1. General description
The HEF4094B is an 8-stage serial shift register. It has a storage latch associated with
each stage for strobing data from the serial inp ut to parallel buffere d 3-state outputs
QP0 to QP7. The parallel outputs may be connected directly to common bus lines. Data is
shifted on positive-goin g clock transitions. The data in each shift register stage is
transferre d to the sto rag e re gister when the strobe (STR) input is HIGH. Data in the
storage register appears at the outputs whenever the output enable (OE) signal is HIGH.
Two serial outputs (QS1 and QS2) are available for cascading a number of HEF4094B
devices. Serial dat a is available at QS1 on positive-goi ng clock edges to allow high-speed
operation in cascaded systems with a fast clock rise time. The same serial data is
available at QS2 on the next negative going clock edge. This is used for cascading
HEF4094B de vices when the clock has a slow rise time.
It operates over a recommended VDD power supply r ange of 3 V to 15 V referenced to VSS
(usually ground). Unused inputs must be connected to VDD, VSS, or another input. It is
also suita ble for use over the industrial (40 °C to +85 °C) and automotive (40 °Cto
+125 °C) temperature ranges.
2. Features
Fully static operation
5 V, 10 V, and 15 V parametric ratings
Standardized symmetrical output characteristics
Operates across the automotive temperature range 40 °C to +125 °C
Complies with JEDEC standard JESD 13-B
3. Ordering information
HEF4094B
8-stage shift-and-store bus register
Rev. 07 — 16 December 2009 Product data sheet
Table 1. Ordering information
All types operate from
40
°
C to +125
°
C.
Type number Package
Name Description Version
HEF4094BP DIP16 plastic dual in-line package; 16 leads (300 mil) SOT38-4
HEF4094BT SO16 plastic small outline package; 16 leads; body width 3.9 mm SOT109-1
HEF4094BTS SSOP16 plastic shrink small outline package; 16 leads; body width 5.3 mm SOT338-1
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 2 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
4. Functional diagram
Fig 1. Functional di agram Fig 2. Logic symbol
001aaf1
19
8-STAGE SHIFT
REGISTER
8-BIT STORAGE
REGISTER
3-STATE OUTPUTS
D
2QS2 10
QS1
QP0
4 5 6 7 14 13 12 11
QP1 QP2 QP3 QP4 QP5 QP6 QP7
9
CP
3
STR
1
OE
15
15
2
OE
D
CP STR
31
QP0
QP1
QP2
QP3
QP4
QP5
QP6
QP7
QS1
QS2
9
10
4
5
6
7
14
13
12
11
001aaf11
1
Fig 3. Logic diag ram
001aag799
DD
CP
CP
Q
FF 0
D
CP
Q
LATCH 0
D
CP
Q
FF 7
D
CP
Q
LATCH 7
D
CP
Q
STAGES 1 TO 6STAGE 0 STAGE 7
QP2
QP0
D QS2
QS1
CP
Q
LATCH
QP1
QP4
QP3
QP6
QP5 QP7
STR
OE
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 3 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
5. Pinning information
5.1 Pinning
5.2 Pin description
Fig 4. Pin configuratio n
HEF4094B
STR V
DD
DOE
CP QP4
QP0 QP5
QP1 QP6
QP2 QP7
QP3 QS2
V
SS
QS1
001aae662
1
2
3
4
5
6
7
8
10
9
12
11
14
13
16
15
Table 2. Pin description
Symbol Pin Description
STR 1 strobe input
D 2 data input
CP 3 clock input
QP0 to QP7 4, 5, 6, 7, 14, 13, 12, 11 parallel output
VSS 8 ground supply voltage
QS1 9 serial ou tp u t
QS2 10 serial output
OE 15 output enable input
VDD 16 supply voltage
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 4 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
6. Functional description
[1] At the positive clock edge, the information in the 7th register stage is transferred to the 8th register stage and the QSn outputs.
H = HIGH voltage level; L = LOW voltage level; X = don’t care;
= positive-going transition; = negative-going transition;
Z = HIGH-impedance OFF-state; NC = no change;
Q6S = the data in register stage 6 before the LOW to HIGH clock transition;
Q7S = the data in register stage 7 before the HIGH to LOW clock transition.
Table 3. Function table[1]
Inputs Parallel outputs Serial outputs
CP OE STR DQP0 QPn QS1 QS2
LXXZZQ6SNC
LXXZZNCQ7S
H L X NCNCQ6SNC
HHLLQPn 1Q6S NC
HHHHQPn 1Q6S NC
HHHNCNCNCQ7S
Fig 5. Timing diagram
001aaf1
17
CLOCK INPUT
DATA INPUT
STROBE INPUT
OUTPUT ENABLE INPUT
INTERNAL Q0S (FF 0)
OUTPUT QP0
INTERNAL Q6S (FF 6)
OUTPUT QP6
SERIAL OUTPUT QS1
SERIAL OUTPUT QS2
Z-state
Z-state
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 5 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
7. Limiting values
[1] For DIP16 packages: above Tamb = 70 °C, Ptot derates linearly with 12 mW/K.
[2] For SO16 packages: above Tamb = 70 °C, Ptot derates linearly with 8 mW/K.
8. Recommended operating conditions
Table 4. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to VSS = 0 V (ground).
Symbol Parameter Conditions Min Max Unit
VDD supply voltage 0.5 +18 V
IIK input clamping current VI<0.5 V or VI>V
DD + 0.5 V - ±10 mA
VIinput voltage 0.5 VDD + 0.5 V
IOK output clamping current VO<0.5 V or VO>V
DD + 0.5 V - ±10 mA
II/O input/output current - ±10 mA
IDD supply current - 50 mA
Tstg storage temperature 65 +150 °C
Tamb ambient temperature 40 +125 °C
Ptot total power dissipation DIP16 [1] -750mW
SO16 [2] -500mW
P power dissipation per output - 100 mW
Table 5. Recommended operating cond ition s
Symbol Parameter Conditions Min Typ Max Unit
VDD supply voltage 3 - 15 V
VIinput voltage 0 - VDD V
Tamb ambient temperature in free air 40 - +125 °C
Δt/ΔV input transition rise and fall rate VDD = 5 V - - 3.75 μs/V
VDD = 10 V - - 0.5 μs/V
VDD = 15 V - - 0.08 μs/V
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 6 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
9. Static characteristics
Table 6. Static characteristics
VSS = 0 V; VI=V
SS or VDD; unless otherwise specified.
Symbol Parameter Conditions VDD Tamb = 40 °C Tamb = +25 °C Tamb = +85 °C Tamb = +125 °CUnit
Min Max Min Max Min Max Min Max
VIH HIGH-level
input voltage |IO| < 1 μA 5 V 3.5 - 3.5 - 3.5 - 3.5 - V
10 V 7.0 - 7.0 - 7.0 - 7.0 - V
15 V 11.0 - 11.0 - 11.0 - 11.0 - V
VIL LOW-level
input voltage |IO| < 1 μA 5 V - 1.5 - 1.5 - 1.5 - 1.5 V
10 V - 3.0 - 3.0 - 3.0 - 3.0 V
15 V - 4.0 - 4.0 - 4.0 - 4.0 V
VOH HIGH-level
output voltage |IO| < 1 μA 5 V 4.95 - 4.95 - 4.95 - 4.95 - V
10 V 9.95 - 9.95 - 9.95 - 9.95 - V
15 V 14.95 - 14.95 - 14.95 - 14.95 - V
VOL LOW-level
output voltage |IO| < 1 μA 5 V - 0.05 - 0.05 - 0.05 - 0.05 V
10 V - 0.05 - 0.05 - 0.05 - 0.05 V
15 V - 0.05 - 0.05 - 0.05 - 0.05 V
IOH HIGH-level
output current VO = 2.5 V 5 V 1.7 - 1.4 - 1.1 - 1.1 - mA
VO = 4.6 V 5 V 0.64 - 0.5 - 0.36 - 0.36 - mA
VO = 9.5 V 10 V 1.6 - 1.3 - 0.9 - 0.9 - mA
VO = 13.5 V 15 V 4.2 - 3.4 - 2.4 - 2.4 - mA
IOL LOW-level
output current VO = 0.4 V 5 V 0.6 4 - 0.5 - 0. 36 - 0.36 - mA
VO = 0.5 V 10 V 1.6 - 1.3 - 0.9 - 0.9 - mA
VO = 1.5 V 15 V 4.2 - 3.4 - 2.4 - 2.4 - mA
IOZ OFF-state
output current QPn output
is HIGH;
VO=15V
15 V - 0.4 - 0.4 - 12 - 12 μA
IIinput leakage
current 15 V - ±0.1 - ±0.1 - ±1.0 - ±1.0 μA
IDD supply current all valid input
combinations;
IO=0A
5 V - 5 - 5 - 150 - 150 μA
10 V - 10 - 10 - 300 - 300 μA
15 V - 20 - 20 - 600 - 600 μA
CIinput
capacitance ---7.5-- - -pF
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 7 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
10. Dynamic characteristics
Table 7. Dynamic characteristics
VSS = 0 V; Tamb = 25
°
C; for test circuit see Figure 10; unless otherwise specified.
Symbol Parameter Conditions VDD Extrapolation formula Min Typ Max Unit
tPHL HIGH to LOW
propagation delay CP to QS1;
see Figure 6 5 V [1] 108 ns + (0.55 ns/pF) CL- 135 270 ns
10 V 54 ns + (0.23 ns/pF) CL- 65 130 ns
15 V 42 ns + (0.16 ns/pF) CL- 50 100 ns
CP to QS2;
see Figure 6 5 V 78 ns + (0.55 ns/pF) CL-105210ns
10 V 39 ns + (0.23 ns/pF) CL- 50 100 ns
15 V 32 ns + (0.16 ns/pF) CL-4080ns
CP to QPn;
see Figure 6 5 V 138 ns + (0.55 ns/pF) CL- 165 330 ns
10 V 64 ns + (0.23 ns/pF) CL- 75 150 ns
15 V 47 ns + (0.16 ns/pF) CL- 55 110 ns
STR to QPn;
see Figure 7 5 V 83 ns + (0.55 ns/pF) CL- 110 220 ns
10 V 39 ns + (0.23 ns/pF) CL- 50 100 ns
15 V 27 ns + (0.16 ns/pF) CL-3570ns
tPLH LOW to HIGH
propagation delay, CP to QS1;
see Figure 6 5 V [1] 78 ns + (0.55 ns/pF) CL- 105 210 ns
10 V 39 ns + (0.23 ns/pF) CL- 50 100 ns
15 V 32 ns + (0.16 ns/pF) CL-4080ns
CP to QS2;
see Figure 6 5 V 78 ns + (0.55 ns/pF) CL- 105 210 ns
10 V 39 ns + (0.23 ns/pF) CL- 50 100 ns
15 V 32 ns + (0.16 ns/pF) CL-4080ns
CP to QPn;
see Figure 6 5 V 123 ns + (0.55 ns/pF) CL- 150 300 ns
10 V 59 ns + (0.23 ns/pF) CL- 70 140 ns
15 V 47 ns + (0.16 ns/pF) CL- 55 110 ns
STR to QPn;
see Figure 7 5 V 73 ns + (0.55 ns/pF) CL- 100 200 ns
10 V 34 ns + (0.23 ns/pF) CL-4590ns
15 V 27 ns + (0.16 ns/pF) CL-3570ns
tttransition time 5 V [1] 10 ns + (1.00 ns/pF) CL- 60 120 ns
10 V 9 ns + (0.42 ns/pF) CL-3060ns
15 V 6 ns + (0.28 ns/pF) CL-2040ns
tPZH OFF-state to HIGH
propagation delay OE to QPn;
see Figure 8 5 V - 40 80 ns
10 V - 25 50 ns
15 V - 20 40 ns
tPZL OFF-state to LOW
propagation delay OE to QPn;
see Figure 8 5 V - 40 80 ns
10 V - 25 50 ns
15 V - 20 40 ns
tPHZ HIGH to OFF-state
propagation delay OE to QPn;
see Figure 8 5 V - 75 150 ns
10 V - 40 80 ns
15 V - 30 60 ns
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 8 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).
tPLZ LOW to OFF-state
propagation delay OE to QPn;
see Figure 8 5 V - 80 160 ns
10 V - 40 80 ns
15 V - 30 60 ns
tsu set-up time D to CP;
see Figure 9 5 V 60 30 - ns
10 V 20 10 - ns
15 V 15 5 - ns
thhold time D to CP;
see Figure 9 5 V +5 15 - ns
10 V 20 5 - ns
15 V 20 5 - ns
tWpulse width minimum LOW
clock pulse;
see Figure 6
5 V 60 30 - ns
10 V 30 15 - ns
15 V 24 12 - ns
minimum HIGH
strobe pulse;
see Figure 7
5 V 40 20 - ns
10 V 30 15 - ns
15 V 24 12 - ns
fmax maximum frequency see Figure 6 5 V 5 10 - MHz
10 V 11 22 - MHz
15 V 14 28 - MHz
Table 7. Dynamic characteristics …continued
VSS = 0 V; Tamb = 25
°
C; for test circuit see Figure 10; unless otherwise specified.
Symbol Parameter Conditions VDD Extrapolation formula Min Typ Max Unit
Table 8. Dynamic power dissipation
VSS = 0 V; tr = tf
20 ns; Tamb = 25
°
C.
Symbol Parameter VDD Typical formul a for P D (μW) where:
PDdynamic power
dissipation 5 V PD = 2100 × fi + Σ(fo × CL) × VDD2fi = input frequency in MHz,
fo = output frequency in MHz,
CL = output load capacitance in pF,
VDD = supply voltage in V,
Σ(fo × CL) = sum of the outputs.
10 V PD = 9700 × fi + Σ(fo × CL) × VDD2
15 V PD = 26000 × fi + Σ(fo × CL) × VDD2
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 9 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
11. Waveforms
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 6. Clock to outputs propagation delays, and clock puls e width and maximum frequency
1/f
max
t
W
t
PHL
t
PLH
V
I
GND
V
OH
V
OL
QPn, QS1 output
CP input V
M
V
M
001aaf113
t
PHL
t
PLH
V
OH
V
OL
QS2 output V
M
Table 9. Measur ement points
Supply voltage Input Output
VDD VMVMVXVY
5 V to 15 V 0.5VDD 0.5VDD 0.1VDD 0.9VDD
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 7. Strobe to output propagation delays, and strobe pulse width, set up and hold times
tW
tPHL
tPLH
VI
GND
VOH
VOL
QPn output
STR input VM
VM
001aaj05
8
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 10 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 8. 3-state output enable and disable times for OE input
001aai54
5
t
PLZ
t
PHZ
outputs
disabled
outputs
enabled
outputs
enabled
output
LOW-to-OFF
OFF-to-LOW
output
HIGH-to-OFF
OFF-to-HIGH
OE input V
M
V
I
V
OL
V
OH
GND
V
Y
V
X
t
PZL
t
PZH
V
M
V
M
V
DD
GND
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Fig 9. Data input data set up and hold times
001aaf11
5
GND
GND
th
tsu
th
tsu
VM
VM
VM
VI
VOH
VOL
VI
QPn, QS1, QS2 output
CP input
D input
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 11 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
a. Input waveform
b. Test circuit
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL= load capacitance including jig and probe capacitance.
RL = load resistance.
RT= termination resistance should be equal to the output impedance Zo of the pulse generator.
Fig 10. Test circuit
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aaj78
1
001aaj91
V
EXT
V
DD
V
I
V
O
DUT
CL
RT
RL
G
Table 10. Test data
Supply voltage Input VEXT Load
VDD VItr, tftPHL, tPLH tPHZ, tPZH tPLZ, tPZL CLRL
5 V to 15 V VSS or VDD 20 ns open VSS VDD 50 pF 1 kΩ
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 12 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
12. Application information
Some examples of applications for the HEF4094B are:
Serial-to-parallel dat a conversion
Remote control holding register
Fig 11. Remote control holding register
001aae66
6
DIGITALLY CONTROLLED
EQUIPMENT
(REQUIRES CONTINUOUS
DIGITAL CONTROL)
CONTROL
AND
SYNC
CIRCUITRY
data clock
from remote
control panel
HEF4094B
QP0
STR
D QS2
CP
QP7
DIGITALLY CONTROLLED
EQUIPMENT
HEF4094B
QP0
STR
D QS2
CP
QP7
DIGITALLY CONTROLLED
EQUIPMENT
HEF4094B
QP0
STR
D
CP
QP7
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 13 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
13. Package outline
Fig 12. Package outline SOT38-4 (DIP16)
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
SOT38-4 95-01-14
03-02-13
MH
c
(e )
1
ME
A
L
seating plane
A1
wM
b1
b2
e
D
A2
Z
16
1
9
8
E
pin 1 index
b
0 5 10 mm
scale
Note
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.
UNIT A
max. 12 b1(1) (1) (1)
b2cD E e M Z
H
L
mm
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
A
min. A
max. bmax.
w
ME
e1
1.73
1.30
0.53
0.38
0.36
0.23
19.50
18.55
6.48
6.20
3.60
3.05 0.2542.54 7.62 8.25
7.80
10.0
8.3 0.764.2 0.51 3.2
inches 0.068
0.051
0.021
0.015
0.014
0.009
1.25
0.85
0.049
0.033
0.77
0.73
0.26
0.24
0.14
0.12 0.010.1 0.3 0.32
0.31
0.39
0.33 0.030.17 0.02 0.13
D
IP16: plastic dual in-line package; 16 leads (300 mil) SOT38
-4
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 14 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
Fig 13. Package outline SOT109-1 (SO16)
X
wM
θ
A
A1
A2
bp
D
HE
Lp
Q
detail X
E
Z
e
c
L
vMA
(A )
3
A
8
9
1
16
y
pin 1 index
UNIT A
max. A1A2A3bpcD
(1) E(1) (1)
eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm
inches
1.75 0.25
0.10
1.45
1.25 0.25 0.49
0.36
0.25
0.19
10.0
9.8
4.0
3.8 1.27 6.2
5.8
0.7
0.6
0.7
0.3 8
0
o
o
0.25 0.1
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
Note
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.
1.0
0.4
SOT109-1 99-12-27
03-02-19
076E07 MS-012
0.069 0.010
0.004
0.057
0.049 0.01 0.019
0.014
0.0100
0.0075
0.39
0.38
0.16
0.15 0.05
1.05
0.041
0.244
0.228
0.028
0.020
0.028
0.012
0.01
0.25
0.01 0.004
0.039
0.016
0 2.5 5 mm
scale
S
O16: plastic small outline package; 16 leads; body width 3.9 mm SOT109
-1
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 15 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
Fig 14. Package outline SOT338-1 (SSOP16)
UNIT A1A2A3bpcD
(1) E(1) eH
ELL
pQZywv θ
REFERENCES
OUTLINE
VERSION EUROPEAN
PROJECTION ISSUE DATE
IEC JEDEC JEITA
mm 0.21
0.05
1.80
1.65 0.25 0.38
0.25
0.20
0.09
6.4
6.0
5.4
5.2 0.65 1.25
7.9
7.6
1.03
0.63
0.9
0.7
1.00
0.55
8
0
o
o
0.130.2 0.1
DIMENSIONS (mm are the original dimensions)
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
SOT338-1 99-12-27
03-02-19
(1)
wM
bp
D
HE
E
Z
e
c
vMA
X
A
y
18
16 9
θ
A
A1
A2
Lp
Q
detail X
L
(A )
3
MO-150
pin 1 index
0 2.5 5 mm
scale
S
SOP16: plastic shrink small outline package; 16 leads; body width 5.3 mm SOT338
-1
A
max.
2
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 16 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
14. Revision history
Table 11. Revision history
Document ID Release date Data sheet status Change notice Supersedes
HEF4094B_7 20091216 Product data sheet - HEF4094B_6
Modifications: Section 11Waveforms Figure 10 “Test circuit: updated.
Section 11Waveforms Table 10 “Test data tPHZ and tPZH and tPLZ and tPZL
values updated.
HEF4094B_6 20091103 Product data sheet - HEF4094B_5
HEF4094B_5 20090728 Product data sheet - HEF4094B_4
HEF4094B_4 20081030 Product data sheet - HEF4094B_CNV_3
HEF4094B_CNV_3 19950101 Product specification - HEF4094B_CNV_2
HEF4094B_CNV_2 19950101 Product specification - -
HEF4094B_7 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 07 — 16 December 2009 17 of 18
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
15. Legal information
15.1 Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Definitions”.
[3] The product status of de vice(s) descr ibed in th is document m ay have cha nged since thi s document w as publish ed and may di ffe r in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
15.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warrant ies as to t he accuracy or completeness of
information included herein and shall have no liab ility for the consequences of
use of such information.
Short data sheet — A short dat a sheet is an extract from a full data sheet
with the same product type number(s) and tit le. A short data sh eet is intended
for quick reference only and shou ld not b e relied u pon to cont ain det ailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall pre va il.
15.3 Disclaimers
General — In formation in this document is believed to be accurate and
reliable. However, NXP Semiconductors d oes not give an y represent ations or
warranties, expressed or impli ed, as to the accuracy or completeness of such
information and shall have no liability for th e co nsequences of use of such
information.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all informa tion supplied prior
to the publication hereof .
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors accepts no liab ility for inclusion and/or use of
NXP Semiconductors products in such equipment or applications and
therefore such inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of these
products are for il lustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ra tings System of IEC 60134) may cause permane nt
damage to the device. Limiting values are stress ratings only and operation of
the device at these or any other co nditions above those given in the
Characteristics sections of this document is not implied. Exposure to limiting
values for extended periods may af fect device reliability.
Terms and conditions of sale — NXP Semiconductors products are sold
subject to the general terms and conditions of commercial sale, as published
at http://www.nxp.com/profile/terms, including those pertaining to warranty,
intellectual property rights infringement and limitation of liability, unless
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of
any inconsistency or conflict between inf ormation in this document and such
terms and conditions, the latter will prevail.
No offer to sell or license — Not hing in this document may be interpret ed or
construed as an of fer t o sell product s that is open for accept ance or the gr ant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulatio ns. Export might require a prior
authorization from national authorities.
15.4 Trademarks
Notice: All refe renced brands, produc t names, service names and trademarks
are the property of their respective ow ners.
16. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Document status[1][2] Product status[3] Definition
Objective [short] data sheet Development This document contain s data from the objective specification for product development.
Preliminary [short] dat a sheet Qualification This document contains data from the preliminary specification.
Product [short] data sheet Production This document cont ains the product specification.
NXP Semiconductors HEF4094B
8-stage shift-and-store bus register
© NXP B.V. 2009. All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 16 December 2009
Document identifier: HEF4094B_7
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
17. Contents
1 General description. . . . . . . . . . . . . . . . . . . . . . 1
2 Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
3 Ordering information. . . . . . . . . . . . . . . . . . . . . 1
4 Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2
5 Pinning information. . . . . . . . . . . . . . . . . . . . . . 3
5.1 Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3
5.2 Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3
6 Functional description . . . . . . . . . . . . . . . . . . . 4
7 Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 5
8 Recommended operating conditions. . . . . . . . 5
9 Static characteristics. . . . . . . . . . . . . . . . . . . . . 6
10 Dynamic characteristics . . . . . . . . . . . . . . . . . . 7
11 Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
12 Application information. . . . . . . . . . . . . . . . . . 12
13 Package outline . . . . . . . . . . . . . . . . . . . . . . . . 13
14 Revision history. . . . . . . . . . . . . . . . . . . . . . . . 16
15 Legal information. . . . . . . . . . . . . . . . . . . . . . . 17
15.1 Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17
15.2 Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
15.3 Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 17
15.4 Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 17
16 Contact information. . . . . . . . . . . . . . . . . . . . . 17
17 Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18