© Semiconductor Components Industries, LLC, 2018
May, 2018 Rev. 1
1Publication Order Number:
FFSB20120A/D
FFSB20120A
Silicon Carbide Schottky
Diode
1200 V, 20 A
Description
Silicon Carbide (SiC) Schottky Diodes use a completely new
technology that provides superior switching performance and higher
reliability compared to Silicon. No reverse recovery current,
temperature independent switching characteristics, and excellent
thermal performance sets Silicon Carbide as the next generation of
power semiconductor. System benefits include highest efficiency,
faster operating frequency, increased power density, reduced EMI, and
reduced system size & cost.
Features
Max Junction Temperature 175°C
Avalanche Rated 200 mJ
High Surge Current Capacity
Positive Temperature Coefficient
Ease of Paralleling
No Reverse Recovery / No Forward Recovery
These Devices are PbFree, Halogen Free/BFR Free and are RoHS
Compliant
Applications
General Purpose
SMPS, Solar Inverter, UPS
Power Switching Circuits
www.onsemi.com
D2PAK3 (TO263, 3LEAD)
CASE 418AJ
See detailed ordering and shipping information on page 2 of
this data sheet.
ORDERING INFORMATION
Schottky Diode
MARKING DIAGRAM
$Y = ON Semiconductor Logo
&Z = Assembly Plant Code
&3 = Numeric Date Code
&K = Lot Code
FFSB20120A = Specific Device Code
1
3
$Y&Z&3&K
FFSB
20120A
1., 3. Cathode 2. Anode
2
FFSB20120A
www.onsemi.com
2
ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Symbol Parameter Value Unit
VRRM Peak Repetitive Reverse Voltage 1200 V
EAS Single Pulse Avalanche Energy (Note 1) 200 mJ
IFContinuous Rectified Forward Current @ TC < 157°C 20 A
Continuous Rectified Forward Current @ TC < 135°C 32
IF, Max Non-Repetitive Peak Forward Surge Current TC = 25°C, 10 ms1190 A
TC = 150°C, 10 ms990 A
IF,S M Non-Repetitive Forward Surge Current Half-Sine Pulse, tp = 8.3 ms 135 A
IF,R M Repetitive Forward Surge Current Half-Sine Pulse, tp = 8.3 ms 74 A
Ptot Power Dissipation TC = 25°C 333 W
TC = 150°C 55 W
TJ, TSTG Operating and Storage Temperature Range 55 to +175 °C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. EAS of 200 mJ is based on starting TJ = 25°C, L = 0.5 mH, IAS = 29 A, V = 50 V.
THERMAL CHARACTERISTICS
Symbol Parameter Value Unit
RqJC Thermal Resistance, Junction to Case, Max 0.45 °C/W
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Symbol Parameter Test Condition Min Typ Max Unit
VFForward Voltage IF = 20 A, TC = 25°C1.45 1.75 V
IF = 20 A, TC = 125°C1.7 2.0
IF = 20 A, TC = 175°C2.0 2.4
IRReverse Current VR = 1200 V, TC = 25°C 200 mA
VR = 1200 V, TC = 125°C 300
VR = 1200 V, TC = 175°C 400
QCTotal Capacitive Charge V = 800 V 120 nC
CTotal Capacitance VR = 1 V, f = 100 kHz 1220 pF
VR = 400 V, f = 100 kHz 111
VR = 800 V, f = 100 kHz 88
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
ORDERING INFORMATION
Part Number Top Marking Package Shipping
FFSB20120A FFSB20120A D2PAK3
(Pb-Free / Halogen Free)
800 / Tape & Reel
FFSB20120A
www.onsemi.com
3
TYPICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
Figure 1. Forward Characteristics Figure 2. Reverse Characteristics
Figure 3. Current Derating Figure 4. Power Derating
Figure 5. Capacitive Charge vs. Reverse
Voltage
Figure 6. Capacitance vs. Reverse Voltage
0.0 0.5 1.0 1.5 2.0 2.5 3.0
0
4
8
12
16
20
TJ = 175 oC
TJ = 125 oC
TJ = 75 oC
TJ = 25 oC
TJ = 55oC
IF, FORWARD CURRENT (A)
VF, FORWARD VOLTAGE (V)
200 400 600 800 1000 1200
103
102
101
100
101
IR, REVERSE CURRENT (mA)
VR, REVERSE VOLTAGE (V)
TJ = 175 oC
TJ = 125 oC
TJ = 55oC
TJ = 25 oC
TJ = 75 oC
25 50 75 100 125 150 175
0
50
100
150
200
250
D = 0.1
D = 0.2
D = 0.3
D = 0.5
D = 0.7 D = 1
IF, PEAK FORWARD CURRENT (A)
TC, CASE TEMPERATURE (
oC)
25 50 75 100 125 150 175
0
50
100
150
200
250
300
350
PTOT, POWER DISSIPATION (W)
TC, CASE TEMPERATURE (
oC)
0 200 400 600 800 1000
0
25
50
75
100
125
150
QC, CAPACITIVE CHARGE (nC)
VR, REVERSE VOLTAGE (V)
0.1 1 10 100 1000
100
1000
50
5000
CAPACITANCE (pF)
VR, REVERSE VOLTAGE (V)
FFSB20120A
www.onsemi.com
4
TYPICAL CHARACTERISTICS
(TJ = 25°C unless otherwise noted)
Figure 7. Capacitance Stored Energy
Figure 8. Junction-to-Case Transient Thermal Response Curve
0 200 400 600 800 1000
0
10
20
30
40
50
EC, CAPACITIVE ENERGY (mJ)
VR, REVERSE VOLTAGE (V)
1061051041031021011
0.0001
0.001
0.01
0.1
1
2
0.2
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
DUTY CYCLEDESCENDING ORDER
SINGLE PULSE
0.01 0.02
0.05
0.1
0.5
t, RECTANGULAR PULSE DURATION (sec)
NOTES:
ZqJC(t) = r(t) x RqJC
RqJC = 0.45 oC/W
Duty Cycle, D = t1 / t2
Peak TJ = PDM x ZqJC(t) + TC
PDM
t1
t2
FFSB20120A
www.onsemi.com
5
TEST CIRCUIT AND WAVEFORMS
Figure 9. Unclamped Inductive Switching Test Circuit & Waveform
LR
+
DUT
CURRENT
SENSE VDD
VDD
Q1
IV
VAVL
tt0t1t2
IL
IL
L = 0.5 mH
R < 0.1 W
VDD = 50 V
EAVL = 1/2LI2 [VR(AVL) / (VR(AVL) VDD)]
Q1 = IGBT (BVCES > DUT VR(AVL))
FFSB20120A
www.onsemi.com
6
PACKAGE DIMENSIONS
D2PAK3 (TO263, 3LEAD)
CASE 418AJ
ISSUE B
DIM MIN MAX MIN MAX
MILLIMETERSINCHES
D0.330 0.380 8.38 9.65
E0.380 0.420 9.65 10.67
A0.160 0.190 4.06 4.83
b0.020 0.039 0.51 0.99
c2 0.045 0.065 1.14 1.65
e0.100 BSC 2.54 BSC
A1 0.000 0.010 0.00 0.25
c0.012 0.029 0.30 0.74
L0.070 0.110 1.78 2.79
H0.575 0.625 14.60 15.88
L2 −−−− 0.070 −−−− 1.78
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. CHAMFER OPTIONAL
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH. MOLD FLASH SHALL NOT EXCEED 0.005
PER SIDE. THESE DIMENSIONS ARE MEASURED
AT THE OUTERMOST EXTREMES OF THE PLAS-
TIC BODY AT DATUM H.
5. THERMAL PAD CONTOUR IS OPTIONAL WITHIN
DIMENSIONS E, L1, D1 AND E1.
6. OPTIONAL MOLD FEATURE
E1 0.245 −−−− 6.22 −−−−
L1 −−−− 0.066 −−−− 1.68
D1 0.260 −−−− 6.60 −−−−
L3 0.010 BSC 0.25 BSC
M08 08°° °°
E
D
H
L1
b
e
A1 B
H
L
MDETAIL C
SEATING
PLANE
A
2X
M
A
M
0.10 B
c2
c
A
BSEATING
PLANE
DETAIL C
VIEW AA
SIDE VIEW
TOP VIEW
E2
L2
A
A
VIEW AA
E1
D1
L1
OPTIONAL CONSTRUCTIONS
L3
GAUGE
PLANE
NOTE 3
M
A
M
0.10 B
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
RECOMMENDED
0.366
0.100
DIMENSIONS: INCHES
PITCH
2X
0.653
0.063
2X
0.436
0.169
SOLDERING FOOTPRINT*
NOTE 6
FFSB20120A
www.onsemi.com
7
ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
N. American Technical Support: 8002829855 Toll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
FFSB20120A/D
LITERATURE FULFILLMENT:
Literature Distribution Center for ON Semiconductor
19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA
Phone: 3036752175 or 8003443860 Toll Free USA/Canada
Fax: 3036752176 or 8003443867 Toll Free USA/Canada
Email: orderlit@onsemi.com
ON Semiconductor Website: www.onsemi.com
Order Literature: http://www.onsemi.com/orderlit
For additional information, please contact your local
Sales Representative