K M Y Drawing No: FCC−K−HTS−0003 /12
Title: CHIP FUSES; RECTANGULAR TYPE
FCC10,16,20,32, FHC10,16,20,32 Page: 6/10
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Issue: KAMAYA ELECTRIC CO., LTD. Research & Development Department HOKKAIDO Research center Last update: 2012.8.30
Tabl e −4(2)
No. Test items Condition of test Performance requirements
Resistance to soldering
heat
Test by a piece.
Temp. of solder bath: 260 °C ± 5 °C
Immersion time: 10 s ± 1 s
After immersion into solder, leaving the room temp.
for 1h or more, and then measure the internal
resistance.
Change of internal resistance:
±10%
No evidence of appearance
damage
5
• Reflow soldering
Pre−heating: 150 °C ∼ 180 °C, 120 s max.
Peak: 260 °C ± 5 °C, 10 s max.
Refrow cycle: 2 times
After immersion into solder, leaving the room temp.
for 1h or more, and then measure the internal
resistance.
6 Solderability JIS C 60068-2-58
Test by a piece
Flux: Rosin−Methanol
Temp. of solder: bath: 235 °C ± 5 °C
Immersion time: 2 s ± 0.5 s
The surface of terminal immersed shall
be min. of 95 % covered with a new
coating of solder.
7 Rapid change temperature
JIS C 60068-2-14 Na
The fuse shall be mounted on the test substrate as
shown in Figure−2.
Upper temperature: +125 °C
Lower temperature: −55 °C
Duration of exposure at each temperature: 30 min.
Number of cycles: 5 cycles
Change of internal resistance:
±10%
No evidence of appearance
damage
8 Endurance test The fuse shall be mounted on the test substrate as
shown in Figure−2.
Test condition: Nominal ambient temp. and Relative
humidity.
Test potential:
1. Cycle of 1 h “ON” and 15 min. “OFF” at 1.05 times
rated current for 100 cycles.
2. After above the test , 1.25 times rated current for
1h.
The voltage drop across the fuse
after the test shall not have
increased by more than 10 % of
the value measured before test.