MIL SPECS O00 IC M@ O00001e5 0029552 4 The documentation and process TINCH-POUND] conversion measures necessary to | I | | | comply with this revision shall be | MIL-S-19500/260D | completed by 2 January 1990 | 21 April 1989 MIL-S-19500/260C 28 April 1983 MILITARY SPECIFICATION SEMICONDUCTOR DEVICE, SILICON, POWER RECTIFIER TYPES 1N1202A, 1N1204A, 1N1206A, 1N3671A AND 1N3673A AND AR JAN, JANTX, JANTXV, AND JANS This specification is approved for use by all Depart- ments and Agencies of the Department of Defense. 1. SCOPE 1.1 Scope. This specification covers the detail requirements for silicon semiconductor, power necti fier diodes. Four levels of product assurance are provided for each device type as specified n -S- 0. 1,2 Normal and reverse (AR suffix) types. Reverse and normal types are identical except: The normal types have the cathode connected to the stud and the reverse types have the anode connected to the stud. Designated values are applicable to both types. 1.3 Physical dimensions. See figure 1 (D0-203AA, formerly DO-4). 1.4 Maximum ratings. I Types Nas a ; 10 3 1. ESHs0c IT and pressure ; rr {Tc = 150C {t = 1/120 s | ts1g | (reduced) | M(pk) IV(pk) Ade A ct mmHg us 1N1202A | 240 200 12 240 | -65 to +200 N/A lo | 1N1204A | 480 | 400 | 12 | 240 -65 to +200 8 | 10 | 1N1206A | 720 600 | 12 240 | -65 to +200 | 16 | 10 | 1N3671A | 960 | 800 | 12 240 | -65 to +200 | 30 | 10 | 1000 | 12 240 | -65 to +200 | 54 10 | 1N3673A 1200 I 1/ Derate linearly 2 percent of Ig per C for Tc = 150C to Tc = 200C. 1.5 Primary electrical characteristics. Rgyc = 2.0C/W maximum. 2. APPLICABLE DOCUMENTS 2.1 Government documents. iBeneficial comments (recommendatfons, additions, deTetfons) and any pertinent data which may | |be of use in improving this document should be addressed to: Space and Naval Warfare | [Systems Command, ATTN: SPAWAR 003-114, Washington, DC 20363 by using the self-addressed | Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this | document or by letter. . | TL AMSC N/A FSC 5961 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.MIL SPECS O00 IC m@ 0000125 0029593 & MIL-S-19500/ 260D 2.1.1 Specifications, standards, and handbooks. The following specifications, standards, and handbooks form a part of this document to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DODISS) and supplement thereto, cited in the solicitation (see 6.2). SPECIFICATION MILITARY MIL-S-15500 - Semiconductor Devices, General Specification for. STANDARDS FEDERAL FED-STD-H28 - Screw-Thread Standards for Federal Services. MILITARY MIL-STD-750 - Test Methods for Semiconductor Devices, (Unless otherwise indicated, copies of federal and military specifications, standards, and handbooks are available from the Naval Publications and Forms Center, (ATTN: NPODS), 5801 Tabor Avenue, Philadelphia, PA 19120-5099, ) 2.2 Order of precedence. In the event of a conflict between the text of this document and the references cited herein (except for related associated detail specifications, specification sheets, or MS standards), the text of this document shall take precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Detail specification, The individual item requirements shall be in accordance with MIL-S-19500, and as specified herein. Lot accumulation period shall be three months in lieu of six weeks. 3.2 Abbreviations, symbols, and definitions. The abbreviations, symboTs, and definitions used herein shall be as specified in MIL-5-19500. 3.3 Design, construction, and physical dimensions, The design, construction, and physical dimenstons shall be as Specified tm MIL-S-19500, and figure 1 herein. 3.4 Marking. Marking shall be in accordance with MIL-S-19500, except at the option of the manufacturer, the following marking may be omitted from the body of the device: a. Country of origin. b. Manufacturer's identification. 3.5 Polarity. The polarity shall be indicated by a graphic symbol with the arrow pointing toward the negative end for forward bias. The reversed units shall also be marked with an R following the last digit in the type number. 4, QUALITY ASSURANCE PROVISIONS 4,1 Sampling and inspection. Sampling and inspection shall be in accordance with MIL-S-19500, and as specified herein. 4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-S-19500, and as specified herein. Tests in either polarity shall be sufficient to obtain qualification approval of both polarities,MIL SPECS O00 IC Mi O0001e5 0029594 46 MIL-S-19500/260D OT K 1 Lo 8 -LAF = | pia Sf = r- SEE NOTE 4 > E| SEE NOTE 6 Pay * GI N > Dimensions in inches with metric SEATING PLANE Ltr | equivalents (mm) in parentheses Notes : | | (see note 2) Minimum Maximum -405 (10.29) .424 (10.77) 424 (10.77) | 437 (11,10) .075 (1,90) 175 (4,44) -800 (20.32) c | 250 (6,35) 6T .060 (1.52) N 2422 (10.72) -453 (11.51) | kK | | 3,5,7 mm jo |;oo go im > |e tt r | NOTES: . Dimensions are in inches. Metric equivalents are given for general information. Units must not be damaged by torque of 15 inch-pounds applied to 10-32NF2B nut assembled on thread. Diameter of unthreaded portion .189 (4.80 mm) max and -163 (4,14 mm) min. Complete threads shall extend to within 2-1/2 threads of the seating plane. Angular orientation of this terminal is undefined, Maximum pitch diameter of plated threads shall be basic pitch diameter -169 inch (4,31 mm) reference FED-STD-H28 (Screw Thread Standards for Federal Services). . - The A.S.A. thread reference is 10-32UNF2A, Terminal end shape is unrestricted, 10. Reversed (anode to stud) units shall be marked with an R following the last digit in the type number. FIGURE 1, Physical dimensions. IO ON OnrF Owe 3MIL SPECS O00 IC M@ O0001c5 0029595 T MIL-S-19500/260D 4.3 Screening (JANS, JANTXV, and JANTX levels only). Screening shall be in accordance with MIL-S-19500 (table IT) and as specified herein. The following measurements shall be made in accordance with table I herein. Devices that exceed the limits of table I herein shall not be acceptable. IScreen (see Measurements table II of MIL-S-19500) JANS Tevet I JANTX and JANTXV TeveTs | { i/ ISurge, see 4.3.1; Surge, see 4.3.1; {Thermal response, see 4.3.2 Thermal response, see 4.3.2 | I I 4 [Not applicable Not applicable 9 Ve2 and Ini 2/ Vr2 and Ip, 2/ 10 MIL-STD-750, method 1038, MIL-STD-750, method 1038, | test condition A, t = 96 hrs. |test condition A, t = 48 hrs. | T I 11 Veo and Ipi; aVre2 Subgroup 2 of table I herein, Vo | = 40.1 V(pk); alpy = 5 wAdc and Ipi; aVFp = #0.1 V(pk); or 100% from the initial AI py = 5 wA de or 100% from the | lvalue, whichever is greater. |initial value, whichever is greater. | Subgroup 2 of table I herein. 3/ 12 Burn-in, see 4.3.3 and 4.5.1. [Not applicable MIL-STD-750, method 1038, | test condition B. 13 Subgroups 2 and 3 of Not applicable table I herein; aVro = 20.1 V(pk); aIp7 = 5 pA de or 100% from the Initial value, whichever is greater. 1/ Surge shall precede thermal response. These tests shall be performed anytime after screen 3 and before screen 9. 2/ Ipy measurement shall not be indicative of an open condition. 3/ PDA of 13 shall apply to screen 11 for JANTX and JANTXV. 4.3.1 Surge current. Surge current, see MIL-STD-750, method 4066. 19 = 0; Vpy(W) = 0; Ipsm = 325; six surges; Ta = 25 C. One surge per minute maximum. tp = 3 ms. erformed in 4.3.2 Thermal response (aVe_ measurements). The aVe measurements shall be accordance with MIL-STD-/50, method 3101. The aVe conditions and maximum Ve limit shall be derived by each vendor. The chosen aVp measurement and conditions for each device in the qualification lot shall be submitted in the qualification report and a thermal response curve shall be plotted. The chosen aVr value shall be considered final after the manufacturer has had the opportunity to test five consecutive lots. tp = 250 ms. Heating current (Ip) > rated Ig.MIL SPECS O00 I M@ 00001e5 00e%5%b 1 MIL-S-19500/260D 4.3.3 Power burn-in, Power burn-in conditions are as follows: MIL-STD-750, method 1038, test condition B. Tc = 150C, f = 60 Hz; Ip = 12 A de (see 4.5.1); Vp = Rated Vp(pk) (see 1.4). 4.4 Quality conformance inspection. Quality conformance inspection shall be in accordance with MIL~S-19500. 4.4.1 Group A inspection. Group A inspection shal] be conducted in accordance with MIL-S-19500, and table I herein. End-point electrical measurements shall be in accordance with the applicable steps of table V herein. 4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for subgroup testing in table IVa (JANS) and table IVb (JANTX and JANTXV) of MIL-S-19500, and tables Ila and IIb herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table V herein. 4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for subgroup testing in table V of MIL-S-19500, and table III herein. Electrical measurements (end points) and delta requirements shall be in accordance with the applicable steps of table V herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in appropriate tables and as follows. 4.5.1 Burn-in and steady-state operation life tests. These tests shall be conducted with a half-sine waveform of the specified peak voltage impressed across the diode in the reverse direction followed by a half-sine waveform of the specified average rectifier current. The forward conduction angle of the rectified current not be greater than 180 degrees nor Jess than egrees. 4.5.2 DC intermittent operation life. A cycle shall consist of an "on" period, when power is applied suddenly, not gradually, to the device for the time necessary to achieve a delta case temperature of 85.C +15.C, -5 C, followed by an "off" period, when the power is suddenly removed, for cooling. Auxiliary (forced) cooling is permitted during the off period only. 30 S< theating < 60 s. P = VF X Ip or P = Vrpy X Jay if using sine wave current. OC full wave current (or equivalent half sine wave current) shall be used for the power required during the on period. Within the time interval of 50 cycles before to 500 cycles after the termination of the test, the sample units shall be removed from the specified test conditions and allowed to reach room ambient conditions. Specified end-point measurements for qualification and quality conformance inspection shall be completed within 96 hours after removal of sample units from the specified test conditions. Additional readings may be taken at the discretion of the manufacturer.MIL SPECS OOO IC M 0000125 0029597 3 MIL-S-19500/260D TABLE I. Group A inspection. | MIL-STD-750 Limits { Inspection LTPD | Symbol ] Unit |Method Conditions 1/ Min {Max | | | | | I I ! Subgroup 1 | | ! ! ! | {Visual and mechanical | 2071 | | | | inspection | | | | | Subgroup 2 | | | | jForward voltage | 4011 [Ip = rated Icy al --- {2.6 V de |Forward voltage | 4011 jig = 38 A(pk) | Veo --- [1.35 | V(pk) | | pulse, pulse | | | | | lwidth = 8.5 ms, | | | | duty cycle = 2% i | ! | maximum | ! [Reverse current 4016 [DC method, IR1 --- 5 [yA de | Vp = Rated Vp (dc) (see 1.4) | | | | Subgroup 3 | | [nigh temperature Tc = 150C | operation | Reverse current 4016 |DC method, Ipo --- 1 [mA de | Vp = Rated Vp (see 1,4) | | | { | | | | Low temperature IT = -65 C operation | | | | | |. | | Reverse current | 4026 |DC method, | IR3 --- 1 [mA de | | | IVp = Rated Vp | | | |(see 1.4) | | |Subgroups 4 and 5 | | | | | | | | | | | | | [Not applicable | ! | | | Subgroup 6 | | [Net applicable | | | ! 1/ For LTPD numbers, see MIL-S-19500.MIL SPECS O00 I M@ 0000125 0029598 5 mm MIL-S-19500/260D TABLE IIa. Group B inspection for JANS devices. 1 | MIL-STD-750 [Qualification and | Small Tot | |large lot quality |quality confor- | Inspection conformance inspec-|mance inspection Method Conditions [tion LTPDo/ n/c 4/ | | Subgroup 1 ! | | | |Physical dimensions | 2066 [See figure 1 | Subgroup 2 2/ | | | | ISolderability | 2026 | | | | | [Resistance to solvents 1022 | | Subgroup 3 | | | | lthermat shock | 1051 | | (temperature cycling) | | |Surge current | 4066 |Tc = 150C; | | IVp = Rated Vp (see 1.4) | | lig(surge) = 240 A; | | lIg = 12 A dc; six 1/120 s | l lsurges; 1 surge per minute | {maximums tp = 8.3 ms {Hermetic seal | 1071 | | | Fine leak | | | | Gross leak | | | | | Electrical measurements | ISee table V, steps 1, 2, 4, | ! {and 5 |Decap-internal visual | 2075 | ! (design verification) | | Iie shear ! 2017 | ! Subgroup 4 [DC intermittent | 1037 |.25 rated Ig < Ig | 5 12/0 | operation life | lapplied < rated Ig | | | {(see 4.5.2); 2,000 cycles ! [Electrical measurements ISee table V, steps 1, 2, 4, land 5 | See footnotes at end of table.MIL SPECS O00 I M@ O00001e5 0029599 7 MIL-S-19500/260D TABLE IIa. Group B inspection for JANS devices - Continued. Electrical measurements ee table V, steps 3, 6, Subgroup 6 Thermal resistance 3101 {See 1.5 I | MIL-STD-750 Qualification and [ Smal? Tot q | | large lot quality |quality confor- | | Inspection | | conformance inspec-|mance inspection| | |Method Conditions tion LTPD =1/ n/c 1/ | | l ] | ! Subgroup 5 ! ! Accelerated steady- | 1027 [Ip = 4A dc; | | state operation life | [Vp = Rated Vp (see 1.4), | | | IT, = 125Cs Re adjusted | | | las required by the chosen | | | IT, te give an average | | | llot Ty = 275C (see 4.5.1), | | | lf = Hz | | | | | | | ISe | | | lan | | | | | | | | | | | | i | | i | { | | | _ / For LTPD numbers, see MIL-S-19500.MIL SPECS 000 IC MM 0000125 00209600 T m MIL-S-19500/260D TABLE IIb. Group B inspection for JANTX and JANTXV devices, i MIL-STD-750 Qualification and [ SmaTT Tot [ ; large lot quality [quality confor- | Inspection ; conformance inspec-|mance inspection| Method Conditions i/ n/e 1/ |{ itfon LTPD Subgroup 1 2/ Solderability Resistance to solvents Subgroup 2 Thermal shock (temperature cycling) Surge current _|Hermetic seal Gross leak Electrical measurements Subgroup 3 2/ DC intermittent operation life | | Electrical measurements Steady-state DC blocking life | Electrical measurements * Subgroup 4 Decap internal visual (design verification) Subgroup 5 T | | | | | | | Is | | | | | | | | | | | | | | | | | | Fine leak | I | | | | | | | | i | | i | [ | | | iNot applicable | Subgroup 6 | | h temperature {nonoperating) JElectrical measurements 2026 1022 1051 4066 1071 1037 1049 2075 1032 | | | | | | | | | | | | | | | | | | TA 150C; 0 = 12 A dc; six surges; surge per minute maximum Rated Vp (see 1.4) 8.3 ms Te = if (surge) = 240 A; I ls i = See table V, steps 1, 2, n and 4 -25 rated Ig applied rated 9 (see 4.5.2); 2 000 cycles See table V, steps 1, 2, and 4 | 1038 or|Condition A; 340 hrs See table V, steps, 1 and 2 = 200C minimum See table V, steps 1 and 2 | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | ! | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | i | | | | | | | | | | | | | | | | | i | | | | | | | | | | | | | | | | | | i | i/ For LTPD numbers, see MIL-S-T9500. 2/ A separate sample may be pulled for each test. 9MIL SPECS OOO IC M@ 0000125 0025401 1 mm MIL-S-19500/260D TABLE ITI. Group C inspection, I T MIL~STD-750 [Qualification and [| Smal) lot. T i | [large lot quality {quality confor- | | Inspection | I conformance inspec-|mance inspection] | [Method ! Conditions |tion LTPD 1 n/c 1/ | | | i | I Subgroup 1 ! | |! (Physical dimensions | 2066 {See figure 1 | | | | | Subgroup 2 | | | | [Thermal shock (glass | 1056 {Test condition B | | | | strain) | | | | | | | | | | | {Terminal strength | 2036 |Test condition A, | | | | (tension) ! {Weight = 10 Ibs, t= 15s | | | | Bending stress | [Test condition F, | | | | l {method B, Weight = 5 Ibs, | | | | | It = 15s | | | | I | | | | { Seal torque | lTest condition D1, | | | | | {Torque = 10 oz-in, | | | I | [It = 15s | | | | | | | | | Stud torque | [Test condition D2, | | i | | |Torque = 15 1b-in, | | | | | [It = 15 5s | | | | { | { | |Hermetic seal 1071 | | | Fine leak | | | | | Gross leak | | | | | |Moi sture resistance ! 1021 | | [Electrical measurements | ISee table V, steps 1, 2, | | I | | land 4 (JANTX and JANTXY), | | | | | |Steps 1, 2, 4, and 5 (JANS) | | | { | ! Subgroup 3 ! | | | Shock | 2016 |! ! |Vibration, variable } 2056 | | | | frequency | |! |Constant acceleration ! 2006 | | | [Electrical measurements! |See table V, steps 1 and 2 | | Subgroup 4 | ! | |Salt atmosphere | 1041 | | | | ! (corrosion) ! ! | ! See footnote at end of table. 10MIL SPECS ooo IC m 0000125 0O2%bo02 3 MIL~S -19500/260D TABLE III. Group C inspection - Continued. MIL-5TD-750 (Qualification and smal! fot I [large lot quality |quality confor- Inspection | {conformance inspec-{mance inspection Method ! Conditions |tion LTPD = 1/ n/c 1/ { Subgroup 5 N/A i | | 5 12/0 | DC intermittent 1037 | operation life lapplied < rated Ip I(see 4.5.2); {6-000 cycles Electrical measurements |See table V, steps 3, 4, 5, land 7 (JANS), and steps 3, 4, land 7 (JANTX, JANTXV) | / For LTPD numbers, see MIL-S-19500. | l | | | | | | | | | | | | | | | i | | | | | | Subgroup 6 ! ! | | -25 rated Ig < Ip | | | | i | | | | | | | | | | | { | | | | ilMIL SPECS O00 I MM 0000125 0029403 5 @ MIL-S-19500/260D TABLE IV. Group E inspection (all quality levels) for qualification only. | [ MIL-STD-750 [Qualification and [ Small lot | large lot quality [quality confor- Inspection |conformance inspec-|mance inspection | Method Conditions Ition LTPD n/c | ! | | | Subgroup 1 | 10 6/0 | | [Thermal shock (glass 1056 |0C to 100C, 100 cycles | | | strain) | ! |Hermetic seal 1071 | | {Electrical measurements |See table V, steps 2, 3, | | land 4 | l Subgroup 2 | | 5 12/0 | | Steady-state DC {1038 or|Condition A; 1,000 hrs | | blocking life 1049 | | |Electrical measurements |See table V, steps 3, 6, | land 7 ! Subgroup 3 | | {DPA [Photos of cross sections | 3/0 | 1/0 | [shal] be submitted in the | | | |qualification report. | | | [Vendors shall retain | | Iduplicate photos. | | | Subgroup 4 10 6/0 | Thermal resistance 3101 [See 1.5 Subgroup 5 [ | [Barometric pressure 1001 {Hg = rated Hg; t = 60 s, | | (reduced) | Voltage during test | 1N1202A --- | | 1N1204A - 400 V dc | | | 1N1206A 600 V dc | | 1N3671A 800 V dc | | 1N3673A | 1000 V de | | | [While the test is being I | | |performed, 1 shall be | |monitored and shall not | | | lexceed group A limits. | 12MIL SPECS O00 IC M O0001ceS 0025604 7 mm MIL-S-19500/260D TABLE V. Groups A, B, and C electrical end-point measurements. | } | MIL-STD-750 Limits | i | | | Step | Inspection |Nethod Conditions | Symbol Nin | Max Unit | | | | { | 1 | | | | | 1. [Forward voltage | 4011 lig = 38 A(pk) | Vee J--- 41.35 |W(pk) | | | | |(pulse); pulse | I | [ | | | | |width = 8.5 ms | | | | | | | | Iduty cycle = 2% | | | | | i |maximum | | | | | | | | | | | 2. [Reverse current | 4016 |DC method | Ipi |--- [5 [pA de | | | Vp = Rated Vp (de) | | | eis hee | | 3. Forward voltage | 4011 lig = 38 A(pk) Vo --- [1.4 [V(pk) | | | | |(pulse); pulse [ | | | | | |width = 8.5 ms | | | | | | |duty cycle = 2% | | | | | | | maximum | | | | | | | | | 4, Thermal response | 3101 Ise e 4.3.2 AVE | mV dc | | 5. |Forward voltage | 4011 [Ip = 50 mA de | aVe3 [#50 mV dc | | | | i | [maximum change | | | | i | from previous to | | | | | 1 post intermittent | | i | | | [life and thermal | | | | | | shock measurement | | | | | | tests (JANS only) | | | | | | | 6. |Reverse current | 4016 [DC method, JaIpy 1/ [100% or 5 yA, i | i | IVp = Rated Vp (de) | ~ (whichever is | | | | (see 1.4) | [greater) change | | | | | | from initial | | i | | | group A reading | | i | | | | | | | | | | | | | | | 7, [Reverse current | 4016 |DC method, | Ip | 110 |pAde | | | | [Vp = Rated Vp (dc) | | | | | I | | (see 1.4) | | | | | l | | i | | | | | / Devices which exceed the group A limits for this test shall be rejected, , 13MIL SPECS O00 IC Mi 0000125 0029405 5 MIL-S-19500/260D 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-S-19500. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. ) 6.1 Notes. The notes specified in MIL-S-19500 are applicable to this specification. 6.2 Acquisition requirements. Acquisition documents must specify the following: a. Title, number, and date of the specification. b. Issue of DODISS to be cited in the solicitation, and if required, the specific issue of individual documents referenced (see 2.1,1). c. Lead finish may be specified (see 3.3.1), 6.3 Substitution information. Devices covered by this specification are substitutable for the manufacturer's and user's part numbers, This information in no way implies that manufacturer's part numbers are suitable as a substitute for the military Part or Identifying Number (PIN). Military Manufacturer's Manufacturer's and user's Part or Identifying CAGE code part number Number 1N1204A CDKF $13001 935A486-1 ~ 1N1204RA CDKF $13002 935A486-2 14MIL SPECS O00 IC Mi 0000125 O025L0b 0 mm MIL-S-19500/260D 6.4 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. CONCLUDING MATERIAL Custodians: Preparing activity: Army - ER Navy - EC Navy - EC Air Force - 17 Agent: NASA - NA DLA - ES Review activities: (Project 5961-1066) Army - AR, MI NASA - MSFC - EGO2 Air Force - 11, 19, 85, 99 DLA - ES User activities: Army - SM Navy - AS, CG, MC, OS, SH 15