current
RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous
materials. Where designed to be soldered at high temperatures, TAOS Pb-Free products are suitable for use in specified
lead-free processes.
Green (RoHS & no Sb/Br) TAOS defines Green to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and
Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material).
Important Information and Disclaimer The information provided in this statement represents TAOS’ knowledge and
belief as of the date that it is provided. TAOS bases its knowledge and belief on information provided by third parties,
and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate
information from third parties. TAOS has taken and continues to take reasonable steps to provide representative
and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and
chemicals. TAOS and TAOS suppliers consider certain information to be proprietary, and thus CAS numbers and other
limited information may not be available for release.
NOTICE
Texas Advanced Optoelectronic Solutions, Inc. (TAOS) reserves the right to make changes to the products contained in this
document to improve performance or for any other purpose, or to discontinue them without notice. Customers are advised
to contact TAOS to obtain the latest product information before placing orders or designing TAOS products into systems.
TAOS assumes no responsibility for the use of any products or circuits described in this document or customer product
design, conveys no license, either expressed or implied, under any patent or other right, and makes no representation that
the circuits are free of patent infringement. TAOS further makes no claim as to the suitability of its products for any particular
purpose, nor does TAOS assume any liability arising out of the use of any product or circuit, and specifically disclaims any
and all liability, including without limitation consequential or incidental damages.
TEXAS ADVANCED OPTOELECTRONIC SOLUTIONS, INC. PRODUCTS ARE NOT DESIGNED OR INTENDED FOR
USE IN CRITICAL APPLICATIONS IN WHICH THE FAILURE OR MALFUNCTION OF THE TAOS PRODUCT MAY
RESULT IN PERSONAL INJURY OR DEATH. USE OF TAOS PRODUCTS IN LIFE SUPPORT SYSTEMS IS EXPRESSLY
UNAUTHORIZED AND ANY SUCH USE BY A CUSTOMER IS COMPLETELY AT THE CUSTOMER’S RISK.
LUMENOLOGY, TAOS, the TAOS logo, and Texas Advanced Optoelectronic Solutions are registered trademarks of Texas Advanced
Optoelectronic Solutions Incorporated.
TSL3301CL
102 × 1 LINEAR OPTICAL SENSOR ARRAY
WITH ANALOG-TO-DIGITAL CONVERTER
TAOS141 − JULY 2011
20
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Copyright E 2011, TAOS Inc. The LUMENOLOGY r Company
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